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@article{DBLP:journals/mr/Abadeer07, author = {W. W. (Bill) Abadeer}, title = {Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {395--400}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.003}, doi = {10.1016/J.MICROREL.2006.05.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Abadeer07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AbbateBFICM07, author = {Carmine Abbate and Giovanni Busatto and Luigi Fratelli and Francesco Iannuzzo and B. Cascone and Roberta Manzo}, title = {The robustness of series-connected high power {IGBT} modules}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1746--1750}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.036}, doi = {10.1016/J.MICROREL.2007.07.036}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AbbateBFICM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AbermannESLOB07, author = {Stephan Abermann and J. K. Efavi and G. Sj{\"{o}}blom and Max Christian Lemme and J{\"{o}}rgen Olsson and Emmerich Bertagnolli}, title = {Impact of Al-, Ni-, TiN-, and Mo-metal gates on MOCVD-grown HfO\({}_{\mbox{2}}\) and ZrO\({}_{\mbox{2}}\) high-kappa dielectrics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {536--539}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.002}, doi = {10.1016/J.MICROREL.2007.01.002}, timestamp = {Mon, 17 Jun 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AbermannESLOB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AdrianREHGPG07, author = {J{\'{e}}r{\^{o}}me Adrian and Nicolas Rodriguez and Fabien Essely and G{\'{e}}rald Haller and Catherine Grosjean and Alain Portavoce and Christophe Girardeaux}, title = {Investigation of a new method for dopant characterization}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1599--1603}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.091}, doi = {10.1016/J.MICROREL.2007.07.091}, timestamp = {Thu, 03 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AdrianREHGPG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AkarvardarMSSCGC07, author = {Kerem Akarvardar and Abdelkarim Mercha and Eddy Simoen and Vaidyanathan Subramanian and Cor Claeys and Pierre Gentil and Sorin Cristoloveanu}, title = {High-temperature performance of state-of-the-art triple-gate transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2065--2069}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.002}, doi = {10.1016/J.MICROREL.2006.10.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AkarvardarMSSCGC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AlamKVM07, author = {Muhammad Ashraful Alam and Haldun Kufluoglu and Dhanoop Varghese and S. Mahapatra}, title = {A comprehensive model for {PMOS} {NBTI} degradation: Recent progress}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {853--862}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.012}, doi = {10.1016/J.MICROREL.2006.10.012}, timestamp = {Mon, 09 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AlamKVM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AltYHKLIASSBKD07, author = {K. W. Alt and R. E. Yeats and C. P. Hutchinson and D. K. Kuhn and T. S. Low and M. Iwamoto and M. E. Adamski and R. L. Shimon and Timothy E. Shirley and M. Bonse and F. G. Kellert and D. C. D'Avanzo}, title = {Determination of transistor infant failure probability in InGaP/GaAs heterojunction bipolar technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1175--1179}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.007}, doi = {10.1016/J.MICROREL.2007.02.007}, timestamp = {Tue, 08 Feb 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AltYHKLIASSBKD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AlwanBKZ07, author = {M. Alwan and B. Beydoun and K. Ketata and M. Zoaeter}, title = {Gate charge behaviors in N-channel power VDMOSFETs during {HEF} and {PBT} stresses}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1406--1410}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.096}, doi = {10.1016/J.MICROREL.2007.07.096}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AlwanBKZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AmatRNAS07, author = {Esteve Amat and Rosana Rodr{\'{\i}}guez and Montserrat Nafr{\'{\i}}a and Xavier Aymerich and James H. Stathis}, title = {Influence of the SiO\({}_{\mbox{2}}\) layer thickness on the degradation of HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\) stacks subjected to static and dynamic stress conditions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {544--547}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.003}, doi = {10.1016/J.MICROREL.2007.01.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AmatRNAS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AnderssonATL07, author = {C. Andersson and D. R. Andersson and Per{-}Erik Tegehall and Johan Liu}, title = {Effect of different temperature cycling profiles on the crack initiation and propagation of Sn-3.5Ag wave soldered solder joints}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {266--272}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.014}, doi = {10.1016/J.MICROREL.2006.09.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AnderssonATL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AresuKPG07, author = {Stefano Aresu and Werner Kanert and Reinhard Pufall and Michael Goroll}, title = {Exceptional operative gate voltage induces negative bias temperature instability {(NBTI)} on n-type trench {DMOS} transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1416--1418}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.021}, doi = {10.1016/J.MICROREL.2007.07.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AresuKPG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ArshadJA07, author = {Mohd Khairuddin Md Arshad and Azman Jalar and Ibrahim Ahmad}, title = {Characterization of parasitic residual deposition on passivation layer in electroless nickel immersion gold process}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1120--1126}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.003}, doi = {10.1016/J.MICROREL.2006.07.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ArshadJA07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AsgaryMZ07, author = {Reza Asgary and Karim Mohammadi and Mark Zwolinski}, title = {Using neural networks as a fault detection mechanism in {MEMS} devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {142--149}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.04.012}, doi = {10.1016/J.MICROREL.2006.04.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AsgaryMZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AtanassovaP07, author = {Elena Atanassova and Albena Paskaleva}, title = {Challenges of Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\) as high-k dielectric for nanoscale DRAMs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {913--923}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.006}, doi = {10.1016/J.MICROREL.2006.06.006}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AtanassovaP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AtanassovaSP07, author = {Elena Atanassova and D. Spassov and Albena Paskaleva}, title = {Metal gates and gate-deposition-induced defects in Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\) stack capacitors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2088--2093}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.001}, doi = {10.1016/J.MICROREL.2006.10.001}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AtanassovaSP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AuleyRKK07, author = {C. N. Mc Auley and Andreas Rummel and F. W. Keating and Stephan Kleindiek}, title = {3D failure analysis in depth profiles of sequentially made {FIB} cuts}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1595--1598}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.032}, doi = {10.1016/J.MICROREL.2007.07.032}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AuleyRKK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BabouxBPB07, author = {Nicolas Baboux and C. Busseret and Carole Plossu and Philippe Boivin}, title = {Peculiarities of electron tunnel injection to the drain of EEPROMs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {631--634}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.055}, doi = {10.1016/J.MICROREL.2007.01.055}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BabouxBPB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BahiLFL07, author = {Manoubi Auguste Bahi and Pascal Lecuyer and H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and Jean{-}Pierre Landesman}, title = {Sequential environmental stresses tests qualification for automotive components}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1680--1684}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.004}, doi = {10.1016/J.MICROREL.2007.07.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BahiLFL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BarlettaC07, author = {Giacomo Barletta and Giuseppe Curr{\`{o}}}, title = {Evaluation of the generation mechanisms at surface and in the bulk of the silicon by current transient technique}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {810--814}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.004}, doi = {10.1016/J.MICROREL.2007.01.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BarlettaC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BarliniCMF07, author = {Davide Barlini and Mauro Ciappa and Michel Mermet{-}Guyennet and Wolfgang Fichtner}, title = {Measurement of the transient junction temperature in {MOSFET} devices under operating conditions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1707--1712}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.008}, doi = {10.1016/J.MICROREL.2007.07.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BarliniCMF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BeaudoinSP07, author = {Felix Beaudoin and Kevin Sanchez and Philippe Perdu}, title = {Dynamic laser stimulation techniques for advanced failure analysis and design debug applications}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1517--1522}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.054}, doi = {10.1016/J.MICROREL.2007.07.054}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BeaudoinSP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BelaidKGMMM07, author = {Mohamed Ali Bela{\"{\i}}d and K. Ketata and M. Gares and Karine Mourgues and Mohamed Masmoudi and J{\'{e}}r{\^{o}}me Marcon}, title = {Comparative analysis of {RF} {LDMOS} capacitance reliability under accelerated ageing tests}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {59--64}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.04.009}, doi = {10.1016/J.MICROREL.2006.04.009}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BelaidKGMMM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BenbahoucheMZ07, author = {Lynda Benbahouche and A. Merabet and A. Zegadi}, title = {Numerical analysis and comparative study of short circuit stress in IGBTs devices (IR, {IXYS)}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1773--1778}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.062}, doi = {10.1016/J.MICROREL.2007.07.062}, timestamp = {Thu, 27 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BenbahoucheMZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BenmansourAMW07, author = {Adel Benmansour and Stephane Azzopardi and Jean{-}Christophe Martin and Eric Woirgard}, title = {Trench {IGBT} failure mechanisms evolution with temperature and gate resistance under various short-circuit conditions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1730--1734}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.049}, doi = {10.1016/J.MICROREL.2007.07.049}, timestamp = {Wed, 03 Aug 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BenmansourAMW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BenmansourAMW07a, author = {Adel Benmansour and Stephane Azzopardi and Jean{-}Christophe Martin and Eric Woirgard}, title = {A step by step methodology to analyze the {IGBT} failure mechanisms under short circuit and turn-off inductive conditions using 2D physically based device simulation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1800--1805}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.051}, doi = {10.1016/J.MICROREL.2007.07.051}, timestamp = {Wed, 03 Aug 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BenmansourAMW07a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BerechmanRS07, author = {Ronen A. Berechman and Boris Revzin and Yoram Shapira}, title = {Correlating gate sinking and electrical performance of pseudomorphic high electron mobility transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1202--1207}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.08.020}, doi = {10.1016/J.MICROREL.2006.08.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BerechmanRS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BestoryML07, author = {Corinne Bestory and Fran{\c{c}}ois Marc and Herv{\'{e}} Levi}, title = {Statistical analysis during the reliability simulation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1353--1357}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.079}, doi = {10.1016/J.MICROREL.2007.07.079}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BestoryML07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BeylierBBG07, author = {Gaelle Beylier and Sylvie Bruy{\`{e}}re and Darcy Benoit and G{\'{e}}rard Ghibaudo}, title = {Refined electrical analysis of two charge states transition characteristic of "borderless" silicon nitride}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {743--747}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.005}, doi = {10.1016/J.MICROREL.2007.01.005}, timestamp = {Thu, 29 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BeylierBBG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BhateD07, author = {Dhruv Bhate and Martin L. Dunn}, title = {Adhesion of arbitrary-shaped thin-film microstructures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2014--2024}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.011}, doi = {10.1016/J.MICROREL.2007.04.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BhateD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BianicAKSR07, author = {Stephane Bianic and St{\'{e}}phanie Allemand and Gr{\'{e}}gory Kerrosa and Pascal Scafidi and Didier Renard}, title = {Advanced backside failure analysis in 65 nm {CMOS} technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1550--1554}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.076}, doi = {10.1016/J.MICROREL.2007.07.076}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BianicAKSR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Bisschop07, author = {Jaap Bisschop}, title = {Reliability methods and standards}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1330--1335}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.084}, doi = {10.1016/J.MICROREL.2007.07.084}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Bisschop07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BottiniCGGGMSS07, author = {Roberta Bottini and Sonia Costantini and Nadia Galbiati and Andrea Ghetti and Gabriella Ghidini and Aurelio Giancarlo Mauri and Claudia Scozzari and Alessandro Sebastiani}, title = {High voltage transistor degradation in {NVM} pump application}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1384--1388}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.050}, doi = {10.1016/J.MICROREL.2007.07.050}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BottiniCGGGMSS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BouarroudjKOBDL07, author = {M. Bouarroudj and Zoubir Khatir and Jean{-}Pierre Ousten and F. Badel and Laurent Dupont and St{\'{e}}phane Lefebvre}, title = {Degradation behavior of 600 {V-200} {A} {IGBT} modules under power cycling and high temperature environment conditions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1719--1724}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.027}, doi = {10.1016/J.MICROREL.2007.07.027}, timestamp = {Thu, 25 Jan 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BouarroudjKOBDL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BoukhenoufaPC07, author = {A. Boukhenoufa and Lionel Pichon and C. Cordier}, title = {Two-dimensional numerical simulations of 1/f noise by {GR} mechanisms in thin film transistors: Effects of induced defect technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1419--1423}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.059}, doi = {10.1016/J.MICROREL.2007.07.059}, timestamp = {Wed, 28 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BoukhenoufaPC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BoulencD07, author = {P. Boulenc and I. Devos}, title = {Templates for LaAlO\({}_{\mbox{3}}\) epitaxy on silicon}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {709--713}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.010}, doi = {10.1016/J.MICROREL.2007.02.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BoulencD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BouyaCMLPCBP07, author = {Mohsine Bouya and D. Carisetti and Nathalie Malbert and Nathalie Labat and Philippe Perdu and J. C. Clement and M. Bonnet and G. Pataut}, title = {Study of passivation defects by electroluminescence in AlGaN/GaN {HEMTS} on SiC}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1630--1633}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.085}, doi = {10.1016/J.MICROREL.2007.07.085}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BouyaCMLPCBP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BreglioINSHNU07, author = {Giovanni Breglio and Andrea Irace and Ettore Napoli and Paolo Spirito and Kimimori Hamada and T. Nishijima and T. Ueta}, title = {Study of a failure mechanism during {UIS} switching of planar {PT-IGBT} with current sense cell}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1756--1760}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.009}, doi = {10.1016/J.MICROREL.2007.07.009}, timestamp = {Wed, 28 Aug 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BreglioINSHNU07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrennanCSDMG07, author = {Ciaran J. Brennan and Kiran V. Chatty and Jeff Sloan and Paul Dunn and Mujahid Muhammad and Robert Gauthier}, title = {Design automation to suppress cable discharge event {(CDE)} induced latchup in 90 nm {CMOS} ASICs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1069--1073}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.008}, doi = {10.1016/J.MICROREL.2006.11.008}, timestamp = {Thu, 02 Feb 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrennanCSDMG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrennanCWCG07, author = {Ciaran J. Brennan and Shunhua Chang and Min Woo and Kiran V. Chatty and Robert Gauthier}, title = {Implementation of diode and bipolar triggered SCRs for {CDM} robust {ESD} protection in 90 nm {CMOS} ASICs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1030--1035}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.009}, doi = {10.1016/J.MICROREL.2006.11.009}, timestamp = {Thu, 02 Feb 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrennanCWCG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BressersDJEZ07, author = {H. J. L. Bressers and W. D. van Driel and Kaspar M. B. Jansen and Leo J. Ernst and G. Q. Zhang}, title = {Correlation between chemistry of polymer building blocks and microelectronics reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {290--294}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.035}, doi = {10.1016/J.MICROREL.2006.09.035}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BressersDJEZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrodbeckG07, author = {Tilo Brodbeck and Reinhold Gaertner}, title = {Experience in {HBM} {ESD} testing of high pin count devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1025--1029}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.010}, doi = {10.1016/J.MICROREL.2006.11.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrodbeckG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BrownKBR07, author = {Douglas W. Brown and Patrick W. Kalgren and Carl S. Byington and Michael J. Roemer}, title = {Electronic prognostics - {A} case study using global positioning system {(GPS)}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1874--1881}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.020}, doi = {10.1016/J.MICROREL.2007.02.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BrownKBR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BuiuHERLHC07, author = {Octavian Buiu and Steve Hall and Olof Engstr{\"{o}}m and B. Raeissi and Max Christian Lemme and Paul K. Hurley and Karim Cherkaoui}, title = {Extracting the relative dielectric constant for "high-kappa layers" from {CV} measurements - Errors and error propagation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {678--681}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.006}, doi = {10.1016/J.MICROREL.2007.01.006}, timestamp = {Mon, 17 Jun 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BuiuHERLHC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BurgaudCMSM07, author = {P. Burgaud and L. Constancias and G. Martel and C. Savina and D. Mesnager}, title = {Preliminary reliability assessment and failure physical analysis on AlGaN/GaN HEMTs {COTS}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1653--1657}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.017}, doi = {10.1016/J.MICROREL.2007.07.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BurgaudCMSM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BychikhinSSPPP07, author = {Sergey Bychikhin and T. Swietlik and Tadeusz Suski and Sylwester Porowski and Piotr Perlin and Dionyz Pogany}, title = {Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient interferometric mapping}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1649--1652}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.046}, doi = {10.1016/J.MICROREL.2007.07.046}, timestamp = {Sun, 05 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BychikhinSSPPP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CachoOCJ07, author = {Florian Cacho and S. Orain and G. Cailletaud and H. Jaouen}, title = {A constitutive single crystal model for the silicon mechanical behavior: Applications to the stress induced by silicided lines and {STI} in {MOS} technologies}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {161--167}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.009}, doi = {10.1016/J.MICROREL.2006.09.