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@article{DBLP:journals/mr/SangameswaranCGW10,
  author       = {Sandeep Sangameswaran and
                  Jeroen De Coster and
                  Guido Groeseneken and
                  Ingrid De Wolf},
  title        = {Impact of design factors and environment on the {ESD} sensitivity
                  of {MEMS} micromirrors},
  journal      = {Microelectron. Reliab.},
  volume       = {50},
  number       = {9-11},
  pages        = {1383--1387},
  year         = {2010},
  url          = {https://doi.org/10.1016/j.microrel.2010.07.079},
  doi          = {10.1016/J.MICROREL.2010.07.079},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SangameswaranCGW10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/tim/ScholzLTSSNHG09,
  author       = {Mirko Scholz and
                  Dimitri Linten and
                  Steven Thijs and
                  Sandeep Sangameswaran and
                  Masanori Sawada and
                  Toshiyuki Nakaei and
                  Takumi Hasebe and
                  Guido Groeseneken},
  title        = {{ESD} On-Wafer Characterization: Is {TLP} Still the Right Measurement
                  Tool?},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {58},
  number       = {10},
  pages        = {3418--3426},
  year         = {2009},
  url          = {https://doi.org/10.1109/TIM.2009.2017657},
  doi          = {10.1109/TIM.2009.2017657},
  timestamp    = {Mon, 08 Jun 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tim/ScholzLTSSNHG09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}