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@inproceedings{DBLP:conf/itc/AbdulrazzaqG00,
author = {Nabil M. Abdulrazzaq and
Sandeep K. Gupta},
title = {Test generation for path-delay faults in one-dimensional iterative
logic arrays},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {326--335},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894221},
doi = {10.1109/TEST.2000.894221},
timestamp = {Tue, 26 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/AbdulrazzaqG00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbrahamPSBP00,
author = {Jais Abraham and
Narayan Prasad and
Srinivasa Chakravarthy B. S. and
Ameet Bagwe and
Rubin A. Parekhji},
title = {A framework to evaluate test tradeoffs in embedded core based systems-case
study on TI's TMS320C27xx},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {417--425},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894233},
doi = {10.1109/TEST.2000.894233},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbrahamPSBP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbramoviciS00,
author = {Miron Abramovici and
Charles E. Stroud},
title = {DIST-based detection and diagnosis of multiple faults in FPGAs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {785--794},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894275},
doi = {10.1109/TEST.2000.894275},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbramoviciS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BarrCW00,
author = {Robert W. Barr and
Chen{-}Huan Chiang and
Edward L. Wallace},
title = {End-to-end testing for boards and systems using boundary scan},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {585--592},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894252},
doi = {10.1109/TEST.2000.894252},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BarrCW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bartenstein00,
author = {Thomas Bartenstein},
title = {Fault distinguishing pattern generation},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {820--828},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894285},
doi = {10.1109/TEST.2000.894285},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bartenstein00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BayraktarogluO00,
author = {Ismet Bayraktaroglu and
Alex Orailoglu},
title = {Deterministic partitioning techniques for fault diagnosis in scan-based
{BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {273--282},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894215},
doi = {10.1109/TEST.2000.894215},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BayraktarogluO00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BellDHP00,
author = {Martin Bell and
Givargis Danialy and
Michael C. Howells and
Stephen Pateras},
title = {Bridging the gap between embedded test and {ATE}},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {55--63},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894191},
doi = {10.1109/TEST.2000.894191},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BellDHP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BensoCCPRSZ00,
author = {Alfredo Benso and
Silvia Chiusano and
Stefano Di Carlo and
Paolo Prinetto and
Fabio Ricciato and
Maurizio Spadari and
Yervant Zorian},
title = {HD\({}^{\mbox{2}}\)BIST: a hierarchical framework for {BIST} scheduling,
data patterns delivering and diagnosis in SoCs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {892--901},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894300},
doi = {10.1109/TEST.2000.894300},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BensoCCPRSZ00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BensoCNPB00,
author = {Alfredo Benso and
Stefano Di Carlo and
Giorgio Di Natale and
Paolo Prinetto and
Monica Lobetti Bodoni},
title = {A programmable {BIST} architecture for clusters of multiple-port SRAMs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {557--566},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894249},
doi = {10.1109/TEST.2000.894249},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BensoCNPB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BensoCP00,
author = {Alfredo Benso and
Silvia Chiusano and
Paolo Prinetto},
title = {A software development kit for dependable applications in embedded
systems},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {170--178},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894204},
doi = {10.1109/TEST.2000.894204},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BensoCP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BerthelotFR00,
author = {David Berthelot and
Marie{-}Lise Flottes and
Bruno Rouzeyre},
title = {BISTing data paths at behavioral level},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {672--680},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894262},
doi = {10.1109/TEST.2000.894262},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BerthelotFR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrosaF00,
author = {Anna Maria Brosa and
Joan Figueras},
title = {Digital signature proposal for mixed-signal circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1041--1050},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894317},
doi = {10.1109/TEST.2000.894317},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrosaF00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BrozAR00,
author = {Jerry J. Broz and
James C. Andersen and
Reynaldo M. Rincon},
title = {Reducing device yield fallout at wafer level test with electrohydrodynamic
{(EHD)} cleaning},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {477--484},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894240},
doi = {10.1109/TEST.2000.894240},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BrozAR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ButlerKPSS00,
author = {Robert Butler and
Brion L. Keller and
Sarala Paliwal and
Richard Schoonover and
Joseph Swenton},
title = {Design and implementation of a parallel automatic test pattern generation
algorithm with low test vector count},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {530--537},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894246},
doi = {10.1109/TEST.2000.894246},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ButlerKPSS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CaiWRM00,
