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@inproceedings{DBLP:conf/dft/AbbatiUPCZHMCIV21,
author = {L. Degli Abbati and
Rudolf Ullmann and
G. Paganini and
M. Coppetta and
L. Zaia and
Vincent Huard and
O. Montfort and
Riccardo Cantoro and
Giorgio Insinga and
F. Venini and
P. Calao and
Paolo Bernardi},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Industrial best practice: cases of study by automotive chip- makers},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568350},
doi = {10.1109/DFT52944.2021.9568350},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/AbbatiUPCZHMCIV21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/AndjelkovicSBCK21,
author = {Marko S. Andjelkovic and
Oliver Schrape and
Anselm Breitenreiter and
Junchao Chen and
Milos Krstic},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Tunable Single Event Transient Filter Based on Digitally Controlled
Capacitive Delay Cells},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568355},
doi = {10.1109/DFT52944.2021.9568355},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/AndjelkovicSBCK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/AnikDDEFGKPT21,
author = {Md Toufiq Hasan Anik and
Jean{-}Luc Danger and
Omar Diankha and
Mohammad Ebrahimabadi and
Christoph Frisch and
Sylvain Guilley and
Naghmeh Karimi and
Michael Pehl and
Sofiane Takarabt},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Testing and Reliability Enhancement of Security Primitives},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568297},
doi = {10.1109/DFT52944.2021.9568297},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/AnikDDEFGKPT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BalakrishnanMGH21,
author = {Aneesh Balakrishnan and
Guilherme Cardoso Medeiros and
Cemil Cem G{\"{u}}rsoy and
Said Hamdioui and
Maksim Jenihhin and
Dan Alexandrescu},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Modeling Soft-Error Reliability Under Variability},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568295},
doi = {10.1109/DFT52944.2021.9568295},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/BalakrishnanMGH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BarbirottaCMMVO21,
author = {Marcello Barbirotta and
Abdallah Cheikh and
Antonio Mastrandrea and
Francesco Menichelli and
Francesco Vigli and
Mauro Olivieri},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Fault Tolerant soft-core obtained from an Interleaved-Multi- Threading
{RISC-} {V} microprocessor design},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568368},
doi = {10.1109/DFT52944.2021.9568368},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/BarbirottaCMMVO21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BelliziaMFPRSTV21,
author = {Davide Bellizia and
Nadia El Mrabet and
Apostolos P. Fournaris and
Simon Ponti{\'{e}} and
Francesco Regazzoni and
Fran{\c{c}}ois{-}Xavier Standaert and
{\'{E}}lise Tasso and
Emanuele Valea},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Post-Quantum Cryptography: Challenges and Opportunities for Robust
and Secure {HW} Design},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568301},
doi = {10.1109/DFT52944.2021.9568301},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/BelliziaMFPRSTV21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BolchiniCMM21,
author = {Cristiana Bolchini and
Luca Cassano and
Andrea Mazzeo and
Antonio Miele},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Usability-based Cross-Layer Reliability Evaluation of Image Processing
Applications},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568307},
doi = {10.1109/DFT52944.2021.9568307},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/BolchiniCMM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BurelEA21,
author = {St{\'{e}}phane Burel and
Adrian Evans and
Lorena Anghel},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Zero-Overhead Protection for {CNN} Weights},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568363},
doi = {10.1109/DFT52944.2021.9568363},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BurelEA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChangCHL21,
author = {Wei Chang and
Yu{-}Guang Chen and
Po{-}Yeh Huang and
Jin{-}Fu Li},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {An Aging-Aware {CMOS} {SRAM} Structure Design for Boolean Logic In-Memory
Computing},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568343},
doi = {10.1109/DFT52944.2021.9568343},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/ChangCHL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChapmanNMKKM21,
author = {Glenn H. Chapman and
Simone Neufeld and
Klinsmann J. Coelho Silva Meneses and
Israel Koren and
Zahava Koren},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Dependence of SEUs in Digital Cameras on Pixel size and Elevation},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568337},
doi = {10.1109/DFT52944.2021.9568337},
timestamp = {Mon, 24 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/ChapmanNMKKM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChenLB21,
author = {Dake Chen and
Chunxiao Lin and
Peter A. Beerel},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {GF-Flush: {A} {GF(2)} Algebraic Attack on Dynamically Secured Scan
Chains},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568356},
doi = {10.1109/DFT52944.2021.9568356},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/ChenLB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CorneliouNMT21,
author = {Panayiotis Corneliou and
Panagiota Nikolaou and
Maria K. Michael and
Theocharis Theocharides},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Fine-Grained Vulnerability Analysis of Resource Constrained Neural
Inference Accelerators},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568281},
