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@article{DBLP:journals/sensors/JosephCLPSBM23,
  author       = {Christopher Hardly Joseph and
                  Giovanni Capoccia and
                  Andrea Lucibello and
                  Emanuela Proietti and
                  Giovanni Maria Sardi and
                  Giancarlo Bartolucci and
                  Romolo Marcelli},
  title        = {Fabrication of Ultra-Sharp Tips by Dynamic Chemical Etching Process
                  for Scanning Near-Field Microwave Microscopy},
  journal      = {Sensors},
  volume       = {23},
  number       = {6},
  pages        = {3360},
  year         = {2023},
  url          = {https://doi.org/10.3390/s23063360},
  doi          = {10.3390/S23063360},
  timestamp    = {Sat, 29 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/sensors/JosephCLPSBM23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/PeiCJLGWLTL23,
  author       = {Tao Pei and
                  Fan Cheng and
                  Xu Dong Jia and
                  Zhong Hao Li and
                  Hao Guo and
                  Huan Fei Wen and
                  Yan Jun Li and
                  Jun Tang and
                  Jun Liu},
  title        = {High-Resolution Detection of Microwave Fields on Chip Surfaces Based
                  on Scanning Microwave Microscopy},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {72},
  pages        = {1--6},
  year         = {2023},
  url          = {https://doi.org/10.1109/TIM.2023.3244254},
  doi          = {10.1109/TIM.2023.3244254},
  timestamp    = {Mon, 04 Mar 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tim/PeiCJLGWLTL23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/access/ChenYWLYJWHW22,
  author       = {Yujie Chen and
                  Xiangyue Yang and
                  Ziqian Wei and
                  Han Luo and
                  Zhiwei Yuan and
                  Guanxi Jiang and
                  Yahui Wang and
                  Amin Ul Haq and
                  Zhe Wu},
  title        = {Application of Near-Field Scanning Microwave Microscopy in Liquid
                  Environment},
  journal      = {{IEEE} Access},
  volume       = {10},
  pages        = {75720--75728},
  year         = {2022},
  url          = {https://doi.org/10.1109/ACCESS.2022.3190606},
  doi          = {10.1109/ACCESS.2022.3190606},
  timestamp    = {Fri, 19 Jan 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/access/ChenYWLYJWHW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/sensors/JosephLAFPFMGPM22,
  author       = {Christopher Hardly Joseph and
                  Francesca Luzi and
                  S. N. Afifa Azman and
                  Pietro Forcellese and
                  Eleonora Pavoni and
                  Gianluca Fabi and
                  Davide Mencarelli and
                  Serena Gentili and
                  Luca Pierantoni and
                  Antonio Morini and
                  Michela Simoncini and
                  Tiziano Bellezze and
                  Valeria Corinaldesi and
                  Marco Farina},
  title        = {Nanoscale Characterization of Graphene Oxide-Based Epoxy Nanocomposite
                  Using Inverted Scanning Microwave Microscopy},
  journal      = {Sensors},
  volume       = {22},
  number       = {24},
  pages        = {9608},
  year         = {2022},
  url          = {https://doi.org/10.3390/s22249608},
  doi          = {10.3390/S22249608},
  timestamp    = {Tue, 31 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/sensors/JosephLAFPFMGPM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/JosephGPSMKBM22,
  author       = {Christopher Hardly Joseph and
                  Georg Gramse and
                  Emanuela Proietti and
                  Giovanni Maria Sardi and
                  Gavin W. Morley and
                  Ferry Kienberger and
                  Giancarlo Bartolucci and
                  Romolo Marcelli},
  title        = {Local Characterization of Ferromagnetic Resonance in Bulk and Patterned
                  Magnetic Materials Using Scanning Microwave Microscopy},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {71},
  pages        = {1--11},
  year         = {2022},
  url          = {https://doi.org/10.1109/TIM.2022.3142760},
  doi          = {10.1109/TIM.2022.3142760},
  timestamp    = {Tue, 15 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tim/JosephGPSMKBM22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/HoribeKH19,
  author       = {Masahiro Horibe and
                  Seitaro Kon and
                  Iku Hirano},
  title        = {Measurement Capability of Scanning Microwave Microscopy: Measurement
                  Sensitivity Versus Accuracy},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {68},
  number       = {6},
  pages        = {1774--1780},
  year         = {2019},
  url          = {https://doi.org/10.1109/TIM.2018.2882937},
  doi          = {10.1109/TIM.2018.2882937},
  timestamp    = {Mon, 03 Jan 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tim/HoribeKH19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/WeiCC19,
  author       = {Zhun Wei and
                  Rui Chen and
                  Xudong Chen},
  title        = {Nonlinear Reconstruction of Multilayer Media in Scanning Microwave
                  Microscopy},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {68},
  number       = {1},
  pages        = {197--205},
  year         = {2019},
  url          = {https://doi.org/10.1109/TIM.2018.2834058},
  doi          = {10.1109/TIM.2018.2834058},
  timestamp    = {Tue, 04 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tim/WeiCC19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@phdthesis{DBLP:phd/dnb/Hanssler18,
  author       = {Olaf C. H{\"{a}}n{\ss}ler},
  title        = {Multimodal sensing and imaging technology by integrated scanning electron,
                  force, and nearfield microwave microscopy and its application to submicrometer
                  studies},
  school       = {University of Oldenburg, Germany},
  year         = {2018},
  url          = {http://oops.uni-oldenburg.de/3580},
