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@inproceedings{DBLP:conf/itc/ArgyridesTHZ23,
author = {Costas Argyrides and
Grigor Tshagharyan and
Gurgen Harutyunyan and
Yervant Zorian},
title = {Utilizing {ECC} Analytics to Improve Memory Lifecycle Management},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {383--387},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00057},
doi = {10.1109/ITC51656.2023.00057},
timestamp = {Tue, 09 Jan 2024 17:03:11 +0100},
biburl = {https://dblp.org/rec/conf/itc/ArgyridesTHZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ArunachalamDRSJ23,
author = {Ayush Arunachalam and
Sanjay Das and
Monikka Rajan and
Fei Su and
Xiankun Jin and
Suvadeep Banerjee and
Arnab Raha and
Suriyaprakash Natarajan and
Kanad Basu},
title = {Enhanced ML-Based Approach for Functional Safety Improvement in Automotive
{AMS} Circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {266--275},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00043},
doi = {10.1109/ITC51656.2023.00043},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ArunachalamDRSJ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AtamanKRO23,
author = {Ferhat Can Ataman and
Y. B. Chethan Kumar and
Sandeep Rao and
Sule Ozev},
title = {Improving Angle of Arrival Estimation Accuracy for mm-Wave Radars},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {30--36},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00013},
doi = {10.1109/ITC51656.2023.00013},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AtamanKRO23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BabanOSCBBKC23,
author = {Navajit Singh Baban and
Ajymurat Orozaliev and
Yong{-}Ak Song and
Urbi Chatterjee and
Sankalp Bose and
Sukanta Bhattacharjee and
Ramesh Karri and
Krishnendu Chakrabarty},
title = {Biochip-PUF: Physically Unclonable Function for Microfluidic Biochips},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {166--175},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00033},
doi = {10.1109/ITC51656.2023.00033},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BabanOSCBBKC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChandraKPTGSNTA23,
author = {Anshuman Chandra and
Moiz Khan and
Ankita Patidar and
Fumiaki Takashima and
Sandeep Kumar Goel and
Bharath Shankaranarayanan and
Vuong Nguyen and
Vistrita Tyagi and
Manish Arora},
title = {A Case Study on {IEEE} 1838 Compliant Multi-Die 3DIC {DFT} Implementation},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {11--20},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00011},
doi = {10.1109/ITC51656.2023.00011},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChandraKPTGSNTA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangKPHLHCK23,
author = {Daehyun Chang and
Youngdae Kim and
Suksoo Pyo and
Shin Hun and
Daesop Lee and
Sohee Hwang and
Jaesik Choi and
Siwoong Kim},
title = {Algorithmic Read Resistance Trim for Improving Yield and Reducing
Test Time in {MRAM}},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {87--92},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00022},
doi = {10.1109/ITC51656.2023.00022},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangKPHLHCK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevendhiranJUSD23,
author = {Manoj Devendhiran and
Jakub Janicki and
Szczepan Urban and
Manish Sharma and
Jayant D'Souza},
title = {Predicting the Resolution of Scan Diagnosis},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {303--309},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00047},
doi = {10.1109/ITC51656.2023.00047},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevendhiranJUSD23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DrayGNZRYKSK23,
author = {Cyrille Dray and
Khushal Gelda and
Benoit Nadeau{-}Dostie and
Wei Zou and
Luc Romain and
Jongsin Yun and
Harshitha Kodali and
Lori Schramm and
Martin Keim},
title = {Transitioning eMRAM from Pilot Project to Volume Production},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {82--86},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00021},
doi = {10.1109/ITC51656.2023.00021},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DrayGNZRYKSK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DubeyA23,
author = {Anuj Dubey and
Aydin Aysu},
title = {A Full-Stack Approach for Side-Channel Secure {ML} Hardware},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {186--195},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00035},
doi = {10.1109/ITC51656.2023.00035},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DubeyA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DupreeYZW23,
author = {Matthew Dupree and
Min Jian Yang and
Yueling Jenny Zeng and
Li{-}C. Wang},
title = {IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {122--131},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00028},
doi = {10.1109/ITC51656.2023.00028},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DupreeYZW23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EikiNKISS23,
author = {Makoto Eiki and
Tomoki Nakamura and
Masuo Kajiyama and
Michiko Inoue and
Takashi Sato and
Michihiro Shintani},
title = {Improving Efficiency and Robustness of Gaussian Process Based Outlier
Detection via Ensemble Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {132--140},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00029},
doi = {10.1109/ITC51656.2023.00029},
timestamp = {Mon, 17 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/EikiNKISS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GhasemiMKGT23,
author = {Seyedeh Maryam Ghasemi and
Sergej Meschkov and
Jonas Krautter and
Dennis R. E. Gnad and
Mehdi B. Tahoori},
title = {Enabling In-Field Parametric Testing for {RISC-V} Cores},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {367--376},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00054},
doi = {10.1109/ITC51656.2023.00054},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GhasemiMKGT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gizopoulos0C23,
author = {Dimitris Gizopoulos and
George Papadimitriou and
Odysseas Chatzopoulos},
title = {Estimating the Failures and Silent Errors Rates of CPUs Across ISAs
and Microarchitectures},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {377--382},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00056},
doi = {10.1109/ITC51656.2023.00056},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gizopoulos0C23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuWCWGLGWYZZC23,
author = {Yunfei Gu and
Xingyu Wang and
Zixiao Chen and
Chentao Wu and
Xinfei Guo and
Jie Li and
Minyi Guo and
Song Wu and
Rong Yuan and
Taile Zhang and
Yawen Zhang and
Haoran Cai},
title = {Improving Productivity and Efficiency of {SSD} Manufacturing Self-Test
Process by Learning-Based Proactive Defect Prediction},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {226--235},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00039},
doi = {10.1109/ITC51656.2023.00039},
timestamp = {Thu, 25 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuWCWGLGWYZZC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolzhausenFTMF23,
author = {Ryan Holzhausen and
Tasnuva Farheen and
Morgan Thomas and
Nima Maghari and
Domenic Forte},
title = {Laser Fault Injection Vulnerability Assessment and Mitigation with
Case Study on {PG-TVD} Logic Cells},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {330--339},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00050},
doi = {10.1109/ITC51656.2023.00050},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HolzhausenFTMF23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsiaoTWLWC23,
author = {Sam M.{-}H. Hsiao and
Amy H.{-}Y. Tsai and
Lowry P.{-}T. Wang and
Aaron C.{-}W. Liang and
Charles H.{-}P. Wen and
Herming Chiueh},
title = {Preventing Single-Event Double-Node Upsets by Engineering Change Order
in Latch Designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {276--285},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00044},
doi = {10.1109/ITC51656.2023.00044},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HsiaoTWLWC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsiehLLNCB23,
author = {Bing{-}Han Hsieh and
Yun{-}Sheng Liu and
James Chien{-}Mo Li and
Chris Nigh and
Mason Chern and
Gaurav Bhargava},
title = {Diagnosis of Systematic Delay Failures Through Subset Relationship
Analysis},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {293--302},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00046},
doi = {10.1109/ITC51656.2023.00046},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsiehLLNCB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HungCBC23,
author = {Shao{-}Chun Hung and
Arjun Chaudhuri and
Sanmitra Banerjee and
Krishnendu Chakrabarty},
title = {Scan Cell Segmentation Based on Reinforcement Learning for Power-Safe
Testing of Monolithic 3D ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {216--225},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00038},
doi = {10.1109/ITC51656.2023.00038},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HungCBC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IwataMMLKMM23,
author = {Hiroyuki Iwata and
Yoichi Maeda and
Jun Matsushima and
Oussama Laouamri and
Naveen Khanna and
Jeff Mayer and
Nilanjan Mukherjee},
title = {A New Framework for {RTL} Test Points Insertion Facilitating a "Shift-Left
DFT" Strategy},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {1--10},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00010},
doi = {10.1109/ITC51656.2023.00010},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IwataMMLKMM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JafarzadehKRNAH23,
author = {Hanieh Jafarzadeh and
Florian Klemme and
Jan Dennis Reimer and
Zahra Paria Najafi{-}Haghi and
Hussam Amrouch and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Robust Pattern Generation for Small Delay Faults Under Process Variations},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {111--116},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00026},
doi = {10.1109/ITC51656.2023.00026},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JafarzadehKRNAH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KandulaKTHZ23,
author = {Kranthi Kandula and
Ramalingam Kolisetti and
Grigor Tshagharyan and
Gurgen Harutyunyan and
Yervant Zorian},
title = {{SLM} Subsystem for Automotive SoC: Case Study on Path Margin Monitor},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {388--392},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00058},
doi = {10.1109/ITC51656.2023.00058},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KandulaKTHZ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KibriaFT23,
author = {Rasheed Kibria and
Farimah Farahmandi and
Mark M. Tehranipoor},
title = {{ARC-FSM-G:} Automatic Security Rule Checking for Finite State Machine
at the Netlist Abstraction},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {320--329},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00049},
doi = {10.1109/ITC51656.2023.00049},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KibriaFT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KomarrajuTAC23,
author = {Suhasini Komarraju and
Akhil Tammana and
Chandramouli N. Amarnath and
Abhijit Chatterjee},
title = {{OATT:} Outlier Oriented Alternative Testing and Post-Manufacture
Tuning of Mixed-Signal/RF Circuits and Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {37--46},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00014},
doi = {10.1109/ITC51656.2023.00014},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KomarrajuTAC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KongalaGWJ23,
author = {Sudhakar Kongala and
Anuj Gupta and
Yash Walia and
Sahil Jain},
title = {Novel Methodology to Optimize {TAT} and Resource Utilization for {ATPG}
Simulations for Large SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {60--64},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00017},
doi = {10.1109/ITC51656.2023.00017},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KongalaGWJ23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeKPWC23,
author = {Seongkwan Lee and
Minho Kang and
Cheolmin Park and
Jun Yeon Won and
Jaemoo Choi},
title = {Method for Adjusting Termination Resistance Using {PMU} in {DC} Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {77--81},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00020},
doi = {10.1109/ITC51656.2023.00020},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeKPWC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeWPKC23,
author = {Seongkwan Lee and
Jun Yeon Won and
Cheolmin Park and
Minho Kang and
Jaemoo Choi},
title = {Method for Diagnosing Channel Damage Using {FPGA} Transceiver},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {71--76},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00019},
doi = {10.1109/ITC51656.2023.00019},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeWPKC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LefevreDGV23,
author = {J. Lefevre and
P. Debaud and
Patrick Girard and
Arnaud Virazel},
title = {Predictor {BIST:} An "All-in-One" Optical Test Solution for {CMOS}
Image Sensors},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {310--319},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00048},
doi = {10.1109/ITC51656.2023.00048},
timestamp = {Tue, 18 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LefevreDGV23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiX23,
author = {Yu Li and
Qiang Xu},
title = {Towards Robust Deep Neural Networks Against Design-Time and Run-Time
Failures},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {196--205},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00036},
doi = {10.1109/ITC51656.2023.00036},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiX23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiangLLWHYY23,
author = {Huaxiao Liang and
Xiaoze Lin and
Liyang Lai and
Naixing Wang and
Yu Huang and
Fei Yang and
Yuxin Yang},
title = {GPU-Based Concurrent Static Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {159--165},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00032},
doi = {10.1109/ITC51656.2023.00032},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiangLLWHYY23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiangWYLCKL23,
author = {Zhe{-}Jia Liang and
Yu{-}Tsung Wu and
Yun{-}Feng Yang and
James Chien{-}Mo Li and
Norman Chang and
Akhilesh Kumar and
Ying{-}Shiun Li},
title = {High-Speed, Low-Storage Power and Thermal Predictions for {ATPG} Test
Patterns},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {206--215},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00037},
doi = {10.1109/ITC51656.2023.00037},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiangWYLCKL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuYLWC23,
author = {Ching{-}Min Liu and
Chia{-}Heng Yen and
Shu{-}Wen Lee and
Kai{-}Chiang Wu and
Mango Chia{-}Tso Chao},
title = {Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level
Defect Pattern Information},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {357--366},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00053},
doi = {10.1109/ITC51656.2023.00053},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuYLWC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LorenzelliEGGKL23,
author = {Francesco Lorenzelli and
Asser Elsayed and
Clement Godfrin and
Alexander Grill and
Stefan Kubicek and
Ruoyu Li and
Michele Stucchi and
Danny Wan and
Kristiaan De Greve and
Erik Jan Marinissen and
Georges G. E. Gielen},
title = {Wafer-Scale Electrical Characterization of Silicon Quantum Dots from
Room to Low Temperatures},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {151--158},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00031},
doi = {10.1109/ITC51656.2023.00031},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LorenzelliEGGKL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LyuYLH23,
author = {Yinxuan Lyu and
Liangliang Yu and
Pengju Li and
Junlin Huang},
title = {Logic Test Vehicles for High Resolution Diagnosis of Systematic {FEOL/MEOL}
Yield Detractors},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {117--121},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00027},
doi = {10.1109/ITC51656.2023.00027},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LyuYLH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NandakumarC23,
author = {Bharath Nandakumar and
Sameer Chillarige},
title = {Low cost production scan chain test for compression based designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {350--356},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00052},
doi = {10.1109/ITC51656.2023.00052},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NandakumarC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OrtegaBJTPC23,
author = {Eduardo Ortega and
Tyler K. Bletsch and
Biresh Kumar Joardar and
Jonti Talukdar and
Woohyun Paik and
Krishnendu Chakrabarty},
title = {Simply-Track-and-Refresh: Efficient and Scalable Rowhammer Mitigation},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {340--349},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00051},
doi = {10.1109/ITC51656.2023.00051},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OrtegaBJTPC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz23,
author = {Irith Pomeranz},
title = {Compaction of Functional Broadside Tests for Path Delay Faults Using
Clusters of Propagation Lines},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {105--110},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00025},
doi = {10.1109/ITC51656.2023.00025},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/R23,
author = {Aswin R},
title = {New Algorithm for Fast and Accurate Linearity Testing of High-Resolution
{SAR} ADCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {21--29},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00012},
doi = {10.1109/ITC51656.2023.00012},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/R23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RameshKYGRS23,
author = {Saidapet Ramesh and
Rahul Kalyan and
Jesse Yanez and
Andreas Glowatz and
Maija Ryyn{\"{a}}nen and
Sergej Schwarz},
title = {Measuring Non-Redundant {VIA} Test-Coverage for Automotive Designs
in Lower Process Nodes},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {286--292},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00045},
doi = {10.1109/ITC51656.2023.00045},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RameshKYGRS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SantosCR23,
author = {Fernando Fernandes dos Santos and
Luigi Carro and
Paolo Rech},
title = {Understanding and Improving GPUs' Reliability Combining Beam Experiments
with Fault Simulation},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {176--185},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00034},
doi = {10.1109/ITC51656.2023.00034},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SantosCR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoN0OIKITZYKK23,
author = {Keno Sato and
Takayuki Nakatani and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa and
Shogo Katayama and
Daisuke Iimori and
Misaki Takagi and
Yujie Zhao and
Shuhei Yamamoto and
Anna Kuwana and
Kentaroh Katoh and
Kazumi Hatayama and
Haruo Kobayashi},
title = {Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation
Using Two Types of Digital Predistortion},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {47--55},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00015},
doi = {10.1109/ITC51656.2023.00015},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoN0OIKITZYKK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinhaCFPMS23,
author = {Arani Sinha and
Glenn Col{\'{o}}n{-}Bonet and
Michael Fahy and
Pankaj Pant and
Haijing Mao and
Akhilesh Shukla},
title = {Maximizing Stress Coverage by Novel {DFT} Techniques and Relaxed Timing
Closure},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {56--59},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00016},
doi = {10.1109/ITC51656.2023.00016},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinhaCFPMS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinhabahuLWWH23,
author = {Nadun Sinhabahu and
Katherine Shu{-}Min Li and
Sying{-}Jyan Wang and
J. R. Wang and
Matt Ho},
title = {Machine-Learning Driven Sensor Data Analytics for Yield Enhancement
of Wafer Probing},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {93--98},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00023},
doi = {10.1109/ITC51656.2023.00023},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinhabahuLWWH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ThaparTCAC23,
author = {Dhruv Thapar and
Simon Thomann and
Arjun Chaudhuri and
Hussam Amrouch and
Krishnendu Chakrabarty},
title = {Analysis and Characterization of Defects in FeFETs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {256--265},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00042},
doi = {10.1109/ITC51656.2023.00042},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ThaparTCAC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/UrbanZSBSYS23,
author = {Szczepan Urban and
Piotr Zimnowlodzki and
Manish Sharma and
Shraddha Bodhe and
John Schulze and
Abdullah Yassine and
Adam Styblinski},
title = {Global Control Signal Defect Diagnosis in Volume Production Environment},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {65--70},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00018},
doi = {10.1109/ITC51656.2023.00018},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/UrbanZSBSYS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangHHL23,
author = {Zihu Wang and
Hanbin Hu and
Chen He and
Peng Li},
title = {Recognizing Wafer Map Patterns Using Semi-Supervised Contrastive Learning
with Optimized Latent Representation Learning and Data Augmentation},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {141--150},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00030},
doi = {10.1109/ITC51656.2023.00030},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangHHL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangR23,
author = {Li{-}C. Wang and
Jeff Rearick},
title = {Welcome Message {ITC} 2023},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {xiii},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00005},
doi = {10.1109/ITC51656.2023.00005},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XunYFATH23,
author = {Hanzhi Xun and
Sicong Yuan and
Moritz Fieback and
Hassen Aziza and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Device-Aware Test for Ion Depletion Defects in RRAMs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {246--255},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00041},
doi = {10.1109/ITC51656.2023.00041},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XunYFATH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YinCHL23,
author = {Yuxuan Yin and
Rebecca Chen and
Chen He and
Peng Li},
title = {Domain-Specific Machine Learning Based Minimum Operating Voltage Prediction
Using On-Chip Monitor Data},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {99--104},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00024},
doi = {10.1109/ITC51656.2023.00024},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YinCHL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuanZFXMKRCTH23,
author = {Sicong Yuan and
Z. Zhang and
Moritz Fieback and
Hanzhi Xun and
Erik Jan Marinissen and
Gouri Sankar Kar and
Sidharth Rao and
Sebastien Couet and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Magnetic Coupling Based Test Development for Contact and Interconnect
Defects in STT-MRAMs},
booktitle = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
pages = {236--245},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023.00040},
doi = {10.1109/ITC51656.2023.00040},
timestamp = {Thu, 04 Jul 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YuanZFXMKRCTH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2023,
title = {{IEEE} International Test Conference, {ITC} 2023, Anaheim, CA, USA,
October 7-15, 2023},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/ITC51656.2023},
doi = {10.1109/ITC51656.2023},
isbn = {979-8-3503-4325-0},
timestamp = {Tue, 09 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/2023.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0001D22,
author = {Sebastian Huhn and
Rolf Drechsler},
title = {Next Generation Design For Testability, Debug and Reliability Using
Formal Techniques},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {609--618},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00086},
doi = {10.1109/ITC50671.2022.00086},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/0001D22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0007HC0YLCHH22,
author = {Xiaopeng Zhang and
Shoubo Hu and
Zhitang Chen and
Shengyu Zhu and
Evangeline F. Y. Young and
Pengyun Li and
Cheng Chen and
Yu Huang and
Jianye Hao},
title = {RCANet: Root Cause Analysis via Latent Variable Interaction Modeling
for Yield Improvement},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {100--107},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00017},
doi = {10.1109/ITC50671.2022.00017},
timestamp = {Wed, 03 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/0007HC0YLCHH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Abdel-HafezDMTN22,
author = {Khader S. Abdel{-}Hafez and
Michael Dsouza and
Likith Kumar Manchukonda and
Elddie Tsai and
Karthikeyan Natarajan and
Ting{-}Pu Tai and
Wenhao Hsueh and
Smith Lai},
title = {Comprehensive Power-Aware {ATPG} Methodology for Complex Low-Power
Designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {334--339},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00041},
doi = {10.1109/ITC50671.2022.00041},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Abdel-HafezDMTN22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhmedT22,
author = {Soyed Tuhin Ahmed and
Mehdi B. Tahoori},
title = {Compact Functional Test Generation for Memristive Deep Learning Implementations
using Approximate Gradient Ranking},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {239--248},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00032},
doi = {10.1109/ITC50671.2022.00032},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AhmedT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AngioneBCCNPQAT22,
author = {Francesco Angione and
Paolo Bernardi and
Andrea Calabrese and
Lorenzo Cardone and
A. Niccoletti and
Davide Piumatti and
Stefano Quer and
Davide Appello and
Vincenzo Tancorre and
Roberto Ugioli},
title = {An innovative Strategy to Quickly Grade Functional Test Programs},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {355--364},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00044},
doi = {10.1109/ITC50671.2022.00044},
timestamp = {Fri, 28 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AngioneBCCNPQAT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ArgyridesSDHZ22,
author = {Costas Argyrides and
Vilas Sridharan and
Hayk Danoyan and
Gurgen Harutyunyan and
Yervant Zorian},
title = {A Novel Protection Technique for Embedded Memories with Optimized
{PPA}},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {642--645},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00089},
doi = {10.1109/ITC50671.2022.00089},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ArgyridesSDHZ22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ArunachalamKKRB22,
author = {Ayush Arunachalam and
Athulya Kizhakkayil and
Shamik Kundu and
Arnab Raha and
Suvadeep Banerjee and
Robert Jin and
Fei Su and
Kanad Basu},
title = {Unsupervised Learning-based Early Anomaly Detection in {AMS} Circuits
of Automotive SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {229--238},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00031},
doi = {10.1109/ITC50671.2022.00031},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ArunachalamKKRB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BhathejaC0JDRKC22,
author = {Kushagra Bhatheja and
Shravan K. Chaganti and
Degang Chen and
Xiankun Robert Jin and
Chris C. Dao and
Juxiang Ren and
Abhishek Kumar and
Daniel Correa and
Mark Lehmann and
Thomas Rodriguez and
Eric Kingham and
Joel R. Knight and
Allan Dobbin and
Scott W. Herrin and
Doug Garrity},
title = {Low Cost High Accuracy Stimulus Generator for On-chip Spectral Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {514--518},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00063},
doi = {10.1109/ITC50671.2022.00063},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BhathejaC0JDRKC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BhattacharyaSD22,
author = {Mayukh Bhattacharya and
Beatrice Solignac and
Michael D{\"{u}}rr},
title = {Application of Sampling in Industrial Analog Defect Simulation},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {436--445},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00051},
doi = {10.1109/ITC50671.2022.00051},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BhattacharyaSD22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BordognaBPS22,
author = {Lorella Bordogna and
Fabio Brembilla and
Alberto Pagani and
Marco Spinetta},
title = {New R{\&}R Methodology in Semiconductor Manufacturing Electrical
Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {410--419},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00048},
doi = {10.1109/ITC50671.2022.00048},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BordognaBPS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BurasXBK22,
author = {Brian Buras and
Constantinos Xanthopoulos and
Ken Butler and
Jason Kim},
title = {Zero Trust Approach to {IC} Manufacturing and Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {583--586},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00077},
doi = {10.1109/ITC50671.2022.00077},
timestamp = {Thu, 12 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BurasXBK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChakrabortyB22,
author = {Prabuddha Chakraborty and
Swarup Bhunia},
title = {AI-Driven Assurance of Hardware {IP} against Reverse Engineering Attacks},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {627--636},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00081},
doi = {10.1109/ITC50671.2022.00081},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChakrabortyB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenKL22,
author = {Yan{-}Fu Chen and
Duo{-}Yao Kang and
Kuen{-}Jong Lee},
title = {Scan-Based Test Chip Design with XOR-based C-testable Functional Blocks},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {82--91},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00015},
doi = {10.1109/ITC50671.2022.00015},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenKL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengLWHLCLT22,
author = {Ken Chau{-}Cheung Cheng and
Katherine Shu{-}Min Li and
Sying{-}Jyan Wang and
Andrew Yi{-}Ann Huang and
Chen{-}Shiun Lee and
Leon Li{-}Yang Chen and
Peter Yi{-}Yu Liao and
Nova Cheng{-}Yen Tsai},
title = {Wafer Defect Pattern Classification with Explainable-Decision Tree
Technique},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {549--553},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00070},
doi = {10.1109/ITC50671.2022.00070},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChengLWHLCLT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengTWSCL22,
author = {Ya{-}Chi Cheng and
Pai{-}Yu Tan and
Cheng{-}Wen Wu and
Ming{-}Der Shieh and
Chien{-}Hui Chuang and
Gordon Liao},
title = {Improving Test Quality of Memory Chips by a Decision Tree-Based Screening
Method},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {601--608},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00080},
doi = {10.1109/ITC50671.2022.00080},
timestamp = {Sun, 17 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChengTWSCL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChoudhuryGTF22,
author = {Muhtadi Choudhury and
Minyan Gao and
Shahin Tajik and
Domenic Forte},
title = {{TAMED:} Transitional Approaches for {LFI} Resilient State Machine
Encoding},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {46--55},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00011},
doi = {10.1109/ITC50671.2022.00011},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChoudhuryGTF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CondiaGSRR22,
author = {Josie E. Rodriguez Condia and
Juan{-}David Guerrero{-}Balaguera and
Fernando Fernandes dos Santos and
Matteo Sonza Reorda and
Paolo Rech},
title = {A Multi-level Approach to Evaluate the Impact of {GPU} Permanent Faults
on CNN's Reliability},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {278--287},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00036},
doi = {10.1109/ITC50671.2022.00036},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CondiaGSRR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DHondtLGV22,
author = {P. D'Hondt and
Aymen Ladhar and
Patrick Girard and
Arnaud Virazel},
title = {A Comprehensive Learning-Based Flow for Cell-Aware Model Generation},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {484--488},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00057},
doi = {10.1109/ITC50671.2022.00057},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DHondtLGV22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DasMTF22,
author = {Upoma Das and
Md Rafid Muttaki and
Mark M. Tehranipoor and
Farimah Farahmandi},
title = {{ADWIL:} {A} Zero-Overhead Analog Device Watermarking Using Inherent
{IP} Features},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {155--164},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00023},
doi = {10.1109/ITC50671.2022.00023},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DasMTF22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DebnathCSS22,
author = {Mukta Debnath and
Animesh Basak Chowdhury and
Debasri Saha and
Susmita Sur{-}Kolay},
title = {GreyConE: Greybox Fuzzing + Concolic Execution Guided Test Generation
for High Level Designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {494--498},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00059},
doi = {10.1109/ITC50671.2022.00059},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DebnathCSS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EikiNKIS22,
author = {Makoto Eiki and
Tomoki Nakamura and
Masuo Kajiyama and
Michiko Inoue and
Michihiro Shintani},
title = {Accurate Failure Rate Prediction Based on Gaussian Process Using {WAT}
Data},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {573--577},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00075},
doi = {10.1109/ITC50671.2022.00075},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EikiNKIS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FarayolaBCS0022,
author = {Praise O. Farayola and
Isaac Bruce and
Shravan K. Chaganti and
Abalhassan Sheikh and
Srivaths Ravi and
Degang Chen},
title = {Optimal Order Polynomial Transformation for Calibrating Systematic
Errors in Multisite Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {509--513},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00062},
doi = {10.1109/ITC50671.2022.00062},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FarayolaBCS0022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FilipponiIRAGT22,
author = {Gabriele Filipponi and
Giusy Iaria and
Matteo Sonza Reorda and
Davide Appello and
Giuseppe Garozzo and
Vincenzo Tancorre},
title = {In-field Data Collection System through Logic {BIST} for large Automotive
Systems-on-Chip},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {646--649},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00090},
doi = {10.1109/ITC50671.2022.00090},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FilipponiIRAGT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FoutzSRCCNCPR22,
author = {Brian Foutz and
Sarthak Singhal and
Prateek Kumar Rai and
Krishna Chakravadhanula and
Vivek Chickermane and
Bharath Nandakumar and
Sameer Chillarige and
Christos Papameletis and
Satish Ravichandran},
title = {{PPA} Optimization of Test Points in Automotive Designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {204--212},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00028},
doi = {10.1109/ITC50671.2022.00028},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FoutzSRCCNCPR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Garita-Rodriguez22,
author = {Esteban Garita{-}Rodr{\'{\i}}guez and
Renato Rimolo{-}Donadio and
Rafael Zamora{-}Salazar},
title = {Challenges for High Volume Testing of Embedded {IO} Interfaces in
Disaggregated Microprocessor Products},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {456--464},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00053},
doi = {10.1109/ITC50671.2022.00053},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Garita-Rodriguez22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeGAWFKRPRSL22,
author = {Chen He and
Paul Grosch and
Onder Anilturk and
Joyce Witowski and
Carl Ford and
Rahul Kalyan and
John C. Robinson and
David W. Price and
Jay Rathert and
Barry Saville and
Dave Lee},
title = {Defect-Directed Stress Testing Based on Inline Inspection Results},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {427--435},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00050},
doi = {10.1109/ITC50671.2022.00050},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HeGAWFKRPRSL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HouCTWL22,
author = {Kuan{-}Wei Hou and
Hsueh{-}Hung Cheng and
Chi Tung and
Cheng{-}Wen Wu and
Juin{-}Ming Lu},
title = {Fault Modeling and Testing of Memristor-Based Spiking Neural Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {92--99},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00016},
doi = {10.1109/ITC50671.2022.00016},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HouCTWL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsiaoWLW22,
author = {Sam M.{-}H. Hsiao and
Lowry P.{-}T. Wang and
Aaron C.{-}W. Liang and
Charles H.{-}P. Wen},
title = {Existence of Single-Event Double-Node Upsets {(SEDU)} in Radiation-Hardened
Latches for Sub-65nm {CMOS} Technologies},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {128--136},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00020},
doi = {10.1109/ITC50671.2022.00020},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HsiaoWLW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangZWMYH22,
author = {Junhua Huang and
Hui{-}Ling Zhen and
Naixing Wang and
Hui Mao and
Mingxuan Yuan and
Yu Huang},
title = {Neural Fault Analysis for SAT-based {ATPG}},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {36--45},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00010},
doi = {10.1109/ITC50671.2022.00010},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangZWMYH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HukerikarS22,
author = {Saurabh Hukerikar and
Nirmal R. Saxena},
title = {Runtime Fault Diagnostics for {GPU} Tensor Cores},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {524--528},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00065},
doi = {10.1109/ITC50671.2022.00065},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HukerikarS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HungCBC22,
author = {Shao{-}Chun Hung and
Arjun Chaudhuri and
Sanmitra Banerjee and
Krishnendu Chakrabarty},
title = {Fault Diagnosis for Resistive Random-Access Memory and Monolithic
Inter-tier Vias in Monolithic 3D Integration},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {118--127},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00019},
doi = {10.1109/ITC50671.2022.00019},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HungCBC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Joe0PR22,
author = {Jerin Joe and
Nilanjan Mukherjee and
Irith Pomeranz and
Janusz Rajski},
title = {Test Generation for an Iterative Design Flow with {RTL} Changes},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {305--313},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00039},
doi = {10.1109/ITC50671.2022.00039},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Joe0PR22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KibriaRFT22,
author = {Rasheed Kibria and
M. Sazadur Rahman and
Farimah Farahmandi and
Mark M. Tehranipoor},
title = {RTL-FSMx: Fast and Accurate Finite State Machine Extraction at the
{RTL} for Security Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {165--174},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00024},
doi = {10.1109/ITC50671.2022.00024},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KibriaRFT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KilianHTHS22,
author = {Tobias Kilian and
Markus Hanel and
Daniel Tille and
Martin Huch and
Ulf Schlichtmann},
title = {A Path Selection Flow for Functional Path Ring Oscillators using Physical
Design Data},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {258--267},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00034},
doi = {10.1109/ITC50671.2022.00034},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KilianHTHS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduBER22,
author = {Subhadip Kundu and
Gaurav Bhargava and
Lesly Endrinal and
Lavakumar Ranganathan},
title = {Using Custom Fault Models to Improve Understanding of Silicon Failures},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {348--354},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00043},
doi = {10.1109/ITC50671.2022.00043},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunduBER22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduMRGB22,
author = {Shamik Kundu and
Akul Malhotra and
Arnab Raha and
Sumeet Kumar Gupta and
Kanad Basu},
title = {RIBoNN: Designing Robust In-Memory Binary Neural Network Accelerators},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {504--508},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00061},
doi = {10.1109/ITC50671.2022.00061},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunduMRGB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuoHLNBC22,
author = {Cheng{-}Sian Kuo and
Bing{-}Han Hsieh and
James Chien{-}Mo Li and
Chris Nigh and
Gaurav Bhargava and
Mason Chern},
title = {Diagnosing Double Faulty Chains through Failing Bit Separation},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {175--184},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00025},
doi = {10.1109/ITC50671.2022.00025},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuoHLNBC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaisneCPKSTRZ22,
author = {Michael Laisne and
Alfred L. Crouch and
Michele Portolan and
Martin Keim and
Hans Martin von Staudt and
Bradford G. Van Treuren and
Jeff Rearick and
Songlin Zuo},
title = {{IEEE} {P1687.1:} Extending the Network Boundaries for Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {382--390},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00084},
doi = {10.1109/ITC50671.2022.00084},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaisneCPKSTRZ22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeePKWRCY22,
author = {Seongkwan Lee and
Cheolmin Park and
Minho Kang and
Jun Yeon Won and
HyungSun Ryu and
Jaemoo Choi and
Byunghyun Yim},
title = {4.5 Gsps {MIPI} {D-PHY} Receiver Circuit for Automatic Test Equipment},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {563--567},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00073},
doi = {10.1109/ITC50671.2022.00073},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeePKWRCY22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeiC22,
author = {Jun{-}Yang Lei and
Abhijit Chatterjee},
title = {ML-Assisted Bug Emulation Experiments for Post-Silicon Multi-Debug
of {AMS} Circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {268--277},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00035},
doi = {10.1109/ITC50671.2022.00035},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeiC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LernerISHMV22,
author = {David P. Lerner and
Benson Inkley and
Shubhada H. Sahasrabudhe and
Ethan Hansen and
Luis D. Rojas Munoz and
Arjan van de Ven},
title = {Optimization of Tests for Managing Silicon Defects in Data Centers},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {578--582},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00076},
doi = {10.1109/ITC50671.2022.00076},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LernerISHMV22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiNDMB22,
author = {Wei Li and
Chris Nigh and
Danielle Duvalsaint and
Subhasish Mitra and
Ronald D. Blanton},
title = {{PEPR:} Pseudo-Exhaustive Physically-Aware Region Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {314--323},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00083},
doi = {10.1109/ITC50671.2022.00083},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiNDMB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiaoLGAY22,
author = {Yiwen Liao and
Rapha{\"{e}}l Latty and
Paul R. Genssler and
Hussam Amrouch and
Bin Yang},
title = {Wafer Map Defect Classification Based on the Fusion of Pattern and
Pixel Information},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {1--9},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00006},
doi = {10.1109/ITC50671.2022.00006},
timestamp = {Sat, 18 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiaoLGAY22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiaoNWY22,
author = {Yiwen Liao and
Zahra Paria Najafi{-}Haghi and
Hans{-}Joachim Wunderlich and
Bin Yang},
title = {Efficient and Robust Resistive Open Defect Detection Based on Unsupervised
Deep Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {185--193},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00026},
doi = {10.1109/ITC50671.2022.00026},
timestamp = {Thu, 11 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiaoNWY22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinCHLFH22,
author = {Wei{-}Chen Lin and
Chun Chen and
Chao{-}Ho Hsieh and
James Chien{-}Mo Li and
Eric Jia{-}Wei Fang and
Sung S.{-}Y. Hsueh},
title = {ML-Assisted VminBinning with Multiple Guard Bands for Low Power Consumption},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {213--218},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00029},
doi = {10.1109/ITC50671.2022.00029},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinCHLFH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LokiKMK22,
author = {Kazuya Loki and
Yasuyuki Kai and
Kohei Miyase and
Seiji Kajihara},
title = {A Practical Online Error Detection Method for Functional Safety Using
Three-Site Implications},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {63--72},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00013},
doi = {10.1109/ITC50671.2022.00013},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LokiKMK22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LuTM22,
author = {Shyue{-}Kung Lu and
Shi{-}Chun Tseng and
Kohei Miyase},
title = {Fine-Grained Built-In Self-Repair Techniques for {NAND} Flash Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {391--399},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00047},
doi = {10.1109/ITC50671.2022.00047},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LuTM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LuWHM22,
author = {Shyue{-}Kung Lu and
Yu{-}Sheng Wu and
Jin{-}Hua Hong and
Kohei Miyase},
title = {Fault Resilience Techniques for Flash Memory of {DNN} Accelerators},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {591--600},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00079},
doi = {10.1109/ITC50671.2022.00079},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LuWHM22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaSAC22,
author = {Kwondo Ma and
Anurup Saha and
Chandramouli N. Amarnath and
Abhijit Chatterjee},
title = {Efficient Low Cost Alternative Testing of Analog Crossbar Arrays for
Deep Neural Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {499--503},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00060},
doi = {10.1109/ITC50671.2022.00060},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaSAC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Massoudi22,
author = {Firooz Massoudi},
title = {In search of Vmin for dynamic power managmenet and reliable operation
in mission mode},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {661--664},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00093},
doi = {10.1109/ITC50671.2022.00093},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Massoudi22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MayahiniaTHTA22,
author = {Mahta Mayahinia and
Mehdi B. Tahoori and
Gurgen Harutyunyan and
Grigor Tshagharyan and
Karen Amirkhanyan},
title = {An Efficient Test Strategy for Detection of Electromigration Impact
in Advanced FinFET Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {650--655},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00091},
doi = {10.1109/ITC50671.2022.00091},
timestamp = {Fri, 06 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MayahiniaTHTA22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MayahiniaTPCC22,
author = {Mahta Mayahinia and
Mehdi B. Tahoori and
Manu Perumkunnil and
Kristof Croes and
Francky Catthoor},
title = {Analyzing the Electromigration Challenges of Computation in Resistive
Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {534--538},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00067},
doi = {10.1109/ITC50671.2022.00067},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MayahiniaTPCC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MittalUCJCPSN22,
author = {Soumya Mittal and
Szczepan Urban and
Kun Young Chung and
Jakub Janicki and
Wu{-}Tung Cheng and
Martin Parley and
Manish Sharma and
Shaun Nicholson},
title = {Industry Evaluation of Reversible Scan Chain Diagnosis},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {420--426},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00049},
doi = {10.1109/ITC50671.2022.00049},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MittalUCJCPSN22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiRTW22,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {{DIST:} Deterministic In-System Test with X-masking},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {20--27},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00008},
doi = {10.1109/ITC50671.2022.00008},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiRTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NandakumarMCRZL22,
author = {Bharath Nandakumar and
Madhur Maheshwari and
Sameer Chillarige and
Robert Redburn and
Jeff Zimmerman and
Nicholai L'Esperance and
Edward Dziarcak},
title = {Scaling physically aware logic diagnosis to complex high volume 7nm
server processors},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {340--347},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00042},
doi = {10.1109/ITC50671.2022.00042},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NandakumarMCRZL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NatarajanSOCB22,
author = {Suriyaprakash Natarajan and
Abhijit Sathaye and
Chaitali Oak and
Nipun Chaplot and
Suvadeep Banerjee},
title = {{DEFCON:} Defect Acceleration through Content Optimization},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {298--304},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00038},
doi = {10.1109/ITC50671.2022.00038},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NatarajanSOCB22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NiewenhuisV22,
author = {Benjamin Niewenhuis and
Devanathan Varadarajan},
title = {Improving structural coverage of functional tests with checkpoint
signature computation},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {587--590},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00078},
doi = {10.1109/ITC50671.2022.00078},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NiewenhuisV22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NirmaierHHYP22,
author = {Thomas Nirmaier and
Manuel Harrant and
Marc Huppmann and
Wendy You and
Georg Pelz},
title = {Virtual Prototyping: Closing the digital gap between product requirements
and post-Si verification},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {559--562},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00072},
doi = {10.1109/ITC50671.2022.00072},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NirmaierHHYP22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PanL22,
author = {Ze{-}Wei Pan and
Jin{-}Fu Li},
title = {DFT-Enhanced Test Scheme for Spin-Transfer-Torque {(STT)} MRAMs},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {489--493},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00058},
doi = {10.1109/ITC50671.2022.00058},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/PanL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PandeyTN22,
author = {Amit Pandey and
Brendan Tully and
Karthikeyan Natarajan},
title = {High Speed {IO} Access for Test forms the foundation for Silicon Lifecycle
Management},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {656--660},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00092},
doi = {10.1109/ITC50671.2022.00092},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PandeyTN22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PaudelT22,
