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@inproceedings{DBLP:conf/date/AbbasZH16,
  author       = {Haider Abbas and
                  Mark Zwolinski and
                  Basel Halak},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Static Aging Analysis Using 3-Dimensional Delay Library},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {34--37},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper9.pdf},
  timestamp    = {Fri, 10 Mar 2023 16:22:47 +0100},
  biburl       = {https://dblp.org/rec/conf/date/AbbasZH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/BenhassainCHA16,
  author       = {Ahmed Benhassain and
                  Florian Cacho and
                  Vincent Huard and
                  Lorena Anghel},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Early failure prediction by using in-situ monitors: Implementation
                  and application results},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {21--24},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper6.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/BenhassainCHA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/DebVD16,
  author       = {Abhijit K. Deb and
                  Bart Vermeulen and
                  Luc van Dijk},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Overview of Health Monitoring Techniques for Reliability},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {30--33},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper8.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/DebVD16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/DuanHWZ16,
  author       = {Shengyu Duan and
                  Basel Halak and
                  Rick Wong and
                  Mark Zwolinski},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {{NBTI} Lifetime Evaluation and Extension in Instruction Caches},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {9--12},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper3.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/DuanHWZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/HillebrandHPP16,
  author       = {Theodor Hillebrand and
                  Nico Hellwege and
                  Steffen Paul and
                  Dagmar Peters{-}Drolshagen},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Reliability-aware design method for {CMOS} circuits},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {17--20},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper5.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/HillebrandHPP16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/NamaziA16,
  author       = {Alireza Namazi and
                  Meisam Abdollahi},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {{LPVM:} Low-Power Variation-Mitigant Adder Architecture Using Carry
                  Expedition},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {41--44},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper11.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/NamaziA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/NawiHZ16,
  author       = {Illani Mohd Nawi and
                  Basel Halak and
                  Mark Zwolinski},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Ageing Impact on a High Speed Voltage Comparator with Hysteresis},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {25--29},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper7.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/NawiHZ16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/OborilT16,
  author       = {Fabian Oboril and
                  Mehdi Baradaran Tahoori},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Cross-Layer Approaches for an Aging-Aware Design Space Exploration
                  for Microprocessors},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {5--8},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper2.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/OborilT16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/RodopoulosRCSS16,
  author       = {Dimitrios Rodopoulos and
                  Philippe Roussel and
                  Francky Catthoor and
                  Yiannakis Sazeides and
                  Dimitrios Soudris},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Approximating Standard Cell Delay Distributions by Reformulating the
                  Most Probable Failure Point},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {13--16},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper4.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/RodopoulosRCSS16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SelimJD16,
  author       = {Mohamed Selim and
                  Eric Jeandeau and
                  Cyril Descl{\`{e}}ves},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Design-Reliability Flow and Advanced Models Address IC-Reliability
                  Issues},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {1--4},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper1.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/SelimJD16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/date/SivadasanCBHA16a,
  author       = {Ajith Sivadasan and
                  Florian Cacho and
                  Sidi Ahmed Benhassain and
                  Vincent Huard and
                  Lorena Anghel},
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Workload Impact on {BTI} {HCI} Induced Aging of Digital Circuits:
                  {A} System level Analysis},
  booktitle    = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  pages        = {38--40},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566/Paper10.pdf},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/SivadasanCBHA16a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/date/2016ermavss,
  editor       = {Adrian Evans and
                  Stefano Di Carlo and
                  Praveen Raghavan and
                  Dimitris Gizopoulos},
  title        = {Proceedings of the Workshop on Early Reliability Modeling for Aging
                  and Variability in Silicon Systems, {ERMAVSS} 2016, co-located with
                  {IEEE/ACM} Design, Automation and Test in Europe Conference {(DATE}
                  2016), Dresden, Germany, March 18, 2016},
  series       = {{CEUR} Workshop Proceedings},
  volume       = {1566},
  publisher    = {CEUR-WS.org},
  year         = {2016},
  url          = {https://ceur-ws.org/Vol-1566},
  timestamp    = {Fri, 10 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/date/2016ermavss.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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