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CachoOCJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CaristiaNBCRCBGS07, author = {Liliana Caristia and Giuseppe Nicotra and Corrado Bongiorno and Nicola Costa and Sebastiano Ravesi and Salvo Coffa and Riccardo De Bastiani and Maria Grazia Grimaldi and Corrado Spinella}, title = {The influence of hydrogen and nitrogen on the formation of Si nanoclusters embedded in sub-stoichiometric silicon oxide layers}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {777--780}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.056}, doi = {10.1016/J.MICROREL.2007.01.056}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/CaristiaNBCRCBGS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CascioCC07, author = {Alessandra Cascio and Giuseppe Curr{\`{o}} and A. Cavagnoli}, title = {Total ionizing dose reliability of thin SiO\({}_{\mbox{2}}\) in PowerMOSFET devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {815--818}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.007}, doi = {10.1016/J.MICROREL.2007.01.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CascioCC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CastellazziCFPM07, author = {Alberto Castellazzi and Mauro Ciappa and Wolfgang Fichtner and M. Piton and Michel Mermet{-}Guyennet}, title = {A study of the threshold-voltage suitability as an application-related reliability indicator for planar-gate non-punch-through IGBTs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1713--1718}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.035}, doi = {10.1016/J.MICROREL.2007.07.035}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CastellazziCFPM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CesterGWPAG07, author = {Andrea Cester and A. Gasperin and Nicola Wrachien and Alessandro Paccagnella and Valentina Ancarani and Cosimo Gerardi}, title = {Ionising radiation and electrical stress on nanocrystal memory cell array}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {602--605}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.008}, doi = {10.1016/J.MICROREL.2007.01.008}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/CesterGWPAG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChakravarthiKRK07, author = {S. Chakravarthi and A. T. Krishnan and V. Reddy and S. Krishnan}, title = {Probing negative bias temperature instability using a continuum numerical framework: Physics to real world operation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {863--872}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.008}, doi = {10.1016/J.MICROREL.2006.10.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChakravarthiKRK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenK07, author = {Shih{-}Hung Chen and Ming{-}Dou Ker}, title = {Active {ESD} protection circuit design against charged-device-model {ESD} event in {CMOS} integrated circuits}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1502--1505}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.095}, doi = {10.1016/J.MICROREL.2007.07.095}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenXLLX07, author = {W. B. Chen and Jing{-}Ping Xu and Pui{-}To Lai and Y. P. Li and S. G. Xu}, title = {Gate leakage properties of {MOS} devices with tri-layer high-k gate dielectric}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {937--943}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.002}, doi = {10.1016/J.MICROREL.2006.06.002}, timestamp = {Mon, 02 Oct 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenXLLX07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Cheng07, author = {Shiou{-}Ying Cheng}, title = {Very wide current-regime operation of an InP/InGaAs tunneling emitter bipolar transistor {(TEBT)}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1208--1212}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.08.018}, doi = {10.1016/J.MICROREL.2006.08.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Cheng07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Chiang07, author = {T. K. Chiang}, title = {A new two-dimensional threshold voltage model for cylindrical, fully-depleted, surrounding-gate {(SG)} MOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {379--383}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.016}, doi = {10.1016/J.MICROREL.2006.05.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Chiang07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChiuCLHC07, author = {C. C. Chiu and H. H. Chang and C. C. Lee and C. C. Hsia and Kuo{-}Ning Chiang}, title = {Reliability of interfacial adhesion in a multi-level copper/low-k interconnect structure}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1506--1511}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.019}, doi = {10.1016/J.MICROREL.2007.07.019}, timestamp = {Wed, 23 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChiuCLHC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChiuSLH07, author = {Fu{-}Chien Chiu and Wen{-}Chieh Shih and Joseph Ya{-}min Lee and Huey{-}Liang Hwang}, title = {An investigation of surface state capture cross-sections for metal-oxide-semiconductor field-effect transistors using HfO\({}_{\mbox{2}}\) gate dielectrics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {548--551}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.009}, doi = {10.1016/J.MICROREL.2007.01.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChiuSLH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CicoKGSLGPF07, author = {Karol Cico and J{\'{a}}n Kuzm{\'{\i}}k and Dagmar Gregusov{\'{a}} and Roman Stoklas and Tibor Lalinsky and Alexandros G. Georgakilas and Dionyz Pogany and Karol Fr{\"{o}}hlich}, title = {Optimization and performance of Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/GaN metal-oxide-semiconductor structures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {790--793}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.010}, doi = {10.1016/J.MICROREL.2007.01.010}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/CicoKGSLGPF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CoppensJCPDMM07, author = {Peter Coppens and G. Jenicot and Herman Casier and F. De Pestel and F. Depuydt and N. Martens and Peter Moens}, title = {{TLP} Characterization of large gate width devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1462--1467}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.041}, doi = {10.1016/J.MICROREL.2007.07.041}, timestamp = {Mon, 13 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CoppensJCPDMM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CorsoASNLSNC07, author = {Domenico Corso and S. Aurite and E. Sciacca and D. Naso and Salvatore Lombardo and A. Santangelo and M. C. Nicotra and S. Cascino}, title = {Measurement of the hot carrier damage profile in {LDMOS} devices stressed at high drain voltage}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {806--809}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.011}, doi = {10.1016/J.MICROREL.2007.01.011}, timestamp = {Tue, 30 Aug 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/CorsoASNLSNC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CrossonEBTCPP07, author = {A. Crosson and Laurent Escotte and Marise Bafleur and D. Talbourdet and L. Cr{\'{e}}tinon and Philippe Perdu and Guy Perez}, title = {Long-term reliability of silicon bipolar transistors subjected to low constraints}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1590--1594}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.057}, doi = {10.1016/J.MICROREL.2007.07.057}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CrossonEBTCPP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CrupiDGBRH07, author = {Isodiana Crupi and Robin Degraeve and Bogdan Govoreanu and David P. Brunco and Philippe Roussel and Jan Van Houdt}, title = {Distribution and generation of traps in SiO\({}_{\mbox{2}}\)/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) gate stacks}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {525--527}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.013}, doi = {10.1016/J.MICROREL.2007.01.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CrupiDGBRH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CuetoACTBFB07, author = {Olga Cueto and Myriam Assous and Fran{\c{c}}ois de Crecy and A. Toffoli and David Bouchu and M. Fayolle and Fr{\'{e}}d{\'{e}}ric Boulanger}, title = {Development of a permittivity extraction method for ultra low k dielectrics integrated in advanced interconnects}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {769--772}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.057}, doi = {10.1016/J.MICROREL.2007.01.057}, timestamp = {Fri, 04 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CuetoACTBFB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CuongKKKY07, author = {Duy Cuong Nguyen and Dong{-}Jin Kim and Byoung{-}Don Kang and Chang Soo Kim and Soon{-}Gil Yoon}, title = {Characterizations of high resistivity TiN\({}_{\mbox{x}}\)O\({}_{\mbox{y}}\) thin films for applications in thin film resistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {752--754}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.014}, doi = {10.1016/J.MICROREL.2007.01.014}, timestamp = {Mon, 02 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CuongKKKY07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CurroCCMN07, author = {Giuseppe Curr{\`{o}} and Marco Camalleri and Denise Cal{\`{\i}} and Francesca Monforte and Fortunato Neri}, title = {Carrier trapping in thin N\({}_{\mbox{2}}\)O-grown oxynitride/oxide di-layer for PowerMOSFET devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {798--801}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.015}, doi = {10.1016/J.MICROREL.2007.01.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CurroCCMN07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CurroCCMN07a, author = {Giuseppe Curr{\`{o}} and Marco Camalleri and Denise Cal{\`{\i}} and Francesca Monforte and Fortunato Neri}, title = {Interface states and traps in thin N\({}_{\mbox{2}}\)O-grown oxynitride/oxide di-layer for PowerMOSFET devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {819--821}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.016}, doi = {10.1016/J.MICROREL.2007.01.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CurroCCMN07a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DankovicMDDGS07, author = {Danijel Dankovic and Ivica Manic and Vojkan Davidovic and Snezana Djoric{-}Veljkovic and Snezana Golubovic and Ninoslav Stojadinovic}, title = {Negative bias temperature instabilities in sequentially stressed and annealed p-channel power VDMOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1400--1405}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.022}, doi = {10.1016/J.MICROREL.2007.07.022}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DankovicMDDGS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DavidovicKSV07, author = {Vojkan Davidovic and Dimitrios N. Kouvatsos and Ninoslav Stojadinovic and Apostolos T. Voutsas}, title = {Influence of polysilicon film thickness on radiation response of advanced excimer laser annealed polycrystalline silicon thin film transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1841--1845}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.025}, doi = {10.1016/J.MICROREL.2007.07.025}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DavidovicKSV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DebledsRMFPM07, author = {S. Debleds and J. P. Rebrasse and Lionel Dantas de Morais and I. Frapreau and R. Perdreau and B. Morillon}, title = {Localization of sensitive areas of power {AC} switch under thermal laser stimulation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1569--1573}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.018}, doi = {10.1016/J.MICROREL.2007.07.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DebledsRMFPM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DelmonteWCCM07, author = {Nicola Delmonte and B. E. Watts and Giovanni Chiorboli and Paolo Cova and Roberto Menozzi}, title = {Test structures for dielectric spectroscopy of thin films at microwave frequencies}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {682--685}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.062}, doi = {10.1016/J.MICROREL.2007.01.062}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DelmonteWCCM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DemkovSLL07, author = {Alexander A. Demkov and Onise Sharia and Xuhui Luo and Jaekwang Lee}, title = {Density functional theory of high-k dielectric gate stacks}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {686--693}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.009}, doi = {10.1016/J.MICROREL.2007.02.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DemkovSLL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DevireddyMCTTZ07, author = {Siva Prasad Devireddy and Bigang Min and Zeynep {\c{C}}elik{-}Butler and Hsing{-}Huang Tseng and Philip J. Tobin and Ania Zlotnicka}, title = {Improved low frequency noise characteristics of sub-micron MOSFETs with TaSiN/TiN gate on {ALD} HfO\({}_{\mbox{2}}\) dielectric}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1228--1232}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.05.006}, doi = {10.1016/J.MICROREL.2007.05.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DevireddyMCTTZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Driel07, author = {W. D. van Driel}, title = {Facing the challenge of designing for Cu/low-k reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1969--1974}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.009}, doi = {10.1016/J.MICROREL.2007.04.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Driel07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DrielMGZ07, author = {W. D. van Driel and A. Mavinkurve and Marcel A. J. van Gils and G. Q. Zhang}, title = {Advanced structural similarity rules for the {BGA} package family}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {205--214}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.005}, doi = {10.1016/J.MICROREL.2006.09.005}, timestamp = {Wed, 18 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DrielMGZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DrielYYKZ07, author = {Willem D. van Driel and Dao{-}Guo Yang and Cadmus A. Yuan and M. van Kleef and G. Q. (Kouchi) Zhang}, title = {Mechanical reliability challenges for {MEMS} packages: Capping}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1823--1826}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.033}, doi = {10.1016/J.MICROREL.2007.07.033}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DrielYYKZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DubecBPGBS07, author = {Viktor Dubec and Sergey Bychikhin and Dionyz Pogany and Erich Gornik and Tilo Brodbeck and Wolfgang Stadler}, title = {Backside interferometric methods for localization of ESD-induced leakage current and metal shorts}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1539--1544}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.029}, doi = {10.1016/J.MICROREL.2007.07.029}, timestamp = {Wed, 16 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DubecBPGBS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DuchampCM07, author = {Genevi{\`{e}}ve Duchamp and D. Castagnet and Alain Meresse}, title = {Near-field {EMC} study to improve electronic component reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1668--1672}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.044}, doi = {10.1016/J.MICROREL.2007.07.044}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DuchampCM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DuenasCGBKHRL07, author = {Salvador Due{\~{n}}as and Helena Cast{\'{a}}n and H{\'{e}}ctor Garc{\'{\i}}a and L. Bail{\'{o}}n and Kaupo Kukli and Timo Hatanp{\"{a}}{\"{a}} and Mikko Ritala and Markku Leskel{\"{a}}}, title = {Experimental observations of temperature-dependent flat band voltage transients on high-k dielectrics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {653--656}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.080}, doi = {10.1016/J.MICROREL.2007.01.080}, timestamp = {Mon, 30 Mar 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DuenasCGBKHRL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DupontLBKF07, author = {Laurent Dupont and St{\'{e}}phane Lefebvre and M. Bouaroudj and Zoubir Khatir and Jean{-}Claude Faugi{\`{e}}res}, title = {Failure modes on low voltage power MOSFETs under high temperature application}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1767--1772}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.066}, doi = {10.1016/J.MICROREL.2007.07.066}, timestamp = {Thu, 25 Jan 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DupontLBKF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DuschlKAJSK07, author = {Rainer Duschl and Martin Kerber and A. Avellan and S. Jakschik and Uwe Schroeder and S. Kudelka}, title = {Reliability aspects of Hf-based capacitors: Breakdown and trapping effects}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {497--500}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.017}, doi = {10.1016/J.MICROREL.2007.01.017}, timestamp = {Sun, 31 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DuschlKAJSK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Dziedzic07, author = {Andrzej Dziedzic}, title = {Carbon/polyesterimide thick-film resistive composites - Experimental characterization and theoretical analysis of physicochemical, electrical and stability properties}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {354--362}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.016}, doi = {10.1016/J.MICROREL.2006.02.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Dziedzic07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DziedzicF07, author = {Andrzej Dziedzic and Jan Felba}, title = {Polytronic 2005}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {327}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.001}, doi = {10.1016/J.MICROREL.2006.03.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DziedzicF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EggerGBD07, author = {Peter Egger and Markus Gr{\"{u}}tzner and Christian Burmer and Fabien Dudkiewicz}, title = {Application of time resolved emission techniques within the failure analysis flow}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1545--1549}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.067}, doi = {10.1016/J.MICROREL.2007.07.067}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EggerGBD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EndresSS07, author = {Ralf Endres and Yordan Stefanov and Udo Schwalke}, title = {Electrical characterization of crystalline Gd\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) gate dielectric MOSFETs fabricated by damascene metal gate technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {528--531}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.018}, doi = {10.1016/J.MICROREL.2007.01.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EndresSS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EnichlmairCPM07, author = {Hubert Enichlmair and Sara Carniello and Jong Mun Park and Rainer Minixhofer}, title = {Analysis of hot carrier effects in a 0.35 {\(\mathrm{\mu}\)}m high voltage n-channel {LDMOS} transistor}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1439--1443}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.034}, doi = {10.1016/J.MICROREL.2007.07.034}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/EnichlmairCPM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EntnerGTEM07, author = {Robert Entner and Tibor Grasser and Oliver Triebl and Hubert Enichlmair and Rainer Minixhofer}, title = {Negative bias temperature instability modeling for high-voltage oxides at different stress temperatures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {697--699}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.078}, doi = {10.1016/J.MICROREL.2007.01.078}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EntnerGTEM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ErslandM07, author = {Peter Ersland and Roberto Menozzi}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1155}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.015}, doi = {10.1016/J.MICROREL.2007.04.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ErslandM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EthertonWWQMF07, author = {M. Etherton and J. Willemen and Wolfgang Wilkening and Ning Qu and S. Mettler and Wolfgang Fichtner}, title = {Verification of {CDM} circuit simulation using an {ESD} evaluation circuit}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1036--1043}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.006}, doi = {10.1016/J.MICROREL.2006.11.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EthertonWWQMF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Evseev07, author = {S. B. Evseev}, title = {Eyring acceleration model in thick nitride/oxide dielectrics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {748--751}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.019}, doi = {10.1016/J.MICROREL.2007.01.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Evseev07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FalatWK07, author = {Tomasz Falat and Artur Wymyslowski and Jana Kolbe}, title = {Numerical approach to characterization of thermally conductive adhesives}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {342--346}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.019}, doi = {10.1016/J.MICROREL.2006.02.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FalatWK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FalatWKJE07, author = {Tomasz Falat and Artur Wymyslowski and Jana Kolbe and Kaspar M. B. Jansen and Leo J. Ernst}, title = {Influence of matrix viscoelastic properties on thermal conductivity of {TCA} - Numerical approach}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1989--1996}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.010}, doi = {10.1016/J.MICROREL.2007.04.