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export results for "Ravindra Moogina"
@article{DBLP:journals/mr/SajjadeGVM18, author = {Faisal Mustafa Sajjade and Neeraj Kumar Goyal and B. K. S. V. L. Varaprasad and Ravindra Moogina}, title = {Radiation Hardened by Design Latches - {A} Review and {SEU} Fault Simulations}, journal = {Microelectron. Reliab.}, volume = {83}, pages = {127--135}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.02.017}, doi = {10.1016/J.MICROREL.2018.02.017}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SajjadeGVM18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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