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@inproceedings{DBLP:conf/itc/AcarO04, author = {Erkan Acar and Sule Ozev}, title = {Delayed-RF Based Test Development for {FM} Transceivers Using Signature Analysis}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {783--792}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387341}, doi = {10.1109/TEST.2004.1387341}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AcarO04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Aitken04, author = {Robert C. Aitken}, title = {A Modular Wrapper Enabling High Speed {BIST} and Repair for Small Wide Memories}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {997--1005}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387365}, doi = {10.1109/TEST.2004.1387365}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Aitken04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Aldrich04, author = {Greg Aldrich}, title = {100 {DPPM} in Nanometer Technology - Is it achievable?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1417}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387425}, doi = {10.1109/TEST.2004.1387425}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Aldrich04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AmyeenVOL04, author = {M. Enamul Amyeen and Srikanth Venkataraman and Ajay Ojha and Sangbong Lee}, title = {Evaluation of the Quality of N-Detect Scan {ATPG} Patterns on a Processor}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {669--678}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387328}, doi = {10.1109/TEST.2004.1387328}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AmyeenVOL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Anderson04, author = {Thomas J. Anderson}, title = {Practical Instrumentation Integration Considerations}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1078--1080}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387381}, doi = {10.1109/TEST.2004.1387381}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Anderson04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ArslanO04, author = {Baris Arslan and Alex Orailoglu}, title = {Test Cost Reduction Through {A} Reconfigurable Scan Architecture}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {945--952}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387359}, doi = {10.1109/TEST.2004.1387359}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ArslanO04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BakerN04, author = {Kendrick Baker and Mehrdad Nourani}, title = {Interconnect Test Pattern Generation Algorithm For Meeting Device and Global {SSO} Limits With Safe Initial Vectors}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {163--172}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386949}, doi = {10.1109/TEST.2004.1386949}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BakerN04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BalakrishnanT04, author = {Kedarnath J. Balakrishnan and Nur A. Touba}, title = {Improving Encoding Efficiency for Linear Decompressors Using Scan Inversion}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {936--944}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387358}, doi = {10.1109/TEST.2004.1387358}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BalakrishnanT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BalenAARL04, author = {Tiago R. Balen and Antonio Andrade Jr. and Florence Aza{\"{\i}}s and Michel Renovell and Marcelo Lubaszewski}, title = {Testing the Configurable Analog Blocks of Field Programmable Analog Arrays}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {893--902}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387353}, doi = {10.1109/TEST.2004.1387353}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BalenAARL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Bartenstein04, author = {Thomas Bartenstein}, title = {Panel 9 - Diagnostics vs. Failure Analysis}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1439}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387447}, doi = {10.1109/TEST.2004.1387447}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Bartenstein04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Benware04, author = {Brady Benware}, title = {Achieving Sub 100 {DPPM} Defect Levels on {VDSM} and Nanometer ASICs}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1418}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387426}, doi = {10.1109/TEST.2004.1387426}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Benware04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BenwareLSKMKKR04, author = {Brady Benware and Cam Lu and John Van Slyke and Prabhu Krishnamurthy and Robert Madge and Martin Keim and Mark Kassab and Janusz Rajski}, title = {Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1285--1294}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387403}, doi = {10.1109/TEST.2004.1387403}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BenwareLSKMKKR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BhattacharyaC04, author = {Soumendu Bhattacharya and Abhijit Chatterjee}, title = {Use of Embedded Sensors for Built-In-Test of {RF} Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {801--809}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387343}, doi = {10.1109/TEST.2004.1387343}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BhattacharyaC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BotaRRSK04, author = {Sebasti{\`{a}} A. Bota and M. Rosales and Jos{\'{e}} Luis Rossell{\'{o}} and Jaume Segura and Ali Keshavarzi}, title = {Within Die Thermal Gradient Impact on Clock-Skew: {A} New Type of Delay-Fault Mechanism}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1276--1284}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387402}, doi = {10.1109/TEST.2004.1387402}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BotaRRSK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BrandVMM04, author = {Kenneth A. Brand and Erik H. Volkerink and Edward J. McCluskey and Subhasish Mitra}, title = {Speed Clustering of Integrated Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1128--1137}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387387}, doi = {10.1109/TEST.2004.1387387}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BrandVMM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BrownB04, author = {Jason G. Brown and R. D. (Shawn) Blanton}, title = {{CAEN-BIST:} Testing the NanoFabric}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {462--471}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386982}, doi = {10.1109/TEST.2004.1386982}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BrownB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BrownFWLB04, author = {Dana Brown and John Ferrario and Randy Wolf and Jing Li and Jayendra Bhagat}, title = {{RF} Testing on a Mixed Signal Tester}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {793--800}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387342}, doi = {10.1109/TEST.2004.1387342}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BrownFWLB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Butler04, author = {Kenneth M. Butler}, title = {Sure You Can Get to 100 {DPPM} in Deep Submicron, But It'll Cost Ya}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1419}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387427}, doi = {10.1109/TEST.2004.1387427}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Butler04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ButlerSFH04, author = {Kenneth M. Butler and Jayashree Saxena and Tony Fryars and Graham Hetherington}, title = {Minimizing Power Consumption in Scan Testing: Pattern Generation and {DFT} Techniques}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {355--364}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386971}, doi = {10.1109/TEST.2004.1386971}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ButlerSFH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/CabbiboCJ04, author = {A. Cabbibo and J. Conder and M. Jacobs}, title = {Feed Forward Test Methodology Utilizing Device Identification}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {655--660}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387326}, doi = {10.1109/TEST.2004.1387326}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/CabbiboCJ04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChakravartyST04, author = {Sreejit Chakravarty and Eric W. Savage and Eric N. Tran}, title = {Defect Coverage Analysis of Partitioned Testing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {907--915}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387355}, doi = {10.1109/TEST.2004.1387355}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChakravartyST04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChandrasekarH04, author = {Kameshwar Chandrasekar and Michael S. Hsiao}, title = {Decision Selection and Learning for an All-Solutions {ATPG} Engine}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {607--616}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386998}, doi = {10.1109/TEST.2004.1386998}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChandrasekarH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChatterjeeSK04, author = {Bhaskar Chatterjee and Manoj Sachdev and Ali Keshavarzi}, title = {A {DFT} Technique for Delay Fault Testability and Diagnostics in 32-Bit High Performance {CMOS} ALUs}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1108--1117}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387385}, doi = {10.1109/TEST.2004.1387385}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChatterjeeSK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChengHWLDHHL04, author = {Kuo{-}Liang Cheng and Jing{-}Reng Huang and Chih{-}Wea Wang and Chih{-}Yen Lo and Li{-}Ming Denq and Chih{-}Tsun Huang and Shin{-}Wei Hung and Jye{-}Yuan Lee}, title = {An {SOC} Test Integration Platform and Its Industrial Realization}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1213--1222}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387394}, doi = {10.1109/TEST.2004.1387394}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChengHWLDHHL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChiangWHC04, author = {Chen{-}Huan Chiang and Paul J. Wheatley and Kenneth Y. Ho and Ken L. Cheung}, title = {Testing and Remote Field Update of Distributed Base Stations in a Wireless Network}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {711--718}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387333}, doi = {10.1109/TEST.2004.1387333}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChiangWHC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChiangZCR04, author = {Man Wah Chiang and Zeljko Zilic and Jean{-}Samuel Chenard and Katarzyna Radecka}, title = {Architectures of Increased Availability Wireless Sensor Network Nodes}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1232--1241}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387396}, doi = {10.1109/TEST.2004.1387396}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChiangZCR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChickermaneFK04, author = {Vivek Chickermane and Brian Foutz and Brion L. Keller}, title = {Channel Masking Synthesis for Efficient On-Chip Test Compression}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {452--461}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386981}, doi = {10.1109/TEST.2004.1386981}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChickermaneFK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ClarkR04, author = {C. J. Clark and Mike Ricchetti}, title = {A Code-less {BIST} Processor for Embedded Test and in-system configuration of Boards and Systems}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {857--866}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387349}, doi = {10.1109/TEST.2004.1387349}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ClarkR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Cole04, author = {Edward I. Cole Jr.