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export results for "Near-field EMC study to improve electronic component reliability."

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@article{DBLP:journals/mr/DuchampCM07,
  author       = {Genevi{\`{e}}ve Duchamp and
                  D. Castagnet and
                  Alain Meresse},
  title        = {Near-field {EMC} study to improve electronic component reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1668--1672},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.044},
  doi          = {10.1016/J.MICROREL.2007.07.044},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/DuchampCM07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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