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@inproceedings{DBLP:conf/ats/Pomeranz01, author = {Irith Pomeranz}, title = {On Pass/Fail Dictionaries for Scan Circuits}, booktitle = {10th Asian Test Symposium {(ATS} 2001), 19-21 November 2001, Kyoto, Japan}, pages = {51--56}, publisher = {{IEEE} Computer Society}, year = {2001}, url = {https://doi.org/10.1109/ATS.2001.990258}, doi = {10.1109/ATS.2001.990258}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/Pomeranz01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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