}, title = {Global Failure Localization: We Have To, But on What and How?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1440}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387448}, doi = {10.1109/TEST.2004.1387448}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Cole04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/CornoRTE04, author = {Fulvio Corno and Matteo Sonza Reorda and Simonluca Tosato and F. Esposito}, title = {Evaluating the Effects of Transient Faults on Vehicle Dynamic Performance in Automotive Systems}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1332--1339}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387408}, doi = {10.1109/TEST.2004.1387408}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/CornoRTE04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Crouch04, author = {Alfred L. Crouch}, title = {Future Trends in Test: The Adoption and Use of Low Cost Structural Testers}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {698--703}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387331}, doi = {10.1109/TEST.2004.1387331}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Crouch04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaaschR04, author = {W. Robert Daasch and Manu Rehani}, title = {Dude! Where's my data? - Cracking Open the Hermetically Sealed Tester}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1428}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387436}, doi = {10.1109/TEST.2004.1387436}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaaschR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DaiSYQ04, author = {Foster F. Dai and Charles E. Stroud and Dayu Yang and Shuying Qi}, title = {Automatic Linearity {(IP3)} Test with Built-in Pattern Generator and Analyzer}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {271--280}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386961}, doi = {10.1109/TEST.2004.1386961}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DaiSYQ04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DattaGSAd04, author = {Ramyanshu Datta and Ravi Gupta and Antony Sebastine and Jacob A. Abraham and Manuel A. d'Abreu}, title = {Tri-Scan: {A} Novel {DFT} Technique for {CMOS} Path Delay Fault Testing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1118--1127}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387386}, doi = {10.1109/TEST.2004.1387386}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DattaGSAd04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DengG04, author = {Baolin Deng and Wolfram Glauert}, title = {Formal Description of Test Specification and {ATE} Architecture for Mixed-Signal Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1081--1090}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387382}, doi = {10.1109/TEST.2004.1387382}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DengG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DowdingWO04, author = {David Dowding and Ernie Wahl and Don Organ}, title = {Extending {STIL} 1450 Standard for Test Program Flow}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {423--431}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386978}, doi = {10.1109/TEST.2004.1386978}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DowdingWO04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Eklow04, author = {Bill Eklow}, title = {What Do You Mean My Board Test Stinks?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1423}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387431}, doi = {10.1109/TEST.2004.1387431}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Eklow04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/EklowHKPVC04, author = {Bill Eklow and Anoosh Hosseini and Chi Khuong and Shyam Pullela and Toai Vo and Hien Chau}, title = {Simulation Based System Level Fault Insertion Using Co-verification Tools}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {704--710}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387332}, doi = {10.1109/TEST.2004.1387332}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/EklowHKPVC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Fleury04, author = {H{\'{e}}rv{\'{e}} Fleury}, title = {Electronic circuit comprising a secret sub-module}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1412}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387420}, doi = {10.1109/TEST.2004.1387420}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Fleury04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Gattiker04, author = {Anne E. Gattiker}, title = {Diagnosis Meets Physical Failure Analysis: How Long can we Succeed?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1441}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387449}, doi = {10.1109/TEST.2004.1387449}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Gattiker04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GavardoniJPC04, author = {Maurizio Gavardoni and Michael Jones and Russell Poffenberger and Miguel Conde}, title = {System Monitor for Diagnostic, Calibration and System Configuration}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1263--1268}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387400}, doi = {10.1109/TEST.2004.1387400}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GavardoniJPC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GhermanWVHWG04, author = {Valentin Gherman and Hans{-}Joachim Wunderlich and Harald P. E. Vranken and Friedrich Hapke and Michael Wittke and Michael Garbers}, title = {Efficient Pattern Mapping for Deterministic Logic {BIST}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {48--56}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386936}, doi = {10.1109/TEST.2004.1386936}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GhermanWVHWG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GhoshTB04, author = {Shalini Ghosh and Nur A. Touba and Sugato Basu}, title = {Reducing Power Consumption in Memory {ECC} Checkers}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1322--1331}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387407}, doi = {10.1109/TEST.2004.1387407}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GhoshTB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GillisWFM04, author = {Pamela S. Gillis and Francis Woytowich and Andrew Ferko and Kevin McCauley}, title = {Low Overhead Delay Testing of {ASICS}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {534--542}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386990}, doi = {10.1109/TEST.2004.1386990}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GillisWFM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GoorHW04, author = {Ad J. van de Goor and Said Hamdioui and Rob Wadsworth}, title = {Detecting Faults in the Peripheral Circuits and an Evaluation of {SRAM} Tests}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {114--123}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386943}, doi = {10.1109/TEST.2004.1386943}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GoorHW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GuWLETTKR04, author = {Xinli Gu and Cyndee Wang and Abby Lee and Bill Eklow and Kun{-}Han Tsai and Jan Arild Tofte and Mark Kassab and Janusz Rajski}, title = {Realizing High Test Quality Goals with Smart Test Resource Usage}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {525--533}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386989}, doi = {10.1109/TEST.2004.1386989}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GuWLETTKR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GuptaH04, author = {Puneet Gupta and Michael S. Hsiao}, title = {{ALAPTF:} {A} new Transition Faultmodel and the {ATPG} Algorithm}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1053--1060}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387378}, doi = {10.1109/TEST.2004.1387378}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GuptaH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GyvezGCPBK04, author = {Jos{\'{e}} Pineda de Gyvez and Guido Gronthoud and Cristiano Cenci and Martin Posch and Thomas Burger and Manfred Koller}, title = {Power Supply Ramping for Quasi-static Testing of PLLs}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {980--987}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387363}, doi = {10.1109/TEST.2004.1387363}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GyvezGCPBK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Hafed04, author = {Mohamed Hafed}, title = {Glamorous Analog Testability - We Already Test them and Ship Them - So What is the Problem?