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@inproceedings{DBLP:conf/itc/AbadirA19,
author = {Magdy Abadir and
Sohrab Aftabjahani},
title = {An Overview of the International Microprocessor/ SoC Test, Security
and Validation (MTV)Workshop},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--2},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000128},
doi = {10.1109/ITC44170.2019.9000128},
timestamp = {Mon, 24 Feb 2020 17:28:46 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbadirA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbadirA19a,
author = {Magdy Abadir and
Sohrab Aftabjahani},
title = {An Overview of the International Verification and Security Workshop
{(IVSW)}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--2},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000165},
doi = {10.1109/ITC44170.2019.9000165},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbadirA19a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgboTH19,
author = {Innocent Okwudili Agbo and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Reliability Modeling and Mitigation for Embedded Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000175},
doi = {10.1109/ITC44170.2019.9000175},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgboTH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BoschiLLSGHSZ19,
author = {Gabriele Boschi and
Donato Luongo and
Duccio Lazzarotti and
Hanna Shaheen and
Hayk T. Grigoryan and
Gurgen Harutyunyan and
Samvel K. Shoukourian and
Yervant Zorian},
title = {Memory {FIT} Rate Mitigation Technique for Automotive SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000158},
doi = {10.1109/ITC44170.2019.9000158},
timestamp = {Mon, 03 Aug 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/BoschiLLSGHSZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaudhuriLC19,
author = {Arjun Chaudhuri and
Mengyun Liu and
Krishnendu Chakrabarty},
title = {Fault-Tolerant Neuromorphic Computing Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000146},
doi = {10.1109/ITC44170.2019.9000146},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChaudhuriLC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChaudhuriYCC19,
author = {Arjun Chaudhuri and
Bonan Yan and
Yiran Chen and
Krishnendu Chakrabarty},
title = {Hardware Fault Tolerance for Binary {RRAM} Crossbars},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000179},
doi = {10.1109/ITC44170.2019.9000179},
timestamp = {Mon, 04 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChaudhuriYCC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenC19,
author = {Tao Chen and
Degang Chen},
title = {Built-in self-test and self-calibration for analog and mixed signal
circuits},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000120},
doi = {10.1109/ITC44170.2019.9000120},
timestamp = {Tue, 26 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenLCW19,
author = {Hao Chen and
Mincent Lee and
Liang{-}Yen Chen and
Min{-}Jer Wang},
title = {High Quality Test Methodology for Highly Reliable Devices},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000174},
doi = {10.1109/ITC44170.2019.9000174},
timestamp = {Wed, 26 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenLCW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChowdhuryGBMF19,
author = {Sreeja Chowdhury and
Fatemeh Ganji and
Troy Bryant and
Nima Maghari and
Domenic Forte},
title = {Recycled Analog and Mixed Signal Chip Detection at Zero Cost Using
{LDO} Degradation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000118},
doi = {10.1109/ITC44170.2019.9000118},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChowdhuryGBMF19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChuH19,
author = {Wei Chu and
Shi{-}Yu Huang},
title = {Overall Strategy for Online Clock System Checking Supporting Heterogeneous
Integration},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000116},
doi = {10.1109/ITC44170.2019.9000116},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChuH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DamljanovicJPSS19,
author = {Aleksa Damljanovic and
Artur Jutman and
Michele Portolan and
Ernesto S{\'{a}}nchez and
Giovanni Squillero and
Anton Tsertov},
title = {Simulation-based Equivalence Checking between {IEEE} 1687 {ICL} and
{RTL}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000181},
doi = {10.1109/ITC44170.2019.9000181},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DamljanovicJPSS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DobbelaereCCVXG19,
author = {Wim Dobbelaere and
Frederik Colle and
Anthony Coyette and
Ronny Vanhooren and
Nektar Xama and
Jhon Gomez and
Georges G. E. Gielen},
title = {Applying Vstress and defect activation coverage to produce zero-defect
mixed-signal automotive ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000123},
doi = {10.1109/ITC44170.2019.9000123},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/DobbelaereCCVXG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuncanRLFT19,
author = {Adam Duncan and