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FalatWKJE07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FantiniF07, author = {Paolo Fantini and Giorgio Ferrari}, title = {Low frequency noise and technology induced mechanical stress in MOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1218--1221}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.024}, doi = {10.1016/J.MICROREL.2006.09.024}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FantiniF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FaqirVFDRMZCCLTD07, author = {Mustapha Faqir and Giovanni Verzellesi and Fausto Fantini and Francesca Danesin and Fabiana Rampazzo and Gaudenzio Meneghesso and Enrico Zanoni and Anna Cavallini and Antonio Castaldini and Nathalie Labat and Andr{\'{e}} Touboul and Christian Dua}, title = {Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1639--1642}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.005}, doi = {10.1016/J.MICROREL.2007.07.005}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/FaqirVFDRMZCCLTD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FarmakisKKV07, author = {F. V. Farmakis and Giannis P. Kontogiannopoulos and Dimitrios N. Kouvatsos and Apostolos T. Voutsas}, title = {Degradation of double-gate polycrystalline silicon TFTs due to hot carrier stress}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1434--1438}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.030}, doi = {10.1016/J.MICROREL.2007.07.030}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FarmakisKKV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FarrellCPAHHM07, author = {Richard A. Farrell and Karim Cherkaoui and Nikolay Petkov and Heinz Amenitsch and Justin D. Holmes and Paul K. Hurley and Michael A. Morris}, title = {Physical and electrical properties of low dielectric constant self-assembled mesoporous silica thin films}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {759--763}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.020}, doi = {10.1016/J.MICROREL.2007.01.020}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/FarrellCPAHHM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FernandezRNA07, author = {Raul Fern{\'{a}}ndez and Rosana Rodr{\'{\i}}guez and Montserrat Nafr{\'{\i}}a and Xavier Aymerich}, title = {Effect of oxide breakdown on {RS} latches}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {581--584}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.021}, doi = {10.1016/J.MICROREL.2007.01.021}, timestamp = {Wed, 14 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/FernandezRNA07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FilhoBFD07, author = {W. C. Maia Filho and M. Brizoux and H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and Yves Danto}, title = {Torsion test applied for reballing and solder paste volume evaluation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1663--1667}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.028}, doi = {10.1016/J.MICROREL.2007.07.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FilhoBFD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FiorenzaNRLTMF07, author = {Patrick Fiorenza and Raffaella Lo Nigro and Vito Raineri and Salvatore Lombardo and Roberta G. Toro and Graziella Malandrino and Ignazio L. Fragal{\`{a}}}, title = {Defects induced anomalous breakdown kinetics in Pr\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) by micro- and nano-characterization}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {640--644}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.022}, doi = {10.1016/J.MICROREL.2007.01.022}, timestamp = {Tue, 17 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FiorenzaNRLTMF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FleetwoodRTZBWSP07, author = {Daniel M. Fleetwood and M. P. Rodgers and L. Tsetseris and X. J. Zhou and I. Batyrev and S. Wang and Ronald D. Schrimpf and Sokrates T. Pantelides}, title = {Effects of device aging on microelectronics radiation response and reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1075--1085}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.009}, doi = {10.1016/J.MICROREL.2006.06.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FleetwoodRTZBWSP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FuWL07, author = {Y. Fu and Hei Wong and Juin J. Liou}, title = {Characterization and modeling of flicker noise in junction field-effect transistor with source and drain trench isolation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {46--50}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.009}, doi = {10.1016/J.MICROREL.2006.01.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FuWL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Fukuda07, author = {Mitsuo Fukuda}, title = {Reliability of semiconductor lasers used in current communication systems and sensing equipment}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1619--1624}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.007}, doi = {10.1016/J.MICROREL.2007.07.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Fukuda07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FukudaOP07, author = {Yuki Fukuda and Michael D. Osterman and Michael G. Pecht}, title = {The impact of electrical current, mechanical bending, and thermal annealing on tin whisker growth}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {88--92}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.04.011}, doi = {10.1016/J.MICROREL.2006.04.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FukudaOP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GalataEPSD07, author = {S. F. Galata and E. K. Evangelou and Yerassimos Panayiotatos and A. Sotiropoulos and Athanasios Dimoulas}, title = {Post deposition annealing studies of lanthanum aluminate and ceria high-k dielectrics on germanium}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {532--535}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.023}, doi = {10.1016/J.MICROREL.2007.01.023}, timestamp = {Thu, 05 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GalataEPSD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GaoGSBBEGL07, author = {Yuan Gao and Nicolas Guitard and Christophe Salamero and Marise Bafleur and Laurent Bary and Laurent Escotte and Patrick Gueulle and Lionel Lescouz{\`{e}}res}, title = {Identification of the physical signatures of {CDM} induced latent defects into a {DC-DC} converter using low frequency noise measurements}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1456--1461}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.089}, doi = {10.1016/J.MICROREL.2007.07.089}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GaoGSBBEGL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GaresBMMMME07, author = {M. Gares and Mohamed Ali Bela{\"{\i}}d and Hichame Maanane and Mohamed Masmoudi and J{\'{e}}r{\^{o}}me Marcon and Karine Mourgues and Philippe Eudeline}, title = {Study of hot-carrier effects on power {RF} {LDMOS} device reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1394--1399}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.064}, doi = {10.1016/J.MICROREL.2007.07.064}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GaresBMMMME07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GawAGM07, author = {Craig A. Gaw and Thomas Arnold and Elizabeth Glass and Robert Martin}, title = {Reliability and performance of a true enhancement mode {HIGFET} for wireless applications}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1180--1187}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.006}, doi = {10.1016/J.MICROREL.2007.02.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GawAGM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GerardiLACAMGP07, author = {Cosimo Gerardi and Salvatore Lombardo and Giuseppe Ammendola and Giovanni Costa and Valentina Ancarani and Domenico Mello and Stella Giuffrida and Maria Cristina Plantamura}, title = {Study of nanocrystal memory integration in a Flash-like {NOR} device}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {593--597}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.024}, doi = {10.1016/J.MICROREL.2007.01.024}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GerardiLACAMGP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GilsDZBSFJ07, author = {Marcel A. J. van Gils and W. D. van Driel and G. Q. Zhang and H. J. L. Bressers and Richard B. R. van Silfhout and X. J. Fan and J. H. J. Janssen}, title = {Virtual qualification of moisture induced failures of advanced packages}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {273--279}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.011}, doi = {10.1016/J.MICROREL.2006.09.011}, timestamp = {Wed, 18 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GilsDZBSFJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GilsSZJV07, author = {Marcel A. J. van Gils and Olaf van der Sluis and G. Q. Zhang and J. H. J. Janssen and R. M. J. Voncken}, title = {Analysis of Cu/low-k bond pad delamination by using a novel failure index}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {179--186}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.003}, doi = {10.1016/J.MICROREL.2006.09.003}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GilsSZJV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GlaserESRDCF07, author = {Ulrich Glaser and Kai Esmark and Martin Streibl and Christian Russ and Krzysztof Domanski and Mauro Ciappa and Wolfgang Fichtner}, title = {{SCR} operation mode of diode strings for {ESD} protection}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1044--1053}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.013}, doi = {10.1016/J.MICROREL.2006.11.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GlaserESRDCF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GlavanovicsKKS07, author = {Michael Glavanovics and Helmut K{\"{o}}ck and Vladim{\'{\i}}r Kosel and Tobias Smorodin}, title = {Flexible active cycle stress testing of smart power switches}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1790--1794}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.065}, doi = {10.1016/J.MICROREL.2007.07.065}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GlavanovicsKKS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GoguenheimPO07, author = {Didier Goguenheim and D. Pic and Jean{-}Luc Ogier}, title = {Oxide reliability below 3 nm for advanced {CMOS:} Issues, characterization, and solutions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1322--1329}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.048}, doi = {10.1016/J.MICROREL.2007.07.048}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GoguenheimPO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GomeniukNVLLBHPC07, author = {Y. V. Gomeniuk and A. N. Nazarov and Ya. N. Vovk and V. S. Lysenko and Yi Lu and Octavian Buiu and Steve Hall and R. J. Potter and Paul R. Chalker}, title = {Charge trapping and interface states in hydrogen annealed HfO\({}_{\mbox{2}}\)-Si structures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {714--717}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.025}, doi = {10.1016/J.MICROREL.2007.01.025}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GomeniukNVLLBHPC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GondaJETZ07, author = {Viktor Gonda and Kaspar M. B. Jansen and Leo J. Ernst and Jaap M. J. den Toonder and G. Q. Zhang}, title = {Micro-mechanical testing of SiLK by nanoindentation and substrate curvature techniques}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {248--251}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.033}, doi = {10.1016/J.MICROREL.2006.09.033}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GondaJETZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GoodmanHJ07, author = {Douglas Goodman and James Hofmeister and Justin Judkins}, title = {Electronic prognostics for switched mode power supplies}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1902--1906}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.021}, doi = {10.1016/J.MICROREL.2007.02.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GoodmanHJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GordonBS07, author = {P{\'{e}}ter Gordon and B{\'{a}}lint Balogh and B{\'{a}}lint Sinkovics}, title = {Thermal simulation of {UV} laser ablation of polyimide}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {347--353}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.013}, doi = {10.1016/J.MICROREL.2006.01.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GordonBS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GorollKPA07, author = {Michael Goroll and Werner Kanert and Reinhard Pufall and Stefano Aresu}, title = {Analysis of {ESD} protection structure behaviour after ageing as new approach for system level reliability of automotive power devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1512--1516}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.042}, doi = {10.1016/J.MICROREL.2007.07.042}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GorollKPA07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GrasserS07, author = {Tibor Grasser and Siegfried Selberherr}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {839--840}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.005}, doi = {10.1016/J.MICROREL.2006.10.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GrasserS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GrassoMP07, author = {Francesco Grasso and Stefano Manetti and Maria Cristina Piccirilli}, title = {A symbolic approach to design centering of analog circuits}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1288--1295}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.022}, doi = {10.1016/J.MICROREL.2006.09.022}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GrassoMP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GrekhovKTV07, author = {I. V. Grekhov and G. G. Kareva and S. E. Tyaginov and M. I. Vexler}, title = {Application of an {MOS} tunnel transistor for measurements of the tunneling parameters and of the parameters of electron energy relaxation in silicon}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {669--672}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.077}, doi = {10.1016/J.MICROREL.2007.01.077}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GrekhovKTV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GuBP07, author = {Jie Gu and Donald Barker and Michael G. Pecht}, title = {Prognostics implementation of electronics under vibration loading}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1849--1856}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.015}, doi = {10.1016/J.MICROREL.2007.02.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GuBP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GuedjIMLRA07, author = {Cyril Guedj and G. Imbert and E. Martinez and Christophe Licitra and N{\'{e}}vine Rochat and V. Arnal}, title = {Modification of porous ultra-low {K} dielectric by electron-beam curing}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {764--768}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.026}, doi = {10.1016/J.MICROREL.2007.01.026}, timestamp = {Tue, 28 Mar 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GuedjIMLRA07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HabchiSMK07, author = {R. Habchi and C. Salame and P. Mialhe and A. Khoury}, title = {Switching times variation of power {MOSFET} devices after electrical stress}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1296--1299}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.044}, doi = {10.1016/J.MICROREL.2006.09.044}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HabchiSMK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HalPGS07, author = {B. A. E. van Hal and Ron H. J. Peerlings and Marc G. D. Geers and Olaf van der Sluis}, title = {Cohesive zone modeling for structural integrity analysis of {IC} interconnects}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1251--1261}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.08.017}, doi = {10.1016/J.MICROREL.2006.08.017}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HalPGS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HattoriNSHKM07, author = {Takeo Hattori and Hiroshi Nohira and S. Shinagawa and M. Hori and M. Kase and T. Maruizumi}, title = {Angle-resolved photoelectron spectroscopy on gate insulators}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {20--26}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.003}, doi = {10.1016/J.MICROREL.2006.03.003}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HattoriNSHKM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeerBMPHGKSR07, author = {Michael Heer and Sergey Bychikhin and W. Mamanee and Dionyz Pogany and A. Heid and P. Grombach and M. Klaussner and Winfried Soppa and Bernd Ramler}, title = {Experimental and numerical analysis of current flow homogeneity in low voltage {SOI} multi-finger gg-NMOS and {NPN} {ESD} protection devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1450--1455}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.092}, doi = {10.1016/J.MICROREL.2007.07.092}, timestamp = {Fri, 10 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeerBMPHGKSR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeineB07, author = {Richard Heine and Donald Barker}, title = {Simplified terrain identification and component fatigue damage estimation model for use in a health and usage monitoring system}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1882--1888}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.017}, doi = {10.1016/J.MICROREL.2007.02.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeineB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HoCHWL07, author = {Chia{-}Huai Ho and Kuei{-}Shu Chang{-}Liao and Ya{-}Nan Huang and Tien{-}Ko Wang and T. C. Lu}, title = {Performance and reliability improvement of flash device by a novel programming method}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {967--971}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.003}, doi = {10.1016/J.MICROREL.2006.06.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HoCHWL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HofJWEYZB07, author = {C. van't Hof and Kaspar M. B. Jansen and G. Wisse and Leo J. Ernst and Dao{-}Guo Yang and G. Q. Zhang and H. J. L. Bressers}, title = {Novel shear tools for viscoelastic characterization of packaging polymers}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {240--247}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.032}, doi = {10.1016/J.MICROREL.2006.09.032}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HofJWEYZB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HolzHSR07, author = {M. Holz and G. Hultsch and T. Scherg and R. Rupp}, title = {Reliability considerations for recent Infineon SiC diode releases}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1741--1745}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.031}, doi = {10.1016/J.MICROREL.2007.07.031}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HolzHSR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HolzerSKGS07, author = {Stefan Holzer and Alireza Sheikholeslami and Markus Karner and Tibor Grasser and Siegfried Selberherr}, title = {Comparison of deposition models for a {TEOS} {LPCVD} process}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {623--625}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.058}, doi = {10.1016/J.MICROREL.2007.01.058}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HolzerSKGS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HongM07, author = {Changsoo Hong and Linda Milor}, title = {Modeling of the breakdown mechanisms for porous copper/low-k process flows}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1478--1482}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.020}, doi = {10.1016/J.MICROREL.2007.07.020}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HongM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HoussaAGGH07, author = {M. Houssa and Marc Aoulaiche and Stefan De Gendt and Guido Groeseneken and Marc M. Heyns}, title = {Negative bias temperature instabilities in HfSiO(N)-based MOSFETs: Electrical characterization and modeling}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {880--889}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.010}, doi = {10.1016/J.MICROREL.2006.10.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HoussaAGGH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HsuL07, author = {Hsin{-}hao Hsu and Joseph Ya{-}min Lee}, title = {Electrical characterization of metal-oxide-high-k dielectric-oxide-semiconductor {(MOHOS)} structures for memory applications}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {606--609}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.027}, doi = {10.1016/J.MICROREL.2007.01.027}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HsuL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuangCT07, author = {Zhiheng Huang and Paul P. Conway and Rachel C. Thomson}, title = {Microstructural considerations for ultrafine lead free solder joints}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1997--2006}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.013}, doi = {10.1016/J.MICROREL.2007.04.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HuangCT07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HurleyCMHG07, author = {Paul K. Hurley and Karim Cherkaoui and S. McDonnell and G. Hughes and A. W. Groenland}, title = {Characterisation and passivation of interface defects in {(1} 0 0)-Si/SiO\({}_{\mbox{2}}\)/HfO\({}_{\mbox{2}}\)/TiN gate stacks}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1195--1201}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.030}, doi = {10.1016/J.MICROREL.2006.09.030}, timestamp = {Fri, 13 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HurleyCMHG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ImmonenKK07, author = {Marika P. Immonen and Mikko Karppinen and Jorma K. Kivilahti}, title = {Investigation of environmental reliability of optical polymer waveguides embedded on printed circuit boards}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {363--371}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.020}, doi = {10.1016/J.MICROREL.2006.02.