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1416}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387424}, doi = {10.1109/TEST.2004.1387424}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Hafed04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HafedCDPTLR04, author = {Mohamed M. Hafed and Antonio H. Chan and Geoffrey D. Duerden and Bardia Pishdad and Clarence Tam and S{\'{e}}bastien Laberge and Gordon W. Roberts}, title = {A High-Throughput 5 GBps Timing and Jitter Test Module Featuring Localized Processing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {728--737}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387335}, doi = {10.1109/TEST.2004.1387335}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HafedCDPTLR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HakkinenSVM04, author = {Juha H{\"{a}}kkinen and Pekka Syri and Juha{-}Veikko Voutilainen and Markku Moilanen}, title = {A Frequency Mixing and Sub-Sampling Based RF-Measurement Apparatus for {IEEE} 1149.4}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {551--559}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386992}, doi = {10.1109/TEST.2004.1386992}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HakkinenSVM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HanselS04, author = {Gert Hansel and Korbinian Stieglbauer}, title = {Implementation of an Economic Jitter Compliance Test for a Multi-Gigabit Device on {ATE}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1303--1312}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387405}, doi = {10.1109/TEST.2004.1387405}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HanselS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HeinekenK04, author = {Hans T. Heineken and Jitendra Khare}, title = {Test Strategies For a 40Gbps Framer SoC}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {758--763}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387338}, doi = {10.1109/TEST.2004.1387338}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HeinekenK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HongOC04, author = {Dongwoo Hong and Chee{-}Kian Ong and Kwang{-}Ting (Tim) Cheng}, title = {{BER} Estimation for Serial Links Based on Jitter Spectrum and Clock Recovery Characteristics}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1138--1147}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387388}, doi = {10.1109/TEST.2004.1387388}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HongOC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HopsSPSPK04, author = {Jonathan Hops and Brian Swing and Brian Phelps and Bruce Sudweeks and John Pane and James Kinslow}, title = {Non-Deterministic {DUT} Behavior During Functional Testing of High Speed Serial Busses: Challenges and Solutions}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {190--196}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386952}, doi = {10.1109/TEST.2004.1386952}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HopsSPSPK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HuangTL04, author = {Jing Huang and Mehdi Baradaran Tahoori and Fabrizio Lombardi}, title = {Routability and Fault Tolerance of {FPGA} Interconnect Architectures}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {479--488}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386984}, doi = {10.1109/TEST.2004.1386984}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HuangTL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HuismanKP04, author = {Leendert M. Huisman and Maroun Kassab and Leah Pastel}, title = {Data Mining Integrated Circuit Fails with Fail Commonalities}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {661--668}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387327}, doi = {10.1109/TEST.2004.1387327}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HuismanKP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/IrajpourGB04, author = {Shahdad Irajpour and Sandeep K. Gupta and Melvin A. Breuer}, title = {Timing-Independent Testing of Crosstalk in the Presence of Delay Producing Defects Using Surrogate Fault Models}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1024--1033}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387368}, doi = {10.1109/TEST.2004.1387368}, timestamp = {Thu, 21 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/IrajpourGB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JiangOCG04, author = {Hanjun Jiang and Beatriz Olleta and Degang Chen and Randall L. Geiger}, title = {Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1379--1388}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387413}, doi = {10.1109/TEST.2004.1387413}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/JiangOCG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Johnson04, author = {John C. Johnson}, title = {Options for High-Volume Test of Multi-GB/s Ports}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1435}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387443}, doi = {10.1109/TEST.2004.1387443}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Johnson04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Jukna04, author = {Rob Jukna}, title = {To Test or To Inspect, What is the Coverage?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1425}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387433}, doi = {10.1109/TEST.2004.1387433}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Jukna04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JunCB04, author = {Hong Shin Jun and Sung Soo Chung and Sang H. Baeg}, title = {Removing {JTAG} Bottlenecks in System Interconnect Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {173--180}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386950}, doi = {10.1109/TEST.2004.1386950}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/JunCB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KalidindiHEG04, author = {Sunil Kalidindi and Nghia Huynh and Bill Eklow and Josh Goldstein}, title = {"Real Life" System Testing of Networking Equipment}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1072--1077}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387380}, doi = {10.1109/TEST.2004.1387380}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KalidindiHEG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Kapur04, author = {Rohit Kapur}, title = {Security vs. Test Quality: Are they mutually exclusive?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1414}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387422}, doi = {10.1109/TEST.2004.1387422}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Kapur04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KeezerMB04, author = {David C. Keezer and Dany Minier and F. Binette}, title = {Modular Extension of {ATE} to 5 Gbps}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {748--757}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387337}, doi = {10.1109/TEST.2004.1387337}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KeezerMB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KellerTBC04, author = {Brion L. Keller and Mick Tegethoff and Thomas Bartenstein and Vivek Chickermane}, title = {An Economic Analysis and {ROI} Model for Nanometer Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {518--524}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386988}, doi = {10.1109/TEST.2004.1386988}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KellerTBC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KhanB04, author = {Omar I. Khan and Michael L. Bushnell}, title = {Spectral Analysis for Statistical Response Compaction During Built-In Self-Testing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {67--76}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386938}, doi = {10.1109/TEST.2004.1386938}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KhanB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Khare04, author = {Jitendra Khare}, title = {Memory Yield Improvement - SoC Design Perspective}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1445}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387453}, doi = {10.1109/TEST.2004.1387453}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Khare04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KimJGC04, author = {Heon C. Kim and Hong Shin Jun and Xinli Gu and Sung Soo Chung}, title = {At-Speed Interconnect Test and Diagnosis of External Memories on a System}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {156--162}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386948}, doi = {10.1109/TEST.2004.1386948}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KimJGC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KingS04, author = {Matthew L. King and Kewal K. Saluja}, title = {Testing Micropipelined Asynchronous Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {329--338}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386968}, doi = {10.1109/TEST.2004.1386968}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KingS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Koenemann04, author = {Bernd Koenemann}, title = {Test In the Era of "What You see Is {NOT} What You Get"}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {12}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386929}, doi = {10.1109/TEST.2004.1386929}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Koenemann04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KrusemanMGE04, author = {Bram Kruseman and Ananta K. Majhi and Guido Gronthoud and Stefan Eichenberger}, title = {On Hazard-free Patterns for Fine-delay Fault Testing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {213--222}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386955}, doi = {10.1109/TEST.2004.1386955}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KrusemanMGE04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KrusemanMHEM04, author = {Bram Kruseman and Ananta K. Majhi and Camelia Hora and Stefan Eichenberger and Johan Meirlevede}, title = {Systematic Defects in Deep Sub-Micron Technologies}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {290--299}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386963}, doi = {10.1109/TEST.2004.1386963}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KrusemanMHEM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KumeUISKHH04, author = {Masaji Kume and Katsutoshi Uehara and Minoru Itakura and Hideo Sawamoto and Toru Kobayashi and Masatoshi Hasegawa and Hideki Hayashi}, title = {Programmable At-Speed Array and Functional {BIST} for Embedded {DRAM} {LSI}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {988--996}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387364}, doi = {10.1109/TEST.2004.1387364}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KumeUISKHH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KunduMG04, author = {Sandip Kundu and T. M. Mak and Rajesh Galivanche}, title = {Trends in manufacturing test methods and their implications}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {679--687}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387329}, doi = {10.1109/TEST.2004.1387329}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KunduMG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KuoFOIT04, author = {Andy Kuo and Touraj Farahmand and Nelson Ou and Andr{\'{e}} Ivanov and Sassan Tabatabaei}, title = {Jitter Models and Measurement Methods for High-Speed Serial Interconnects}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1295--1302}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387404}, doi = {10.1109/TEST.2004.1387404}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KuoFOIT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LaiPRC04, author = {Liyang Lai and Janak H. Patel and Thomas Rinderknecht and Wu{-}Tung Cheng}, title = {Logic {BIST} with Scan Chain Segmentation}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {57--66}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386937}, doi = {10.1109/TEST.2004.1386937}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LaiPRC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Laquai04, author = {Bernd Laquai}, title = {A Model-based Test Approach for Testing High-Speed PLLs and Phase Regulation Circuitry in {SOC} Devices}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {764--772}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387339}, doi = {10.1109/TEST.2004.1387339}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Laquai04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Larsson04, author = {Erik Larsson}, title = {Integrating Core Selection in the {SOC} Test Solution Design-Flow}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1349--1358}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387410}, doi = {10.1109/TEST.2004.1387410}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Larsson04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LeeHJW04, author = {Geeng{-}Wei Lee and Juinn{-}Dar Huang and Jing{-}Yang Jou and Chun{-}Yao Wang}, title = {Verification on Port Connections}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {830--836}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387346}, doi = {10.1109/TEST.2004.1387346}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LeeHJW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LevineR04, author = {Peter M. Levine and Gordon W. Roberts}, title = {A High-Resolution Flash Time-to-Digital Converter and Calibration Scheme}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1148--1157}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387389}, doi = {10.1109/TEST.2004.1387389}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LevineR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Li04, author = {Mike Li}, title = {Is "Design to Production" The Ultimate Answer For Jitter, Noise, and {BER} Challenges For Multi GB/s ICs?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1433}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387441}, doi = {10.1109/TEST.2004.1387441}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Li04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Li04a, author = {Mike Li}, title = {Will "Heisenberg Uncertainty Principle" Hold For Designing and Testing Multiple GB/s ICs?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1436}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387444}, doi = {10.1109/TEST.2004.1387444}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Li04a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LiMTW04, author = {Mike Li and Andy Martwick and Gerry Talbot and Jan B. Wilstrup}, title = {Transfer Functions For The Reference Clock Jitter In {A} Serial Link: Theory And Applications}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1158--1167}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387390}, doi = {10.1109/TEST.2004.1387390}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiMTW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LiuSCP04, author = {Chunsheng Liu and Hamid Sharif and {\'{E}}rika F. Cota and Dhiraj K. Pradhan}, title = {Test Scheduling for Network-on-Chip with {BIST} and Precedence Constraints}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1369--1378}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387412}, doi = {10.1109/TEST.2004.1387412}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiuSCP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Madge04, author = {Robert Madge}, title = {New Test Paradigms for Yield and Manufacturability}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {13}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386930}, doi = {10.1109/TEST.2004.1386930}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Madge04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Madge04a, author = {Robert Madge}, title = {{ATE} Value Add through Open Data Collection}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1430}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387438}, doi = {10.1109/TEST.2004.1387438}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Madge04a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MadgeBTDSR04, author = {Robert Madge and Brady Benware and Ritesh P. Turakhia and W. Robert Daasch and Chris Schuermyer and Jens Ruffler}, title = {In Search of the Optimum Test Set - Adaptive Test Methods for Maximum Defect Coverage and Lowest Test Cost}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {203--212}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386954}, doi = {10.1109/TEST.2004.1386954}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MadgeBTDSR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MannTSB04, author = {William R. Mann and Frederick L. Taber and Philip W. Seitzer and Jerry J. Broz}, title = {The Leading Edge of Production Wafer Probe Test Technology}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1168--1195}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387391}, doi = {10.1109/TEST.2004.1387391}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MannTSB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Marinissen04, author = {Erik Jan Marinissen}, title = {Security vs. Test Quality: Can We Really Only Have One at a Time?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1411}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387419}, doi = {10.1109/TEST.2004.1387419}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Marinissen04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MarkF04, author = {Dave Mark and Jenny Fan}, title = {Localizing Open Interconnect Defects using Targeted Routing in FPGA's}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {627--634}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387000}, doi = {10.1109/TEST.2004.1387000}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MarkF04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MattesDS04, author = {Heinz Mattes and Claus Dworski and Sebastian Sattler}, title = {Controlled Sine Wave Fitting for {ADC} Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {963--971}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387361}, doi = {10.1109/TEST.2004.1387361}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MattesDS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MauckRM04, author = {Benjamin M. Mauck and Vishnumohan Ravichandran and Usman Azeez Mughal}, title = {A Design for Test Technique for Parametric Analysis of {SRAM:} On-Die Low Yield Analysis}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {105--113}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386942}, doi = {10.1109/TEST.2004.1386942}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MauckRM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MetraMO04, author = {Cecilia Metra and T. M. Mak and Martin Oma{\~{n}}a}, title = {Risks Associated with Faults within Test Pattern Compactors and Their Implications on Testing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1223--1231}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387395}, doi = {10.1109/TEST.2004.1387395}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MetraMO04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MichelR04, author = {Carlos Michel and Rosa D. Reinosa}, title = {Test Strategy Cost Model Innovations}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {384--392}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386974}, doi = {10.1109/TEST.2004.1386974}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MichelR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MicleaSTBP04, author = {Liviu Miclea and Szil{\'{a}}rd Enyedi and Gavril Toderean and Alfredo Benso and Paolo Prinetto}, title = {Towards Microagent based {DBIST/DBISR}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {867--874}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387350}, doi = {10.1109/TEST.2004.1387350}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/MicleaSTBP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MitraLM04, author = {Subhasish Mitra and Steven S. Lumetta and Michael Mitzenmacher}, title = {X-Tolerant Signature Analysis}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {432--441}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386979}, doi = {10.1109/TEST.2004.1386979}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MitraLM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MrugalskiWPTR04, author = {Grzegorz Mrugalski and Chen Wang and Artur Pogiel and Jerzy Tyszer and Janusz Rajski}, title = {Fault Diagnosis in Designs with Convolutional Compactors}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {498--507}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386986}, doi = {10.1109/TEST.2004.1386986}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MrugalskiWPTR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MuhtarogluPRT04, author = {Ali Muhtaroglu and Benoit Provost and Tawfik Rahal{-}Arabi and Greg Taylor}, title = {{I/O} Self-Leakage Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {903--906}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387354}, doi = {10.1109/TEST.2004.1387354}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MuhtarogluPRT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Mukherjee04, author = {Nilanjan Mukherjee}, title = {Cost of Test - Taking Control}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1431}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387439}, doi = {10.1109/TEST.2004.1387439}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Mukherjee04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Nejedlo04, author = {Jay J. Nejedlo}, title = {Functional Test Coverage Effectiveness on the Decline}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1424}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387432}, doi = {10.1109/TEST.2004.1387432}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Nejedlo04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Nigh04, author = {Phil Nigh}, title = {Achieving Quality Levels of 100dpm: It's possible - but roll up your sleeves and be prepared to do some work.