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@inproceedings{DBLP:conf/mtdt/ChoiPLKP03,
  author       = {Minsu Choi and
                  Nohpill Park and
                  Fabrizio Lombardi and
                  Yong{-}Bin Kim and
                  Vincenzo Piuri},
  title        = {Optimal Spare Utilization in Repairable and Reliable Memory Cores},
  booktitle    = {11th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2003), 28-29 July 2003, San Jose, CA, {USA}},
  pages        = {64--71},
  year         = {2003},
  crossref     = {DBLP:conf/mtdt/2003},
  url          = {https://doi.org/10.1109/MTDT.2003.1222363},
  doi          = {10.1109/MTDT.2003.1222363},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/ChoiPLKP03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/mtdt/2003,
  title        = {11th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2003), 28-29 July 2003, San Jose, CA, {USA}},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/8664/proceeding},
  isbn         = {0-7695-2004-9},
  timestamp    = {Fri, 15 Nov 2024 02:58:43 +0100},
  biburl       = {https://dblp.org/rec/conf/mtdt/2003.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}