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@inproceedings{DBLP:conf/ats/0001BFS19, author = {Binod Kumar and Atul Kumar Bhosale and Masahiro Fujita and Virendra Singh}, title = {Validating Multi-Processor Cache Coherence Mechanisms under Diminished Observability}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {99--104}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00019}, doi = {10.1109/ATS47505.2019.00019}, timestamp = {Tue, 14 Jan 2020 13:20:27 +0100}, biburl = {https://dblp.org/rec/conf/ats/0001BFS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/AraujoPMFK19, author = {Leandro Santiago de Ara{\'{u}}jo and Vinay C. Patil and Leandro Augusto Justen Marzulo and Felipe Maia Galv{\~{a}}o Fran{\c{c}}a and Sandip Kundu}, title = {Efficient Testing of Physically Unclonable Functions for Uniqueness}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {117--122}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00022}, doi = {10.1109/ATS47505.2019.00022}, timestamp = {Wed, 07 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/AraujoPMFK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ChakrabortyAM19, author = {Anirban Chakraborty and Manaar Alam and Debdeep Mukhopadhyay}, title = {Deep Learning Based Diagnostics for Rowhammer Protection of {DRAM} Chips}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {86--91}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00016}, doi = {10.1109/ATS47505.2019.00016}, timestamp = {Tue, 25 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/ChakrabortyAM19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ChattopadhyayKR19, author = {Saranyu Chattopadhyay and Preeti Kumari and Biswajit Ray and Rajat Subhra Chakraborty}, title = {Machine Learning Assisted Accurate Estimation of Usage Duration and Manufacturer for Recycled and Counterfeit Flash Memory Detection}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {49--54}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-1}, doi = {10.1109/ATS47505.2019.000-1}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/ChattopadhyayKR19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ChenH19, author = {Ching{-}Yuan Chen and Jiun{-}Lang Huang}, title = {Reinforcement-Learning-Based Test Program Generation for Software-Based Self-Test}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {73--78}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00013}, doi = {10.1109/ATS47505.2019.00013}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ChenH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ChooOIIMDKH19, author = {Hau Sim Choo and Chia Yee Ooi and Michiko Inoue and Nordinah Ismail and Mehrdad Moghbel and Sreedharan Baskara Dass and Chee Hoo Kok and Fawnizu Azmadi Hussin}, title = {Machine-Learning-Based Multiple Abstraction-Level Detection of Hardware Trojan Inserted at Register-Transfer Level}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {98}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00018}, doi = {10.1109/ATS47505.2019.00018}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/ChooOIIMDKH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/ChoudhuryMS19, author = {Avishek Choudhury and Brototi Mondal and Biplab K. Sikdar}, title = {Latency Aware Fault Tolerant Cache in Multicore Using Dynamic Remapping Clusters}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {79}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00014}, doi = {10.1109/ATS47505.2019.00014}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ChoudhuryMS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/DebD19, author = {Arighna Deb and Debesh K. Das}, title = {Detailed Fault Model for Physical Quantum Circuits}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {153--158}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00028}, doi = {10.1109/ATS47505.2019.00028}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/DebD19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/DrechlserG19, author = {Rolf Drechsler and Daniel Gro{\ss}e}, title = {Ensuring Correctness of Next Generation Devices: From Reconfigurable to Self-Learning Systems}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {159--164}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00029}, doi = {10.1109/ATS47505.2019.00029}, timestamp = {Thu, 25 Mar 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/DrechlserG19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/GhoshMCRG19, author = {Sourav Ghosh and Dolan Maity and Arijit Chowdhury and Surajit Kumar Roy and Chandan Giri}, title = {Iterative Parallel Test to Detect and Diagnose Multiple Defects for Digital Microfluidic Biochip}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {147--152}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00027}, doi = {10.1109/ATS47505.2019.00027}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/GhoshMCRG19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/HiramotoOT19, author = {Yushiro Hiramoto and Satoshi Ohtake and Hiroshi Takahashi}, title = {A Built-In Self-Diagnostic Mechanism for Delay Faults Based on Self-Generation of Expected Signatures}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {31--36}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-4}, doi = {10.1109/ATS47505.2019.000-4}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/HiramotoOT19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/Huang19, author = {Tsung{-}Chu Huang}, title = {Self-Checking Residue Number System for Low-Power Reliable Neural Network}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {37--42}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-3}, doi = {10.1109/ATS47505.2019.000-3}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/Huang19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KokOIMDCIH19, author = {Chee Hoo Kok and Chia Yee Ooi and Michiko Inoue and Mehrdad Moghbel and Sreedharan Baskara Dass and Hau Sim Choo and Nordinah Ismail and Fawnizu Azmadi Hussin}, title = {Net Classification Based on Testability and Netlist Structural Features for Hardware Trojan Detection}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {105--110}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00020}, doi = {10.1109/ATS47505.2019.00020}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/KokOIMDCIH19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/KumarDKKCM19, author = {Vinay B. Y. Kumar and Suman Deb and Rupesh Kumar and Mustafa Khairallah and Anupam Chattopadhyay and Avi Mendelson}, title = {Recruiting Fault Tolerance Techniques for Microprocessor Security}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {80--85}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00015}, doi = {10.1109/ATS47505.2019.00015}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/KumarDKKCM19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/LuSSL019, author = {Renjie Lu and Haihua Shen and Yu Su and Huawei Li and Xiaowei Li}, title = {GramsDet: Hardware Trojan Detection Based on Recurrent Neural Network}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {111--116}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00021}, doi = {10.1109/ATS47505.2019.00021}, timestamp = {Thu, 11 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/LuSSL019.