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export results for "On minimizing the number of test points needed to achieve complete robust path delay fault testability."

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@inproceedings{DBLP:conf/vts/UppaluriSP96,
  author       = {Prasanti Uppaluri and
                  Uwe Sparmann and
                  Irith Pomeranz},
  title        = {On minimizing the number of test points needed to achieve complete
                  robust path delay fault testability},
  booktitle    = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
                  Princeton, NJ, {USA}},
  pages        = {288--295},
  year         = {1996},
  crossref     = {DBLP:conf/vts/1996},
  url          = {https://doi.org/10.1109/VTEST.1996.510870},
  doi          = {10.1109/VTEST.1996.510870},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/UppaluriSP96.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/vts/1996,
  title        = {14th {IEEE} {VLSI} Test Symposium (VTS'96), April 28 - May 1, 1996,
                  Princeton, NJ, {USA}},
  publisher    = {{IEEE} Computer Society},
  year         = {1996},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/3739/proceeding},
  isbn         = {0-8186-7304-4},
  timestamp    = {Mon, 16 Sep 2024 21:45:06 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/1996.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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