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ImmonenKK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/InaniKG07, author = {Anand Inani and Victor Koldyaev and Spencer Graves}, title = {Accelerated testing for time dependent dielectric breakdown {(TDDB)} evaluation of embedded {DRAM} capacitors using tantalum pentoxide}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1429--1433}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.053}, doi = {10.1016/J.MICROREL.2007.07.053}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/InaniKG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IraceBS07, author = {Andrea Irace and Giovanni Breglio and Paolo Spirito}, title = {New developments of THERMOS\({}^{\mbox{3}}\), a tool for 3D electro-thermal simulation of smart power MOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1696--1700}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.012}, doi = {10.1016/J.MICROREL.2007.07.012}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/IraceBS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IwayamaHH07, author = {T. S. Iwayama and T. Hama and D. E. Hole}, title = {{RTA} effects on the formation process of embedded luminescent Si nanocrystals in SiO\({}_{\mbox{2}}\)}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {781--785}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.028}, doi = {10.1016/J.MICROREL.2007.01.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IwayamaHH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JacobNH07, author = {Peter Jacob and Giovanni Nicoletti and Florian Hauf}, title = {Device decapsulated (and/or depassivated) - Retest ok - What happened?}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1574--1579}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.077}, doi = {10.1016/J.MICROREL.2007.07.077}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JacobNH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JangKYKCP07, author = {Sung Jun Jang and Dae Hyun Ka and Chong{-}Gun Yu and Kwan{-}Su Kim and Won{-}Ju Cho and Jong Tae Park}, title = {Comparative study of {NBTI} as a function of Si film orientation and thickness in {SOI} pMOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1411--1415}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.015}, doi = {10.1016/J.MICROREL.2007.07.015}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/JangKYKCP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JeongHP07, author = {Jae{-}Seong Jeong and Soon{-}Ha Hong and Sang{-}Deuk Park}, title = {Field failure mechanism and improvement of {EOS} failure of integrated {IGBT} inverter modules}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1795--1799}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.087}, doi = {10.1016/J.MICROREL.2007.07.087}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JeongHP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JevticH07, author = {Milan Jevtic and Jovan M. Hadzi{-}Vukovic}, title = {Study of the electrical cycling stressed large area Schottky diodes using {I-V} and noise measurements}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {51--58}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.013}, doi = {10.1016/J.MICROREL.2006.03.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JevticH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JinkaGDLSS07, author = {K. K. Jinka and S. Ganesan and A. Dasgupta and S. Ling and Andrew A. Shapiro and D. Schatzel}, title = {Chip-on-Board (CoB) technology for low temperature environments. Part {I:} Wire profile modeling in unencapsulated chips}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1246--1250}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.08.019}, doi = {10.1016/J.MICROREL.2006.08.019}, timestamp = {Tue, 03 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JinkaGDLSS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KaczerDRG07, author = {Ben Kaczer and Robin Degraeve and Philippe Roussel and Guido Groeseneken}, title = {Gate oxide breakdown in {FET} devices and circuits: From nanoscale physics to system-level reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {559--566}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.063}, doi = {10.1016/J.MICROREL.2007.01.063}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KaczerDRG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KahnVDDBBPGB07, author = {Maurice Kahn and Christophe Vall{\'{e}}e and Emmanuel Defay and Catherine Dubourdieu and Marceline Bonvalot and Serge Blonkowski and Jean{-}Raoul Plaussu and Pierre Garrec and Thierry Baron}, title = {Improved electrical properties using SrTiO\({}_{\mbox{3}}\)/Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) bilayer dielectrics for {MIM} capacitor applications}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {773--776}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.029}, doi = {10.1016/J.MICROREL.2007.01.029}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KahnVDDBBPGB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KarnerGWEHGVGKS07, author = {Markus Karner and Andreas Gehring and M. Wagner and Robert Entner and Stefan Holzer and Wolfgang Goes and M. Vasicek and Tibor Grasser and Hans Kosina and Siegfried Selberherr}, title = {{VSP} - {A} gate stack analyzer}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {704--708}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.059}, doi = {10.1016/J.MICROREL.2007.01.059}, timestamp = {Thu, 13 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KarnerGWEHGVGKS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KeimasiAP07, author = {Mohammadreza Keimasi and Michael H. Azarian and Michael G. Pecht}, title = {Isothermal aging effects on flex cracking of multilayer ceramic capacitors with standard and flexible terminations}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2215--2225}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.12.005}, doi = {10.1016/J.MICROREL.2006.12.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KeimasiAP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KerC07, author = {Ming{-}Dou Ker and Wei{-}Jen Chang}, title = {Overview on {ESD} protection design for mixed-voltage {I/O} interfaces with high-voltage-tolerant power-rail {ESD} clamp circuits in low-voltage thin-oxide {CMOS} technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {27--35}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.012}, doi = {10.1016/J.MICROREL.2006.03.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KerC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KerberPVGK07, author = {A. Kerber and Luigi Pantisano and Anabela Veloso and Guido Groeseneken and Martin Kerber}, title = {Reliability screening of high-k dielectrics based on voltage ramp stress}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {513--517}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.030}, doi = {10.1016/J.MICROREL.2007.01.030}, timestamp = {Fri, 09 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KerberPVGK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KhatirLS07, author = {Zoubir Khatir and St{\'{e}}phane Lefebvre and F. Saint{-}Eve}, title = {Experimental and numerical investigations on delayed short-circuit failure mode of single chip {IGBT} devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {422--428}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.004}, doi = {10.1016/J.MICROREL.2006.05.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KhatirLS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Khazhinsky07, author = {Michael G. Khazhinsky}, title = {{ESD} protection strategies in advanced {CMOS} {SOI} ICs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1313--1321}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.086}, doi = {10.1016/J.MICROREL.2007.07.086}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Khazhinsky07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KhongLTDCLVS07, author = {B. Khong and Marc Legros and Patrick Tounsi and Philippe Dupuy and X. Chauffleur and Colette Levade and G. Vanderschaeve and Emmanuel Scheid}, title = {Characterization and modelling of ageing failures on power {MOSFET} devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1735--1740}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.055}, doi = {10.1016/J.MICROREL.2007.07.055}, timestamp = {Fri, 06 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KhongLTDCLVS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimISUK07, author = {Keun{-}Soo Kim and Takayuki Imanishi and Katsuaki Suganuma and Minoru Ueshima and Rikiya Kato}, title = {Properties of low temperature Sn-Ag-Bi-In solder systems}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1113--1119}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.012}, doi = {10.1016/J.MICROREL.2006.06.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimISUK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimS07, author = {Hak Sung Kim and Ho Geon Song}, title = {Investigation of moisture-induced failures of stacked-die package}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1673--1679}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.014}, doi = {10.1016/J.MICROREL.2007.07.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimYB07, author = {Hyong Tae Kim and Hae Jeong Yang and Seung Yub Baek}, title = {Iterative algorithm for automatic alignment by object transformation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {972--985}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.008}, doi = {10.1016/J.MICROREL.2006.06.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimYB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KisielFBM07, author = {Ryszard Kisiel and Jan Felba and Janusz Borecki and Andrzej Moscicki}, title = {Problems of {PCB} microvias filling by conductive paste}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {335--341}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.018}, doi = {10.1016/J.MICROREL.2006.02.018}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KisielFBM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KolbeACMMSS07, author = {Jana Kolbe and Andreas Arp and Francesco Calderone and Edouard Marc Meyer and Wilhelm Meyer and Helmut Schaefer and Manuela Stuve}, title = {Inkjettable conductive adhesive for use in microelectronics and microsystems technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {331--334}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.017}, doi = {10.1016/J.MICROREL.2006.02.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KolbeACMMSS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KomodaMTWY07, author = {Hirotaka Komoda and Chie Moritani and Kazutaka Takahashi and Heiji Watanabe and Kiyoshi Yasutake}, title = {Sample tilting technique for preventing electrostatic discharge during high-current {FIB} gas-assisted etching with XeF\({}_{\mbox{2}}\)}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {74--81}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.04.013}, doi = {10.1016/J.MICROREL.2006.04.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KomodaMTWY07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KooJ07, author = {Ja{-}Myeong Koo and Seung{-}Boo Jung}, title = {Effect of displacement rate on ball shear properties for Sn-37Pb and Sn-3.5Ag {BGA} solder joints during isothermal aging}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2169--2178}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.043}, doi = {10.1016/J.MICROREL.2006.09.043}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KooJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KunchwarSG07, author = {Mayuri Kunchwar and Reza Sedaghat and Vadim Geurkov}, title = {Dynamic behavior of resistive faults in nanometer technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2141--2146}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.081}, doi = {10.1016/J.MICROREL.2007.01.081}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KunchwarSG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Kung07, author = {Huang{-}Kuang Kung}, title = {Evaluation of sweep resistance of {Q} Auto-Loop and Square-Loop bonds for semiconductor packaging technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1103--1112}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.001}, doi = {10.1016/J.MICROREL.2006.07.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Kung07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KurodaTWMYSO07, author = {Rihito Kuroda and Akinobu Teramoto and Kazufumi Watanabe and Michihiko Mifuji and Takahisa Yamaha and Shigetoshi Sugawa and Tadahiro Ohmi}, title = {Circuit level prediction of device performance degradation due to negative bias temperature stress}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {930--936}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.013}, doi = {10.1016/J.MICROREL.2006.06.013}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KurodaTWMYSO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LabatT07, author = {Nathalie Labat and Andr{\'{e}} Touboul}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1311--1312}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.08.007}, doi = {10.1016/J.MICROREL.2007.08.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LabatT07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LachenalBMR07, author = {D. Lachenal and Alain Bravaix and Frederic Monsieur and Yannick Rey{-}Tauriac}, title = {Degradation mechanism understanding of {NLDEMOS} {SOI} in {RF} applications}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1634--1638}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.024}, doi = {10.1016/J.MICROREL.2007.07.024}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LachenalBMR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiCKLC07, author = {Yi{-}Shao Lai and Kuo{-}Ming Chen and Chin{-}Li Kao and Chiu{-}Wen Lee and Ying{-}Ta Chiu}, title = {Electromigration of Sn-37Pb and Sn-3Ag-1.5Cu/Sn-3Ag-0.5Cu composite flip-chip solder bumps with Ti/Ni(V)/Cu under bump metallurgy}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1273--1279}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.023}, doi = {10.1016/J.MICROREL.2006.09.023}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiCKLC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiCY07, author = {Yi{-}Shao Lai and Hsiao{-}Chuan Chang and Chang{-}Lin Yeh}, title = {Evaluation of solder joint strengths under ball impact test}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2179--2187}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.015}, doi = {10.1016/J.MICROREL.2006.11.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiCY07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiFLHY07, author = {Chieh{-}Ming Lai and Yean{-}Kuen Fang and Chien{-}Ting Lin and Chia{-}Wei Hsu and Wen{-}Kuan Yeh}, title = {The impacts of high tensile stress {CESL} and geometry design on device performance and reliability for 90 nm {SOI} nMOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {944--952}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.010}, doi = {10.1016/J.MICROREL.2006.06.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiFLHY07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiW07, author = {Yi{-}Shao Lai and Tong Hong Wang}, title = {Optimal design towards enhancement of board-level thermomechanical reliability of wafer-level chip-scale packages}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {104--110}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.04.008}, doi = {10.1016/J.MICROREL.2006.04.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiWTJ07, author = {Yi{-}Shao Lai and Tong Hong Wang and Han{-}Hui Tsai and Ming{-}Hwa R. Jen}, title = {Cyclic bending reliability of wafer-level chip-scale packages}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {111--117}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.04.010}, doi = {10.1016/J.MICROREL.2006.04.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiWTJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LajnefVBBW07, author = {Walid Lajnef and Jean{-}Michel Vinassa and Olivier Briat and H. El Brouji and Eric Woirgard}, title = {Monitoring fading rate of ultracapacitors using online characterization during power cycling}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1751--1755}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.08.005}, doi = {10.1016/J.MICROREL.2007.08.005}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LajnefVBBW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LallHBISL07, author = {Pradeep Lall and Madhura Hande and Chandan Bhat and Nokibul Islam and Jeff Suhling and Jay Lee}, title = {Feature extraction and damage-precursors for prognostication of lead-free electronics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1907--1920}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.022}, doi = {10.1016/J.MICROREL.2007.02.022}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LallHBISL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LangS07, author = {Florian Lang and Uwe Scheuermann}, title = {Reliability of spring pressure contacts under environmental stress}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1761--1766}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.038}, doi = {10.1016/J.MICROREL.2007.07.038}, timestamp = {Thu, 13 Jun 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LangS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LanzaPNBFRLJ07, author = {Mario Lanza and Marc Porti and Montserrat Nafr{\'{\i}}a and Guenther Benstetter and Werner Frammelsberger and Heiko Ranzinger and E. Lodermeier and G. Jaschke}, title = {Influence of the manufacturing process on the electrical properties of thin (k stacks observed with {CAFM}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1424--1428}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.045}, doi = {10.1016/J.MICROREL.2007.07.045}, timestamp = {Wed, 07 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LanzaPNBFRLJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LauQHSCATS07, author = {W. S. Lau and P. W. Qian and Taejoon Han and Nathan P. Sandler and S. T. Che and S. E. Ang and C. H. Tung and T. T. Sheng}, title = {Evidence that N\({}_{\mbox{2}}\)O is a stronger oxidizing agent than O\({}_{\mbox{2}}\) for both Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\) and bare Si below 1000degreeC and temperature for minimum low-K interfacial oxide for high-K dielectric on Si}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {429--433}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.018}, doi = {10.1016/J.MICROREL.2006.05.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LauQHSCATS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaurilaMVKLSK07, author = {Tomi Laurila and Toni T. Mattila and Vesa Vuorinen and Juha Karppinen and Jue Li and Mika Sippola and Jorma K. Kivilahti}, title = {Evolution of microstructure and failure mechanism of lead-free solder interconnections in power cycling and thermal shock tests}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1135--1144}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.095}, doi = {10.1016/J.MICROREL.2006.07.095}, timestamp = {Thu, 03 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaurilaMVKLSK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LebedinskiiZ07, author = {Yu. Lebedinskii and A. V. Zenkevich}, title = {Effective work function of NiSi/HfO\({}_{\mbox{2}}\) gate stacks measured with X-ray photoelectron spectroscopy}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {649--652}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.064}, doi = {10.1016/J.MICROREL.2007.01.064}, timestamp = {Thu, 28 Mar 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LebedinskiiZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LeeLKCC07, author = {Chang{-}Chun Lee and Chien{-}Chen Lee and Hsiao{-}Tung Ku and Shu{-}Ming Chang and Kuo{-}Ning Chiang}, title = {Solder joints layout design and reliability enhancements of wafer level packaging using response surface methodology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {196--204}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.004}, doi = {10.1016/J.MICROREL.2006.09.004}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LeeLKCC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LeeS07, author = {J. G. Lee and K. N. Subramanian}, title = {Effects of {TMF} heating rates on damage accumulation and resultant mechanical behavior of Sn-Ag based solder joints}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {118--131}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.001}, doi = {10.1016/J.MICROREL.2006.02.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LeeS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LembergerBB07, author = {Martin Lemberger and A. Baunemann and Anton J. Bauer}, title = {Chemical vapor deposition of tantalum nitride films for metal gate application using {TBTDET} and novel single-source {MOCVD} precursors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {635--639}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.032}, doi = {10.1016/J.MICROREL.2007.01.032}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LembergerBB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Lenahan07, author = {Patrick M. Lenahan}, title = {Deep level defects involved in {MOS} device instabilities}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {890--898}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.016}, doi = {10.1016/J.MICROREL.2006.10.