author = {Yongming Cai and
T. P. Warwick and
Sunil G. Rane and
E. Masserrat},
title = {Digital serial communication device testing and its implications on
automatic test equipment architecture},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {600--609},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894254},
doi = {10.1109/TEST.2000.894254},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CaiWRM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CherubalC00,
author = {Sasikumar Cherubal and
Abhijit Chatterjee},
title = {Optimal {INL/DNL} testing of {A/D} converters using a linear model},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {358--366},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894225},
doi = {10.1109/TEST.2000.894225},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CherubalC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChiusanoPW00,
author = {Silvia Chiusano and
Paolo Prinetto and
Hans{-}Joachim Wunderlich},
title = {Non-intrusive {BIST} for systems-on-a-chip},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {644--651},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894259},
doi = {10.1109/TEST.2000.894259},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChiusanoPW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CogswellPST00,
author = {Michael Cogswell and
Don Pearl and
James Sage and
Alan Troidl},
title = {Test structure verification of logical {BIST:} problems and solutions},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {123--130},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894199},
doi = {10.1109/TEST.2000.894199},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CogswellPST00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Costa00,
author = {Cristo da Costa},
title = {Hardware for production test of {RFID} interface embedded into chips
for smart cards and labels used in contactless applications},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {485--491},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894241},
doi = {10.1109/TEST.2000.894241},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Costa00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DaaschMBC00,
author = {W. Robert Daasch and
James McNames and
Daniel Bockelman and
Kevin Cota},
title = {Variance reduction using wafer patterns in I{\_}ddQ data},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {189--198},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894206},
doi = {10.1109/TEST.2000.894206},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DaaschMBC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DasT00,
author = {Debaleena Das and
Nur A. Touba},
title = {Reducing test data volume using external/LBIST hybrid test patterns},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {115--122},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894198},
doi = {10.1109/TEST.2000.894198},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DasT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DebB00,
author = {Nilmoni Deb and
Ronald D. Blanton},
title = {Analysis of failure sources in surface-micromachined {MEMS}},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {739--749},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894270},
doi = {10.1109/TEST.2000.894270},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DebB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Derere00,
author = {L. Derere},
title = {Case-based reasoning: diagnosis of faults in complex systems through
reuse of experience},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {27--34},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894147},
doi = {10.1109/TEST.2000.894147},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Derere00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DesineniDB00,
author = {Rao Desineni and
Kumar N. Dwarakanath and
Ronald D. Blanton},
title = {Universal test generation using fault tuples},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {812--819},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894283},
doi = {10.1109/TEST.2000.894283},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DesineniDB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DinhR00,
author = {Dieu Van Dinh and
Virginia Rabitoy},
title = {An approach to testing 200 ps echo clock to output timing on the double
data rate synchronous memory},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {610--618},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894255},
doi = {10.1109/TEST.2000.894255},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DinhR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DworakGLWM00,
author = {Jennifer Dworak and
Michael R. Grimaila and
Sooryong Lee and
Li{-}C. Wang and
M. Ray Mercer},
title = {Enhanced {DO-RE-ME} based defect level prediction using defect site
aggregation-MPG-D},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {930--939},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894304},
doi = {10.1109/TEST.2000.894304},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DworakGLWM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EilesWLX00,
author = {Travis M. Eiles and
Keneth R. Wilsher and
William K. Lo and
G. Xiao},
title = {Optical interferometric probing of advanced microprocessors},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {80--84},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894194},
doi = {10.1109/TEST.2000.894194},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EilesWLX00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Fernandez-GomezRM00,
author = {Santiago Fern{\'{a}}ndez{-}Gomez and
Juan J. Rodr{\'{\i}}guez{-}Andina and
Enrique Mandado},
title = {Concurrent error detection in block ciphers},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {979--984},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894310},
doi = {10.1109/TEST.2000.894310},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Fernandez-GomezRM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GeuzebroekLG00,
author = {M. J. Geuzebroek and
J. Th. van der Linden and
Ad J. van de Goor},
title = {Test point insertion for compact test sets},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {292--301},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894217},
