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@inproceedings{DBLP:conf/itc/AcarOST08, author = {Erkan Acar and Sule Ozev and Ganesh Srinivasan and Friedrich Taenzler}, editor = {Douglas Young and Nur A. Touba}, title = {Optimized {EVM} Testing for {IEEE} 802.11a/n {RF} ICs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700602}, doi = {10.1109/TEST.2008.4700602}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AcarOST08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AchkirZE08, author = {Brice Achkir and Pavel Zivny and Bill Eklow}, editor = {Douglas Young and Nur A. Touba}, title = {Parametric Testing of Optical Interfaces}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700655}, doi = {10.1109/TEST.2008.4700655}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AchkirZE08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AderholzAR08, author = {Ernst Aderholz and Heiko Ahrens and Michael Rohleder}, editor = {Douglas Young and Nur A. Touba}, title = {Bridging the gap between Design and Test Engineering for Functional Pattern Development}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700609}, doi = {10.1109/TEST.2008.4700609}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AderholzAR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AgarwalBBKPWYCM08, author = {Mridul Agarwal and Varsha Balakrishnan and Anshuman Bhuyan and Kyunglok Kim and Bipul C. Paul and Wenping Wang and Bo Yang and Yu Cao and Subhasish Mitra}, editor = {Douglas Young and Nur A. Touba}, title = {Optimized Circuit Failure Prediction for Aging: Practicality and Promise}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700619}, doi = {10.1109/TEST.2008.4700619}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AgarwalBBKPWYCM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AhrensSLSB08, author = {Heiko Ahrens and Rolf Schlagenhaft and Helmut Lang and V. Srinivasan and Enrico Bruzzano}, editor = {Douglas Young and Nur A. Touba}, title = {{DFT} Architecture for Automotive Microprocessors using On-Chip Scan Compression supporting Dual Vendor {ATPG}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700600}, doi = {10.1109/TEST.2008.4700600}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AhrensSLSB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Al-ArsHGM08, author = {Zaid Al{-}Ars and Said Hamdioui and Ad J. van de Goor and Georg Mueller}, editor = {Douglas Young and Nur A. Touba}, title = {Defect Oriented Testing of the Strap Problem Under Process Variations in DRAMs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700631}, doi = {10.1109/TEST.2008.4700631}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Al-ArsHGM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Al-AssadiK08, author = {Waleed K. Al{-}Assadi and Sindhu Kakarla}, editor = {Douglas Young and Nur A. Touba}, title = {Design for Test of Asynchronous {NULL} Convention Logic {(NCL)} Circuits}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700611}, doi = {10.1109/TEST.2008.4700611}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Al-AssadiK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AlaghiSKN08, author = {Armin Alaghi and Mahshid Sedghi and Naghmeh Karimi and Zainalabedin Navabi}, editor = {Douglas Young and Nur A. Touba}, title = {NoC Reconfiguration for Utilizing the Largest Fault-free Connected Sub-structure}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700688}, doi = {10.1109/TEST.2008.4700688}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AlaghiSKN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AlemzadehCRPN08, author = {Homa Alemzadeh and Stefano Di Carlo and Fatemeh Refan and Paolo Prinetto and Zainalabedin Navabi}, editor = {Douglas Young and Nur A. Touba}, title = {"Plug {\&} Test" at System Level via Testable {TLM} Primitives}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700610}, doi = {10.1109/TEST.2008.4700610}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AlemzadehCRPN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AlimohammadFC08, author = {Amirhossein Alimohammad and Saeed Fouladi Fard and Bruce F. Cockburn}, editor = {Douglas Young and Nur A. Touba}, title = {Hardware-based Error Rate Testing of Digital Baseband Communication Systems}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700653}, doi = {10.1109/TEST.2008.4700653}, timestamp = {Tue, 04 Jun 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/AlimohammadFC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AlmukhaizimS08, author = {Sobeeh Almukhaizim and Ozgur Sinanoglu}, editor = {Douglas Young and Nur A. Touba}, title = {Peak Power Reduction Through Dynamic Partitioning of Scan Chains}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700573}, doi = {10.1109/TEST.2008.4700573}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AlmukhaizimS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AouiniR08, author = {Sadok Aouini and Gordon W. Roberts}, editor = {Douglas Young and Nur A. Touba}, title = {Generating Test Signals for Noise-Based {NPR/ACPR} Type Tests in Production}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700623}, doi = {10.1109/TEST.2008.4700623}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AouiniR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/AraiINS08, author = {Masayuki Arai and Kazuhiko Iwasaki and Michinobu Nakao and Iwao Suzuki}, editor = {Douglas Young and Nur A. Touba}, title = {Hardware Overhead Reduction for Memory {BIST}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700690}, doi = {10.1109/TEST.2008.4700690}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/AraiINS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BahlSG08, author = {Swapnil Bahl and Rajiv Sarkar and Akhil Garg}, editor = {Douglas Young and Nur A. Touba}, title = {Low Power Test}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700682}, doi = {10.1109/TEST.2008.4700682}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BahlSG08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BastaniCWA08, author = {Pouria Bastani and Nicholas Callegari and Li{-}C. Wang and Magdy S. Abadir}, editor = {Douglas Young and Nur A. Touba}, title = {Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700588}, doi = {10.1109/TEST.2008.4700588}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BastaniCWA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BernardiMPPA08, author = {Paolo Bernardi and Fabio Melchiori and Davide Pandini and Santo Pugliese and Davide Appello}, editor = {Douglas Young and Nur A. Touba}, title = {Robust Design-for-Productization Practices for High Quality Automotive Products}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.5483612}, doi = {10.1109/TEST.2008.5483612}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BernardiMPPA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BiswasB08, author = {Sounil Biswas and Ronald D. Blanton}, editor = {Douglas Young and Nur A. Touba}, title = {Improving the Accuracy of Test Compaction through Adaptive Test Update}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700706}, doi = {10.1109/TEST.2008.4700706}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BiswasB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/BommuCKS08, author = {Surendra Bommu and Kameshwar Chandrasekar and Rahul Kundu and Sanjay Sengupta}, editor = {Douglas Young and Nur A. Touba}, title = {{CONCAT:} CONflict Driven Learning in {ATPG} for Industrial designs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700566}, doi = {10.1109/TEST.2008.4700566}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/BommuCKS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Bowhers08, author = {William J. Bowhers}, editor = {Douglas Young and Nur A. Touba}, title = {{FPGA} Time Measurement