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@inproceedings{DBLP:conf/itc/Abbott84,
  author       = {William B. Abbott IV},
  title        = {Time Specification Conformance of {VLSI} Test Systems {O5}},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {105--112},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 13:40:15 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Abbott84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Agrawal84,
  author       = {Vishwani D. Agrawal},
  title        = {Will Testability Analysis Replace Fault Simulation ?},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {718--718},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Agrawal84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/AgrawalA84,
  author       = {Dharma P. Agrawal and
                  Sami A. Al{-}Arian},
  title        = {Comprehensive Fault Model and Testing of {CMOS} Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {218--223},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AgrawalA84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/AhrensBDR84,
  author       = {D. P. Ahrens and
                  P. J. Bednarczyk and
                  D. L. Denburg and
                  R. M. Robertson},
  title        = {{TPG2} : An Automatic Test Program Generator for Custom ICs},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {762--767},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AhrensBDR84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/AngwinDR84,
  author       = {Jeff Angwin and
                  Paul Drake and
                  Glenn Reader},
  title        = {The Need for Real-Time Intelligence When Testing {VLSI}},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {752--761},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AngwinDR84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/AraiY84,
  author       = {Nobuo Arai and
                  Yoshio Yamanaka},
  title        = {Parallel Testing of Random Logic LSIs},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {827--833},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AraiY84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/AthertonES84,
  author       = {Robert W. Atherton and
                  Leonard Ekkelkamp and
                  Chuck Schmitz},
  title        = {Logic Device Characterization Using Computer-Aided Test and Analysis},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {367--383},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AthertonES84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BabitzL84,
  author       = {Arthur Babitz and
                  Kurt Lender},
  title        = {Using Simulation in the Design Process - {A} Case Study},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {229--236},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BabitzL84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BalasubramaniamF84,
  author       = {Ramaswamy Balasubramaniam and
                  Peretz Feder},
  title        = {Test Strategy for a 32-Bit Microprocessor Module with Memory Management},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {598--605},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BalasubramaniamF84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Bandes84,
  author       = {Dean Bandes},
  title        = {Exploratory Data Analysis Makes Testing More Valuable for Semiconductor
                  Manufacturing},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {350--358},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Bandes84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BardellM84,
  author       = {Paul H. Bardell and
                  William H. McAnney},
  title        = {Parallel Pseudorandom Sequences for Built-In Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {302--308},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BardellM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BellonS84,
  author       = {Catherine Bellon and
                  Gabriele Saucier},
  title        = {{CADOC} : {A} System for Computer Aided Functional Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {680--689},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BellonS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BellonV84,
  author       = {Catherine Bellon and
                  Raoul Velazco},
  title        = {Hardware and Software Tools for Microprocessor Functional Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {804--820},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Thu, 09 Feb 2012 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BellonV84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BhattacharyaG84,
  author       = {Bhargab B. Bhattacharya and
                  Bidyut Gupta},
  title        = {Logical Modeling of Physical Failures and Their Inherent Syndrome
                  Testability in {MOS} {LSI/VLSI} Networks},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {847--855},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BhattacharyaG84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BhavsarK84,
  author       = {Dilip K. Bhavsar and
                  Balakrishnan Krishnamurthy},
  title        = {Can We Eliminate Fault Escape in Self-Testing by Polynomial Division
                  (Signature Analysis) ?},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {134--139},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BhavsarK84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Bosse84,
  author       = {Gene P. Bosse},
  title        = {High Speed Redundancy Processor},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {282--286},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Bosse84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Boulton84,
  author       = {Herb Boulton},
  title        = {Design Verification, Product Characterization and Production Testing
                  of Hybrids and Printed Circuit Cards Using High-Sensitivity Thermography
                  Systems},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {747--751},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Boulton84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Bozorgui-NesbatM84,
  author       = {Saied Bozorgui{-}Nesbat and
                  Edward J. McCluskey},
  title        = {Lower Overhead Design for Testability of Programmable Logic Arrays},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {856--865},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Bozorgui-NesbatM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BrglezPH84,
  author       = {Franc Brglez and
                  Philip Pownall and
                  Robert Hum},
  title        = {Applications of Testability Analysis: From {ATPG} to Critical Delay
