default search action
Search dblp for Publications
export results for "Emmanuel Scheid"
@misc{DBLP:data/10/FreireSABBCCCEKLMRRSSSV16, author = {Juliana Freire and Cl{\'{a}}udio T. Silva and Erik W. Anderson and Louis Bavoil and Clifton Brooks and Jason H. Callahan and Steven P. Callahan and Lorena Carlo and Tommy Ellqvist and David Koop and Lauro Didier Lins and Phillip Mates and R{\'{e}}mi Rampin and Daniel Rees and Emmanuele Santos and Carlos Eduardo Scheidegger and Nathan Smith and Huy T. Vo}, title = {VisTrails 2.2.4 (Version 2.2.4)}, publisher = {Zenodo}, year = {2016}, month = may, howpublished = {\url{https://doi.org/10.5281/zenodo.2573118}}, note = {Accessed on YYYY-MM-DD.} }
@article{DBLP:journals/mj/MahamdiSMTSJ09, author = {Ramdane Mahamdi and Laurent Saci and Farida Mansour and Pierre Temple{-}Boyer and Emmanuel Scheid and Laurent Jalabert}, title = {Boron diffusion and activation in polysilicon multilayer films for P\({}^{\mbox{+}}\) {MOS} structure: Characterization and modeling}, journal = {Microelectron. J.}, volume = {40}, number = {1}, pages = {1--4}, year = {2009} }
@article{DBLP:journals/mr/SauveplaneSD09, author = {Jean{-}Baptiste Sauveplane and Emmanuel Scheid and A. Deram}, title = {On the accurate determination of the thermomechanical properties of micro-scale material: Application to AlSi\({}_{\mbox{1{\%}}}\) chip metallization of a power semiconductor device}, journal = {Microelectron. Reliab.}, volume = {49}, number = {5}, pages = {499--505}, year = {2009} }
@article{DBLP:journals/mr/SauveplaneTSD08, author = {Jean{-}Baptiste Sauveplane and Patrick Tounsi and Emmanuel Scheid and A. Deram}, title = {3D electro-thermal investigations for reliability of ultra low {ON} state resistance power {MOSFET}}, journal = {Microelectron. Reliab.}, volume = {48}, number = {8-9}, pages = {1464--1467}, year = {2008} }
@article{DBLP:journals/mr/KhongLTDCLVS07, author = {B. Khong and Marc Legros and Patrick Tounsi and Philippe Dupuy and X. Chauffleur and Colette Levade and G. Vanderschaeve and Emmanuel Scheid}, title = {Characterization and modelling of ageing failures on power {MOSFET} devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1735--1740}, year = {2007} }
@article{DBLP:journals/mr/PeratDSBCPZT02, author = {Oliver Perat and Jean{-}Marie Dorkel and Emmanuel Scheid and Pierre Temple{-}Boyer and Y. S. Chung and A. Peyre{-}Lavigne and M. Zecri and Patrick Tounsi}, title = {Characterization method of thermomechanical parameters for microelectronic materials}, journal = {Microelectron. Reliab.}, volume = {42}, number = {7}, pages = {1053--1058}, year = {2002} }
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.