author = {Bijay Raj Paudel and
Spyros Tragoudas},
title = {The Impact of On-chip Training to Adversarial Attacks in Memristive
Crossbar Arrays},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {519--523},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00064},
doi = {10.1109/ITC50671.2022.00064},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PaudelT22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz22,
author = {Irith Pomeranz},
title = {Transforming an {\textdollar}n{\textdollar}-Detection Test Set into
a Test Set for a Variety of Fault Models},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {474--478},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00055},
doi = {10.1109/ITC50671.2022.00055},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PortolanPNFS22,
author = {Michele Portolan and
Antonios Pavlidis and
Giorgio Di Natale and
Eric Faehn and
Haralampos{-}G. Stratigopoulos},
title = {Circuit-to-Circuit Attacks in SoCs via Trojan-Infected {IEEE} 1687
Test Infrastructure},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {539--543},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00068},
doi = {10.1109/ITC50671.2022.00068},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PortolanPNFS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTTW22,
author = {Janusz Rajski and
Maciej Trawka and
Jerzy Tyszer and
Bartosz Wlodarczak},
title = {Hardware Root of Trust for SSN-basedDFT Ecosystems},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {479--483},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00056},
doi = {10.1109/ITC50671.2022.00056},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTTW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaxenaL22,
author = {Nirmal R. Saxena and
Atieh Lotfi},
title = {Error Model {(EM)} - {A} New Way of Doing Fault Simulation},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {324--333},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00040},
doi = {10.1109/ITC50671.2022.00040},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SaxenaL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShiLKWWH022,
author = {Zhengyuan Shi and
Min Li and
Sadaf Khan and
Liuzheng Wang and
Naixing Wang and
Yu Huang and
Qiang Xu},
title = {DeepTPI: Test Point Insertion with Deep Reinforcement Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {194--203},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00027},
doi = {10.1109/ITC50671.2022.00027},
timestamp = {Sun, 05 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShiLKWWH022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Singh22,
author = {Adit D. Singh},
title = {Understanding Vmin Failures for Improved Testing of Timing Marginalities},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {372--381},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00046},
doi = {10.1109/ITC50671.2022.00046},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Singh22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinghFBBGJH22,
author = {Abhairaj Singh and
Moritz Fieback and
Rajendra Bishnoi and
Filip Bradaric and
Anteneh Gebregiorgis and
Rajiv V. Joshi and
Said Hamdioui},
title = {Accelerating {RRAM} Testing with a Low-cost Computation-in-Memory
based {DFT}},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {400--409},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00085},
doi = {10.1109/ITC50671.2022.00085},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinghFBBGJH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinhaCER22,
author = {Arani Sinha and
Yonsang Cho and
Jon Easter and
Meizel V. Leiva Rojas},
title = {Multi-die Parallel Test Fabric for Scalability and Pattern Reusability},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {249--257},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00033},
doi = {10.1109/ITC50671.2022.00033},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinhaCER22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinhabahuLLWW22,
author = {Nadun Sinhabahu and
Katherine Shu{-}Min Li and
Jian{-}De Li and
J. R. Wang and
Sying{-}Jyan Wang},
title = {Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal
Integrity Pattern Recognition for Wafer Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {554--558},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00071},
doi = {10.1109/ITC50671.2022.00071},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SinhabahuLLWW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SohH22,
author = {Weng Joe Soh and
Chen He},
title = {Enhanced Data Pattern to Detect Defects in Flash Memory Address Decoder},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {544--548},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00069},
doi = {10.1109/ITC50671.2022.00069},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SohH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Srimani022,
author = {Supriyo Srimani and
Hafizur Rahaman},
title = {Testing of Analog Circuits using Statistical and Machine Learning
Techniques},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {619--626},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00087},
doi = {10.1109/ITC50671.2022.00087},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Srimani022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SrivastavaA22,
author = {Ankush Srivastava and
Jais Abraham},
title = {Low Capture Power At-Speed Test with Local Hot Spot Analysis to Reduce
Over-Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {446--455},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00052},
doi = {10.1109/ITC50671.2022.00052},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SrivastavaA22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StaudtEWPC22,
author = {Hans Martin von Staudt and
Luai Tarek Elnawawy and
Sarah Wang and
Larry Ping and
Jung Woo Choi},
title = {Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED
Headlamp Driver {IC}},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {365--371},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00045},
doi = {10.1109/ITC50671.2022.00045},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StaudtEWPC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StaudtSBCHC22,
author = {Hans Martin von Staudt and
Franz Schuler and
Rohitaswa Bhattacharya and
Justin Wei{-}Lin Cheng and
Cheng{-}Da Huang and
Parker Chih{-}Chun Chen},
title = {High-Coverage DfT and Reliability Enhancements for Automotive Floating
Gate {OTP} Beyond {AEC-Q100}},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {637--641},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00088},
doi = {10.1109/ITC50671.2022.00088},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StaudtSBCHC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StellariS22,
author = {Franco Stellari and
Peilin Song},
title = {Reliability Study of 14 nm Scan Chains and Its Application to Hardware
Security},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {28--35},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00009},
doi = {10.1109/ITC50671.2022.00009},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StellariS22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TalukdarCBC22,
author = {Jonti Talukdar and
Arjun Chaudhuri and
Mayukh Bhattacharya and
Krishnendu Chakrabarty},
title = {Automatic Structural Test Generation for Analog Circuits using Neural
Twins},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {145--154},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00022},
doi = {10.1109/ITC50671.2022.00022},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TalukdarCBC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thangamariappan22,
author = {Vijayakumar Thangamariappan and
Nidhi Agrawal and
Jason Kim and
Constantinos Xanthopoulos and
Ken Butler and
Ira Leventhal and
Joe Xiao},
title = {Improvements in Automated {IC} Socket Pin Defect Detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {568--572},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00074},
doi = {10.1109/ITC50671.2022.00074},
timestamp = {Thu, 12 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thangamariappan22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiH22,
author = {Chen{-}Lin Tsai and
Shi{-}Yu Huang},
title = {Just-Enough Stress Test for Infant-Mortality Screening Using Speed
Binning},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {137--144},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00021},
doi = {10.1109/ITC50671.2022.00021},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsaiH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Uezono0L22,
author = {Takumi Uezono and
Yi He and
Yanjing Li},
title = {Achieving Automotive Safety Requirements through Functional In-Field
Self-Test for Deep Learning Accelerators},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {465--473},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00054},
doi = {10.1109/ITC50671.2022.00054},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Uezono0L22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wang0WZH22,
author = {Xing Wang and
Zezhong Wang and
Naixing Wang and
Weiwei Zhang and
Yu Huang},
title = {Compression-Aware {ATPG}},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {108--117},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00018},
doi = {10.1109/ITC50671.2022.00018},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wang0WZH22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangLJCC22,
author = {Hongfei Wang and
Wei Liu and
Hai Jin and
Yu Chen and
Wenjie Cai},
title = {Modeling Challenge Covariances and Design Dependency for Efficient
Attacks on Strong PUFs},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {1--10},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00007},
doi = {10.1109/ITC50671.2022.00007},
timestamp = {Thu, 12 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangLJCC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangLC22,
author = {Dun{-}An Yang and
Jing{-}Jia Liou and
Harry H. Chen},
title = {Transient Fault Pruning for Effective Candidate Reduction in Functional
Debugging},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {73--81},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00014},
doi = {10.1109/ITC50671.2022.00014},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangLC22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangZW22,
author = {Min Jian Yang and
Yueling Zeng and
Li{-}C. Wang},
title = {Language Driven Analytics for Failure Pattern Feedforward and Feedback},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {288--297},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00037},
doi = {10.1109/ITC50671.2022.00037},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangZW22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YunLYGGLNPSTYG22,
author = {Feng Yun and
Yunkun Lin and
Lou Yunfei and
Lei Gao and
Vaibhav Gera and
Boxuan Li and
Vennela Chowdary Nekkanti and
Aditya Rajendra Pharande and
Kunal Sheth and
Meghana Thommondru and
Guizhong Ye and
Sandeep Gupta},
title = {Fault-coverage Maximizing March Tests for Memory Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {529--533},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00066},
doi = {10.1109/ITC50671.2022.00066},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YunLYGGLNPSTYG22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZadeganZPL22,
author = {Farrokh Ghani Zadegan and
Zilin Zhang and
Kim Peters{\'{e}}n and
Erik Larsson},
title = {Reusing {IEEE} 1687-Compatible Instruments and Sub-Networks over a
System Bus},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {219--228},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00030},
doi = {10.1109/ITC50671.2022.00030},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZadeganZPL22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZouN22,
author = {Wei Zou and
Benoit Nadeau{-}Dostie},
title = {Configurable {BISR} Chain For Fast Repair Data Loading},
booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
pages = {56--62},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022.00012},
doi = {10.1109/ITC50671.2022.00012},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZouN22.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2022,
title = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA,
September 23-30, 2022},
publisher = {{IEEE}},
year = {2022},
url = {https://doi.org/10.1109/ITC50671.2022},
doi = {10.1109/ITC50671.2022},
isbn = {978-1-6654-6270-9},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/2022.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhmedSI21,
author = {Foisal Ahmed and
Michihiro Shintani and
Michiko Inoue},
title = {Study on High-Accuracy and Low-Cost Recycled {FPGA} Detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {133--142},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00021},
doi = {10.1109/ITC50571.2021.00021},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AhmedSI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AmarnathMC21,
author = {Chandramouli N. Amarnath and
Md Imran Momtaz and
Abhijit Chatterjee},
title = {Hierarchical Failure Modeling and Machine Learning Assisted Correction
of Electro-Mechanical Subsystem Failures in Autonomous Vehicles},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {389--398},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00055},
doi = {10.1109/ITC50571.2021.00055},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AmarnathMC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AvciO21,
author = {Muslum Emir Avci and
Sule Ozev},
title = {Background Receiver {IQ} Imbalance Correction for in-Field and Post-Production
Testing and Calibration},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {380--388},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00054},
doi = {10.1109/ITC50571.2021.00054},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AvciO21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BartschWKSK21,
author = {Christian Bartsch and
Stephan Wilhelm and
Daniel K{\"{a}}stner and
Dominik Stoffel and
Wolfgang Kunz},
title = {Compositional Fault Propagation Analysis in Embedded Systems using
Abstract Interpretation},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {409--418},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00057},
doi = {10.1109/ITC50571.2021.00057},
timestamp = {Wed, 31 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BartschWKSK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaudhuriCTMDC21,
author = {Arjun Chaudhuri and
Ching{-}Yuan Chen and
Jonti Talukdar and
Siddarth Madala and
Abhishek Kumar Dubey and
Krishnendu Chakrabarty},
title = {Efficient Fault-Criticality Analysis for {AI} Accelerators using a
Neural Twin\({}^{\mbox{{\({_\ast}\)}}}\)},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {73--82},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00015},
doi = {10.1109/ITC50571.2021.00015},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChaudhuriCTMDC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenC21,
author = {Ching{-}Yuan Chen and
Krishnendu Chakrabarty},
title = {On-line Functional Testing of Memristor-mapped Deep Neural Networks
using Backdoored Checksums},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {83--92},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00016},
doi = {10.1109/ITC50571.2021.00016},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenCYC21,
author = {Yongliang Chen and
Xiaole Cui and
Wenqiang Ye and
Xiaoxin Cui},
title = {The Security Enhancement Techniques of the Double-layer {PUF} Against
the ANN-based Modeling Attack},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {63--72},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00014},
doi = {10.1109/ITC50571.2021.00014},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenCYC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenLJWHCLH21,
author = {Leon Li{-}Yang Chen and
Katherine Shu{-}Min Li and
Xu{-}Hao Jiang and
Sying{-}Jyan Wang and
Andrew Yi{-}Ann Huang and
Jwu E. Chen and
Hsing{-}Chung Liang and
Chun{-}Lung Hsu},
title = {Semi-Supervised Framework for Wafer Defect Pattern Recognition with
Enhanced Labeling},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {208--212},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00029},
doi = {10.1109/ITC50571.2021.00029},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenLJWHCLH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CorsoRATL21,
author = {Jorge Corso and
Saidapet Ramesh and
Kumar Abishek and
Ley Teng Tan and
Chik Hooi Lew},
title = {Multi-Transition Fault Model {(MTFM)} {ATPG} patterns towards achieving
0 {DPPB} on automotive designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {278--283},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00037},
doi = {10.1109/ITC50571.2021.00037},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CorsoRATL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuvalsaintB21,
author = {Danielle Duvalsaint and
R. D. Shawn Blanton},
title = {Characterizing Corruptibility of Logic Locks using {ATPG}},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {213--222},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00030},
doi = {10.1109/ITC50571.2021.00030},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuvalsaintB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EggersglussMRT21,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer},
title = {On Reduction of Deterministic Test Pattern Sets},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {260--267},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00035},
doi = {10.1109/ITC50571.2021.00035},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EggersglussMRT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FarayolaBCOS0C21,
author = {Praise O. Farayola and
Isaac Bruce and
Shravan K. Chaganti and
Abdullah O. Obaidi and
Abalhassan Sheikh and
Srivaths Ravi and
Degang Chen},
title = {Systematic Hardware Error Identification and Calibration for Massive
Multisite Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {304--308},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00042},
doi = {10.1109/ITC50571.2021.00042},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FarayolaBCOS0C21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GensslerA21,
author = {Paul R. Genssler and
Hussam Amrouch},
title = {Brain-Inspired Computing for Wafer Map Defect Pattern Classification},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {123--132},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00020},
doi = {10.1109/ITC50571.2021.00020},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GensslerA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeUL21,
author = {Yi He and
Takumi Uezono and
Yanjing Li},
title = {Efficient Functional In-Field Self-Test for Deep Learning Accelerators},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {93--102},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00017},
doi = {10.1109/ITC50571.2021.00017},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HeUL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuH021,
author = {Hanbin Hu and
Chen He and
Peng Li},
title = {Semi-supervised Wafer Map Pattern Recognition using Domain-Specific
Data Augmentation and Contrastive Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {113--122},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00019},
doi = {10.1109/ITC50571.2021.00019},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HuH021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangQXCJDLH21,
author = {Xin Huang and
Min Qin and
Ruosheng Xu and
Cheng Chen and
Shangling Jui and
Zhihao Ding and
Pengyun Li and
Yu Huang},
title = {Adaptive NN-based Root Cause Analysis in Volume Diagnosis for Yield
Improvement},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {30--36},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00010},
doi = {10.1109/ITC50571.2021.00010},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangQXCJDLH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IimoriNKOHKSIOI21,
author = {Daisuke Iimori and
Takayuki Nakatani and
Shogo Katayama and
Gaku Ogihara and
Akemi Hatta and
Anna Kuwana and
Keno Sato and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa and
Jianglin Wei and
Yujie Zhao and
Minh Tri Tran and
Kazumi Hatayama and
Haruo Kobayashi},
title = {Summing Node and False Summing Node Methods: Accurate Operational
Amplifier {AC} Characteristics Testing without Audio Analyzer},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {364--373},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00052},
doi = {10.1109/ITC50571.2021.00052},
timestamp = {Thu, 31 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IimoriNKOHKSIOI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KilianATHS21,
author = {Tobias Kilian and
Heiko Ahrens and
Daniel Tille and
Martin Huch and
Ulf Schlichtmann},
title = {A Scalable Design Flow for Performance Monitors Using Functional Path
Ring Oscillators},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {299--303},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00041},
doi = {10.1109/ITC50571.2021.00041},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KilianATHS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KlemmeA21,
author = {Florian Klemme and
Hussam Amrouch},
title = {Machine Learning for Circuit Aging Estimation under Workload Dependency},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {37--46},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00011},
doi = {10.1109/ITC50571.2021.00011},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KlemmeA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuoLCHLFH21,
author = {Yen{-}Ting Kuo and
Wei{-}Chen Lin and
Chun Chen and
Chao{-}Ho Hsieh and
James Chien{-}Mo Li and
Eric Jia{-}Wei Fang and
Sung S.{-}Y. Hsueh},
title = {Minimum Operating Voltage Prediction in Production Test Using Accumulative
Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {47--52},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00012},
doi = {10.1109/ITC50571.2021.00012},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuoLCHLFH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LarssonMZ21,
author = {Erik Larsson and
Prathamesh Murali and
Ziling Zhang},
title = {Accessing general {IEEE} Std. 1687 networks via functional ports},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {354--363},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00051},
doi = {10.1109/ITC50571.2021.00051},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LarssonMZ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeKPRCY21,
author = {Seongkwan Lee and
Minho Kang and
Cheolmin Park and
HyungSun Ryu and
Jaemoo Choi and
Byunghyun Yim},
title = {3.5Gsps {MIPI} {C-PHY} Receiver Circuit for Automatic Test Equipment},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {294--298},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00040},
doi = {10.1109/ITC50571.2021.00040},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeKPRCY21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LefevreDGV21,
author = {J. Lefevre and
Philippe Debaud and
Patrick Girard and
Arnaud Virazel},
title = {A Fast and Low Cost Embedded Test Solution for {CMOS} Image Sensors},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {1--9},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00007},
doi = {10.1109/ITC50571.2021.00007},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LefevreDGV21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiSWZHX21,
author = {Min Li and
Zhengyuan Shi and
Zezhong Wang and
Weiwei Zhang and
Yu Huang and
Qiang Xu},
title = {Testability-Aware Low Power Controller Design with Evolutionary Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {324--328},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00046},
doi = {10.1109/ITC50571.2021.00046},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiSWZHX21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiaoLCWHCTC21,
author = {Peter Yi{-}Yu Liao and
Katherine Shu{-}Min Li and
Leon Li{-}Yang Chen and
Sying{-}Jyan Wang and
Andrew Yi{-}Ann Huang and
Ken Chau{-}Cheung Cheng and
Nova Cheng{-}Yen Tsai and
Leon Chou},
title = {WGrid: Wafermap Grid Pattern Recognition with Machine Learning Techniques},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {309--313},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00043},
doi = {10.1109/ITC50571.2021.00043},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiaoLCWHCTC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuC21,
author = {Mengyun Liu and
Krishnendu Chakrabarty},
title = {Adaptive Methods for Machine Learning-Based Testing of Integrated
Circuits and Boards},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {153--162},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00023},
doi = {10.1109/ITC50571.2021.00023},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuO21,
author = {Chenwei Liu and
Jie Ou},
title = {Smart Sampling for Efficient System Level Test: {A} Robust Machine
Learning Approach},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {53--62},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00013},
doi = {10.1109/ITC50571.2021.00013},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuO21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuT21,
author = {Chenwei Liu and
Qiaoyue Tang},
title = {Triplet Convolutional Networks for Classifying Mixed-Type {WBM} Patterns
with Noisy Labels},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {200--207},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00028},
doi = {10.1109/ITC50571.2021.00028},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LylinaWW21,
author = {Natalia Lylina and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {Testability-Enhancing Resynthesis of Reconfigurable Scan Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {20--29},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00009},
doi = {10.1109/ITC50571.2021.00009},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LylinaWW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MayahiniaMT21,
author = {Mahta Mayahinia and
Christopher M{\"{u}}nch and
Mehdi B. Tahoori},
title = {Analyzing and Mitigating Sensing Failures in Spintronic-based Computing
in Memory},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {268--277},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00036},
doi = {10.1109/ITC50571.2021.00036},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MayahiniaMT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MayerSBYHDRPD21,
author = {Franziska Mayer and
Christian Schott and
Enrico Billich and
Saeid Yazdani and
Ulrich Heinkel and
Georg Daler and
Bernhard Ruf and
Ricardo Pannuzzo and
Wolfgang Dickenscheid},
title = {Automatic Verification of Mixed-Signal {ATE} Test Programs using Device
Variation},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {374--379},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00053},
doi = {10.1109/ITC50571.2021.00053},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MayerSBYHDRPD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MelisSSA21,
author = {Tommaso Melis and
Emmanuel Simeu and
Luc Saury and
Etienne Auvray},
title = {Relevant Signals and Devices for Failure Analysis of Analog and Mixed-signal
Circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {243--250},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00033},
doi = {10.1109/ITC50571.2021.00033},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MelisSSA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MeschkovGKT21,
author = {Sergej Meschkov and
Dennis R. E. Gnad and
Jonas Krautter and
Mehdi B. Tahoori},
title = {Is your secure test infrastructure secure enough? : Attacks based
on delay test patterns using transient behavior analysis},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {334--338},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00048},
doi = {10.1109/ITC50571.2021.00048},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MeschkovGKT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NighBB21,
author = {Chris Nigh and
Gaurav Bhargava and
Ronald D. Blanton},
title = {{AAA:} Automated, On-ATE {AI} Debug of Scan Chain Failures},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {314--318},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00044},
doi = {10.1109/ITC50571.2021.00044},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NighBB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PortolanRMLN21,
author = {Michele Portolan and
Vincent Reynaud and
Paolo Maistri and
R{\'{e}}gis Leveugle and
Giorgio Di Natale},
title = {Security {EDA} Extension through {P1687.1} and 1687 Callbacks},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {344--353},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00050},
doi = {10.1109/ITC50571.2021.00050},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PortolanRMLN21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PrasanthPA21,
author = {V. Prasanth and
Rubin A. Parekhji and
Bharadwaj Amrutur},
title = {Exploiting Application Tolerance for Functional Safety},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {399--408},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00056},
doi = {10.1109/ITC50571.2021.00056},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PrasanthPA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RahmanLGRFT21,
author = {M. Sazadur Rahman and
Henian Li and
Rui Guo and
Fahim Rahman and
Farimah Farahmandi and
Mark M. Tehranipoor},
title = {{LL-ATPG:} Logic-Locking Aware Test Using Valet Keys in an Untrusted
Environment},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {180--189},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00026},
doi = {10.1109/ITC50571.2021.00026},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RahmanLGRFT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RasoolzadehS021,
author = {Shahram Rasoolzadeh and
Aein Rezaei Shahmirzadi and
Amir Moradi},
title = {Impeccable Circuits {III}},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {163--169},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00024},
doi = {10.1109/ITC50571.2021.00024},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/RasoolzadehS021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoIOIWNZKYKH021,
author = {Keno Sato and
Takashi Ishida and
Toshiyuki Okamoto and
Tamotsu Ichikawa and
Jianglin Wei and
Takayuki Nakatani and
Yujie Zhao and
Shogo Katayama and
Shuhei Yamamoto and
Anna Kuwana and
Kazumi Hatayama and
Haruo Kobayashi},
title = {Revisit to Accurate {ADC} Testing with Incoherent Sampling Using Proper
Sinusoidal Signal and Sampling Frequencies},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {284--288},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00038},
doi = {10.1109/ITC50571.2021.00038},
timestamp = {Mon, 21 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoIOIWNZKYKH021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShangSKHK21,
author = {Yang Shang and
Makoto Shinohara and
Eiji Kato and
Masaichi Hashimoto and
Joanna Kiljan},
title = {Open-short Normalization Method for a Quick Defect Identification
in Branched Traces with High-resolution Time-domain Reflectometry},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {233--242},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00032},
doi = {10.1109/ITC50571.2021.00032},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShangSKHK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShintaniMINKE21,
author = {Michihiro Shintani and
Riaz{-}ul{-}haque Mian and
Michiko Inoue and
Tomoki Nakamura and
Masuo Kajiyama and
Makoto Eiki},
title = {Wafer-level Variation Modeling for Multi-site {RF} {IC} Testing via
Hierarchical Gaussian Process},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {103--112},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00018},
doi = {10.1109/ITC50571.2021.00018},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShintaniMINKE21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SilvaBH021,
author = {Felipe Augusto da Silva and
Ahmet Cagri Bagbaba and
Said Hamdioui and
Christian Sauer},
title = {An automated formal-based approach for reducing undetected faults
in {ISO} 26262 hardware compliant designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {329--333},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00047},
doi = {10.1109/ITC50571.2021.00047},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SilvaBH021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunJRDNMB21,
author = {Yi Sun and
Hui Jiang and
Lakshmi Ramakrishnan and
Jennifer Dworak and
Kundan Nepal and
Theodore W. Manikas and
R. Iris Bahar},
title = {Low Power Shift and Capture through ATPG-Configured Embedded Enable
Capture Bits},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {319--323},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00045},
doi = {10.1109/ITC50571.2021.00045},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunJRDNMB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuparjoCS21,
author = {Bambang Suparjo and
Jugantor Chetia and
Ankit R. Shah},
title = {Seamless Physical Implementation of {ASIC} Hierarchical Integrated
Scan Architecture},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {339--343},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00049},
doi = {10.1109/ITC50571.2021.00049},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuparjoCS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TalukdarCDASC21,
author = {Jonti Talukdar and
Siyuan Chen and
Amitabh Das and
Sohrab Aftabjahani and
Peilin Song and
Krishnendu Chakrabarty},
title = {A BIST-based Dynamic Obfuscation Scheme for Resilience against Removal
and Oracle-guided Attacks\({}^{\mbox{*}}\)},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {170--179},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00025},
doi = {10.1109/ITC50571.2021.00025},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TalukdarCDASC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TraynorHYK21,
author = {Stephen Traynor and
Chen He and
Y. Y. Yu and
Ken Klein},
title = {Adaptive High Voltage Stress Methodology to Enable Automotive Quality
on FinFET Technologies},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {289--293},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00039},
doi = {10.1109/ITC50571.2021.00039},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TraynorHYK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VafaeiHTF21,
author = {Arash Vafaei and
Nick Hooten and
Mark M. Tehranipoor and
Farimah Farahmandi},
title = {SymbA: Symbolic Execution at C-level for Hardware Trojan Activation},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {223--232},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00031},
doi = {10.1109/ITC50571.2021.00031},
timestamp = {Fri, 10 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VafaeiHTF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuKLNB21,
author = {Mu{-}Ting Wu and
Cheng{-}Sian Kuo and
James Chien{-}Mo Li and
Chris Nigh and
Gaurav Bhargava},
title = {Improving Volume Diagnosis and Debug with Test Failure Clustering
and Reorganization},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {251--259},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00034},
doi = {10.1109/ITC50571.2021.00034},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuKLNB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuRTMKH21,
author = {Lizhou Wu and
Siddharth Rao and
Mottaqiallah Taouil and
Erik Jan Marinissen and
Gouri Sankar Kar and
Said Hamdioui},
title = {Testing {STT-MRAM:} Manufacturing Defects, Fault Models, and Test
Solutions},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {143--152},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00022},
doi = {10.1109/ITC50571.2021.00022},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WuRTMKH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangCHLC21,
author = {Dun{-}An Yang and
Yu{-}Teng Chang and
Ting{-}Shuo Hsu and
Jing{-}Jia Liou and
Harry H. Chen},
title = {ACE-Pro: Reduction of Functional Errors with {ACE} Propagation Graph},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {10--19},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00008},
doi = {10.1109/ITC50571.2021.00008},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangCHLC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZengWS21,
author = {Yueling Jenny Zeng and
Li{-}C. Wang and
Chuanhe Jay Shan},
title = {MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification},
booktitle = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
pages = {190--199},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021.00027},
doi = {10.1109/ITC50571.2021.00027},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZengWS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2021,
title = {{IEEE} International Test Conference, {ITC} 2021, Anaheim, CA, USA,
October 10-15, 2021},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/ITC50571.2021},
doi = {10.1109/ITC50571.2021},
isbn = {978-1-6654-1695-5},
timestamp = {Mon, 29 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/2021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0001B20,
author = {Zeye Liu and
R. D. Shawn Blanton},
title = {High Defect-Density Yield Learning using Three-Dimensional Logic Test
Chips},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325244},
doi = {10.1109/ITC44778.2020.9325244},
timestamp = {Mon, 25 Jan 2021 08:44:58 +0100},
biburl = {https://dblp.org/rec/conf/itc/0001B20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalYXTXHSL20,
author = {Nidhi Agrawal and
Min{-}Jian Yang and
Constantinos Xanthopoulos and
Vijayakumar Thangamariappan and
Joe Xiao and
Chee{-}Wah Ho and
Keith Schaub and
Ira Leventhal},
title = {Automated Socket Anomaly Detection through Deep Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325269},
doi = {10.1109/ITC44778.2020.9325269},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalYXTXHSL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhnSKSKOK20,
author = {Sang{-}Uck Ahn and
Beom{-}Kyu Seo and
Hyun{-}Woo Kim and
Yeoun{-}Sook Shin and
Hyung{-}Tae Kim and
Ghil{-}Geun Oh and
Young{-}Dae Kim},
title = {Cost-Effective Test Method for screening out Unexpected Failure in
High Speed Serial Interface IPs},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--4},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325235},
doi = {10.1109/ITC44778.2020.9325235},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AhnSKSKOK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AvciO20,
author = {Muslum Emir Avci and
Sule Ozev},
title = {Design Optimization for N-port {RF} Network Reflectometers under Noise
and Gain Imperfections},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325256},
doi = {10.1109/ITC44778.2020.9325256},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AvciO20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AzimiS20,
author = {Sarah Azimi and
Luca Sterpone},
title = {Digital Design Techniques for Dependable High Performance Computing},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325281},
doi = {10.1109/ITC44778.2020.9325281},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AzimiS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BabyBEPMGCDKS20,
author = {Manu Baby and
Bernd B{\"{u}}ttner and
Piet Engelke and
Ulrike Pfannkuchen and
Reinhard Meier and
Jonathan Gaudet and
Jean{-}Fran{\c{c}}ois C{\^{o}}t{\'{e}} and
Givargis Danialy and
Martin Keim and
Lori Schramm},
title = {{IJTAG} Through a Two-Pin Chip Interface},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325232},
doi = {10.1109/ITC44778.2020.9325232},
timestamp = {Tue, 13 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BabyBEPMGCDKS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BoschiSGKH20,
author = {Gabriele Boschi and
Elisa Spano and
Hayk T. Grigoryan and
Arun Kumar and
Gurgen Harutyunyan},
title = {Die-to-Die Testing and {ECC} Error Mitigation in Automotive and Industrial
Safety Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--6},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325242},
doi = {10.1109/ITC44778.2020.9325242},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BoschiSGKH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BramleyHDSR20,
author = {Richard Bramley and
Yanxiang Huang and
Guangshan Duan and
Nirmal R. Saxena and
Paul Racunas},
title = {On the Measurement of Safe Fault Failure Rates in High-Performance
Compute Processors},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325239},
doi = {10.1109/ITC44778.2020.9325239},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BramleyHDSR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrauchlerD20,
author = {David Brauchler and
Jennifer Dworak},
title = {Multi-Level Access Protection for Future {IEEE} {P1687.1} {IJTAG}
Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325276},
doi = {10.1109/ITC44778.2020.9325276},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrauchlerD20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CantoroFSRAP20,
author = {Riccardo Cantoro and
Dario Foti and
Sandro Sartoni and
Matteo Sonza Reorda and
Lorena Anghel and
Michele Portolan},
title = {New Perspectives on Core In-field Path Delay Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325260},
doi = {10.1109/ITC44778.2020.9325260},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/CantoroFSRAP20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CantoroHKMSS20,
author = {Riccardo Cantoro and
Martin Huch and
Tobias Kilian and
Raffaele Martone and
Ulf Schlichtmann and
Giovanni Squillero},
title = {Machine Learning based Performance Prediction of Microcontrollers
using Speed Monitors},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325253},
doi = {10.1109/ITC44778.2020.9325253},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CantoroHKMSS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CasarsaHZ20,
author = {M. Casarsa and
Gurgen Harutyunyan and
Yervant Zorian},
title = {Test and Diagnosis Solution for Functional Safety},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325275},
doi = {10.1109/ITC44778.2020.9325275},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CasarsaHZ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaudhuriTSC20,
author = {Arjun Chaudhuri and
Jonti Talukdar and
Fei Su and
Krishnendu Chakrabarty},
title = {Functional Criticality Classification of Structural Faults in {AI}
Accelerators},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325272},
doi = {10.1109/ITC44778.2020.9325272},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChaudhuriTSC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenH20,
author = {Jun Chen and
Masanori Hashimoto},
title = {Proactive Supply Noise Mitigation with Low-Latency Minor Voltage Regulator
and Lightweight Current Prediction},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--8},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325257},
doi = {10.1109/ITC44778.2020.9325257},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenHH20,
author = {Wei{-}Hao Chen and
Chu{-}Chun Hsu and
Shi{-}Yu Huang},
title = {Rapid {PLL} Monitoring By {A} Novel min-MAX Time-to-Digital Converter},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--8},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325217},
doi = {10.1109/ITC44778.2020.9325217},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenHH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenJSCN20,
author = {Siyuan Chen and
Jinwook Jung and
Peilin Song and
Krishnendu Chakrabarty and
Gi{-}Joon Nam},
title = {BISTLock: Efficient {IP} Piracy Protection using {BIST}},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325210},
doi = {10.1109/ITC44778.2020.9325210},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenJSCN20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenLCWHCTL20,
author = {Leon Li{-}Yang Chen and
Katherine Shu{-}Min Li and
Ken Chau{-}Cheung Cheng and
Sying{-}Jyan Wang and
Andrew Yi{-}Ann Huang and
Leon Chou and
Nova Cheng{-}Yen Tsai and
Chen{-}Shiun Lee},
title = {TestDNA-E: Wafer Defect Signature for Pattern Recognition by Ensemble
Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--4},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325237},
doi = {10.1109/ITC44778.2020.9325237},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenLCWHCTL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChowdhuryABFHDF20,
author = {Sreeja Chowdhury and
Rabin Yu Acharya and
William Boullion and
Andrew Felder and
Mark Howard and
Jia Di and
Domenic Forte},
title = {A Weak Asynchronous RESet {(ARES)} {PUF} Using Start-up Characteristics
of Null Conventional Logic Gates},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325278},
doi = {10.1109/ITC44778.2020.9325278},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChowdhuryABFHDF20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChuangHWLTCW20,
author = {Chien{-}Hui Chuang and
Kuan{-}Wei Hou and
Cheng{-}Wen Wu and
Mincent Lee and
Chia{-}Heng Tsai and
Hao Chen and
Min{-}Jer Wang},
title = {A Deep Learning-Based Screening Method for Improving the Quality and
Reliability of Integrated Passive Devices},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--9},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325221},
doi = {10.1109/ITC44778.2020.9325221},
timestamp = {Wed, 26 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChuangHWLTCW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoteKJRMKOERCMY20,
author = {Jean{-}Fran{\c{c}}ois C{\^{o}}t{\'{e}} and
Mark Kassab and
Wojciech Janiszewski and
Ricardo Rodrigues and
Reinhard Meier and
Bartosz Kaczmarek and
Peter Orlando and
Geir Eide and
Janusz Rajski and
Glenn Col{\'{o}}n{-}Bonet and
Naveen Mysore and
Ya Yin and
Pankaj Pant},
title = {Streaming Scan Network {(SSN):} An Efficient Packetized Data Network
for Testing of Complex SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325233},
doi = {10.1109/ITC44778.2020.9325233},
timestamp = {Wed, 27 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CoteKJRMKOERCMY20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FrederiksenAH20,
author = {Steven J. Frederiksen and
John Aromando and
Michael S. Hsiao},
title = {Automated Assertion Generation from Natural Language Specifications},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325264},
doi = {10.1109/ITC44778.2020.9325264},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FrederiksenAH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GaoJ20,
author = {Wei Gao and
Tao Jing},
title = {Modeling Accuracy of Wideband Power Amplifiers with Memory effects
via Measurements},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--7},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325245},
doi = {10.1109/ITC44778.2020.9325245},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GaoJ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GeurkovK20,
author = {Vadim Geurkov and
Lev Kirischian},
title = {A Unified Method of Designing Signature Analyzers for Digital and
Mixed-Signal Circuits Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325274},
doi = {10.1109/ITC44778.2020.9325274},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GeurkovK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuazzelliF20,
author = {Ricardo Aquino Guazzelli and
Laurent Fesquet},
title = {At-speed DfT Architecture for Bundled-data Design},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--9},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325261},
doi = {10.1109/ITC44778.2020.9325261},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuazzelliF20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeTBS20,
author = {Chen He and
Stephen Traynor and
Gayathri Bhagavatheeswaran and
Hector Sanchez},
title = {Stress, Test, and Simulation of Analog IOs on Automotive ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325224},
doi = {10.1109/ITC44778.2020.9325224},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HeTBS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeY20,
author = {Chen He and
Yanyao Yu},
title = {Wafer Level Stress: Enabling Zero Defect Quality for Automotive Microcontrollers
without Package Burn-In},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325213},
doi = {10.1109/ITC44778.2020.9325213},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HeY20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstKSRHWW20,
author = {Stefan Holst and
Matthias Kampmann and
Alexander Sprenger and
Jan Dennis Reimer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Xiaoqing Wen},
title = {Logic Fault Diagnosis of Hidden Delay Defects},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325234},
doi = {10.1109/ITC44778.2020.9325234},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HolstKSRHWW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuNH020,
author = {Hanbin Hu and
Nguyen Nguyen and
Chen He and
Peng Li},
title = {Advanced Outlier Detection Using Unsupervised Learning for Screening
Potential Customer Returns},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325225},
doi = {10.1109/ITC44778.2020.9325225},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HuNH020.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangFB20,
author = {Qicheng Huang and
Chenlei Fang and
R. D. Shawn Blanton},
title = {{LAIDAR:} Learning for Accuracy and Ideal Diagnostic Resolution},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325212},
doi = {10.1109/ITC44778.2020.9325212},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangFB20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangFB20a,
author = {Qicheng Huang and
Chenlei Fang and
R. D. Shawn Blanton},
title = {Knowledge Transfer for Diagnosis Outcome Preview with Limited Data},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--9},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325214},
doi = {10.1109/ITC44778.2020.9325214},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangFB20a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ItsujiUTIH20,
author = {Hiroaki Itsuji and
Takumi Uezono and
Tadanobu Toba and
Kojiro Ito and
Masanori Hashimoto},
title = {Concurrent Detection of Failures in {GPU} Control Logic for Reliable
Parallel Computing},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325216},
doi = {10.1109/ITC44778.2020.9325216},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ItsujiUTIH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KalyanamMSA20,
author = {Vijay Kiran Kalyanam and
Eric Mahurin and
Michael Spence and
Jacob A. Abraham},
title = {Functional Test Sequences for Inducing Voltage Droops in a Multi-Threaded
Processor},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325271},
doi = {10.1109/ITC44778.2020.9325271},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KalyanamMSA20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KarmakarC20,
author = {Rajit Karmakar and
Santanu Chattopadhyay},
title = {Hardware {IP} Protection Using Logic Encryption and Watermarking},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325223},
doi = {10.1109/ITC44778.2020.9325223},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KarmakarC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhanG20,
author = {Mohammad Nasim Imtiaz Khan and
Swaroop Ghosh},
title = {Assuring Security and Reliability of Emerging Non-Volatile Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325231},
doi = {10.1109/ITC44778.2020.9325231},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhanG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KomarrajuC20,
author = {Suhasini Komarraju and
Abhijit Chatterjee},
title = {Fast {EVM} Tuning of {MIMO} Wireless Systems Using Collaborative Parallel
Testing and Implicit Reward Driven Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325270},
doi = {10.1109/ITC44778.2020.9325270},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KomarrajuC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KroegerCGDK20,
author = {Trevor Kroeger and
Wei Cheng and
Sylvain Guilley and
Jean{-}Luc Danger and
Naghmeh Karimi},
title = {Cross-PUF Attacks on Arbiter-PUFs through their Power Side-Channel},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325241},
doi = {10.1109/ITC44778.2020.9325241},
timestamp = {Fri, 11 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KroegerCGDK20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ladnushkin20,
author = {Maxim Ladnushkin},
title = {Flip-flops fanout splitting in scan designs},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325247},
doi = {10.1109/ITC44778.2020.9325247},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ladnushkin20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaisneCPKSATR20,
author = {Mike Laisne and
Alfred L. Crouch and
Michele Portolan and
Martin Keim and
Hans Martin von Staudt and
M. Abdalwahab and
Bradford G. Van Treuren and
Jeff Rearick},
title = {Modeling Novel Non-JTAG {IEEE} 1687-Like Architectures},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325248},
doi = {10.1109/ITC44778.2020.9325248},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaisneCPKSATR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeCKKLJ20,
author = {Hayoung Lee and
Keewon Cho and
Sungho Kang and
Wooheon Kang and
Seungtaek Lee and
Woosik Jeong},