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Lenahan07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Leray07, author = {J. L. Leray}, title = {Effects of atmospheric neutrons on devices, at sea level and in avionics embedded systems}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1827--1835}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.101}, doi = {10.1016/J.MICROREL.2007.07.101}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Leray07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LerouxGR07, author = {Charles Leroux and G{\'{e}}rard Ghibaudo and Gilles Reimbold}, title = {Accurate determination of flat band voltage in advanced {MOS} structure}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {660--664}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.033}, doi = {10.1016/J.MICROREL.2007.01.033}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LerouxGR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LeyrisMHVV07, author = {C{\'{e}}dric Leyris and Fr{\'{e}}d{\'{e}}ric Martinez and Alain Hoffmann and M. Valenza and J. C. Vildeuil}, title = {{N-MOSFET} oxide trap characterization induced by nitridation process using {RTS} noise analysis}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {41--45}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.010}, doi = {10.1016/J.MICROREL.2006.02.010}, timestamp = {Tue, 03 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LeyrisMHVV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LeyrisMVHV07, author = {C{\'{e}}dric Leyris and Fr{\'{e}}d{\'{e}}ric Martinez and M. Valenza and Alain Hoffmann and J. C. Vildeuil}, title = {Random telegraph signal: {A} sensitive and nondestructive tool for gate oxide single trap characterization}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {573--576}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.034}, doi = {10.1016/J.MICROREL.2007.01.034}, timestamp = {Tue, 03 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LeyrisMVHV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LhommeauPMMMK07, author = {T. Lhommeau and Xavier Perpi{\~{n}}{\`{a}} and C. Martin and R{\'{e}}gis Meuret and Michel Mermet{-}Guyennet and Moussa Karama}, title = {Thermal fatigue effects on the temperature distribution inside {IGBT} modules for zone engine aeronautical applications}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1779--1783}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.093}, doi = {10.1016/J.MICROREL.2007.07.093}, timestamp = {Thu, 30 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LhommeauPMMMK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiSPSCSAAEBDNLGM07, author = {Z. Li and Tom Schram and Luigi Pantisano and A. Stesmans and Thierry Conard and S. Shamuilia and V. V. Afanasiev and A. Akheyar and Sven Van Elshocht and D. P. Brunco and W. Deweerd and Y. Naoki and P. Lehnen and Stefan De Gendt and Kristin De Meyer}, title = {Mechanism of O\({}_{\mbox{2}}\)-anneal induced V\({}_{\mbox{fb}}\) shifts of Ru gated stacks}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {518--520}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.054}, doi = {10.1016/J.MICROREL.2007.01.054}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiSPSCSAAEBDNLGM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiT07, author = {Wei Li and Cher Ming Tan}, title = {Enhanced finite element modelling of Cu electromigration using {ANSYS} and matlab}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1497--1501}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.058}, doi = {10.1016/J.MICROREL.2007.07.058}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiT07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiaoMB07, author = {Joy Y. Liao and Howard L. Marks and F. Beaudoin}, title = {{OBIRCH} analysis of electrically stressed advanced graphic ICs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1565--1568}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.047}, doi = {10.1016/J.MICROREL.2007.07.047}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiaoMB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LinCCWC07, author = {Hung{-}Sung Lin and Chun{-}Ming Chen and Kuo{-}Hsiung Chen and Afung Wang and C. H. Chao}, title = {A case study of defects due to process marginalities in deep sub-micron technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1604--1608}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.075}, doi = {10.1016/J.MICROREL.2007.07.075}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LinCCWC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LinCSW07, author = {M. H. Lin and K. P. Chang and K. C. Su and Tahui Wang}, title = {Effects of width scaling and layout variation on dual damascene copper interconnect electromigration}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2100--2108}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.004}, doi = {10.1016/J.MICROREL.2006.10.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LinCSW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LindgrenBTL07, author = {Mats Lindgren and Ilja Belov and Magnus T{\"{o}}rnvall and Peter Leisner}, title = {Application of simulation-based decision making in product development of an {RF} module}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {302--309}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.008}, doi = {10.1016/J.MICROREL.2006.09.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LindgrenBTL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuHZZY07, author = {Hongfei Liu and Alin Hou and Hongbo Zhang and Daming Zhang and Maobin Yi}, title = {A voltage calibration technique of electro-optic probing for characterization internal to IC's chip}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {82--87}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.007}, doi = {10.1016/J.MICROREL.2006.05.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuHZZY07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuSH07, author = {D. S. Liu and M. K. Shih and W. H. Huang}, title = {Measurement and analysis of contact resistance in wafer probe testing}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1086--1094}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.091}, doi = {10.1016/J.MICROREL.2006.07.091}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuSH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuXFGMWFM07, author = {Zhanwei Liu and Huimin Xie and Daining Fang and Changzhi Gu and Yonggang Meng and Weining Wang and Yan Fang and Jianmin Miao}, title = {Deformation analysis in microstructures and micro-devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2226--2230}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.019}, doi = {10.1016/J.MICROREL.2006.11.019}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LiuXFGMWFM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Lloyd07, author = {J. R. Lloyd}, title = {Black's law revisited - Nucleation and growth in electromigration failure}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1468--1472}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.094}, doi = {10.1016/J.MICROREL.2007.07.094}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Lloyd07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Lombardo07, author = {Salvatore Lombardo}, title = {Guest Editorial}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {477--478}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.008}, doi = {10.1016/J.MICROREL.2007.02.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Lombardo07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Lopez07, author = {Leon Lopez}, title = {Advanced electronic prognostics through system telemetry and pattern recognition methods}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1865--1873}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.018}, doi = {10.1016/J.MICROREL.2007.02.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Lopez07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LuBHMDPC07, author = {Y. Lu and Octavian Buiu and Steve Hall and Ivona Z. Mitrovic and W. Davey and R. J. Potter and Paul R. Chalker}, title = {Tuneable electrical properties of hafnium aluminate gate dielectrics deposited by metal organic chemical vapour deposition}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {722--725}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.052}, doi = {10.1016/J.MICROREL.2007.01.052}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LuBHMDPC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LuLL07, author = {C. Y. Lu and Horng{-}Chih Lin and Y. J. Lee}, title = {Dynamic {NBTI} characteristics of PMOSFETs with PE-SiN capping}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {924--929}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.004}, doi = {10.1016/J.MICROREL.2006.06.004}, timestamp = {Wed, 21 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LuLL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LuanTPLZ07, author = {Jing{-}en Luan and Tong Yan Tee and Eric Pek and Chwee Teck Lim and Zhaowei Zhong}, title = {Dynamic responses and solder joint reliability under board level drop test}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {450--460}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.012}, doi = {10.1016/J.MICROREL.2006.05.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LuanTPLZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MaJEDSZ07, author = {Xiaosong Ma and Kaspar M. B. Jansen and Leo J. Ernst and W. D. van Driel and Olaf van der Sluis and G. Q. Zhang}, title = {Characterization of moisture properties of polymers for {IC} packaging}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1685--1689}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.090}, doi = {10.1016/J.MICROREL.2007.07.090}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MaJEDSZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MagnonePCG07, author = {Paolo Magnone and Calogero Pace and Felice Crupi and Gino Giusi}, title = {Low frequency noise in nMOSFETs with subnanometer {EOT} hafnium-based gate dielectrics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2109--2113}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.001}, doi = {10.1016/J.MICROREL.2006.11.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MagnonePCG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MaingotFLPD07, author = {V. Maingot and Jean Baptiste Ferron and R{\'{e}}gis Leveugle and Vincent Pouget and Alexandre Douin}, title = {Configuration errors analysis in SRAM-based FPGAs: Software tool and practical results}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1836--1840}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.074}, doi = {10.1016/J.MICROREL.2007.07.074}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MaingotFLPD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Mao07, author = {Lingfeng Mao}, title = {First-principles study of the effects of oxygen vacancy on hole tunneling current}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1213--1217}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.027}, doi = {10.1016/J.MICROREL.2006.09.027}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Mao07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MarichalWCVK07, author = {Olivier Marichal and Geert Wybo and Benjamin Van Camp and Pieter Vanysacker and Bart Keppens}, title = {SCR-based {ESD} protection in nanometer {SOI} technologies}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1060--1068}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.011}, doi = {10.1016/J.MICROREL.2006.11.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MarichalWCVK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MarrasIMVS07, author = {Alessandro Marras and Maurizio Impronta and Ilaria De Munari and M. G. Valentini and Andrea Scorzoni}, title = {Reliability assessment of multi-via Cu-damascene structures by wafer-level isothermal electromigration tests}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1492--1496}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.002}, doi = {10.1016/J.MICROREL.2007.07.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MarrasIMVS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Martin-MartinezGRNACPG07, author = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and Simone Gerardin and Rosana Rodr{\'{\i}}guez and Montserrat Nafr{\'{\i}}a and Xavier Aymerich and Andrea Cester and Alessandro Paccagnella and G. Ghidini}, title = {Lifetime estimation of analog circuits from the electrical characteristics of stressed MOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1349--1352}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.088}, doi = {10.1016/J.MICROREL.2007.07.088}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/Martin-MartinezGRNACPG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Martin-MartinezRNAS07, author = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and Rosana Rodr{\'{\i}}guez and Montserrat Nafr{\'{\i}}a and Xavier Aymerich and James H. Stathis}, title = {Worn-out oxide {MOSFET} characteristics: Role of gate current and device parameters on a current mirror}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {665--668}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.035}, doi = {10.1016/J.MICROREL.2007.01.035}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Martin-MartinezRNAS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MartyniukAMDF07, author = {Mariusz Martyniuk and J. Antoszewski and C. A. Musca and J. M. Dell and L. Faraone}, title = {Dielectric thin films for MEMS-based optical sensors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {733--738}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.060}, doi = {10.1016/J.MICROREL.2007.01.060}, timestamp = {Mon, 23 Oct 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MartyniukAMDF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Masana07, author = {F. N. Masana}, title = {A straightforward analytical method for extraction of semiconductor device transient thermal parameters}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2122--2128}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.042}, doi = {10.1016/J.MICROREL.2006.09.042}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Masana07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MatinTVG07, author = {M. A. Matin and J. G. A. Theeven and W. P. Vellinga and Marc G. D. Geers}, title = {Correlation between localized strain and damage in shear-loaded Pb-free solders}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1262--1272}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.025}, doi = {10.1016/J.MICROREL.2006.09.025}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MatinTVG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MeneghiniTSMVMZ07, author = {Matteo Meneghini and Lorenzo Trevisanello and C. Sanna and Giovanna Mura and Massimo Vanzi and Gaudenzio Meneghesso and Enrico Zanoni}, title = {High temperature electro-optical degradation of InGaN/GaN HBLEDs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1625--1629}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.081}, doi = {10.1016/J.MICROREL.2007.07.081}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MeneghiniTSMVMZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MercklingDEGRRCMSGRH07, author = {Clement Merckling and G. Delhaye and Mario El Kazzi and S. Gaillard and Yoann Rozier and L. Rapenne and B. Chenevier and O. Marty and G. Saint{-}Girons and M. Gendry and Y. Robach and Guy Hollinger}, title = {Epitaxial growth of LaAlO\({}_{\mbox{3}}\) on Si(0 0 1) using interface engineering}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {540--543}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.036}, doi = {10.1016/J.MICROREL.2007.01.036}, timestamp = {Mon, 29 Apr 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MercklingDEGRRCMSGRH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Mermet-GuyennetPP07, author = {Michel Mermet{-}Guyennet and X. Perpi{\~{n}}{\`{a}} and M. Piton}, title = {Revisiting power cycling test for better life-time prediction in traction}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1690--1695}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.099}, doi = {10.1016/J.MICROREL.2007.07.099}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Mermet-GuyennetPP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MichalasEPKV07, author = {Loukas Michalas and M. A. Exarchos and George J. Papaioannou and Dimitrios N. Kouvatsos and Apostolos T. Voutsas}, title = {An experimental study of the thermally activated processes in polycrystalline silicon thin film transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2058--2064}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.016}, doi = {10.1016/J.MICROREL.2006.11.016}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MichalasEPKV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MilanovicTSD07, author = {Miro Milanovic and Mitja Truntic and Primoz Slibar and Drago Dolinar}, title = {Reconfigurable digital controller for a buck converter based on {FPGA}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {150--154}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.019}, doi = {10.1016/J.MICROREL.2006.09.019}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MilanovicTSD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MilorH07, author = {Linda Milor and Changsoo Hong}, title = {Backend dielectric breakdown dependence on linewidth and pattern density}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1473--1477}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.023}, doi = {10.1016/J.MICROREL.2007.07.023}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MilorH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MitrovicBHBWDL07, author = {Ivona Z. Mitrovic and Octavian Buiu and Steve Hall and C. Bungey and T. Wagner and W. Davey and Y. Lu}, title = {Electrical and structural properties of hafnium silicate thin films}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {645--648}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.065}, doi = {10.1016/J.MICROREL.2007.01.065}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MitrovicBHBWDL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MonforteCCCFN07, author = {Francesca Monforte and Marco Camalleri and Denise Cal{\`{\i}} and Giuseppe Curr{\`{o}} and Enza Fazio and Fortunato Neri}, title = {Nitrogen bonding configurations near the oxynitride/silicon interface after oxynitridation in N\({}_{\mbox{2}}\)O ambient of a thin SiO\({}_{\mbox{2}}\) gate}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {822--824}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.037}, doi = {10.1016/J.MICROREL.2007.01.037}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MonforteCCCFN07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MoonenVLCMB07, author = {R. Moonen and Piet Vanmeerbeek and G. Lekens and Ward De Ceuninck and Peter Moens and J. Boutsen}, title = {Lifetime modeling of intrinsic gate oxide breakdown at high temperature}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1389--1393}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.039}, doi = {10.1016/J.MICROREL.2007.07.039}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MoonenVLCMB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MoraisARR07, author = {Lionel Dantas de Morais and F. Allanic and F. Roqueta and J. P. Rebrasse}, title = {Thermal approach of defects generation on copper/organic dielectric interface due to {SEM} inspections}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1614--1618}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.056}, doi = {10.1016/J.MICROREL.2007.07.056}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MoraisARR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Morris07, author = {James E. Morris}, title = {Isotropic conductive adhesives: Future trends, possibilities and risks}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {328--330}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.015}, doi = {10.1016/J.MICROREL.2006.02.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Morris07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MoschouEKPV07, author = {Despina C. Moschou and M. A. Exarchos and Dimitrios N. Kouvatsos and George J. Papaioannou and Apostolos T. Voutsas}, title = {Performance and reliability of {SLS} {ELA} polysilicon TFTs fabricated with novel crystallization techniques}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1378--1383}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.073}, doi = {10.1016/J.MICROREL.2007.07.073}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MoschouEKPV07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MoyS07, author = {W. H. Moy and Yu{-}Lin Shen}, title = {On the failure path in shear-tested solder joints}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1300--1305}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.08.021}, doi = {10.1016/J.MICROREL.2006.08.021}, timestamp = {Fri, 17 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MoyS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MullerE07, author = {Stefan M{\"{u}}ller and Peter Egger}, title = {Investigation of low temperature {SRAM} and {ROM} failures to enable the replacement of cold test insertion by room temperature test}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1362--1365}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.080}, doi = {10.1016/J.MICROREL.2007.07.080}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MullerE07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NakadairaJSSMCKO07, author = {Yoshikuni Nakadaira and Seyoung Jeong and Jongbo Shim and Jaiseok Seo and Sunhee Min and Taeje Cho and Sayoon Kang and Seyong Oh}, title = {Growth of tin whiskers for lead-free plated leadframe packages in high humid environments and during thermal cycling}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1928--1949}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.03.008}, doi = {10.1016/J.MICROREL.2007.03.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NakadairaJSSMCKO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NeauMVVVBPR07, author = {G. N{\'{e}}au and Fr{\'{e}}d{\'{e}}ric Martinez and M. Valenza and J. C. Vildeuil and E. Vincent and Fr{\'{e}}d{\'{e}}ric Boeuf and F. Payet and K. Rochereau}, title = {Impact of strained-channel n-MOSFETs with a SiGe virtual substrate on dielectric interface quality evaluated by low frequency noise measurements}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {567--572}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.079}, doi = {10.1016/J.MICROREL.2007.01.079}, timestamp = {Tue, 03 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NeauMVVVBPR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NeugroschelBC07, author = {Arnost Neugroschel and Gennadi Bersuker and Rino Choi}, title = {Applications of {DCIV} method to {NBTI} characterization}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1366--1372}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.037}, doi = {10.1016/J.MICROREL.2007.07.037}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/NeugroschelBC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NguyenBMPABP07, author = {T. Nguyen and C. Busseret and Liviu Militaru and A. Poncet and D. Aim{\'{e}} and Nicolas Baboux and Carole Plossu}, title = {Parameters extraction of hafnium based gate oxide capacitors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {729--732}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.061}, doi = {10.1016/J.MICROREL.2007.01.061}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NguyenBMPABP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Nickel07, author = {N. H. Nickel}, title = {Hydrogen transport in doped and undoped polycrystalline silicon}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {899--902}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.014}, doi = {10.1016/J.MICROREL.2006.10.