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export results for "MURLAV: A Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method."
@article{DBLP:journals/tcad/YanLGZHNCWGW24, author = {Aibin Yan and Zhixing Li and Zhongyu Gao and Jing Zhang and Zhengfeng Huang and Tianming Ni and Jie Cui and Xiaolei Wang and Patrick Girard and Xiaoqing Wen}, title = {{MURLAV:} {A} Multiple-Node-Upset Recovery Latch and Algorithm-Based Verification Method}, journal = {{IEEE} Trans. Comput. Aided Des. Integr. Circuits Syst.}, volume = {43}, number = {7}, pages = {2205--2214}, year = {2024}, url = {https://doi.org/10.1109/TCAD.2024.3357593}, doi = {10.1109/TCAD.2024.3357593}, timestamp = {Fri, 19 Jul 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/tcad/YanLGZHNCWGW24.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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