doi = {10.1109/TEST.2000.894217},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GeuzebroekLG00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GirardLGP00,
author = {Patrick Girard and
Christian Landrault and
Lo{\"{\i}}s Guiller and
Serge Pravossoudovitch},
title = {Low power {BIST} design by hypergraph partitioning: methodology and
architectures},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {652--661},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894260},
doi = {10.1109/TEST.2000.894260},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GirardLGP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Golshan00,
author = {Farideh Golshan},
title = {Test and on-line debug capabilities of {IEEE} Std 1149.1 in UltraSPARC-III
microprocessor},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {141--150},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894201},
doi = {10.1109/TEST.2000.894201},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Golshan00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoorPA00,
author = {Ad J. van de Goor and
A. Paalvast},
title = {Industrial evaluation of {DRAM} {SIMM} tests},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {426--435},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894234},
doi = {10.1109/TEST.2000.894234},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoorPA00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HafedAR00,
author = {Mohamed M. Hafed and
Nazmy Abaskharoun and
Gordon W. Roberts},
title = {A stand-alone integrated test core for time and frequency domain measurements},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1031--1040},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894316},
doi = {10.1109/TEST.2000.894316},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HafedAR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HarrisonCN00,
author = {Stephen Harrison and
Peter Collins and
Greg Noeninckx},
title = {The implementation of {IEEE} Std 1149.1 boundary scan test strategy
within a cellular infrastructure production environment},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {45--54},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894190},
doi = {10.1109/TEST.2000.894190},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HarrisonCN00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HellebrandWL00,
author = {Sybille Hellebrand and
Hans{-}Joachim Wunderlich and
Huaguo Liang},
title = {A mixed mode {BIST} scheme based on reseeding of folding counters},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {778--784},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894274},
doi = {10.1109/TEST.2000.894274},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HellebrandWL00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HigginsL00,
author = {Peter M. Higgins and
Jim Lampos},
title = {Microwave test mismatch and power de-embedding},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {950--954},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894306},
doi = {10.1109/TEST.2000.894306},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HigginsL00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangC00,
author = {Jiun{-}Lang Huang and
Kwang{-}Ting Cheng},
title = {Testing and characterization of the one-bit first-order delta-sigma
modulator for on-chip analog signal analysis},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1021--1030},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894315},
doi = {10.1109/TEST.2000.894315},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HuangYTC00,
author = {Chung{-}Yang Huang and
Bwolen Yang and
Huan{-}Chih Tsai and
Kwang{-}Ting Cheng},
title = {Static property checking using {ATPG} vs. {BDD} techniques},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {309--316},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894219},
doi = {10.1109/TEST.2000.894219},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HuangYTC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jacobson00,
author = {Neil G. Jacobson},
title = {Streamlining programmable device and system test using {IEEE} Std
1532},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {847--853},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894290},
doi = {10.1109/TEST.2000.894290},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Jacobson00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Johnson00,
author = {Gerald H. Johnson},
title = {Challenges of high supply currents during {VLSI} test},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1013--1020},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894314},
doi = {10.1109/TEST.2000.894314},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Johnson00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JongKS00,
author = {Frans G. M. de Jong and
Ben Kup and
Rodger Schuttert},
title = {Power pin testing: making the test coverage complete},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {575--584},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894251},
doi = {10.1109/TEST.2000.894251},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JongKS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KarriW00,
author = {Ramesh Karri and
Kaijie Wu},
title = {Algorithm level re-computing with shifted operands-a register transfer
level concurrent error detection technique},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {971--978},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894309},
doi = {10.1109/TEST.2000.894309},
timestamp = {Sun, 12 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KarriW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KatzR00,
author = {Jerry Katz and
Rochit Rajsuman},
title = {A new paradigm in test for the next millennium},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {468--476},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894239},
doi = {10.1109/TEST.2000.894239},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KatzR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KavousianosBN00,
author = {Xrysovalantis Kavousianos and
Dimitris Bakalis and
Dimitris Nikolos},
title = {Test response compaction by an accumulator behaving as a multiple
input non-linear feedback shift register},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {804--811},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894277},