Module: Preliminary Results}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700703}, doi = {10.1109/TEST.2008.4700703}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Bowhers08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ButlerCS08, author = {Kenneth M. Butler and John M. Carulli Jr. and Jayashree Saxena}, editor = {Douglas Young and Nur A. Touba}, title = {Modeling Test Escape Rate as a Function of Multiple Coverages}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700605}, doi = {10.1109/TEST.2008.4700605}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ButlerCS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/CarreteroVCA08, author = {Javier Carretero and Xavier Vera and Pedro Chaparro and Jaume Abella}, editor = {Douglas Young and Nur A. Touba}, title = {On-line Failure Detection in Memory Order Buffers}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700582}, doi = {10.1109/TEST.2008.4700582}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/CarreteroVCA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChangCHC08, author = {Chi{-}Min Chang and Mango Chia{-}Tso Chao and Rei{-}Fu Huang and Ding{-}Yuan Chen}, editor = {Douglas Young and Nur A. Touba}, title = {Testing Methodology of Embedded DRAMs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700618}, doi = {10.1109/TEST.2008.4700618}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChangCHC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChangK08, author = {Che{-}Jen Jerry Chang and Takeo Kobayashi}, editor = {Douglas Young and Nur A. Touba}, title = {Test Quality Improvement with Timing-aware {ATPG:} Screening small delay defect case study}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700702}, doi = {10.1109/TEST.2008.4700702}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChangK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChenDMGDBCWZCYSGN08, author = {Liang{-}Chi Chen and Paul Dickinson and Prasad Mantri and Murali M. R. Gala and Peter Dahlgren and Subhra Bhattacharya and Olivier Caty and Kevin Woodling and Thomas A. Ziaja and David Curwen and Wendy Yee and Ellen Su and Guixiang Gu and Tim Nguyen}, editor = {Douglas Young and Nur A. Touba}, title = {Transition Test on UltraSPARC- {T2} Microprocessor}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700599}, doi = {10.1109/TEST.2008.4700599}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChenDMGDBCWZCYSGN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChickermaneGSYC08, author = {Vivek Chickermane and Patrick R. Gallagher Jr. and James Sage and Paul Yuan and Krishna Chakravadhanula}, editor = {Douglas Young and Nur A. Touba}, title = {A Power-Aware Test Methodology for Multi-Supply Multi-Voltage Designs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700572}, doi = {10.1109/TEST.2008.4700572}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChickermaneGSYC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ChiuL08, author = {Geng{-}Ming Chiu and James Chien{-}Mo Li}, editor = {Douglas Young and Nur A. Touba}, title = {{IEEE} 1500 Compatible Secure Test Wrapper For Embedded {IP} Cores}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700683}, doi = {10.1109/TEST.2008.4700683}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ChiuL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Chu08, author = {Brandon Chu}, editor = {Douglas Young and Nur A. Touba}, title = {Solder Bead on High Density Interconnect Printed Circuit Board}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--5}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700590}, doi = {10.1109/TEST.2008.4700590}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Chu08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/CzyszKLMRT08, author = {Dariusz Czysz and Mark Kassab and Xijiang Lin and Grzegorz Mrugalski and Janusz Rajski and Jerzy Tyszer}, editor = {Douglas Young and Nur A. Touba}, title = {Low Power Scan Shift and Capture in the {EDT} Environment}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700585}, doi = {10.1109/TEST.2008.4700585}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/CzyszKLMRT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DSouzaMMRMDAS08, author = {Jayant D'Souza and Subramanian Mahadevan and Nilanjan Mukherjee and Graham Rhodes and Jocelyn Moreau and Thomas Droniou and Paul Armagnat and Damien Sartoretti}, editor = {Douglas Young and Nur A. Touba}, title = {High Test Quality in Low Pin Count Applications}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700700}, doi = {10.1109/TEST.2008.4700700}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DSouzaMMRMDAS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Davidson08, author = {Scott Davidson}, editor = {Douglas Young and Nur A. Touba}, title = {Justifying {DFT} with a Hierarchical Top-Down Cost-Benefit Model}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700656}, doi = {10.1109/TEST.2008.4700656}, timestamp = {Tue, 12 Dec 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Davidson08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DoegeC08, author = {Jason Doege and Alfred L. Crouch}, editor = {Douglas Young and Nur A. Touba}, title = {The Advantages of Limiting {P1687} to a Restricted Subset}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700643}, doi = {10.1109/TEST.2008.4700643}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DoegeC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DubberkeGD08, author = {Dave F. Dubberke and James J. Grealish and Bill Van Dick}, editor = {Douglas Young and Nur A. Touba}, title = {Solving In-Circuit Defect Coverage Holes with a Novel Boundary Scan Application}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700579}, doi = {10.1109/TEST.2008.4700579}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DubberkeGD08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/DuttaAPP08, author = {Amit Dutta and Srinivasulu Alampally and V. Prasanth and Rubin A. Parekhji}, editor = {Douglas Young and Nur A. Touba}, title = {{DFT} Implementationis for Striking the Right Balance between Test Cost and Test Quality for Automotive SOCs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.5483610}, doi = {10.1109/TEST.2008.5483610}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/DuttaAPP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Ehrenberg08, author = {Heiko Ehrenberg}, editor = {Douglas Young and Nur A. Touba}, title = {{IEEE} {P1581} drastically simplifies connectivity test for memory devices}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700681}, doi = {10.1109/TEST.2008.4700681}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Ehrenberg08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/EichenbergerGHKM08, author = {Stefan Eichenberger and Jeroen Geuzebroek and Camelia Hora and Bram Kruseman and Ananta K. Majhi}, editor = {Douglas Young and Nur A. Touba}, title = {Towards a World Without Test Escapes: The Use of Volume Diagnosis to Improve Test Quality}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700604}, doi = {10.1109/TEST.2008.4700604}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/EichenbergerGHKM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/FranchRNHFDWGS08, author = {Robert L. Franch and Phillip J. Restle and James K. Norman and William V. Huott and Joshua Friedrich and R. Dixon and Steve Weitzel and K. van Goor and Gerard Salem}, editor = {Douglas Young and Nur A. Touba}, title = {On-chip Timing Uncertainty Measurements on {IBM} Microprocessors}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--7}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700707}, doi = {10.1109/TEST.2008.4700707}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/FranchRNHFDWGS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/FritzscheH08, author = {William Fritzsche and Asim E. Haque}, editor = {Douglas Young and Nur A. Touba}, title = {Low cost testing of multi-GBit device pins with {ATE} assisted loopback instrument}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700558}, doi = {10.1109/TEST.2008.4700558}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/FritzscheH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Gattiker08, author = {Anne Gattiker}, editor = {Douglas Young and Nur A. Touba}, title = {Unraveling Variability for Process/Product Improvement}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700550}, doi = {10.1109/TEST.2008.4700550}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Gattiker08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GeuzebroekV08, author = {Jeroen Geuzebroek and Bart Vermeulen}, editor = {Douglas Young and Nur A. Touba}, title = {Integration of Hardware Assertions in Systems-on-Chip}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700593}, doi = {10.1109/TEST.2008.4700593}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GeuzebroekV08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GilesWSBW08, author = {Grady Giles and Jing Wang and Anuja Sehgal and Kedarnath J. Balakrishnan and James Wingfield}, editor = {Douglas Young and Nur A. Touba}, title = {Test Access Mechanism for Multiple Identical Cores}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700553}, doi = {10.1109/TEST.2008.4700553}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GilesWSBW08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GinezPA08, author = {Olivier Ginez and Jean{-}Michel Portal and Hassen Aziza}, editor = {Douglas Young and Nur A. Touba}, title = {A High-Speed Structural Method for Testing Address Decoder Faults in Flash Memories}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700633}, doi = {10.1109/TEST.2008.4700633}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/GinezPA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/GuoLHC08, author = {Ruifeng Guo and Liyang Lai and Yu Huang and Wu{-}Tung Cheng}, editor = {Douglas Young and Nur A. Touba}, title = {Detection and Diagnosis of Static Scan Cell Internal Defect}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700596}, doi = {10.1109/TEST.2008.4700596}, timestamp = {Sun, 04 Aug 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/GuoLHC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HillebrechtPEBKC08, author = {Stefan Hillebrecht and Ilia Polian and Piet Engelke and Bernd Becker and Martin Keim and Wu{-}Tung Cheng}, editor = {Douglas Young and Nur A. Touba}, title = {Extraction, Simulation and Test Generation for Interconnect Open Defects Based on Enhanced Aggressor-Victim Model}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700642}, doi = {10.1109/TEST.2008.4700642}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HillebrechtPEBKC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HirdW08, author = {Steve Hird and Reggie Weng}, editor = {Douglas Young and Nur A. Touba}, title = {Finding Power/Ground Defects on Connectors - Case Study}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--4}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700591}, doi = {10.1109/TEST.2008.4700591}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HirdW08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HuangCNSG08, author = {I{-}De Huang and Yi{-}Shing Chang and Suriyaprakash Natarajan and Ramesh Sharma and Sandeep K. Gupta}, editor = {Douglas Young and Nur A. Touba}, title = {On Accelerating Path Delay Fault Simulation of Long Test Sequences}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700625}, doi = {10.1109/TEST.2008.4700625}, timestamp = {Fri, 22 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/HuangCNSG08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/HuangX08, author = {Lin Huang and Qiang Xu}, editor = {Douglas Young and Nur A. Touba}, title = {Is It Cost-Effective to Achieve Very High Fault Coverage for Testing Homogeneous SoCs with Core-Level Redundancy?}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700697}, doi = {10.1109/TEST.2008.4700697}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/HuangX08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/InoueLM08, author = {Hiroaki Inoue and Yanjing Li and Subhasish Mitra}, editor = {Douglas Young and Nur A. Touba}, title = {{VAST:} Virtualization-Assisted Concurrent Autonomous Self-Test}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700583}, doi = {10.1109/TEST.2008.4700583}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/InoueLM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JayaramanFT08, author = {Dheepakkumaran Jayaraman and Edward Flanigan and Spyros Tragoudas}, editor = {Douglas Young and Nur A. Touba}, title = {Implicit Identification of Non-Robustly Unsensitizable Paths using Bounded Delay Model}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700626}, doi = {10.1109/TEST.2008.4700626}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/JayaramanFT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/JiangA08, author = {Wei Jiang and Vishwani D. Agrawal}, editor = {Douglas Young and Nur A. Touba}, title = {Built-in Self-Calibration of On-chip {DAC} and {ADC}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700638}, doi = {10.1109/TEST.2008.4700638}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/JiangA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Jin08, author = {Le Jin}, editor = {Douglas Young and Nur A. Touba}, title = {Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700637}, doi = {10.1109/TEST.2008.4700637}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Jin08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KarimiMJM08, author = {Naghmeh Karimi and Michail Maniatakos and Abhijit Jas and Yiorgos Makris}, editor = {Douglas Young and Nur A. Touba}, title = {On the Correlation between Controller Faults and Instruction-Level Errors in Modern Microprocessors}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700613}, doi = {10.1109/TEST.2008.4700613}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KarimiMJM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KatayamaYHTKSO08, author = {Akira Katayama and Tomoaki Yabe and Osamu Hirabayashi and Yasuhisa Takeyama and Keiichi Kushida and Takahiko Sasaki and Nobuaki Otsuka}, editor = {Douglas Young and Nur A. Touba}, title = {Direct Cell-Stability Test Techniques for an {SRAM} Macro with Asymmetric Cell-Bias-Voltage Modulation}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--7}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700616}, doi = {10.1109/TEST.2008.4700616}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KatayamaYHTKSO08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KeezerMDM08, author = {David C. Keezer and Dany Minier and Patrice Ducharme and A. M. Majid}, editor = {Douglas Young and Nur A. Touba}, title = {An Electronic Module for 12.8 Gbps Multiplexing and Loopback Test}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700624}, doi = {10.1109/TEST.2008.4700624}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KeezerMDM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KhocheBRP08, author = {Ajay Khoche and Phil Burlison and John Rowe and Glenn Plowman}, editor = {Douglas Young and Nur A. Touba}, title = {A Tutorial on {STDF} Fail Datalog Standard}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700654}, doi = {10.1109/TEST.2008.4700654}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KhocheBRP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KimBKJK08, author = {Gyu{-}Yeol Kim and Eon{-}Jo Byunb and Ki{-}Sang Kang and Young{-}Hyun Jun and Bai{-}Sun Kong}, editor = {Douglas Young and Nur