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@inproceedings{DBLP:conf/itc/LaisneCPKSTRZ22, author = {Michael Laisne and Alfred L. Crouch and Michele Portolan and Martin Keim and Hans Martin von Staudt and Bradford G. Van Treuren and Jeff Rearick and Songlin Zuo}, title = {{IEEE} {P1687.1:} Extending the Network Boundaries for Test}, booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA, September 23-30, 2022}, pages = {382--390}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ITC50671.2022.00084}, doi = {10.1109/ITC50671.2022.00084}, timestamp = {Thu, 05 Jan 2023 13:13:27 +0100}, biburl = {https://dblp.org/rec/conf/itc/LaisneCPKSTRZ22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/StaudtEWPC22, author = {Hans Martin von Staudt and Luai Tarek Elnawawy and Sarah Wang and Larry Ping and Jung Woo Choi}, title = {Probeless DfT Scheme for Testing 20k I/Os of an Automotive Micro-LED Headlamp Driver {IC}}, booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA, September 23-30, 2022}, pages = {365--371}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ITC50671.2022.00045}, doi = {10.1109/ITC50671.2022.00045}, timestamp = {Thu, 05 Jan 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/StaudtEWPC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/StaudtSBCHC22, author = {Hans Martin von Staudt and Franz Schuler and Rohitaswa Bhattacharya and Justin Wei{-}Lin Cheng and Cheng{-}Da Huang and Parker Chih{-}Chun Chen}, title = {High-Coverage DfT and Reliability Enhancements for Automotive Floating Gate {OTP} Beyond {AEC-Q100}}, booktitle = {{IEEE} International Test Conference, {ITC} 2022, Anaheim, CA, USA, September 23-30, 2022}, pages = {637--641}, publisher = {{IEEE}}, year = {2022}, url = {https://doi.org/10.1109/ITC50671.2022.00088}, doi = {10.1109/ITC50671.2022.00088}, timestamp = {Thu, 05 Jan 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/StaudtSBCHC22.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ets/StaudtTRPK21, author = {Hans Martin von Staudt and Bradford G. Van Treuren and Jeff Rearick and Michele Portolan and Martin Keim}, title = {Exploring and Comparing {IEEE} {P1687.1} and {IEEE} 1687 Modeling of Non-TAP Interfaces}, booktitle = {26th {IEEE} European Test Symposium, {ETS} 2021, Bruges, Belgium, May 24-28, 2021}, pages = {1--10}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/ETS50041.2021.9465438}, doi = {10.1109/ETS50041.2021.9465438}, timestamp = {Fri, 02 Jul 2021 14:14:26 +0200}, biburl = {https://dblp.org/rec/conf/ets/StaudtTRPK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LaisneCPKSATR20, author = {Mike Laisne and Alfred L. Crouch and Michele Portolan and Martin Keim and Hans Martin von Staudt and M. Abdalwahab and Bradford G. Van Treuren and Jeff Rearick}, title = {Modeling Novel Non-JTAG {IEEE} 1687-Like Architectures}, booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC, USA, November 1-6, 2020}, pages = {1--10}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/ITC44778.2020.9325248}, doi = {10.1109/ITC44778.2020.9325248}, timestamp = {Mon, 25 Jan 2021 08:44:58 +0100}, biburl = {https://dblp.org/rec/conf/itc/LaisneCPKSATR20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/StaudtBRL20, author = {Hans Martin von Staudt and Mohamed Anas Benhebibi and Jeff Rearick and Michael Laisne}, title = {Industrial Application of {IJTAG} Standards to the Test of Big-A/little-d devices}, booktitle = {{IEEE} International Test Conference, {ITC} 2020, Washington, DC, USA, November 1-6, 2020}, pages = {1--10}, publisher = {{IEEE}}, year = {2020}, url = {https://doi.org/10.1109/ITC44778.2020.9325267}, doi = {10.1109/ITC44778.2020.9325267}, timestamp = {Mon, 25 Jan 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/StaudtBRL20.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/RearickCS19, author = {Jeff Rearick and Alfred L. Crouch and Hans Martin von Staudt}, title = {Innovative Practices on {IEEE} 1687.xyz}, booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA, April 23-25, 2019}, pages = {1}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/VTS.2019.8758629}, doi = {10.1109/VTS.2019.8758629}, timestamp = {Wed, 16 Oct 2019 14:14:54 +0200}, biburl = {https://dblp.org/rec/conf/vts/RearickCS19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/vts/StaudtMTK19, author = {Hans Martin von Staudt and Amit Majumdar and Bill Taylor and Jennifer Kitchen}, title = {Innovative Design for Test in State-of-the-Art Analog Systems}, booktitle = {37th {IEEE} {VLSI} Test Symposium, {VTS} 2019, Monterey, CA, USA, April 23-25, 2019}, pages = {1}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/VTS.2019.8758607}, doi = {10.1109/VTS.2019.8758607}, timestamp = {Thu, 18 Apr 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/vts/StaudtMTK19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LaisneSBE17, author = {Michael Laisne and Hans Martin von Staudt and Sourabh Bhalerao and Mark Eason}, title = {Single-pin test control for Big A, little {D} devices}, booktitle = {{IEEE} International Test Conference, {ITC} 2017, Fort Worth, TX, USA, October 31 - Nov. 2, 2017}, pages = {1--10}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/TEST.2017.8242069}, doi = {10.1109/TEST.2017.8242069}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/LaisneSBE17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/date/SpangSW07, author = {Oliver Spang and Hans Martin von Staudt and Michael G. Wahl}, editor = {Rudy Lauwereins and Jan Madsen}, title = {A sophisticated memory test engine for {LCD} display drivers}, booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition, {DATE} 2007, Nice, France, April 16-20, 2007}, pages = {213--218}, publisher = {{EDA} Consortium, San Jose, CA, {USA}}, year = {2007}, url = {https://doi.org/10.1109/DATE.2007.364593}, doi = {10.1109/DATE.2007.364593}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/date/SpangSW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/ddecs/VockFS06, author = {Stefan Vock and Ulrich Flogaus and Hans Martin von Staudt}, editor = {Matteo Sonza Reorda and Ondrej Nov{\'{a}}k and Bernd Straube and Hana Kub{\'{a}}tov{\'{a}} and Zdenek Kot{\'{a}}sek and Pavel Kubal{\'{\i}}k and Raimund Ubar and Jir{\'{\i}} Bucek}, title = {Productivity and Code Quality Improvement of Mixed-Signal Test Software by Applying Software Engineering Methods}, booktitle = {Proceedings of the 9th {IEEE} Workshop on Design {\&} Diagnostics of Electronic Circuits {\&} Systems {(DDECS} 2006), Prague, Czech Republic, April 18-21, 2006}, pages = {136--140}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/DDECS.2006.1649593}, doi = {10.1109/DDECS.2006.1649593}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ddecs/VockFS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VockSS06, author = {Stefan Vock and Markus Schmid and Hans Martin von Staudt}, editor = {Scott Davidson and Anne Gattiker}, title = {Test Software Generation Productivity and Code Quality Improvement by applying Software Engineering Techniques}, booktitle = {2006 {IEEE} International Test Conference, {ITC} 2006, Santa Clara, CA, USA, October 22-27, 2006}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/TEST.2006.297652}, doi = {10.1109/TEST.2006.297652}, timestamp = {Tue, 12 Dec 2023 09:46:27 +0100}, biburl = {https://dblp.org/rec/conf/itc/VockSS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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