default search action
Search dblp for Publications
export results for "Talal Jaber"
@inproceedings{DBLP:conf/itc/WuLRJST04, author = {David M. Wu and Mike Lin and Madhukar Reddy and Talal Jaber and Anil Sabbavarapu and Larry Thatcher}, title = {An Optimized {DFT} and Test Pattern Generation Strategy for an Intel High Performance Microprocessor}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {38--47}, year = {2004}, crossref = {DBLP:conf/itc/2004}, url = {https://doi.org/10.1109/TEST.2004.1386935}, doi = {10.1109/TEST.2004.1386935}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuLRJST04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuLMKSJJMP03, author = {David M. Wu and Mike Lin and Subhasish Mitra and Kee Sup Kim and Anil Sabbavarapu and Talal Jaber and Pete Johnson and Dale March and Greg Parrish}, title = {{H-DFT:} {A} Hybrid {DFT} Architecture For Low-Cost High Quality Structural Testing}, booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, {USA}}, pages = {1229--1238}, year = {2003}, crossref = {DBLP:conf/itc/2003}, url = {https://doi.org/10.1109/TEST.2003.1271112}, doi = {10.1109/TEST.2003.1271112}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuLMKSJJMP03.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/itc/2004, title = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://ieeexplore.ieee.org/xpl/conhome/9526/proceeding}, isbn = {0-7803-8581-0}, timestamp = {Sun, 15 Sep 2024 20:51:13 +0200}, biburl = {https://dblp.org/rec/conf/itc/2004.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/itc/2003, title = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, {USA}}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://ieeexplore.ieee.org/xpl/conhome/8970/proceeding}, isbn = {0-7803-8106-8}, timestamp = {Sun, 15 Sep 2024 20:51:13 +0200}, biburl = {https://dblp.org/rec/conf/itc/2003.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.