title = {Fail Memory Configuration Set for {RA} Estimation},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--9},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325273},
doi = {10.1109/ITC44778.2020.9325273},
timestamp = {Tue, 27 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeCKKLJ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiWG20,
author = {Mingye Li and
Fangzhou Wang and
Sandeep Gupta},
title = {Data-driven fault model development for superconducting logic},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325220},
doi = {10.1109/ITC44778.2020.9325220},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiWG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuC20,
author = {Mengyun Liu and
Krishnendu Chakrabarty},
title = {Online Fault Detection in ReRAM-Based Computing Systems by Monitoring
Dynamic Power Consumption},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325259},
doi = {10.1109/ITC44778.2020.9325259},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuMM0RTW20,
author = {Yingdi Liu and
Sylwester Milewski and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Bartosz Wldarczak},
title = {X-Tolerant Tunable Compactor for In-System Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325266},
doi = {10.1109/ITC44778.2020.9325266},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuMM0RTW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LylinaAWW20,
author = {Natalia Lylina and
Ahmed Atteya and
Chih{-}Hao Wang and
Hans{-}Joachim Wunderlich},
title = {Security Preserving Integration and Resynthesis of Reconfigurable
Scan Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325227},
doi = {10.1109/ITC44778.2020.9325227},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LylinaAWW20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaLQHWMSKHY20,
author = {Haiying Ma and
Ligang Lu and
Haitao Qian and
Jing Han and
Xin Wen and
Fanjin Meng and
Rahul Singhal and
Martin Keim and
Yu Huang and
Wu Yang},
title = {Fast Bring-Up of an {AI} SoC through {IEEE} 1687 Integrating Embedded
TAPs and {IEEE} 1500 Interfaces},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325251},
doi = {10.1109/ITC44778.2020.9325251},
timestamp = {Tue, 29 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MaLQHWMSKHY20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MhamdiGVBL20,
author = {Safa Mhamdi and
Patrick Girard and
Arnaud Virazel and
Alberto Bosio and
Aymen Ladhar},
title = {A Learning-Based Cell-Aware Diagnosis Flow for Industrial Customer
Returns},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325246},
doi = {10.1109/ITC44778.2020.9325246},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MhamdiGVBL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MomtazAC20,
author = {Md Imran Momtaz and
Chandramouli N. Amarnath and
Abhijit Chatterjee},
title = {Concurrent Error Detection in Embedded Digital Control of Nonlinear
Autonomous Systems Using Adaptive State Space Checks},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325229},
doi = {10.1109/ITC44778.2020.9325229},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MomtazAC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nadeau-DostieR20,
author = {Benoit Nadeau{-}Dostie and
Luc Romain},
title = {Memory repair logic sharing techniques and their impact on yield},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325280},
doi = {10.1109/ITC44778.2020.9325280},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nadeau-DostieR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NandakumarCMCER20,
author = {Bharath Nandakumar and
Sameer Chillarige and
Anil Malik and
Atul Chabbra and
Nicholai L'Esperance and
Robert Redburn},
title = {Improved Chain Diagnosis Methodology for Clock and Control Signal
Defect Identification},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--9},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325236},
doi = {10.1109/ITC44778.2020.9325236},
timestamp = {Fri, 14 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NandakumarCMCER20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OhHGLJ20,
author = {Youngsu Oh and
Dongmin Han and
Byeongseon Go and
Seungtaek Lee and
Woosik Jeong},
title = {Novel Eye Diagram Estimation Technique to Assess Signal Integrity
in High-Speed Memory Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325279},
doi = {10.1109/ITC44778.2020.9325279},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OhHGLJ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PanZLCG20,
author = {Renjian Pan and
Zhaobo Zhang and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Unsupervised Root-Cause Analysis for Integrated Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325268},
doi = {10.1109/ITC44778.2020.9325268},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PanZLCG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PandeyLNGNSSC20,
author = {Sujay Pandey and
Zhiwei Liao and
Shreyas Nandi and
Sanya Gupta and
Suriyaprakash Natarajan and
Arani Sinha and
Adit D. Singh and
Abhijit Chatterjee},
title = {{SAT-ATPG} Generated Multi-Pattern Scan Tests for Cell Internal Defects:
Coverage Analysis for Resistive Opens and Shorts},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325240},
doi = {10.1109/ITC44778.2020.9325240},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PandeyLNGNSSC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PengHPCFTSY20,
author = {Hanson Peng and
Mao{-}Yuan Hsia and
Man{-}Ting Pang and
I.{-}Y. Chang and
Jeff Fan and
Huaxing Tang and
Manish Sharma and
Wu Yang},
title = {Using Volume Cell-aware Diagnosis Results to Improve Physical Failure
Analysis Efficiency},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--4},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325262},
doi = {10.1109/ITC44778.2020.9325262},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PengHPCFTSY20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz20,
author = {Irith Pomeranz},
title = {Selecting Close-to-Functional Path Delay Faults for Test Generation},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325255},
doi = {10.1109/ITC44778.2020.9325255},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RamanLMNY20,
author = {Srikanth Venkataraman and
Pongpachara Limpisathian and
Pascal Meinerzhagen and
Suriyaprakash Natarajan and
Eric Yang},
title = {Automating Design For Yield: Silicon Learning to Predictive Models
and Design Optimization},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325263},
doi = {10.1109/ITC44778.2020.9325263},
timestamp = {Mon, 13 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/RamanLMNY20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RoyMA20,
author = {Soham Roy and
Spencer K. Millican and
Vishwani D. Agrawal},
title = {Machine Intelligence for Efficient Test Pattern Generation},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325250},
doi = {10.1109/ITC44778.2020.9325250},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RoyMA20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SagirkayaD20,
author = {H{\"{u}}seyin Sagirkaya and
G{\"{o}}khan Durgun},
title = {Avionics Simulation Environment},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--3},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325215},
doi = {10.1109/ITC44778.2020.9325215},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SagirkayaD20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaikiranGC20,
author = {Marampally Saikiran and
Mona Ganji and
Degang Chen},
title = {Robust DfT Techniques for Built-in Fault Detection in Operational
Amplifiers with High Coverage},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325226},
doi = {10.1109/ITC44778.2020.9325226},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SaikiranGC20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sanabria-Borbon20,
author = {Adriana C. Sanabria{-}Borbon and
Nithyashankari Gummidipoondi Jayasankaran and
S. Y. Lee and
Edgar S{\'{a}}nchez{-}Sinencio and
Jiang Hu and
Jeyavijayan (JV) Rajendran},
title = {Schmitt Trigger-Based Key Provisioning for Locking Analog/RF Integrated
Circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325209},
doi = {10.1109/ITC44778.2020.9325209},
timestamp = {Wed, 16 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Sanabria-Borbon20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sanchez-Martinez20,
author = {Cesar A. S{\'{a}}nchez{-}Mart{\'{\i}}nez and
Paulo L{\'{o}}pez{-}Meyer and
Esdras Ju{\'{a}}rez{-}Hern{\'{a}}ndez and
Aaron Desiga{-}Orenday and
Andr{\'{e}}s Viveros{-}Wacher},
title = {High Speed Serial Links Risk Assessment in Industrial Post-Silicon
Validation Exploiting Machine Learning Techniques},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325238},
doi = {10.1109/ITC44778.2020.9325238},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sanchez-Martinez20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchvittzBR20,
author = {Rafael B. Schvittz and
Paulo F. Butzen and
Leomar S. da Rosa},
title = {Methods for Susceptibility Analysis of Logic Gates in the Presence
of Single Event Transients},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--9},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325252},
doi = {10.1109/ITC44778.2020.9325252},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SchvittzBR20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShpiroWTZL20,
author = {Uri Shpiro and
Khen Wee and
Kun{-}Han Tsai and
Justyna Zawada and
Xijiang Lin},
title = {Test Challenges of Intel {IA} Cores},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325265},
doi = {10.1109/ITC44778.2020.9325265},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShpiroWTZL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StaudtBRL20,
author = {Hans Martin von Staudt and
Mohamed Anas Benhebibi and
Jeff Rearick and
Michael Laisne},
title = {Industrial Application of {IJTAG} Standards to the Test of Big-A/little-d
devices},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325267},
doi = {10.1109/ITC44778.2020.9325267},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StaudtBRL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SternMTFT20,
author = {Andrew Stern and
Dhwani Mehta and
Shahin Tajik and
Farimah Farahmandi and
Mark M. Tehranipoor},
title = {{SPARTA:} {A} Laser Probing Approach for Trojan Detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325222},
doi = {10.1109/ITC44778.2020.9325222},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SternMTFT20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuGZ20,
author = {Fei Su and
Prashant Goteti and
Min Zhang},
title = {Unleashing the Power of Anomaly Data for Soft Failure Predictive Analytics},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325243},
doi = {10.1109/ITC44778.2020.9325243},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuGZ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterWCVDXGG20,
author = {Stephen Sunter and
Michal Wolinski and
Anthony Coyette and
Ronny Vanhooren and
Wim Dobbelaere and
Nektar Xama and
Jhon Gomez and
Georges G. E. Gielen},
title = {Quick Analyses for Improving Reliability and Functional Safety of
Mixed-Signal ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325230},
doi = {10.1109/ITC44778.2020.9325230},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SunterWCVDXGG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thornton20,
author = {Mitchell A. Thornton},
title = {Introduction to Quantum Computation Reliability},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325277},
doi = {10.1109/ITC44778.2020.9325277},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thornton20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiYLZ0CRKRWZ20,
author = {Fong{-}Jyun Tsai and
Chong{-}Siao Ye and
Kuen{-}Jong Lee and
Shi{-}Xuan Zheng and
Yu Huang and
Wu{-}Tung Cheng and
Sudhakar M. Reddy and
Mark Kassab and
Janusz Rajski and
Chen Wang and
Justyna Zawada},
title = {Prediction of Test Pattern Count and Test Data Volume for Scan Architectures
under Different Input Channel Configurations},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325219},
doi = {10.1109/ITC44778.2020.9325219},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TsaiYLZ0CRKRWZ20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuHLL20,
author = {Chen{-}Hung Wu and
Cheng{-}Yun Hsieh and
Jiun{-}Yun Li and
James Chien{-}Mo Li},
title = {qATG: Automatic Test Generation for Quantum Circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325228},
doi = {10.1109/ITC44778.2020.9325228},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuHLL20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuRTMKH20,
author = {Lizhou Wu and
Siddharth Rao and
Mottaqiallah Taouil and
Erik Jan Marinissen and
Gouri Sankar Kar and
Said Hamdioui},
title = {Characterization, Modeling and Test of Synthetic Anti-Ferromagnet
Flip Defect in STT-MRAMs},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325258},
doi = {10.1109/ITC44778.2020.9325258},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WuRTMKH20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YunNKSDBG20,
author = {Jongsin Yun and
Benoit Nadeau{-}Dostie and
Martin Keim and
Lori Schramm and
Cyrille Dray and
El Mehdi Boujamaa and
Khushal Gelda},
title = {{MBIST} Supported Multi Step Trim for Reliable eMRAM Sensing},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--5},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325218},
doi = {10.1109/ITC44778.2020.9325218},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YunNKSDBG20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZahidGFBV20,
author = {Ussama Zahid and
Giulio Gambardella and
Nicholas J. Fraser and
Michaela Blott and
Kees A. Vissers},
title = {{FAT:} Training Neural Networks for Reliable Inference Under Hardware
Faults},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325249},
doi = {10.1109/ITC44778.2020.9325249},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZahidGFBV20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZengWSS20,
author = {Yueling Jenny Zeng and
Li{-}C. Wang and
Chuanhe Jay Shan and
Nik Sumikawa},
title = {Learning {A} Wafer Feature With One Training Sample},
booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
pages = {1--10},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020.9325254},
doi = {10.1109/ITC44778.2020.9325254},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZengWSS20.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2020,
title = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC,
USA, November 1-6, 2020},
publisher = {{IEEE}},
year = {2020},
url = {https://doi.org/10.1109/ITC44778.2020},
doi = {10.1109/ITC44778.2020},
isbn = {978-1-7281-9113-3},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/2020.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbadirA19,
author = {Magdy Abadir and
Sohrab Aftabjahani},
title = {An Overview of the International Microprocessor/ SoC Test, Security
and Validation (MTV)Workshop},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--2},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000128},
doi = {10.1109/ITC44170.2019.9000128},
timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbadirA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbadirA19a,
author = {Magdy Abadir and
Sohrab Aftabjahani},
title = {An Overview of the International Verification and Security Workshop
{(IVSW)}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--2},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000165},
doi = {10.1109/ITC44170.2019.9000165},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbadirA19a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgboTH19,
author = {Innocent Okwudili Agbo and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Reliability Modeling and Mitigation for Embedded Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000175},
doi = {10.1109/ITC44170.2019.9000175},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgboTH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BoschiLLSGHSZ19,
author = {Gabriele Boschi and
Donato Luongo and
Duccio Lazzarotti and
Hanna Shaheen and
Hayk T. Grigoryan and
Gurgen Harutyunyan and
Samvel K. Shoukourian and
Yervant Zorian},
title = {Memory {FIT} Rate Mitigation Technique for Automotive SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000158},
doi = {10.1109/ITC44170.2019.9000158},
timestamp = {Mon, 03 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BoschiLLSGHSZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaudhuriLC19,
author = {Arjun Chaudhuri and
Mengyun Liu and
Krishnendu Chakrabarty},
title = {Fault-Tolerant Neuromorphic Computing Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000146},
doi = {10.1109/ITC44170.2019.9000146},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChaudhuriLC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaudhuriYCC19,
author = {Arjun Chaudhuri and
Bonan Yan and
Yiran Chen and
Krishnendu Chakrabarty},
title = {Hardware Fault Tolerance for Binary {RRAM} Crossbars},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000179},
doi = {10.1109/ITC44170.2019.9000179},
timestamp = {Mon, 04 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChaudhuriYCC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenC19,
author = {Tao Chen and
Degang Chen},
title = {Built-in self-test and self-calibration for analog and mixed signal
circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000120},
doi = {10.1109/ITC44170.2019.9000120},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenLCW19,
author = {Hao Chen and
Mincent Lee and
Liang{-}Yen Chen and
Min{-}Jer Wang},
title = {High Quality Test Methodology for Highly Reliable Devices},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000174},
doi = {10.1109/ITC44170.2019.9000174},
timestamp = {Wed, 26 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenLCW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChowdhuryGBMF19,
author = {Sreeja Chowdhury and
Fatemeh Ganji and
Troy Bryant and
Nima Maghari and
Domenic Forte},
title = {Recycled Analog and Mixed Signal Chip Detection at Zero Cost Using
{LDO} Degradation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000118},
doi = {10.1109/ITC44170.2019.9000118},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChowdhuryGBMF19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChuH19,
author = {Wei Chu and
Shi{-}Yu Huang},
title = {Overall Strategy for Online Clock System Checking Supporting Heterogeneous
Integration},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000116},
doi = {10.1109/ITC44170.2019.9000116},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChuH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DamljanovicJPSS19,
author = {Aleksa Damljanovic and
Artur Jutman and
Michele Portolan and
Ernesto S{\'{a}}nchez and
Giovanni Squillero and
Anton Tsertov},
title = {Simulation-based Equivalence Checking between {IEEE} 1687 {ICL} and
{RTL}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000181},
doi = {10.1109/ITC44170.2019.9000181},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DamljanovicJPSS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DobbelaereCCVXG19,
author = {Wim Dobbelaere and
Frederik Colle and
Anthony Coyette and
Ronny Vanhooren and
Nektar Xama and
Jhon Gomez and
Georges G. E. Gielen},
title = {Applying Vstress and defect activation coverage to produce zero-defect
mixed-signal automotive ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000123},
doi = {10.1109/ITC44170.2019.9000123},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DobbelaereCCVXG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuncanRLFT19,
author = {Adam Duncan and
Fahim Rahman and
Andrew Lukefahr and
Farimah Farahmandi and
Mark M. Tehranipoor},
title = {{FPGA} Bitstream Security: {A} Day in the Life},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000145},
doi = {10.1109/ITC44170.2019.9000145},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuncanRLFT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuvalsaintJNB19,
author = {Danielle Duvalsaint and
Xiaoxiao Jin and
Benjamin Niewenhuis and
R. D. (Shawn) Blanton},
title = {Characterization of Locked Combinational Circuits via {ATPG}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000130},
doi = {10.1109/ITC44170.2019.9000130},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuvalsaintJNB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Eggersgluss19,
author = {Stephan Eggersgl{\"{u}}{\ss}},
title = {Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT
Techniques},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000152},
doi = {10.1109/ITC44170.2019.9000152},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Eggersgluss19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EggersglussHJMR19,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Said Hamdioui and
Artur Jutman and
Maria K. Michael and
Jaan Raik and
Matteo Sonza Reorda and
Mehdi Baradaran Tahoori and
Elena Ioana Vatajelu},
title = {{IEEE} European Test Symposium {(ETS)}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000148},
doi = {10.1109/ITC44170.2019.9000148},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/EggersglussHJMR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EnyediM19,
author = {Szil{\'{a}}rd Enyedi and
Liviu Miclea},
title = {{IEEE} International Conference on Automation, Quality and Testing,
Robotics {(AQTR)}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000144},
doi = {10.1109/ITC44170.2019.9000144},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/EnyediM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FarzanaRTF19,
author = {Nusrat Farzana and
Fahim Rahman and
Mark M. Tehranipoor and
Farimah Farahmandi},
title = {SoC Security Verification using Property Checking},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000170},
doi = {10.1109/ITC44170.2019.9000170},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FarzanaRTF19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FiebackWMARMTH19,
author = {Moritz Fieback and
Lizhou Wu and
Guilherme Cardoso Medeiros and
Hassen Aziza and
Siddharth Rao and
Erik Jan Marinissen and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Device-Aware Test: {A} New Test Approach Towards {DPPB} Level},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000134},
doi = {10.1109/ITC44170.2019.9000134},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FiebackWMARMTH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FloridiaPRSLM19,
author = {Andrea Floridia and
Davide Piumatti and
Annachiara Ruospo and
Ernesto S{\'{a}}nchez and
Sergio de Luca and
Rosario Martorana},
title = {A Decentralized Scheduler for On-line Self-test Routines in Multi-core
Automotive System-on-Chips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000129},
doi = {10.1109/ITC44170.2019.9000129},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FloridiaPRSLM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ForteBKPT19,
author = {Domenic Forte and
Swarup Bhunia and
Ramesh Karri and
Jim Plusquellic and
Mark M. Tehranipoor},
title = {{IEEE} International Symposium on Hardware Oriented Security and Trust
{(HOST):} Past, Present, and Future},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000111},
doi = {10.1109/ITC44170.2019.9000111},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ForteBKPT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GaoMHSBHCGM19,
author = {Zhan Gao and
Santosh Malagi and
Min{-}Chun Hu and
Joe Swenton and
Rogier Baert and
Jos Huisken and
Bilal Chehab and
Kees Goossens and
Erik Jan Marinissen},
title = {Application of Cell-Aware Test on an Advanced 3nm {CMOS} Technology
Library},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000164},
doi = {10.1109/ITC44170.2019.9000164},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GaoMHSBHCGM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GebregiorgisT19,
author = {Anteneh Gebregiorgis and
Mehdi Baradaran Tahoori},
title = {Testing of Neuromorphic Circuits: Structural vs Functional},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000110},
doi = {10.1109/ITC44170.2019.9000110},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GebregiorgisT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HamdiouiFNT19,
author = {Said Hamdioui and
Moritz Fieback and
Surya Nagarajan and
Mottaqiallah Taouil},
title = {Testing Computation-in-Memory Architectures Based on Emerging Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000117},
doi = {10.1109/ITC44170.2019.9000117},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HamdiouiFNT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/He19,
author = {Chen He},
title = {Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive
Microcontrollers},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000147},
doi = {10.1109/ITC44170.2019.9000147},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/He19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeL19,
author = {Yi He and
Yanjing Li},
title = {Time-Slicing Soft Error Resilience in Microprocessors for Reliable
and Energy-Efficient Execution},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000180},
doi = {10.1109/ITC44170.2019.9000180},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HeL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstSKWW19,
author = {Stefan Holst and
Eric Schneider and
Michael A. Kochte and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000143},
doi = {10.1109/ITC44170.2019.9000143},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HolstSKWW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangLTCWJCL19,
author = {Andrew Yi{-}Ann Huang and
Katherine Shu{-}Min Li and
Cheng{-}Yen Tsai and
Ken Chau{-}Cheung Cheng and
Sying{-}Jyan Wang and
Xu{-}Hao Jiang and
Leon Chou and
Chen{-}Shiun Lee},
title = {TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000166},
doi = {10.1109/ITC44170.2019.9000166},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HuangLTCWJCL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IbrahimK19,
author = {Ahmed M. Y. Ibrahim and
Hans G. Kerkhoff},
title = {{DARS:} An {EDA} Framework for Reliability and Functional Safety Management
of System-on-Chips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000112},
doi = {10.1109/ITC44170.2019.9000112},
timestamp = {Sat, 19 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IbrahimK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IchiyamaKI19,
author = {Kiyotaka Ichiyama and
Takashi Kusaka and
Masahiro Ishida},
title = {A Jitter Injection Module for Production Test of 52-Gbps {PAM4} Signal
Interfaces},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000138},
doi = {10.1109/ITC44170.2019.9000138},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IchiyamaKI19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IkedaSLMXN19,
author = {Kosuke Ikeda and
Keith Schaub and
Ira Leventhal and
Yiorgos Makris and
Constantinos Xanthopoulos and
Deepika Neethirajan},
title = {Subtle Anomaly Detection of Microscopic Probes using Deep learning
based Image Completion},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000126},
doi = {10.1109/ITC44170.2019.9000126},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IkedaSLMXN19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/InoueLW19,
author = {Michiko Inoue and
Xiaowei Li and
Cheng{-}Wen Wu},
title = {Asian Test Symposium - Past, Present and Future -},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000151},
doi = {10.1109/ITC44170.2019.9000151},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/InoueLW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JayasankaranSAS19,
author = {Nithyashankari Gummidipoondi Jayasankaran and
Adriana C. Sanabria{-}Borbon and
Amr Abuellil and
Edgar S{\'{a}}nchez{-}Sinencio and
Jiang Hu and
Jeyavijayan Rajendran},
title = {Breaking Analog Locking Techniques via Satisfiability Modulo Theories},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000113},
doi = {10.1109/ITC44170.2019.9000113},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JayasankaranSAS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimLY19,
author = {Jisuk Kim and
Jinyub Lee and
Sungjoo Yoo},
title = {Machine Learning-Based Automatic Generation of eFuse Configuration
in {NAND} Flash Chip},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--9},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000162},
doi = {10.1109/ITC44170.2019.9000162},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimLY19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoganA19,
author = {Tal Kogan and
Yehonatan Abotbol},
title = {Virtual Memory Structures Facilitating Memory {BIST} Insertion In
Complex SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000153},
doi = {10.1109/ITC44170.2019.9000153},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoganA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LarssonMK19,
author = {Erik Larsson and
Prathamesh Murali and
Gani Kumisbek},
title = {{IEEE} Std. {P1687.1:} Translator and Protocol},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000135},
doi = {10.1109/ITC44170.2019.9000135},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LarssonMK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeHLIZ19,
author = {Kuen{-}Jong Lee and
Shi{-}Yu Huang and
Huawei Li and
Tomoo Inoue and
Yervant Zorian},
title = {International Test Conference in Asia (ITC-Asia) - Bridging {ITC}
and Test Community in Asia},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000177},
doi = {10.1109/ITC44170.2019.9000177},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeHLIZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiLH19,
author = {Huawei Li and
Xiaowei Li and
Yinhe Han},
title = {China Test Conference {(CTC)} - Extending the Global Test Forum to
China},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000121},
doi = {10.1109/ITC44170.2019.9000121},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiLH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiangCK19,
author = {Tung{-}Che Liang and
Krishnendu Chakrabarty and
Ramesh Karri},
title = {Programmable Daisychaining of Microelectrodes for {IP} Protection
in {MEDA} Biochips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000167},
doi = {10.1109/ITC44170.2019.9000167},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiangCK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuHFB19,
author = {Zeye Liu and
Qicheng Huang and
Chenlei Fang and
R. D. (Shawn) Blanton},
title = {Improving Test Chip Design Efficiency via Machine Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000131},
doi = {10.1109/ITC44170.2019.9000131},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuHFB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuLCG19,
author = {Mengyun Liu and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Knowledge Transfer in Board-Level Functional Fault Identification
using Domain Adaptation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000172},
doi = {10.1109/ITC44170.2019.9000172},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuLCG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LotfiHBRSBH19,
author = {Atieh Lotfi and
Saurabh Hukerikar and
Keshav Balasubramanian and
Paul Racunas and
Nirmal R. Saxena and
Richard Bramley and
Yanxiang Huang},
title = {Resiliency of automotive object detection networks on {GPU} architectures},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--9},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000150},
doi = {10.1109/ITC44170.2019.9000150},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LotfiHBRSBH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LylinaARSBW19,
author = {Natalia Lylina and
Ahmed Atteya and
Pascal Raiola and
Matthias Sauer and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Security Compliance Analysis of Reconfigurable Scan Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--9},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000114},
doi = {10.1109/ITC44170.2019.9000114},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LylinaARSBW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaazSH19,
author = {Mohammad Urf Maaz and
Alexander Sprenger and
Sybille Hellebrand},
title = {A Hybrid Space Compactor for Adaptive X-Handling},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000159},
doi = {10.1109/ITC44170.2019.9000159},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaazSH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McLaurinK19,
author = {Teresa McLaurin and
Rob Knoth},
title = {The Challenges of Implementing an {MBIST} Interface: {A} Practical
Application},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000157},
doi = {10.1109/ITC44170.2019.9000157},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McLaurinK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MozaffariBNAPSC19,
author = {Seyed Nima Mozaffari and
Bonita Bhaskaran and
Kaushik Narayanun and
Ayub Abdollahian and
Vinod Pagalone and
Shantanu Sarangi and
Jonathon E. Colburn},
title = {An Efficient Supervised Learning Method to Predict Power Supply Noise
During At-speed Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000171},
doi = {10.1109/ITC44170.2019.9000171},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MozaffariBNAPSC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeeTTSLMM19,
author = {Nilanjan Mukherjee and
Jerzy Tyszer and
Daniel Tille and
Mahendar Sapati and
Yingdi Liu and
Jeffrey Mayer and
Sylwester Milewski and
Elham K. Moghaddam and
Janusz Rajski and
Jedrzej Solecki},
title = {Test Time and Area Optimized BrST Scheme for Automotive ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000133},
doi = {10.1109/ITC44170.2019.9000133},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeeTTSLMM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NienWLCCCLKC19,
author = {Yu{-}Teng Nien and
Kai{-}Chiang Wu and
Dong{-}Zhen Lee and
Ying{-}Yen Chen and
Po{-}Lin Chen and
Mason Chern and
Jih{-}Nung Lee and
Shu{-}Yi Kao and
Mango Chia{-}Tso Chao},
title = {Methodology of Generating Timing-Slack-Based Cell-Aware Tests},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000119},
doi = {10.1109/ITC44170.2019.9000119},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NienWLCCCLKC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OckunzziGKTPJ19,
author = {Kelly Ockunzzi and
Richard Grupp and
Brion Keller and
Mark Taylor and
Sreekanth Pai and
Greeshma Jayakumar},
title = {Applications of Hierarchical Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000156},
doi = {10.1109/ITC44170.2019.9000156},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OckunzziGKTPJ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OmuroSKO19,
author = {Toshiyuki Omuro and
Shigeo Nakamura Surname and
Takashi Kimura and
Kiyokawa Omuro},
title = {A New Test Method for the Large Current Magnetic Sensors},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000142},
doi = {10.1109/ITC44170.2019.9000142},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OmuroSKO19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PandeyGLNSC19,
author = {Sujay Pandey and
Sanya Gupta and
Madhu Sudhan L. and
Suriya Natarajan and
Arani Sinha and
Abhijit Chatterjee},
title = {Characterization of Library Cells for Open-circuit Defect Exposure:
{A} Systematic Methodology},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000154},
doi = {10.1109/ITC44170.2019.9000154},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PandeyGLNSC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PapameletisCFSC19,
author = {Christos Papameletis and
Vivek Chickermane and
Brian Foutz and
Sarthak Singhal and
Krishna Chakravadhanula},
title = {Optimized Physical {DFT} Synthesis of Unified Compression and {LBIST}
for Automotive Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000115},
doi = {10.1109/ITC44170.2019.9000115},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PapameletisCFSC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz19,
author = {Irith Pomeranz},
title = {Iterative Test Generation for Gate-Exhaustive Faults to Cover the
Sites of Undetectable Target Faults},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000124},
doi = {10.1109/ITC44170.2019.9000124},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz19a,
author = {Irith Pomeranz},
title = {Compaction of a Functional Broadside Test Set through the Compaction
of a Functional Test Sequence without Sequential Fault Simulation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000161},
doi = {10.1109/ITC44170.2019.9000161},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz19a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ReddyBM19,
author = {Gaurav Rajavendra Reddy and
Mohammad{-}Mahdi Bidmeshki and
Yiorgos Makris},
title = {{VIPER:} {A} Versatile and Intuitive Pattern GenERator for Early Design
Space Exploration},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000169},
doi = {10.1109/ITC44170.2019.9000169},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ReddyBM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RojasHC19,
author = {Luis D. Rojas and
Kevin Hess and
Christina Carter{-}Brown},
title = {Effectively Using Machine Learning to Expedite System Level Test Failure
Debug},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000163},
doi = {10.1109/ITC44170.2019.9000163},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RojasHC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchromHMVKF19,
author = {Gerhard Schrom and
Michael J. Hill and
Sarath Makala and
Ravi Sankar Vunnam and
Arun Krishnamoorthy and
Ryan Ferguson},
title = {Efficiency Measurement Method for Fully Integrated Voltage Regulators
used in 4\({}^{\mbox{th}}\) and 5\({}^{\mbox{th}}\) Generation Intel{\textregistered}
Core{\texttrademark} Microprocessors},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000125},
doi = {10.1109/ITC44170.2019.9000125},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SchromHMVKF19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShanWWS19,
author = {Chuanhe Jay Shan and
Ahmed Wahba and
Li{-}C. Wang and
Nik Sumikawa},
title = {Deploying {A} Machine Learning Solution As {A} Surrogate},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000109},
doi = {10.1109/ITC44170.2019.9000109},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShanWWS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShenLHW19,
author = {Cheng{-}Hsien Shen and
Aaron C.{-}W. Liang and
Charles C.{-}H. Hsu and
Charles H.{-}P. Wen},
title = {{FAE:} Autoencoder-Based Failure Binning of {RTL} Designs for Verification
and Debugging},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000178},
doi = {10.1109/ITC44170.2019.9000178},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShenLHW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShoukourianSS19,
author = {Samvel K. Shoukourian and
Yuri Shoukourian and
Vladimir Sahakyan},
title = {Armenia: Communicating to World Community in Electronic Test and Design},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000139},
doi = {10.1109/ITC44170.2019.9000139},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShoukourianSS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Singh19,
author = {Adit D. Singh},
title = {An Adaptive Approach to Minimize System Level Tests Targeting Low
Voltage {DVFS} Failures},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000173},
doi = {10.1109/ITC44170.2019.9000173},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Singh19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StamenkovicBCNP19,
author = {Zoran Stamenkovic and
Alberto Bosio and
Gy{\"{o}}rgy Cserey and
Ondrej Nov{\'{a}}k and
Witold A. Pleskacz and
Luk{\'{a}}s Sekanina and
Andreas Steininger and
Goran Stojanovic and
Viera Stopjakov{\'{a}}},
title = {International Symposium on Design and Diagnostics of Electronic Circuits
and Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000137},
doi = {10.1109/ITC44170.2019.9000137},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/StamenkovicBCNP19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuGZ19,
author = {Fei Su and
Prashant Goteti and
Min Zhang},
title = {On Freedom from Interference in Mixed-Criticality Systems: {A} Causal
Learning Approach},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000160},
doi = {10.1109/ITC44170.2019.9000160},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuGZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sunter19,
author = {Stephen Sunter},
title = {Efficient Analog Defect Simulation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000141},
doi = {10.1109/ITC44170.2019.9000141},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sunter19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VashisthaRPA19,
author = {Nidish Vashistha and
M. Tanjidur Rahman and
Olivia P. Paradis and
Navid Asadizanjani},
title = {Is Backside the New Backdoor in Modern SoCs?: Invited Paper},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000127},
doi = {10.1109/ITC44170.2019.9000127},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VashisthaRPA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangG19,
author = {Fangzhou Wang and
Sandeep Gupta},
title = {Multi-cell characterization: Developing robust cells and abstraction
for Rapid Single Flux Quantum {(RSFQ)} Logic},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000132},
doi = {10.1109/ITC44170.2019.9000132},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuA19,
author = {Zheng Xu and
Jacob Abraham},
title = {Safety Design of a Convolutional Neural Network Accelerator with Error
Localization and Correction},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000149},
doi = {10.1109/ITC44170.2019.9000149},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XuA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangK19,
author = {Jingchi Yang and
David C. Keezer},
title = {A Framework for Design of Self-Repairing Digital Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000155},
doi = {10.1109/ITC44170.2019.9000155},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhongC19,
author = {Zhanwei Zhong and
Krishnendu Chakrabarty},
title = {Fault Recovery in Micro-Electrode-Dot-Array Digital Microfluidic Biochips
Using an {IJTAG} NetworkBehaviors},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000176},
doi = {10.1109/ITC44170.2019.9000176},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhongC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhongZZHC19,
author = {Zhanwei Zhong and
Haodong Zhu and
Peiran Zhang and
Tony Jun Huang and
Krishnendu Chakrabarty},
title = {Structural Test and Functional Test for Digital Acoustofluidic Biochips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000140},
doi = {10.1109/ITC44170.2019.9000140},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhongZZHC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianHCL19,
author = {Yervant Zorian and
Vladimir Hahanov and
Svetlana Chumachenko and
Eugenia Litvinova},
title = {17th {IEEE} East-West Design and Test Symposium},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000168},
doi = {10.1109/ITC44170.2019.9000168},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianHCL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianSV19,
author = {Apik Zorian and
Basim Shanyour and
Milir Vaseekar},
title = {Machine Learning-Based {DFT} Recommendation System for {ATPG} {QOR}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000136},
doi = {10.1109/ITC44170.2019.9000136},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianSV19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2019,
title = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
publisher = {{IEEE}},
year = {2019},
url = {https://ieeexplore.ieee.org/xpl/conhome/8977396/proceeding},
isbn = {978-1-7281-4823-6},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/2019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0004SJP18,
author = {Meng Li and
Kaveh Shamsi and
Yier Jin and
David Z. Pan},
title = {TimingSAT: Decamouflaging Timing-based Logic Obfuscation},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624671},
doi = {10.1109/TEST.2018.8624671},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/0004SJP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/0005MRT018,
author = {Yu Huang and
Sylwester Milewski and
Janusz Rajski and
Jerzy Tyszer and
Chen Wang},
title = {Hypercompression of Test Patterns},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624868},
doi = {10.1109/TEST.2018.8624868},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/0005MRT018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhmedFIM18,
author = {Alif Ahmed and
Farimah Farahmandi and
Yousef Iskander and
Prabhat Mishra},
title = {Scalable Hardware Trojan Activation by Interleaving Concrete Simulation
and Symbolic Execution},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624854},
doi = {10.1109/TEST.2018.8624854},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AhmedFIM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AndraudOLMV18,
author = {Martin Andraud and
Laura Isabel Galindez Olascoaga and
Yichuan Lu and
Yiorgos Makris and
Marian Verhelst},
title = {On the use of Bayesian Networks for Resource-Efficient Self-Calibration
of Analog/RF ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624893},
doi = {10.1109/TEST.2018.8624893},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AndraudOLMV18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ault18,
author = {Trevor Ault},
title = {Optimizing the Use of Simulations for Commissioning with Systems Engineering
Principles and Objective Analysis},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624713},
doi = {10.1109/TEST.2018.8624713},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ault18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CantoroDRS18,
author = {Riccardo Cantoro and
Aleksa Damljanovic and
Matteo Sonza Reorda and
Giovanni Squillero},
title = {A New Technique to Generate Test Sequences for Reconfigurable Scan
Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624742},
doi = {10.1109/TEST.2018.8624742},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CantoroDRS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CasarsaH18,
author = {M. Casarsa and
Gurgen Harutyunyan},
title = {Case Study and Advanced Functional Safety Solution for Automotive
SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624740},
doi = {10.1109/TEST.2018.8624740},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CasarsaH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChagantiSDAAC18,
author = {Shravan K. Chaganti and
Abalhassan Sheikh and
Sumit Dubey and
Frank Ankapong and
Nitin Agarwal and
Degang Chen},
title = {Fast and accurate linearity test for DACs with various architectures
using segmented models},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624753},
doi = {10.1109/TEST.2018.8624753},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChagantiSDAAC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaudhuriC18,
author = {Arjun Chaudhuri and
Krishnendu Chakrabarty},
title = {Analysis of Process Variations, Defects, and Design-Induced Coupling
in Memristors},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624819},
doi = {10.1109/TEST.2018.8624819},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChaudhuriC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChillarigeCMNSC18,
author = {Sameer Chillarige and
Atul Chhabra and
Anil Malik and
Bharath Nandakumar and
Joe Swenton and
Krishna Chakravadhanula},
title = {Improving Diagnosis Resolution and Performance at High Compression
Ratios},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624829},
doi = {10.1109/TEST.2018.8624829},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChillarigeCMNSC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DasSC18,
author = {Sourav Das and
Fei Su and
Sreejit Chakravarty},
title = {A PVT-Resilient No-Touch {DFT} Methodology for Prebond {TSV} Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624691},
doi = {10.1109/TEST.2018.8624691},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DasSC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DolatsaraYHBS18,
author = {Majid Ahadi Dolatsara and
Huan Yu and
Jose Ale Hejase and
Wiren Dale Becker and
Madhavan Swaminathan},
title = {Polynomial Chaos modeling for jitter estimation in high-speed links},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624875},
doi = {10.1109/TEST.2018.8624875},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DolatsaraYHBS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FernC18,
author = {Nicole Fern and
Kwang{-}Ting (Tim) Cheng},
title = {Pre-silicon Formal Verification of {JTAG} Instruction Opcodes for
Security},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624739},
doi = {10.1109/TEST.2018.8624739},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FernC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FiebackTH18,
author = {Moritz Fieback and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Testing Resistive Memories: Where are We and What is Missing?},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624895},
doi = {10.1109/TEST.2018.8624895},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FiebackTH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FultonP18,
author = {Nathan Fulton and
Andr{\'{e}} Platzer},
title = {Safe {AI} for {CPS} (Invited Paper)},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--7},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624774},
doi = {10.1109/TEST.2018.8624774},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FultonP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GrigoryanSHZA18,
author = {Hayk T. Grigoryan and
Samvel K. Shoukourian and
Gurgen Harutyunyan and
Yervant Zorian and
Costas Argyrides},
title = {Advanced ECC-Based {FIT} Rate Mitigation Technique for Automotive
SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--6},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624837},
doi = {10.1109/TEST.2018.8624837},
timestamp = {Mon, 03 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/GrigoryanSHZA18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gupta18,
author = {Pallav Gupta},
title = {An Effective Methodology for Automated Diagnosis of Functional Pattern
Failures to Support Silicon Debug},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624881},
doi = {10.1109/TEST.2018.8624881},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gupta18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeM18,
author = {Friedrich Hapke and
Peter C. Maxwell},
title = {Total Critical Area Based Testing},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624825},
doi = {10.1109/TEST.2018.8624825},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HapkeM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HoFVBG18,
author = {Tien{-}Phu Ho and
Eric Faehn and
Arnaud Virazel and
Alberto Bosio and
Patrick Girard},
title = {An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624799},
doi = {10.1109/TEST.2018.8624799},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HoFVBG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HoqueCCB18,
author = {Tamzidul Hoque and
Jonathan Cruz and
Prabuddha Chakraborty and
Swarup Bhunia},
title = {Hardware {IP} Trust Validation: Learn (the Untrustworthy), and Verify},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624727},
doi = {10.1109/TEST.2018.8624727},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HoqueCCB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HossainSIO18,
author = {Fakir Sharif Hossain and
Michihiro Shintani and
Michiko Inoue and
Alex Orailoglu},
title = {Variation-Aware Hardware Trojan Detection through Power Side-channel},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624866},
doi = {10.1109/TEST.2018.8624866},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HossainSIO18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HowellHBVDGRSFR18,
author = {Will Howell and
Friedrich Hapke and
Edward Brazil and
Srikanth Venkataraman and
R. Datta and
Andreas Glowatz and
Wilfried Redemund and
J. Schmerberg and
Anja Fast and
Janusz Rajski},
title = {{DPPM} Reduction Methods and New Defect Oriented Test Methods Applied
to Advanced FinFET Technologies},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624906},
doi = {10.1109/TEST.2018.8624906},
timestamp = {Mon, 01 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HowellHBVDGRSFR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangFMB18,
author = {Qicheng Huang and
Chenlei Fang and
Soumya Mittal and
R. D. Shawn Blanton},
title = {Improving Diagnosis Efficiency via Machine Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624884},
doi = {10.1109/TEST.2018.8624884},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangFMB18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangGLG18,
author = {I{-}De Huang and
Pallav Gupta and
Loganathan Lingappan and
Vijay Gangaram},
title = {Online Scan Diagnosis : {A} Novel Approach to Volume Diagnosis},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624686},
doi = {10.1109/TEST.2018.8624686},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangGLG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IchiyamaKI18,
author = {Kiyotaka Ichiyama and
Takashi Kusaka and
Masahiro Ishida},
title = {A Stressed Eye Testing Module for Production Test of 30-Gbps {NRZ}
Signal Interfaces},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624841},