A. Touba}, title = {Wafer-Level Characterization of Probecards using {NAC} Probing}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700571}, doi = {10.1109/TEST.2008.4700571}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KimBKJK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KoKN08, author = {Ho Fai Ko and Adam B. Kinsman and Nicola Nicolici}, editor = {Douglas Young and Nur A. Touba}, title = {Distributed Embedded Logic Analysis for Post-Silicon Validation of SOCs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700594}, doi = {10.1109/TEST.2008.4700594}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KoKN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Komatsu08, author = {Satoshi Komatsu}, editor = {Douglas Young and Nur A. Touba}, title = {{VLSI} Test Exercise Courses for Students in {EE} Department}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700689}, doi = {10.1109/TEST.2008.4700689}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Komatsu08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/KongPWI08, author = {Wei Kong and Paul C. Parries and G. Wang and Subramanian S. Iyer}, editor = {Douglas Young and Nur A. Touba}, title = {Analysis of Retention Time Distribution of Embedded {DRAM} - {A} New Method to Characterize Across-Chip Threshold Voltage Variation}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--7}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700556}, doi = {10.1109/TEST.2008.4700556}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/KongPWI08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LarssonZLC08, author = {Anders Larsson and Xin Zhang and Erik Larsson and Krishnendu Chakrabarty}, editor = {Douglas Young and Nur A. Touba}, title = {{SOC} Test Optimization with Compression-Technique Selection}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700685}, doi = {10.1109/TEST.2008.4700685}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LarssonZLC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LeeM08, author = {Jaekwang Lee and Edward J. McCluskey}, editor = {Douglas Young and Nur A. Touba}, title = {Failing Frequency Signature Analysis}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700561}, doi = {10.1109/TEST.2008.4700561}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LeeM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LeeT08, author = {Jeremy Lee and Mohammad Tehranipoor}, editor = {Douglas Young and Nur A. Touba}, title = {A Novel Pattern Generation Framework for Inducing Maximum Crosstalk Effects on Delay-Sensitive Paths}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700641}, doi = {10.1109/TEST.2008.4700641}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LeeT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Li08, author = {Mike P. Li}, editor = {Douglas Young and Nur A. Touba}, title = {Jitter and Signal Integrity Verification for Synchronous and Asynchronous I/Os at Multiple to 10 GHz/Gbps}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700649}, doi = {10.1109/TEST.2008.4700649}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Li08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LinHLHCCC08, author = {Chung{-}Fu Lin and Chia{-}Fu Huang and De{-}Chung Lu and Chih{-}Chiang Hsu and Wen{-}Tsung Chiu and Yu{-}Wei Chen and Yeong{-}Jar Chang}, editor = {Douglas Young and Nur A. Touba}, title = {A Low-Cost Programmable Memory {BIST} Design for Multiple Memory Instances}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700691}, doi = {10.1109/TEST.2008.4700691}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LinHLHCCC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LinPBNLI08, author = {Yen{-}Tzu Lin and Osei Poku and Ronald D. Blanton and Phil Nigh and Peter Lloyd and Vikram Iyengar}, editor = {Douglas Young and Nur A. Touba}, title = {Evaluating the Effectiveness of Physically-Aware N-Detect Test using Real Silicon}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700606}, doi = {10.1109/TEST.2008.4700606}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LinPBNLI08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LinR08, author = {Xijiang Lin and Janusz Rajski}, editor = {Douglas Young and Nur A. Touba}, title = {Test Generation for Interconnect Opens}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--7}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700640}, doi = {10.1109/TEST.2008.4700640}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LinR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LinWLCTHT08, author = {Hsiu{-}Ting Lin and Jen{-}Yang Wen and James Li and Ming{-}Tung Chang and Min{-}Hsiu Tsai and Sheng{-}Chih Huang and Chili{-}Mou Tseng}, editor = {Douglas Young and Nur A. Touba}, title = {Capture and Shift Toggle Reduction {(CASTR)} {ATPG} to Minimize Peak Power Supply Noise}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700701}, doi = {10.1109/TEST.2008.4700701}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LinWLCTHT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LiuTLL08, author = {Wei{-}Chih Liu and Wei{-}Lin Tsai and Hsiu{-}Ting Lin and James Chien{-}Mo Li}, editor = {Douglas Young and Nur A. Touba}, title = {Diagnosis of Logic-to-chain Bridging Faults}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700695}, doi = {10.1109/TEST.2008.4700695}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiuTLL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/LiuYX08, author = {Xiao Liu and Feng Yuan and Qiang Xu}, editor = {Douglas Young and Nur A. Touba}, title = {A Generic Framework for Scan Capture Power Reduction in Test Compression Environment}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700699}, doi = {10.1109/TEST.2008.4700699}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/LiuYX08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Lydon08, author = {Mike Lydon}, editor = {Douglas Young and Nur A. Touba}, title = {Managing Test in the End-to-End, Mega Supply Chain}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700540}, doi = {10.1109/TEST.2008.4700540}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Lydon08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MaLT08, author = {Junxia Ma and Jeremy Lee and Mohammad Tehranipoor}, editor = {Douglas Young and Nur A. Touba}, title = {Power Distribution Failure Analysis Using Transition-Delay Fault Patterns}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700696}, doi = {10.1109/TEST.2008.4700696}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MaLT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Maeda08, author = {Akinori Maeda}, editor = {Douglas Young and Nur A. Touba}, title = {A Method to Generate a Very Low Distortion, High Frequency Sine Waveform Using an {AWG}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700607}, doi = {10.1109/TEST.2008.4700607}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Maeda08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MajzoobiKP08, author = {Mehrdad Majzoobi and Farinaz Koushanfar and Miodrag Potkonjak}, editor = {Douglas Young and Nur A. Touba}, title = {Testing Techniques for Hardware Security}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700636}, doi = {10.1109/TEST.2008.4700636}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MajzoobiKP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Mak08, author = {T. M. Mak}, editor = {Douglas Young and Nur A. Touba}, title = {Jitters in high performance microprocessors}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700650}, doi = {10.1109/TEST.2008.4700650}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Mak08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MalianE08, author = {John Malian and Bill Eklow}, editor = {Douglas Young and Nur A. Touba}, title = {Embedded