doi = {10.1109/TEST.2000.894277},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KavousianosBN00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KawagoeONOHH00,
author = {Tomoya Kawagoe and
Jun Ohtani and
Mitsutaka Niiro and
Tukasa Ooishi and
Mitsuhiro Hamada and
Hideto Hidaka},
title = {A built-in self-repair analyzer {(CRESTA)} for embedded DRAMs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {567--574},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894250},
doi = {10.1109/TEST.2000.894250},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KawagoeONOHH00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Keahey00,
author = {Julia A. Keahey},
title = {Programming of flash with {ICT} rights and responsibilities},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {711--717},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894266},
doi = {10.1109/TEST.2000.894266},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Keahey00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KeshavarziRHSSD00,
author = {Ali Keshavarzi and
Kaushik Roy and
Charles F. Hawkins and
Manoj Sachdev and
Krishnamurthy Soumyanath and
Vivek De},
title = {Multiple-parameter {CMOS} {IC} testing with increased sensitivity
for I{\_}DDQ},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1051--1059},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894318},
doi = {10.1109/TEST.2000.894318},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KeshavarziRHSSD00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KieferWVM00,
author = {Gundolf Kiefer and
Hans{-}Joachim Wunderlich and
Harald P. E. Vranken and
Erik Jan Marinissen},
title = {Application of deterministic logic {BIST} on industrial circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {105--114},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894197},
doi = {10.1109/TEST.2000.894197},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KieferWVM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KimCV00,
author = {Seonki Kim and
Sreejit Chakravarty and
Bapiraju Vinnakota},
title = {An analysis of the delay defect detection capability of the {ECR}
test method},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1060--1069},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894319},
doi = {10.1109/TEST.2000.894319},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KimCV00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KinraBTC00,
author = {Anjali Kinra and
Hari Balachandran and
Regy Thomas and
John Carulli},
title = {Logic mapping on a microprocessor},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {701--710},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894265},
doi = {10.1109/TEST.2000.894265},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KinraBTC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kittross00,
author = {Andy Kittross},
title = {Easy mixed signal test creation with test elements and procedures},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {72--79},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894193},
doi = {10.1109/TEST.2000.894193},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kittross00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Konuk00,
author = {Haluk Konuk},
title = {On invalidation mechanisms for non-robust delay tests},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {393--399},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894230},
doi = {10.1109/TEST.2000.894230},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Konuk00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KunduB00,
author = {Rahul Kundu and
Ronald D. Blanton},
title = {Identification of crosstalk switch failures in domino {CMOS} circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {502--509},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894243},
doi = {10.1109/TEST.2000.894243},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KunduB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KuyelT00,
author = {Turker Kuyel and
Frank (Ching{-}Yuh) Tsay},
title = {Optimal analog trim techniques for improving the linearity of pipeline
ADCs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {367--375},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894226},
doi = {10.1109/TEST.2000.894226},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KuyelT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LaiKC00,
author = {Wei{-}Cheng Lai and
Angela Krstic and
Kwang{-}Ting Cheng},
title = {Test program synthesis for path delay faults in microprocessor cores},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1080--1089},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894321},
doi = {10.1109/TEST.2000.894321},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LaiKC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LangPM00,
author = {Helmut Lang and
Jens Pfeiffer and
Jeff Maguire},
title = {Using on-chip test pattern compression for full scan SoC designs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {638--643},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894258},
doi = {10.1109/TEST.2000.894258},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LangPM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lavo00,
author = {David B. Lavo},
title = {A good excuse for reuse: "open" {TAP} controller design},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1090--1099},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894322},
doi = {10.1109/TEST.2000.894322},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lavo00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LiM00,
author = {Chien{-}Mo James Li and
Edward J. McCluskey},
title = {Testing for tunneling opens},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {85--94},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894195},
doi = {10.1109/TEST.2000.894195},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LiM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaedaK00,
author = {Toshiyuki Maeda and
Kozo Kinoshita},
title = {Precise test generation for resistive bridging faults of {CMOS} combinational
circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {510--519},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894244},