                  Path Tracing},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {705--712},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BrglezPH84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BroughtonB84,
  author       = {Robert S. Broughton and
                  Michael G. Brashler},
  title        = {The Future is Now: Extending {CAE} into Test of Custom {VLSI}},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {462--465},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BroughtonB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Broyles84,
  author       = {Steve Broyles},
  title        = {Automating Functional Programming for Micro-Based Boards},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {730--736},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Broyles84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Burke84,
  author       = {Anthony J. Burke},
  title        = {Software Convergence of Test Program Parameters},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {118--122},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Burke84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/BushanamHKS84,
  author       = {G. Siva Bushanam and
                  Vance R. Harwood and
                  Philip N. King and
                  Roger D. Story},
  title        = {Measuring Thermal Rises Due to Digital Device Overdriving},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {400--425},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BushanamHKS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Campbell84,
  author       = {James F. Campbell Jr.},
  title        = {Transfer Function Estimation Part {II} : Some Experimental Results},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {440--446},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Campbell84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Campbell84a,
  author       = {Michael J. Campbell},
  title        = {Monitored Burn-In {(A} Case Study for In-Situ Testing and Reliability
                  Studies)},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {518--523},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Campbell84a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Caplow84,
  author       = {Stephen Caplow},
  title        = {Conquering Testability Problems by Combining In-Circuit and Functional
                  Techniques},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {581--588},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Caplow84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Carter84,
  author       = {J. Lawrence Carter},
  title        = {A Vote in Favor of Fault Simulation},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {719--721},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Carter84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ChenMN84,
  author       = {Harry H. Chen and
                  Robert G. Mathews and
                  John A. Newkirk},
  title        = {Test Generation for {MOS} Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {70--79},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ChenMN84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Crosby84,
  author       = {Brian C. Crosby},
  title        = {Adapting {CAE} Design Information for In-Circuit Test Generation},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {206--211},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Crosby84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/DandapaniPA84,
  author       = {Ramaswami Dandapani and
                  Janak H. Patel and
                  Jacob A. Abraham},
  title        = {Design of Test Pattern Generators for Built-In Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {315--319},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DandapaniPA84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Davidson84,
  author       = {Scott Davidson},
  title        = {Fault Simulation at the Architectural Level},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {669--679},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Tue, 12 Dec 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Davidson84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Day84,
  author       = {John R. Day},
  title        = {A Fault-Driven, Comprehensive Redundancy Algorithm for Repair of Dynamic
                  RAMs},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {287--293},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Day84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/DenkerC84,
  author       = {Stephen P. Denker and
                  Judy Cobb},
  title        = {Automatic Visual Testing: {A} New, Comprehensive Element of Cost-Effective
                  {PCB} Testing Strategies},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {558--563},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/DenkerC84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Dervisoglu84,
  author       = {Bulent I. Dervisoglu},
  title        = {On Coosing a Hardware Descriptive Language for Digital Systems Testing/Verification},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {184--187},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Dervisoglu84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/El-ZiqB84,
  author       = {Yacoub M. El{-}Ziq and
                  Hamid H. Butt},
  title        = {Impact of Mixed-Mode Self Test on Life Cycle Cost of {VLSI} Based
                  Design},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {338--349},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/El-ZiqB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/FitzPatrickPC84,
  author       = {Gerard FitzPatrick and
                  David F. Peach and
                  Richard P. Cushman},
  title        = {An Automated Test of a Disk Product Power System Independent of the
                  Primary Function of the Machine},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {513--517},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/FitzPatrickPC84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/GernerN84,
  author       = {M. Gerner and
                  Hans Nertinger},
  title        = {Scan Path in {CMOS} Semicustom {LSI} Chips ?},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {834--841},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 21 Oct 2016 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/GernerN84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/GilesM84,
  author       = {David Giles and
                  Gregory A. Maston},
  title        = {Device Models : {A} New Methodology for a Perennial Problem},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {768--772},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GilesM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Goel84,
  author       = {Prabhakar Goel},