doi = {10.1109/TEST.2018.8624841},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IchiyamaKI18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG18,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Self-Learning Health-Status Analysis for a Core Router System},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624712},
doi = {10.1109/TEST.2018.8624712},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KanD18,
author = {Senwen Kan and
Jennifer Dworak},
title = {{IJTAG} Integrity Checking with Chained Hashing},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624777},
doi = {10.1109/TEST.2018.8624777},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KanD18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KapatsoriLAM18,
author = {Christiana Kapatsori and
Yu Liu and
Angelos Antonopoulos and
Yiorgos Makris},
title = {Hardware Dithering: {A} Run-Time Method for Trojan Neutralization
in Wireless Cryptographic ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--7},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624705},
doi = {10.1109/TEST.2018.8624705},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KapatsoriLAM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KatselasHJPM18,
author = {Leonidas Katselas and
Alkis A. Hatzopoulos and
Hailong Jiao and
Christos Papameletis and
Erik Jan Marinissen},
title = {On-Chip Toggle Generators to Provide Realistic Conditions during Test
of Digital 2D-SoCs and 3D-SICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624803},
doi = {10.1109/TEST.2018.8624803},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KatselasHJPM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhanG18,
author = {Mohammad Nasim Imtiaz Khan and
Swaroop Ghosh},
title = {Test of Supply Noise for Emerging Non-Volatile Memory},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624896},
doi = {10.1109/TEST.2018.8624896},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhanG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoganABHMZ18,
author = {Tal Kogan and
Yehonatan Abotbol and
Gabriele Boschi and
Gurgen Harutyunyan and
N. Martirosyan and
Yervant Zorian},
title = {Advanced Uniformed Test Approach For Automotive SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624810},
doi = {10.1109/TEST.2018.8624810},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoganABHMZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KungLR18,
author = {Yi{-}Cheng Kung and
Kuen{-}Jong Lee and
Sudhakar M. Reddy},
title = {Generating Compact Test Patterns for {DC} and {AC} Faults Using One
{ATPG} Run},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624678},
doi = {10.1109/TEST.2018.8624678},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KungLR18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LanHWLS018,
author = {Shuyue Lan and
Chao Huang and
Zhilu Wang and
Hengyi Liang and
Wenhao Su and
Qi Zhu},
title = {Design Automation for Intelligent Automotive Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624723},
doi = {10.1109/TEST.2018.8624723},
timestamp = {Thu, 09 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LanHWLS018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeinoSDFL18,
author = {Klas Leino and
Shayak Sen and
Anupam Datta and
Matt Fredrikson and
Linyi Li},
title = {Influence-Directed Explanations for Deep Convolutional Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624792},
doi = {10.1109/TEST.2018.8624792},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeinoSDFL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinAYP18,
author = {Yibo Lin and
Mohamed Baker Alawieh and
Wei Ye and
David Z. Pan},
title = {Machine Learning for Yield Learning and Optimization},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624733},
doi = {10.1109/TEST.2018.8624733},
timestamp = {Mon, 28 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinAYP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Liu0RRT18,
author = {Yingdi Liu and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer},
title = {Deterministic Stellar {BIST} for In-System Automotive Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624872},
doi = {10.1109/TEST.2018.8624872},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Liu0RRT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuPYLCG18,
author = {Mengyun Liu and
Renjian Pan and
Fangming Ye and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Fine-Grained Adaptive Testing Based on Quality Prediction},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624891},
doi = {10.1109/TEST.2018.8624891},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuPYLCG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuXWC18,
author = {Mengyun Liu and
Lixue Xia and
Yu Wang and
Krishnendu Chakrabarty},
title = {Fault Tolerance for RRAM-Based Matrix Operations},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624687},
doi = {10.1109/TEST.2018.8624687},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuXWC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ManjunathHSETMM18,
author = {Niveditha Manjunath and
Dieter Haerle and
Stephen Sabanal and
Herbert Eichinger and
Hermann Tauber and
Andreas Machne and
Christian Manthey and
Mikko Vaananen and
Radu Grosu and
Dejan Nickovic},
title = {Production Tests Coverage Analysis in the Simulation Environment},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--7},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624870},
doi = {10.1109/TEST.2018.8624870},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ManjunathHSETMM18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MarinissenFPSJW18,
author = {Erik Jan Marinissen and
Ferenc Fodor and
Arnita Podpod and
Michele Stucchi and
Yu{-}Rong Jian and
Cheng{-}Wen Wu},
title = {Solutions to Multiple Probing Challenges for Test Access to Multi-Die
Stacked Integrated Circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624731},
doi = {10.1109/TEST.2018.8624731},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MarinissenFPSJW18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McLaurinL18,
author = {Teresa L. McLaurin and
Ignatius P. Lawrence},
title = {Improving Power, Performance and Area with Test: {A} Case Study},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624752},
doi = {10.1109/TEST.2018.8624752},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McLaurinL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NairBTTGHZ18,
author = {Sarath Mohanachandran Nair and
Rajendra Bishnoi and
Mehdi Baradaran Tahoori and
Grigor Tshagharyan and
Hayk T. Grigoryan and
Gurgen Harutyunyan and
Yervant Zorian},
title = {Defect injection, Fault Modeling and Test Algorithm Generation Methodology
for {STT-MRAM}},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624725},
doi = {10.1109/TEST.2018.8624725},
timestamp = {Tue, 31 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NairBTTGHZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NeroSWS18,
author = {Matthew Nero and
Chuanhe Jay Shan and
Li{-}C. Wang and
Nik Sumikawa},
title = {Concept Recognition in Production Yield Data Analytics},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624714},
doi = {10.1109/TEST.2018.8624714},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NeroSWS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz18,
author = {Irith Pomeranz},
title = {On Close-to-Functional Test Sequences},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624703},
doi = {10.1109/TEST.2018.8624703},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiTZ18,
author = {Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {On New Class of Test Points and Their Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624900},
doi = {10.1109/TEST.2018.8624900},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiTZ18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rangel-PatinoRH18,
author = {Francisco E. Rangel{-}Patino and
Jos{\'{e}} Ernesto Rayas{-}S{\'{a}}nchez and
Nagib Hakim},
title = {Transmitter and Receiver Equalizers Optimization Methodologies for
High-Speed Links in Industrial Computer Platforms Post-Silicon Validation},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624794},
doi = {10.1109/TEST.2018.8624794},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rangel-PatinoRH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShanyourT18,
author = {Basim Shanyour and
Spyros Tragoudas},
title = {Detection of Low Power Trojans in Standard Cell Designs using Built-in
Current Sensors},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624715},
doi = {10.1109/TEST.2018.8624715},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShanyourT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShenPCLP18,
author = {Ting{-}Yu Shen and
Chia{-}Cheng Pai and
Tsai{-}Chieh Chen and
James Chien{-}Mo Li and
Samuel Pan},
title = {Test methodology for {PCHB/PCFB} Asynchronous Circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624757},
doi = {10.1109/TEST.2018.8624757},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShenPCLP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShintaniIN18,
author = {Michihiro Shintani and
Michiko Inoue and
Yoshiyuki Nakamura},
title = {Artificial Neural Network Based Test Escape Screening Using Generative
Model},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--8},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624821},
doi = {10.1109/TEST.2018.8624821},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShintaniIN18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SternBSSFT18,
author = {Andrew Stern and
Ulbert Botero and
Bicky Shakya and
Hao{-}Ting Shen and
Domenic Forte and
Mark M. Tehranipoor},
title = {{EMFORCED:} EM-based Fingerprinting Framework for Counterfeit Detection
with Demonstration on Remarked and Cloned ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624679},
doi = {10.1109/TEST.2018.8624679},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SternBSSFT18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuG18,
author = {Fei Su and
Prashant Goteti},
title = {Improving Analog Functional Safety Using Data-Driven Anomaly Detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624716},
doi = {10.1109/TEST.2018.8624716},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TshagharyanHZGG18,
author = {Grigor Tshagharyan and
Gurgen Harutyunyan and
Yervant Zorian and
Anteneh Gebregiorgis and
Mohammad Saber Golanbari and
Rajendra Bishnoi and
Mehdi Baradaran Tahoori},
title = {Modeling and Testing of Aging Faults in FinFET Memories for Automotive
Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624890},
doi = {10.1109/TEST.2018.8624890},
timestamp = {Tue, 31 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TshagharyanHZGG18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wang18,
author = {Li{-}C. Wang},
title = {An Autonomous System View To Apply Machine Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624844},
doi = {10.1109/TEST.2018.8624844},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wang18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangLLL18,
author = {Ying Wang and
Wen Li and
Huawei Li and
Xiaowei Li},
title = {Lightweight Timing Channel Protection for Shared {DRAM} Controller},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624848},
doi = {10.1109/TEST.2018.8624848},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangLLL18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWMC18,
author = {Peter Wohl and
John A. Waicukauski and
Gregory A. Maston and
Jonathon E. Colburn},
title = {{XLBIST:} X-Tolerant Logic {BIST}},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--9},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624738},
doi = {10.1109/TEST.2018.8624738},
timestamp = {Sat, 26 Jan 2019 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWMC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuTRMH18,
author = {Lizhou Wu and
Mottaqiallah Taouil and
Siddharth Rao and
Erik Jan Marinissen and
Said Hamdioui},
title = {Electrical Modeling of {STT-MRAM} Defects},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624749},
doi = {10.1109/TEST.2018.8624749},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuTRMH18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YasinS18,
author = {Muhammad Yasin and
Ozgur Sinanoglu},
title = {Towards Provably Secure Logic Locking for Hardening Hardware Security
Dissertation Summary: {IEEE} {TTTC} {E.J.} McCluskey Doctoral Thesis
Award Competition},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624809},
doi = {10.1109/TEST.2018.8624809},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YasinS18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangLC18,
author = {Ling Zhang and
Zipeng Li and
Krishnendu Chakrabarty},
title = {Built-In Self-Diagnosis and Fault-Tolerant Daisy-Chain Design in {MEDA}
Biochips},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624847},
doi = {10.1109/TEST.2018.8624847},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangLC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhongLYC18,
author = {Zhanwei Zhong and
Guoliang Li and
Qinfu Yang and
Krishnendu Chakrabarty},
title = {Access-Time Minimization in the {IEEE} 1687 Network Using Broadcast
and Hardware Parallelism},
booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
pages = {1--10},
publisher = {{IEEE}},
year = {2018},
url = {https://doi.org/10.1109/TEST.2018.8624850},
doi = {10.1109/TEST.2018.8624850},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhongLYC18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2018,
title = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
October 29 - Nov. 1, 2018},
publisher = {{IEEE}},
year = {2018},
url = {https://ieeexplore.ieee.org/xpl/conhome/8610502/proceeding},
isbn = {978-1-5386-8382-8},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2018.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AraiII17,
author = {Masayuki Arai and
Shingo Inuyama and
Kazuhiko Iwasaki},
title = {Layout-aware 2-step window-based pattern reordering for fast bridge/open
test generation},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242060},
doi = {10.1109/TEST.2017.8242060},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/AraiII17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BecklerB17,
author = {Matthew Beckler and
Ronald D. Blanton},
title = {Fault simulation acceleration for {TRAX} dictionary construction using
GPUs},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242078},
doi = {10.1109/TEST.2017.8242078},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BecklerB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chakravadhanula17,
author = {Krishna Chakravadhanula and
Vivek Chickermane and
Paul Cunningham and
Brian Foutz and
Dale Meehl and
Louis Milano and
Christos Papameletis and
David Scott and
Steev Wilcox},
title = {Advancing test compression to the physical dimension},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242035},
doi = {10.1109/TEST.2017.8242035},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Chakravadhanula17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChillarigeMSSC17,
author = {Sameer Chillarige and
Anil Malik and
Sharjinder Singh and
Joe Swenton and
Krishna Chakravadhanula},
title = {High throughput multiple device diagnosis system},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242051},
doi = {10.1109/TEST.2017.8242051},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChillarigeMSSC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DeyatiMJC17,
author = {Sabyasachi Deyati and
Barry J. Muldrey and
Byunghoo Jung and
Abhijit Chatterjee},
title = {Concurrent built in test and tuning of beamforming {MIMO} systems
using learning assisted performance optimization},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242031},
doi = {10.1109/TEST.2017.8242031},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DeyatiMJC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DingLL17,
author = {Xiaoan Ding and
Xi Liang and
Yanjing Li},
title = {Cross-layer refresh mitigation for efficient and reliable {DRAM} systems:
{A} comparative study},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242065},
doi = {10.1109/TEST.2017.8242065},
timestamp = {Thu, 09 Apr 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DingLL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DongGLRSWW17,
author = {Yan Dong and
Grady Giles and
GuoLiang Li and
Jeff Rearick and
John Schulze and
James Wingfield and
Tim Wood},
title = {Maximizing scan pin and bandwidth utilization with a scan routing
fabric},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242053},
doi = {10.1109/TEST.2017.8242053},
timestamp = {Sat, 03 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DongGLRSWW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuS17,
author = {Boyang Du and
Luca Sterpone},
title = {Fault tolerant electronic system design},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242080},
doi = {10.1109/TEST.2017.8242080},
timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DuS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ElnaggarCT17,
author = {Rana Elnaggar and
Krishnendu Chakrabarty and
Mehdi Baradaran Tahoori},
title = {Run-time hardware trojan detection using performance counters},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242063},
doi = {10.1109/TEST.2017.8242063},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ElnaggarCT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EsenCXDVG17,
author = {Baris Esen and
Anthony Coyette and
Nektar Xama and
Wim Dobbelaere and
Ronny Vanhooren and
Georges G. E. Gielen},
title = {Non-intrusive detection of defects in mixed-signal integrated circuits
using light activation},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--7},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242056},
doi = {10.1109/TEST.2017.8242056},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EsenCXDVG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GhermanFASD17,
author = {Valentin Gherman and
Emna Farjallah and
Jean{-}Marc Armani and
Marcelino Seif and
Luigi Dilillo},
title = {Improvement of the tolerated raw bit error rate in {NAND} flash-based
SSDs with the help of embedded statistics},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242066},
doi = {10.1109/TEST.2017.8242066},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GhermanFASD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GuptaCDE17,
author = {Saurabh Gupta and
Al Crouch and
Jennifer Dworak and
Daniel Engels},
title = {Increasing {IJTAG} bandwidth and managing security through parallel
locking-SIBs},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242034},
doi = {10.1109/TEST.2017.8242034},
timestamp = {Wed, 20 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GuptaCDE17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstSKKMWKW17,
author = {Stefan Holst and
Eric Schneider and
Koshi Kawagoe and
Michael A. Kochte and
Kohei Miyase and
Hans{-}Joachim Wunderlich and
Seiji Kajihara and
Xiaoqing Wen},
title = {Analysis and mitigation or IR-Drop induced scan shift-errors},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242055},
doi = {10.1109/TEST.2017.8242055},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HolstSKKMWKW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HongL17,
author = {Shuo{-}Lian Hong and
Kuen{-}Jong Lee},
title = {A run-pause-resume silicon debug technique with cycle granularity
for multiple clock domain systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242077},
doi = {10.1109/TEST.2017.8242077},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HongL17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IshidaI17,
author = {Masahiro Ishida and
Kiyotaka Ichiyama},
title = {A jitter separation and {BER} estimation method for asymmetric total
jitter distributions},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242058},
doi = {10.1109/TEST.2017.8242058},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IshidaI17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JainATP17,
author = {Nimit Jain and
Nitin Agarwal and
Rajavelu Thinakaran and
Rubin A. Parekhji},
title = {Low cost dynamic error detection in linearity testing of {SAR} ADCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242030},
doi = {10.1109/TEST.2017.8242030},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JainATP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JeongYWO17,
author = {Jae Woong Jeong and
Ender Yilmaz and
LeRoy Winemberg and
Sule Ozev},
title = {Built-in self-test for stability measurement of low dropout regulator},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242033},
doi = {10.1109/TEST.2017.8242033},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JeongYWO17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinCJBKGGC17,
author = {Xiankun Jin and
Tao Chen and
Mayank Jain and
Arun Kumar Barman and
David Kramer and
Doug Garrity and
Randall L. Geiger and
Degang Chen},
title = {An on-chip {ADC} {BIST} solution and the {BIST} enabled calibration
scheme},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242032},
doi = {10.1109/TEST.2017.8242032},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/JinCJBKGGC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG17,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Changepoint-based anomaly detection in a core router system},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242043},
doi = {10.1109/TEST.2017.8242043},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG17a,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Symbol-based health-status analysis in a core router system},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242044},
doi = {10.1109/TEST.2017.8242044},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Klosterboer17,
author = {Bob Klosterboer},
title = {Testing beyond the green light},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242025},
doi = {10.1109/TEST.2017.8242025},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Klosterboer17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoganABHKSZ17,
author = {Tal Kogan and
Yehonatan Abotbol and
Gabriele Boschi and
Gurgen Harutyunyan and
I. Kroul and
Hanna Shaheen and
Yervant Zorian},
title = {Advanced functional safety mechanisms for embedded memories and IPs
in automotive SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242046},
doi = {10.1109/TEST.2017.8242046},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoganABHKSZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduKKK17,
author = {Subhadip Kundu and
Kuldip Kumar and
Rishi Kumar and
Rohit Kapur},
title = {Diagnosing multiple faulty chains with low pin convolution compressor
using compressed production test set},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--7},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242048},
doi = {10.1109/TEST.2017.8242048},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunduKKK17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kunkel17,
author = {Joachim Kunkel},
title = {Automotive keynote: Look Mom! No hands!},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242027},
doi = {10.1109/TEST.2017.8242027},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kunkel17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaisneSBE17,
author = {Michael Laisne and
Hans Martin von Staudt and
Sourabh Bhalerao and
Mark Eason},
title = {Single-pin test control for Big A, little {D} devices},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242069},
doi = {10.1109/TEST.2017.8242069},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaisneSBE17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lin17,
author = {Xijiang Lin},
title = {On applying scan based structural test for designs with dual-edge
triggered flip-flops},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242054},
doi = {10.1109/TEST.2017.8242054},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lin17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinHTCW17,
author = {Bing{-}Yang Lin and
Hsin{-}Wei Hung and
Shu{-}Mei Tseng and
Chi Chen and
Cheng{-}Wen Wu},
title = {Highly reliable and low-cost symbiotic {IOT} devices and systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242076},
doi = {10.1109/TEST.2017.8242076},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LinHTCW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuFB17,
author = {Zeye Liu and
Phillip Fynan and
Ronald D. Blanton},
title = {Front-end layout reflection for test chip design},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242041},
doi = {10.1109/TEST.2017.8242041},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuFB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LukasYC17,
author = {Christopher J. Lukas and
Farah B. Yahya and
Benton H. Calhoun},
title = {Modeling trans-threshold correlations for reducing functional test
time in ultra-low power systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242039},
doi = {10.1109/TEST.2017.8242039},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LukasYC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mathew17,
author = {Sanu Mathew},
title = {Security keynote: Ultra-low-energy security circuit primitives for
IoT platforms},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242026},
doi = {10.1109/TEST.2017.8242026},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mathew17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MhiraHBCMNJPB17,
author = {Souhir Mhira and
Vincent Huard and
Ahmed Benhassain and
Florian Cacho and
David Meyer and
Sylvie Naudet and
Abhishek Jain and
C. R. Parthasarathy and
Alain Bravaix},
title = {Cognitive approach to support dynamic aging compensation},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--7},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242042},
doi = {10.1109/TEST.2017.8242042},
timestamp = {Fri, 06 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MhiraHBCMNJPB17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MilewskiMRSTZ17,
author = {Sylwester Milewski and
Nilanjan Mukherjee and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer and
Justyna Zawada},
title = {Full-scan {LBIST} with capture-per-cycle hybrid test points},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242036},
doi = {10.1109/TEST.2017.8242036},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MilewskiMRSTZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NahiyanSVCFT17,
author = {Adib Nahiyan and
Mehdi Sadi and
Rahul Vittal and
Gustavo K. Contreras and
Domenic Forte and
Mark M. Tehranipoor},
title = {Hardware trojan detection through information flow security verification},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242062},
doi = {10.1109/TEST.2017.8242062},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NahiyanSVCFT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OdintsovJD17,
author = {Sergei Odintsov and
Artur Jutman and
Sergei Devadze},
title = {Marginal {PCB} assembly defect detection on {DDR3/4} memory bus},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242070},
doi = {10.1109/TEST.2017.8242070},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/OdintsovJD17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PintoH17,
author = {Sonal Pinto and
Michael S. Hsiao},
title = {{RTL} functional test generation using factored concolic execution},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242038},
doi = {10.1109/TEST.2017.8242038},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PintoH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz17,
author = {Irith Pomeranz},
title = {Selecting target bridging faults for uniform circuit coverage},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--7},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242061},
doi = {10.1109/TEST.2017.8242061},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz17a,
author = {Irith Pomeranz},
title = {{POSTT:} Path-oriented static test compaction for transition faults
in scan circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242073},
doi = {10.1109/TEST.2017.8242073},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz17a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PradeepNMMN17,
author = {W. Pradeep and
P. Narayanan and
R. Mittal and
N. Maheshwari and
N. Naresh},
title = {Frequency scaled segmented {(FSS)} scan architecture for optimized
scan-shift power and faster test application time},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242052},
doi = {10.1109/TEST.2017.8242052},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PradeepNMMN17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PrasanthFR17,
author = {V. Prasanth and
David Foley and
Srivaths Ravi},
title = {Demystifying automotive safety and security for semiconductor developer},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242074},
doi = {10.1109/TEST.2017.8242074},
timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PrasanthFR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PrasanthPA17,
author = {V. Prasanth and
Rubin A. Parekhji and
Bharadwaj Amrutur},
title = {Safety analysis for integrated circuits in the context of hybrid systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242045},
doi = {10.1109/TEST.2017.8242045},
timestamp = {Fri, 30 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PrasanthPA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobertazziSWTT17,
author = {Raphael Robertazzi and
Micheal Scheurman and
Matt Wordeman and
Shurong Tian and
Christy Tyberg},
title = {Analytical test of 3D integrated circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242067},
doi = {10.1109/TEST.2017.8242067},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RobertazziSWTT17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RoyG17,
author = {Surajit Kumar Roy and
Chandan Giri},
title = {Design-for-test and test time optimization for 3D SOCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242082},
doi = {10.1109/TEST.2017.8242082},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/RoyG17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SarsonR17,
author = {Peter Sarson and
Jeff Rearick},
title = {Use models for extending {IEEE} 1687 to analog test},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--8},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242068},
doi = {10.1109/TEST.2017.8242068},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SarsonR17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShanBPCW17,
author = {Chuanhe Jay Shan and
Pietro Babighian and
Yan Pan and
John M. Carulli and
Li{-}C. Wang},
title = {Systematic defect detection methodology for volume diagnosis: {A}
data mining perspective},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242050},
doi = {10.1109/TEST.2017.8242050},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShanBPCW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinhaPSSS17,
author = {Arani Sinha and
Sujay Pandey and
Ayush Singhal and
Alodeep Sanyal and
Alan Schmaltz},
title = {DFM-aware fault model and {ATPG} for intra-cell and inter-cell defects},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242059},
doi = {10.1109/TEST.2017.8242059},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinhaPSSS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SrivastavaSSS17,
author = {Ankush Srivastava and
Adit D. Singh and
Virendra Singh and
Kewal K. Saluja},
title = {Exploiting path delay test generation to develop better {TDF} tests
for small delay defects},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242072},
doi = {10.1109/TEST.2017.8242072},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SrivastavaSSS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SumikawaNW17,
author = {Nik Sumikawa and
Matt Nero and
Li{-}C. Wang},
title = {Kernel based clustering for quality improvement and excursion detection},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242071},
doi = {10.1109/TEST.2017.8242071},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SumikawaNW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterS17,
author = {Stephen Sunter and
Peter Sarson},
title = {{A/MS} benchmark circuits for comparing fault simulation, DFT, and
test generation methods},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--7},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242079},
doi = {10.1109/TEST.2017.8242079},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterS17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TshagharyanHZ17,
author = {Grigor Tshagharyan and
Gurgen Harutyunyan and
Yervant Zorian},
title = {An effective functional safety solution for automotive systems-on-chip},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242075},
doi = {10.1109/TEST.2017.8242075},
timestamp = {Tue, 31 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TshagharyanHZ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VenkataramanPBA17,
author = {Srikanth Venkataraman and
Irith Pomeranz and
Shraddha Bodhe and
M. Enamul Amyeen},
title = {Test reordering for improved scan chain diagnosis using an enhanced
defect diagnosis procedure},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--9},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242049},
doi = {10.1109/TEST.2017.8242049},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VenkataramanPBA17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangSSNSW17,
author = {Li{-}C. Wang and
Sebastian Siatkowski and
Chuanhe Jay Shan and
Matthew Nero and
Nikolas Sumikawa and
LeRoy Winemberg},
title = {Some considerations on choosing an outlier method for automotive product
lines},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242047},
doi = {10.1109/TEST.2017.8242047},
timestamp = {Fri, 05 Jan 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangSSNSW17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangSSSH17,
author = {Jiafan Wang and
Congyin Shi and
Adriana C. Sanabria{-}Borbon and
Edgar S{\'{a}}nchez{-}Sinencio and
Jiang Hu},
title = {Thwarting analog {IC} piracy via combinational locking},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242064},
doi = {10.1109/TEST.2017.8242064},
timestamp = {Wed, 28 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangSSSH17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XanthopoulosSRM17,
author = {Constantinos Xanthopoulos and
Peter Sarson and
Heinz Reiter and
Yiorgos Makris},
title = {Automated die inking: {A} pattern recognition-based approach},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--6},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242040},
doi = {10.1109/TEST.2017.8242040},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/XanthopoulosSRM17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuZTBC17,
author = {Li Xu and
Yuming Zhuang and
Rajavelu Thinakaran and
Kenneth M. Butler and
Degang Chen},
title = {Accurate {ADC} testing with significantly relaxed instrumentation
including large cumulative jitter},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242057},
doi = {10.1109/TEST.2017.8242057},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/XuZTBC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangCLJ17,
author = {Ying Zhang and
Krishnendu Chakrabarty and
Huawei Li and
Jianhui Jiang},
title = {Software-based online self-testing of network-on-chip using bounded
model checking},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242037},
doi = {10.1109/TEST.2017.8242037},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhangCLJ17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhuangC17,
author = {Yuming Zhuang and
Degang Chen},
title = {Accurate and robust spectral testing with relaxed instrumentation
requirements},
booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
pages = {1--10},
publisher = {{IEEE}},
year = {2017},
url = {https://doi.org/10.1109/TEST.2017.8242081},
doi = {10.1109/TEST.2017.8242081},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhuangC17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2017,
title = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX,
USA, October 31 - Nov. 2, 2017},
publisher = {{IEEE}},
year = {2017},
url = {https://ieeexplore.ieee.org/xpl/conhome/8227522/proceeding},
isbn = {978-1-5386-3413-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2017.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhmadiXNOPM16,
author = {Ali Ahmadi and
Constantinos Xanthopoulos and
Amit Nahar and
Bob Orr and
Michael Pas and
Yiorgos Makris},
title = {Harnessing process variations for optimizing wafer-level probe-test
flow},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805835},
doi = {10.1109/TEST.2016.7805835},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AhmadiXNOPM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AlamTF16,
author = {Md. Mahbub Alam and
Mark M. Tehranipoor and
Domenic Forte},
title = {Recycled {FPGA} detection using exhaustive {LUT} path delay characterization},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805854},
doi = {10.1109/TEST.2016.7805854},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AlamTF16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AmyeenKCNVJGS16,
author = {M. Enamul Amyeen and
Dongok Kim and
Maheshwar Chandrasekar and
Mohammad Noman and
Srikanth Venkataraman and
Anurag Jain and
Neha Goel and
Ramesh Sharma},
title = {A novel diagnostic test generation methodology and its application
in production failure isolation},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805821},
doi = {10.1109/TEST.2016.7805821},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AmyeenKCNVJGS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ArmstrongM16,
author = {Dave Armstrong and
Gary Maier},
title = {Known-good-die test methods for large, thin, high-power digital devices},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805851},
doi = {10.1109/TEST.2016.7805851},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ArmstrongM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AroraABS16,
author = {Shalini Arora and
Aman Aflaki and
Sounil Biswas and
Masashi Shimanouchi},
title = {{SERDES} external loopback test using production parametric-test hardware},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805841},
doi = {10.1109/TEST.2016.7805841},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AroraABS16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BanerjeeCA16,
author = {Suvadeep Banerjee and
Abhijit Chatterjee and
Jacob A. Abraham},
title = {Efficient cross-layer concurrent error detection in nonlinear control
systems using mapped predictive check states},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805861},
doi = {10.1109/TEST.2016.7805861},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BanerjeeCA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ButlerND16,
author = {Kenneth M. Butler and
Amit Nahar and
W. Robert Daasch},
title = {What we know after twelve years developing and deploying test data
analytics solutions},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805844},
doi = {10.1109/TEST.2016.7805844},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ButlerND16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaoLWLL16,
author = {Huina Chao and
Huawei Li and
Tiancheng Wang and
Xiaowei Li and
Bo Liu},
title = {An accurate algorithm for computing mutation coverage in model checking},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805864},
doi = {10.1109/TEST.2016.7805864},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChaoLWLL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CoyetteEDVG16,
author = {Anthony Coyette and
Baris Esen and
Wim Dobbelaere and
Ronny Vanhooren and
Georges G. E. Gielen},
title = {Automatic test signal generation for mixed-signal integrated circuits
using circuit partitioning and interval analysis},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805867},
doi = {10.1109/TEST.2016.7805867},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CoyetteEDVG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevanathanK16,
author = {V. R. Devanathan and
Sumant Kale},
title = {A reconfigurable built-in memory self-repair architecture for heterogeneous
cores with embedded {BIST} datapath},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805870},
doi = {10.1109/TEST.2016.7805870},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DevanathanK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DobbelaereVMMCE16,
author = {Wim Dobbelaere and
Ronny Vanhooren and
Willy De Man and
Koen Matthijs and
Anthony Coyette and
Baris Esen and
Georges G. E. Gielen},
title = {Analog fault coverage improvement using final-test dynamic part average
testing},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805829},
doi = {10.1109/TEST.2016.7805829},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DobbelaereVMMCE16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EsenCGDV16,
author = {Baris Esen and
Anthony Coyette and
Georges G. E. Gielen and
Wim Dobbelaere and
Ronny Vanhooren},
title = {Effective {DC} fault models and testing approach for open defects
in analog circuits},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805830},
doi = {10.1109/TEST.2016.7805830},
timestamp = {Fri, 02 Nov 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EsenCGDV16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FanVSRJDK16,
author = {Y. Fan and
A. Verma and
Y. Su and
L. Rose and
J. Janney and
V. Do and
S. Kumar},
title = {{RF} test accuracy and capacity enhancement on {ATE} for silicon {TV}
tuners},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805842},
doi = {10.1109/TEST.2016.7805842},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FanVSRJDK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FynanLNMSB16,
author = {Phillip Fynan and
Zeye Liu and
Benjamin Niewenhuis and
Soumya Mittal and
Marcin Strajwas and
R. D. (Shawn) Blanton},
title = {Logic characterization vehicle design reflection via layout rewiring},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805849},
doi = {10.1109/TEST.2016.7805849},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FynanLNMSB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hansen16,
author = {Ken Hansen},
title = {Keynote address Thursday: Addressing semiconductor industry needs:
Defining the future through creative, exciting research},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {11},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805818},
doi = {10.1109/TEST.2016.7805818},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Hansen16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HouCLLKC16,
author = {Chih{-}Sheng Hou and
Yong{-}Xiao Chen and
Jin{-}Fu Li and
Chih{-}Yen Lo and
Ding{-}Ming Kwai and
Yung{-}Fa Chou},
title = {A built-in self-repair scheme for DRAMs with spare rows, columns,
and bits},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805832},
doi = {10.1109/TEST.2016.7805832},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HouCLLKC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsuSSLCSC16,
author = {Chun{-}Kai Hsu and
Peter Sarson and
Gregor Schatzberger and
Friedrich Peter Leisenberger and
John M. Carulli Jr. and
Siddhartha Siddhartha and
Kwang{-}Ting Cheng},
title = {Variation and failure characterization through pattern classification
of test data from multiple test stages},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805845},
doi = {10.1109/TEST.2016.7805845},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsuSSLCSC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JagannadhaYSCSB16,
author = {Pavan Kumar Datla Jagannadha and
Mahmut Yilmaz and
Milind Sonawane and
Sailendra Chadalavada and
Shantanu Sarangi and
Bonita Bhaskaran and
Ayub Abdollahian},
title = {Advanced test methodology for complex SoCs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805857},
doi = {10.1109/TEST.2016.7805857},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/JagannadhaYSCSB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JinZCG16,
author = {Shi Jin and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Accurate anomaly detection using correlation-based time-series analysis
in a core router system},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805836},
doi = {10.1109/TEST.2016.7805836},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JinZCG16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JohnsonNJCMD16,
author = {Michael Johnson and
Brian Noble and
Mark Johnson and
Jim Crafts and
Cynthia Manya and
John Deforge},
title = {Active reliability monitor: Defect level extrinsic reliability monitoring
on 22nm {POWER8} and zSeries processors},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805871},
doi = {10.1109/TEST.2016.7805871},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/JohnsonNJCMD16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KadamRCA16,
author = {Gurunath Kadam and
Markus Rudack and
Krishnendu Chakrabarty and
Juergen Alt},
title = {Supply-voltage optimization to account for process variations in high-volume
manufacturing testing},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805846},
doi = {10.1109/TEST.2016.7805846},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KadamRCA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KelirisSCKMK16,
author = {Anastasis Keliris and
Hossein Salehghaffari and
Brian R. Cairl and
Prashanth Krishnamurthy and
Michail Maniatakos and
Farshad Khorrami},
title = {Machine learning-based defense against process-aware attacks on Industrial
Control Systems},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805855},
doi = {10.1109/TEST.2016.7805855},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KelirisSCKMK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduBK16,
author = {Subhadip Kundu and
Parthajit Bhattacharya and
Rohit Kapur},
title = {Handling wrong mapping: {A} new direction towards better diagnosis
with low pin convolution compressors},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805822},
doi = {10.1109/TEST.2016.7805822},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KunduBK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeTK16,
author = {Kuen{-}Jong Lee and
Pin{-}Hao Tang and
Michael A. Kochte},
title = {An on-chip self-test architecture with test patterns recorded in scan
chains},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805865},
doi = {10.1109/TEST.2016.7805865},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LeeTK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiJLXC16,
author = {Tianjian Li and
Li Jiang and
Xiaoyao Liang and
Qiang Xu and
Krishnendu Chakrabarty},
title = {Defect tolerance for CNFET-based SRAMs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805833},
doi = {10.1109/TEST.2016.7805833},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiJLXC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiLYCHL16,
author = {Zipeng Li and
Kelvin Yi{-}Tse Lai and
Po{-}Hsien Yu and
Krishnendu Chakrabarty and
Tsung{-}Yi Ho and
Chen{-}Yi Lee},
title = {Built-in self-test for micro-electrode-dot-array digital microfluidic
biochips},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805847},
doi = {10.1109/TEST.2016.7805847},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiLYCHL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LienL16,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee},
title = {Output bit selection methodology for test response compaction},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805873},
doi = {10.1109/TEST.2016.7805873},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LienL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LimX0BA16,
author = {Carlston Lim and
Yang Xue and
Xin Li and
Ronald D. Blanton and
M. Enamul Amyeen},
title = {Diagnostic resolution improvement through learning-guided physical
failure analysis},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805824},
doi = {10.1109/TEST.2016.7805824},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LimX0BA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuMMRRT16,
author = {Yingdi Liu and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Sudhakar M. Reddy and
Janusz Rajski and
Jerzy Tyszer},
title = {Minimal area test points for deterministic patterns},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805825},
doi = {10.1109/TEST.2016.7805825},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuMMRRT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MittalLNB16,
author = {Soumya Mittal and
Zeye Liu and
Ben Niewenhuis and
R. D. (Shawn) Blanton},
title = {Test chip design for optimal cell-aware diagnosability},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805850},
doi = {10.1109/TEST.2016.7805850},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MittalLNB16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoghaddamMRTZ16,
author = {Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Test point insertion in hybrid test compression/LBIST architectures},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805826},
doi = {10.1109/TEST.2016.7805826},
timestamp = {Fri, 02 Mar 2018 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoghaddamMRTZ16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuldreyDC16,
author = {Barry John Muldrey and
Sabyasachi Deyati and
Abhijit Chatterjee},
title = {{DE-LOC:} Design validation and debugging under limited observation
and control, pre- and post-silicon for mixed-signal systems},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805868},
doi = {10.1109/TEST.2016.7805868},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MuldreyDC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MurakamiKMKMK16,
author = {Masahiro Murakami and
Haruo Kobayashi and
Shaiful Nizam Bin Mohyar and
Osamu Kobayashi and
Takahiro Miki and
Junya Kojima},
title = {{I-Q} signal generation techniques for communication {IC} testing
and {ATE} systems},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805858},
doi = {10.1109/TEST.2016.7805858},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MurakamiKMKMK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NakamuraA16,
author = {Takayuki Nakamura and
Koji Asami},
title = {Novel crosstalk evaluation method for high-density signal traces using
clock waveform conversion technique},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805859},
doi = {10.1109/TEST.2016.7805859},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NakamuraA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NakuraTIIKIA16,
author = {Toru Nakura and
Naoki Terao and
Masahiro Ishida and
Rimon Ikeno and
Takashi Kusaka and
Tetsuya Iizuka and
Kunihiro Asada},
title = {Power supply impedance emulation to eliminate overkills and underkills
due to the impedance difference between {ATE} and customer board},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805860},
doi = {10.1109/TEST.2016.7805860},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NakuraTIIKIA16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PanDSCFBC16,
author = {Yan Pan and
Rao Desineni and
Kannan Sekar and
Atul Chittora and
Sherwin Fernandes and
Neerja Bawaskar and
John M. Carulli},
title = {Pylon: Towards an integrated customizable volume diagnosis infrastructure},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805872},
doi = {10.1109/TEST.2016.7805872},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/PanDSCFBC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Papavramidou16,
author = {Panagiota Papavramidou},
title = {Memory repair for high fault rates},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805874},
doi = {10.1109/TEST.2016.7805874},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Papavramidou16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Portolan16,
author = {Michele Portolan},
title = {Accessing 1687 systems using arbitrary protocols},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805839},
doi = {10.1109/TEST.2016.7805839},
timestamp = {Sat, 19 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Portolan16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rhines16,
author = {Walden C. Rhines},
title = {Plenary keynote address Tuesday: The business of test: Test and semiconductor
economics},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805816},
doi = {10.1109/TEST.2016.7805816},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Rhines16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Roberts16,
author = {Gordon W. Roberts},
title = {Mixed-signal {ATE} technology and its impact on today's electronic
system},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805852},
doi = {10.1109/TEST.2016.7805852},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Roberts16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rutenbar16,
author = {Rob A. Rutenbar},
title = {Keynote address Wednesday: Hardware inference accelerators for machine
learning},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805817},
doi = {10.1109/TEST.2016.7805817},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Rutenbar16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SadiCTCWT16,
author = {Mehdi Sadi and
Gustavo K. Contreras and
Dat Tran and
Jifeng Chen and
LeRoy Winemberg and
Mark M. Tehranipoor},
title = {{BIST-RM:} BIST-assisted reliability management of SoCs using on-chip
clock sweeping and machine learning},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805862},