Testing in an In-Circuit Test Environment}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--6}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700652}, doi = {10.1109/TEST.2008.4700652}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MalianE08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MaoDC08, author = {Vincent Mao and Chris Dwyer and Krishnendu Chakrabarty}, editor = {Douglas Young and Nur A. Touba}, title = {Fabrication Defects and Fault Models for {DNA} Self-Assembled Nanoelectronics}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700634}, doi = {10.1109/TEST.2008.4700634}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MaoDC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MargulisAWM08, author = {Arie Margulis and David Akselrod and Tim Wood and Sopho Metsis}, editor = {Douglas Young and Nur A. Touba}, title = {Platform Independent Test Access Port Architecture}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700687}, doi = {10.1109/TEST.2008.4700687}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MargulisAWM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MeixnerKPB08, author = {Anne Meixner and Akira Kakizawa and Benoit Provost and Serge Bedwani}, editor = {Douglas Young and Nur A. Touba}, title = {External Loopback Testing Experiences with High Speed Serial Interfaces}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700557}, doi = {10.1109/TEST.2008.4700557}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MeixnerKPB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MerentitisKPG08, author = {Andreas Merentitis and Nektarios Kranitis and Antonis M. Paschalis and Dimitris Gizopoulos}, editor = {Douglas Young and Nur A. Touba}, title = {Low Energy On-Line {SBST} of Embedded Processors}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700581}, doi = {10.1109/TEST.2008.4700581}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MerentitisKPG08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MirzaeianZC08, author = {Saeed Mirzaeian and Feijun (Frank) Zheng and Kwang{-}Ting (Tim) Cheng}, editor = {Douglas Young and Nur A. Touba}, title = {{RTL} Error Diagnosis Using a Word-Level SAT-Solver}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700568}, doi = {10.1109/TEST.2008.4700568}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MirzaeianZC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MooreMSRWBRFS08, author = {Brian Moore and Marc Mangrum and Chris Sellathamby and Md. Mahbub Reja and T. Weng and Brenda Bai and Edwin Walter Reid and Igor M. Filanovsky and Steven Slupsky}, editor = {Douglas Young and Nur A. Touba}, title = {Non-contact Testing for SoC and {RCP} (SIPs) at Advanced Nodes}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700612}, doi = {10.1109/TEST.2008.4700612}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MooreMSRWBRFS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MoreiraBKCRC08, author = {Jose Moreira and Heidi Barnes and Hiroshi Kaga and Michael Comai and Bernhard Roth and Morgan Culver}, editor = {Douglas Young and Nur A. Touba}, title = {Beyond 10 Gbps? Challenges of Characterizing Future {I/O} Interfaces with Automated Test Equipment}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700651}, doi = {10.1109/TEST.2008.4700651}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MoreiraBKCRC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MukherjeePRT08, author = {Nilanjan Mukherjee and Artur Pogiel and Janusz Rajski and Jerzy Tyszer}, editor = {Douglas Young and Nur A. Touba}, title = {High Throughput Diagnosis via Compression of Failure Data in Embedded Memory {BIST}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700554}, doi = {10.1109/TEST.2008.4700554}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MukherjeePRT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/MullaneHM08, author = {Brendan Mullane and Michael Higgins and Ciaran MacNamee}, editor = {Douglas Young and Nur A. Touba}, title = {{IEEE} 1500 Core Wrapper Optimization Techniques and Implementation}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700629}, doi = {10.1109/TEST.2008.4700629}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/MullaneHM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Nadeau-DostieTC08, author = {Benoit Nadeau{-}Dostie and Kiyoshi Takeshita and Jean{-}Francois Cote}, editor = {Douglas Young and Nur A. Touba}, title = {Power-Aware At-Speed Scan Test Methodology for Circuits with Synchronous Clocks}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700574}, doi = {10.1109/TEST.2008.4700574}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Nadeau-DostieTC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NagarajK08, author = {Kelageri Nagaraj and Sandip Kundu}, editor = {Douglas Young and Nur A. Touba}, title = {An Automatic Post Silicon Clock Tuning System for Improving System Performance based on Tester Measurements}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700565}, doi = {10.1109/TEST.2008.4700565}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NagarajK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NamCKKMLJKKSKK08, author = {Junghyun Nam and Sunghoon Chun and Gibum Koo and Yanggi Kim and Byungsoo Moon and Jonghyoung Lim and Jaehoon Joo and Sangseok Kang and Hoonjung Kim and Kyeongseon Shin and Kisang Kang and Sungho Kang}, editor = {Douglas Young and Nur A. Touba}, title = {A New Wafer Level Latent Defect Screening Methodology for Highly Reliable {DRAM} Using a Response Surface Method}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700632}, doi = {10.1109/TEST.2008.4700632}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NamCKKMLJKKSKK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NatarajanCLSC08, author = {Vishwanath Natarajan and Hyun Woo Choi and Deuk Lee and Rajarajan Senguttuvan and Abhijit Chatterjee}, editor = {Douglas Young and Nur A. Touba}, title = {{EVM} Testing of Wireless {OFDM} Transceivers Using Intelligent Back-End Digital Signal Processing Algorithms}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700603}, doi = {10.1109/TEST.2008.4700603}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NatarajanCLSC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NepalADB08, author = {Kundan Nepal and Nuno Alves and Jennifer Dworak and R. Iris Bahar}, editor = {Douglas Young and Nur A. Touba}, title = {Using Implications for Online Error Detection}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700614}, doi = {10.1109/TEST.2008.4700614}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NepalADB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NeyBDGPVB08, author = {Alexandre Ney and Alberto Bosio and Luigi Dilillo and Patrick Girard and Serge Pravossoudovitch and Arnaud Virazel and Magali Bastian}, editor = {Douglas Young and Nur A. Touba}, title = {A History-Based Diagnosis Technique for Static and Dynamic Faults in SRAMs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700555}, doi = {10.1109/TEST.2008.4700555}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NeyBDGPVB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NirmaierZLSRS08, author = {Thomas Nirmaier and Jose Torres Zaguirre and Eric Liau and Wolfgang Spirkl and Armin Rettenberger and Doris Schmitt{-}Landsiedel}, editor = {Douglas Young and Nur A. Touba}, title = {Efficient High-Speed Interface Verification and Fault Analysis}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700559}, doi = {10.1109/TEST.2008.4700559}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NirmaierZLSRS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NorrgardP08, author = {Dayton Norrgard and Kenneth P. Parker}, editor = {Douglas Young and Nur A. Touba}, title = {Augmenting Boundary-Scan Tests for Enhanced Defect