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export results for "The impact of process maturity on defect density."

 download as .bib file

@inproceedings{DBLP:conf/esem/ShahMT12,
  author       = {Syed Muhammad Ali Shah and
                  Maurizio Morisio and
                  Marco Torchiano},
  editor       = {Per Runeson and
                  Martin H{\"{o}}st and
                  Emilia Mendes and
                  Anneliese Amschler Andrews and
                  Rachel Harrison},
  title        = {The impact of process maturity on defect density},
  booktitle    = {2012 {ACM-IEEE} International Symposium on Empirical Software Engineering
                  and Measurement, {ESEM} '12, Lund, Sweden - September 19 - 20, 2012},
  pages        = {315--318},
  publisher    = {{ACM}},
  year         = {2012},
  url          = {https://doi.org/10.1145/2372251.2372308},
  doi          = {10.1145/2372251.2372308},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/esem/ShahMT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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