doi = {10.1109/TEST.2016.7805862},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SadiCTCWT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaleemT16,
author = {Kamran Saleem and
Nur A. Touba},
title = {Using symbolic canceling to improve diagnosis from compacted response},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805823},
doi = {10.1109/TEST.2016.7805823},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SaleemT16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sarson16,
author = {Peter Sarson},
title = {Test time efficient group delay filter characterization technique
using a discrete chirped excitation signal},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--6},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805853},
doi = {10.1109/TEST.2016.7805853},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Sarson16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SequeiraNGC16,
author = {Jyotsna Sequeira and
Suriyaprakash Natarajan and
Prashant Goteti and
Nitin Chaudhary},
title = {Fault simulation for analog test coverage},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--7},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805831},
doi = {10.1109/TEST.2016.7805831},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SequeiraNGC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShawHBN16,
author = {David Shaw and
Dirk Hoops and
Kenneth M. Butler and
Amit Nahar},
title = {Statistical outlier screening as a test solution health monitor},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805837},
doi = {10.1109/TEST.2016.7805837},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShawHBN16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterVM16,
author = {Stephen Sunter and
Alessandro Valerio and
Riccardo Miglierina},
title = {Automated measurement of defect tolerance in mixed-signal ICs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805869},
doi = {10.1109/TEST.2016.7805869},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SunterVM16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TangKIC16,
author = {Jack Tang and
Ramesh Karri and
Mohamed Ibrahim and
Krishnendu Chakrabarty},
title = {Securing digital microfluidic biochips by randomizing checkpoints},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805856},
doi = {10.1109/TEST.2016.7805856},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TangKIC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsertovJDRLZCMK16,
author = {Anton Tsertov and
Artur Jutman and
Sergei Devadze and
Matteo Sonza Reorda and
Erik Larsson and
Farrokh Ghani Zadegan and
Riccardo Cantoro and
Mehrdad Montazeri and
Rene Krenz{-}Baath},
title = {A suite of {IEEE} 1687 benchmark networks},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805840},
doi = {10.1109/TEST.2016.7805840},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsertovJDRLZCMK16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ValleroSPCCTKGR16,
author = {Alessandro Vallero and
Alessandro Savino and
Gianfranco Politano and
Stefano Di Carlo and
Athanasios Chatzidimitriou and
Sotiris Tselonis and
Manolis Kaliorakis and
Dimitris Gizopoulos and
Marc Riera and
Ramon Canal and
Antonio Gonz{\'{a}}lez and
Maha Kooli and
Alberto Bosio and
Giorgio Di Natale},
title = {Cross-layer system reliability assessment framework for hardware faults},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805863},
doi = {10.1109/TEST.2016.7805863},
timestamp = {Sun, 02 Jun 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ValleroSPCCTKGR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangC16,
author = {Ran Wang and
Krishnendu Chakrabarty},
title = {Testing of interposer-based 2.5D integrated circuits},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805875},
doi = {10.1109/TEST.2016.7805875},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuL16,
author = {Cheng{-}Hung Wu and
Kuen{-}Jong Lee},
title = {Transformation of multiple fault models to a unified model for {ATPG}
efficiency enhancement},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805866},
doi = {10.1109/TEST.2016.7805866},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WuL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XiangCF16,
author = {Dong Xiang and
Krishnendu Chakrabarty and
Hideo Fujiwara},
title = {A unified test and fault-tolerant multicast solution for network-on-chip
designs},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805827},
doi = {10.1109/TEST.2016.7805827},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XiangCF16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YoonCR16,
author = {Insik Yoon and
Ashwin Chintaluri and
Arijit Raychowdhury},
title = {{EMACS:} Efficient {MBIST} architecture for test and characterization
of {STT-MRAM} arrays},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805834},
doi = {10.1109/TEST.2016.7805834},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YoonCR16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZadeganKL16,
author = {Farrokh Ghani Zadegan and
Rene Krenz{-}Baath and
Erik Larsson},
title = {Upper-bound computation for optimal retargeting in {IEEE1687} networks},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805838},
doi = {10.1109/TEST.2016.7805838},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZadeganKL16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangHSGASWD16,
author = {Fanchen Zhang and
Daphne Hwong and
Yi Sun and
Allison Garcia and
Soha Alhelaly and
Geoff Shofner and
LeRoy Winemberg and
Jennifer Dworak},
title = {Putting wasted clock cycles to use: Enhancing fortuitous cell-aware
fault detection with scan shift capture},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--10},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805828},
doi = {10.1109/TEST.2016.7805828},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhangHSGASWD16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhengHLWTC16,
author = {Chih{-}Chieh Zheng and
Shi{-}Yu Huang and
Shyue{-}Kung Lu and
Ting{-}Chi Wang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
title = {Online slack-time binning for IO-registered die-to-die interconnects},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--8},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805848},
doi = {10.1109/TEST.2016.7805848},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhengHLWTC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhuangUJSMC16,
author = {Yuming Zhuang and
Akhilesh Kesavan Unnithan and
Arun Joseph and
Siva Sudani and
Benjamin Magstadt and
Degang Chen},
title = {Low cost ultra-pure sine wave generation with self calibration},
booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
pages = {1--9},
publisher = {{IEEE}},
year = {2016},
url = {https://doi.org/10.1109/TEST.2016.7805843},
doi = {10.1109/TEST.2016.7805843},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ZhuangUJSMC16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2016,
title = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
TX, USA, November 15-17, 2016},
publisher = {{IEEE}},
year = {2016},
url = {https://ieeexplore.ieee.org/xpl/conhome/7794484/proceeding},
isbn = {978-1-4673-8773-6},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2016.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AceroFHMMNPRTZ15,
author = {Cesar Acero and
Derek Feltham and
Friedrich Hapke and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Vidya Neerkundar and
Marek Patyra and
Janusz Rajski and
Jerzy Tyszer and
Justyna Zawada},
title = {Embedded deterministic test points for compact cell-aware tests},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342383},
doi = {10.1109/TEST.2015.7342383},
timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
biburl = {https://dblp.org/rec/conf/itc/AceroFHMMNPRTZ15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Arabi15,
author = {Karim Arabi},
title = {Brain-inspired computing},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {7},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342374},
doi = {10.1109/TEST.2015.7342374},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Arabi15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BackerHK15,
author = {Jerry Backer and
David H{\'{e}}ly and
Ramesh Karri},
title = {Secure design-for-debug for Systems-on-Chip},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342418},
doi = {10.1109/TEST.2015.7342418},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BackerHK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BasakZB15,
author = {Abhishek Basak and
Fengchao Zhang and
Swarup Bhunia},
title = {PiRA: {IC} authentication utilizing intrinsic variations in pin resistance},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342388},
doi = {10.1109/TEST.2015.7342388},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BasakZB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonNL15,
author = {R. D. (Shawn) Blanton and
Benjamin Niewenhuis and
Zeye (Dexter) Liu},
title = {Design reflection for optimal test-chip implementation},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342379},
doi = {10.1109/TEST.2015.7342379},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BlantonNL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bottoms15,
author = {William R. Bottoms},
title = {Can we ensure reliability in the era of heterogeneous integration?},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342376},
doi = {10.1109/TEST.2015.7342376},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Bottoms15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DeutschC15,
author = {Sergej Deutsch and
Krishnendu Chakrabarty},
title = {Contactless pre-bond {TSV} fault diagnosis using duty-cycle detectors
and ring oscillators},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342389},
doi = {10.1109/TEST.2015.7342389},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DeutschC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DeutschC15a,
author = {Sergej Deutsch and
Krishnendu Chakrabarty},
title = {Test and debug solutions for 3D-stacked integrated circuits},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342421},
doi = {10.1109/TEST.2015.7342421},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DeutschC15a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DinhYHC15,
author = {Trung Anh Dinh and
Shigeru Yamashita and
Tsung{-}Yi Ho and
Krishnendu Chakrabarty},
title = {A general testing method for digital microfluidic biochips under physical
constraints},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342403},
doi = {10.1109/TEST.2015.7342403},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DinhYHC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EbrahimiT15,
author = {Mojtaba Ebrahimi and
Mehdi Baradaran Tahoori},
title = {Stepped parity: {A} low-cost multiple bit upset detection technique},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342410},
doi = {10.1109/TEST.2015.7342410},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/EbrahimiT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FernKC15,
author = {Nicole Fern and
Shrikant Kulkarni and
Kwang{-}Ting (Tim) Cheng},
title = {Hardware Trojans hidden in {RTL} don't cares - Automated insertion
and prevention methodologies},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342387},
doi = {10.1109/TEST.2015.7342387},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FernKC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IizukaMHO15,
author = {Shoichi Iizuka and
Yutaka Masuda and
Masanori Hashimoto and
Takao Onoye},
title = {Stochastic timing error rate estimation under process and temporal
variations},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342404},
doi = {10.1109/TEST.2015.7342404},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IizukaMHO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IshidaI15,
author = {Masahiro Ishida and
Kiyotaka Ichiyama},
title = {An {ATE} system for testing 2.4-GHz {RF} digital communication devices
with {QAM} signal interfaces},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342394},
doi = {10.1109/TEST.2015.7342394},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IshidaI15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JeongKO15,
author = {Jae Woong Jeong and
Jennifer Kitchen and
Sule Ozev},
title = {A self-compensating built-in self-test solution for {RF} phased array
mismatch},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342414},
doi = {10.1109/TEST.2015.7342414},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/JeongKO15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JiangPJLLX15,
author = {Li Jiang and
Pu Pang and
Naifeng Jing and
Sung Kyu Lim and
Xiaoyao Liang and
Qiang Xu},
title = {On diagnosable and tunable 3D clock network design for lifetime reliability
enhancement},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342405},
doi = {10.1109/TEST.2015.7342405},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JiangPJLLX15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JiangX15,
author = {Li Jiang and
Qiang Xu},
title = {Yield and reliability enhancement for 3D ICs: Dissertation summary:
{IEEE} {TTTC} {E.J.} McCluskey doctoral thesis award competition finalist},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--11},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342423},
doi = {10.1109/TEST.2015.7342423},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JiangX15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kahng15,
author = {Andrew B. Kahng},
title = {Modeling the future of semiconductors (and test!)},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342375},
doi = {10.1109/TEST.2015.7342375},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Kahng15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KarunagaranSF15,
author = {Sriram Karunagaran and
Karuna P. Sahoo and
Masahiro Fujita},
title = {Hardware in loop testing of an insulin pump},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342416},
doi = {10.1109/TEST.2015.7342416},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/KarunagaranSF15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Krenz-BaathZL15,
author = {Rene Krenz{-}Baath and
Farrokh Ghani Zadegan and
Erik Larsson},
title = {Access time minimization in {IEEE} 1687 networks},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342408},
doi = {10.1109/TEST.2015.7342408},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Krenz-BaathZL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiGLC15,
author = {Zipeng Li and
Sandeep Kumar Goel and
Frank Lee and
Krishnendu Chakrabarty},
title = {Efficient observation-point insertion for diagnosability enhancement
in digital circuits},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342380},
doi = {10.1109/TEST.2015.7342380},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiGLC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinHC15,
author = {Fan Lin and
Chun{-}Kai Hsu and
Kwang{-}Ting Cheng},
title = {AdaTest: An efficient statistical test framework for test escape screening},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342391},
doi = {10.1109/TEST.2015.7342391},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinHC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinR15,
author = {Xijiang Lin and
Sudhakar M. Reddy},
title = {On generating high quality tests based on cell functions},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342382},
doi = {10.1109/TEST.2015.7342382},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LinR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinSBM15,
author = {David Lin and
Eshan Singh and
Clark W. Barrett and
Subhasish Mitra},
title = {A structured approach to post-silicon validation and debug using symbolic
quick error detection},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342397},
doi = {10.1109/TEST.2015.7342397},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LinSBM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuVHM15,
author = {Yu Liu and
Georgios Volanis and
Ke Huang and
Yiorgos Makris},
title = {Concurrent hardware Trojan detection in wireless cryptographic ICs},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342386},
doi = {10.1109/TEST.2015.7342386},
timestamp = {Wed, 27 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiuVHM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LongTLH15,
author = {An{-}Jim Long and
David Tsai and
Kent Lien and
Steve Hsu},
title = {Tolerance analysis of fixture fabrication, from drilling holes to
pointing accuracy},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--4},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342401},
doi = {10.1109/TEST.2015.7342401},
timestamp = {Thu, 23 Aug 2018 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LongTLH15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LuSHKHM15,
author = {Yichuan Lu and
Kiruba S. Subramani and
He Huang and
Nathan Kupp and
Ke Huang and
Yiorgos Makris},
title = {A comparative study of one-shot statistical calibration methods for
analog / {RF} ICs},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342415},
doi = {10.1109/TEST.2015.7342415},
timestamp = {Wed, 27 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LuSHKHM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MarinissenWWFKS15,
author = {Erik Jan Marinissen and
Bart De Wachter and
Teng Wang and
Jens Fiedler and
Jorg Kiesewetter and
Karsten Stoll},
title = {Automated testing of bare die-to-die stacks},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342412},
doi = {10.1109/TEST.2015.7342412},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MarinissenWWFKS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McGintyHNC15,
author = {Stephen McGinty and
Daniel Hadad and
Chris Nappi and
Brian Caquelin},
title = {Developing a modern platform for test engineering - Introducing the
origen semiconductor developer's kit},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342393},
doi = {10.1109/TEST.2015.7342393},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/McGintyHNC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MingJYWM15,
author = {Xue Ming and
Koelz Johann and
Lee Chow York and
Lee Kwan Wee and
Shi Zhi Min},
title = {Electrical package defect testing for volume production},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342400},
doi = {10.1109/TEST.2015.7342400},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MingJYWM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MrugalskiRRST15,
author = {Grzegorz Mrugalski and
Janusz Rajski and
Lukasz Rybak and
Jedrzej Solecki and
Jerzy Tyszer},
title = {A deterministic {BIST} scheme based on EDT-compressed test patterns},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342398},
doi = {10.1109/TEST.2015.7342398},
timestamp = {Wed, 22 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/MrugalskiRRST15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OborilT15,
author = {Fabian Oboril and
Mehdi Baradaran Tahoori},
title = {Cross-layer approaches for an aging-aware design of nanoscale microprocessors:
Dissertation summary: {IEEE} {TTTC} {E.J.} McCluskey doctoral thesis
award competition finalist},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342422},
doi = {10.1109/TEST.2015.7342422},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/OborilT15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OckunzziOG15,
author = {Kelly A. Ockunzzi and
Michael R. Ouellette and
Kevin W. Gorman},
title = {Optimizing delay tests at the memory boundary},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342411},
doi = {10.1109/TEST.2015.7342411},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/OckunzziOG15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Okawara15,
author = {Hideo Okawara},
title = {eRNA: Refining of reconstructed digital waveform},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342392},
doi = {10.1109/TEST.2015.7342392},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Okawara15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PayakapanKPYCKD15,
author = {Tassanee Payakapan and
Senwen Kan and
Ken Pham and
Kathy Yang and
Jean{-}Francois Cote and
Martin Keim and
Jennifer Dworak},
title = {A case study: Leverage {IEEE} 1687 based method to automate modeling,
verification, and test access for embedded instruments in a server
processor},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342407},
doi = {10.1109/TEST.2015.7342407},
timestamp = {Mon, 25 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PayakapanKPYCKD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/QuerbachYVBKPC15,
author = {Bruce Querbach and
Tan Peter Yanyang and
Lovelace Van and
David Blankenbeckler and
Rahul Khanna and
Sudeep Puligundla and
Patrick Chiang},
title = {Platform {IO} and system memory test using {L3} cache based test {(CBT)}
and parallel execution of {CPGC} Intel {BIST} engine},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342399},
doi = {10.1109/TEST.2015.7342399},
timestamp = {Fri, 03 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/QuerbachYVBKPC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RashidzadehJSM15,
author = {Rashid Rashidzadeh and
Esrafil Jedari and
Tareq Muhammad Supon and
Vladimir Mashkovtsev},
title = {A DLL-based test solution for through silicon via {(TSV)} in 3D-stacked
ICs},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342390},
doi = {10.1109/TEST.2015.7342390},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/RashidzadehJSM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SiatkowskiCWSWD15,
author = {Sebastian Siatkowski and
Chia{-}Ling Chang and
Li{-}C. Wang and
Nikolas Sumikawa and
LeRoy Winemberg and
W. Robert Daasch},
title = {Generalization of an outlier model into a "global" perspective},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342396},
doi = {10.1109/TEST.2015.7342396},
timestamp = {Thu, 15 Jun 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SiatkowskiCWSWD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StratigopoulosB15,
author = {Haralampos{-}G. D. Stratigopoulos and
Manuel J. Barrag{\'{a}}n and
Salvador Mir and
Herv{\'{e}} Le Gall and
Neha Bhargava and
Ankur Bal},
title = {Evaluation of low-cost mixed-signal test techniques for circuits with
long simulation times},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--7},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342385},
doi = {10.1109/TEST.2015.7342385},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/StratigopoulosB15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterCR15,
author = {Stephen K. Sunter and
Jean{-}Francois Cote and
Jeff Rearick},
title = {Streaming fast access to ADCs and DACs for mixed-signal {ATPG}},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--8},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342395},
doi = {10.1109/TEST.2015.7342395},
timestamp = {Tue, 26 Jan 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterCR15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TanwirPHL15,
author = {Sarmad Tanwir and
Sarvesh Prabhu and
Michael S. Hsiao and
Loganathan Lingappan},
title = {Information-theoretic and statistical methods of failure log selection
for improved diagnosis},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342381},
doi = {10.1109/TEST.2015.7342381},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TanwirPHL15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TiernanSPWD15,
author = {Kevin Tiernan and
Snehamay Sinha and
Lily Pang and
Robert Williams and
Ken Delling},
title = {How many probes is enough? {A} low cost method for probe card depopulation
with low risk},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--5},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342413},
doi = {10.1109/TEST.2015.7342413},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TiernanSPWD15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiHTC15,
author = {Meng{-}Ting Tsai and
Shi{-}Yu Huang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
title = {Monitoring the delay of long interconnects via distributed {TDC}},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342406},
doi = {10.1109/TEST.2015.7342406},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TsaiHTC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsoutsosM15,
author = {Nektarios Georgios Tsoutsos and
Michail Maniatakos},
title = {Extending residue-based fault tolerance to encrypted computation},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342419},
doi = {10.1109/TEST.2015.7342419},
timestamp = {Wed, 25 Sep 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/TsoutsosM15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VartziotisKGC15,
author = {Fotios Vartziotis and
Xrysovalantis Kavousianos and
Panagiotis Georgiou and
Krishnendu Chakrabarty},
title = {Test-access-mechanism optimization for multi-Vdd SoCs},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342420},
doi = {10.1109/TEST.2015.7342420},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VartziotisKGC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VoineaK15,
author = {Adrian I. Voinea and
Stefan Kampfer},
title = {Rapid prototyping and test before silicon of integrated pressure sensors},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--9},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342402},
doi = {10.1109/TEST.2015.7342402},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VoineaK15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamaguchiDKIUS15,
author = {Takahiro J. Yamaguchi and
Katsuhiko Degawa and
Masayuki Kawabata and
Masahiro Ishida and
Koichiro Uekusa and
Mani Soma},
title = {A new method for measuring alias-free aperture jitter in an {ADC}
output},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--6},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342384},
doi = {10.1109/TEST.2015.7342384},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YamaguchiDKIUS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangHSLSPC15,
author = {Hao{-}Yu Yang and
Rei{-}Fu Huang and
Chin{-}Lung Su and
Kuan{-}Hong Lin and
Hang{-}Kaung Shu and
Chi{-}Wei Peng and
Mango Chia{-}Tso Chao},
title = {Testing methods for quaternary content addressable memory using charge-sharing
sensing scheme},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342409},
doi = {10.1109/TEST.2015.7342409},
timestamp = {Wed, 24 May 2017 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YangHSLSPC15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YaoCZLWXWY15,
author = {Song Yao and
Xiaoming Chen and
Jie Zhang and
Qiaoyi Liu and
Jia Wang and
Qiang Xu and
Yu Wang and
Huazhong Yang},
title = {FASTrust: Feature analysis for third-party {IP} trust verification},
booktitle = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
pages = {1--10},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/TEST.2015.7342417},
doi = {10.1109/TEST.2015.7342417},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YaoCZLWXWY15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2015,
title = {2015 {IEEE} International Test Conference, {ITC} 2015, Anaheim, CA,
USA, October 6-8, 2015},
publisher = {{IEEE}},
year = {2015},
url = {https://ieeexplore.ieee.org/xpl/conhome/7331771/proceeding},
isbn = {978-1-4673-6578-9},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2015.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbeKSKKK14,
author = {Fumitaka Abe and
Yutaro Kobayashi and
Kenji Sawada and
Keisuke Kato and
Osamu Kobayashi and
Haruo Kobayashi},
title = {Low-distortion signal generation for {ADC} testing},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035304},
doi = {10.1109/TEST.2014.7035304},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbeKSKKK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AdhamCLHH14,
author = {Saman Adham and
Jonathan Chang and
Hung{-}Jen Liao and
John Hung and
Ting{-}Hua Hsieh},
title = {The importance of DFX, a foundry perspective},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035311},
doi = {10.1109/TEST.2014.7035311},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AdhamCLHH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalCE14,
author = {Mukesh Agrawal and
Krishnendu Chakrabarty and
Bill Eklow},
title = {A distributed, reconfigurable, and reusable bist infrastructure for
3D-stacked ICs},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035333},
doi = {10.1109/TEST.2014.7035333},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalCE14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AhmadiHNCM14,
author = {Ali Ahmadi and
Ke Huang and
Suriyaprakash Natarajan and
John M. Carulli Jr. and
Yiorgos Makris},
title = {Spatio-temporal wafer-level correlation modeling with progressive
sampling: {A} pathway to {HVM} yield estimation},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035325},
doi = {10.1109/TEST.2014.7035325},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AhmadiHNCM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ajouri14,
author = {Stacy Ajouri},
title = {The desire-friction ratio of Adaptive test},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035289},
doi = {10.1109/TEST.2014.7035289},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ajouri14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BishnoiEOT14,
author = {Rajendra Bishnoi and
Mojtaba Ebrahimi and
Fabian Oboril and
Mehdi Baradaran Tahoori},
title = {Read disturb fault detection in {STT-MRAM}},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035342},
doi = {10.1109/TEST.2014.7035342},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BishnoiEOT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BlantonNT14,
author = {Ronald D. Blanton and
Ben Niewenhuis and
Carl Taylor},
title = {Logic characterization vehicle design for maximal information extraction
for yield learning},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035345},
doi = {10.1109/TEST.2014.7035345},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BlantonNT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bose14,
author = {Pradip Bose},
title = {Energy-secure computer architectures},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035284},
doi = {10.1109/TEST.2014.7035284},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bose14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bowen14,
author = {Carl Bowen},
title = {Concerns over predictability of supply and quality},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035288},
doi = {10.1109/TEST.2014.7035288},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bowen14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BowmanPNAAYYH14,
author = {Keith A. Bowman and
Alex Park and
Venkat Narayanan and
Francois Atallah and
Alain Artieri and
Sei Seung Yoon and
Kendrick Yuen and
David Hansquine},
title = {Trading-off on-die observability for cache minimum supply voltage
reduction in system-on-chip (SoC) processors},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035322},
doi = {10.1109/TEST.2014.7035322},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BowmanPNAAYYH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Brat14,
author = {Guillaume Brat},
title = {Compositional verification using formal analysis for a flight critical
system},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035309},
doi = {10.1109/TEST.2014.7035309},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Brat14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CaiWM14,
author = {X. Cai and
Peter Wohl and
Daniel Martin},
title = {Fault sharing in a copy-on-write based {ATPG} system},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035349},
doi = {10.1109/TEST.2014.7035349},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CaiWM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Cassano14,
author = {Luca Cassano},
title = {Analysis and test of the effects of single event upsets affecting
the configuration memory of SRAM-based FPGAs},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035366},
doi = {10.1109/TEST.2014.7035366},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Cassano14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaoCCCLLHKCL14,
author = {Shih{-}Min Chao and
Po{-}Juei Chen and
Jing{-}Yu Chen and
Po{-}Hao Chen and
Ang{-}Feng Lin and
James Chien{-}Mo Li and
Pei{-}Ying Hsueh and
Chun{-}Yi Kuo and
Ying{-}Yen Chen and
Jih{-}Nung Li},
title = {Divide and conquer diagnosis for multiple defects},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035362},
doi = {10.1109/TEST.2014.7035362},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChaoCCCLLHKCL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chen14,
author = {Harry H. Chen},
title = {The case for analyzing system level failures using structural patterns},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035346},
doi = {10.1109/TEST.2014.7035346},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Chen14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenLPW14,
author = {Hao Chen and
Hung{-}Chih Lin and
Ching{-}Nen Peng and
Min{-}Jer Wang},
title = {Wafer Level Chip Scale Package copper pillar probing},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035315},
doi = {10.1109/TEST.2014.7035315},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenLPW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengG14,
author = {Da Cheng and
Sandeep K. Gupta},
title = {Optimizing redundancy design for chip-multiprocessors for flexible
utility functions},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035368},
doi = {10.1109/TEST.2014.7035368},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChengG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CherMHSMGDDKSSS14,
author = {Chen{-}Yong Cher and
K. Paul Muller and
Ruud A. Haring and
David L. Satterfield and
Thomas E. Musta and
Thomas Gooding and
Kristan D. Davis and
Marc Boris Dombrowa and
Gerard V. Kopcsay and
Robert M. Senger and
Yutaka Sugawara and
Krishnan Sugavanam},
title = {Soft error resiliency characterization and improvement on {IBM} BlueGene/Q
processor using accelerated proton irradiation},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035317},
doi = {10.1109/TEST.2014.7035317},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CherMHSMGDDKSSS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Curtis14,
author = {Bill Curtis},
title = {Delivering security by design in the Internet of Things},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035283},
doi = {10.1109/TEST.2014.7035283},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Curtis14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/David-GrignotAL14,
author = {Stephane David{-}Grignot and
Florence Aza{\"{\i}}s and
Laurent Latorre and
Francois Lefevre},
title = {Low-cost phase noise testing of complex {RF} ICs using standard digital
{ATE}},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035301},
doi = {10.1109/TEST.2014.7035301},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/David-GrignotAL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DeutschC14,
author = {Sergej Deutsch and
Krishnendu Chakrabarty},
title = {Massive signal tracing using on-chip {DRAM} for in-system silicon
debug},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035363},
doi = {10.1109/TEST.2014.7035363},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DeutschC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DworakCCP14,
author = {Jennifer Dworak and
Zoe Conroy and
Alfred L. Crouch and
John C. Potter},
title = {Board security enhancement using new locking SIB-based architectures},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035355},
doi = {10.1109/TEST.2014.7035355},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DworakCCP14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EllurS14,
author = {Harsharaj Ellur and
Kalpesh Shah},
title = {A Tag based solution for efficient utilization of efuse for memory
repair},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035324},
doi = {10.1109/TEST.2014.7035324},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EllurS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ErbSKSWB14,
author = {Dominik Erb and
Karsten Scheibler and
Michael A. Kochte and
Matthias Sauer and
Hans{-}Joachim Wunderlich and
Bernd Becker},
title = {Test pattern generation in presence of unknown values based on restricted
symbolic logic},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035350},
doi = {10.1109/TEST.2014.7035350},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ErbSKSWB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FanVJK14,
author = {Y. Fan and
A. Verma and
J. Janney and
S. Kumar},
title = {Testing silicon {TV} tuners on {ATE} without {TV} signal generator},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035352},
doi = {10.1109/TEST.2014.7035352},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FanVJK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Floyd14,
author = {Brian A. Floyd},
title = {Market opportunities and testing challenges for millimeter-wave radios
and radars},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035302},
doi = {10.1109/TEST.2014.7035302},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Floyd14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FujitaM14,
author = {Masahiro Fujita and
Alan Mishchenko},
title = {Efficient SAT-based {ATPG} techniques for all multiple stuck-at faults},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035351},
doi = {10.1109/TEST.2014.7035351},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FujitaM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gattiker14,
author = {Anne Gattiker},
title = {Big data and test},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035327},
doi = {10.1109/TEST.2014.7035327},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gattiker14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GielenDVCE14,
author = {Georges G. E. Gielen and
Wim Dobbelaere and
Ronny Vanhooren and
Anthony Coyette and
Baris Esen},
title = {Design and test of analog circuits towards sub-ppm level},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--2},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035330},
doi = {10.1109/TEST.2014.7035330},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GielenDVCE14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GurumurthyPGR14,
author = {Sankar Gurumurthy and
Mustansir Pratapgarhwala and
Curtis Gilgan and
Jeff Rearick},
title = {Comparing the effectiveness of cache-resident tests against cycleaccurate
deterministic functional patterns},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035348},
doi = {10.1109/TEST.2014.7035348},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GurumurthyPGR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HanS14,
author = {Chao Han and
Adit D. Singh},
title = {On the testing of hazard activated open defects},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035277},
doi = {10.1109/TEST.2014.7035277},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HanS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandIKKLW14,
author = {Sybille Hellebrand and
Thomas Indlekofer and
Matthias Kampmann and
Michael A. Kochte and
Chang Liu and
Hans{-}Joachim Wunderlich},
title = {{FAST-BIST:} Faster-than-at-Speed {BIST} targeting hidden delay defects},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035360},
doi = {10.1109/TEST.2014.7035360},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HellebrandIKKLW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hernandez14,
author = {Julio Vazquez Hernandez},
title = {Error prediction and detection methodologies for reliable circuit
operation under {NBTI}},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035364},
doi = {10.1109/TEST.2014.7035364},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Hernandez14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IshidaKNKA14,
author = {Masahiro Ishida and
Takashi Kusaka and
Toru Nakura and
Satoshi Komatsu and
Kunihiro Asada},
title = {Statistical silicon results of dynamic power integrity control of
{ATE} for eliminating overkills and underkills},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035299},
doi = {10.1109/TEST.2014.7035299},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IshidaKNKA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JeonLA14,
author = {Hyeran Jeon and
Gabriel H. Loh and
Murali Annavaram},
title = {Efficient {RAS} support for die-stacked {DRAM}},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035318},
doi = {10.1109/TEST.2014.7035318},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JeonLA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KellerCFCGSSPS14,
author = {Brion L. Keller and
Krishna Chakravadhanula and
Brian Foutz and
Vivek Chickermane and
Akhil Garg and
Richard Schoonover and
James Sage and
Don Pearl and
Thomas J. Snethen},
title = {Efficient testing of hierarchical core-based SOCs},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035292},
doi = {10.1109/TEST.2014.7035292},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KellerCFCGSSPS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KumarKMMRRTW14,
author = {Amit Kumar and
Mark Kassab and
Elham K. Moghaddam and
Nilanjan Mukherjee and
Janusz Rajski and
Sudhakar M. Reddy and
Jerzy Tyszer and
Chen Wang},
title = {Isometric test compression with low toggling activity},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035293},
doi = {10.1109/TEST.2014.7035293},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KumarKMMRRTW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuxUKSMBH14,
author = {Andreas Kux and
Rudolf Ullmann and
Thomas Kern and
Roland Strunz and
Hanno Melzner and
Stephan Beuven and
Andreas Haase},
title = {Latent defect detection in microcontroller embedded flash test using
device stress and wordline outlier screening},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035298},
doi = {10.1109/TEST.2014.7035298},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuxUKSMBH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Larsen14,
author = {Kenneth Larsen},
title = {Emulation and its connection to test},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035338},
doi = {10.1109/TEST.2014.7035338},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Larsen14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lee14,
author = {Bong Hyun Lee},
title = {Thermal-aware mobile SoC design and test in 14nm finfet technology},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035320},
doi = {10.1109/TEST.2014.7035320},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lee14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeHE14,
author = {J. K. Jerry Lee and
Amr Haggag and
William Eklow},
title = {Protecting against emerging vmin failures in advanced technology nodes},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035278},
doi = {10.1109/TEST.2014.7035278},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeHE14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeW14,
author = {Kuen{-}Jong Lee and
Cheng{-}Hung Wu},
title = {An efficient diagnosis-aware pattern generation procedure for transition
faults},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035361},
doi = {10.1109/TEST.2014.7035361},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Liang14,
author = {Yue Liang},
title = {Yield and performance improvement through technology-design co-optimization
in advanced technology nodes},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035312},
doi = {10.1109/TEST.2014.7035312},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Liang14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinCWLLPW14,
author = {Bing{-}Yang Lin and
Wan{-}Ting Chiang and
Cheng{-}Wen Wu and
Mincent Lee and
Hung{-}Chih Lin and
Ching{-}Nen Peng and
Min{-}Jer Wang},
title = {Redundancy architectures for channel-based 3D {DRAM} yield improvement},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035331},
doi = {10.1109/TEST.2014.7035331},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LinCWLLPW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinHC14,
author = {Fan Lin and
Chun{-}Kai Hsu and
Kwang{-}Ting Cheng},
title = {Feature engineering with canonical analysis for effective statistical
tests screening test escapes},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035344},
doi = {10.1109/TEST.2014.7035344},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinHC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mak14,
author = {T. M. Mak},
title = {Interposer test: Testing PCBs that have shrunk 100x},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035334},
doi = {10.1109/TEST.2014.7035334},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Mak14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MarinissenWODPB14,
author = {Erik Jan Marinissen and
Bart De Wachter and
Stephen O'Loughlin and
Sergej Deutsch and
Christos Papameletis and
Tobias Burgherr},
title = {Vesuvius-3D: {A} 3D-DfT demonstrator},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035332},
doi = {10.1109/TEST.2014.7035332},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MarinissenWODPB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MarinissenWSKTH14,
author = {Erik Jan Marinissen and
Bart De Wachter and
Ken Smith and
Jorg Kiesewetter and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Direct probing on large-array fine-pitch micro-bumps of a wide-I/O
logic-memory interface},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035314},
doi = {10.1109/TEST.2014.7035314},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MarinissenWSKTH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Meier14,
author = {Alexandra von Meier},
title = {Recruiting distributed resources for grid resilience: The need for
transparency},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035287},
doi = {10.1109/TEST.2014.7035287},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Meier14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MirkhaniA14,
author = {Shahrzad Mirkhani and
Jacob A. Abraham},
title = {{EAGLE:} {A} regression model for fault coverage estimation using
a simulation based metric},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035347},
doi = {10.1109/TEST.2014.7035347},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MirkhaniA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MittalKP14,
author = {Rajesh Mittal and
Mudasir Kawoosa and
Rubin A. Parekhji},
title = {Systematic approach for trim test time optimization: Case study on
a multi-core {RF} {SOC}},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035319},
doi = {10.1109/TEST.2014.7035319},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MittalKP14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Murmann14,
author = {Boris Murmann},
title = {Teaching an old dog new tricks: Views on the future of mixed-signal
{IC} design},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035306},
doi = {10.1109/TEST.2014.7035306},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Murmann14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Murthy14,
author = {Praveen K. Murthy},
title = {Top ten challenges in Big Data security and privacy},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035307},
doi = {10.1109/TEST.2014.7035307},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Murthy14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuthyalaT14,
author = {Sreenivaas S. Muthyala and
Nur A. Touba},
title = {Improving test compression with scan feedforward techniques},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035358},
doi = {10.1109/TEST.2014.7035358},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MuthyalaT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pagarkar14,
author = {Sajjad Pagarkar},
title = {Challenges of testing 100M chips},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035300},
doi = {10.1109/TEST.2014.7035300},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pagarkar14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkK14,
author = {Myeong{-}Jae Park and
Jaeha Kim},
title = {A built-in self-test circuit for jitter tolerance measurement in high-speed
wireline receivers},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035305},
doi = {10.1109/TEST.2014.7035305},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PengYTTCLHKLTCH14,
author = {Chun{-}Hsien Peng and
ChiaYu Yang and
Adonis Tsu and
Chung{-}Jin Tsai and
Yosen Chen and
C.{-}Y. Lin and
Kai Hong and
Kaipon Kao and
Paul C. P. Liang and
Chao Long Tsai and
Charles Chien and
H. C. Hwang},
title = {A novel {RF} self test for a combo SoC on digital {ATE} with multi-site
applications},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035303},
doi = {10.1109/TEST.2014.7035303},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PengYTTCLHKLTCH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PinoJF14,
author = {Youngok K. Pino and
Vinayaka Jyothi and
Matthew French},
title = {Intra-die process variation aware anomaly detection in FPGAs},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035343},
doi = {10.1109/TEST.2014.7035343},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PinoJF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PoulosV14,
author = {Zissis Poulos and
Andreas G. Veneris},
title = {Clustering-based failure triage for {RTL} regression debugging},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035339},
doi = {10.1109/TEST.2014.7035339},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PoulosV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PrabhuABH14,
author = {Sarvesh Prabhu and
Vineeth V. Acharya and
Sharad Bagri and
Michael S. Hsiao},
title = {A diagnosis-friendly {LBIST} architecture with property checking},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035359},
doi = {10.1109/TEST.2014.7035359},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PrabhuABH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PurtellM14,
author = {Michael Purtell and
Subhasish Mitra},
title = {Welcome message},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--2},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035248},
doi = {10.1109/TEST.2014.7035248},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PurtellM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/QuerbachKBZAESD14,
author = {Bruce Querbach and
Rahul Khanna and
David Blankenbeckler and
Yulan Zhang and
Ronald T. Anderson and
David G. Ellis and
Zale T. Schoenborn and
Sabyasachi Deyati and
Patrick Chiang},
title = {A reusable {BIST} with software assisted repair technology for improved
memory and {IO} debug, validation and test time},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035340},
doi = {10.1109/TEST.2014.7035340},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/QuerbachKBZAESD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RashidzadehB14,
author = {Rashid Rashidzadeh and
Iftekhar Ibne Basith},
title = {A test probe for {TSV} using resonant inductive coupling},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035367},
doi = {10.1109/TEST.2014.7035367},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RashidzadehB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobertazziNS14,
author = {Raphael Robertazzi and
Janusz Nowak and
Jonathan Sun},
title = {Analytical {MRAM} test},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035341},
doi = {10.1109/TEST.2014.7035341},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RobertazziNS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Roos14,
author = {Mark Roos},
title = {{ATE} and test equipment vendors; Hardware not software},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035291},
doi = {10.1109/TEST.2014.7035291},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Roos14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RyanAHJL14,
author = {Paul G. Ryan and
Irfan Aziz and
William B. Howell and
Teresa K. Janczak and
Davia J. Lu},
title = {Process defect trends and strategic test gaps},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035276},
doi = {10.1109/TEST.2014.7035276},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RyanAHJL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Saeed14,
author = {Samah Mohamed Saeed},
title = {DfST: Design for secure testability},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035365},
doi = {10.1109/TEST.2014.7035365},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Saeed14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaeedASK14,
author = {Samah Mohamed Saeed and
Sk Subidh Ali and
Ozgur Sinanoglu and
Ramesh Karri},
title = {Test-mode-only scan attack and countermeasure for contemporary scan
architectures},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035357},
doi = {10.1109/TEST.2014.7035357},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SaeedASK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Schneider14,
author = {Kevin Schneider},
title = {Microgrids as a resiliency resource},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035286},
doi = {10.1109/TEST.2014.7035286},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Schneider14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Schroeder14,
author = {Bianca Schroeder},
title = {A tale of two lives: Under test and in the wild},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035316},
