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export results for "A golden-template self-generating method for patterned wafer inspection."
@article{DBLP:journals/mva/XieG00, author = {Pin Xie and Sheng Uei Guan}, title = {A golden-template self-generating method for patterned wafer inspection}, journal = {Mach. Vis. Appl.}, volume = {12}, number = {3}, pages = {149--156}, year = {2000}, url = {https://doi.org/10.1007/s001380050133}, doi = {10.1007/S001380050133}, timestamp = {Wed, 17 May 2017 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mva/XieG00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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