  title        = {Testability Analysis will not Replace Fault Simulation},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {722--724},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Goel84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/GotoOIIFI84,
  author       = {Y. Goto and
                  K. Ozaki and
                  T. Ishizuka and
                  A. Ito and
                  Y. Furukawa and
                  T. Inagaki},
  title        = {Electron Beam Prober for {LSI} Testing with 100ps Time Resolution},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {543--549},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/GotoOIIFI84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HallHB84,
  author       = {Frederick G. Hall and
                  Robert G. Hillman and
                  John M. Bednarczyk},
  title        = {"Instant On" Semiconductor Memories: Reality or Myth},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {258--262},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HallHB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Hansen84,
  author       = {Peter Hansen},
  title        = {A Multimode Programming Strategy for {VLSI} Boards},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {737--742},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Hansen84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HassanM84,
  author       = {Syed Zahoor Hassan and
                  Edward J. McCluskey},
  title        = {Pseudo-Exhaustive Testing of Sequential Machines Using Signature Analysis},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {320--326},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HassanM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Healy84,
  author       = {James T. Healy},
  title        = {An Information Processing Software System for {ATE}},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {497--505},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Healy84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HeardSDS84,
  author       = {Brian J. Heard and
                  Ramu N. Sheshadri and
                  Ronald B. David and
                  Arvid G. Sammuli},
  title        = {Automatic Test Pattern Generation for Asynchronous Networks},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {63--69},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HeardSDS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Henley84,
  author       = {Francois J. Henley},
  title        = {An Automated Laser Prober to Determine {VLSI} Internal Node Logic
                  States},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {536--542},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Henley84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HeretzM84,
  author       = {G. Heretz and
                  L. T. Matlock},
  title        = {A Real-time Executive for a Distributed Processing System},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {627--629},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HeretzM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HeuvelK84,
  author       = {Anthony P. van den Heuvel and
                  Noshir F. Khory},
  title        = {A Rational Basis for Setting Burn-In Yield Criteria},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {524--530},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Tue, 09 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HeuvelK84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Hirgelt84,
  author       = {Edward S. Hirgelt},
  title        = {Knowledge Representation in an In-Circuit Test Program Generator},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {773--777},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Hirgelt84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Hnatek84,
  author       = {Eugene R. Hnatek},
  title        = {Thoughts on {VLSI} Burn-in},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {531--535},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Hnatek84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HoffmanW84,
  author       = {Mark S. Hoffman and
                  Joseph F. Wrinn},
  title        = {Channel Card Architecture for Multimode Board Test Systems},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {589--597},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HoffmanW84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Holland84,
  author       = {Alexander Holland},
  title        = {High Resolution, High Linearity Interpolating {A/D} Converter},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {96--104},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Holland84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HughesM84,
  author       = {Joseph L. A. Hughes and
                  Edward J. McCluskey},
  title        = {An Analysis of the Multiple Fault Detection Capabilities of Single
                  Stuck-at Fault Test Sets},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {52--58},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HughesM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/HungerG84,
  author       = {Axel Hunger and
                  Axel G{\"{a}}rtner},
  title        = {Functional Characterization of Microprocessors},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {794--803},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Mon, 31 Oct 2016 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HungerG84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/JacksonME84,
  author       = {Philip C. Jackson and
                  Gregory de Mare and
                  Albert Esser},
  title        = {Compaction Technique Universal Pin Electronics},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {471--481},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/JacksonME84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Jacobson84,
  author       = {Robert G. Jacobson},
  title        = {{PAL} and Logic Array In-Circuit Testing Considerations},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {743--746},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Jacobson84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/JrP84,
  author       = {Gordon H. Bowers Jr. and
                  Bruce G. Pratt},
  title        = {"Low Cost Testers" : Are They Really Low Cost ?},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {40--51},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Mon, 08 Mar 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/JrP84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Khorram84,
  author       = {Ramin Khorram},
  title        = {Functional Test Pattern Generation for Integrated Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {246--249},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Khorram84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KimeKLW84,