doi = {10.1109/TEST.2014.7035316},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Schroeder14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchulzeT14,
author = {John Schulze and
Ryan Tally},
title = {Mitigating voltage droop during scan with variable shift frequency},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035295},
doi = {10.1109/TEST.2014.7035295},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchulzeT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShaikhWASTLR14,
author = {Raashid Shaikh and
Pradeep Wilson and
Khushboo Agarwal and
H. V. Sanjay and
Rajesh Tiwari and
Kaushik Lath and
Srivaths Ravi},
title = {At-speed capture power reduction using layout-aware granular clock
gate enable controls},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035296},
doi = {10.1109/TEST.2014.7035296},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShaikhWASTLR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShiN14,
author = {Xiaobing Shi and
Nicola Nicolici},
title = {On-chip constrained random stimuli generation for post-silicon validation
using compact masks},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035337},
doi = {10.1109/TEST.2014.7035337},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShiN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShirleyDNC14,
author = {C. Glenn Shirley and
W. Robert Daasch and
Phil Nigh and
Zoe Conroy},
title = {Board manufacturing test correlation to {IC} manufacturing test},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035336},
doi = {10.1109/TEST.2014.7035336},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShirleyDNC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Smith14,
author = {Wesley Smith},
title = {Collaboration and teamwork obstacles},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035290},
doi = {10.1109/TEST.2014.7035290},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Smith14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Soma14,
author = {Mani Soma},
title = {Analog fault models: Back to the future?},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035280},
doi = {10.1109/TEST.2014.7035280},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Soma14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SongSW14,
author = {Peilin Song and
Franco Stellari and
Alan J. Weger},
title = {Counterfeit {IC} detection using light emission},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035356},
doi = {10.1109/TEST.2014.7035356},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SongSW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterJDV14,
author = {Stephen Sunter and
Krzysztof Jurga and
Peter Dingenen and
Ronny Vanhooren},
title = {Practical random sampling of potential defects for analog fault simulation},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035281},
doi = {10.1109/TEST.2014.7035281},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterJDV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterSL14,
author = {Stephen Sunter and
Saghir A. Shaikh and
Qing Lin},
title = {Fast {BIST} of {I/O} Pin {AC} specifications and inter-chip delays},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035297},
doi = {10.1109/TEST.2014.7035297},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterSL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Swaminathan14,
author = {Madhavan Swaminathan},
title = {Managing signal, power and thermal integrity for 3D integration},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035313},
doi = {10.1109/TEST.2014.7035313},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Swaminathan14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TikkanenSSWA14,
author = {Jeff Tikkanen and
Sebastian Siatkowski and
Nik Sumikawa and
Li{-}C. Wang and
Magdy S. Abadir},
title = {Yield optimization using advanced statistical correlation methods},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035326},
doi = {10.1109/TEST.2014.7035326},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TikkanenSSWA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Trimberger14,
author = {Steve Trimberger},
title = {Security solutions in the first-generation Zynq All-Programmable SoC},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035282},
doi = {10.1109/TEST.2014.7035282},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Trimberger14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TzouBC14,
author = {Nicholas Tzou and
Debesh Bhatta and
Abhijit Chatterjee},
title = {Low cost back end signal processing driven bandwidth interleaved signal
acquisition using free running undersampling clocks and mixing signals},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035279},
doi = {10.1109/TEST.2014.7035279},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TzouBC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Vadari14,
author = {Mani Vadari},
title = {Dynamic microgrids - {A} potential solution for enhanced resiliency
in distribution systems},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035285},
doi = {10.1109/TEST.2014.7035285},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Vadari14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VillarragaSBRBF14,
author = {Carlos Villarraga and
Bernard Schmidt and
Binghao Bao and
Rakesh Raman and
Christian Bartsch and
Thomas Fehmel and
Dominik Stoffel and
Wolfgang Kunz},
title = {Software in a hardware view: New models for HW-dependent software
in SoC verification and test},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035308},
doi = {10.1109/TEST.2014.7035308},
timestamp = {Wed, 31 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VillarragaSBRBF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangKSC14,
author = {Xian Wang and
Blanchard Kenfack and
Estella Silva and
Abhijit Chatterjee},
title = {A self-tuning architecture for buck converters based on alternative
test},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035353},
doi = {10.1109/TEST.2014.7035353},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangKSC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWCS14,
author = {Peter Wohl and
John A. Waicukauski and
Jonathon E. Colburn and
Milind Sonawane},
title = {Achieving extreme scan compression for SoC Designs},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035294},
doi = {10.1109/TEST.2014.7035294},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWCS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XanthopoulosHPN14,
author = {Constantinos Xanthopoulos and
Ke Huang and
Abbas Poonawala and
Amit Nahar and
Bob Orr and
John M. Carulli Jr. and
Yiorgos Makris},
title = {{IC} laser trimming speed-up through wafer-level spatial correlation
modeling},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035329},
doi = {10.1109/TEST.2014.7035329},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XanthopoulosHPN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuC14,
author = {Li Xu and
Degang Chen},
title = {Fast co-test of linearity and spectral performance with non-coherent
sampled and amplitude clipped data},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035354},
doi = {10.1109/TEST.2014.7035354},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XuC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YeZCG14,
author = {Fangming Ye and
Zhaobo Zhang and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Knowledge discovery and knowledge transfer in board-level functional
fault diagnosis},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035335},
doi = {10.1109/TEST.2014.7035335},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YeZCG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Yeric14,
author = {Greg Yeric},
title = {Design, technology and yield in the post-moore era},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035310},
doi = {10.1109/TEST.2014.7035310},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Yeric14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZadeganCL14,
author = {Farrokh Ghani Zadegan and
Gunnar Carlsson and
Erik Larsson},
title = {Robustness of TAP-based scan networks},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035321},
doi = {10.1109/TEST.2014.7035321},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZadeganCL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangLBSCB14,
author = {Shanghang Zhang and
Xin Li and
Ronald D. Blanton and
Jos{\'{e}} Machado da Silva and
John M. Carulli Jr. and
Kenneth M. Butler},
title = {Bayesian model fusion: Enabling test cost reduction of analog/RF circuits
via wafer-level spatial variation modeling},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035328},
doi = {10.1109/TEST.2014.7035328},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangLBSCB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Zorian14,
author = {Yervant Zorian},
title = {Design, test {\&} repair methodology for FinFET-based memories},
booktitle = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://doi.org/10.1109/TEST.2014.7035323},
doi = {10.1109/TEST.2014.7035323},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Zorian14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2014,
title = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
October 20-23, 2014},
publisher = {{IEEE} Computer Society},
year = {2014},
url = {https://ieeexplore.ieee.org/xpl/conhome/7024668/proceeding},
isbn = {978-1-4799-4722-5},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2014.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbdallahSM13,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {True non-intrusive sensors for {RF} built-in test},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651885},
doi = {10.1109/TEST.2013.6651885},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbdallahSM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalC13,
author = {Mukesh Agrawal and
Krishnendu Chakrabarty},
title = {A graph-theoretic approach for minimizing the number of wrapper cells
for pre-bond testing of 3D-stacked ICs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651895},
doi = {10.1109/TEST.2013.6651895},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ArasuNCBR13,
author = {Senthil Arasu and
Mehrdad Nourani and
John M. Carulli and
Kenneth M. Butler and
Vijay Reddy},
title = {A design-for-reliability approach based on grading library cells for
aging effects},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651923},
doi = {10.1109/TEST.2013.6651923},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ArasuNCBR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AzumaMUNTMHTY13,
author = {Naoya Azuma and
T. Makita and
S. Ueyama and
Makoto Nagata and
Satoru Takahashi and
Motoki Murakami and
Kazuaki Hori and
Satoshi Tanaka and
Masahiro Yamaguchi},
title = {In-system diagnosis of {RF} ICs for tolerance against on-chip in-band
interferers},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651922},
doi = {10.1109/TEST.2013.6651922},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AzumaMUNTMHTY13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Barton13,
author = {John D. Barton},
title = {Keynote address wednesday: Compute continuum and the nonlinear validation
challenge},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651872},
doi = {10.1109/TEST.2013.6651872},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Barton13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bose13,
author = {Pradip Bose},
title = {Keynote address thursday: Efficient resilience in future systems:
Design and modeling challenges},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651873},
doi = {10.1109/TEST.2013.6651873},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bose13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CaiFCOR13,
author = {Yi Cai and
Liming Fang and
Ivan Chan and
Max Olsen and
Kevin Richter},
title = {12Gbps SerDes Jitter Tolerance {BIST} in production loopback testing
with enhanced spread spectrum clock generation circuit},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651882},
doi = {10.1109/TEST.2013.6651882},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CaiFCOR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CaiW13,
author = {X. Cai and
Peter Wohl},
title = {A distributed-multicore hybrid {ATPG} system},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651916},
doi = {10.1109/TEST.2013.6651916},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CaiW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CarloGMPRT13,
author = {Stefano Di Carlo and
Giulio Gambardella and
Ippazio Martella and
Paolo Prinetto and
Daniele Rolfo and
Pascal Trotta},
title = {Fault mitigation strategies for {CUDA} GPUs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651908},
doi = {10.1109/TEST.2013.6651908},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CarloGMPRT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChakravadhanulaCPGKMN13,
author = {Krishna Chakravadhanula and
Vivek Chickermane and
Don Pearl and
Akhil Garg and
R. Khurana and
Subhasish Mukherjee and
P. Nagaraj},
title = {SmartScan - Hierarchical test compression for pin-limited low power
designs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651897},
doi = {10.1109/TEST.2013.6651897},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChakravadhanulaCPGKMN13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenHYS13,
author = {Harry H. Chen and
Roger Hsu and
PaulYoung Yang and
J. J. Shyr},
title = {Predicting system-level test and in-field customer failures using
data mining},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651892},
doi = {10.1109/TEST.2013.6651892},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenHYS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenYMN13,
author = {Degang Chen and
Zhongjun Yu and
Krunal Maniar and
Mojtaba Nowrozi},
title = {Test time reduction with {SATOM:} Simultaneous {AC-DC} Test with Orthogonal
Multi-excitations},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651912},
doi = {10.1109/TEST.2013.6651912},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenYMN13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChowSL13,
author = {Daniel Chow and
Masashi Shimanouchi and
Mike Peng Li},
title = {Theory, model, and applications of non-Gaussian probability density
functions for random jitter/noise with non-white power spectral densities},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651910},
doi = {10.1109/TEST.2013.6651910},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChowSL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CohnSWBTP13,
author = {Michael B. Cohn and
Kaosio Saechao and
Michael Whitlock and
Daniel Brenman and
Wallace T. Tang and
Robert M. Proie},
title = {{RF} {MEMS} switches for Wide {I/O} data bus applications},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651889},
doi = {10.1109/TEST.2013.6651889},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CohnSWBTP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ConroyC13,
author = {Zoe Conroy and
Alfred L. Crouch},
title = {{BA-BIST:} Board test from inside the {IC} out},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651919},
doi = {10.1109/TEST.2013.6651919},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ConroyC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DeutschCM13,
author = {Sergej Deutsch and
Krishnendu Chakrabarty and
Erik Jan Marinissen},
title = {Uncertainty-aware robust optimization of test-access architectures
for 3D stacked ICs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651905},
doi = {10.1109/TEST.2013.6651905},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DeutschCM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DworakCPZT13,
author = {Jennifer Dworak and
Al Crouch and
John C. Potter and
Adam Zygmontowicz and
Micah Thornton},
title = {Don't forget to lock your {SIB:} Hiding instruments using {P16871}},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651903},
doi = {10.1109/TEST.2013.6651903},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DworakCPZT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ferry13,
author = {Joshua Ferry},
title = {FPGA-based universal embedded digital instrument},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651917},
doi = {10.1109/TEST.2013.6651917},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ferry13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FirouziYCT13,
author = {Farshad Firouzi and
Fangming Ye and
Krishnendu Chakrabarty and
Mehdi Baradaran Tahoori},
title = {Representative critical-path selection for aging-induced delay monitoring},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651924},
doi = {10.1109/TEST.2013.6651924},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FirouziYCT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GaoL13,
author = {Wei Gao and
Chris Liu},
title = {Performance enhancement of a {WCDMA/HSDPA+} receiver via minimizing
error vector magnitude},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651881},
doi = {10.1109/TEST.2013.6651881},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GaoL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GhofraniLC13,
author = {Amirali Ghofrani and
Miguel Angel Lastras{-}Monta{\~{n}}o and
Kwang{-}Ting Cheng},
title = {Towards data reliable crossbar-based memristive memories},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651928},
doi = {10.1109/TEST.2013.6651928},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GhofraniLC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoelAWCHMLCKVMSCLCK13,
author = {Sandeep Kumar Goel and
Saman Adham and
Min{-}Jer Wang and
Ji{-}Jan Chen and
Tze{-}Chiang Huang and
Ashok Mehta and
Frank Lee and
Vivek Chickermane and
Brion L. Keller and
Thomas Valind and
Subhasish Mukherjee and
Navdeep Sood and
Jeongho Cho and
Hayden Hyungdong Lee and
Jungi Choi and
Sangdoo Kim},
title = {Test and debug strategy for {TSMC} CoWoS{\texttrademark} stacking
process based heterogeneous 3D {IC:} {A} silicon case study},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651893},
doi = {10.1109/TEST.2013.6651893},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoelAWCHMLCKVMSCLCK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GradyPPDN13,
author = {Matt Grady and
Bradley Pepper and
Joshua Patch and
Michael Degregorio and
Phil Nigh},
title = {Adaptive testing - Cost reduction through test pattern sampling},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651891},
doi = {10.1109/TEST.2013.6651891},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GradyPPDN13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsuCHLLLPW13,
author = {Sen{-}Kuei Hsu and
Hao Chen and
Chung{-}Han Huang and
Der{-}Jiann Liu and
Wei{-}Hsun Lin and
Hung{-}Chih Lin and
Ching{-}Nen Peng and
Min{-}Jer Wang},
title = {Test-yield improvement of high-density probing technology using optimized
metal backer with plastic patch},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651888},
doi = {10.1109/TEST.2013.6651888},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsuCHLLLPW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsuLCZLCB13,
author = {Chun{-}Kai Hsu and
Fan Lin and
Kwang{-}Ting Cheng and
Wangyang Zhang and
Xin Li and
John M. Carulli and
Kenneth M. Butler},
title = {Test data analytics - Exploring spatial and test-item correlations
in production test data},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651900},
doi = {10.1109/TEST.2013.6651900},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HsuLCZLCB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangCM13,
author = {Ke Huang and
John M. Carulli and
Yiorgos Makris},
title = {Counterfeit electronics: {A} rising threat in the semiconductor manufacturing
industry},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651880},
doi = {10.1109/TEST.2013.6651880},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangCM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangHTC13,
author = {Shi{-}Yu Huang and
Li{-}Ren Huang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng},
title = {Delay testing and characterization of post-bond interposer wires in
2.5-D ICs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651906},
doi = {10.1109/TEST.2013.6651906},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangHTC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangKCM13,
author = {Ke Huang and
Nathan Kupp and
John M. Carulli Jr. and
Yiorgos Makris},
title = {Process monitoring through wafer-level spatial variation decomposition},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651901},
doi = {10.1109/TEST.2013.6651901},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangKCM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangSM13,
author = {Ke Huang and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir},
title = {Fault modeling and diagnosis for nanometric analog circuits},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651886},
doi = {10.1109/TEST.2013.6651886},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangSM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IchiyamaINW13,
author = {Kiyotaka Ichiyama and
Masahiro Ishida and
Kenichi Nagatani and
Toshifumi Watanabe},
title = {A functional test of 2-GHz/4-GHz {RF} digital communication device
using digital tester},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651909},
doi = {10.1109/TEST.2013.6651909},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IchiyamaINW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JanickiTCHKMRDG13,
author = {Jakub Janicki and
Jerzy Tyszer and
Wu{-}Tung Cheng and
Yu Huang and
Mark Kassab and
Nilanjan Mukherjee and
Janusz Rajski and
Yan Dong and
Grady Giles},
title = {{EDT} bandwidth management - Practical scenarios for large SoC designs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651898},
doi = {10.1109/TEST.2013.6651898},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JanickiTCHKMRDG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeezerGCM13,
author = {David C. Keezer and
Carl Edward Gray and
Te{-}Hui Chen and
Ashraf Majid},
title = {Practical methods for extending {ATE} to 40 and 50Gbps},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651876},
doi = {10.1109/TEST.2013.6651876},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeezerGCM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kim13,
author = {Kwang{-}Hyun Kim},
title = {Keynote address tuesday: Challenges in mobile devices: Process, design
and manufacturing},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651871},
doi = {10.1109/TEST.2013.6651871},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kim13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KumarRRW13,
author = {Amit Kumar and
Janusz Rajski and
Sudhakar M. Reddy and
Chen Wang},
title = {On the generation of compact test sets},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651914},
doi = {10.1109/TEST.2013.6651914},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KumarRRW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiCMM13,
author = {Yanjing Li and
Eric Cheng and
Samy Makar and
Subhasish Mitra},
title = {Self-repair of uncore components in robust system-on-chips: An OpenSPARC
{T2} case study},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651907},
doi = {10.1109/TEST.2013.6651907},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiCMM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lu13,
author = {Ming Lu},
title = {An enhanced procedure for calculating dynamic properties of high-performance
{DAC} on {ATE}},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651877},
doi = {10.1109/TEST.2013.6651877},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lu13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LyonsCAS13,
author = {Timothy Lyons and
George Conner and
John Aslanian and
Shawn Sullivan},
title = {The implementation and application of a protocol aware architecture},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651911},
doi = {10.1109/TEST.2013.6651911},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LyonsCAS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ManichWGS13,
author = {Salvador Manich and
Markus S. Wamser and
Oscar M. Guillen and
Georg Sigl},
title = {Differential scan-path: {A} novel solution for secure design-for-testability},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651902},
doi = {10.1109/TEST.2013.6651902},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ManichWGS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NasseryJO13,
author = {Afsaneh Nassery and
Jae Woong Jeong and
Sule Ozev},
title = {Zero-overhead self test and calibration of {RF} transceivers},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651921},
doi = {10.1109/TEST.2013.6651921},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NasseryJO13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NiewenhuisBBM13,
author = {Ben Niewenhuis and
Ronald D. Blanton and
Mudit Bhargava and
Ken Mai},
title = {{SCAN-PUF:} {A} low overhead Physically Unclonable Function from scan
chain power-up states},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651904},
doi = {10.1109/TEST.2013.6651904},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NiewenhuisBBM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Okawara13,
author = {Hideo Okawara},
title = {Advanced method to refine waveform smeared by jitter in waveform sampler
measurement},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651883},
doi = {10.1109/TEST.2013.6651883},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Okawara13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PrabhuA13,
author = {Mahesh Prabhu and
Jacob A. Abraham},
title = {Application of under-approximation techniques to functional test generation
targeting hard to detect stuck-at faults},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651915},
doi = {10.1109/TEST.2013.6651915},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PrabhuA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajendranSK13,
author = {Jeyavijayan Rajendran and
Ozgur Sinanoglu and
Ramesh Karri},
title = {{VLSI} testing based security metric for {IC} camouflaging},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651879},
doi = {10.1109/TEST.2013.6651879},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajendranSK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiT13,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Fault diagnosis of TSV-based interconnects in 3-D stacked designs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651894},
doi = {10.1109/TEST.2013.6651894},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobertsA13,
author = {Gordon W. Roberts and
Rob Aitken},
title = {Welcome message},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651865},
doi = {10.1109/TEST.2013.6651865},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RobertsA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SauerKSKDCKMB13,
author = {Matthias Sauer and
Young Moon Kim and
Jun Seomun and
Hyung{-}Ock Kim and
Kyung Tae Do and
Jung Yun Choi and
Kee Sup Kim and
Subhasish Mitra and
Bernd Becker},
title = {Early-life-failure detection using SAT-based {ATPG}},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651925},
doi = {10.1109/TEST.2013.6651925},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SauerKSKDCKMB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SindiaA13,
author = {Suraj Sindia and
Vishwani D. Agrawal},
title = {High sensitivity test signatures for unconventional analog circuit
test paradigms},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651884},
doi = {10.1109/TEST.2013.6651884},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SindiaA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SudaniXC13,
author = {Siva Sudani and
Li Xu and
Degang Chen},
title = {Accurate full spectrum test robust to simultaneous non-coherent sampling
and amplitude clipping},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651920},
doi = {10.1109/TEST.2013.6651920},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SudaniXC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SumikawaWA13,
author = {Nik Sumikawa and
Li{-}C. Wang and
Magdy S. Abadir},
title = {A pattern mining framework for inter-wafer abnormality analysis},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651890},
doi = {10.1109/TEST.2013.6651890},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SumikawaWA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunJXZWG13,
author = {Zelong Sun and
Li Jiang and
Qiang Xu and
Zhaobo Zhang and
Zhiyuan Wang and
Xinli Gu},
title = {AgentDiag: An agent-assisted diagnostic framework for board-level
functional failures},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651918},
doi = {10.1109/TEST.2013.6651918},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunJXZWG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiS13,
author = {Kun{-}Han Tsai and
Shuo Sheng},
title = {Design rule check on the clock gating logic for testability and beyond},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651930},
doi = {10.1109/TEST.2013.6651930},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsaiS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VenkataramaniA13,
author = {Praveen Venkataramani and
Vishwani D. Agrawal},
title = {{ATE} test time reduction using asynchronous clock period},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651931},
doi = {10.1109/TEST.2013.6651931},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VenkataramaniA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WatanabeMHASOO13,
author = {Daisuke Watanabe and
Shin Masuda and
Hideo Hara and
Tsuyoshi Ataka and
Atsushi Seki and
Atsushi Ono and
Toshiyuki Okayasu},
title = {30-Gb/s optical and electrical test solution for high-volume testing},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651887},
doi = {10.1109/TEST.2013.6651887},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WatanabeMHASOO13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWNMAC13,
author = {Peter Wohl and
John A. Waicukauski and
Frederic Neuveux and
Gregory A. Maston and
Nadir Achouri and
Jonathon E. Colburn},
title = {Two-level compression through selective reseeding},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651896},
doi = {10.1109/TEST.2013.6651896},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWNMAC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuePLB13,
author = {Yang Xue and
Osei Poku and
Xin Li and
Ronald D. Blanton},
title = {{PADRE:} Physically-Aware Diagnostic Resolution Enhancement},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651899},
doi = {10.1109/TEST.2013.6651899},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XuePLB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamaguchiTKA13,
author = {Takahiro J. Yamaguchi and
James S. Tandon and
Satoshi Komatsu and
Kunihiro Asada},
title = {A novel test structure for measuring the threshold voltage variance
in MOSFETs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651878},
doi = {10.1109/TEST.2013.6651878},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamaguchiTKA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ye0HCGLT0CLCEKLP13,
author = {Jing Ye and
Yu Huang and
Yu Hu and
Wu{-}Tung Cheng and
Ruifeng Guo and
Liyang Lai and
Ting{-}Pu Tai and
Xiaowei Li and
Wei{-}pin Changchien and
Daw{-}Ming Lee and
Ji{-}Jan Chen and
Sandeep C. Eruvathi and
Kartik K. Kumara and
Charles C. C. Liu and
Sam Pan},
title = {Diagnosis and Layout Aware {(DLA)} scan chain stitching},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651929},
doi = {10.1109/TEST.2013.6651929},
timestamp = {Mon, 22 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Ye0HCGLT0CLCEKLP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YehHCW13,
author = {Kuen{-}Wei Yeh and
Jiun{-}Lang Huang and
Hao{-}Jan Chao and
Laung{-}Terng Wang},
title = {A circular pipeline processing based deterministic parallel test pattern
generator},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651913},
doi = {10.1109/TEST.2013.6651913},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YehHCW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuC13,
author = {Z. Yu and
D. Chen},
title = {Best paper award winners},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {4},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651867},
doi = {10.1109/TEST.2013.6651867},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangBKSBIWH13,
author = {Hongyan Zhang and
Lars Bauer and
Michael A. Kochte and
Eric Schneider and
Claus Braun and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
J{\"{o}}rg Henkel},
title = {Module diversification: Fault tolerance and aging mitigation for runtime
reconfigurable architectures},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651926},
doi = {10.1109/TEST.2013.6651926},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangBKSBIWH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZordanBDGTVB13,
author = {Leonardo Bonet Zordan and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Arnaud Virazel and
Nabil Badereddine},
title = {On the reuse of read and write assist circuits to improve test efficiency
in low-power SRAMs},
booktitle = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/TEST.2013.6651927},
doi = {10.1109/TEST.2013.6651927},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZordanBDGTVB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2013,
title = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
USA, September 6-13, 2013},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://ieeexplore.ieee.org/xpl/conhome/6646057/proceeding},
isbn = {978-1-4799-0859-2},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2013.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbdallahSMK12,
author = {Louay Abdallah and
Haralampos{-}G. D. Stratigopoulos and
Salvador Mir and
Christophe Kelma},
title = {Experiences with non-intrusive sensors for {RF} built-in test},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401587},
doi = {10.1109/TEST.2012.6401587},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbdallahSMK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgrawalRC12,
author = {Mukesh Agrawal and
Michael Richter and
Krishnendu Chakrabarty},
title = {A dynamic programming solution for optimizing test delivery in multicore
SOCs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401535},
doi = {10.1109/TEST.2012.6401535},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgrawalRC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AleksejevJDOW12,
author = {Igor Aleksejev and
Artur Jutman and
Sergei Devadze and
Sergei Odintsov and
Thomas Wenzel},
title = {FPGA-based synthetic instrumentation for board test},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401571},
doi = {10.1109/TEST.2012.6401571},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AleksejevJDOW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AltetMGPVJ12,
author = {Josep Altet and
Diego Mateo and
Didac G{\'{o}}mez and
Xavier Perpi{\~{n}}{\`{a}} and
Miquel Vellveh{\'{\i}} and
Xavier Jord{\`{a}}},
title = {{DC} temperature measurements for power gain monitoring in {RF} power
amplifiers},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401589},
doi = {10.1109/TEST.2012.6401589},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AltetMGPVJ12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Atwood12,
author = {Eugene R. Atwood},
title = {"Managing process variance in analog designs"},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401527},
doi = {10.1109/TEST.2012.6401527},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Atwood12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AyariABCKPR12,
author = {Haithem Ayari and
Florence Aza{\"{\i}}s and
Serge Bernard and
Mariane Comte and
Vincent Kerzerho and
Olivier Potin and
Michel Renovell},
title = {Making predictive analog/RF alternate test strategy independent of
training set size},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401560},
doi = {10.1109/TEST.2012.6401560},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AyariABCKPR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BaranowskiKW12,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Modeling, verification and pattern generation for reconfigurable scan
networks},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401555},
doi = {10.1109/TEST.2012.6401555},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BaranowskiKW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BecklerB12,
author = {Matthew Beckler and
R. D. (Shawn) Blanton},
title = {On-chip diagnosis for early-life and wear-out failures},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401580},
doi = {10.1109/TEST.2012.6401580},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BecklerB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Conroy12,
author = {Zoe Conroy},
title = {Are the {IC} guys helping or hindering board test?},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401530},
doi = {10.1109/TEST.2012.6401530},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Conroy12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ConroyGMSCM12,
author = {Zoe Conroy and
James J. Grealish and
Harrison Miles and
Anthony J. Suto and
Alfred L. Crouch and
Skip Meyers},
title = {Board assisted-BIST: Long and short term solutions for testpoint erosion
- Reaching into the DFx toolbox},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401572},
doi = {10.1109/TEST.2012.6401572},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ConroyGMSCM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszRT12,
author = {Dariusz Czysz and
Janusz Rajski and
Jerzy Tyszer},
title = {Low power test application with selective compaction in {VLSI} designs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401532},
doi = {10.1109/TEST.2012.6401532},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszRT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Davidson12,
author = {Scott Davidson},
title = {Testing high-frequency and low-power designs: Do the standard rules
and tools apply?},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401529},
doi = {10.1109/TEST.2012.6401529},
timestamp = {Sat, 09 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Davidson12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DeutschKCMSGCMLM12,
author = {Sergej Deutsch and
Brion L. Keller and
Vivek Chickermane and
Subhasish Mukherjee and
Navdeep Sood and
Sandeep Kumar Goel and
Ji{-}Jan Chen and
Ashok Mehta and
Frank Lee and
Erik Jan Marinissen},
title = {DfT architecture and {ATPG} for Interconnect tests of {JEDEC} Wide-I/O
memory-on-logic die stacks},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401569},
doi = {10.1109/TEST.2012.6401569},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DeutschKCMSGCMLM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DingPWCLS12,
author = {Weichi Ding and
Mingde Pan and
Wilson Wong and
Daniel Chow and
Mike Peng Li and
Sergey Y. Shumarayev},
title = {On-die instrumentation to solve challenges for 28nm, 28Gbps timing
variability and stressing},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401536},
doi = {10.1109/TEST.2012.6401536},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DingPWCLS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuboisFMDM12,
author = {Matthieu Dubois and
Emeric de Foucauld and
Christopher Mounet and
Serigne Dia and
Cedric Mayor},
title = {A frequency measurement {BIST} implementation targeting gigahertz
application},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401588},
doi = {10.1109/TEST.2012.6401588},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuboisFMDM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EckerBS12,
author = {Allan Ecker and
Kenneth Blakkan and
Mani Soma},
title = {A digital method for phase noise measurement},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401537},
doi = {10.1109/TEST.2012.6401537},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EckerBS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FanTHCRB12,
author = {Xiaoxin Fan and
Huaxing Tang and
Yu Huang and
Wu{-}Tung Cheng and
Sudhakar M. Reddy and
Brady Benware},
title = {Improved volume diagnosis throughput using dynamic design partitioning},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401564},
doi = {10.1109/TEST.2012.6401564},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FanTHCRB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GaoLC12,
author = {Ming Gao and
Peter Lisherness and
Kwang{-}Ting (Tim) Cheng},
title = {Adaptive test selection for post-silicon timing validation: {A} data
mining approach},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401540},
doi = {10.1109/TEST.2012.6401540},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GaoLC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gu12,
author = {Xinli Gu},
title = {Are industrial test problems real problems? {I} thought research has
resolved them all!},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401526},
doi = {10.1109/TEST.2012.6401526},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gu12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeRRORRGSR12,
author = {Friedrich Hapke and
Michael Reese and
Jason Rivers and
A. Over and
V. Ravikumar and
Wilfried Redemund and
Andreas Glowatz and
J{\"{u}}rgen Schl{\"{o}}ffel and
Janusz Rajski},
title = {Cell-aware Production test results from a 32-nm notebook processor},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401533},
doi = {10.1109/TEST.2012.6401533},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HapkeRRORRGSR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HilberGSO12,
author = {Gerald Hilber and
Dominik Gruber and
Michael Sams and
Timm Ostermann},
title = {Calibration of a flexible high precision Power-On Reset during production
test},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401562},
doi = {10.1109/TEST.2012.6401562},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HilberGSO12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IshidaIWKO12,
author = {Masahiro Ishida and
Kiyotaka Ichiyama and
Daisuke Watanabe and
Masayuki Kawabata and
Toshiyuki Okayasu},
title = {Real-time testing method for 16 Gbps 4-PAM signal interface},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401524},
doi = {10.1109/TEST.2012.6401524},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IshidaIWKO12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IshidaNKKKA12,
author = {Masahiro Ishida and
Toru Nakura and
Toshiyuki Kikkawa and
Takashi Kusaka and
Satoshi Komatsu and
Kunihiro Asada},
title = {Power integrity control of {ATE} for emulating power supply fluctuations
on customer environment},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401553},
doi = {10.1109/TEST.2012.6401553},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IshidaNKKKA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ItoOL12,
author = {Takashi Ito and
Hideo Okawara and
Jinlei Liu},
title = {{RNA:} Advanced phase tracking method for digital waveform reconstruction},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401592},
doi = {10.1109/TEST.2012.6401592},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ItoOL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KamathCSW12,
author = {Vinayak Kamath and
Wen Chen and
Nik Sumikawa and
Li{-}C. Wang},
title = {Functional test content optimization for peak-power validation - An
experimental study},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401586},
doi = {10.1109/TEST.2012.6401586},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KamathCSW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeezerCGCKLY12,
author = {David C. Keezer and
Te{-}Hui Chen and
Carl Edward Gray and
Hyun Woo Choi and
Sungyeol Kim and
Seongkwan Lee and
Hosun Yoo},
title = {Multi-gigahertz arbitrary timing generator and data pattern serializer/formatter},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--11},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401544},
doi = {10.1109/TEST.2012.6401544},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeezerCGCKLY12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhareKRRS12,
author = {Animesh Khare and
P. Kishore and
S. Reddy and
K. Rajan and
A. Sanghani},
title = {Methodology for fault grading high speed {I/O} interfaces used in
complex Graphics Processing Unit},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401585},
doi = {10.1109/TEST.2012.6401585},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhareKRRS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KinsmanKN12,
author = {Adam B. Kinsman and
Ho Fai Ko and
Nicola Nicolici},
title = {In-system constrained-random stimuli generation for post-silicon validation},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401541},
doi = {10.1109/TEST.2012.6401541},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KinsmanKN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KohanNJN12,
author = {Somayeh Sadeghi Kohan and
Majid Namaki{-}Shoushtari and
Fatemeh Javaheri and
Zainalabedin Navabi},
title = {{BS} 1149.1 extensions for an online interconnect fault detection
and recovery},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401583},
doi = {10.1109/TEST.2012.6401583},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KohanNJN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KojimaAFAOSW12,
author = {Shoji Kojima and
Yasuyuki Arai and
Tasuku Fujibe and
Tsuyoshi Ataka and
Atsushi Ono and
Ken{-}ichi Sawada and
Daisuke Watanabe},
title = {8Gbps {CMOS} pin electronics hardware macro with simultaneous bi-directional
capability},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401543},
doi = {10.1109/TEST.2012.6401543},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KojimaAFAOSW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuppHCM12,
author = {Nathan Kupp and
Ke Huang and
John M. Carulli Jr. and
Yiorgos Makris},
title = {Spatial estimation of wafer measurement parameters using Gaussian
process models},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401545},
doi = {10.1109/TEST.2012.6401545},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuppHCM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuppM12,
author = {Nathan Kupp and
Yiorgos Makris},
title = {Integrated optimization of semiconductor manufacturing: {A} machine
learning approach},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401531},
doi = {10.1109/TEST.2012.6401531},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuppM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lanier12,
author = {Ken Lanier},
title = {Test/ATE vision 2020 - Entrepreneurship in test {CEO} panel},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401525},
doi = {10.1109/TEST.2012.6401525},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lanier12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeKL12,
author = {Jong Chul Lee and
Faycel Kouteib and
Roman Lysecky},
title = {Event-driven framework for configurable runtime system observability
for {SOC} designs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401554},
doi = {10.1109/TEST.2012.6401554},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeKL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiGH12,
author = {Min Li and
Kelson Gent and
Michael S. Hsiao},
title = {Design validation of {RTL} circuits using evolutionary swarm intelligence},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401556},
doi = {10.1109/TEST.2012.6401556},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiGH12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinHTCS12,
author = {Yu{-}Hsiang Lin and
Shi{-}Yu Huang and
Kun{-}Han Tsai and
Wu{-}Tung Cheng and
Stephen K. Sunter},
title = {A unified method for parametric fault characterization of post-bond
TSVs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401566},
doi = {10.1109/TEST.2012.6401566},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinHTCS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuX12,
author = {Xiao Liu and
Qiang Xu},
title = {On efficient silicon debug with flexible trace interconnection fabric},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401539},
doi = {10.1109/TEST.2012.6401539},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuX12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuX12a,
author = {Yuxi Liu and
Qiang Xu},
title = {On modeling faults in FinFET logic circuits},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401565},
doi = {10.1109/TEST.2012.6401565},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuX12a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ManiatakosMM12,
author = {Michail Maniatakos and
Maria K. Michael and
Yiorgos Makris},
title = {Vulnerability-based Interleaving for Multi-Bit Upset {(MBU)} protection
in modern microprocessors},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401594},
doi = {10.1109/TEST.2012.6401594},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ManiatakosMM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McLaurinFS12,
author = {Teresa L. McLaurin and
Frank Frederick and
Rich Slobodnik},
title = {The {DFT} challenges and solutions for the ARM{\textregistered} Cortex{\texttrademark}-A15
Microprocessor},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401534},
doi = {10.1109/TEST.2012.6401534},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McLaurinFS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MirkhaniAVJE12,
author = {Shahrzad Mirkhani and
Jacob A. Abraham and
Toai Vo and
Hong Shin Jun and
Bill Eklow},
title = {{FALCON:} Rapid statistical fault coverage estimation for complex
designs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401584},
doi = {10.1109/TEST.2012.6401584},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MirkhaniAVJE12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Mirza-AghatabarBG12,
author = {Mohammad Mirza{-}Aghatabar and
Melvin A. Breuer and
Sandeep K. Gupta},
title = {A design flow to maximize yield/area of physical devices via redundancy},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401582},
doi = {10.1109/TEST.2012.6401582},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/Mirza-AghatabarBG12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoonCC12,
author = {Thomas Moon and
Hyun Woo Choi and
Abhijit Chatterjee},
title = {Low cost high-speed test data acquisition: Accurate period estimation
driven signal reconstruction using incoherent subsampling},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401591},
doi = {10.1109/TEST.2012.6401591},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoonCC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoreiraMSN12,
author = {Jose Moreira and
Marc Moessinger and
Koji Sasaki and
Takayuki Nakamura},
title = {Driver sharing challenges for {DDR4} high-volume testing with {ATE}},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401542},
doi = {10.1109/TEST.2012.6401542},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoreiraMSN12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuthyalaT12,
author = {Sreenivaas S. Muthyala and
Nur A. Touba},
title = {Improving test compression by retaining non-pivot free variables in
sequential linear decompressors},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401557},
doi = {10.1109/TEST.2012.6401557},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MuthyalaT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NakajimaYS12,
author = {Takahiro Nakajima and
Takeshi Yaguchi and
Hajime Sugimura},
title = {An {ATE} architecture for implementing very high efficiency concurrent
testing},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401551},
doi = {10.1109/TEST.2012.6401551},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NakajimaYS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nigh12,
author = {Phil Nigh},
title = {How are failure modes, defect types and test methods changing for
32nm/28nm technologies and beyond?},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--4},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401528},
doi = {10.1109/TEST.2012.6401528},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nigh12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NoiaPCL12,
author = {Brandon Noia and
Shreepad Panth and
Krishnendu Chakrabarty and
Sung Kyu Lim},
title = {Scan test of die logic in 3D ICs using {TSV} probing},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401568},
doi = {10.1109/TEST.2012.6401568},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NoiaPCL12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Parker12,
author = {Kenneth P. Parker},
title = {Capacitive sensing testability in complex memory devices},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401570},
doi = {10.1109/TEST.2012.6401570},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Parker12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Portolan12,
author = {Michele Portolan},
title = {Packet-based {JTAG} for remote testing},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401573},
doi = {10.1109/TEST.2012.6401573},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Portolan12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoKYHIMUHSS12,
author = {Yasuo Sato and
Seiji Kajihara and
Tomokazu Yoneda and