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/MillicanSRA19, author = {Spencer K. Millican and Yang Sun and Soham Roy and Vishwani D. Agrawal}, title = {Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {13--18}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-7}, doi = {10.1109/ATS47505.2019.000-7}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/MillicanSRA19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/MomtazC19, author = {Md Imran Momtaz and Abhijit Chatterjee}, title = {Hierarchical State Space Checks for Errors in Sensors, Actuators and Control of Nonlinear Systems: Diagnosis and Compensation}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {141--146}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00026}, doi = {10.1109/ATS47505.2019.00026}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/MomtazC19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/MondalCPSB19, author = {Manobendra Nath Mondal and Animesh Basak Chowdhury and Manjari Pradhan and Susmita Sur{-}Kolay and Bhargab B. Bhattacharya}, title = {Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {25--30}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-5}, doi = {10.1109/ATS47505.2019.000-5}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/MondalCPSB19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/MuduliS19, author = {Sujit Kumar Muduli and Pramod Subramanyan}, title = {Towards Verifiably Secure Systems-on-Chip Platforms}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {92--97}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00017}, doi = {10.1109/ATS47505.2019.00017}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/MuduliS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/OzenO19, author = {Elbruz Ozen and Alex Orailoglu}, title = {Sanity-Check: Boosting the Reliability of Safety-Critical Deep Neural Network Applications}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {7--12}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-8}, doi = {10.1109/ATS47505.2019.000-8}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/OzenO19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/RohanBK19, author = {Aditya Rohan and Kanad Basu and Ramesh Karri}, title = {Can Monitoring System State + Counting Custom Instruction Sequences Aid Malware Detection?}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {61--66}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00007}, doi = {10.1109/ATS47505.2019.00007}, timestamp = {Mon, 15 Jun 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/RohanBK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/S0SJBS19, author = {Vineesh V. S. and Binod Kumar and Rushikesh Shinde and Akshay Jaiswal and Harsh Bhargava and Virendra Singh}, title = {Orion: {A} Technique to Prune State Space Search Directions for Guidance-Based Formal Verification}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {123--128}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00023}, doi = {10.1109/ATS47505.2019.00023}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/S0SJBS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/SanyalPDB19, author = {Sayandeep Sanyal and Amit Patra and Pallab Dasgupta and Mayukh Bhattacharya}, title = {A Structured Approach for Rapid Identification of Fault-Sensitive Nets in Analog Circuits}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {135--140}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00025}, doi = {10.1109/ATS47505.2019.00025}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/SanyalPDB19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/SilvaBH019, author = {Felipe Augusto da Silva and Ahmet Cagri Bagbaba and Said Hamdioui and Christian Sauer}, title = {Combining Fault Analysis Technologies for {ISO26262} Functional Safety Verification}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {129--134}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00024}, doi = {10.1109/ATS47505.2019.00024}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/SilvaBH019.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/WangWTCLKP19, author = {Naixing Wang and Chen Wang and Kun{-}Han Tsai and Wu{-}Tung Cheng and Xijiang Lin and Mark Kassab and Irith Pomeranz}, title = {{TEA:} {A} Test Generation Algorithm for Designs with Timing Exceptions}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {19--24}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-6}, doi = {10.1109/ATS47505.2019.000-6}, timestamp = {Wed, 22 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/WangWTCLKP19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/Wu0LCVRHY19, author = {Cheng{-}Hung Wu and Yu Huang and Kuen{-}Jong Lee and Wu{-}Tung Cheng and Gaurav Veda and Sudhakar M. Reddy and Chun{-}Cheng Hu and Chong{-}Siao Ye}, title = {Deep Learning Based Test Compression Analyzer}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {1--6}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-9}, doi = {10.1109/ATS47505.2019.000-9}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/Wu0LCVRHY19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/YanWLCSY0W19, author = {Aibin Yan and Zhen Wu and Lu Lu and Zhili Chen and Jie Song and Zuobin Ying and Patrick Girard and Xiaoqing Wen}, title = {Novel Radiation Hardened Latch Design with Cost-Effectiveness for Safety-Critical Terrestrial Applications}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {43--48}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.000-2}, doi = {10.1109/ATS47505.2019.000-2}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/YanWLCSY0W19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ats/YanWZHCYW019, author = {Aibin Yan and Zhen Wu and Jun Zhou and Yuanjie Hu and Yan Chen and Zuobin Ying and Xiaoqing Wen and Patrick Girard}, title = {Design of a Sextuple Cross-Coupled {SRAM} Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications}, booktitle = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, pages = {55--60}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ATS47505.2019.00006}, doi = {10.1109/ATS47505.2019.00006}, timestamp = {Mon, 11 May 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/ats/YanWZHCYW019.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/ats/2019, title = {28th {IEEE} Asian Test Symposium, {ATS} 2019, Kolkata, India, December 10-13, 2019}, publisher = {{IEEE}}, year = {2019}, url = {https://ieeexplore.ieee.org/xpl/conhome/8942393/proceeding}, isbn = {978-1-7281-2695-1}, timestamp = {Tue, 14 Jan 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/2019.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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