doi = {10.1109/DFT52944.2021.9568281},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/CorneliouNMT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GaoWDR21,
author = {Zhen Gao and
Ruize Wang and
Haoyu Du and
Pedro Reviriego},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Analysis and Evaluation of the Effects of Single Event Upsets {(SEU}
s) on Memories in Polar Decoders},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568336},
doi = {10.1109/DFT52944.2021.9568336},
timestamp = {Thu, 21 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/GaoWDR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GaoXR21,
author = {Zhen Gao and
Jiajun Xiao and
Pedro Reviriego},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Reliability Evaluation of Digital Channelizers Implemented on {SRAM}
- FPGAs},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568339},
doi = {10.1109/DFT52944.2021.9568339},
timestamp = {Thu, 21 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/GaoXR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GeorgakidisLSS21,
author = {Christos Georgakidis and
Iordanis Lilitsis and
Georgios Stanimeropoulos and
Christos P. Sotiriou},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {RADPlace: {A} Timing-aware RAdiation-Hardening Detailed Placement
Scheme Satisfying {TMR} Spacing Constraints},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568290},
doi = {10.1109/DFT52944.2021.9568290},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/GeorgakidisLSS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GhoshalSYZKP21,
author = {Nabanita Ghoshal and
Sree Rama K. C. Saraswatula and
Santosh Yachareni and
Shidong Zhou and
Anil Kumar Kandala and
Narendra Kumar Pulipati},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Mitigation of the impact of across chip systematic process variation
using a novel system level design},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568294},
doi = {10.1109/DFT52944.2021.9568294},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/GhoshalSYZKP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GuptaPKMJO21,
author = {Vishal Gupta and
Giulio Panunzi and
Saurabh Khandelwal and
Eugenio Martinelli and
Abusaleh M. Jabir and
Marco Ottavi},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Reliability Assessment of Memristor based Gas Sensor Array},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568304},
doi = {10.1109/DFT52944.2021.9568304},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/GuptaPKMJO21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/IchiharaFI21,
author = {Hideyuki Ichihara and
Takayuki Fukuda and
Tomoo Inoue},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Design of Reliable Linear FSMs with Equivalent States in Stochastic
Computing},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568312},
doi = {10.1109/DFT52944.2021.9568312},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/IchiharaFI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/JainC21,
author = {Vijay K. Jain and
Glenn H. Chapman},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Fault Tolerance for Islandable-Microgrid Sensors},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568353},
doi = {10.1109/DFT52944.2021.9568353},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/JainC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KajaGVRPHDE21,
author = {Endri Kaja and
Nicolas Gerlin and
Mounika Vaddeboina and
Luis Rivas and
Sebastian Siegfried Prebeck and
Zhao Han and
Keerthikumara Devarajegowda and
Wolfgang Ecker},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Towards Fault Simulation at Mixed Register-Transfer/Gate-Level Models},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568310},
doi = {10.1109/DFT52944.2021.9568310},
timestamp = {Tue, 23 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KajaGVRPHDE21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KazemiNKFHB21,
author = {Zahra Kazemi and
Amin Norollah and
Afef Kchaou and
Mahdi Fazeli and
David H{\'{e}}ly and
Vincent Beroulle},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {An In-Depth Vulnerability Analysis of {RISC-V} Micro-Architecture
Against Fault Injection Attack},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568318},
doi = {10.1109/DFT52944.2021.9568318},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/KazemiNKFHB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KhelifLR21,
author = {Mohamed Amine Khelif and
Jordane Lorandel and
Olivier Romain},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Non-invasive {I2C} Hardware Trojan Attack Vector},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568347},
doi = {10.1109/DFT52944.2021.9568347},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/KhelifLR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KumarM21,
author = {Sandeep Kumar and
Atin Mukherjee},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Self-Healing, High Performance and Low-Cost Radiation Hardened Latch
Design},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568359},
doi = {10.1109/DFT52944.2021.9568359},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/KumarM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MalekzadehRLE21,
author = {Elaheh Malekzadeh and
Nezam Rohbani and
Zhonghai Lu and
Masoumeh Ebrahimi},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {The Impact of Faults on DNNs: {A} Case Study},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568340},
doi = {10.1109/DFT52944.2021.9568340},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/MalekzadehRLE21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MercierKKHC21,
author = {Romain Mercier and
C{\'{e}}dric Killian and
Angeliki Kritikakou and
Youri Helen and
Daniel Chillet},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Region-Based Bit-Shuffling Approach Trading Hardware Cost and Fault
