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export results for "Thermal-uniformity-aware X-filling to reduce temperature-induced delay variation for accurate at-speed testing"
@inproceedings{DBLP:conf/vts/YonedaISF10, author = {Tomokazu Yoneda and Michiko Inoue and Yasuo Sato and Hideo Fujiwara}, title = {Thermal-uniformity-aware X-filling to reduce temperature-induced delay variation for accurate at-speed testing}, booktitle = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010, Santa Cruz, California, {USA}}, pages = {188--193}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/VTS.2010.5469578}, doi = {10.1109/VTS.2010.5469578}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/vts/YonedaISF10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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