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Nickel07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NoulisSS07, author = {Thomas Noulis and Stylianos Siskos and G{\'{e}}rard Sarrabayrouse}, title = {Comparison between {BSIM4.X} and {HSPICE} flicker noise models in {NMOS} and {PMOS} transistors in all operating regions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1222--1227}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.021}, doi = {10.1016/J.MICROREL.2006.09.021}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/NoulisSS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/OrainBFLJ07, author = {S. Orain and J.{-}C. Barb{\'{e}} and X. Federspiel and P. Legallo and H. Jaouen}, title = {FEM-based method to determine mechanical stress evolution during process flow in microelectronics, application to stress-voiding}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {295--301}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.018}, doi = {10.1016/J.MICROREL.2006.09.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/OrainBFLJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PajonaAD07, author = {O. Pajona and Christelle Aupetit{-}Berthelemot and Jean{-}Michel Dumas}, title = {A study of metamorphic {HEMT} technological improvements: Impact on parasitic effect electrical models}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1643--1648}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.063}, doi = {10.1016/J.MICROREL.2007.07.063}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PajonaAD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PanC07, author = {Min{-}Chun Pan and Po{-}Chun Chen}, title = {Drop simulation/experimental verification and shock resistance improvement of {TFT-LCD} monitors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2249--2259}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.12.003}, doi = {10.1016/J.MICROREL.2006.12.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PanC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PanW07, author = {Cheng{-}Tang Pan and T. T. Wu}, title = {Simulation and fabrication of magnetic rotary microgenerator with multipolar Nd/Fe/B magnet}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2129--2134}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.037}, doi = {10.1016/J.MICROREL.2006.09.037}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PanW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PantelidesTRZFS07, author = {Sokrates T. Pantelides and L. Tsetseris and Sergey N. Rashkeev and X. J. Zhou and Daniel M. Fleetwood and Ronald D. Schrimpf}, title = {Hydrogen in MOSFETs - {A} primary agent of reliability issues}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {903--911}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.011}, doi = {10.1016/J.MICROREL.2006.10.011}, timestamp = {Tue, 26 Mar 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PantelidesTRZFS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PapandreouLSPPP07, author = {E. Papandreou and Mohamed Lamhamdi and C. M. Skoulikidou and Patrick Pons and George J. Papaioannou and Robert Plana}, title = {Structure dependent charging process in {RF} {MEMS} capacitive switches}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1812--1817}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.100}, doi = {10.1016/J.MICROREL.2007.07.100}, timestamp = {Sun, 04 Aug 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/PapandreouLSPPP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ParkXSYSCMJLLKCO07, author = {Jong{-}Hyun Park and Cheng{-}Ji Xian and Nak{-}Jin Seong and Soon{-}Gil Yoon and Seung{-}Hyun Son and Hyung{-}Mi Chung and Jin{-}Suck Moon and Hyun{-}Joo Jin and Seung{-}Eun Lee and Jeong{-}Won Lee and Hyung{-}Dong Kang and Yeoul{-}Kyo Chung and Yong{-}Soo Oh}, title = {Development of embedded capacitor with bismuth-based pyrochlore thin films at low temperatures for printed circuit board applications}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {755--758}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.038}, doi = {10.1016/J.MICROREL.2007.01.038}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ParkXSYSCMJLLKCO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PaskalevaLB07, author = {Albena Paskaleva and Martin Lemberger and Anton J. Bauer}, title = {Polarity asymmetry of stress and charge trapping behavior of thin Hf- and Zr-silicate layers}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2094--2099}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.018}, doi = {10.1016/J.MICROREL.2006.11.018}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PaskalevaLB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PearnHPH07, author = {Wen Lea Pearn and H. N. Hung and N. F. Peng and C. Y. Huang}, title = {Testing process precision for truncated normal distributions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2275--2281}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.12.001}, doi = {10.1016/J.MICROREL.2006.12.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PearnHPH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PengMM07, author = {Weiqun Peng and Eduardo Monlevade and Marco E. Marques}, title = {Effect of thermal aging on the interfacial structure of SnAgCu solder joints on Cu}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2161--2168}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.12.006}, doi = {10.1016/J.MICROREL.2006.12.006}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/PengMM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PerkinsS07, author = {Andy Perkins and Suresh K. Sitaraman}, title = {Universal fatigue life prediction equation for ceramic ball grid array {(CBGA)} packages}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2260--2274}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.12.004}, doi = {10.1016/J.MICROREL.2006.12.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PerkinsS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PerpinaCPMM07, author = {X. Perpi{\~{n}}{\`{a}} and Alberto Castellazzi and M. Piton and Michel Mermet{-}Guyennet and Jos{\'{e}} Mill{\'{a}}n}, title = {Failure-relevant abnormal events in power inverters considering measured {IGBT} module temperature inhomogeneities}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1784--1789}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.071}, doi = {10.1016/J.MICROREL.2007.07.071}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PerpinaCPMM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PerpinaPMJM07, author = {X. Perpi{\~{n}}{\`{a}} and M. Piton and Michel Mermet{-}Guyennet and Xavier Jord{\`{a}} and Jos{\'{e}} Mill{\'{a}}n}, title = {Local thermal cycles determination in thermosyphon-cooled traction {IGBT} modules reproducing mission profiles}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1701--1706}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.072}, doi = {10.1016/J.MICROREL.2007.07.072}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PerpinaPMJM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PetitZ07, author = {Christian Petit and Damien Zander}, title = {Low voltage stress induced leakage current and time to breakdown in ultra-thin (1.2-2.3nm) oxides}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {401--408}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.006}, doi = {10.1016/J.MICROREL.2006.05.006}, timestamp = {Fri, 17 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/PetitZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PetitZ07a, author = {Christian Petit and Damien Zander}, title = {Stress induced gate-drain leakage current in ultra-thin gate oxide}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2070--2081}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.013}, doi = {10.1016/J.MICROREL.2006.10.013}, timestamp = {Fri, 17 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/PetitZ07a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PicGO07, author = {D. Pic and Didier Goguenheim and Jean{-}Luc Ogier}, title = {A comprehensive study of stress induced leakage current using a floating gate structure for direct applications in {EEPROM} memories}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1373--1377}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.040}, doi = {10.1016/J.MICROREL.2007.07.040}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PicGO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PinzelliGBVBG07, author = {L. Pinzelli and M. Gros{-}Jean and Y. Br{\'{e}}chet and F. Volpi and A. Bajolet and J.{-}C. Giraudin}, title = {High-K dielectric deposition in 3D architectures: The case of Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\) deposited with metal-organic precursor {TBTDET}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {700--703}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.066}, doi = {10.1016/J.MICROREL.2007.01.066}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PinzelliGBVBG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PriviteraMCFP07, author = {Stefania Privitera and R. Modica and V. Cerantonio and Giorgio Fallica and G. Pappalardo}, title = {{LOCOS} induced stress effects on {SOI} bipolar devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {802--805}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.039}, doi = {10.1016/J.MICROREL.2007.01.039}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PriviteraMCFP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Puchner07, author = {Helmut Puchner}, title = {{NBTI} product level reliability for a low-power {SRAM} technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {873--879}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.015}, doi = {10.1016/J.MICROREL.2006.10.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Puchner07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PugatschowHB07, author = {A. Pugatschow and Ralf Heiderhoff and L. J. Balk}, title = {Time resolved determination of electrical field distributions within dynamically biased power devices by spectral {EBIC} investigations}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1529--1533}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.003}, doi = {10.1016/J.MICROREL.2007.07.003}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PugatschowHB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PuzzilliGIRH07, author = {Giuseppina Puzzilli and Bogdan Govoreanu and Fernanda Irrera and Maarten Rosmeulen and Jan Van Houdt}, title = {Characterization of charge trapping in SiO\({}_{\mbox{2}}\)/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) dielectric stacks by pulsed {C-V} technique}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {508--512}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.040}, doi = {10.1016/J.MICROREL.2007.01.040}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PuzzilliGIRH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/QuCQLW07, author = {Xin Qu and Zhaoyi Chen and Bo Qi and Taekoo Lee and Jiaji Wang}, title = {Board level drop test and simulation of leaded and lead-free {BGA-PCB} assembly}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2197--2204}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.017}, doi = {10.1016/J.MICROREL.2006.10.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/QuCQLW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RamsaySTWWTR07, author = {Euan Ramsay and K. A. Serrels and M. J. Thomson and Andrew J. Waddie and Richard J. Warburton and Mohammed R. Taghizadeh and Derryck Telford Reid}, title = {Three-dimensional nanometric sub-surface imaging of a silicon flip-chip using the two-photon optical beam induced current method}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1534--1538}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.069}, doi = {10.1016/J.MICROREL.2007.07.069}, timestamp = {Fri, 15 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RamsaySTWWTR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RaskinSBR07, author = {Yosef Raskin and Asaad Salameh and David Betel and Yakov Roizin}, title = {Reliability of {HTO} based high-voltage gate stacks for flash memories}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {615--618}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.041}, doi = {10.1016/J.MICROREL.2007.01.041}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RaskinSBR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RegoliniBM07, author = {Jorge Luis Regolini and Daniel Benoit and Pierre Morin}, title = {Passivation issues in active pixel {CMOS} image sensors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {739--742}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.067}, doi = {10.1016/J.MICROREL.2007.01.067}, timestamp = {Thu, 29 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RegoliniBM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ReimboldMGLGM07, author = {Gilles Reimbold and J{\'{e}}r{\^{o}}me Mitard and Xavier Garros and Charles Leroux and G{\'{e}}rard Ghibaudo and Fran{\c{c}}ois Martin}, title = {Initial and PBTI-induced traps and charges in Hf-based oxides/TiN stacks}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {489--496}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.068}, doi = {10.1016/J.MICROREL.2007.01.068}, timestamp = {Tue, 09 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ReimboldMGLGM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Reissner07, author = {M. Reissner}, title = {Fault localization at high voltage devices using thermally induced voltage alteration {(TIVA)}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1561--1564}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.016}, doi = {10.1016/J.MICROREL.2007.07.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Reissner07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ReyndersM07, author = {K. Reynders and Peter Moens}, title = {Integration of an {SCR} in an active clamp}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1054--1059}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.005}, doi = {10.1016/J.MICROREL.2006.11.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ReyndersM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RocakMSHBD07, author = {Dubravka Rocak and S. Macek and J. Sitek and Marko Hrovat and K. Bukat and Z. Drozd}, title = {A reliability study of the lead-free solder connections of miniature chip components on hybrid circuits}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {986--995}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.007}, doi = {10.1016/J.MICROREL.2006.06.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RocakMSHBD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoelligDWBWWM07, author = {Mike Roellig and Rainer Dudek and Steffen Wiese and Bjoern Boehme and Bernhard Wunderle and Klaus{-}J{\"{u}}rgen Wolter and Bernd Michel}, title = {Fatigue analysis of miniaturized lead-free solder contacts based on a novel test concept}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {187--195}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.013}, doi = {10.1016/J.MICROREL.2006.09.013}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoelligDWBWWM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoeschB07, author = {William J. Roesch and Steve Brockett}, title = {Field returns, a source of natural failure mechanisms}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1156--1165}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.004}, doi = {10.1016/J.MICROREL.2007.02.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RoeschB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RommelBR07, author = {Mathias Rommel and Anton J. Bauer and Heiner Ryssel}, title = {Quantitative oxide charge determination by photocurrent analysis}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {673--677}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.069}, doi = {10.1016/J.MICROREL.2007.01.069}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RommelBR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RooneyGXCS07, author = {Daniel T. Rooney and Louis Gullo and Dongji Xie and N. Todd Castello and Dongkai Shanguan}, title = {Evaluation of reliability and metallurgical integrity of wire bonds and lead free solder joints on flexible printed circuit board sample modules}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2152--2160}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.015}, doi = {10.1016/J.MICROREL.2006.01.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RooneyGXCS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RosaR07, author = {Giuseppe La Rosa and Stewart E. Rauch III}, title = {Channel hot carrier effects in n-MOSFET devices of advanced submicron {CMOS} technologies}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {552--558}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.031}, doi = {10.1016/J.MICROREL.2007.01.031}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RosaR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RothschildMKSEDCRVVVLBDJNAB07, author = {A. Rothschild and R. Mitsuhashi and Christoph Kerner and X. Shi and J. L. Everaert and L. Date and Thierry Conard and Olivier Richard and C. Vrancken and R. Verbeeck and Anabela Veloso and A. Lauwers and Muriel de Potter de ten Broeck and I. Debusschere and M. Jurczak and M. Niwa and Philippe Absil and S. Biesemans}, title = {Optimization of HfSiON using a design of experiment {(DOE)} approach on 0.45 {V} V\({}_{\mbox{t}}\) Ni-FUSI {CMOS} transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {521--524}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.042}, doi = {10.1016/J.MICROREL.2007.01.042}, timestamp = {Wed, 13 Mar 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RothschildMKSEDCRVVVLBDJNAB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RouetMDF07, author = {Vincent Rouet and Fr{\'{e}}d{\'{e}}ric Minault and Guillaume Diancourt and Bruno Foucher}, title = {Concept of smart integrated life consumption monitoring system for electronics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1921--1927}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.019}, doi = {10.1016/J.MICROREL.2007.02.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RouetMDF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RouxLFOLLM07, author = {Claire Le Roux and Laurent Lopez and Abdellatif Firiti and Jean{-}Luc Ogier and Fr{\'{e}}d{\'{e}}ric Lalande and Romain Laffont and Gilles Micolau}, title = {A new method to quantify retention-failed cells of an {EEPROM} {CAST}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1609--1613}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.083}, doi = {10.1016/J.MICROREL.2007.07.083}, timestamp = {Fri, 21 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RouxLFOLLM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoyTOHH07, author = {Arijit Roy and Cher Ming Tan and Sean J. O'Shea and Kedar Hippalgaonkar and Wulf Hofbauer}, title = {Room temperature observation of point defect on gold surface using thermovoltage mapping}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1580--1584}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.010}, doi = {10.1016/J.MICROREL.2007.07.010}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoyTOHH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RuanNBBCLP07, author = {Jinyu Jason Ruan and Nicolas Nolhier and Marise Bafleur and Laurent Bary and Fabio Coccetti and T. Lisec and Robert Plana}, title = {Electrostatic discharge failure analysis of capacitive {RF} {MEMS} switches}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1818--1822}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.070}, doi = {10.1016/J.MICROREL.2007.07.070}, timestamp = {Sun, 04 Aug 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RuanNBBCLP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RushworthDKLO07, author = {Simon A. Rushworth and Hywel Davies and Andrew J. Kingsley and Thomas Leese and Rajesh Odedra}, title = {Volatility and vapourisation characterisation of new precursors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {718--721}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.070}, doi = {10.1016/J.MICROREL.2007.01.070}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RushworthDKLO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SacconiJPC07, author = {F. Sacconi and J. M. Jancu and M. Povolotskyi and Aldo Di Carlo}, title = {Full-band tunneling in high-kappa dielectric {MOS} structures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {694--696}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.043}, doi = {10.1016/J.MICROREL.2007.01.043}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SacconiJPC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SalmHKHWS07, author = {Cora Salm and Eric Hoekstra and Jay S. Kolhatkar and Andr{\'{e}} J. Hof and Hans Wallinga and Jurriaan Schmitz}, title = {Low-frequency noise in hot-carrier degraded nMOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {577--580}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.044}, doi = {10.1016/J.MICROREL.2007.01.044}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SalmHKHWS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SandbornP07, author = {Peter Sandborn and Michael G. Pecht}, title = {Introduction to special section on electronic systems prognostics and health management}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1847--1848}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.03.004}, doi = {10.1016/J.MICROREL.2007.03.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SandbornP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SandbornW07, author = {Peter A. Sandborn and Chris Wilkinson}, title = {A maintenance planning and business case development model for the application of prognostics and health management {(PHM)} to electronic systems}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1889--1901}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.016}, doi = {10.1016/J.MICROREL.2007.02.