}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1420}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387428}, doi = {10.1109/TEST.2004.1387428}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Nigh04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Nigh04a, author = {Phil Nigh}, title = {Redefining {ATE:} "Data Collection Engines that Drive Yield Learning and Process Optimization"}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1429}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387437}, doi = {10.1109/TEST.2004.1387437}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Nigh04a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NighG04, author = {Phil Nigh and Anne E. Gattiker}, title = {Random and Systematic Defect Analysis Using {IDDQ} Signature Analysis for Understanding Fails and Guiding Test Decisions}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {309--318}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386966}, doi = {10.1109/TEST.2004.1386966}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NighG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Nikawa04, author = {Kiyoshi Nikawa}, title = {How long can we succeed using the {OBIRCH} and its derivatives?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1443}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387451}, doi = {10.1109/TEST.2004.1387451}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Nikawa04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NikilaP04, author = {K. Nikila and Rubin A. Parekhji}, title = {{DFT} for Test Optimisations in a Complex Mixed-Signal {SOC} - Case Study on TI's {TNETD7300} {ADSL} Modem Device}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {773--782}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387340}, doi = {10.1109/TEST.2004.1387340}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NikilaP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Njinda04, author = {Charles Njinda}, title = {A Hierarchical {DFT} Architecture for Chip, Board and System Test/Debug}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1061--1071}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387379}, doi = {10.1109/TEST.2004.1387379}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Njinda04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Okawara04, author = {Hideo Okawara}, title = {Precise Pulse Width Measurement in Write Pre-compensation Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {972--979}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387362}, doi = {10.1109/TEST.2004.1387362}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Okawara04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Okuda04, author = {Yukio Okuda}, title = {Panel Synopsis - Diagnosis Meets Physical Failure Analysis: How Long Can We Succeed?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1438}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387446}, doi = {10.1109/TEST.2004.1387446}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Okuda04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PadmanabanT04, author = {Saravanan Padmanaban and Spyros Tragoudas}, title = {A Critical Path Selection Method for Delay Testing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {232--241}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386957}, doi = {10.1109/TEST.2004.1386957}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PadmanabanT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Parker04, author = {Kenneth P. Parker}, title = {A New Probing Technique for High-Speed/High-Density Printed Circuit Boards}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {365--374}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386972}, doi = {10.1109/TEST.2004.1386972}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Parker04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Parker04a, author = {Kenneth P. Parker}, title = {Board Test Coverage Needs to be Standardized}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1426}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387434}, doi = {10.1109/TEST.2004.1387434}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Parker04a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PatelSP04, author = {Chintan Patel and Abhishek Singh and Jim Plusquellic}, title = {Defect detection under Realistic Leakage Models using Multiple {IDDQ} Measurement}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {319--328}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386967}, doi = {10.1109/TEST.2004.1386967}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PatelSP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Pateras04, author = {Stephen Pateras}, title = {Security vs. Test Quality: Fully Embedded Test Approaches Are the Key to Having Both}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1413}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387421}, doi = {10.1109/TEST.2004.1387421}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Pateras04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Patten04, author = {Peter Patten}, title = {Divide and Conquer based Fast Shmoo algorithms}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {197--202}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386953}, doi = {10.1109/TEST.2004.1386953}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Patten04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PaulNR04, author = {Bipul Chandra Paul and Cassondra Neau and Kaushik Roy}, title = {Impact of Body Bias on Delay Fault Testing of Nanoscale {CMOS} Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1269--1275}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387401}, doi = {10.1109/TEST.2004.1387401}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PaulNR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PavlovSG04, author = {Andrei Pavlov and Manoj Sachdev and Jos{\'{e}} Pineda de Gyvez}, title = {{AN} {SRAM} Weak Cell Fault Model and a {DFT} Technique with a Programmable Detection Threshold}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1006--1015}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387366}, doi = {10.1109/TEST.2004.1387366}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PavlovSG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Perez04, author = {Sergio M. Perez}, title = {The Critical Need For Open {ATE} Architecture}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1409}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387417}, doi = {10.1109/TEST.2004.1387417}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Perez04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PolonskyJWC04, author = {Stas Polonsky and Keith A. Jenkins and Alan J. Weger and Shinho Cho}, title = {{CMOS} {IC} diagnostics using the luminescence of OFF-state leakage currents}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {134--139}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386945}, doi = {10.1109/TEST.2004.1386945}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PolonskyJWC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PomeranzVR04, author = {Irith Pomeranz and Srikanth Venkataraman and Sudhakar M. Reddy}, title = {{Z-DFD:} Design-for-Diagnosability Based on the Concept of Z-Detection}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {489--497}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386985}, doi = {10.1109/TEST.2004.1386985}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PomeranzVR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PramanickKEASP04, author = {Ankan K. Pramanick and Ramachandran Krishnaswamy and Mark Elston and Toshiaki Adachi and Harsanjeet Singh and Bruce R. Parnas}, title = {Test Programming Environment in a Modular, Open Architecture Test System}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {413--422}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386977}, doi = {10.1109/TEST.2004.1386977}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PramanickKEASP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ProvostLBMHTAZM04, author = {Benoit Provost and Chee How Lim and Mo Bashir and Ali Muhtaroglu and Tiffany Huang and Kathy Tian and Mubeen Atha and Cangsang Zhao and Harry Muljono}, title = {{AC} {IO} Loopback Design for High Speed {\(\mathrm{\mu}\)}Processor {IO} Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {23--30}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386933}, doi = {10.1109/TEST.2004.1386933}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ProvostLBMHTAZM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Qian04, author = {Jun Qian}, title = {Plan Ahead for Yield}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1447}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387455}, doi = {10.1109/TEST.2004.1387455}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Qian04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/QiuWWRLSB04, author = {Wangqi Qiu and Jing Wang and D. M. H. Walker and Divya Reddy and Zhuo Li and Weiping Shi and Hari Balachandran}, title = {K Longest Paths Per Gate {(KLPG)} Test Generation for Scan-Based Sequential Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {223--231}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386956}, doi = {10.1109/TEST.2004.1386956}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/QiuWWRLSB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RaghunathanCAC04, author = {Ashwin Raghunathan and Ji Hwan (Paul) Chun and Jacob A. Abraham and Abhijit Chatterjee}, title = {Quasi-Oscillation Based Test for Improved Prediction of Analog Performance Parameters}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {252--261}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386959}, doi = {10.1109/TEST.2004.1386959}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RaghunathanCAC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Raghuraman04, author = {R. Raghuraman}, title = {Simulation Requirements for Vectors in {ATE} Formats}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1100--1107}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387384}, doi = {10.1109/TEST.2004.1387384}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Raghuraman04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RajsumanN04, author = {Rochit Rajsuman and Masuda Noriyuki}, title = {Open Architecture Test System: System Architecture and Design}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {403--412}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386976}, doi = {10.1109/TEST.2004.1386976}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RajsumanN04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RaoOK04, author = {Wenjing Rao and Alex Orailoglu and Ramesh Karri}, title = {Fault Tolerant Arithmetic with Applications in Nanotechnology based Systems}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {472--478}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386983}, doi = {10.1109/TEST.2004.1386983}, timestamp = {Sun, 12 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RaoOK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RavikumarH04, author = {C. P. Ravikumar