Search dblp for Publications

export results for "Semiconductor Quality Prediction: Comprehensive Comparative Evaluation of Machine Learning Models."

 download as .bib file

@inproceedings{DBLP:conf/ricai/GeW23,
  author       = {Peng Ge and
                  Ruiping Wang},
  title        = {Semiconductor Quality Prediction: Comprehensive Comparative Evaluation
                  of Machine Learning Models},
  booktitle    = {5th International Conference on Robotics, Intelligent Control and
                  Artificial Intelligence, {RICAI} 2023, Hangzhou, China, December 1-3,
                  2023},
  pages        = {1111--1115},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/RICAI60863.2023.10489342},
  doi          = {10.1109/RICAI60863.2023.10489342},
  timestamp    = {Sat, 20 Apr 2024 12:53:27 +0200},
  biburl       = {https://dblp.org/rec/conf/ricai/GeW23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.