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SandbornW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SanzCC07, author = {Maria Teresa Sanz and Santiago Celma and Bel{\'{e}}n Calvo}, title = {Low-distortion 4th order programmable Butterworth filter}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {471--476}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.008}, doi = {10.1016/J.MICROREL.2006.05.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SanzCC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SarkarMS07, author = {Partha Sarkar and Abhijit Mallik and Chandan Kumar Sarkar}, title = {Performance comparison of channel engineered deep sub-micrometer pseudo {SOI} n-MOSFETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {953--958}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.011}, doi = {10.1016/J.MICROREL.2006.06.011}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SarkarMS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ScanffFGSGF07, author = {E. Scanff and K. L. Feldman and S. Ghelam and Peter Sandborn and M. Glade and B. Foucher}, title = {Life cycle cost impact of using prognostic health management {(PHM)} for helicopter avionics}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1857--1864}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.014}, doi = {10.1016/J.MICROREL.2007.02.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ScanffFGSGF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchlangenKBMJL07, author = {Rudolf Schlangen and Uwe Kerst and Christian Boit and Tahir Malik and Rajesh Jain and Ted R. Lundquist}, title = {Non destructive 3D chip inspection with nano scale potential by use of backside {FIB} and backscattered electron microscopy}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1523--1528}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.082}, doi = {10.1016/J.MICROREL.2007.07.082}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchlangenKBMJL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchoenfelderELBB07, author = {Stephan Schoenfelder and Matthias Ebert and Christof Landesberger and Karlheinz Bock and J{\"{o}}rg Bagdahn}, title = {Investigations of the influence of dicing techniques on the strength properties of thin silicon}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {168--178}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.002}, doi = {10.1016/J.MICROREL.2006.09.002}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchoenfelderELBB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Schroder07, author = {Dieter K. Schroder}, title = {Negative bias temperature instability: What do we understand?}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {841--852}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.006}, doi = {10.1016/J.MICROREL.2006.10.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Schroder07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchwierzS07, author = {F. Schwierz and C. Schippel}, title = {Performance trends of Si-based {RF} transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {384--390}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.015}, doi = {10.1016/J.MICROREL.2006.05.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchwierzS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SebastianiPMG07, author = {A. Sebastiani and R. Piagge and Alberto Modelli and G. Ghidini}, title = {High-K dielectrics for inter-poly application in non volatile memories}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {598--601}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.045}, doi = {10.1016/J.MICROREL.2007.01.045}, timestamp = {Thu, 05 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SebastianiPMG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShaimeevGKWLK07, author = {Sergey Shaimeev and Vladimir Gritsenko and Kaupo Kukli and Hei Wong and Eun{-}Hong Lee and Chungwoo Kim}, title = {Single band electronic conduction in hafnium oxide prepared by atomic layer deposition}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {36--40}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.002}, doi = {10.1016/J.MICROREL.2006.03.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ShaimeevGKWLK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShickovaKVAHMGK07, author = {A. Shickova and Ben Kaczer and Anabela Veloso and Marc Aoulaiche and M. Houssa and Herman E. Maes and Guido Groeseneken and J. A. Kittl}, title = {{NBTI} reliability of Ni FUSI/HfSiON gates: Effect of silicide phase}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {505--507}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.046}, doi = {10.1016/J.MICROREL.2007.01.046}, timestamp = {Tue, 31 Oct 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ShickovaKVAHMGK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShinwariDL07, author = {M. Waleed Shinwari and M. Jamal Deen and Dolf Landheer}, title = {Study of the electrolyte-insulator-semiconductor field-effect transistor {(EISFET)} with applications in biosensor design}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2025--2057}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.003}, doi = {10.1016/J.MICROREL.2006.10.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ShinwariDL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SluisESDG07, author = {Olaf van der Sluis and R. A. B. Engelen and Richard B. R. van Silfhout and W. D. van Driel and Marcel A. J. van Gils}, title = {Efficient damage sensitivity analysis of advanced Cu/low-k bond pad structures by means of the area release energy criterion}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1975--1982}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.004}, doi = {10.1016/J.MICROREL.2007.04.004}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SluisESDG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SmedesBR07, author = {Theo Smedes and J. de Boet and T. R{\"{o}}dle}, title = {Selecting an appropriate {ESD} protection for discrete {RF} power LDMOSTs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1000--1007}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.012}, doi = {10.1016/J.MICROREL.2006.11.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SmedesBR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SoestbergenEJD07, author = {M. van Soestbergen and Leo J. Ernst and Kaspar M. B. Jansen and W. D. van Driel}, title = {Measuring the through-plane elastic modulus of thin polymer films in situ}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1983--1988}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.006}, doi = {10.1016/J.MICROREL.2007.04.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SoestbergenEJD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SoldnerSHTGSCID07, author = {Wolfgang Soldner and Martin Streibl and U. Hodel and Marc Tiebout and Harald Gossner and Doris Schmitt{-}Landsiedel and Jung{-}Hoon Chun and Choshu Ito and Robert W. Dutton}, title = {{RF} {ESD} protection strategies: Codesign vs. low-C protection}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1008--1015}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.007}, doi = {10.1016/J.MICROREL.2006.11.007}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SoldnerSHTGSCID07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SolomalalaSMCCCF07, author = {Pierre Solomalala and J. Saiz and Michel Mermet{-}Guyennet and Alberto Castellazzi and Mauro Ciappa and X. Chauffleur and Jean{-}Pierre Fradin}, title = {Virtual reliability assessment of integrated power switches based on multi-domain simulation approach}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1343--1348}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.006}, doi = {10.1016/J.MICROREL.2007.07.006}, timestamp = {Mon, 12 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SolomalalaSMCCCF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SozziM07, author = {Giovanna Sozzi and Roberto Menozzi}, title = {A review of the use of electro-thermal simulations for the analysis of heterostructure FETs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {65--73}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.014}, doi = {10.1016/J.MICROREL.2006.03.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SozziM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SpraulNMWM07, author = {M. Spraul and Wolfgang N{\"{u}}chter and A. M{\"{o}}ller and Bernhard Wunderle and Bernd Michel}, title = {Reliability of SnPb and Pb-free flip-chips under different test conditions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {252--258}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.026}, doi = {10.1016/J.MICROREL.2006.09.026}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SpraulNMWM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SrinivasanCSMPMC07, author = {Paolo Srinivasan and Felice Crupi and Eddy Simoen and Paolo Magnone and Calogero Pace and Durga Misra and Cor Claeys}, title = {Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {501--504}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.012}, doi = {10.1016/J.MICROREL.2007.01.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SrinivasanCSMPMC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stadler07, author = {Wolfgang Stadler}, title = {Guest editorial}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {999}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.002}, doi = {10.1016/J.MICROREL.2006.11.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stadler07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/StanimirovicJS07, author = {Ivanka P. Stanimirovic and Milan Jevtic and Zdravko I. Stanimirovic}, title = {Multiple high-voltage pulse stressing of conventional thick-film resistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2242--2248}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.017}, doi = {10.1016/J.MICROREL.2006.11.017}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/StanimirovicJS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SteenbergeLWVS07, author = {Nele Van Steenberge and Paresh Limaye and Geert Willems and Bart Vandevelde and Inge Schildermans}, title = {Analytical and finite element models of the thermal behavior for lead-free soldering processes in electronic assembly}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {215--222}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.010}, doi = {10.1016/J.MICROREL.2006.09.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SteenbergeLWVS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SteimleMRSSYHSGVPMACW07, author = {R. F. Steimle and R. Muralidhar and R. Rao and M. Sadd and C. T. Swift and Jane Yater and B. Hradsky and S. Straub and H. Gasquet and L. Vishnubhotla and E. J. Prinz and T. Merchant and B. Acred and K. Chang and B. E. White Jr.}, title = {Silicon nanocrystal non-volatile memory for embedded memory scaling}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {585--592}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.047}, doi = {10.1016/J.MICROREL.2007.01.047}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SteimleMRSSYHSGVPMACW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07, author = {Mile K. Stojcev}, title = {Mohamed Ilyas, Imad Mahgoud, Handbook of Sensor Networks: Compact Wireless and Wired Sensing Systems, Hardcover, pp 864, {CRC} Press, 2005, {ISBN} 0-8493-1968-4}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {996--997}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.006}, doi = {10.1016/J.MICROREL.2006.03.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07a, author = {Mile K. Stojcev}, title = {Richard Zurawski, ed., The Industrial Information Technology Handbook, Hardcover, {CRC} Press, 2005, pp 1936, {ISBN} 0-8493-1985-4}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1153--1154}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.007}, doi = {10.1016/J.MICROREL.2006.03.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07b, author = {Mile K. Stojcev}, title = {S. Sitharama Iyengar, Richards R. Brooks, Eds., Distributed Sensor Networks, Hardcover, pp 1123, Chapman {\&} Hall/CRC Press, 2005, {ISBN} 1-58488-383-9}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1306--1307}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.008}, doi = {10.1016/J.MICROREL.2006.03.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07b.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07c, author = {Mile K. Stojcev}, title = {Richard Zurawski, editor. Embedded Systems Handbook, Hardcover, pp 1112, {CRC} Press, Taylor {\&} Francis Group, 2006, {ISBN} 0-8493-2824-1}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1308--1309}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.04.006}, doi = {10.1016/J.MICROREL.2006.04.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07c.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07d, author = {Mile K. Stojcev}, title = {Taxonomies for the Development and Verification of Digital Systems, Brian Bailey, Grant Martin, Thomas Anderson (Editors). Springer, New York {(2005).} 179pp., Hardcover, {ISBN:} 0-387-24019-5}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2282--2283}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.017}, doi = {10.1016/J.MICROREL.2006.09.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07e, author = {Mile K. Stojcev}, title = {William {C.Y.} Lee, Wireless {\&} Cellular Telecommunications (third ed.), McGraw Hill, New York {(2006)} {ISBN} 0-07-143686-3 Hardcover, 822 pp., plus {XXIII}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2284--2286}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.041}, doi = {10.1016/J.MICROREL.2006.09.041}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07e.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07f, author = {Mile K. Stojcev}, title = {Louis Scheffer, Luciano Lavagno and Grant Martin, Editors, Electronic Design Automation for Integrated Circuits Handbook Vols. {I} and II, CRC, imprint of Taylor and Francis Group, Boca Raton {(2006)} {ISBN} 0-8493-3096-3 Hardcover, 1095 pp., plus {XLVIII}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2287--2288}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.007}, doi = {10.1016/J.MICROREL.2006.10.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07f.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07g, author = {Mile K. Stojcev}, title = {Fast, Efficient and Predictable Memory Access: Optimization Algorithms for Memory Architecture Aware Compilation, Lars Wehmeyer, Peter Marwedel. Springer, Dordercht, The Netherlands {(2006).} 257pp., Hardcover, plus XI, {ISBN:} 1-4020-4821-1}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2289--2290}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.082}, doi = {10.1016/J.MICROREL.2007.01.082}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07g.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev07h, author = {Mile K. Stojcev}, title = {Arithmetic and Logic in Computer Systems, Mi Lu. John Wiley {\&} Sons, Inc., Hoboken, {NJ} (2004), {ISBN:} 0-471-46945-9}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {157--158}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.004}, doi = {10.1016/J.MICROREL.2006.03.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev07h.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/StoyanovKBD07, author = {Stoyan Stoyanov and Robert W. Kay and Chris Bailey and Marc P. Y. Desmulliez}, title = {Computational modelling for reliable flip-chip packaging at sub-100mum pitch using isotropic conductive adhesives}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {132--141}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.004}, doi = {10.1016/J.MICROREL.2006.01.004}, timestamp = {Wed, 07 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/StoyanovKBD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SuSL07, author = {Yu{-}Di Su and Wen{-}Chieh Shih and Joseph Ya{-}min Lee}, title = {The characterization of retention properties of metal-ferroelectric (PbZr\({}_{\mbox{0.53}}\)Ti\({}_{\mbox{0.47}}\)O\({}_{\mbox{3}}\))-insulator (Dy\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\), Y\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\))-semiconductor devices}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {619--622}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.048}, doi = {10.1016/J.MICROREL.2007.01.048}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SuSL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SverdlovKS07, author = {Viktor Sverdlov and Hans Kosina and Siegfried Selberherr}, title = {Modeling current transport in ultra-scaled field-effect transistors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {11--19}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.009}, doi = {10.1016/J.MICROREL.2006.03.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SverdlovKS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TaechakumputTBPCJ07, author = {P. Taechakumput and S. Taylor and Octavian Buiu and R. J. Potter and Paul R. Chalker and A. C. Jones}, title = {Optical and electrical characterization of hafnium oxide deposited by liquid injection atomic layer deposition}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {825--829}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.049}, doi = {10.1016/J.MICROREL.2007.01.049}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TaechakumputTBPCJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TakeshitaIYS07, author = {Tatsuya Takeshita and Ryuzo Iga and Mitsuo Yamamoto and Mitsuru Sugo}, title = {Analysis of interior degradation of a laser waveguide using an {OBIC} monitor}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2135--2140}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.001}, doi = {10.1016/J.MICROREL.2007.01.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TakeshitaIYS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TamuraO07, author = {Susumu Tamura and Yasuhisa Omura}, title = {Ferroelectric characteristic of group {IV} elements added SrBi\({}_{\mbox{2}}\)Ta\({}_{\mbox{2}}\)O\({}_{\mbox{9}}\) thin films}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {830--833}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.050}, doi = {10.1016/J.MICROREL.2007.01.050}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TamuraO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanR07, author = {Cher Ming Tan and Nagarajan Raghavan}, title = {An approach to statistical analysis of gate oxide breakdown mechanisms}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1336--1342}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.011}, doi = {10.1016/J.MICROREL.2007.07.011}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanYC07, author = {Cher Ming Tan and Stanny Yanuar and Tai Chong Chai}, title = {Finite element modeling of capacitive coupling voltage contrast}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1555--1560}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.060}, doi = {10.1016/J.MICROREL.2007.07.060}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanYC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanakaTTSO07, author = {Koutarou Tanaka and Hiroaki Tanaka and Akinobu Teramoto and Shigetoshi Sugawa and Tadahiro Ohmi}, title = {High quality gate insulator film formation on SiC using by microwave-excited high-density plasma}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {786--789}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.076}, doi = {10.1016/J.MICROREL.2007.01.076}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanakaTTSO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TangYLW07, author = {Z. Tang and P. D. Ye and D. Lee and Chu{-}Ryang Wie}, title = {Electrical measurements of voltage stressed Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/GaAs {MOSFET}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2082--2087}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.012}, doi = {10.1016/J.MICROREL.2007.02.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TangYLW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TannerPCWWBW07, author = {D. M. Tanner and T. B. Parson and A. D. Corwin and Jeremy A. Walraven and J. W. Wittwer and B. L. Boyce and S. R. Winzer}, title = {Science-based {MEMS} reliability methodology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1806--1811}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.061}, doi = {10.1016/J.MICROREL.2007.07.061}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TannerPCWWBW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TaoOCN07, author = {Guoqiao Tao and Cedric Ouvrard and Helene Chauveau and Som Nath}, title = {Experimental study of carrier transport in multi-layered structures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {610--614}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.051}, doi = {10.1016/J.MICROREL.2007.01.051}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TaoOCN07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TardyEDGTBCBZ07, author = {Jacques Tardy and Mohsen Erouel and A. L. Deman and A. Gagnaire and V. Teodorescu and M. G. Blanchin and B. Canut and A. Barau and M. Zaharescu}, title = {Organic thin film transistors with HfO\({}_{\mbox{2}}\) high-k gate dielectric grown by anodic oxidation or deposited by sol-gel}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {372--377}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.012}, doi = {10.1016/J.MICROREL.2006.01.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TardyEDGTBCBZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TazzoliMCBCZM07, author = {Augusto Tazzoli and Fabio Alessio Marino and Martina Cordoni and A. Benvenuti and Paolo Colombo and Enrico Zanoni and Gaudenzio Meneghesso}, title = {Holding voltage investigation of advanced SCR-based protection structures for {CMOS} technology}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1444--1449}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.078}, doi = {10.1016/J.MICROREL.2007.07.078}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TazzoliMCBCZM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TengH07, author = {Shiang{-}Yu Teng and Sheng{-}Jye Hwang}, title = {Predicting the process induced warpage of electronic packages using the {P-V-T-C} equation and the Taguchi method}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2231--2241}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.084}, doi = {10.1016/J.MICROREL.2007.01.084}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TengH07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Tosic07, author = {Milorad Tosic}, title = {{S.V.