Kazumi Hatayama and
Michiko Inoue and
Yukiya Miura and
Satosni Untake and
Takumi Hasegawa and
Motoyuki Sato and
Kotaro Shimamura},
title = {{DART:} Dependable {VLSI} test architecture and its implementation},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401581},
doi = {10.1109/TEST.2012.6401581},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoKYHIMUHSS12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SauerKCPRB12,
author = {Matthias Sauer and
Stefan Kupferschmid and
Alexander Czutro and
Ilia Polian and
Sudhakar M. Reddy and
Bernd Becker},
title = {Functional test of small-delay faults using {SAT} and Craig interpolation},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401550},
doi = {10.1109/TEST.2012.6401550},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SauerKCPRB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SeshadriGLC12,
author = {B. Seshadri and
P. Gupta and
Y. T. Lin and
Bruce Cory},
title = {Systematic defect screening in controlled experiments using volume
diagnosis},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401546},
doi = {10.1109/TEST.2012.6401546},
timestamp = {Thu, 07 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SeshadriGLC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Singh12,
author = {Eshan Singh},
title = {Impact of Radial defect clustering on 3D stacked {IC} yield from wafer
to wafer stacking},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401567},
doi = {10.1109/TEST.2012.6401567},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Singh12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SoleckiTMMR12,
author = {Jedrzej Solecki and
Jerzy Tyszer and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
title = {Low power programmable {PRPG} with enhanced fault coverage gradient},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401559},
doi = {10.1109/TEST.2012.6401559},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SoleckiTMMR12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StellariCSSDBM12,
author = {Franco Stellari and
Thomas Cowell and
Peilin Song and
Michael Sorna and
Zeynep Toprak Deniz and
John F. Bulzacchelli and
Nandita A. Mitra},
title = {Root cause identification of an hard-to-find on-chip power supply
coupling fail},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401563},
doi = {10.1109/TEST.2012.6401563},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StellariCSSDBM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SumikawaTWWA12,
author = {Nik Sumikawa and
Jeff Tikkanen and
Li{-}C. Wang and
LeRoy Winemberg and
Magdy S. Abadir},
title = {Screening customer returns with multivariate test analysis},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401547},
doi = {10.1109/TEST.2012.6401547},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SumikawaTWWA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SumikawaWA12,
author = {Nik Sumikawa and
Li{-}C. Wang and
Magdy S. Abadir},
title = {An experiment of burn-in time reduction based on parametric test analysis},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401595},
doi = {10.1109/TEST.2012.6401595},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SumikawaWA12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TzouBHCC12,
author = {Nicholas Tzou and
Debesh Bhatta and
Sen{-}Wen Hsiao and
Hyun Woo Choi and
Abhijit Chatterjee},
title = {Low-cost wideband periodic signal reconstruction using incoherent
undersampling and back-end cost optimization},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401552},
doi = {10.1109/TEST.2012.6401552},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TzouBHCC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/UedaIGKAI12,
author = {Motoo Ueda and
Shinichi Ishikawa and
Masaru Goishi and
Satoru Kitagawa and
Hiroshi Araki and
Shuichi Inage},
title = {Automated system level functional test program generation on {ATE}
from {EDA} using Functional Test Abstraction},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401590},
doi = {10.1109/TEST.2012.6401590},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/UedaIGKAI12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangCMTC12,
author = {Xian Wang and
Hyun Woo Choi and
Thomas Moon and
Nicholas Tzou and
Abhijit Chatterjee},
title = {Higher than Nyquist test waveform synthesis and digital phase noise
injection using time-interleaved mixed-mode data converters},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401538},
doi = {10.1109/TEST.2012.6401538},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangCMTC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangTGWAPDT12,
author = {Xiaoxiao Wang and
Dat Tran and
Saji George and
LeRoy Winemberg and
Nisar Ahmed and
Steve Palosh and
Allan Dobin and
Mohammad Tehranipoor},
title = {Radic: {A} standard-cell-based sensor for on-chip aging and flip-flop
metastability measurements},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401593},
doi = {10.1109/TEST.2012.6401593},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WangTGWAPDT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WenNMKGTW12,
author = {Xiaoqing Wen and
Y. Nishida and
Kohei Miyase and
Seiji Kajihara and
Patrick Girard and
Mohammad Tehranipoor and
Laung{-}Terng Wang},
title = {On pinpoint capture power management in at-speed scan test generation},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401548},
doi = {10.1109/TEST.2012.6401548},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WenNMKGTW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWNC12,
author = {Peter Wohl and
John A. Waicukauski and
Frederic Neuveux and
Jonathon E. Colburn},
title = {Hybrid selector for high-X scan compression},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401558},
doi = {10.1109/TEST.2012.6401558},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWNC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuCLLWTLCPW12,
author = {Tze{-}Hsin Wu and
Po{-}Yuan Chen and
Mincent Lee and
Bin{-}Yen Lin and
Cheng{-}Wen Wu and
Chen{-}Hung Tien and
Hung{-}Chih Lin and
Hao Chen and
Ching{-}Nen Peng and
Min{-}Jer Wang},
title = {A memory yield improvement scheme combining built-in self-repair and
error correction codes},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401576},
doi = {10.1109/TEST.2012.6401576},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WuCLLWTLCPW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamatoYHI12,
author = {Yuta Yamato and
Tomokazu Yoneda and
Kazumi Hatayama and
Michiko Inoue},
title = {A fast and accurate per-cell dynamic IR-drop estimation method for
at-speed scan test pattern validation},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401549},
doi = {10.1109/TEST.2012.6401549},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamatoYHI12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangLCCTJC12,
author = {Hao{-}Yu Yang and
Chen{-}Wei Lin and
Hung{-}Hsin Chen and
Mango Chia{-}Tso Chao and
Ming{-}Hsien Tu and
Shyh{-}Jye Jou and
Ching{-}Te Chuang},
title = {Testing strategies for a 9T sub-threshold {SRAM}},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401577},
doi = {10.1109/TEST.2012.6401577},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangLCCTJC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YouCLLKCW12,
author = {Yun{-}Chao You and
Che{-}Wei Chou and
Jin{-}Fu Li and
Chih{-}Yen Lo and
Ding{-}Ming Kwai and
Yung{-}Fa Chou and
Cheng{-}Wen Wu},
title = {A built-in self-test scheme for 3D RAMs},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401579},
doi = {10.1109/TEST.2012.6401579},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/YouCLLKCW12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuC12,
author = {Zhongjun Yu and
Degang Chen},
title = {Algorithm for dramatically improved efficiency in {ADC} linearity
test},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401561},
doi = {10.1109/TEST.2012.6401561},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuC12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZordanBDGTVB12,
author = {Leonardo Bonet Zordan and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Aida Todri and
Arnaud Virazel and
Nabil Badereddine},
title = {Low-power SRAMs power mode control logic: Failure analysis and test
solutions},
booktitle = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://doi.org/10.1109/TEST.2012.6401578},
doi = {10.1109/TEST.2012.6401578},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZordanBDGTVB12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2012,
title = {2012 {IEEE} International Test Conference, {ITC} 2012, Anaheim, CA,
USA, November 5-8, 2012},
publisher = {{IEEE} Computer Society},
year = {2012},
url = {https://ieeexplore.ieee.org/xpl/conhome/6387511/proceeding},
isbn = {978-1-4673-1594-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2012.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AcharyyaMTLSFBW11,
author = {Dhruva Acharyya and
Kosuke Miyao and
David Ting and
Daniel Lam and
Robert Smith and
Pete Fitzpatrick and
Brian Buras and
John Williamson},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Architecture and implementation of a truly parallel {ATE} capable
of measuring pico ampere level current},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139133},
doi = {10.1109/TEST.2011.6139133},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AcharyyaMTLSFBW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AmyeenJVPT11,
author = {M. Enamul Amyeen and
Andal Jayalakshmi and
Srikanth Venkataraman and
Sundar V. Pathy and
Ewe C. Tan},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Logic {BIST} silicon debug and volume diagnosis methodology},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139147},
doi = {10.1109/TEST.2011.6139147},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AmyeenJVPT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BahlMKGGAT11,
author = {Swapnil Bahl and
Roberto Mattiuzzo and
Shray Khullar and
Akhil Garg and
S. Graniello and
Khader S. Abdel{-}Hafez and
Salvatore Talluto},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {State of the art low capture power methodology},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139164},
doi = {10.1109/TEST.2011.6139164},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BahlMKGGAT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Balangue11,
author = {Bailarico Balangue},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {In circuit test {(ICT):} The king is dead; long live the king!},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139194},
doi = {10.1109/TEST.2011.6139194},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Balangue11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BanerjeeSDC11,
author = {Aritra Banerjee and
Shreyas Sen and
Shyam Kumar Devarakond and
Abhijit Chatterjee},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Accurate signature driven power conscious tuning of {RF} systems using
hierarchical performance models},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139144},
doi = {10.1109/TEST.2011.6139144},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BanerjeeSDC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BasuMP11,
author = {Kanad Basu and
Prabhat Mishra and
Priyadarsan Patra},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Efficient combination of trace and scan signals for post silicon validation
and debug},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139157},
doi = {10.1109/TEST.2011.6139157},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BasuMP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BhavsarP11,
author = {Dilip K. Bhavsar and
Steve Poehlman},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Test access and the testability features of the Poulson multi-core
Intel Itanium{\textregistered} processor},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139168},
doi = {10.1109/TEST.2011.6139168},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BhavsarP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChakravartyDEH11,
author = {Sreejit Chakravarty and
Binh Dang and
Darcy Escovedo and
A. J. Haas},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Optimal manufacturing flow to determine minumum operating voltage},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139169},
doi = {10.1109/TEST.2011.6139169},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChakravartyDEH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangCZLB11,
author = {Hsiu{-}Ming Chang and
Kwang{-}Ting Cheng and
Wangyang Zhang and
Xin Li and
Kenneth M. Butler},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Test cost reduction through performance prediction using virtual probe},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139129},
doi = {10.1109/TEST.2011.6139129},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangCZLB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangHTY11,
author = {Yi{-}Chung Chang and
Shi{-}Yu Huang and
Chao{-}Wen Tzeng and
Jack T. Yao},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {A fully cell-based design for timing measurement of memory},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139150},
doi = {10.1109/TEST.2011.6139150},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangHTY11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenCWCJC11,
author = {Kuo{-}An Chen and
Tsung{-}Wei Chang and
Meng{-}Chen Wu and
Mango Chia{-}Tso Chao and
Jing{-}Yang Jou and
Sonair Chen},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Design-for-debug layout adjustment for {FIB} probing and circuit editing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139155},
doi = {10.1109/TEST.2011.6139155},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenCWCJC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenDDD11,
author = {Liang{-}Chi Chen and
Peter Dahlgren and
Paul Dickinson and
Scott Davidson},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Transition test bring-up and diagnosis on UltraSPARC\({}^{\mbox{TM}}\)
processors},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139167},
doi = {10.1109/TEST.2011.6139167},
timestamp = {Sat, 09 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenDDD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiMGW11,
author = {Chun{-}Chuan Chi and
Erik Jan Marinissen and
Sandeep Kumar Goel and
Cheng{-}Wen Wu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Post-bond testing of 2.5D-SICs and 3D-SICs containing a passive silicon
interposer base},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139181},
doi = {10.1109/TEST.2011.6139181},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChiMGW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Dally11,
author = {Bill Dally},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Power, programmability, and granularity: The challenges of ExaScale
computing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {12},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139189},
doi = {10.1109/TEST.2011.6139189},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Dally11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevanathanV11,
author = {V. R. Devanathan and
Srinivas Kumar Vooka},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Techniques to improve memory interface test quality for complex SoCs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139172},
doi = {10.1109/TEST.2011.6139172},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevanathanV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DrmanacL11,
author = {Dragoljub Gagi Drmanac and
Michael Laisne},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Wafer probe test cost reduction of an {RF/A} device by automatic testset
minimization - {A} case study},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139143},
doi = {10.1109/TEST.2011.6139143},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DrmanacL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EhrenbergR11,
author = {Heiko Ehrenberg and
Bob Russell},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {{IEEE} Std 1581 - {A} standardized test access methodology for memory
devices},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139141},
doi = {10.1109/TEST.2011.6139141},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EhrenbergR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FonsecaDBGPVB11,
author = {Renan Alves Fonseca and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Nabil Badereddine},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {On using address scrambling to implement defect tolerance in SRAMs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139149},
doi = {10.1109/TEST.2011.6139149},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FonsecaDBGPVB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GattikerN11,
author = {Anne E. Gattiker and
Phil Nigh},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Using well/substrate bias manipulation to enhance voltage-test-based
defect detection},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139153},
doi = {10.1109/TEST.2011.6139153},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GattikerN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoorHK11,
author = {Ad J. van de Goor and
Said Hamdioui and
Halil Kukner},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Generic, orthogonal and low-cost March Element based memory {BIST}},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139148},
doi = {10.1109/TEST.2011.6139148},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoorHK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GotkhindikarDBCN11,
author = {Kapil R. Gotkhindikar and
W. Robert Daasch and
Kenneth M. Butler and
John M. Carulli Jr. and
Amit Nahar},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Die-level adaptive test: Real-time test reordering and elimination},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139173},
doi = {10.1109/TEST.2011.6139173},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GotkhindikarDBCN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gu11,
author = {Xinli Gu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {The gap: Test challenges in Asia manufacturing field},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139195},
doi = {10.1109/TEST.2011.6139195},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gu11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeSRGRRRR11,
author = {Friedrich Hapke and
J{\"{u}}rgen Schl{\"{o}}ffel and
Wilfried Redemund and
Andreas Glowatz and
Janusz Rajski and
Michael Reese and
J. Rearick and
Jason Rivers},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Cell-aware analysis for small-delay effects and production test results
from different fault models},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139151},
doi = {10.1109/TEST.2011.6139151},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HapkeSRGRRRR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IngelssonA11,
author = {Urban Ingelsson and
Bashir M. Al{-}Hashimi},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Investigation into voltage and process variation-aware manufacturing
test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139138},
doi = {10.1109/TEST.2011.6139138},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IngelssonA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IshidaIWKO11,
author = {Masahiro Ishida and
Kiyotaka Ichiyama and
Daisuke Watanabe and
Masayuki Kawabata and
Toshiyuki Okayasu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Real-time testing method for 16 Gbps 4-PAM signal interface},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139160},
doi = {10.1109/TEST.2011.6139160},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IshidaIWKO11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JanickiTDKMMR11,
author = {Jakub Janicki and
Jerzy Tyszer and
Avijit Dutta and
Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {{EDT} channel bandwidth management in SoC designs with pattern-independent
test access mechanism},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139170},
doi = {10.1109/TEST.2011.6139170},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JanickiTDKMMR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KorenSDNPR11,
author = {Ivo Koren and
Ben Schuffenhauer and
Frank Demmerle and
Frank Neugebauer and
Gert Pfahl and
Dirk Rautmann},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Multi-site test of {RF} transceivers on low-cost digital {ATE}},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139142},
doi = {10.1109/TEST.2011.6139142},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KorenSDNPR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrusemanTHDHBX11,
author = {Bram Kruseman and
Bratislav Tasic and
Camelia Hora and
Jos Dohmen and
Hamidreza Hashempour and
Maikel van Beurden and
Yizi Xing},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Defect Oriented Testing for analog/mixed-signal devices},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139127},
doi = {10.1109/TEST.2011.6139127},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrusemanTHDHBX11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunAHMTC11,
author = {Andras Kun and
Ralf Arnold and
Peter Heinrich and
Gwenol{\'{e}} Maugard and
Huaxing Tang and
Wu{-}Tung Cheng},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Deterministic {IDDQ} diagnosis using a net activation based model},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139175},
doi = {10.1109/TEST.2011.6139175},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunAHMTC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinHW11,
author = {Yi{-}Tsung Lin and
Jiun{-}Lang Huang and
Xiaoqing Wen},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Clock-gating-aware low launch {WSA} test pattern generation for at-speed
scan testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139132},
doi = {10.1109/TEST.2011.6139132},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinHW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinT11,
author = {Mitchell Lin and
Tyler Tolman},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Analyzing {ATE} interconnect performance for serial links of 10 Gbps
and above},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139158},
doi = {10.1109/TEST.2011.6139158},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MajidK11,
author = {A. M. Majid and
David C. Keezer},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Multi-function multi-GHz {ATE} extension using state-of-the-art FPGAs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139161},
doi = {10.1109/TEST.2011.6139161},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MajidK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MittalBSPNSP11,
author = {Rajesh Mittal and
Lakshmanan Balasubramanian and
Adesh Sontakke and
Harikrishna Parthasarathy and
Prakash Narayanan and
Puneet Sabbarwal and
Rubin A. Parekhji},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {{DFT} for extremely low cost test of mixed signal SOCs with integrated
{RF} and power management},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139128},
doi = {10.1109/TEST.2011.6139128},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MittalBSPNSP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Moreira11,
author = {Jose Moreira},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Development of an {ATE} test cell for at-speed characterization and
production testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139134},
doi = {10.1109/TEST.2011.6139134},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Moreira11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MumtazIW11,
author = {Abdullah Mumtaz and
Michael E. Imhof and
Hans{-}Joachim Wunderlich},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {{P-PET:} Partial pseudo-exhaustive test for high defect coverage},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139130},
doi = {10.1109/TEST.2011.6139130},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MumtazIW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nigh11,
author = {Phil Nigh},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Industry leaders panel - How will testing change in the next 10 years?},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139192},
doi = {10.1109/TEST.2011.6139192},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nigh11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NoiaC11,
author = {Brandon Noia and
Krishnendu Chakrabarty},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Pre-bond probing of TSVs in 3D stacked ICs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139179},
doi = {10.1109/TEST.2011.6139179},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NoiaC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Okawara11,
author = {Hideo Okawara},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Elegant construction of {SSC} implemented signal by {AWG} and organized
under-sampling of wideband signal},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139159},
doi = {10.1109/TEST.2011.6139159},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Okawara11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PantS11,
author = {Pankaj Pant and
Eric Skeels},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Hardware hooks for transition scan characterization},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139166},
doi = {10.1109/TEST.2011.6139166},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PantS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ParkerKD11,
author = {Kenneth P. Parker and
Shuichi Kameyama and
David Dubberke},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Surviving state disruptions caused by test: {A} case study},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139140},
doi = {10.1109/TEST.2011.6139140},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ParkerKD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RajskiMR11,
author = {Janusz Rajski and
Elham K. Moghaddam and
Sudhakar M. Reddy},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Low power compression utilizing clock-gating},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139145},
doi = {10.1109/TEST.2011.6139145},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RajskiMR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShamshiriGC11,
author = {Saeed Shamshiri and
Amirali Ghofrani and
Kwang{-}Ting Cheng},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {End-to-end error correction and online diagnosis for on-chip networks},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139156},
doi = {10.1109/TEST.2011.6139156},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShamshiriGC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SharmaDCBK11,
author = {Manish Sharma and
Avijit Dutta and
Wu{-}Tung Cheng and
Brady Benware and
Mark Kassab},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {A novel Test Access Mechanism for failure diagnosis of multiple isolated
identical cores},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139171},
doi = {10.1109/TEST.2011.6139171},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SharmaDCBK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShiKHD11,
author = {Yiwen Shi and
Kantapon Kaewtip and
Wan{-}Chan Hu and
Jennifer Dworak},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Partial state monitoring for fault detection estimation},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139146},
doi = {10.1109/TEST.2011.6139146},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShiKHD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Shyu11,
author = {Jyuo{-}Min Shyu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {A systems perspective on the R{\&}D of industrial technology},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {13},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139190},
doi = {10.1109/TEST.2011.6139190},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Shyu11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SmithHJGSDDKMD11,
author = {Ken Smith and
Peter Hanaway and
Mike Jolley and
Reed Gleason and
Eric Strid and
Tom Daenen and
Luc Dupas and
Bruno Knuts and
Erik Jan Marinissen and
Marc Van Dievel},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Evaluation of {TSV} and micro-bump probing for wide {I/O} testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139180},
doi = {10.1109/TEST.2011.6139180},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SmithHJGSDDKMD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SudaniWC11,
author = {Siva Sudani and
Minshun Wu and
Degang Chen},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {A novel robust and accurate spectral testing method for non-coherent
sampling},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139176},
doi = {10.1109/TEST.2011.6139176},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SudaniWC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SumikawaDWWA11,
author = {Nik Sumikawa and
Dragoljub Gagi Drmanac and
Li{-}C. Wang and
LeRoy Winemberg and
Magdy S. Abadir},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Forward prediction based on wafer sort data - {A} case study},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139174},
doi = {10.1109/TEST.2011.6139174},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SumikawaDWWA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterR11,
author = {Stephen K. Sunter and
Aubin Roy},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Adaptive parametric {BIST} of high-speed parallel I/Os via standard
boundary scan},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139165},
doi = {10.1109/TEST.2011.6139165},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TakahashiMO11,
author = {Yasuhiro Takahashi and
Akinori Maeda and
Mitsuhiro Ogura},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Actual implementation of multi domain test: Further reduction of cost
of test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139135},
doi = {10.1109/TEST.2011.6139135},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TakahashiMO11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TamB11,
author = {Wing Chiu Tam and
R. D. (Shawn) Blanton},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Physically-aware analysis of systematic defects in integrated circuits},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139137},
doi = {10.1109/TEST.2011.6139137},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TamB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TheodorouKPG11,
author = {George Theodorou and
Nektarios Kranitis and
Antonis M. Paschalis and
Dimitris Gizopoulos},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {A Software-Based Self-Test methodology for on-line testing of processor
caches},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139154},
doi = {10.1109/TEST.2011.6139154},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TheodorouKPG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VijayakumarSK11,
author = {Priyamvada Vijayakumar and
Vikram B. Suresh and
Sandip Kundu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Lithography aware critical area estimation and yield analysis},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139152},
doi = {10.1109/TEST.2011.6139152},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VijayakumarSK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WenHTLLCTTL11,
author = {Jen{-}Yang Wen and
Yu{-}Chuan Huang and
Min{-}Hong Tsai and
Kuan{-}Yu Liao and
James Chien{-}Mo Li and
Ming{-}Tung Chang and
Min{-}Hsiu Tsai and
Chih{-}Mou Tseng and
Hung{-}Chun Li},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Test clock domain optimization for peak power supply noise reduction
during scan},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139163},
doi = {10.1109/TEST.2011.6139163},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WenHTLLCTTL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamaguchiSAFDAAK11,
author = {Takahiro J. Yamaguchi and
Mani Soma and
Takafumi Aoki and
Yasuo Furukawa and
Katsuhiko Degawa and
Kunihiro Asada and
Mohamed Abbas and
Satoshi Komatsu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Application of a continuous-time level crossing quantization method
for timing noise measurements},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139177},
doi = {10.1109/TEST.2011.6139177},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamaguchiSAFDAAK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamatoWKMKW11,
author = {Yuta Yamato and
Xiaoqing Wen and
Michael A. Kochte and
Kohei Miyase and
Seiji Kajihara and
Laung{-}Terng Wang},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {A novel scan segmentation design method for avoiding shift timing
failure in scan testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139162},
doi = {10.1109/TEST.2011.6139162},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamatoWKMKW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YanL11,
author = {Guihai Yan and
Xiaowei Li},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Online timing variation tolerance for digital integrated circuits},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139136},
doi = {10.1109/TEST.2011.6139136},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YanL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YilmazOB11,
author = {Ender Yilmaz and
Sule Ozev and
Kenneth M. Butler},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Adaptive multidimensional outlier analysis for analog and mixed signal
circuits},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139178},
doi = {10.1109/TEST.2011.6139178},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YilmazOB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YonedaHIF11,
author = {Tomokazu Yoneda and
Keigo Hori and
Michiko Inoue and
Hideo Fujiwara},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Faster-than-at-speed test for increased test quality and in-field
reliability},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139131},
doi = {10.1109/TEST.2011.6139131},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YonedaHIF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Zeng11,
author = {Jing Zeng},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Challenges and best practices in advanced silicon debug},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139193},
doi = {10.1109/TEST.2011.6139193},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Zeng11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangCWWG11,
author = {Zhaobo Zhang and
Krishnendu Chakrabarty and
Zhanglei Wang and
Zhiyuan Wang and
Xinli Gu},
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {Smart diagnosis: Efficient board-level diagnosis and repair using
artificial neural networks},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://doi.org/10.1109/TEST.2011.6139139},
doi = {10.1109/TEST.2011.6139139},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangCWWG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2011,
editor = {Bill Eklow and
R. D. (Shawn) Blanton},
title = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
USA, September 20-22, 2011},
publisher = {{IEEE} Computer Society},
year = {2011},
url = {https://ieeexplore.ieee.org/xpl/conhome/6132473/proceeding},
isbn = {978-1-4577-0153-5},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2011.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Abdul-AzizT10,
author = {Mohammed A. Abdul{-}Aziz and
Mehdi Baradaran Tahoori},
editor = {Ron Press and
Erik H. Volkerink},
title = {Soft error reliability aware placement and routing for FPGAs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {753--761},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699279},
doi = {10.1109/TEST.2010.5699279},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Abdul-AzizT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AcharyyaAP10,
author = {Dhruva Acharyya and
Kanak Agarwal and
Jim Plusquellic},
editor = {Ron Press and
Erik H. Volkerink},
title = {Leveraging existing power control circuits and power delivery architecture
for variability measurement},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {645--653},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699268},
doi = {10.1109/TEST.2010.5699268},
timestamp = {Tue, 04 Jun 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AcharyyaAP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Al-GayemLRBK10,
author = {Qais Al{-}Gayem and
Hongyuan Liu and
Andrew Richardson and
Nick Burd and
M. Kumar},
editor = {Ron Press and
Erik H. Volkerink},
title = {An on-line monitoring technique for electrode degradation in bio-fluidic
microsystems},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {654--663},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699269},
doi = {10.1109/TEST.2010.5699269},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Al-GayemLRBK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AmatiBSF10,
author = {Luca Amati and
Cristiana Bolchini and
Fabio Salice and
Federico Franzoso},
editor = {Ron Press and
Erik H. Volkerink},
title = {Improving fault diagnosis accuracy by automatic test set modification},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {477--484},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699250},
doi = {10.1109/TEST.2010.5699250},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AmatiBSF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AouiniCR10,
author = {Sadok Aouini and
Kun Chuai and
Gordon W. Roberts},
editor = {Ron Press and
Erik H. Volkerink},
title = {A low-cost {ATE} phase signal generation technique for test applications},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {29--38},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699202},
doi = {10.1109/TEST.2010.5699202},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AouiniCR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AsamiKI10,
author = {Koji Asami and
Toshiaki Kurihara and
Yushi Inada},
editor = {Ron Press and
Erik H. Volkerink},
title = {Evaluation techniques of frequency-dependent {I/Q} imbalances in wideband
quadrature mixers},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {229--236},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699223},
doi = {10.1109/TEST.2010.5699223},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AsamiKI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AsamiMKTK10,
author = {Koji Asami and
Hiroyuki Miyajima and
Tsuyoshi Kurosawa and
Takenori Tateiwa and
Haruo Kobayashi},
editor = {Ron Press and
Erik H. Volkerink},
title = {Timing skew compensation technique using digital filter with novel
linear phase condition},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {334--342},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699234},
doi = {10.1109/TEST.2010.5699234},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AsamiMKTK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BasharapandiyanC10,
author = {Suri Basharapandiyan and
Yi Cai},
editor = {Ron Press and
Erik H. Volkerink},
title = {Practical active compensation techniques for {ATE} power supply response
for testing of mixed signal data storage SOCs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {599--605},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699263},
doi = {10.1109/TEST.2010.5699263},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BasharapandiyanC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BernardiGRZ10,
author = {Paolo Bernardi and
Michelangelo Grosso and
Matteo Sonza Reorda and
Y. Zhang},
editor = {Ron Press and
Erik H. Volkerink},
title = {A programmable {BIST} for {DRAM} testing and diagnosis},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {447--456},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699247},
doi = {10.1109/TEST.2010.5699247},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BernardiGRZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrascaBRBSB10,
author = {Lyl M. Ciganda Brasca and
Paolo Bernardi and
Matteo Sonza Reorda and
Dimitri Barbieri and
Maurizio Straiotto and
Luciano Bonaria},
editor = {Ron Press and
Erik H. Volkerink},
title = {A tester architecture suitable for {MEMS} calibration and testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {806},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699298},
doi = {10.1109/TEST.2010.5699298},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrascaBRBSB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CaiWWN10,
author = {X. Cai and
Peter Wohl and
John A. Waicukauski and
Pramod Notiyath},
editor = {Ron Press and
Erik H. Volkerink},
title = {Highly efficient parallel {ATPG} based on shared memory},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {353--359},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699236},
doi = {10.1109/TEST.2010.5699236},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CaiWWN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangWB10,
author = {Po{-}Hsien Chang and
Li{-}C. Wang and
Jayanta Bhadra},
editor = {Ron Press and
Erik H. Volkerink},
title = {A kernel-based approach for functional test program generation},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {164--173},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699216},
doi = {10.1109/TEST.2010.5699216},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangWB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenBWZDM10,
author = {Janine Chen and
Brendon Bolin and
Li{-}C. Wang and
Jing Zeng and
Dragoljub Gagi Drmanac and
Michael Mateja},
editor = {Ron Press and
Erik H. Volkerink},
title = {Mining {AC} delay measurements for understanding speed-limiting paths},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {553--562},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699258},
doi = {10.1109/TEST.2010.5699258},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenBWZDM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenWCRT10,
author = {Tsung{-}Tang Chen and
Po{-}Han Wu and
Kung{-}Han Chen and
Jiann{-}Chyi Rau and
Shih{-}Ming Tzeng},
editor = {Ron Press and
Erik H. Volkerink},
title = {The AB-filling methodology for power-aware at-speed scan testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {807},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699299},
doi = {10.1109/TEST.2010.5699299},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenWCRT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChoSRM10,
author = {Minki Cho and
Nikhil Sathe and
Arijit Raychowdhury and
Saibal Mukhopadhyay},
editor = {Ron Press and
Erik H. Volkerink},
title = {Optimization of burn-in test for many-core processors through adaptive
spatiotemporal power migration},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {59--68},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699205},
doi = {10.1109/TEST.2010.5699205},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChoSRM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChungG10,
author = {Kun Young Chung and
Sandeep K. Gupta},
editor = {Ron Press and
Erik H. Volkerink},
title = {Design and test of latch-based circuits to maximize performance, yield,
and delay test quality},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {94--103},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699209},
doi = {10.1109/TEST.2010.5699209},
timestamp = {Fri, 22 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChungG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ClarkDPT10,
author = {C. J. Clark and
Dave Dubberke and
Kenneth P. Parker and
Bill Tuthill},
editor = {Ron Press and
Erik H. Volkerink},
title = {Solutions for undetected shorts on {IEEE} 1149.1 self-monitoring pins},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {563--570},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699259},
doi = {10.1109/TEST.2010.5699259},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ClarkDPT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CraftsBCFFHKSTW10,
author = {James Crafts and
David Bogdan and
Dennis Conti and
Donato O. Forlenza and
Orazio P. Forlenza and
William V. Huott and
Mary P. Kusko and
Edward Seymour and
Timothy Taylor and
Brian Walsh},
editor = {Ron Press and
Erik H. Volkerink},
title = {Testing the {IBM} Power 7{\texttrademark} 4 GHz eight core microprocessor},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {49--58},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699204},
doi = {10.1109/TEST.2010.5699204},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CraftsBCFFHKSTW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Czamara10,
author = {Al Czamara},
editor = {Ron Press and
Erik H. Volkerink},
title = {AXIe{\textregistered}: Open architecture test system standard},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {801},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699293},
doi = {10.1109/TEST.2010.5699293},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Czamara10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CzyszMMRST10,
author = {Dariusz Czysz and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Przemyslaw Szczerbicki and
Jerzy Tyszer},
editor = {Ron Press and
Erik H. Volkerink},
title = {Low power compression of incompatible test cubes},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {704--713},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699274},
doi = {10.1109/TEST.2010.5699274},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CzyszMMRST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DattaT10,
author = {Rudrajit Datta and
Nur A. Touba},
editor = {Ron Press and
Erik H. Volkerink},
title = {Post-manufacturing {ECC} customization based on Orthogonal Latin Square
codes and its application to ultra-low power caches},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {212--218},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699221},
doi = {10.1109/TEST.2010.5699221},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DattaT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DengCBK10,
author = {Shujun Deng and
Kwang{-}Ting Cheng and
Jinian Bian and
Zhiqiu Kong},
editor = {Ron Press and
Erik H. Volkerink},
title = {Mutation-based diagnostic test generation for hardware design error
diagnosis},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {815},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699307},
doi = {10.1109/TEST.2010.5699307},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DengCBK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DesineniPKR10,
author = {Rao Desineni and
Leah Pastel and
Maroun Kassab and
Robert Redburn},
editor = {Ron Press and
Erik H. Volkerink},
title = {Hard to find, easy to find systematics; just find them},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {388--397},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699240},
doi = {10.1109/TEST.2010.5699240},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DesineniPKR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevanathanHKS10,
author = {V. R. Devanathan and
Alan Hales and
Sumant Kale and
Dharmesh Sonkar},
editor = {Ron Press and
Erik H. Volkerink},
title = {Towards effective and compression-friendly test of memory interface
logic},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {124--133},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699212},
doi = {10.1109/TEST.2010.5699212},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevanathanHKS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Devta-PrasannaG10,
author = {Narendra Devta{-}Prasanna and
Arun Gunda},
editor = {Ron Press and
Erik H. Volkerink},
title = {Clock Gate Test Points},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {84--93},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699208},
doi = {10.1109/TEST.2010.5699208},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Devta-PrasannaG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Devta-PrasannaGRP10,
author = {Narendra Devta{-}Prasanna and
Arun Gunda and
Sudhakar M. Reddy and
Irith Pomeranz},
editor = {Ron Press and
Erik H. Volkerink},
title = {Multiple fault activation cycle tests for transistor stuck-open faults},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {821},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699313},
doi = {10.1109/TEST.2010.5699313},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Devta-PrasannaGRP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DrappaHV10,
author = {Anke Drappa and
Peter Huber and
Jon Vollmar},
editor = {Ron Press and
Erik H. Volkerink},
title = {Automated test program generation for automotive devices},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699253},
doi = {10.1109/TEST.2010.5699253},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DrappaHV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuanJC10,
author = {Jingbo Duan and
Le Jin and
Degang Chen},
editor = {Ron Press and
Erik H. Volkerink},
title = {A new method for estimating spectral performance of {ADC} from {INL}},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {694--703},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699273},
doi = {10.1109/TEST.2010.5699273},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuanJC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FoutrisPGAVG10,
author = {Nikos Foutris and
Mihalis Psarakis and
Dimitris Gizopoulos and
Andreas Apostolakis and
Xavier Vera and
Antonio Gonz{\'{a}}lez},
editor = {Ron Press and
Erik H. Volkerink},
title = {{MT-SBST:} Self-test optimization in multithreaded multicore architectures},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {734--743},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699277},
doi = {10.1109/TEST.2010.5699277},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FoutrisPGAVG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GalliereRGD10,
author = {Jean{-}Marc Galli{\`{e}}re and
Paolo Rech and
Patrick Girard and
Luigi Dilillo},
editor = {Ron Press and
Erik H. Volkerink},
title = {A roaming memory test bench for detecting particle induced SEUs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {810},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699302},
doi = {10.1109/TEST.2010.5699302},
timestamp = {Fri, 19 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/GalliereRGD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeRSKGWHE10,
author = {Friedrich Hapke and
Wilfried Redemund and
J{\"{u}}rgen Schl{\"{o}}ffel and
Rene Krenz{-}Baath and
Andreas Glowatz and
Michael Wittke and
Hamidreza Hashempour and
Stefan Eichenberger},
editor = {Ron Press and
Erik H. Volkerink},
title = {Defect-oriented cell-internal testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {285--294},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699229},
doi = {10.1109/TEST.2010.5699229},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HapkeRSKGWHE10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeLLL10,
author = {Zijian He and
Tao Lv and
Huawei Li and
Xiaowei Li},
editor = {Ron Press and
Erik H. Volkerink},
title = {On generation of a universal path candidate set containing testable
long paths},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {816},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699308},
doi = {10.1109/TEST.2010.5699308},
timestamp = {Thu, 11 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HeLLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeMJPH10,
author = {Xin He and
Yashwant K. Malaiya and
Anura P. Jayasumana and
Kenneth P. Parker and
Stephen Hird},
editor = {Ron Press and
Erik H. Volkerink},
title = {Principal Component Analysis-based compensation for measurement errors
due to mechanical misalignments in {PCB} testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {467--476},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699249},
doi = {10.1109/TEST.2010.5699249},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HeMJPH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HongLPMLKHNGM10,
author = {Ted Hong and
Yanjing Li and
Sung{-}Boem Park and
Diana Mui and
David Lin and
Ziyad Abdel Kaleq and
Nagib Hakim and
Helia Naeimi and
Donald S. Gardner and
Subhasish Mitra},
editor = {Ron Press and
Erik H. Volkerink},
title = {{QED:} Quick Error Detection tests for effective post-silicon validation},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {154--163},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699215},
doi = {10.1109/TEST.2010.5699215},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HongLPMLKHNGM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangBCTKC10,
author = {Yu Huang and
Brady Benware and
Wu{-}Tung Cheng and
Ting{-}Pu Tai and
Feng{-}Ming Kuo and
Yuan{-}Shih Chen},
editor = {Ron Press and
Erik H. Volkerink},
title = {Case study of scan chain diagnosis and {PFA} on a low yield wafer},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {818},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699310},
doi = {10.1109/TEST.2010.5699310},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangBCTKC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IrobiAH10,
author = {Sandra Irobi and
Zaid Al{-}Ars and
Said Hamdioui},
editor = {Ron Press and
Erik H. Volkerink},
title = {Detecting memory faults in the presence of bit line coupling in {SRAM}
devices},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {437--446},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699246},