doi = {10.1109/TEST.2000.894244},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaedaK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MatthesF00,
author = {Doug Matthes and
John Ford},
title = {Technique for testing a very high speed mixed signal read channel
design},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {965--970},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894308},
doi = {10.1109/TEST.2000.894308},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MatthesF00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellHB00,
author = {Peter C. Maxwell and
Ismed Hartanto and
Lee Bentz},
title = {Comparing functional and structural tests},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {400--407},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894231},
doi = {10.1109/TEST.2000.894231},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellHB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellOADJQW00,
author = {Peter C. Maxwell and
Pete O'Neill and
Robert C. Aitken and
Ronald Dudley and
Neal Jaarsma and
Minh Quach and
Don Wiseman},
title = {Current ratios: a self-scaling technique for production {IDDQ} testing},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1148--1156},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894324},
doi = {10.1109/TEST.2000.894324},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellOADJQW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MaxwellR00,
author = {Peter C. Maxwell and
Jeff Rearick},
title = {Deception by design: fooling ourselves with gate-level models},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {921--929},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894303},
doi = {10.1109/TEST.2000.894303},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MaxwellR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McClintockCP00,
author = {David McClintock and
Lance Cunningham and
Takis Petropoulos},
title = {Motherboard testing using the {PCI} bus},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {593--599},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894253},
doi = {10.1109/TEST.2000.894253},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McClintockCP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskeyT00,
author = {Edward J. McCluskey and
Chao{-}Wen Tseng},
title = {Stuck-fault tests vs. actual defects},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {336--343},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894222},
doi = {10.1109/TEST.2000.894222},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskeyT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McLaurinF00,
author = {Teresa L. McLaurin and
Frank Frederick},
title = {The testability features of the {MCF5407} containing the 4th generation
ColdFire(R) microprocessor core},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {151--159},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894202},
doi = {10.1109/TEST.2000.894202},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McLaurinF00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McLaurinP00,
author = {Teresa L. McLaurin and
John C. Potter},
title = {On-the-shelf core pattern methodology for ColdFire(R) microprocessor
cores},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1100--1107},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894323},
doi = {10.1109/TEST.2000.894323},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McLaurinP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MitraM00,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Combinational logic synthesis for diversity in duplex systems},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {179--188},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894205},
doi = {10.1109/TEST.2000.894205},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MitraM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MitraM00a,
author = {Subhasish Mitra and
Edward J. McCluskey},
title = {Which concurrent error detection scheme to choose ?},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {985--994},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894311},
doi = {10.1109/TEST.2000.894311},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MitraM00a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MooreGBL00,
author = {Will R. Moore and
Guido Gronthoud and
Keith Baker and
Maurice Lousberg},
title = {Delay-fault testing and defects in deep sub-micron ICs-does critical
resistance really mean anything?},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {95--104},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894196},
doi = {10.1109/TEST.2000.894196},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MooreGBL00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MurakamiKSPR00,
author = {Atsushi Murakami and
Seiji Kajihara and
Tsutomu Sasao and
Irith Pomeranz and
Sudhakar M. Reddy},
title = {Selection of potentially testable path delay faults for test generation},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {376--384},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894227},
doi = {10.1109/TEST.2000.894227},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MurakamiKSPR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuresanWMV00,
author = {Valentin Muresan and
Xiaojun Wang and
Valentina Muresan and
Mircea Vladutiu},
title = {A comparison of classical scheduling approaches in power-constrained
block-test scheduling},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {882--891},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894299},
doi = {10.1109/TEST.2000.894299},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MuresanWMV00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NicoliciA00,
author = {Nicola Nicolici and
Bashir M. Al{-}Hashimi},
title = {Power conscious test synthesis and scheduling for {BIST} {RTL} data
paths},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {662--671},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894261},
doi = {10.1109/TEST.2000.894261},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NicoliciA00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NighG00,
author = {Phil Nigh and
Anne E. Gattiker},
title = {Test method evaluation experiments and data},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {454--463},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894237},