Fahim Rahman and
Andrew Lukefahr and
Farimah Farahmandi and
Mark M. Tehranipoor},
title = {{FPGA} Bitstream Security: {A} Day in the Life},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000145},
doi = {10.1109/ITC44170.2019.9000145},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuncanRLFT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DuvalsaintJNB19,
author = {Danielle Duvalsaint and
Xiaoxiao Jin and
Benjamin Niewenhuis and
R. D. (Shawn) Blanton},
title = {Characterization of Locked Combinational Circuits via {ATPG}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000130},
doi = {10.1109/ITC44170.2019.9000130},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DuvalsaintJNB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Eggersgluss19,
author = {Stephan Eggersgl{\"{u}}{\ss}},
title = {Towards Complete Fault Coverage by Test Point Insertion using Optimization-SAT
Techniques},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000152},
doi = {10.1109/ITC44170.2019.9000152},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Eggersgluss19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EggersglussHJMR19,
author = {Stephan Eggersgl{\"{u}}{\ss} and
Said Hamdioui and
Artur Jutman and
Maria K. Michael and
Jaan Raik and
Matteo Sonza Reorda and
Mehdi Baradaran Tahoori and
Elena Ioana Vatajelu},
title = {{IEEE} European Test Symposium {(ETS)}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000148},
doi = {10.1109/ITC44170.2019.9000148},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/EggersglussHJMR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EnyediM19,
author = {Szil{\'{a}}rd Enyedi and
Liviu Miclea},
title = {{IEEE} International Conference on Automation, Quality and Testing,
Robotics {(AQTR)}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000144},
doi = {10.1109/ITC44170.2019.9000144},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EnyediM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FarzanaRTF19,
author = {Nusrat Farzana and
Fahim Rahman and
Mark M. Tehranipoor and
Farimah Farahmandi},
title = {SoC Security Verification using Property Checking},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000170},
doi = {10.1109/ITC44170.2019.9000170},
timestamp = {Tue, 30 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FarzanaRTF19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FiebackWMARMTH19,
author = {Moritz Fieback and
Lizhou Wu and
Guilherme Cardoso Medeiros and
Hassen Aziza and
Siddharth Rao and
Erik Jan Marinissen and
Mottaqiallah Taouil and
Said Hamdioui},
title = {Device-Aware Test: {A} New Test Approach Towards {DPPB} Level},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000134},
doi = {10.1109/ITC44170.2019.9000134},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FiebackWMARMTH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FloridiaPRSLM19,
author = {Andrea Floridia and
Davide Piumatti and
Annachiara Ruospo and
Ernesto S{\'{a}}nchez and
Sergio de Luca and
Rosario Martorana},
title = {A Decentralized Scheduler for On-line Self-test Routines in Multi-core
Automotive System-on-Chips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000129},
doi = {10.1109/ITC44170.2019.9000129},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FloridiaPRSLM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ForteBKPT19,
author = {Domenic Forte and
Swarup Bhunia and
Ramesh Karri and
Jim Plusquellic and
Mark M. Tehranipoor},
title = {{IEEE} International Symposium on Hardware Oriented Security and Trust
{(HOST):} Past, Present, and Future},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000111},
doi = {10.1109/ITC44170.2019.9000111},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ForteBKPT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GaoMHSBHCGM19,
author = {Zhan Gao and
Santosh Malagi and
Min{-}Chun Hu and
Joe Swenton and
Rogier Baert and
Jos Huisken and
Bilal Chehab and
Kees Goossens and
Erik Jan Marinissen},
title = {Application of Cell-Aware Test on an Advanced 3nm {CMOS} Technology
Library},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000164},
doi = {10.1109/ITC44170.2019.9000164},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GaoMHSBHCGM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GebregiorgisT19,
author = {Anteneh Gebregiorgis and
Mehdi Baradaran Tahoori},
title = {Testing of Neuromorphic Circuits: Structural vs Functional},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000110},
doi = {10.1109/ITC44170.2019.9000110},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GebregiorgisT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HamdiouiFNT19,
author = {Said Hamdioui and
Moritz Fieback and
Surya Nagarajan and
Mottaqiallah Taouil},
title = {Testing Computation-in-Memory Architectures Based on Emerging Memories},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000117},
doi = {10.1109/ITC44170.2019.9000117},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HamdiouiFNT19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/He19,