Coverage}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700580}, doi = {10.1109/TEST.2008.4700580}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NorrgardP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/NounCFAB08, author = {Ziad Noun and Philippe Cauvet and Marie{-}Lise Flottes and David Andreu and Serge Bernard}, editor = {Douglas Young and Nur A. Touba}, title = {Wireless Test Structure for Integrated Systems}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700704}, doi = {10.1109/TEST.2008.4700704}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/NounCFAB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ONeill08, author = {Peter M. O'Neill}, editor = {Douglas Young and Nur A. Touba}, title = {Production Multivariate Outlier Detection Using Principal Components}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700549}, doi = {10.1109/TEST.2008.4700549}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ONeill08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ParkM08, author = {Intaik Park and Edward J. McCluskey}, editor = {Douglas Young and Nur A. Touba}, title = {Launch-on-Shift-Capture Transition Tests}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700648}, doi = {10.1109/TEST.2008.4700648}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ParkM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ParkerJ08, author = {Kenneth P. Parker and Neil G. Jacobson}, editor = {Douglas Young and Nur A. Touba}, title = {Boundary-Scan Testing of Power/Ground Pins}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700628}, doi = {10.1109/TEST.2008.4700628}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ParkerJ08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ParulkarAALRCP08, author = {Ishwar Parulkar and Sriram Anandakumar and Gaurav Agarwal and Gordon Liu and Krishna Rajan and Frank Chiu and Rajesh Pendurkar}, editor = {Douglas Young and Nur A. Touba}, title = {{DFX} of a 3\({}^{\mbox{rd}}\) Generation, 16-core/32-thread UltraSPARC- {CMT} Microprocessor}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700552}, doi = {10.1109/TEST.2008.4700552}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ParulkarAALRCP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Pease08, author = {Robert A. Pease}, editor = {Douglas Young and Nur A. Touba}, title = {Having {FUN} with Analog Test}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700542}, doi = {10.1109/TEST.2008.4700542}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Pease08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PhamCSCTMS08, author = {Tung N. Pham and Frances Clougherty and Gerard Salem and James M. Crafts and Jon Tetzloff and Pamela Moczygemba and Timothy M. Skergan}, editor = {Douglas Young and Nur A. Touba}, title = {Functional Test and Speed/Power Sorting of the {IBM} {POWER6} and {Z10} Processors}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--7}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700598}, doi = {10.1109/TEST.2008.4700598}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PhamCSCTMS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PhelpsJGK08, author = {Jonathan Phelps and Chuck Johnson and Corey Goodrich and Aman Kokrady}, editor = {Douglas Young and Nur A. Touba}, title = {The Importance of Functional-Like Access for Memory Test}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700692}, doi = {10.1109/TEST.2008.4700692}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PhelpsJGK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/PortolanGTCCC08, author = {Michele Portolan and Suresh Goyal and Bradford G. Van Treuren and Chen{-}Huan Chiang and Tapan J. Chakraborty and Thomas B. Cook}, editor = {Douglas Young and Nur A. Touba}, title = {A New Language Approach for {IJTAG}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700644}, doi = {10.1109/TEST.2008.4700644}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/PortolanGTCCC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Rabaey08, author = {Jan M. Rabaey}, editor = {Douglas Young and Nur A. Touba}, title = {Computing at the Crossroads (And What Does it Mean to Verification and Test?)}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700541}, doi = {10.1109/TEST.2008.4700541}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Rabaey08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Raina08, author = {Rajesh Raina}, editor = {Douglas Young and Nur A. Touba}, title = {Achieving Zero-Defects for Automotive Applications}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.5483611}, doi = {10.1109/TEST.2008.5483611}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Raina08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Rearick08, author = {Jeff Rearick}, editor = {Douglas Young and Nur A. Touba}, title = {This is a Test: How to Tell if {DFT} and Test Are Adding Value to Your Company}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700543}, doi = {10.1109/TEST.2008.4700543}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Rearick08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Rodriguez-MontanesAFEHK08, author = {Rosa Rodr{\'{\i}}guez{-}Monta{\~{n}}{\'{e}}s and Daniel Arum{\'{\i}} and Joan Figueras and Stefan Eichenberger and Camelia Hora and Bram Kruseman}, editor = {Douglas Young and Nur A. Touba}, title = {Time-dependent Behaviour of Full Open Defects in Interconnect Lines}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700575}, doi = {10.1109/TEST.2008.4700575}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Rodriguez-MontanesAFEHK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SchneiderS08, author = {Myron Schneider and Ayub Shafi}, editor = {Douglas Young and Nur A. Touba}, title = {Engineering Test Coverage on Complex Sockets}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700578}, doi = {10.1109/TEST.2008.4700578}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SchneiderS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Sde-PazS08, author = {Shlomi Sde{-}Paz and Eyal Salomon}, editor = {Douglas Young and Nur A. Touba}, title = {Frequency and Power Correlation between At-Speed Scan and Functional Tests}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700586}, doi = {10.1109/TEST.2008.4700586}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Sde-PazS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ShamshiriLPC08, author = {Saeed Shamshiri and Peter Lisherness and Sung{-}Jui (Song{-}Ra) Pan and Kwang{-}Ting Cheng}, editor = {Douglas Young and Nur A. Touba}, title = {A Cost Analysis Framework for Multi-core Systems with Spares}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700562}, doi = {10.1109/TEST.2008.4700562}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ShamshiriLPC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SharmaBLALKTCTCLM08, author = {Manish Sharma and Brady Benware and Lei Ling and David Abercrombie and Lincoln Lee and Martin Keim and Huaxing Tang and Wu{-}Tung Cheng and Ting{-}Pu Tai and Yi{-}Jung Chang and Reinhart Lin and Albert Mann}, editor = {Douglas Young and Nur A. Touba}, title = {Efficiently Performing Yield Enhancements by Identifying Dominant Physical Root Cause from Test Fail Data}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700589}, doi = {10.1109/TEST.2008.4700589}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SharmaBLALKTCTCLM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ShazliATK08, author = {Syed Zafar Shazli and Mohammed A. Abdul{-}Aziz and Mehdi Baradaran Tahoori and David R. Kaeli}, editor = {Douglas Young and Nur A. Touba}, title = {A Field Analysis of System-level Effects of Soft Errors Occurring in Microprocessors used in Information Systems}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700615}, doi = {10.1109/TEST.2008.4700615}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ShazliATK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Sinanoglu08, author = {Ozgur Sinanoglu}, editor = {Douglas Young and Nur A. Touba}, title = {Align-Encode: Improving the Encoding Capability of Test Stimulus Decompressors}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700647}, doi = {10.1109/TEST.2008.4700647}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Sinanoglu08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Singh08, author = {Adit D. Singh}, editor = {Douglas Young and Nur A. Touba}, title = {Scan Based Testing of Dual/Multi Core Processors for Small Delay Defects}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700563}, doi = {10.1109/TEST.2008.4700563}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Singh08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SongISSDSMJKS08, author = {Peilin Song and Stephen Ippolito and Franco Stellari and John Sylvestri and Tim Diemoz and George Smith and Paul Muench and Norm James and Seongwon Kim and Hector Saenz}, editor = {Douglas Young and Nur A. Touba}, title = {Optical Diagnostics for {IBM} {POWER6-} Microprocessor}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700597}, doi = {10.1109/TEST.2008.4700597}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SongISSDSMJKS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SongJLJKP08, author = {Jaehoon Song and Taejin Jung and Junseop Lee and Hyeran Jeong and Byeongjin Kim and Sungju Park}, editor = {Douglas Young and Nur A. Touba}, title = {An Efficient Secure Scan Design for an SoC Embedding {AES} Core}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700693}, doi = {10.1109/TEST.2008.4700693}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SongJLJKP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SouefEA08, author = {Laurent Souef and Christophe Eychenne and Emmanuel Alie}, editor = {Douglas Young and Nur A. Touba}, title = {Architecture for Testing Multi-Voltage Domain {SOC}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700592}, doi = {10.1109/TEST.2008.4700592}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SouefEA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SreedharK08, author = {Aswin Sreedhar and Sandip Kundu}, editor = {Douglas Young and Nur A. Touba}, title = {Statistical Yield Modeling for Sub-wavelength Lithography}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700576}, doi = {10.1109/TEST.2008.4700576}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SreedharK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/SrinivasanCT08, author = {Ganesh Srinivasan and Hui{-}Chuan Chao and Friedrich Taenzler}, editor = {Douglas Young and Nur A. Touba}, title = {Octal-Site {EVM} Tests for {WLAN} Transceivers on "Very" Low-Cost {ATE} Platforms}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700601}, doi = {10.1109/TEST.2008.4700601}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/SrinivasanCT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/StewartA08, author = {John Stewart and Temitope Animashaun}, editor = {Douglas Young and Nur A. Touba}, title = {Overview of a High Speed Top Side Socket Solution}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700705}, doi = {10.1109/TEST.2008.4700705}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/StewartA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TakeuchiTMYKS08, author = {Kan Takeuchi and Genichi Tanaka and Hiroaki Matsushita and Kenichi Yoshizumi and Yusaku Katsuki and Takao Sato}, editor = {Douglas Young and Nur A. Touba}, title = {Observations of Supply-Voltage-Noise Dispersion in Sub-nsec}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700621}, doi = {10.1109/TEST.2008.4700621}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TakeuchiTMYKS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Tamba08, author = {Mamoru Tamba}, editor = {Douglas Young and Nur A. Touba}, title = {A Hybrid {A/D} Converter with 120dB {SNR} and -125dB {THD}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700622}, doi = {10.1109/TEST.2008.4700622}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Tamba08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TayadeA08, author = {Rajeshwary Tayade and Jacob A. Abraham}, editor = {Douglas Young and Nur A. Touba}, title = {On-chip Programmable Capture for Accurate Path Delay Test and Characterization}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700564}, doi = {10.1109/TEST.2008.4700564}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TayadeA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Treuren08, author = {Bradford G. Van Treuren}, editor = {Douglas Young and Nur A. Touba}, title = {System {JTAG} Initiative Group Advancements}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700698}, doi = {10.1109/TEST.2008.4700698}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Treuren08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TreurenCH08, author = {Bradford G. Van Treuren and Chen{-}Huan Chiang and Kenneth Honaker}, editor = {Douglas Young and Nur A. Touba}, title = {Problems Using Boundary-Scan for Memory Cluster Tests}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700645}, doi = {10.1109/TEST.2008.4700645}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/TreurenCH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/TsengL08, author = {Tsu{-}Wei Tseng and Jin{-}Fu Li}, editor = {Douglas Young and Nur A. Touba}, title = {A Shared Parallel Built-In Self-Repair Scheme for Random Access Memories in SOCs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700617}, doi = {10.1109/TEST.2008.4700617}, timestamp = {Tue, 17 Oct 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/TsengL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/Ungar08, author = {Louis Y. Ungar}, editor = {Douglas Young and Nur A. Touba}, title = {The Economics of Harm Prevention through Design for Testability}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700657}, doi = {10.1109/TEST.2008.4700657}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/Ungar08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VialBGLPV08, author = {Julien Vial and Alberto Bosio and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel}, editor = {Douglas Young and Nur A. Touba}, title = {SoC Yield Improvement: Redundant Architectures to the Rescue?}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700686}, doi = {10.1109/TEST.2008.4700686}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VialBGLPV08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VijR08, author = {Anjali Vij and Richard Ratliff}, editor = {Douglas Young and Nur A. Touba}, title = {Implementation Update: Logic Mapping On {SPARC-} Microprocessors}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700560}, doi = {10.1109/TEST.2008.4700560}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VijR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/VikinskiLSC08, author = {Omer Vikinski and Shaul Lupo and Gregory Sizikov and Chee Yee Chung}, editor = {Douglas Young and Nur A. Touba}, title = {Embedded Power Delivery Decoupling in Small Form Factor Test Sockets}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--8}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700569}, doi = {10.1109/TEST.2008.4700569}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/VikinskiLSC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WagenenVT08, author = {Bethany Van Wagenen and Jon Vollmar and Dan Thornton}, editor = {Douglas Young and Nur A. Touba}, title = {Leveraging {IEEE} 1641 for Tester-Independent {ATE} Software}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700608}, doi = {10.1109/TEST.2008.4700608}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WagenenVT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WangAWSLWJYWCGLNSWL08, author = {Laung{-}Terng Wang and Ravi Apte and Shianling Wu and Boryau Sheu and Kuen{-}Jong Lee and Xiaoqing Wen and Wen{-}Ben Jone and Chia{-}Hsien Yeh and Wei{-}Shin Wang and Hao{-}Jan Chao and Jianghao Guo and Jinsong Liu and Yanlong Niu and Yi{-}Chih Sung and Chi{-}Chun Wang and Fangfang Li}, editor = {Douglas Young and Nur A. Touba}, title = {Turbo1500: Toward Core-Based Design for Test and Diagnosis Using the {IEEE} 1500 Standard}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700630}, doi = {10.1109/TEST.2008.4700630}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WangAWSLWJYWCGLNSWL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WangHLLYH08, author = {Fei Wang and Yu Hu and Huawei Li and Xiaowei Li and Jing Ye and Yu Huang}, editor = {Douglas Young and Nur A. Touba}, title = {Deterministic Diagnostic Pattern Generation {(DDPG)} for Compound Defects}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700587}, doi = {10.1109/TEST.2008.4700587}, timestamp = {Mon, 22 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/WangHLLYH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WarwickRWRS08, author = {Thomas P. Warwick and Gustavo Rivera and David Waite and James Russell and Jeffrey Smith}, editor = {Douglas Young and Nur A. Touba}, title = {Measurement Repeatability for {RF} Test Within the Load-board Constraints of High Density and Fine Pitch {SOC} Applications}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700570}, doi = {10.1109/TEST.2008.4700570}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WarwickRWRS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WohlWN08, author = {Peter Wohl and John A. Waicukauski and Frederic Neuveux}, editor = {Douglas Young and Nur A. Touba}, title = {Increasing Scan Compression by Using X-chains}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700646}, doi = {10.1109/TEST.2008.4700646}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WohlWN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WoodGKSTIM08, author = {Tim Wood and Grady Giles and Chris Kiszely and Martin Schuessler and Daniela Toneva and Joel Irby and Michael Mateja}, editor = {Douglas Young and Nur A. Touba}, title = {The Test Features of the Quad-Core {AMD} Opteron- Microprocessor}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700551}, doi = {10.1109/TEST.2008.4700551}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WoodGKSTIM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuCCX08, author = {Xiaoxia Wu and Yibo Chen and Krishnendu Chakrabarty and Yuan Xie}, editor = {Douglas Young and Nur A. Touba}, title = {Test-Access Solutions for Three-Dimensional SOCs}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700684}, doi = {10.1109/TEST.2008.4700684}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuCCX08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuDW08, author = {Sean H. Wu and Dragoljub Gagi Drmanac and Li{-}C. Wang}, editor = {Douglas Young and Nur A. Touba}, title = {A Study of Outlier Analysis Techniques for Delay Testing}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700548}, doi = {10.1109/TEST.2008.4700548}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuDW08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuH08, author = {Weixin Wu and Michael S. Hsiao}, editor = {Douglas Young and Nur A. Touba}, title = {SAT-based State Justification with Adaptive Mining of Invariants}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700567}, doi = {10.1109/TEST.2008.4700567}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/WuHWM08, author = {Meng{-}Fan Wu and Jiun{-}Lang Huang and Xiaoqing Wen and Kohei Miyase}, editor = {Douglas Young and Nur A. Touba}, title = {Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700584}, doi = {10.1109/TEST.2008.4700584}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/WuHWM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/X08, editor = {Douglas Young and Nur A. Touba}, title = {Overview of {IEEE} {P1450.6.2} Standard; Creating {CTL} Model For Memory Test and Repair}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700680}, doi = {10.1109/TEST.2008.4700680}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/X08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YamaguchiKSISU08, author = {Takahiro J. Yamaguchi and Masayuki Kawabata and Mani Soma and Masahiro Ishida and K. Sawami and Koichiro Uekusa}, editor = {Douglas Young and Nur A. Touba}, title = {A New Method for Measuring Aperture Jitter in {ADC} Output and Its Application to {ENOB} Testing}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700639}, doi = {10.1109/TEST.2008.4700639}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YamaguchiKSISU08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YangCDRP08, author = {Fan Yang and Sreejit Chakravarty and Narendra Devta{-}Prasanna and Sudhakar M. Reddy and Irith Pomeranz}, editor = {Douglas Young and Nur A. Touba}, title = {Detection of Internal Stuck-open Faults in Scan Chains}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700577}, doi = {10.1109/TEST.2008.4700577}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YangCDRP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YeWHL08, author = {Jing Ye and Fei Wang and Yu Hu and Xiaowei Li}, editor = {Douglas Young and Nur A. Touba}, title = {Diagnosis of Mask-Effect Multiple Timing Faults in Scan Chains}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700694}, doi = {10.1109/TEST.2008.4700694}, timestamp = {Mon, 22 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/YeWHL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YilmazCT08, author = {Mahmut Yilmaz and Krishnendu Chakrabarty and Mohammad Tehranipoor}, editor = {Douglas Young and Nur A. Touba}, title = {Interconnect-Aware and Layout-Oriented Test-Pattern Selection for Small-Delay Defects}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700627}, doi = {10.1109/TEST.2008.4700627}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YilmazCT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YuB08, author = {Xiaochun Yu and Ronald D. Blanton}, editor = {Douglas Young and Nur A. Touba}, title = {An Effective and Flexible Multiple Defect Diagnosis Methodology Using Error Propagation Analysis}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700595}, doi = {10.1109/TEST.2008.4700595}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YuB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/YuanX08, author = {Feng Yuan and Qiang Xu}, editor = {Douglas Young and Nur A. Touba}, title = {SoC Test Architecture Design and Optimization Considering Power Supply Noise Effects}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700620}, doi = {10.1109/TEST.2008.4700620}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/YuanX08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/itc/ZhaoXC08, author = {Yang Zhao and Tao Xu and Krishnendu Chakrabarty}, editor = {Douglas Young and Nur A. Touba}, title = {Built-in Self-Test and Fault Diagnosis for Lab-on-Chip Using Digital Microfluidic Logic Gates}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700635}, doi = {10.1109/TEST.2008.4700635}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/itc/ZhaoXC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/itc/2008, editor = {Douglas Young and Nur A. Touba}, title = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://ieeexplore.ieee.org/xpl/conhome/4690905/proceeding}, isbn = {978-1-4244-2403-0}, timestamp = {Wed, 16 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/itc/2008.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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