doi = {10.1109/TEST.2000.894237},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NighG00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NouraniP00,
author = {Mehrdad Nourani and
Christos A. Papachristou},
title = {An {ILP} formulation to optimize test access mechanism in system-on-chip
testing},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {902--910},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894301},
doi = {10.1109/TEST.2000.894301},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NouraniP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Oakland00,
author = {Steven F. Oakland},
title = {Considerations for implementing {IEEE} 1149.1 on system-on-a-chip
integrated circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {628--637},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894257},
doi = {10.1109/TEST.2000.894257},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Oakland00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Okuda00,
author = {Yukio Okuda},
title = {{DECOUPLE:} defect current detection in deep submicron I{\_}DDQ},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {199--206},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894207},
doi = {10.1109/TEST.2000.894207},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Okuda00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PantC00,
author = {Pankaj Pant and
Abhijit Chatterjee},
title = {Path-delay fault diagnosis in non-scan sequential circuits with at-speed
test application},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {245--252},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894212},
doi = {10.1109/TEST.2000.894212},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PantC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Parker00,
author = {Kenneth P. Parker},
title = {System issues in boundary-scan board test},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {724--728},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894268},
doi = {10.1109/TEST.2000.894268},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Parker00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Parnas00,
author = {Bruce R. Parnas},
title = {Doing it in {STIL:} intelligent conversion from {STIL} to an {ATE}
format},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {64--71},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894192},
doi = {10.1109/TEST.2000.894192},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Parnas00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PengAS00,
author = {Qiang Peng and
Miron Abramovici and
Jacob Savir},
title = {{MUST:} multiple-stem analysis for identifying sequentially untestable
faults},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {839--846},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894288},
doi = {10.1109/TEST.2000.894288},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PengAS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pillkahn00,
author = {Ulf Pillkahn},
title = {Structural test in a board self test environment},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1005--1012},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894313},
doi = {10.1109/TEST.2000.894313},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pillkahn00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PiloHHLM00,
author = {Harold Pilo and
Stu Hall and
Patrick Hansen and
Steve Lamphier and
Chris Murphy},
title = {Design-for-test methods for stand-alone SRAMs at 1 Gb/s/pin and beyond},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {436--443},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894235},
doi = {10.1109/TEST.2000.894235},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PiloHHLM00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PlusquellicGHSC00,
author = {James F. Plusquellic and
Amy Germida and
Jonathan Hudson and
Ernesto Staroswiecki and
Chintan Patel},
title = {Predicting device performance from pass/fail transient signal analysis
data},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {1070--1079},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894320},
doi = {10.1109/TEST.2000.894320},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PlusquellicGHSC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PouyaC00,
author = {Bahram Pouya and
Alfred L. Crouch},
title = {Optimization trade-offs for vector volume and test power},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {873--881},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894298},
doi = {10.1109/TEST.2000.894298},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PouyaC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/PriviteraWS00,
author = {John Privitera and
Steven Woo and
Craig Soldat},
title = {Pattern generation tools for the development of memory core test patterns
for Rambus devices},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {444--453},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894236},
doi = {10.1109/TEST.2000.894236},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/PriviteraWS00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RainaBBKMPR00,
author = {Rajesh Raina and
Robert Bailey and
Dawit Belete and
Vikram Khosa and
Robert F. Molyneaux and
Javier Prado and
Ashutosh Razdan},
title = {{DFT} advances in Motorola's Next-Generation 74xx PowerPC\({}^{\mbox{TM}}\)
microprocessor},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {131--140},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894200},
doi = {10.1109/TEST.2000.894200},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RainaBBKMPR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RaviLJ00,
author = {Srivaths Ravi and
Ganesh Lakshminarayana and
Niraj K. Jha},
title = {: Reducing test application time in high-level test generation},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {829--838},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894286},
doi = {10.1109/TEST.2000.894286},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RaviLJ00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ReddyPKMTO00,
author = {Sudhakar M. Reddy and
Irith Pomeranz and
Seiji Kajihara and
Atsushi Murakami and
Sadami Takeoka and
Mitsuyasu Ohta},