author = {Chen He},
title = {Advanced Burn-In - An Optimized Product Stress and Test Flow for Automotive
Microcontrollers},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000147},
doi = {10.1109/ITC44170.2019.9000147},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/He19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HeL19,
author = {Yi He and
Yanjing Li},
title = {Time-Slicing Soft Error Resilience in Microprocessors for Reliable
and Energy-Efficient Execution},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000180},
doi = {10.1109/ITC44170.2019.9000180},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HeL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HolstSKWW19,
author = {Stefan Holst and
Eric Schneider and
Michael A. Kochte and
Xiaoqing Wen and
Hans{-}Joachim Wunderlich},
title = {Variation-Aware Small Delay Fault Diagnosis on Compressed Test Responses},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000143},
doi = {10.1109/ITC44170.2019.9000143},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HolstSKWW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangLTCWJCL19,
author = {Andrew Yi{-}Ann Huang and
Katherine Shu{-}Min Li and
Cheng{-}Yen Tsai and
Ken Chau{-}Cheung Cheng and
Sying{-}Jyan Wang and
Xu{-}Hao Jiang and
Leon Chou and
Chen{-}Shiun Lee},
title = {TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000166},
doi = {10.1109/ITC44170.2019.9000166},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/HuangLTCWJCL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IbrahimK19,
author = {Ahmed M. Y. Ibrahim and
Hans G. Kerkhoff},
title = {{DARS:} An {EDA} Framework for Reliability and Functional Safety Management
of System-on-Chips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000112},
doi = {10.1109/ITC44170.2019.9000112},
timestamp = {Sat, 19 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IbrahimK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IchiyamaKI19,
author = {Kiyotaka Ichiyama and
Takashi Kusaka and
Masahiro Ishida},
title = {A Jitter Injection Module for Production Test of 52-Gbps {PAM4} Signal
Interfaces},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000138},
doi = {10.1109/ITC44170.2019.9000138},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/IchiyamaKI19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/IkedaSLMXN19,
author = {Kosuke Ikeda and
Keith Schaub and
Ira Leventhal and
Yiorgos Makris and
Constantinos Xanthopoulos and
Deepika Neethirajan},
title = {Subtle Anomaly Detection of Microscopic Probes using Deep learning
based Image Completion},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000126},
doi = {10.1109/ITC44170.2019.9000126},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/IkedaSLMXN19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/InoueLW19,
author = {Michiko Inoue and
Xiaowei Li and
Cheng{-}Wen Wu},
title = {Asian Test Symposium - Past, Present and Future -},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000151},
doi = {10.1109/ITC44170.2019.9000151},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/InoueLW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JayasankaranSAS19,
author = {Nithyashankari Gummidipoondi Jayasankaran and
Adriana C. Sanabria{-}Borbon and
Amr Abuellil and
Edgar S{\'{a}}nchez{-}Sinencio and
Jiang Hu and
Jeyavijayan Rajendran},
title = {Breaking Analog Locking Techniques via Satisfiability Modulo Theories},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000113},
doi = {10.1109/ITC44170.2019.9000113},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JayasankaranSAS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimLY19,
author = {Jisuk Kim and
Jinyub Lee and
Sungjoo Yoo},
title = {Machine Learning-Based Automatic Generation of eFuse Configuration
in {NAND} Flash Chip},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--9},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000162},
doi = {10.1109/ITC44170.2019.9000162},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimLY19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoganA19,
author = {Tal Kogan and
Yehonatan Abotbol},
title = {Virtual Memory Structures Facilitating Memory {BIST} Insertion In
Complex SoCs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000153},
doi = {10.1109/ITC44170.2019.9000153},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoganA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LarssonMK19,
author = {Erik Larsson and
Prathamesh Murali and
Gani Kumisbek},
title = {{IEEE} Std. {P1687.1:} Translator and Protocol},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000135},
doi = {10.1109/ITC44170.2019.9000135},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LarssonMK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeHLIZ19,
author = {Kuen{-}Jong Lee and
Shi{-}Yu Huang and
Huawei Li and
Tomoo Inoue and
Yervant Zorian},
title = {International Test Conference in Asia (ITC-Asia) - Bridging {ITC}
and Test Community in Asia},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000177},