Mitigation Efficiency},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568366},
doi = {10.1109/DFT52944.2021.9568366},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/MercierKKHC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MertenHD21,
author = {Marcel Merten and
Sebastian Huhn and
Rolf Drechsler},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Codeword-based Compactor for On-Chip Generated Debug Data Using
Two-Stage Artificial Neural Networks},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568298},
doi = {10.1109/DFT52944.2021.9568298},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/MertenHD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/NarangVKH21,
author = {Anuraag Narang and
Balaji Venn and
S. Saqib Khursheed and
Peter Harrod},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {An Exploration of Microprocessor Self-Test Optimisation Based On Safe
Faults},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568326},
doi = {10.1109/DFT52944.2021.9568326},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/NarangVKH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PalumboCRBO21,
author = {Alessandro Palumbo and
Luca Cassano and
Pedro Reviriego and
Giuseppe Bianchi and
Marco Ottavi},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Lightweight Security Checking Module to Protect Microprocessors
against Hardware Trojan Horses},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568291},
doi = {10.1109/DFT52944.2021.9568291},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/PalumboCRBO21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Pomeranz21,
author = {Irith Pomeranz},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Zoom-In Feature for Storage-Based Logic Built-In Self-Test},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568357},
doi = {10.1109/DFT52944.2021.9568357},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/Pomeranz21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SavanurT21,
author = {Puneet Ramesh Savanur and
Spyros Tragoudas},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {A Fault Model to Detect Design Errors in Combinational Circuits},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568351},
doi = {10.1109/DFT52944.2021.9568351},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/SavanurT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SelgJE21,
author = {Hardi Selg and
Maksim Jenihhin and
Peeter Ellervee},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {J{\"{A}}NES: {A} {NAS} Framework for ML-based {EDA} Applications},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568321},
doi = {10.1109/DFT52944.2021.9568321},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/SelgJE21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SimoglouSB21,
author = {Stavros Simoglou and
Christos P. Sotiriou and
Nikolaos Blias},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Static Timing Analysis Induced Simulation Errors for Asynchronous
Circuits},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568296},
doi = {10.1109/DFT52944.2021.9568296},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/SimoglouSB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SioAPS21,
author = {Corrado De Sio and
Sarah Azimi and
Andrea Portaluri and
Luca Sterpone},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {{SEU} Evaluation of Hardened-by-Replication Software in {RISC-} {V}
Soft Processor},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568342},
doi = {10.1109/DFT52944.2021.9568342},
timestamp = {Sat, 02 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/SioAPS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SouvatzoglouPSV21,
author = {Ioanna Souvatzoglou and
Athanasios Papadimitriou and
Aitzan Sari and
Vasileios Vlagkoulis and
Mihalis Psarakis},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {Analyzing the Single Event Upset Vulnerability of Binarized Neural
Networks on {SRAM} FPGAs},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568280},
doi = {10.1109/DFT52944.2021.9568280},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/SouvatzoglouPSV21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ThometPDBARGR21,
author = {S{\'{e}}bastien Thomet and
Serge De Paoli and
Jean{-}Marc Daveau and
Val{\'{e}}rie Bertin and
Fady Abouzeid and
Philippe Roche and
Fakhreddine Ghaffari and
Olivier Romain},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {{FIRECAP:} Fail-Reason Capturing hardware module for a {RISC-V} based
System on a Chip},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568317},
doi = {10.1109/DFT52944.2021.9568317},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ThometPDBARGR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TsoumanisPES21,
author = {Pelopidas Tsoumanis and
Georgios Ioannis Paliaroutis and
Nestoras E. Evmorfopoulos and
George I. Stamoulis},
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {On the Impact of Electrical Masking and Timing Analysis on Soft Error
Rate Estimation in Deep Submicron Technologies},
booktitle = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021.9568306},
doi = {10.1109/DFT52944.2021.9568306},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/TsoumanisPES21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2021,
editor = {Luigi Dilillo and
Luca Cassano and
Athanasios Papadimitriou},
title = {36th {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2021, Athens, Greece,
October 6-8, 2021},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/DFT52944.2021},
doi = {10.1109/DFT52944.2021},
isbn = {978-1-6654-1609-2},
timestamp = {Fri, 22 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/2021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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