title = {On validating data hold times for flip-flops in sequential circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {317--325},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894220},
doi = {10.1109/TEST.2000.894220},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ReddyPKMTO00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RenovellZ00,
author = {Michel Renovell and
Yervant Zorian},
title = {Different experiments in test generation for {XILINX} FPGAs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {854--862},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894292},
doi = {10.1109/TEST.2000.894292},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RenovellZ00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Richmond00,
author = {Ronald A. Richmond},
title = {Successful implementation of structured testing},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {344--348},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894223},
doi = {10.1109/TEST.2000.894223},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Richmond00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rodgers00,
author = {Mike Rodgers},
title = {Defect screening challenges in the Gigahertz/Nanometer age: keeping
up with the tails of defect behaviors},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {464--467},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894238},
doi = {10.1109/TEST.2000.894238},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rodgers00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RossWG00,
author = {Don E. Ross and
Tim Wood and
Grady Giles},
title = {Conversion of small functional test sets of nonscan blocks to scan
patterns},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {691--700},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894264},
doi = {10.1109/TEST.2000.894264},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RossWG00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RoyGC00,
author = {Subrata Roy and
Gokhan Guner and
Kwang{-}Ting Cheng},
title = {Efficient test mode selection and insertion for {RTL-BIST}},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {263--272},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894214},
doi = {10.1109/TEST.2000.894214},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RoyGC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SartoriW00,
author = {Luca Sartori and
Burnell G. West},
title = {The path to one-picosecond accuracy},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {619--627},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894256},
doi = {10.1109/TEST.2000.894256},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SartoriW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SatoINN00,
author = {Yasuo Sato and
Toyohito Ikeya and
Michinobu Nakao and
Takaharu Nagumo},
title = {A {BIST} approach for very deep sub-micron {(VDSM)} defects},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {283--291},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894216},
doi = {10.1109/TEST.2000.894216},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SatoINN00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Savir00,
author = {Jacob Savir},
title = {On-line and off-line test of airborne digital systems: a reliability
study},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {35--44},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894148},
doi = {10.1109/TEST.2000.894148},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Savir00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SaxenaB00,
author = {Jayashree Saxena and
Kenneth M. Butler},
title = {An empirical study on the effects of test type ordering on overall
test efficiency},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {408--416},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894232},
doi = {10.1109/TEST.2000.894232},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SaxenaB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Scheiber00,
author = {Stephen F. Scheiber},
title = {It isn't just testing anymore {(REDUX)}},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {718--723},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894267},
doi = {10.1109/TEST.2000.894267},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Scheiber00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SchoettmerWB00,
author = {Ulrich Schoettmer and
Chris Wagner and
Tom Bleakley},
title = {Device interfacing: the weakest link in the chain to break into the
giga bit domain?},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {995--1004},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894312},
doi = {10.1109/TEST.2000.894312},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SchoettmerWB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SharmaP00,
author = {Manish Sharma and
Janak H. Patel},
title = {Enhanced delay defect coverage with path-segments},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {385--392},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894228},
doi = {10.1109/TEST.2000.894228},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SharmaP00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShigetaI00,
author = {Kazuki Shigeta and
Toshio Ishiyama},
title = {An improved fault diagnosis algorithm based on path tracing with dynamic
circuit extraction},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {235--244},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894211},
doi = {10.1109/TEST.2000.894211},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShigetaI00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StanojevicBWLSB00,
author = {Zoran Stanojevic and
Hari Balachandran and
D. M. H. Walker and
Fred Lakbani and
Jayashree Saxena and
Kenneth M. Butler},
title = {Computer-aided fault to defect mapping {(CAFDM)} for defect diagnosis},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {729--738},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894269},
doi = {10.1109/TEST.2000.894269},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StanojevicBWLSB00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StroudEBCN00,
author = {Charles E. Stroud and
John Marty Emmert and
John R. Bailey and
Khushru S. Chhor and
Dragan Nikolic},
title = {Bridging fault extraction from physical design data for manufacturing