doi = {10.1109/ITC44170.2019.9000177},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeHLIZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiLH19,
author = {Huawei Li and
Xiaowei Li and
Yinhe Han},
title = {China Test Conference {(CTC)} - Extending the Global Test Forum to
China},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000121},
doi = {10.1109/ITC44170.2019.9000121},
timestamp = {Tue, 23 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/LiLH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiangCK19,
author = {Tung{-}Che Liang and
Krishnendu Chakrabarty and
Ramesh Karri},
title = {Programmable Daisychaining of Microelectrodes for {IP} Protection
in {MEDA} Biochips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000167},
doi = {10.1109/ITC44170.2019.9000167},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiangCK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuHFB19,
author = {Zeye Liu and
Qicheng Huang and
Chenlei Fang and
R. D. (Shawn) Blanton},
title = {Improving Test Chip Design Efficiency via Machine Learning},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000131},
doi = {10.1109/ITC44170.2019.9000131},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuHFB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiuLCG19,
author = {Mengyun Liu and
Xin Li and
Krishnendu Chakrabarty and
Xinli Gu},
title = {Knowledge Transfer in Board-Level Functional Fault Identification
using Domain Adaptation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000172},
doi = {10.1109/ITC44170.2019.9000172},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiuLCG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LotfiHBRSBH19,
author = {Atieh Lotfi and
Saurabh Hukerikar and
Keshav Balasubramanian and
Paul Racunas and
Nirmal R. Saxena and
Richard Bramley and
Yanxiang Huang},
title = {Resiliency of automotive object detection networks on {GPU} architectures},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--9},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000150},
doi = {10.1109/ITC44170.2019.9000150},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LotfiHBRSBH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LylinaARSBW19,
author = {Natalia Lylina and
Ahmed Atteya and
Pascal Raiola and
Matthias Sauer and
Bernd Becker and
Hans{-}Joachim Wunderlich},
title = {Security Compliance Analysis of Reconfigurable Scan Networks},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--9},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000114},
doi = {10.1109/ITC44170.2019.9000114},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LylinaARSBW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaazSH19,
author = {Mohammad Urf Maaz and
Alexander Sprenger and
Sybille Hellebrand},
title = {A Hybrid Space Compactor for Adaptive X-Handling},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--8},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000159},
doi = {10.1109/ITC44170.2019.9000159},
timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaazSH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McLaurinK19,
author = {Teresa McLaurin and
Rob Knoth},
title = {The Challenges of Implementing an {MBIST} Interface: {A} Practical
Application},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000157},
doi = {10.1109/ITC44170.2019.9000157},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McLaurinK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MozaffariBNAPSC19,
author = {Seyed Nima Mozaffari and
Bonita Bhaskaran and
Kaushik Narayanun and
Ayub Abdollahian and
Vinod Pagalone and
Shantanu Sarangi and
Jonathon E. Colburn},
title = {An Efficient Supervised Learning Method to Predict Power Supply Noise
During At-speed Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000171},
doi = {10.1109/ITC44170.2019.9000171},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MozaffariBNAPSC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MukherjeeTTSLMM19,
author = {Nilanjan Mukherjee and
Jerzy Tyszer and
Daniel Tille and
Mahendar Sapati and
Yingdi Liu and
Jeffrey Mayer and
Sylwester Milewski and
Elham K. Moghaddam and
Janusz Rajski and
Jedrzej Solecki},
title = {Test Time and Area Optimized BrST Scheme for Automotive ICs},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000133},
doi = {10.1109/ITC44170.2019.9000133},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MukherjeeTTSLMM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NienWLCCCLKC19,
author = {Yu{-}Teng Nien and
Kai{-}Chiang Wu and
Dong{-}Zhen Lee and
Ying{-}Yen Chen and
Po{-}Lin Chen and
Mason Chern and
Jih{-}Nung Lee and
Shu{-}Yi Kao and
Mango Chia{-}Tso Chao},
title = {Methodology of Generating Timing-Slack-Based Cell-Aware Tests},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000119},
doi = {10.1109/ITC44170.2019.9000119},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/NienWLCCCLKC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OckunzziGKTPJ19,
author = {Kelly Ockunzzi and
