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@article{DBLP:journals/symmetry/BurgioSVW21, author = {G. Fiorella Burgio and Hans{-}Josef Schulze and Isaac Vida{\~{n}}a and Jin{-}Biao Wei}, title = {A Modern View of the Equation of State in Nuclear and Neutron Star Matter}, journal = {Symmetry}, volume = {13}, number = {3}, pages = {400}, year = {2021}, url = {https://doi.org/10.3390/sym13030400}, doi = {10.3390/SYM13030400}, timestamp = {Thu, 29 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/symmetry/BurgioSVW21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BaburskeNSBKL18, author = {Roman Baburske and Franz{-}Josef Niedernostheide and Hans{-}Joachim Schulze and Riteshkumar Bhojani and J. Kowalsky and Josef Lutz}, title = {Unified view on energy and electrical failure of the short-circuit operation of IGBTs}, journal = {Microelectron. Reliab.}, volume = {88-90}, pages = {236--241}, year = {2018}, url = {https://doi.org/10.1016/j.microrel.2018.06.091}, doi = {10.1016/J.MICROREL.2018.06.091}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BaburskeNSBKL18.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iet-cds/BaslerPFNPSBL14, author = {Thomas Basler and M. Pfaffenlehner and Hans Peter Felsl and Franz{-}Josef Niedernostheide and F. Pfirsch and Hans{-}Joachim Schulze and Roman Baburske and Josef Lutz}, title = {Switching ruggedness and surge-current capability of diodes using the self-adjusting p emitter efficiency diode concept}, journal = {{IET} Circuits Devices Syst.}, volume = {8}, number = {3}, pages = {205--212}, year = {2014}, url = {https://doi.org/10.1049/iet-cds.2013.0216}, doi = {10.1049/IET-CDS.2013.0216}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iet-cds/BaslerPFNPSBL14.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/HeinzeLFS08, author = {Birk Heinze and Josef Lutz and Hans Peter Felsl and Hans{-}Joachim Schulze}, title = {Ruggedness analysis of 3.3 kV high voltage diodes considering various buffer structures and edge terminations}, journal = {Microelectron. J.}, volume = {39}, number = {6}, pages = {868--877}, year = {2008}, url = {https://doi.org/10.1016/j.mejo.2007.11.023}, doi = {10.1016/J.MEJO.2007.11.023}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mj/HeinzeLFS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/iet-cds/NiedernostheideSFLKL07, author = {Franz{-}Josef Niedernostheide and Hans{-}Joachim Schulze and Hans Peter Felsl and Thomas Laska and Ulrich Kellner{-}Werdehausen and Josef Lutz}, title = {Thyristors and IGBTs with integrated self-protection functions}, journal = {{IET} Circuits Devices Syst.}, volume = {1}, number = {5}, pages = {315--320}, year = {2007}, url = {https://doi.org/10.1049/iet-cds:20060369}, doi = {10.1049/IET-CDS:20060369}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/iet-cds/NiedernostheideSFLKL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mj/SiemieniecSNSL06, author = {Ralf Siemieniec and Hans{-}Joachim Schulze and Franz{-}Josef Niedernostheide and W. S{\"{u}}dkamp and Josef Lutz}, title = {Compensation and doping effects in heavily helium-radiated silicon for power device applications}, journal = {Microelectron. J.}, volume = {37}, number = {3}, pages = {204--212}, year = {2006}, url = {https://doi.org/10.1016/j.mejo.2005.09.011}, doi = {10.1016/J.MEJO.2005.09.011}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mj/SiemieniecSNSL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/ai/BodeFFNS01, author = {Mathias Bode and O. Freyd and Joern Fischer and Franz{-}Josef Niedernostheide and Hans{-}Joachim Schulze}, title = {Hybrid hardware for a highly parallel search in the context of learning classifiers}, journal = {Artif. Intell.}, volume = {130}, number = {1}, pages = {75--84}, year = {2001}, url = {https://doi.org/10.1016/S0004-3702(01)00053-4}, doi = {10.1016/S0004-3702(01)00053-4}, timestamp = {Sat, 27 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/ai/BodeFFNS01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZmeckPBOWBNSFB01, author = {M. Zmeck and J. C. H. Phang and Andrew Bettiol and T. Osipowicz and F. Watt and L. J. Balk and Franz{-}Josef Niedernostheide and Hans{-}Joachim Schulze and E. Falck and R. Barthelmess}, title = {Analysis of high-power devices using proton beam induced charge microscopy}, journal = {Microelectron. Reliab.}, volume = {41}, number = {9-10}, pages = {1519--1524}, year = {2001}, url = {https://doi.org/10.1016/S0026-2714(01)00159-7}, doi = {10.1016/S0026-2714(01)00159-7}, timestamp = {Thu, 05 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZmeckPBOWBNSFB01.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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