  urn          = {urn:nbn:de:gbv:715-oops-36612},
  timestamp    = {Sat, 17 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/phd/dnb/Hanssler18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AmsterRYIM18,
  author       = {Oskar Amster and
                  K. A. Rubin and
                  Y. Yang and
                  D. Iyer and
                  Arron Messinger},
  title        = {Application of Scanning Microwave Microscopy nano-C-V to investigate
                  dopant defect under a poly gate device},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {250--254},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.106},
  doi          = {10.1016/J.MICROREL.2018.06.106},
  timestamp    = {Fri, 04 Jun 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/AmsterRYIM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/AmsterSFYDD17,
  author       = {Oskar Amster and
                  Fred Stanke and
                  Stuart Friedman and
                  Yongliang Yang and
                  St. J. Dixon{-}Warren and
                  B. Drevniok},
  title        = {Practical quantitative scanning microwave impedance microscopy},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {214--217},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.082},
  doi          = {10.1016/J.MICROREL.2017.07.082},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/AmsterSFYDD17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HommelKASK17,
  author       = {S{\"{o}}ren Hommel and
                  Nicole Killat and
                  A. Altes and
                  Thomas Schweinb{\"{o}}ck and
                  Franz Kreupl},
  title        = {Determination of doping type by calibrated capacitance scanning microwave
                  microscopy},
  journal      = {Microelectron. Reliab.},
  volume       = {76-77},
  pages        = {218--221},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.06.050},
  doi          = {10.1016/J.MICROREL.2017.06.050},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HommelKASK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/HommelKASSSH16,
  author       = {S{\"{o}}ren Hommel and
                  Nicole Killat and
                  Andreas Altes and
                  Thomas Schweinb{\"{o}}ck and
                  Doris Schmitt{-}Landsiedel and
                  Marco Silvestri and
                  Oliver Haeberlen},
  title        = {Scanning Microwave Microscopy for Electronic Device Analysis on Nanometre
                  Scale},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {310--312},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.134},
  doi          = {10.1016/J.MICROREL.2016.07.134},
  timestamp    = {Wed, 23 Mar 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/HommelKASSSH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/GuHFL16,
  author       = {Sijia Gu and
                  Kamel Haddadi and
                  Abdelhatif El Fellahi and
                  Tuami Lasri},
  title        = {Setting Parameters Influence on Accuracy and Stability of Near-Field
                  Scanning Microwave Microscopy Platform},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {65},
  number       = {4},
  pages        = {890--897},
  year         = {2016},
  url          = {https://doi.org/10.1109/TIM.2015.2507699},
  doi          = {10.1109/TIM.2015.2507699},
  timestamp    = {Mon, 08 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tim/GuHFL16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/i2mtc/GuHFDL15,
  author       = {Sijia Gu and
                  Kamel Haddadi and
                  Abdelhatif El Fellahi and
                  Gilles Dambrine and
                  Tuami Lasri},
  title        = {Measurement accuracy and repeatability in near-field scanning microwave
                  microscopy},
  booktitle    = {2015 {IEEE} International Instrumentation and Measurement Technology
                  Conference {(I2MTC)} Proceedings, Pisa, Italy, May 11-14, 2015},
  pages        = {1735--1740},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/I2MTC.2015.7151542},
  doi          = {10.1109/I2MTC.2015.7151542},
  timestamp    = {Sat, 19 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/i2mtc/GuHFDL15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SchweinbockH14,
  author       = {Thomas Schweinb{\"{o}}ck and
                  S{\"{o}}ren Hommel},
  title        = {Quantitative Scanning Microwave Microscopy: {A} calibration flow},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {2070--2074},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.024},
  doi          = {10.1016/J.MICROREL.2014.07.024},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SchweinbockH14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/BakliHL14,
  author       = {Hind Bakli and
                  Kamel Haddadi and
                  Tuami Lasri},
  title        = {Interferometric Technique for Scanning Near-Field Microwave Microscopy
                  Applications},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {63},
  number       = {5},
  pages        = {1281--1286},
  year         = {2014},
  url          = {https://doi.org/10.1109/TIM.2013.2296416},
  doi          = {10.1109/TIM.2013.2296416},
  timestamp    = {Mon, 08 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tim/BakliHL14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/i2mtc/BakliHL13,
  author       = {Hind Bakli and
                  Kamel Haddadi and
                  Tuami Lasri},
  title        = {Interferometric technique for scanning near-field microwave microscopy
                  applications},
  booktitle    = {{IEEE} International Instrumentation and Measurement Technology Conference,
                  {I2MTC} 2013, Minneapolis, MN, USA, May 6-9, 2013},
  pages        = {1694--1698},
  publisher    = {{IEEE}},
  year         = {2013},
  url          = {https://doi.org/10.1109/I2MTC.2013.6555703},
  doi          = {10.1109/I2MTC.2013.6555703},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/i2mtc/BakliHL13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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