Richard Grupp and
Brion Keller and
Mark Taylor and
Sreekanth Pai and
Greeshma Jayakumar},
title = {Applications of Hierarchical Test},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000156},
doi = {10.1109/ITC44170.2019.9000156},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OckunzziGKTPJ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/OmuroSKO19,
author = {Toshiyuki Omuro and
Shigeo Nakamura Surname and
Takashi Kimura and
Kiyokawa Omuro},
title = {A New Test Method for the Large Current Magnetic Sensors},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000142},
doi = {10.1109/ITC44170.2019.9000142},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/OmuroSKO19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PandeyGLNSC19,
author = {Sujay Pandey and
Sanya Gupta and
Madhu Sudhan L. and
Suriya Natarajan and
Arani Sinha and
Abhijit Chatterjee},
title = {Characterization of Library Cells for Open-circuit Defect Exposure:
{A} Systematic Methodology},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000154},
doi = {10.1109/ITC44170.2019.9000154},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PandeyGLNSC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PapameletisCFSC19,
author = {Christos Papameletis and
Vivek Chickermane and
Brian Foutz and
Sarthak Singhal and
Krishna Chakravadhanula},
title = {Optimized Physical {DFT} Synthesis of Unified Compression and {LBIST}
for Automotive Applications},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000115},
doi = {10.1109/ITC44170.2019.9000115},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PapameletisCFSC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz19,
author = {Irith Pomeranz},
title = {Iterative Test Generation for Gate-Exhaustive Faults to Cover the
Sites of Undetectable Target Faults},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000124},
doi = {10.1109/ITC44170.2019.9000124},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pomeranz19a,
author = {Irith Pomeranz},
title = {Compaction of a Functional Broadside Test Set through the Compaction
of a Functional Test Sequence without Sequential Fault Simulation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000161},
doi = {10.1109/ITC44170.2019.9000161},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pomeranz19a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ReddyBM19,
author = {Gaurav Rajavendra Reddy and
Mohammad{-}Mahdi Bidmeshki and
Yiorgos Makris},
title = {{VIPER:} {A} Versatile and Intuitive Pattern GenERator for Early Design
Space Exploration},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000169},
doi = {10.1109/ITC44170.2019.9000169},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ReddyBM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RojasHC19,
author = {Luis D. Rojas and
Kevin Hess and
Christina Carter{-}Brown},
title = {Effectively Using Machine Learning to Expedite System Level Test Failure
Debug},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000163},
doi = {10.1109/ITC44170.2019.9000163},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RojasHC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchromHMVKF19,
author = {Gerhard Schrom and
Michael J. Hill and
Sarath Makala and
Ravi Sankar Vunnam and
Arun Krishnamoorthy and
Ryan Ferguson},
title = {Efficiency Measurement Method for Fully Integrated Voltage Regulators
used in 4\({}^{\mbox{th}}\) and 5\({}^{\mbox{th}}\) Generation Intel{\textregistered}
Core{\texttrademark} Microprocessors},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000125},
doi = {10.1109/ITC44170.2019.9000125},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/SchromHMVKF19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShanWWS19,
author = {Chuanhe Jay Shan and
Ahmed Wahba and
Li{-}C. Wang and
Nik Sumikawa},
title = {Deploying {A} Machine Learning Solution As {A} Surrogate},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000109},
doi = {10.1109/ITC44170.2019.9000109},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShanWWS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShenLHW19,
author = {Cheng{-}Hsien Shen and
Aaron C.{-}W. Liang and
Charles C.{-}H. Hsu and
Charles H.{-}P. Wen},
title = {{FAE:} Autoencoder-Based Failure Binning of {RTL} Designs for Verification
and Debugging},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000178},
doi = {10.1109/ITC44170.2019.9000178},
timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShenLHW19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShoukourianSS19,
author = {Samvel K. Shoukourian and
Yuri Shoukourian and
Vladimir Sahakyan},
title = {Armenia: Communicating to World Community in Electronic Test and Design},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--3},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000139},
doi = {10.1109/ITC44170.2019.9000139},
timestamp = {Sun, 25 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ShoukourianSS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Singh19,
author = {Adit D. Singh},
