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export results for "Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level."

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@article{DBLP:journals/sensors/ArezkiSHLPBSSAZ21,
  author       = {Yassir Arezki and
                  Rong Su and
                  Ville Heikkinen and
                  Fran{\c{c}}ois Leprete and
                  Pavel Psota and
                  Youichi Bitou and
                  Christian Schober and
                  Charyar{-}Mehdi Souzani and
                  Bandar Abdulrahman Mohammed Alzahrani and
                  Xiangchao Zhang and
                  Yohan Kondo and
                  Christof Pruss and
                  Vit Ledl and
                  Nabil Anwer and
                  Mohamed Lamjed Bouazizi and
                  Richard K. Leach and
                  Hichem Nouira},
  title        = {Traceable Reference Full Metrology Chain for Innovative Aspheric and
                  Freeform Optical Surfaces Accurate at the Nanometer Level},
  journal      = {Sensors},
  volume       = {21},
  number       = {4},
  pages        = {1103},
  year         = {2021},
  url          = {https://doi.org/10.3390/s21041103},
  doi          = {10.3390/S21041103},
  timestamp    = {Thu, 23 Dec 2021 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/sensors/ArezkiSHLPBSSAZ21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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