  author       = {Charles R. Kime and
                  H. H. Kwan and
                  J. K. Lemke and
                  Gerald B. Williams},
  title        = {A Built-In Test Methodology for {VLSI} Data Paths},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {327--337},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KimeKLW84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/King84,
  author       = {Terence King},
  title        = {Advanced Test System Software Architecture Blends High Speed with
                  User Friendliness},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {606--613},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/King84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KinoshitaS84,
  author       = {Kozo Kinoshita and
                  Kewal K. Saluja},
  title        = {Built-in Testing of Memory Using On-chip Compact Testing Scheme},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {271--281},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Thu, 19 Feb 2004 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KinoshitaS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Kinsey84,
  author       = {Graeme R. Kinsey},
  title        = {Information and Material Flow Within a Production Test Cell},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {212--217},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Kinsey84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KizisW84,
  author       = {R. E. Kizis and
                  G. C. Wickham},
  title        = {Multi-Port Test Data Supply System},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {630--635},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KizisW84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Kombol84,
  author       = {A. J. Kombol},
  title        = {Processing of Test Data between Design and Testing},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {789--793},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Kombol84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KubanS84,
  author       = {John Kuban and
                  John Salick},
  title        = {Testability Features of the {MC68020}},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {821--826},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KubanS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KuollenspergerKSWWW84,
  author       = {P. K{\"{o}}llensperger and
                  A. Krupp and
                  Mathias Sturm and
                  R. Weyl and
                  F. Widulla and
                  Eckhard Wolfgang},
  title        = {Automated Electron Beam Testing of {VLSI} Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {550--557},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Tue, 14 Jan 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KuollenspergerKSWWW84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/KurzweilJ84,
  author       = {E. Kurzweil and
                  L. Jambut},
  title        = {Access Time Evaluation of Fast Static {MOS} Memories},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {263--270},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KurzweilJ84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Lee84,
  author       = {Terence Lee},
  title        = {In-Circuit Analog Component Testing at High Frequencies},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {455--461},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Lee84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LeeM84,
  author       = {S. Daniel Lee and
                  Tom Middleton},
  title        = {Behavioral Simulation of {VLSI} Test System Aids Debugging and Analysis
                  of Test Programs},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {614--620},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LeeM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LimayeRJ84,
  author       = {M. V. Limaye and
                  K. Rajanikanth and
                  H. S. Jamadagni},
  title        = {Disc Drive Testing Instrument},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {506--512},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LimayeRJ84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/LinS84,
  author       = {Tonysheng Lin and
                  Stephen Y. H. Su},
  title        = {Functional Test Generation of Digital {LSI/VLSI} Systems Using Machine
                  Symbolic Execution Technique},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {660--668},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/LinS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MalaiyaY84,
  author       = {Yashwant K. Malaiya and
                  Shoubao Yang},
  title        = {The Coverage Problem for Random Testing},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {237--245},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MalaiyaY84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MalikC84,
  author       = {Sushil K. Malik and
                  E. F. Chace},
  title        = {{MOS} Gate Oxide Quality Control and Reliability Assessment by Voltage
                  Ramping},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {384--389},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MalikC84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MalyFS84,
  author       = {Wojciech Maly and
                  F. Joel Ferguson and
                  John Paul Shen},
  title        = {Systematic Characterization of Physical Defects for Fault Analysis
                  of {MOS} {IC} Cells},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {390--399},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MalyFS84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Mandl84,
  author       = {Kenneth D. Mandl},
  title        = {{CMOS} {VLSI} Challenges to Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {642--648},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Mandl84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ManthaniR84,
  author       = {Sridhar R. Manthani and
                  Sudhakar M. Reddy},
  title        = {On {CMOS} Totally Self-Checking Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {866--877},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ManthaniR84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/McAnneyBG84,
  author       = {William H. McAnney and
                  Paul H. Bardell and
                  V. P. Gupta},
  title        = {Random Testing for Stuck-At Storage Cells in an Embedded Memory},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {157--166},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/McAnneyBG84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/MelgaraPRM84,
  author       = {M. Melgara and
                  M. Paolini and
                  R. Roncella and
                  S. Morpurgo},
