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export results for "Partitioning algorithm to enhance pseudoexhaustive testing of digital VLSI circuits."
@article{DBLP:journals/tvlsi/ShaerLA00, author = {Bassam Shaer and David L. Landis and Sami A. Al{-}Arian}, title = {Partitioning algorithm to enhance pseudoexhaustive testing of digital {VLSI} circuits}, journal = {{IEEE} Trans. Very Large Scale Integr. Syst.}, volume = {8}, number = {6}, pages = {750--754}, year = {2000}, url = {https://doi.org/10.1109/92.902271}, doi = {10.1109/92.902271}, timestamp = {Wed, 11 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/tvlsi/ShaerLA00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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