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@inproceedings{DBLP:conf/ats/ShenLMLC09,
  author       = {Shiue{-}Tsung Shen and
                  Wei{-}Hsiao Liu and
                  En{-}Hua Ma and
                  James Chien{-}Mo Li and
                  I{-}Chun Cheng},
  title        = {Very-Low-Voltage Testing of Amorphous Silicon {TFT} Circuits},
  booktitle    = {Proceedings of the Eighteentgh Asian Test Symposium, {ATS} 2009, 23-26
                  November 2009, Taichung, Taiwan},
  pages        = {75--80},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/ATS.2009.68},
  doi          = {10.1109/ATS.2009.68},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ShenLMLC09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc/ShenLLC09,
  author       = {Shiue{-}Tsung Shen and
                  Wei{-}Hsiao Liu and
                  Chien{-}Mo James Li and
                  I{-}Chun Cheng},
  editor       = {Gordon W. Roberts and
                  Bill Eklow},
  title        = {Very-Low-Voltage testing of amorphous silicon {TFT} circuits},
  booktitle    = {2009 {IEEE} International Test Conference, {ITC} 2009, Austin, TX,
                  USA, November 1-6, 2009},
  pages        = {1},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/TEST.2009.5355808},
  doi          = {10.1109/TEST.2009.5355808},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/ShenLLC09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}