  title        = {{CVT-FERT} : Automatic Generator of Analytical Faults at Register
                  Transfer Level from Electrical and Topological Descriptions},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {250--257},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MelgaraPRM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Mullis84,
  author       = {Robert Mullis},
  title        = {An Expert System for {VLSI} Tester Diagnostics},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {196--199},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Mullis84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Myers84,
  author       = {Mark A. Myers},
  title        = {DeltaI vs. DeltaY : {A} Quantitative Analysis of the Trade-offs Between
                  Higher Capital Investment and Higher Yield in {PCB} Testing},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {8--19},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Myers84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/NishimuraHH84,
  author       = {Y. Nishimura and
                  Mitsuhiro Hamada and
                  Y. Hayasaka},
  title        = {A New Timing Calibration Method for High Speed Memory Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {113--117},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Wed, 16 Dec 2015 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/NishimuraHH84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PittmanB84,
  author       = {J. S. Pittman and
                  William C. Bruce},
  title        = {Test Logic Economic Considerations in a Commercial {VLSI} Chip Environment},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {31--39},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Mon, 28 Aug 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/PittmanB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/PoolHLC84,
  author       = {F. Pool and
                  J. Hop and
                  J. P. L. Lagerberg and
                  C. Da Costa},
  title        = {Testing a 317K bit High Speed Video Memory with a {VSLI} Test System},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {294--301},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/PoolHLC84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/RatfordG84,
  author       = {Vin Ratford and
                  Mike Gill},
  title        = {Software Verification Techniques},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {621--626},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RatfordG84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Raymond84,
  author       = {Douglas W. Raymond},
  title        = {In-Circuit Testability Factors: Shoot With a Rifle},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {572--580},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Raymond84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Robinson84,
  author       = {Gordon D. Robinson},
  title        = {Artificial Intelligence and Testing},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {200--205},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Robinson84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/RothOB84,
  author       = {J. Paul Roth and
                  Vojin G. Oklobdzija and
                  John F. Beetem},
  title        = {Test Generation for {FET} Switching Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {59--62},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RothOB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Sacher84,
  author       = {Eric Sacher},
  title        = {Component Level Fault-Isolation Techniques in a Systems Test Environment},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {489--492},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Sacher84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SasakiKNT84,
  author       = {Tohru Sasaki and
                  Shunichi Kato and
                  Nobuyoshi Nomizu and
                  Hidetoshi Tanaka},
  title        = {Logic Design Verification Using Automated Test Generation},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {88--95},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SasakiKNT84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SatohTKST84,
  author       = {Tadaaki Satoh and
                  Akira Takagi and
                  Masami Kita and
                  Katsuhiko Shirakawa and
                  Shimpei Takeshita},
  title        = {21-Bit Precision and High-Speed {DC} Measurement System},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {123--133},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SatohTKST84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SavariaARH84,
  author       = {Yvon Savaria and
                  Vinod K. Agarwal and
                  Nicholas C. Rumin and
                  Jeremiah F. Hayes},
  title        = {A Design for Machines with Built-In Tolerance to Soft Errors},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {649--659},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SavariaARH84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Shirachi84,
  author       = {Douglas K. Shirachi},
  title        = {{CODEC} Testing Using Synchronized Analog and Digital Signals},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {447--454},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Shirachi84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Singer84,
  author       = {David M. Singer},
  title        = {Testability Analysis of {MOS} {VLSI} Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {690--696},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Singer84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Sloane84,
  author       = {E. A. Sloane},
  title        = {Transfer Function Estimation Part {I} : Theoretical and Practical
                  Considerations},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {426--439},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Sloane84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SmithR84,
  author       = {Leslie Turner Smith and
                  Roy R. Rezac},
  title        = {Methodology for and Results from the Use of a Hardware Logic Simulation
                  Engine for Fault Simulation},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {224--228},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SmithR84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Starke84,
  author       = {Corot W. Starke},
  title        = {Built-In Test for {CMOS} Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {309--314},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Mon, 19 Jun 2006 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Starke84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/SunW84,
  author       = {Zuhi Sun and
                  Laung{-}Terng Wang},
