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export results for "DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs."
@inproceedings{DBLP:conf/ets/MedeirosTFPH19, author = {Guilherme Cardoso Medeiros and Mottaqiallah Taouil and Moritz Fieback and Leticia Bolzani Poehls and Said Hamdioui}, title = {{DFT} Scheme for Hard-to-Detect Faults in FinFET SRAMs}, booktitle = {24th {IEEE} European Test Symposium, {ETS} 2019, Baden-Baden, Germany, May 27-31, 2019}, pages = {1--2}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ETS.2019.8791517}, doi = {10.1109/ETS.2019.8791517}, timestamp = {Sat, 05 Sep 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ets/MedeirosTFPH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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