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export results for "Built-in intermediate voltage testing for CMOS circuits."

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@inproceedings{DBLP:conf/date/TangLL95,
  author       = {Jing{-}Jou Tang and
                  Kuen{-}Jong Lee and
                  Bin{-}Da Liu},
  title        = {Built-in intermediate voltage testing for {CMOS} circuits},
  booktitle    = {1995 European Design and Test Conference, ED{\&}TC 1995, Paris,
                  France, March 6-9, 1995},
  pages        = {372--377},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/EDTC.1995.470369},
  doi          = {10.1109/EDTC.1995.470369},
  timestamp    = {Fri, 20 May 2022 15:41:46 +0200},
  biburl       = {https://dblp.org/rec/conf/date/TangLL95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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