} Nagaraj, Web Caching and its Applications, Kluwer Academic Publishers, Boston/Dordrecht/London, (The Kluwer International Series in Engineering and Computer Science, Vol 772), Hardcover (May 1, 2004), {\textdollar}105.00, pp 236, {ISBN} 1-4020-8049-2}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {155--156}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.03.005}, doi = {10.1016/J.MICROREL.2006.03.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Tosic07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TremouillesTRNVG07, author = {David Tr{\'{e}}mouilles and Steven Thijs and Philippe Roussel and M. I. Natarajan and Vesselin K. Vassilev and Guido Groeseneken}, title = {Transient voltage overshoot in {TLP} testing - Real or artifact?}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1016--1024}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.11.004}, doi = {10.1016/J.MICROREL.2006.11.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TremouillesTRNVG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Tsai07, author = {Han{-}Chang Tsai}, title = {An investigation on the influence of electromagnetic interference induced in conducting wire of universal LEDs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {6}, pages = {959--966}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.005}, doi = {10.1016/J.MICROREL.2006.06.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Tsai07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TsaiYLC07, author = {Tsung{-}Yueh Tsai and Chang{-}Lin Yeh and Yi{-}Shao Lai and Rong{-}Sheng Chen}, title = {Response spectra analysis for undamped structural systems subjected to half-sine impact acceleration pulses}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1239--1245}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.096}, doi = {10.1016/J.MICROREL.2006.07.096}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TsaiYLC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TurchanikovNLOWSK07, author = {V. I. Turchanikov and A. N. Nazarov and V. S. Lysenko and V. Ostahov and O. Winkler and B. Spangenberg and H. Kurz}, title = {Charge accumulation in the dielectric of the nanocluster {NVM} {MOS} structures under anti- and unipolar {W/E} window formation}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {626--630}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.075}, doi = {10.1016/J.MICROREL.2007.01.075}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TurchanikovNLOWSK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TyagulskyyOLNHBLPC07, author = {I. P. Tyagulskyy and I. N. Osiyuk and V. S. Lysenko and A. N. Nazarov and Steve Hall and Octavian Buiu and Y. Lu and Richard Potter and Paul R. Chalker}, title = {Charge trapping characterization of {MOCVD} HfO\({}_{\mbox{2}}\)/p-Si interfaces at cryogenic temperatures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {726--728}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.074}, doi = {10.1016/J.MICROREL.2007.01.074}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TyagulskyyOLNHBLPC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Urresti-IbanezCPRMC07, author = {Jes{\'{u}}s Urresti{-}Iba{\~{n}}ez and Alberto Castellazzi and M. Piton and Jos{\'{e}} Rebollo and Michel Mermet{-}Guyennet and Mauro Ciappa}, title = {Robustness test and failure analysis of {IGBT} modules during turn-off}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1725--1729}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.097}, doi = {10.1016/J.MICROREL.2007.07.097}, timestamp = {Wed, 31 Mar 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/Urresti-IbanezCPRMC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VamvakasTGKP07, author = {V. Em. Vamvakas and M. Theodoropoulou and Stavroula N. Georga and Christoforos A. Krontiras and M. N. Pisanias}, title = {Correlation between infrared transmission spectra and the interface trap density of SiO\({}_{\mbox{2}}\) films}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {834--837}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.072}, doi = {10.1016/J.MICROREL.2007.01.072}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VamvakasTGKP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VamvakasVG07, author = {Vassilis Emm. Vamvakas and Nikolaos Vourdas and S. Gardelis}, title = {Optical characterization of Si-rich silicon nitride films prepared by low pressure chemical vapor deposition}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {794--797}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.073}, doi = {10.1016/J.MICROREL.2007.01.073}, timestamp = {Tue, 01 Jun 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/VamvakasVG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VandeveldeGLRB07, author = {Bart Vandevelde and Mario Gonzalez and Paresh Limaye and Petar Ratchev and Eric Beyne}, title = {Thermal cycling reliability of SnAgCu and SnPb solder joints: {A} comparison for several IC-packages}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {259--265}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.034}, doi = {10.1016/J.MICROREL.2006.09.034}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/VandeveldeGLRB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VargheseD07, author = {Joe Varghese and Abhijit Dasgupta}, title = {Test methodology for durability estimation of surface mount interconnects under drop testing conditions}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {93--103}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.02.002}, doi = {10.1016/J.MICROREL.2006.02.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VargheseD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VargheseD07a, author = {Joe Varghese and Abhijit Dasgupta}, title = {An experimental approach to characterize rate-dependent failure envelopes and failure site transitions in surface mount assemblies}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1095--1102}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.002}, doi = {10.1016/J.MICROREL.2006.07.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VargheseD07a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VellvehiJGFM07, author = {Miquel Vellveh{\'{\i}} and Xavier Jord{\`{a}} and Philippe Godignon and Carles Ferrer and Jos{\'{e}} Mill{\'{a}}n}, title = {Coupled electro-thermal simulation of a {DC/DC} converter}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2114--2121}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.10.009}, doi = {10.1016/J.MICROREL.2006.10.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VellvehiJGFM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VermeerschM07, author = {Bjorn Vermeersch and Gilbert De Mey}, title = {Influence of substrate thickness on thermal impedance of microelectronic structures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {437--443}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.017}, doi = {10.1016/J.MICROREL.2006.05.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VermeerschM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VermeerschM07a, author = {Bjorn Vermeersch and Gilbert De Mey}, title = {Influence of thermal contact resistance on thermal impedance of microelectronic structures}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1233--1238}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.020}, doi = {10.1016/J.MICROREL.2006.09.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VermeerschM07a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VriesJD07, author = {J. W. C. de Vries and M. Y. Jansen and W. D. van Driel}, title = {On the difference between thermal cycling and thermal shock testing for board level reliability of soldered interconnections}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {444--449}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.009}, doi = {10.1016/J.MICROREL.2006.05.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VriesJD07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Wang07, author = {Jinlin Wang}, title = {The effects of rheological and wetting properties on underfill filler settling and flow voids in flip chip packages}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1958--1966}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.016}, doi = {10.1016/J.MICROREL.2007.04.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Wang07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WangZT07, author = {Zhichun Wang and P. Zeelen and H. Tigelaar}, title = {Importance of multi-temp testing in automotive qualification and zero defects program}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1358--1361}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.026}, doi = {10.1016/J.MICROREL.2007.07.026}, timestamp = {Mon, 29 Mar 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/WangZT07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WatanabeTKSO07, author = {Kazufumi Watanabe and Akinobu Teramoto and Rihito Kuroda and Shigetoshi Sugawa and Tadahiro Ohmi}, title = {Examination of degradation mechanism due to negative bias temperature stress from a perspective of hole energy for accurate lifetime prediction}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {409--418}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.06.001}, doi = {10.1016/J.MICROREL.2006.06.001}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WatanabeTKSO07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Weide-ZaageDDF07, author = {Kirsten Weide{-}Zaage and David Dalleau and Yves Danto and H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont}, title = {Dynamic void formation in a DD-copper-structure with different metallization geometry}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {319--325}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.012}, doi = {10.1016/J.MICROREL.2006.09.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Weide-ZaageDDF07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WelBBHW07, author = {P. J. van der Wel and J. R. de Beer and R. J. M. van Boxtel and Y. Y. Hsieh and Y. C. Wang}, title = {Effect of oval defects in GaAs on the reliability of SiN\({}_{\mbox{x}}\) metal-insulator-metal capacitors}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1188--1193}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.089}, doi = {10.1016/J.MICROREL.2007.01.089}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WelBBHW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Whitman07, author = {Charles S. Whitman}, title = {Defining the safe operating area for HBTs with an InGaP emitter across temperature and current density}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1166--1174}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.02.005}, doi = {10.1016/J.MICROREL.2007.02.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Whitman07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WieseW07, author = {Steffen Wiese and Klaus{-}J{\"{u}}rgen Wolter}, title = {Creep of thermally aged SnAgCu-solder joints}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {223--232}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.006}, doi = {10.1016/J.MICROREL.2006.09.006}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/WieseW07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongFWC07, author = {Hei Wong and Valeriu Filip and C. K. Wong and P. S. Chung}, title = {Silicon integrated photonics begins to revolutionize}, journal = {Microelectron. Reliab.}, volume = {47}, number = {1}, pages = {1--10}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.01.002}, doi = {10.1016/J.MICROREL.2006.01.002}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongFWC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WuLCL07, author = {You{-}Lin Wu and Shi{-}Tin Lin and Tsung{-}Min Chang and Juin J. Liou}, title = {Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {419--421}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.014}, doi = {10.1016/J.MICROREL.2006.05.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WuLCL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Wymyslowski07, author = {Artur Wymyslowski}, title = {Thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1967--1968}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.001}, doi = {10.1016/J.MICROREL.2007.04.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Wymyslowski07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WymyslowskiDPTZ07, author = {Artur Wymyslowski and W. D. van Driel and J. van de Peer and N. Tzannetakis and G. Q. Zhang}, title = {Advanced numerical prototyping methods in modern engineering applications - Optimisation for micro-electronic package reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {280--289}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.007}, doi = {10.1016/J.MICROREL.2006.09.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WymyslowskiDPTZ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WymyslowskiVA07, author = {Artur Wymyslowski and Bart Vandevelde and Dag Andersson}, title = {Thermal, mechanical and multi-physics simulation and experiments in micro-electronics and micro-systems}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {159--160}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.029}, doi = {10.1016/J.MICROREL.2006.09.029}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WymyslowskiVA07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YamadaTYNASOI07, author = {Yasushi Yamada and Yoshikazu Takaku and Yuji Yagi and Ikuo Nakagawa and Takashi Atsumi and Mikio Shirai and Ikuo Ohnuma and Kiyohito Ishida}, title = {Reliability of wire-bonding and solder joint for high temperature operation of power semiconductor device}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2147--2151}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.102}, doi = {10.1016/J.MICROREL.2007.07.102}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YamadaTYNASOI07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YamanakaTS07, author = {Kimihiro Yamanaka and Yutaka Tsukada and Katsuaki Suganuma}, title = {Studies on solder bump electromigration in Cu/Sn-3Ag-0.5Cu/Cu system}, journal = {Microelectron. Reliab.}, volume = {47}, number = {8}, pages = {1280--1287}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.028}, doi = {10.1016/J.MICROREL.2006.09.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YamanakaTS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangJEZBJ07, author = {Dao{-}Guo Yang and Kaspar M. B. Jansen and Leo J. Ernst and G. Q. Zhang and H. J. L. Bressers and J. H. J. Janssen}, title = {Effect of filler concentration of rubbery shear and bulk modulus of molding compounds}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {233--239}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.031}, doi = {10.1016/J.MICROREL.2006.09.031}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangJEZBJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangJEZDBJ07, author = {Dao{-}Guo Yang and Kaspar M. B. Jansen and Leo J. Ernst and G. Q. Zhang and W. D. van Driel and H. J. L. Bressers and J. H. J. Janssen}, title = {Numerical modeling of warpage induced in {QFN} array molding process}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {310--318}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.036}, doi = {10.1016/J.MICROREL.2006.09.036}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangJEZDBJ07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YehLCC07, author = {Chang{-}Lin Yeh and Yi{-}Shao Lai and Hsiao{-}Chuan Chang and Tsan{-}Hsien Chen}, title = {Empirical correlation between package-level ball impact test and board-level drop reliability}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1127--1134}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.093}, doi = {10.1016/J.MICROREL.2006.07.093}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YehLCC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YehTL07, author = {Chang{-}Lin Yeh and Tsung{-}Yueh Tsai and Yi{-}Shao Lai}, title = {Transient analysis of drop responses of board-level electronic packages using response spectra incorporated with modal superposition}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2188--2196}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.040}, doi = {10.1016/J.MICROREL.2006.09.040}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YehTL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YewCC07, author = {Ming{-}Chih Yew and Chan{-}Yen Chou and Kuo{-}Ning Chiang}, title = {Reliability assessment for solders with a stress buffer layer using ball shear strength test and board-level finite element analysis}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1658--1662}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.043}, doi = {10.1016/J.MICROREL.2007.07.043}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YewCC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YoungHNCLB07, author = {Chadwin D. Young and Dawei Heh and Arnost Neugroschel and Rino Choi and Byoung Hun Lee and Gennadi Bersuker}, title = {Electrical characterization and analysis techniques for the high-kappa era}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {479--488}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.053}, doi = {10.1016/J.MICROREL.2007.01.053}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YoungHNCLB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YuanSZEDS07, author = {Cadmus A. Yuan and Olaf van der Sluis and G. Q. (Kouchi) Zhang and Leo J. Ernst and Willem D. van Driel and Richard B. R. van Silfhout}, title = {Molecular simulation on the material/interfacial strength of the low-dielectric materials}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1483--1491}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.052}, doi = {10.1016/J.MICROREL.2007.07.052}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YuanSZEDS07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZarandiM07, author = {Hamid R. Zarandi and Seyed Ghassem Miremadi}, title = {Dependability evaluation of Altera FPGA-based embedded systems subjected to SEUs}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {461--470}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.005}, doi = {10.1016/J.MICROREL.2006.05.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZarandiM07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZarebskiG07, author = {Janusz Zarebski and Krzysztof G{\'{o}}recki}, title = {Spice-aided modelling of the {UC3842} current mode {PWM} controller with selfheating taken into account}, journal = {Microelectron. Reliab.}, volume = {47}, number = {7}, pages = {1145--1152}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.07.092}, doi = {10.1016/J.MICROREL.2006.07.092}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZarebskiG07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZarnikBN07, author = {Marina Santo Zarnik and Darko Belavic and Franc Novak}, title = {Finite-element model-based fault diagnosis, a case study of a ceramic pressure sensor structure}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {1950--1957}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.018}, doi = {10.1016/J.MICROREL.2007.04.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZarnikBN07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZbrzeznySP07, author = {A. R. Zbrzezny and Polina Snugovsky and D. D. Perovic}, title = {Impact of board and component metallizations on microstructure and reliability of lead-free solder joints}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2205--2214}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.09.038}, doi = {10.1016/J.MICROREL.2006.09.038}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZbrzeznySP07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZelsacherWBPSKB07, author = {R. Zelsacher and A. C. G. Wood and E. Bacher and E. Prax and K. Sorschag and J. Krumrey and J. Baumgartl}, title = {A novel {SIMS} based approach to the characterization of the channel doping profile of a trench {MOSFET}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {9-11}, pages = {1585--1589}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.07.001}, doi = {10.1016/J.MICROREL.2007.07.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZelsacherWBPSKB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZenkevichLSFBL07, author = {Andrei Zenkevich and Yu. Lebedinskii and G. Scarel and Marco Fanciulli and Andrey Baturin and N. Lubovin}, title = {Degradation kinetics of ultrathin HfO\({}_{\mbox{2}}\) layers on Si(1 0 0) during vacuum annealing monitored with in situ {XPS/LEIS} and ex situ {AFM}}, journal = {Microelectron. Reliab.}, volume = {47}, number = {4-5}, pages = {657--659}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.01.071}, doi = {10.1016/J.MICROREL.2007.01.071}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ZenkevichLSFBL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhangVSMK07, author = {Guangping Zhang and C. A. Volkert and Ruth Schwaiger and R. M{\"{o}}nig and O. Kraft}, title = {Fatigue and thermal fatigue damage analysis of thin metal films}, journal = {Microelectron. Reliab.}, volume = {47}, number = {12}, pages = {2007--2013}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2007.04.005}, doi = {10.1016/J.MICROREL.2007.04.005}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ZhangVSMK07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhaoL07, author = {Jianyin Zhao and Fang Liu}, title = {Reliability assessment of the metallized film capacitors from degradation data}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {434--436}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.013}, doi = {10.1016/J.MICROREL.2006.05.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhaoL07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZouXLLC07, author = {X. Zou and Jing{-}Ping Xu and C. X. Li and Pui{-}To Lai and W. B. Chen}, title = {A threshold-voltage model of SiGe-channel pMOSFET without Si cap layer}, journal = {Microelectron. Reliab.}, volume = {47}, number = {2-3}, pages = {391--394}, year = {2007}, url = {https://doi.org/10.1016/j.microrel.2006.05.019}, doi = {10.1016/J.MICROREL.2006.05.019}, timestamp = {Mon, 02 Oct 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ZouXLLC07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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