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@article{DBLP:journals/mr/SajjadeGVM18,
  author       = {Faisal Mustafa Sajjade and
                  Neeraj Kumar Goyal and
                  B. K. S. V. L. Varaprasad and
                  Ravindra Moogina},
  title        = {Radiation Hardened by Design Latches - {A} Review and {SEU} Fault
                  Simulations},
  journal      = {Microelectron. Reliab.},
  volume       = {83},
  pages        = {127--135},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.02.017},
  doi          = {10.1016/J.MICROREL.2018.02.017},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SajjadeGVM18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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