and Graham Hetherington}, title = {A Holistic Parallel and Hierarchical Approach towards Design-For-Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {345--354}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386970}, doi = {10.1109/TEST.2004.1386970}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RavikumarH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RearickPD04, author = {Jeff Rearick and Sylvia Patterson and Krista Dorner}, title = {Integrating Boundary Scan into Multi-GHz {I/O} Circuitry}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {560--566}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386993}, doi = {10.1109/TEST.2004.1386993}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RearickPD04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ReddyCKBB04, author = {Vijay Reddy and John M. Carulli and Anand T. Krishnan and William Bosch and Brendan Burgess}, title = {Impact of Negative Bias Temperature Instability on Product Parametric Drift}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {148--155}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386947}, doi = {10.1109/TEST.2004.1386947}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ReddyCKBB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RehaniAMTS04, author = {Manu Rehani and David Abercrombie and Robert Madge and Jim Teisher and Jason Saw}, title = {{ATE} Data Collection - {A} comprehensive requirements proposal to maximize {ROI} of test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {181--189}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386951}, doi = {10.1109/TEST.2004.1386951}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RehaniAMTS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/RemmersVF04, author = {Jeff Remmers and Moe Villalba and Richard Fisette}, title = {Hierarchical {DFT} Methodology - {A} Case Study}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {847--856}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387348}, doi = {10.1109/TEST.2004.1387348}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/RemmersVF04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Resnick04, author = {David Resnick}, title = {Embedded Test for a new Memory-Card Architecture}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {875--882}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387351}, doi = {10.1109/TEST.2004.1387351}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Resnick04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Reynick04, author = {Joseph A. Reynick}, title = {Investment vs. Yield Relationship for Memories and {IP} in {SOC}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1446}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387454}, doi = {10.1109/TEST.2004.1387454}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Reynick04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Robinson04, author = {Gordon D. Robinson}, title = {Open Architecture {ATE:} Dream or Reality?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1408}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387416}, doi = {10.1109/TEST.2004.1387416}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Robinson04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SchuermyerRD04, author = {Chris Schuermyer and Jens Ruffler and W. Robert Daasch}, title = {Minimum Testing Requirements to Screen Temperature Dependent Defects}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {300--308}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386964}, doi = {10.1109/TEST.2004.1386964}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SchuermyerRD04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SchuttertGK04, author = {Rodger Schuttert and D. C. L. (Erik) van Geest and A. Kumar}, title = {On-Chip Mixed-Signal Test Structures Re-used for Board Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {375--383}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386973}, doi = {10.1109/TEST.2004.1386973}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SchuttertGK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SehgalGMC04, author = {Anuja Sehgal and Sandeep Kumar Goel and Erik Jan Marinissen and Krishnendu Chakrabarty}, title = {{IEEE} P1500-Compliant Test Wrapper Design for Hierarchical Cores}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1203--1212}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387393}, doi = {10.1109/TEST.2004.1387393}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SehgalGMC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SenGAB04, author = {Alper Sen and Vijay K. Garg and Jacob A. Abraham and Jayanta Bhadra}, title = {Formal Verification of a System-on-Chip Using Computation Slicing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {810--819}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387344}, doi = {10.1109/TEST.2004.1387344}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SenGAB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Sengupta04, author = {Sanjay Sengupta}, title = {Test Strategies for Nanometer Technologies}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1421}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387429}, doi = {10.1109/TEST.2004.1387429}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Sengupta04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SeurenW04, author = {Geert Seuren and Tom Waayers}, title = {Extending the Digital Core-based Test Methodology to Support Mixed-Signal}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {281--289}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386962}, doi = {10.1109/TEST.2004.1386962}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SeurenW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Shaikh04, author = {Saghir A. Shaikh}, title = {{IEEE} Std 1149.6 Implementation for a XAUI-to-Serial 10-Gbps Transceiver}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {543--550}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386991}, doi = {10.1109/TEST.2004.1386991}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Shaikh04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ShiM04, author = {Feng Shi and Yiorgos Makris}, title = {{SPIN-SIM:} Logic and Fault Simulation for Speed-Independent Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {597--606}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386997}, doi = {10.1109/TEST.2004.1386997}, timestamp = {Fri, 03 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/ShiM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Shimanouchi04, author = {Masashi Shimanouchi}, title = {Timing Accuracy Enhancement by a New Calibration Scheme for Multi-Gbps {ATE}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {567--576}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386994}, doi = {10.1109/TEST.2004.1386994}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Shimanouchi04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SinanogluO04, author = {Ozgur Sinanoglu and Alex Orailoglu}, title = {Autonomous Yet Deterministic Test of {SOC} Cores}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1359--1368}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387411}, doi = {10.1109/TEST.2004.1387411}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SinanogluO04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SinghPP04, author = {Abhishek Singh and Chintan Patel and Jim Plusquellic}, title = {On-Chip Impulse Response Generation for Analog and Mixed-Signal Testing}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {262--270}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386960}, doi = {10.1109/TEST.2004.1386960}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SinghPP04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SivaramPSWST04, author = {A. T. Sivaram and Pascal Pierra and Shida Sheibani and Nancy Wang{-}Lee and Jorge E. Solorzano and Lily Tran}, title = {Active Tester Interface Unit Design For Data Collection}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {587--596}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386996}, doi = {10.1109/TEST.2004.1386996}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SivaramPSWST04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SivaramSMJ04, author = {A. T. Sivaram and Masashi Shimanouchi and Howard Maassen and Robert Jackson}, title = {Tester Architecture For The Source Synchronous Bus}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {738--747}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387336}, doi = {10.1109/TEST.2004.1387336}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SivaramSMJ04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Smith04, author = {Michael J. Smith}, title = {What do you mean my Board Test stinks?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1427}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387435}, doi = {10.1109/TEST.2004.1387435}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Smith04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SongSWX04, author = {Peilin Song and Franco Stellari and Alan J. Weger and Tian Xia}, title = {A Novel Scan Chain Diagnostics Technique Based on Light Emission from Leakage Current}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {140--147}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386946}, doi = {10.1109/TEST.2004.1386946}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SongSWX04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Sourgen04, author = {Laurent Sourgen}, title = {Testing a secure device: High coverage with very low observability}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1415}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387423}, doi = {10.1109/TEST.2004.1387423}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Sourgen04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Sproch04, author = {Jim Sproch}, title = {A Little {DFT} Goes a Long Way When Testing Multi-Gb/s {I/O} Signals}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1437}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387445}, doi = {10.1109/TEST.2004.1387445}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Sproch04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Storey04, author = {Thomas M. Storey}, title = {Testing in a high volume {DSM} Environment}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1422}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387430}, doi = {10.1109/TEST.2004.1387430}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Storey04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/StroudSGH04, author = {Charles E. Stroud and John Sunwoo and Srinivas M. Garimella and Jonathan Harris}, title = {Built-In Self-Test for System-on-Chip: {A} Case