  title        = {Self-Testing of Embedded RAMs},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {148--156},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SunW84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Susskind84,
  author       = {Alfred K. Susskind},
  title        = {A Technique for Making Asynchronous Sequential Circuits Readily Testable},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {842--846},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Susskind84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Teta84,
  author       = {Stephen R. Teta},
  title        = {Using a Synchronous High-Speed Sensor System to Diagnose Microprocessor
                  Boards},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {564--571},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Teta84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Trischler84,
  author       = {Erwin Trischler},
  title        = {ATWIG, An Automatic Test Pattern Generator with Inherent Guidance},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {80--87},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Trischler84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Turino84,
  author       = {Jon Turino},
  title        = {A Totally Universal Reset, Initialization (and) Nodal Observation
                  Circuit},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {878--884},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Turino84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/UnderwoodM84,
  author       = {Bill Underwood and
                  M. Ray Mercer},
  title        = {Correlating Testability with Fault Detection},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {697--704},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/UnderwoodM84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/VarmaAB84,
  author       = {Prab Varma and
                  Anthony P. Ambler and
                  Keith Baker},
  title        = {An Analysis of the Economics of Self Test},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {20--30},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/VarmaAB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Voitus84,
  author       = {R. F. Voitus},
  title        = {{PBX} System Test: Fast Functional Testing Without System Assembly},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {482--488},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Voitus84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/WadaTK84,
  author       = {Kou Wada and
                  Satoshi Tazawa and
                  Katsutoshi Kubota},
  title        = {A Flexible Database System and Its Application in {VLSI} Process Development},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {359--366},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WadaTK84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Wang84,
  author       = {F. C. Wang},
  title        = {Testability Analysis: What Role Should it Play in {IC} Design ?},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {725--727},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Wang84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/WatkinsLSP84,
  author       = {Steven L. Watkins and
                  Kenny Liu and
                  Mitchell Schrift and
                  Robert Patrie},
  title        = {C : An Important Tool for Test Software Development},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {636--641},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WatkinsLSP84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/WesterhoffD84,
  author       = {Todd Westerhoff and
                  Andre DiMino},
  title        = {The Role of the Engineering Work Station in Test Program Development},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {493--496},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WesterhoffD84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Wheater84,
  author       = {Donald L. Wheater},
  title        = {IBM's Cost Performance Array Tester Architecture for the 80's},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {466--470},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Wheater84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Wilkinson84,
  author       = {A. Jesse Wilkinson},
  title        = {A Method for Test System Diagnostics Based on the Principles of Artificial
                  Intelligence},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {188--195},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Wilkinson84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Williams84,
  author       = {Tom W. Williams},
  title        = {Sufficient Testing In {A} Self-Testing Environment},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {167--173},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Mon, 19 Jun 2006 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/Williams84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/Willoner84,
  author       = {Robert Willoner},
  title        = {The Importance of Fault Simulation},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {728--729},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/Willoner84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/WilsonH84,
  author       = {Beau R. Wilson Jr. and
                  Eugene R. Hnatek},
  title        = {Problems Encountered in Developing {VLSI} Test Programs for {COT}
                  {(A} Practical Outlook)},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {778--788},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Wed, 24 Jan 2007 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WilsonH84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/WuRB84,
  author       = {David M. Wu and
                  Charles E. Radke and
                  C. C. Beh},
  title        = {Improve Yield and Quality Through Testability Analysis of {VLSI} Circuits},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {713--717},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WuRB84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ZorianA84,
  author       = {Yervant Zorian and
                  Vinod K. Agarwal},
  title        = {Higher Certainty of Error Coverage by Output Data Modification},
  booktitle    = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  pages        = {140--147},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ZorianA84.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc/1984,
  title        = {Proceedings International Test Conference 1984, Philadelphia, PA,
                  USA, October 1984},
  publisher    = {{IEEE} Computer Society},
  year         = {1984},
  timestamp    = {Fri, 22 Nov 2002 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/1984.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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