title = {An Adaptive Approach to Minimize System Level Tests Targeting Low
Voltage {DVFS} Failures},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000173},
doi = {10.1109/ITC44170.2019.9000173},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Singh19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StamenkovicBCNP19,
author = {Zoran Stamenkovic and
Alberto Bosio and
Gy{\"{o}}rgy Cserey and
Ondrej Nov{\'{a}}k and
Witold A. Pleskacz and
Luk{\'{a}}s Sekanina and
Andreas Steininger and
Goran Stojanovic and
Viera Stopjakov{\'{a}}},
title = {International Symposium on Design and Diagnostics of Electronic Circuits
and Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000137},
doi = {10.1109/ITC44170.2019.9000137},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/StamenkovicBCNP19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SuGZ19,
author = {Fei Su and
Prashant Goteti and
Min Zhang},
title = {On Freedom from Interference in Mixed-Criticality Systems: {A} Causal
Learning Approach},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000160},
doi = {10.1109/ITC44170.2019.9000160},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SuGZ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sunter19,
author = {Stephen Sunter},
title = {Efficient Analog Defect Simulation},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000141},
doi = {10.1109/ITC44170.2019.9000141},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sunter19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VashisthaRPA19,
author = {Nidish Vashistha and
M. Tanjidur Rahman and
Olivia P. Paradis and
Navid Asadizanjani},
title = {Is Backside the New Backdoor in Modern SoCs?: Invited Paper},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000127},
doi = {10.1109/ITC44170.2019.9000127},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VashisthaRPA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WangG19,
author = {Fangzhou Wang and
Sandeep Gupta},
title = {Multi-cell characterization: Developing robust cells and abstraction
for Rapid Single Flux Quantum {(RSFQ)} Logic},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000132},
doi = {10.1109/ITC44170.2019.9000132},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/WangG19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XuA19,
author = {Zheng Xu and
Jacob Abraham},
title = {Safety Design of a Convolutional Neural Network Accelerator with Error
Localization and Correction},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000149},
doi = {10.1109/ITC44170.2019.9000149},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XuA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangK19,
author = {Jingchi Yang and
David C. Keezer},
title = {A Framework for Design of Self-Repairing Digital Systems},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000155},
doi = {10.1109/ITC44170.2019.9000155},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhongC19,
author = {Zhanwei Zhong and
Krishnendu Chakrabarty},
title = {Fault Recovery in Micro-Electrode-Dot-Array Digital Microfluidic Biochips
Using an {IJTAG} NetworkBehaviors},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000176},
doi = {10.1109/ITC44170.2019.9000176},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhongC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhongZZHC19,
author = {Zhanwei Zhong and
Haodong Zhu and
Peiran Zhang and
Tony Jun Huang and
Krishnendu Chakrabarty},
title = {Structural Test and Functional Test for Digital Acoustofluidic Biochips},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--10},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000140},
doi = {10.1109/ITC44170.2019.9000140},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhongZZHC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianHCL19,
author = {Yervant Zorian and
Vladimir Hahanov and
Svetlana Chumachenko and
Eugenia Litvinova},
title = {17th {IEEE} East-West Design and Test Symposium},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000168},
doi = {10.1109/ITC44170.2019.9000168},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianHCL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianSV19,
author = {Apik Zorian and
Basim Shanyour and
Milir Vaseekar},
title = {Machine Learning-Based {DFT} Recommendation System for {ATPG} {QOR}},
booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
pages = {1--7},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/ITC44170.2019.9000136},
doi = {10.1109/ITC44170.2019.9000136},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianSV19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2019,
title = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC,
USA, November 9-15, 2019},
publisher = {{IEEE}},
year = {2019},
url = {https://ieeexplore.ieee.org/xpl/conhome/8977396/proceeding},
isbn = {978-1-7281-4823-6},
timestamp = {Mon, 24 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/2019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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