Study}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {837--846}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387347}, doi = {10.1109/TEST.2004.1387347}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/StroudSGH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SuC04, author = {Fei Su and Krishnendu Chakrabarty}, title = {Concurrent Testing of Droplet-Based Microfluidic Systems for Multiplexed Biomedical Assays}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {883--892}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387352}, doi = {10.1109/TEST.2004.1387352}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SuC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SuHWHKCW04, author = {Chin{-}Lung Su and Rei{-}Fu Huang and Cheng{-}Wen Wu and Chien{-}Chung Hung and Ming{-}Jer Kao and Yeong{-}Jar Chang and Wen Ching Wu}, title = {{MRAM} Defect Analysis and Fault Modeli}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {124--133}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386944}, doi = {10.1109/TEST.2004.1386944}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SuHWHKCW04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SunterRC04, author = {Stephen K. Sunter and Aubin Roy and Jean{-}Francois Cote}, title = {An Automated, Complete, Structural Test Solution for {SERDES}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {95--104}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386941}, doi = {10.1109/TEST.2004.1386941}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SunterRC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SyalHC04, author = {Manan Syal and Michael S. Hsiao and Sreejit Chakravarty}, title = {Identifying Untestable Transition Faults in Latch Based Designs with Multiple Clocks}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1034--1043}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387369}, doi = {10.1109/TEST.2004.1387369}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SyalHC04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Syed04, author = {Ahmed Rashid Syed}, title = {Automatic Delay Calibration Method for Multi-channel {CMOS} Formatter}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {577--586}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386995}, doi = {10.1109/TEST.2004.1386995}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Syed04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TabatabaeiLB04, author = {Sassan Tabatabaei and Michael Lee and Freddy Ben{-}Zeev}, title = {Jitter Generation and Measurement for Test of Multigbps Serial {IO}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1313--1321}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387406}, doi = {10.1109/TEST.2004.1387406}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TabatabaeiLB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Tahoori04, author = {Mehdi Baradaran Tahoori}, title = {Application-Dependent Diagnosis of FPGAs}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {645--654}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387002}, doi = {10.1109/TEST.2004.1387002}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Tahoori04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TahooriM04, author = {Mehdi Baradaran Tahoori and Subhasish Mitra}, title = {Interconnect Delay Testing of Designs on Programmable Logic Devices}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {635--644}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387001}, doi = {10.1109/TEST.2004.1387001}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TahooriM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TailleferR04, author = {Christopher S. Taillefer and Gordon W. Roberts}, title = {Reducing Measurement Uncertainty in a DSP-Based Mixed-Signal Test Environment without Increasing Test Time}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {953--962}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387360}, doi = {10.1109/TEST.2004.1387360}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TailleferR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TangWVHWEPB04, author = {Yuyi Tang and Hans{-}Joachim Wunderlich and Harald P. E. Vranken and Friedrich Hapke and Michael Wittke and Piet Engelke and Ilia Polian and Bernd Becker}, title = {X-Masking During Logic {BIST} and Its Impact on Defect Coverage}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {442--451}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386980}, doi = {10.1109/TEST.2004.1386980}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TangWVHWEPB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TaylorNCNLSHHB04, author = {Karen Taylor and Bryan Nelson and Alan Chong and Hieu Nguyen and Henry C. Lin and Mani Soma and Hosam Haggag and Jeff Huard and Jim Braatz}, title = {Experimental Results for High-Speed Jitter Measurement Technique}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {85--94}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386940}, doi = {10.1109/TEST.2004.1386940}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TaylorNCNLSHHB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Tripp04, author = {Mike Tripp}, title = {{ITC} 2004 Panel: Cost of Test - Taking Control}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1432}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387440}, doi = {10.1109/TEST.2004.1387440}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Tripp04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TrippMM03a, author = {Mike Tripp and T. M. Mak and Anne Meixner}, title = {Elimination of Traditional Functional Testing of Interface Timings at Intel}, booktitle = {Proceedings 2003 International Test Conference {(ITC} 2003), Breaking Test Interface Bottlenecks, 28 September - 3 October 2003, Charlotte, NC, {USA}}, pages = {1448--1456}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387457}, doi = {10.1109/TEST.2004.1387457}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TrippMM03a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Venkataraman04, author = {Srikanth Venkataraman}, title = {Diagnosis meets Physical Failure Analysis: What is needed to succeed?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1442}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387450}, doi = {10.1109/TEST.2004.1387450}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Venkataraman04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VermaRB04, author = {Amit Verma and Charles Robinson and Steve Butkovich}, title = {Production Test Effectiveness of Combined Automated Inspection and {ICT} Test Strategies}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {393--402}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386975}, doi = {10.1109/TEST.2004.1386975}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VermaRB04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VermeulenHKMR04, author = {Bart Vermeulen and Camelia Hora and Bram Kruseman and Erik Jan Marinissen and Robert Van Rijsinge}, title = {Trends in Testing Integrated Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {688--697}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387330}, doi = {10.1109/TEST.2004.1387330}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VermeulenHKMR04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VogelsZDBMBNFHGMRT04, author = {Thomas J. Vogels and Thomas Zanon and Rao Desineni and R. D. (Shawn) Blanton and Wojciech Maly and Jason G. Brown and Jeffrey E. Nelson and Y. Fei and X. Huang and Padmini Gopalakrishnan and Mahim Mishra and Vyacheslav Rovner and S. Tiwary}, title = {Benchmarking Diagnosis Algorithms With a Diverse Set of {IC} Deformations}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {508--517}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386987}, doi = {10.1109/TEST.2004.1386987}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VogelsZDBMBNFHGMRT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WadaNINF04, author = {Osamu Wada and Toshimasa Namekawa and Hiroshi Ito and Atsushi Nakayama and Shuso Fujii}, title = {Post-Packaging Auto Repair Techniques for Fast Row Cycle Embedded {DRAM}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1016--1023}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387367}, doi = {10.1109/TEST.2004.1387367}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WadaNINF04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WangAWWFHLT04, author = {Laung{-}Terng Wang and Khader S. Abdel{-}Hafez and Shianling Wu and Xiaoqing Wen and Hiroshi Furukawa and Fei{-}Sheng Hsu and Shyh{-}Horng Lin and Sen{-}Wei Tsai}, title = {VirtualScan: {A} New Compressed Scan Technology for Test Cost Reduction}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {916--925}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387356}, doi = {10.1109/TEST.2004.1387356}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WangAWWFHLT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WangKT04, author = {Haibo Wang and Suchitra Kulkarni and Spyros Tragoudas}, title = {On-line Testing Field Programmable Analog Array Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1340--1348}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387409}, doi = {10.1109/TEST.2004.1387409}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WangKT04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WatanabeSO04, author = {Daisuke Watanabe and Masakatsu Suda and Toshiyuki Okayasu}, title = {34.1Gbps Low Jitter, Low {BER} High-Speed Parallel {CMOS} Interface for Interconnections in High-Speed Memory Test System}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1255--1262}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387399}, doi = {10.1109/TEST.2004.1387399}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WatanabeSO04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/West04, author = {Burnell G. West}, title = {Open Architecture {ATE:} Prospects and Problems}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1410}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387418}, doi = {10.1109/TEST.2004.1387418}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/West04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WestJ04, author = {Burnell G. West and Michael F. Jones}, title = {Digital Synchronization for Reconfigurable {ATE}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1249--1254}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387398}, doi = {10.1109/TEST.2004.1387398}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WestJ04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuH04, author = {Qingwei Wu and Michael S. Hsiao}, title = {State Variable Extraction to Reduce Problem Complexity for {ATPG} and Design Validation}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {820--829}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387345}, doi = {10.1109/TEST.2004.1387345}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuKKG04, author = {Kaijie Wu and Ramesh Karri and Grigori Kuznetsov and Michael G{\"{o}}ssel}, title = {Low Cost Concurrent Error Detection for the Advanced Encryption Standard}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1242--1248}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387397}, doi = {10.1109/TEST.2004.1387397}, timestamp = {Sun, 12 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuKKG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuLRJST04, author = {David M. Wu and Mike Lin and Madhukar Reddy and Talal Jaber and Anil Sabbavarapu and Larry Thatcher}, title = {An Optimized {DFT} and Test Pattern Generation Strategy for an Intel High Performance Microprocessor}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {38--47}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386935}, doi = {10.1109/TEST.2004.1386935}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuLRJST04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WurtenbergerTH04, author = {Armin W{\"{u}}rtenberger and Christofer S. Tautermann and Sybille Hellebrand}, title = {Data Compression for Multiple Scan Chains Using Dictionaries with Corrections}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {926--935}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387357}, doi = {10.1109/TEST.2004.1387357}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WurtenbergerTH04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04, title = {International Test Conference - Cover}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386912}, doi = {10.1109/TEST.2004.1386912}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04a, title = {International Test Conference - Title Page}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {i}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386914}, doi = {10.1109/TEST.2004.1386914}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04b, title = {International Test Conference - Copyright}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {ii}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386915}, doi = {10.1109/TEST.2004.1386915}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04b.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04c, title = {Welcoming Message}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386921}, doi = {10.1109/TEST.2004.1386921}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04c.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04d, title = {Steering Committee and Subcommittees}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {2--3}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386922}, doi = {10.1109/TEST.2004.1386922}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04e, title = {Ned Kornfield Memorial}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {4}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386923}, doi = {10.1109/TEST.2004.1386923}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04e.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04f, title = {2003 Paper Awards}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {5}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386924}, doi = {10.1109/TEST.2004.1386924}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04f.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04g, title = {Technical Program Committee}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {6--8}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386925}, doi = {10.1109/TEST.2004.1386925}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04g.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04h, title = {{ITC} Technical Paper Evaluation and Selection Process}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {10}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386927}, doi = {10.1109/TEST.2004.1386927}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04h.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04i, title = {2005 Call for Papers}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {11}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386928}, doi = {10.1109/TEST.2004.1386928}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04i.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04j, title = {{TTTC:} Test Technology Technical Council}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {14--16}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386931}, doi = {10.1109/TEST.2004.1386931}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04j.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X04k, title = {Technical Paper Reviewers}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {17--22}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386932}, doi = {10.1109/TEST.2004.1386932}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X04k.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/XuN04, author = {Qiang Xu and Nicola Nicolici}, title = {Time/Area Tradeoffs in Testing Hierarchical SOCs With Hard Mega-Cores}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1196--1202}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387392}, doi = {10.1109/TEST.2004.1387392}, timestamp = {Thu, 30 Mar 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/XuN04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Yamaguchi04, author = {Takahiro J. Yamaguchi}, title = {Loopback or not?}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1434}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387442}, doi = {10.1109/TEST.2004.1387442}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Yamaguchi04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YamaguchiIISKOS04, author = {Takahiro J. Yamaguchi and Masahiro Ishida and Kiyotaka Ichiyama and Mani Soma and Christian Krawinkel and Katsuaki Ohsawa and Masao Sugai}, title = {A Real-Time Jitter Measurement Board for High-Performance Computer and Communication Systems}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {77--84}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386939}, doi = {10.1109/TEST.2004.1386939}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YamaguchiIISKOS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YanS04, author = {Haihua Yan and Adit D. Singh}, title = {Evaluating the Effectiveness of Detecting Delay Defects in the Slack Interval: {A} Simulation Study}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {242--251}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386958}, doi = {10.1109/TEST.2004.1386958}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YanS04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YangWK04, author = {Bo Yang and Kaijie Wu and Ramesh Karri}, title = {Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {339--344}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386969}, doi = {10.1109/TEST.2004.1386969}, timestamp = {Sun, 12 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YangWK04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YuCG04, author = {Zhongjun Yu and Degang Chen and Randall L. Geiger}, title = {A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1398--1407}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387415}, doi = {10.1109/TEST.2004.1387415}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YuCG04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YuSCA04, author = {Hak{-}soo Yu and Hongjoong Shin and Ji Hwan (Paul) Chun and Jacob A. Abraham}, title = {Performance Characterization of Mixed-Signal Circuits Using a Ternary Signal Representation}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1389--1397}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387414}, doi = {10.1109/TEST.2004.1387414}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YuSCA04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZambaldiE04, author = {Martin Zambaldi and Wolfgang Ecker}, title = {How to Bridge the Gap Between Simulationand Test}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1091--1099}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387383}, doi = {10.1109/TEST.2004.1387383}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZambaldiE04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZengAKVWA04, author = {Jing Zeng and Magdy S. Abadir and A. Kolhatkar and G. Vandling and Li{-}C. Wang and Jacob A. Abraham}, title = {On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {31--37}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386934}, doi = {10.1109/TEST.2004.1386934}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZengAKVWA04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZhangBA04, author = {Junwu Zhang and Michael L. Bushnell and Vishwani D. Agrawal}, title = {On Random Pattern Generation with the Selfish Gene Algorithm for Testing Digital Sequential Circuits}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {617--626}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1386999}, doi = {10.1109/TEST.2004.1386999}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZhangBA04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZhangL04, author = {Yujun Zhang and Zhongcheng Li}, title = {{IPV6} Conformance Testing: Theory and Practice}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {719--727}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387334}, doi = {10.1109/TEST.2004.1387334}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZhangL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZhouM04, author = {Quming Zhou and Kartik Mohanram}, title = {Analysis of delay caused by bridging faults in {RLC} interconnects}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1044--1052}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387377}, doi = {10.1109/TEST.2004.1387377}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZhouM04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Zorian04, author = {Yervant Zorian}, title = {Investment vs. Yield Relationship for Memories in {SOC}}, booktitle = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, pages = {1444}, publisher = {{IEEE} Computer Society}, year = {2004}, url = {https://doi.org/10.1109/TEST.2004.1387452}, doi = {10.1109/TEST.2004.1387452}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Zorian04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/itc/2004, title = {Proceedings 2004 International Test Conference {(ITC} 2004), October 26-28, 2004, Charlotte, NC, {USA}}, publisher = {{IEEE} Computer Society}, year = {2003}, url = {https://ieeexplore.ieee.org/xpl/conhome/9526/proceeding}, isbn = {0-7803-8581-0}, timestamp = {Wed, 16 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/2004.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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