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@article{DBLP:journals/et/VolkerinkKRH03, author = {Erik H. Volkerink and Ajay Khoche and Jochen Rivoir and Klaus{-}Dieter Hilliges}, title = {Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits}, journal = {J. Electron. Test.}, volume = {19}, number = {2}, pages = {125--135}, year = {2003}, url = {https://doi.org/10.1023/A:1022829321216}, doi = {10.1023/A:1022829321216}, timestamp = {Wed, 07 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/et/VolkerinkKRH03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/ArabiHKT02, author = {Karim Arabi and Klaus{-}Dieter Hilliges and David C. Keezer and Sassan Tabatabaei}, title = {Multi-GigaHertz Testing Challenges and Solutions}, booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}}, pages = {265--268}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/VTS.2002.1011149}, doi = {10.1109/VTS.2002.1011149}, timestamp = {Sun, 06 Oct 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/ArabiHKT02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/VolkerinkKRH02, author = {Erik H. Volkerink and Ajay Khoche and Jochen Rivoir and Klaus{-}Dieter Hilliges}, title = {Test Economics for Multi-site Test with Modern Cost Reduction Techniques}, booktitle = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}}, pages = {411--416}, publisher = {{IEEE} Computer Society}, year = {2002}, url = {https://doi.org/10.1109/VTS.2002.1011173}, doi = {10.1109/VTS.2002.1011173}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/vts/VolkerinkKRH02.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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