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@article{DBLP:journals/mr/CharpenelDDGGGGLMM03,
  author       = {P. Charpenel and
                  F. Davenel and
                  R. Digout and
                  M. Giraudeau and
                  M. Glade and
                  J. P. Guerveno and
                  N. Guillet and
                  A. Lauriac and
                  S. Male and
                  D. Manteigas},
  title        = {The right way to assess electronic system reliability: {FIDES}},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1401--1404},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00250-6},
  doi          = {10.1016/S0026-2714(03)00250-6},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/CharpenelDDGGGGLMM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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