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@article{DBLP:journals/tvlsi/KimJWYKNLSKROS23,
  author       = {Taehak Kim and
                  Jaehoon Jeong and
                  Seungmin Woo and
                  Jeonggyu Yang and
                  Hyunwoo Kim and
                  Ahyeon Nam and
                  Changdong Lee and
                  Jinmin Seo and
                  Minji Kim and
                  Siwon Ryu and
                  Yoonju Oh and
                  Taigon Song},
  title        = {{NS3K:} {A} 3-nm Nanosheet {FET} Standard Cell Library Development
                  and its Impact},
  journal      = {{IEEE} Trans. Very Large Scale Integr. Syst.},
  volume       = {31},
  number       = {2},
  pages        = {163--176},
  year         = {2023},
  url          = {https://doi.org/10.1109/TVLSI.2022.3229442},
  doi          = {10.1109/TVLSI.2022.3229442},
  timestamp    = {Fri, 10 Feb 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/tvlsi/KimJWYKNLSKROS23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/iscas/KimJWYKNLSKROS21,
  author       = {Taehak Kim and
                  Jaehoon Jeong and
                  Seungmin Woo and
                  Jeonggyu Yang and
                  Hyunwoo Kim and
                  Ahyeon Nam and
                  Changdong Lee and
                  Jinmin Seo and
                  Minji Kim and
                  Siwon Ryu and
                  Yoonju Oh and
                  Taigon Song},
  title        = {{NS3K:} {A} 3nm Nanosheet {FET} Library for {VLSI} Prediction in Advanced
                  Nodes},
  booktitle    = {{IEEE} International Symposium on Circuits and Systems, {ISCAS} 2021,
                  Daegu, South Korea, May 22-28, 2021},
  pages        = {1--5},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/ISCAS51556.2021.9401055},
  doi          = {10.1109/ISCAS51556.2021.9401055},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/iscas/KimJWYKNLSKROS21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/sensors/BaeLHNJLCKK17,
  author       = {Ji{-}Yong Bae and
                  Kye{-}Sung Lee and
                  Hwan Hur and
                  Ki{-}Hwan Nam and
                  Sukju Jung and
                  Ah{-}Yeong Lee and
                  Ki Soo Chang and
                  Geon{-}Hee Kim and
                  Ghiseok Kim},
  title        = {3D Defect Localization on Exothermic Faults within Multi-Layered Structures
                  Using Lock-In Thermography: An Experimental and Numerical Approach},
  journal      = {Sensors},
  volume       = {17},
  number       = {10},
  pages        = {2331},
  year         = {2017},
  url          = {https://doi.org/10.3390/s17102331},
  doi          = {10.3390/S17102331},
  timestamp    = {Wed, 14 Nov 2018 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/sensors/BaeLHNJLCKK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}