Search dblp for Publications

• > Home > Search

@inproceedings{DBLP:conf/iciip/PanLH21,
  author       = {Jia{-}Fang Pan and
                  Min{-}Chao Liang and
                  Fa{-}Guo Huang},
  title        = {Research on the Correlation between Extrusion Parameters and Screw
                  Failure Based on Fluent},
  booktitle    = {{ICIIP}},
  pages        = {202--209},
  publisher    = {{ACM}},
  year         = {2021}
}

@article{DBLP:journals/tim/LuanWZLLWD20,
  author       = {Peng Luan and
                  Yibang Wang and
                  Wei Zhao and
                  Chen Liu and
                  Faguo Liang and
                  Aihua Wu and
                  Jing Du},
  title        = {Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline
                  {TRL} Calibration Including Dynamic Accuracy},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {69},
  number       = {11},
  pages        = {8874--8880},
  year         = {2020}
}

@article{DBLP:journals/tim/WuFLLWLL20,
  author       = {Aihua Wu and
                  Xingchang Fu and
                  Chen Liu and
                  Chong Li and
                  Yibang Wang and
                  Faguo Liang and
                  Peng Luan},
  title        = {Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter
                  Measurement Systems},
  journal      = {{IEEE} Trans. Instrum. Meas.},
  volume       = {69},
  number       = {6},
  pages        = {2837--2844},
  year         = {2020}
}

@inproceedings{DBLP:conf/isbdai/PanLH20,
  author       = {Jia{-}Fang Pan and
                  Min{-}Chao Liang and
                  Fa{-}Guo Huang},
  title        = {Application of Vibration Detection Technology in Rubber Extruder Fault
                  Diagnosis},
  booktitle    = {{ISBDAI}},
  pages        = {385--392},
  publisher    = {{ACM}},
  year         = {2020}
}

@article{DBLP:journals/mr/ZhaiLGL16,
  author       = {Yuwei Zhai and
                  Faguo Liang and
                  Chunsheng Guo and
                  Yan Liu},
  title        = {Transient dual interface measurement of junction-to-case thermal resistance
                  in AlGaN/GaN {HEMT} utilizing an improved infrared microscope},
  journal      = {Microelectron. Reliab.},
  volume       = {66},
  pages        = {52--57},
  year         = {2016}
}