doi = {10.1109/TEST.2010.5699246},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IrobiAH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IversonDMNST10,
author = {David Iverson and
Dan Dickinson and
John Masson and
Christina Newman{-}LaBounty and
Daniel Simmons and
William Tanona},
editor = {Ron Press and
Erik H. Volkerink},
title = {Redundant core testing on the cell {BE} microprocessor},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {68--73},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699206},
doi = {10.1109/TEST.2010.5699206},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IversonDMNST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JiangLDXX10,
author = {Li Jiang and
Yuxi Liu and
Lian Duan and
Yuan Xie and
Qiang Xu},
editor = {Ron Press and
Erik H. Volkerink},
title = {Modeling {TSV} open defects in 3D-stacked {DRAM}},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {174--182},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699217},
doi = {10.1109/TEST.2010.5699217},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JiangLDXX10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KandalaftBR10,
author = {Nabeeh Kandalaft and
Iftekhar Ibne Basith and
Rashid Rashidzadeh},
editor = {Ron Press and
Erik H. Volkerink},
title = {A {MEMS} based device interface board},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {804},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699296},
doi = {10.1109/TEST.2010.5699296},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KandalaftBR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KannanKSTAFM10,
author = {Sukeshwar Kannan and
Bruce C. Kim and
Ganesh Srinivasan and
Friedrich Taenzlar and
Richard Antley and
Craig Force and
Falah Mohammed},
editor = {Ron Press and
Erik H. Volkerink},
title = {RADPro: Automatic {RF} analyzer and diagnostic program generation
tool},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {325--333},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699233},
doi = {10.1109/TEST.2010.5699233},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KannanKSTAFM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KaramatiN10,
author = {Sara Karamati and
Zainalabedin Navabi},
editor = {Ron Press and
Erik H. Volkerink},
title = {Using context based methods for test data compression},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {809},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699301},
doi = {10.1109/TEST.2010.5699301},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KaramatiN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KarandjeffH10,
author = {Carl Karandjeff and
Chris Hannaford},
editor = {Ron Press and
Erik H. Volkerink},
title = {Precision audio nulling instrumentation achieves near -140dB measurements
in a production environment},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {589--598},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699262},
doi = {10.1109/TEST.2010.5699262},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KarandjeffH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KassabMMRJT10,
author = {Mark Kassab and
Grzegorz Mrugalski and
Nilanjan Mukherjee and
Janusz Rajski and
Jakub Janicki and
Jerzy Tyszer},
editor = {Ron Press and
Erik H. Volkerink},
title = {Dynamic channel allocation for higher {EDT} compression in SoC designs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {265--274},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699227},
doi = {10.1109/TEST.2010.5699227},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KassabMMRJT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KawachiI10,
author = {Tomohiro Kawachi and
Koichi Irie},
editor = {Ron Press and
Erik H. Volkerink},
title = {{ADC} linearity testing method with single analog monitoring port},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {419--426},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699244},
doi = {10.1109/TEST.2010.5699244},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KawachiI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KellerCFCMSILG10,
author = {Brion L. Keller and
Krishna Chakravadhanula and
Brian Foutz and
Vivek Chickermane and
R. Malneedi and
Thomas J. Snethen and
Vikram Iyengar and
David E. Lackey and
Gary Grise},
editor = {Ron Press and
Erik H. Volkerink},
title = {Low cost at-speed testing using On-Product Clock Generation compatible
with test compression},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {724--733},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699276},
doi = {10.1109/TEST.2010.5699276},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KellerCFCMSILG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KhursheedZAAK10,
author = {S. Saqib Khursheed and
Shida Zhong and
Robert C. Aitken and
Bashir M. Al{-}Hashimi and
Sandip Kundu},
editor = {Ron Press and
Erik H. Volkerink},
title = {Modeling the impact of process variation on resistive bridge defects},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {295--304},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699230},
doi = {10.1109/TEST.2010.5699230},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KhursheedZAAK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimishimaMSTNSHON10,
author = {Masayuki Kimishima and
S. Mizuno and
T. Seki and
H. Takeuti and
Haruki Nagami and
Hideki Shirasu and
Y. Haraguti and
J. Okayasu and
M. Nakanishi},
editor = {Ron Press and
Erik H. Volkerink},
title = {A high density small size {RF} test module for high throughput multiple
resource testing},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {315--324},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699232},
doi = {10.1109/TEST.2010.5699232},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimishimaMSTNSHON10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KingerNS10,
author = {Rakesh Kinger and
Swetha Narasimhawsamy and
Stephen K. Sunter},
editor = {Ron Press and
Erik H. Volkerink},
title = {Experiences with parametric {BIST} for production testing PLLs with
picosecond precision},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {410--418},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699243},
doi = {10.1109/TEST.2010.5699243},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KingerNS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoN10,
author = {Ho Fai Ko and
Nicola Nicolici},
editor = {Ron Press and
Erik H. Volkerink},
title = {Automated trace signals selection using the {RTL} descriptions},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {144--153},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699214},
doi = {10.1109/TEST.2010.5699214},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KochteZBIWHCP10,
author = {Michael A. Kochte and
Christian G. Zoellin and
Rafal Baranowski and
Michael E. Imhof and
Hans{-}Joachim Wunderlich and
Nadereh Hatami and
Stefano Di Carlo and
Paolo Prinetto},
editor = {Ron Press and
Erik H. Volkerink},
title = {System reliability evaluation using concurrent multi-level simulation
of structural faults},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {817},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699309},
doi = {10.1109/TEST.2010.5699309},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KochteZBIWHCP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KohnoAKI10,
author = {Jun Kohno and
Tatsuro Akiyama and
Dai Kato and
Makoto Imamura},
editor = {Ron Press and
Erik H. Volkerink},
title = {A high linearity compact timing vernier for {CMOS} timing generator},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699174},
doi = {10.1109/TEST.2010.5699174},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KohnoAKI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuppHDM10,
author = {Nathan Kupp and
He Huang and
Petros Drineas and
Yiorgos Makris},
editor = {Ron Press and
Erik H. Volkerink},
title = {Post-production performance calibration in analog/RF devices},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {245--254},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699225},
doi = {10.1109/TEST.2010.5699225},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuppHDM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lee10,
author = {Kelly Lee},
editor = {Ron Press and
Erik H. Volkerink},
title = {A practical scan re-use scheme for system test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {814},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699306},
doi = {10.1109/TEST.2010.5699306},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lee10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiXHCL10,
author = {Huawei Li and
Dawen Xu and
Yinhe Han and
Kwang{-}Ting Cheng and
Xiaowei Li},
editor = {Ron Press and
Erik H. Volkerink},
title = {nGFSIM : {A} GPU-based fault simulator for 1-to-n detection and its
applications},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {343--352},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699235},
doi = {10.1109/TEST.2010.5699235},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiXHCL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinCYCH10,
author = {Chen{-}Wei Lin and
Hung{-}Hsin Chen and
Hao{-}Yu Yang and
Mango Chia{-}Tso Chao and
Rei{-}Fu Huang},
editor = {Ron Press and
Erik H. Volkerink},
title = {Fault models and test methods for subthreshold SRAMs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {427--436},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699245},
doi = {10.1109/TEST.2010.5699245},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinCYCH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LuoLCFC10,
author = {Tseng{-}Chin Luo and
Eric Leong and
Mango Chia{-}Tso Chao and
Philip A. Fisher and
Wen{-}Hsiang Chang},
editor = {Ron Press and
Erik H. Volkerink},
title = {Mask versus Schematic - an enhanced design-verification flow for first
silicon success},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {369--377},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699238},
doi = {10.1109/TEST.2010.5699238},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LuoLCFC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lyons10,
author = {Timothy Daniel Lyons},
editor = {Ron Press and
Erik H. Volkerink},
title = {Complete testing of receiver jitter tolerance},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {9--18},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699175},
doi = {10.1109/TEST.2010.5699175},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lyons10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MajzoobiDEK10,
author = {Mehrdad Majzoobi and
Eva L. Dyer and
Ahmed Elnably and
Farinaz Koushanfar},
editor = {Ron Press and
Erik H. Volkerink},
title = {Rapid {FPGA} delay characterization using clock synthesis and sparse
sampling},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {457--466},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699248},
doi = {10.1109/TEST.2010.5699248},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MajzoobiDEK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaliukSHM10,
author = {Dzmitry Maliuk and
Haralampos{-}G. D. Stratigopoulos and
He Huang and
Yiorgos Makris},
editor = {Ron Press and
Erik H. Volkerink},
title = {Analog neural network design for {RF} built-in self-test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {684--693},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699272},
doi = {10.1109/TEST.2010.5699272},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaliukSHM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MannathWMCKGS10,
author = {Deepa Mannath and
Dallas Webster and
Victor Monta{\~{n}}o{-}Martinez and
David Cohen and
Shai Kush and
Ganesan Thiagarajan and
Adesh Sontakke},
editor = {Ron Press and
Erik H. Volkerink},
title = {Structural approach for built-in tests in {RF} devices},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {398--404},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699241},
doi = {10.1109/TEST.2010.5699241},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MannathWMCKGS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoghaddamRRLMK10,
author = {Elham K. Moghaddam and
Janusz Rajski and
Sudhakar M. Reddy and
Xijiang Lin and
Nilanjan Mukherjee and
Mark Kassab},
editor = {Ron Press and
Erik H. Volkerink},
title = {Low capture power at-speed test in {EDT} environment},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {714--723},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699275},
doi = {10.1109/TEST.2010.5699275},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoghaddamRRLMK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MorrisEPSPF10,
author = {Devin Morris and
William R. Eisenstadt and
Andrea Paganini and
Mustapha Slamani and
Timothy Platt and
John Ferrario},
editor = {Ron Press and
Erik H. Volkerink},
title = {Synthetic {DSP} approach for novel FPGA-based measurement of error
vector magnitude},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {237--244},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699224},
doi = {10.1109/TEST.2010.5699224},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MorrisEPSPF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NatarajanKCG10,
author = {Suriyaprakash Natarajan and
Arun Krishnamachary and
Eli Chiprout and
Rajesh Galivanche},
editor = {Ron Press and
Erik H. Volkerink},
title = {Path coverage based functional test generation for processor marginality
validation},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {544--552},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699257},
doi = {10.1109/TEST.2010.5699257},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NatarajanKCG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NelsonTB10,
author = {Jeffrey E. Nelson and
Wing Chiu Tam and
Ronald D. Blanton},
editor = {Ron Press and
Erik H. Volkerink},
title = {Automatic classification of bridge defects},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {305--314},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699231},
doi = {10.1109/TEST.2010.5699231},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NelsonTB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NoiaCM10,
author = {Brandon Noia and
Krishnendu Chakrabarty and
Erik Jan Marinissen},
editor = {Ron Press and
Erik H. Volkerink},
title = {Optimization methods for post-bond die-internal/external testing in
3D stacked ICs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {193--201},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699219},
doi = {10.1109/TEST.2010.5699219},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NoiaCM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NomuraSS10,
author = {Shuou Nomura and
Karthikeyan Sankaralingam and
Ranganathan Sankaralingam},
editor = {Ron Press and
Erik H. Volkerink},
title = {A fast and highly accurate path delay emulation framework for logic-emulation
of timing speculation},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {635--644},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699267},
doi = {10.1109/TEST.2010.5699267},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NomuraSS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OReillyKWP10,
author = {Jim O'Reilly and
Ajay Khoche and
Ernst Wahl and
Bruce R. Parnas},
editor = {Ron Press and
Erik H. Volkerink},
title = {{STIL} {P1450.4:} {A} standard for test flow specification},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {506--515},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699254},
doi = {10.1109/TEST.2010.5699254},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OReillyKWP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ObienOF10,
author = {Marie Engelene J. Obien and
Satoshi Ohtake and
Hideo Fujiwara},
editor = {Ron Press and
Erik H. Volkerink},
title = {Constrained {ATPG} for functional {RTL} circuits using F-Scan},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {615--624},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699265},
doi = {10.1109/TEST.2010.5699265},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ObienOF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PantZCFY10,
author = {Pankaj Pant and
Joshua Zelman and
Glenn Col{\'{o}}n{-}Bonet and
Jennifer Flint and
Steve Yurash},
editor = {Ron Press and
Erik H. Volkerink},
title = {Lessons from at-speed scan deployment on an Intel{\textregistered}
Itanium{\textregistered} microprocessor},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {526--535},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699256},
doi = {10.1109/TEST.2010.5699256},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PantZCFY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Parker10,
author = {Kenneth P. Parker},
editor = {Ron Press and
Erik H. Volkerink},
title = {Surviving state disruptions caused by test: The "Lobotomy Problem"},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {571--578},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699260},
doi = {10.1109/TEST.2010.5699260},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Parker10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PortolanTG10,
author = {Michele Portolan and
Bradford G. Van Treuren and
Suresh Goyal},
editor = {Ron Press and
Erik H. Volkerink},
title = {Scan chain securization though Open-Circuit Deadlocks},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {808},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699300},
doi = {10.1109/TEST.2010.5699300},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PortolanTG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PuligundlaSCT10,
author = {Sudeep Puligundla and
Fulvio Spagna and
Lidong Chen and
Amanda Tran},
editor = {Ron Press and
Erik H. Volkerink},
title = {Validating the performance of a 32nm {CMOS} high speed serial link
receiver with adaptive equalization and baud-rate clock data recovery},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {405--409},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699242},
doi = {10.1109/TEST.2010.5699242},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PuligundlaSCT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ReinosaABM10,
author = {Rosa D. Reinosa and
Aileen Allen and
Elizabeth Benedetto and
Alan Mcallister},
editor = {Ron Press and
Erik H. Volkerink},
title = {Characterizing mechanical performance of Board Level Interconnects
for In-Circuit Test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {495--505},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699252},
doi = {10.1109/TEST.2010.5699252},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ReinosaABM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RobertazziMSMGLW10,
author = {Raphael Robertazzi and
Louis Medina and
Ernesto Shiling and
Garry Moore and
Ronald Geiger and
Jiun{-}Hsin Liao and
John Williamson},
editor = {Ron Press and
Erik H. Volkerink},
title = {New tools and methodology for advanced parametric and defect structure
test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {19--28},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699201},
doi = {10.1109/TEST.2010.5699201},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RobertazziMSMGLW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RodriguesKK10,
author = {Rance Rodrigues and
Sandip Kundu and
Omer Khan},
editor = {Ron Press and
Erik H. Volkerink},
title = {Shadow checker {(SC):} {A} low-cost hardware scheme for online detection
of faults in small memory structures of a microprocessor},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {219--228},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699222},
doi = {10.1109/TEST.2010.5699222},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RodriguesKK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SanyalCYF10,
author = {Alodeep Sanyal and
Krishnendu Chakrabarty and
Mahmut Yilmaz and
Hideo Fujiwara},
editor = {Ron Press and
Erik H. Volkerink},
title = {RT-level design-for-testability and expansion of functional test sequences
for enhanced defect coverage},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {625--634},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699266},
doi = {10.1109/TEST.2010.5699266},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SanyalCYF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShamshiriC10,
author = {Saeed Shamshiri and
Kwang{-}Ting Cheng},
editor = {Ron Press and
Erik H. Volkerink},
title = {Error-locality-aware linear coding to correct multi-bit upsets in
SRAMs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {202--211},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699220},
doi = {10.1109/TEST.2010.5699220},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShamshiriC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinanogluA10,
author = {Ozgur Sinanoglu and
Sobeeh Almukhaizim},
editor = {Ron Press and
Erik H. Volkerink},
title = {Predictive analysis for projecting test compression levels},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {275--284},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699228},
doi = {10.1109/TEST.2010.5699228},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinanogluA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SinghSRN10,
author = {Abhay Singh and
Milan Shetty and
Srivaths Ravi and
Ravindra Nibandhe},
editor = {Ron Press and
Erik H. Volkerink},
title = {Methodology for early and accurate test power estimation at {RTL}},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {813},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699305},
doi = {10.1109/TEST.2010.5699305},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SinghSRN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SongSK10,
author = {Ki{-}Jae Song and
Hunkyo Seo and
Sang{-}hyun Ko},
editor = {Ron Press and
Erik H. Volkerink},
title = {Package test interface fixture considering low cost solution, high
electrical performance, and compatibility with fine pitch packages},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {606--614},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699264},
doi = {10.1109/TEST.2010.5699264},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SongSK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SootkaneungS10,
author = {Warin Sootkaneung and
Kewal K. Saluja},
editor = {Ron Press and
Erik H. Volkerink},
title = {On techniques for handling soft errors in digital circuits},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {744--752},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699278},
doi = {10.1109/TEST.2010.5699278},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SootkaneungS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Spargo10,
author = {Kenneth Spargo},
editor = {Ron Press and
Erik H. Volkerink},
title = {AXIe{\textregistered} 2.0 and {MVP-C:} Open {ATE} software standards},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {802},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699294},
doi = {10.1109/TEST.2010.5699294},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Spargo10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SrivastavaPS10,
author = {Ankush Srivastava and
Ajay Prajapati and
Vinay Soni},
editor = {Ron Press and
Erik H. Volkerink},
title = {A novel approach to improve test coverage of {BSR} cells},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {803},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699295},
doi = {10.1109/TEST.2010.5699295},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SrivastavaPS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunterT10,
author = {Stephen K. Sunter and
Matthias Tilmann},
editor = {Ron Press and
Erik H. Volkerink},
title = {{BIST} of {I/O} circuit parameters via standard boundary scan},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {74--83},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699207},
doi = {10.1109/TEST.2010.5699207},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunterT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TamPB10,
author = {Wing Chiu Tam and
Osei Poku and
Ronald D. Blanton},
editor = {Ron Press and
Erik H. Volkerink},
title = {Systematic defect identification through layout snippet clustering},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {378--387},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699239},
doi = {10.1109/TEST.2010.5699239},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TamPB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TammaliKST10,
author = {Sarveswara Tammali and
Vishal Khatri and
Gowrysankar Shanmugam and
Mark Terry},
editor = {Ron Press and
Erik H. Volkerink},
title = {{DFM} aware bridge pair extraction for manufacturing test development},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {812},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699304},
doi = {10.1109/TEST.2010.5699304},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TammaliKST10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TaouilHVM10,
author = {Mottaqiallah Taouil and
Said Hamdioui and
Jouke Verbree and
Erik Jan Marinissen},
editor = {Ron Press and
Erik H. Volkerink},
title = {On maximizing the compound yield for 3D Wafer-to-Wafer stacked ICs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {183--192},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699218},
doi = {10.1109/TEST.2010.5699218},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TaouilHVM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ThreattGRPKJH10,
author = {Vance Threatt and
Atchyuth Gorti and
Jeff Rearick and
Shaishav Parikh and
Anirudh Kadiyala and
Aditya Jagirdar and
Andy Halliday},
editor = {Ron Press and
Erik H. Volkerink},
title = {Vendor-agnostic native compression engine},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {819},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699311},
doi = {10.1109/TEST.2010.5699311},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ThreattGRPKJH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TranVBDGPW10,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
editor = {Ron Press and
Erik H. Volkerink},
title = {Parity prediction synthesis for nano-electronic gate designs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {820},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699312},
doi = {10.1109/TEST.2010.5699312},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TranVBDGPW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TranWCLLS10,
author = {Dat Tran and
LeRoy Winemberg and
Darrell Carder and
Xijiang Lin and
Joe LeBritton and
Bruce Swanson},
editor = {Ron Press and
Erik H. Volkerink},
title = {Detecting and diagnosing open defects},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {811},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699303},
doi = {10.1109/TEST.2010.5699303},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TranWCLLS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TsaiHCTK10,
author = {Kun{-}Han Tsai and
Yu Huang and
Wu{-}Tung Cheng and
Ting{-}Pu Tai and
Augusli Kifli},
editor = {Ron Press and
Erik H. Volkerink},
title = {Test cycle power optimization for scan-based designs},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {134--143},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699213},
doi = {10.1109/TEST.2010.5699213},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TsaiHCTK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaayersMLK10,
author = {Tom Waayers and
Richard Morren and
Xijiang Lin and
Mark Kassab},
editor = {Ron Press and
Erik H. Volkerink},
title = {Clock control architecture and {ATPG} for reducing pattern count in
SoC designs with multiple clock domains},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {114--123},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699211},
doi = {10.1109/TEST.2010.5699211},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WaayersMLK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WagenenS10,
author = {Bethany Van Wagenen and
Edward Seng},
editor = {Ron Press and
Erik H. Volkerink},
title = {Concurrent test planning},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {516--525},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699255},
doi = {10.1109/TEST.2010.5699255},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WagenenS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Whetsel10,
author = {Lee Whetsel},
editor = {Ron Press and
Erik H. Volkerink},
title = {Commanded Test Access Port operations},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {579--588},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699261},
doi = {10.1109/TEST.2010.5699261},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Whetsel10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlWF10,
author = {Peter Wohl and
John A. Waicukauski and
T. Finklea},
editor = {Ron Press and
Erik H. Volkerink},
title = {Increasing PRPG-based compression by delayed justification},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {255--264},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699226},
doi = {10.1109/TEST.2010.5699226},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlWF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WuDBGPVTMWA10,
author = {Fangmei Wu and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Mohammad Tehranipoor and
Kohei Miyase and
Xiaoqing Wen and
Nisar Ahmed},
editor = {Ron Press and
Erik H. Volkerink},
title = {Is test power reduction through X-filling good enough?},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {805},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699297},
doi = {10.1109/TEST.2010.5699297},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WuDBGPVTMWA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangC10,
author = {Fan Yang and
Sreejit Chakravarty},
editor = {Ron Press and
Erik H. Volkerink},
title = {Testing of latch based embedded arrays using scan tests},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {104--113},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699210},
doi = {10.1109/TEST.2010.5699210},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YilmazOB10,
author = {Ender Yilmaz and
Sule Ozev and
Kenneth M. Butler},
editor = {Ron Press and
Erik H. Volkerink},
title = {Adaptive test flow for mixed-signal/RF circuits using learned information
from device under test},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {674--683},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699271},
doi = {10.1109/TEST.2010.5699271},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YilmazOB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YilmazWROSEFGC10,
author = {Mahmut Yilmaz and
Baosheng Wang and
Jayalakshmi Rajaraman and
Tom Olsen and
Kanwaldeep Sobti and
Dwight Elvey and
Jeff Fitzgerald and
Grady Giles and
Wei{-}Yu Chen},
editor = {Ron Press and
Erik H. Volkerink},
title = {The scan-DFT features of AMD's next-generation microprocessor core},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {39--48},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699203},
doi = {10.1109/TEST.2010.5699203},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YilmazWROSEFGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuB10,
author = {Xiaochun Yu and
Ronald D. Blanton},
editor = {Ron Press and
Erik H. Volkerink},
title = {Estimating defect-type distributions through volume diagnosis and
defect behavior attribution},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {664--673},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699270},
doi = {10.1109/TEST.2010.5699270},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangA10,
author = {Yu Zhang and
Vishwani D. Agrawal},
editor = {Ron Press and
Erik H. Volkerink},
title = {A diagnostic test generation system},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {360--368},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699237},
doi = {10.1109/TEST.2010.5699237},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangWGC10,
author = {Zhaobo Zhang and
Zhanglei Wang and
Xinli Gu and
Krishnendu Chakrabarty},
editor = {Ron Press and
Erik H. Volkerink},
title = {Board-level fault diagnosis using an error-flow dictionary},
booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
pages = {485--494},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://doi.org/10.1109/TEST.2010.5699251},
doi = {10.1109/TEST.2010.5699251},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangWGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2010,
editor = {Ron Press and
Erik H. Volkerink},
title = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX,
USA, November 2-4, 2010},
publisher = {{IEEE} Computer Society},
year = {2010},
url = {https://ieeexplore.ieee.org/xpl/conhome/5684496/proceeding},
isbn = {978-1-4244-7206-2},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2010.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Aldrete-VidrioOAMS09,
author = {Eduardo Aldrete{-}Vidrio and
Marvin Onabajo and
Josep Altet and
Diego Mateo and
Jos{\'{e}} Silva{-}Mart{\'{\i}}nez},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Non-invasive {RF} built-in testing using on-chip temperature sensors},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355901},
doi = {10.1109/TEST.2009.5355901},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Aldrete-VidrioOAMS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AmyeenVM09,
author = {M. Enamul Amyeen and
Srikanth Venkataraman and
Mun Wai Mak},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Microprocessor system failures debug and fault isolation methodology},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355702},
doi = {10.1109/TEST.2009.5355702},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AmyeenVM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BaiLKTW09,
author = {Bing{-}Chuan Bai and
Chien{-}Mo James Li and
Augusli Kifli and
Even Tsai and
Kun{-}Cheng Wu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Power scan: {DFT} for power switches in {VLSI} designs},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355631},
doi = {10.1109/TEST.2009.5355631},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BaiLKTW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CallegariWB09,
author = {Nicholas Callegari and
Li{-}C. Wang and
Pouria Bastani},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Feature based similarity search with application to speedpath analysis},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355708},
doi = {10.1109/TEST.2009.5355708},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CallegariWB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CarloHP09,
author = {Stefano Di Carlo and
Nadereh Hatami and
Paolo Prinetto},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Test infrastructures evaluation at transaction level},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355830},
doi = {10.1109/TEST.2009.5355830},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CarloHP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChakravadhanulaCKGN09,
author = {Krishna Chakravadhanula and
Vivek Chickermane and
Brion L. Keller and
Patrick R. Gallagher Jr. and
Prashant Narang},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Capture power reduction using clock gating aware test generation},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355649},
doi = {10.1109/TEST.2009.5355649},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChakravadhanulaCKGN09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChangWB09,
author = {Chia{-}Ling Chang and
Charles H.{-}P. Wen and
Jayanta Bhadra},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Speeding up bounded sequential equivalence checking with cross-timeframe
state-pair constraints from data learning},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355713},
doi = {10.1109/TEST.2009.5355713},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChangWB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenDDDCW09,
author = {Liang{-}Chi Chen and
Paul Dickinson and
Peter Dahlgren and
Scott Davidson and
Olivier Caty and
Kevin Wu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Using transition test to understand timing behavior of logic circuits
on UltraSPARC\({}^{\mbox{TM}}\) {T2} family},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355655},
doi = {10.1109/TEST.2009.5355655},
timestamp = {Sat, 09 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenDDDCW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenWCZYM09,
author = {Janine Chen and
Li{-}C. Wang and
Po{-}Hsien Chang and
Jing Zeng and
S. Yu and
Michael Mateja},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Data learning techniques and methodology for Fmax prediction},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355620},
doi = {10.1109/TEST.2009.5355620},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChenWCZYM09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChinTCC09,
author = {Ching{-}Yu Chin and
Yao{-}Te Tsou and
Chi{-}Min Chang and
Mango Chia{-}Tso Chao},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {A novel test flow for one-time-programming applications of {NROM}
technology},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355537},
doi = {10.1109/TEST.2009.5355537},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChinTCC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChungCC09,
author = {Chen{-}I Chung and
Shuo{-}Wen Chang and
Ching{-}Hwa Cheng},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Fine resolution double edge clipping with calibration technique for
built-in at-speed delay testing},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355907},
doi = {10.1109/TEST.2009.5355907},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChungCC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DevadzeJAU09,
author = {Sergei Devadze and
Artur Jutman and
Igor Aleksejev and
Raimund Ubar},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Fast extended test access via {JTAG} and FPGAs},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355668},
doi = {10.1109/TEST.2009.5355668},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DevadzeJAU09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Devta-PrasannaGGWK09,
author = {Narendra Devta{-}Prasanna and
Sandeep Kumar Goel and
Arun Gunda and
Mark Ward and
P. Krishnamurthy},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Accurate measurement of small delay defect coverage of test patterns},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355644},
doi = {10.1109/TEST.2009.5355644},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Devta-PrasannaGGWK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DonglikarBCH09,
author = {Swapneel Donglikar and
Mainak Banga and
Maheshwar Chandrasekar and
Michael S. Hsiao},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Fast circuit topology based method to configure the scan chains in
Illinois Scan architecture},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355661},
doi = {10.1109/TEST.2009.5355661},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DonglikarBCH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DrmanacBWA09,
author = {Dragoljub Gagi Drmanac and
Brendon Bolin and
Li{-}C. Wang and
Magdy S. Abadir},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Minimizing outlier delay test cost in the presence of systematic variability},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355643},
doi = {10.1109/TEST.2009.5355643},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DrmanacBWA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ehrenberg09,
author = {Heiko Ehrenberg},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Test Mode Entry and Exit Methods for {IEEE} {P1581} compliant devices},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355636},
doi = {10.1109/TEST.2009.5355636},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ehrenberg09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FujibeSYNFWO09,
author = {Tasuku Fujibe and
Masakatsu Suda and
Kazuhiro Yamamoto and
Yoshihito Nagata and
Kazuhiro Fujita and
Daisuke Watanabe and
Toshiyuki Okayasu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Dynamic arbitrary jitter injection method for {\(\gg\)}6.5Gb/s SerDes
testing},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355735},
doi = {10.1109/TEST.2009.5355735},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FujibeSYNFWO09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GeigerB09,
author = {Philip B. Geiger and
Steve Butkovich},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Boundary-scan adoption - an industry snapshot with emphasis on the
semiconductor industry},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355673},
doi = {10.1109/TEST.2009.5355673},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GeigerB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GilesWSBW09,
author = {Grady Giles and
Jing Wang and
Anuja Sehgal and
Kedarnath J. Balakrishnan and
James Wingfield},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Test access mechanism for multiple identical cores},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355560},
doi = {10.1109/TEST.2009.5355560},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GilesWSBW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoelDW09,
author = {Sandeep Kumar Goel and
Narendra Devta{-}Prasanna and
Mark Ward},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Comparing the effectiveness of deterministic bridge fault and multiple-detect
stuck fault patterns for physical bridge defects: {A} simulation and
silicon study},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355762},
doi = {10.1109/TEST.2009.5355762},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoelDW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GudavalliDNH09,
author = {Rama Gudavalli and
W. Robert Daasch and
Phil Nigh and
Douglas Heaberlin},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Application of non-parametric statistics of the parametric response
for defect diagnosis},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355728},
doi = {10.1109/TEST.2009.5355728},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GudavalliDNH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GurumurthyBJR09,
author = {Sankar Gurumurthy and
D. Bertanzetti and
P. Jakobsen and
Jeff Rearick},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Cache-resident self-testing for {I/O} circuitry},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355549},
doi = {10.1109/TEST.2009.5355549},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GurumurthyBJR09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HapkeKGSHEHA09,
author = {Friedrich Hapke and
Rene Krenz{-}Baath and
Andreas Glowatz and
J{\"{u}}rgen Schl{\"{o}}ffel and
Hamidreza Hashempour and
Stefan Eichenberger and
Camelia Hora and
Dan Adolfsson},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Defect-oriented cell-aware {ATPG} and fault simulation for industrial
cell libraries and designs},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355741},
doi = {10.1109/TEST.2009.5355741},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HapkeKGSHEHA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeMJPH09,
author = {Xin He and
Yashwant K. Malaiya and
Anura P. Jayasumana and
Kenneth P. Parker and
Stephen Hird},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {An outlier detection based approach for {PCB} testing},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355761},
doi = {10.1109/TEST.2009.5355761},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HeMJPH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HigamiKOYTSAT09,
author = {Yoshinobu Higami and
Yosuke Kurose and
Satoshi Ohno and
Hironori Yamaoka and
Hiroshi Takahashi and
Yoshihiro Shimizu and
Takashi Aikyo and
Yuzo Takamatsu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Diagnostic test generation for transition faults using a stuck-at
{ATPG} tool},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355681},
doi = {10.1109/TEST.2009.5355681},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HigamiKOYTSAT09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HsiehBAGL09,
author = {Tong{-}Yu Hsieh and
Melvin A. Breuer and
Murali Annavaram and
Sandeep K. Gupta and
Kuen{-}Jong Lee},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Tolerance of performance degrading faults for effective yield improvement},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355594},
doi = {10.1109/TEST.2009.5355594},
timestamp = {Thu, 21 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HsiehBAGL09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangX09,
author = {Lin Huang and
Qiang Xu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Test economics for homogeneous manycore systems},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355748},
doi = {10.1109/TEST.2009.5355748},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangX09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kamm09,
author = {Matthias Kamm},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Manufacturing data: Maximizing value using component-to-system analysis},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355834},
doi = {10.1109/TEST.2009.5355834},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kamm09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KannanK09,
author = {Sukeshwar Kannan and
Bruce C. Kim},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Automatic diagnostic tool for Analog-Mixed Signal and {RF} load boards},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355836},
doi = {10.1109/TEST.2009.5355836},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KannanK09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KassirKJC09,
author = {Bilal El Kassir and
Christophe Kelma and
Bernard Jarry and
Michel Campovecchio},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Built-in Self Test for Error Vector Magnitude measurement of {RF}
transceiver},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355906},
doi = {10.1109/TEST.2009.5355906},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KassirKJC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeezerGMMD09,
author = {David C. Keezer and
Carl Gray and
A. M. Majid and
Dany Minier and
Patrice Ducharme},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {A development platform and electronic modules for automated test up
to 20 Gbps},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--11},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355701},
doi = {10.1109/TEST.2009.5355701},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeezerGMMD09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimPSCKLC09,
author = {Boyon Kim and
Il{-}Chan Park and
Giseob Song and
Wooseong Choi and
Byeong{-}Yun Kim and
Kyutaek Lee and
Chi{-}Young Choi},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {A novel multisite testing techniques by using frequency synthesizer},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355814},
doi = {10.1109/TEST.2009.5355814},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimPSCKLC09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoCH09,
author = {Hsuan{-}Chung Ko and
Deng{-}Yao Chang and
Cheng{-}Nan Hu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Cost-effective approach to improve {EMI} yield loss},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355696},
doi = {10.1109/TEST.2009.5355696},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoCH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaiRW09,
author = {Bobby Lai and
Chris Rivera and
Khurram Waheed},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Enabling {GSM/GPRS/EDGE} {EVM} testing on low cost multi-site testers},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--7},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355626},
doi = {10.1109/TEST.2009.5355626},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaiRW09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ley09,
author = {Adam W. Ley},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Doing more with less - An {IEEE} 1149.7 embedded tutorial : Standard
for reduced-pin and enhanced-functionality test access port and boundary-scan
architecture},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355572},
doi = {10.1109/TEST.2009.5355572},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ley09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ley09a,
author = {Adam W. Ley},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Defect coverage of non-intrusive board tests {(NBT):} What does it
mean when a non-intrusive board test passes?},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355828},
doi = {10.1109/TEST.2009.5355828},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ley09a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiH09,
author = {Min Li and
Michael S. Hsiao},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {An ant colony optimization technique for abstraction-guided state
justification},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355676},
doi = {10.1109/TEST.2009.5355676},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiH09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinB09,
author = {Yen{-}Tzu Lin and
Ronald D. Blanton},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Test effectiveness evaluation through analysis of readily-available
tester data},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355716},
doi = {10.1109/TEST.2009.5355716},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinB09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuX09,
author = {Xiao Liu and
Qiang Xu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {On simultaneous shift- and capture-power reduction in linear decompressor-based
test compression environment},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355554},
doi = {10.1109/TEST.2009.5355554},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuX09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuX09a,
author = {Xiao Liu and
Qiang Xu},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Trace signal selection for debugging electrical errors in post-silicon
validation},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355831},
doi = {10.1109/TEST.2009.5355831},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuX09a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Losik09,
author = {Len Losik},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Eliminating product infant mortality failures using prognostic analysis},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355817},
doi = {10.1109/TEST.2009.5355817},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Losik09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LuoCWLHTHCPY09,
author = {Tseng{-}Chin Luo and
Mango Chia{-}Tso Chao and
Michael S.{-}Y. Wu and
Kuo{-}Tsai Li and
Chin C. Hsia and
Huan{-}Chi Tseng and
Chuen{-}Uan Huang and
Yuan{-}Yao Chang and
Samuel C. Pan and
Konrad K.{-}L. Young},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {A novel array-based test methodology for local process variation monitoring},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--9},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355656},
doi = {10.1109/TEST.2009.5355656},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LuoCWLHTHCPY09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lyons09,
author = {Timothy Daniel Lyons},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {A timestamping method using reduced cost {ADC} hardware},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--8},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355736},
doi = {10.1109/TEST.2009.5355736},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lyons09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MarinissenZ09,
author = {Erik Jan Marinissen and
Yervant Zorian},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Testing 3D chips containing through-silicon vias},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--11},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355573},
doi = {10.1109/TEST.2009.5355573},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MarinissenZ09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaurouxVBDGPG09,
author = {Pierre{-}Didier Mauroux and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Beno{\^{\i}}t Godard},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {{NAND} flash testing: {A} preliminary study on actual defects},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355898},
doi = {10.1109/TEST.2009.5355898},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaurouxVBDGPG09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MoreauDLA09,
author = {Jocelyn Moreau and
Thomas Droniou and
Philippe Lebourg and
Paul Armagnat},
editor = {Gordon W. Roberts and
Bill Eklow},
title = {Running scan test on three pins: yes we can!},
booktitle = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
USA, November 1-6, 2009},
pages = {1--10},
publisher = {{IEEE} Computer Society},
year = {2009},
url = {https://doi.org/10.1109/TEST.2009.5355693},
doi = {10.1109/TEST.2009.5355693},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MoreauDLA09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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