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@article{DBLP:journals/combinatorica/AroraS03,
  author       = {Sanjeev Arora and
                  Madhu Sudan},
  title        = {Improved Low-Degree Testing and its Applications},
  journal      = {Comb.},
  volume       = {23},
  number       = {3},
  pages        = {365--426},
  year         = {2003},
  url          = {https://doi.org/10.1007/s00493-003-0025-0},
  doi          = {10.1007/S00493-003-0025-0},
  timestamp    = {Tue, 14 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/combinatorica/AroraS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/stoc/AroraS97,
  author       = {Sanjeev Arora and
                  Madhu Sudan},
  editor       = {Frank Thomson Leighton and
                  Peter W. Shor},
  title        = {Improved Low-Degree Testing and its Applications},
  booktitle    = {Proceedings of the Twenty-Ninth Annual {ACM} Symposium on the Theory
                  of Computing, El Paso, Texas, USA, May 4-6, 1997},
  pages        = {485--495},
  publisher    = {{ACM}},
  year         = {1997},
  url          = {https://doi.org/10.1145/258533.258642},
  doi          = {10.1145/258533.258642},
  timestamp    = {Tue, 14 Jun 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/stoc/AroraS97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/eccc/ECCC-TR97-003,
  author       = {Sanjeev Arora and
                  Madhu Sudan},
  title        = {Improved low-degree testing and its applications},
  journal      = {Electron. Colloquium Comput. Complex.},
  volume       = {{TR97-003}},
  year         = {1997},
  url          = {https://eccc.weizmann.ac.il/eccc-reports/1997/TR97-003/index.html},
  eprinttype    = {ECCC},
  eprint       = {TR97-003},
  timestamp    = {Wed, 28 Sep 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/eccc/ECCC-TR97-003.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}