test development},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {760--769},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894272},
doi = {10.1109/TEST.2000.894272},
timestamp = {Thu, 27 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/StroudEBCN00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SunXCT00,
author = {Xiaoling Sun and
Jian Xu and
Ben Chan and
Pieter M. Trouborst},
title = {Novel technique for built-in self-test of {FPGA} interconnects},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {795--803},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894276},
doi = {10.1109/TEST.2000.894276},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SunXCT00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ThakerAZ00,
author = {Pradip A. Thaker and
Vishwani D. Agrawal and
Mona E. Zaghloul},
title = {Register-transfer level fault modeling and test evaluation techniques
for {VLSI} circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {940--949},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894305},
doi = {10.1109/TEST.2000.894305},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ThakerAZ00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Thibeault00,
author = {Claude Thibeault},
title = {Improving Delta-I{\_}DDQ-based test methods},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {207--216},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894208},
doi = {10.1109/TEST.2000.894208},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Thibeault00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Variyam00,
author = {Pramodchandran N. Variyam},
title = {Increasing the {IDDQ} test resolution using current prediction},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {217--224},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894209},
doi = {10.1109/TEST.2000.894209},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Variyam00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VariyamA00,
author = {Pramodchandran N. Variyam and
Vinay Agrawal},
title = {Measuring code edges of ADCs using interpolation and its application
to offset and gain error testing},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {349--357},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894224},
doi = {10.1109/TEST.2000.894224},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VariyamA00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VenkataramanD00,
author = {Srikanth Venkataraman and
Scott Brady Drummonds},
title = {{POIROT:} a logic fault diagnosis tool and its applications},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {253--262},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894213},
doi = {10.1109/TEST.2000.894213},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VenkataramanD00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WeissSME00,
author = {Mark W. Weiss and
Sharad C. Seth and
Shashank K. Mehta and
Kent L. Einspahr},
title = {Exploiting don't cares to enhance functional tests},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {538--546},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894247},
doi = {10.1109/TEST.2000.894247},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WeissSME00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Whetsel00,
author = {Lee Whetsel},
title = {Adapting scan architectures for low power operation},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {863--872},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894297},
doi = {10.1109/TEST.2000.894297},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Whetsel00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WohlW00,
author = {Peter Wohl and
John A. Waicukauski},
title = {Optimizing the flattened test-generation model for very large designs},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {681--690},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894263},
doi = {10.1109/TEST.2000.894263},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WohlW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/XiangXF00,
author = {Dong Xiang and
Yi Xu and
Hideo Fujiwara},
title = {Non-scan design for testability for synchronous sequential circuits
based on conflict analysis},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {520--529},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894245},
doi = {10.1109/TEST.2000.894245},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/XiangXF00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YamaguchiSHNRIW00,
author = {Takahiro J. Yamaguchi and
Mani Soma and
David Halter and
Jim Nissen and
Rajesh Raina and
Masahiro Ishida and
Toshifumi Watanabe},
title = {Jitter measurements of a PowerPC\({}^{\mbox{TM}}\) microprocessor
using an analytic signal method},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {955--964},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894307},
doi = {10.1109/TEST.2000.894307},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YamaguchiSHNRIW00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YangMC00,
author = {Zan Yang and
Byeong Min and
Gwan Choi},
title = {Si-emulation: system verification using simulation and emulation},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {160--169},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894203},
doi = {10.1109/TEST.2000.894203},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YangMC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YuWR00,
author = {Xiaoming Yu and
Jue Wu and
Elizabeth M. Rudnick},
title = {Diagnostic test generation for sequential circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {225--234},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894210},
doi = {10.1109/TEST.2000.894210},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YuWR00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZachariahC00,
author = {Sujit T. Zachariah and
Sreejit Chakravarty},
title = {A scalable and efficient methodology to extract two node bridges from
large industrial circuits},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {750--759},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894271},
doi = {10.1109/TEST.2000.894271},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZachariahC00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZarrinehAEG00,
author = {Kamran Zarrineh and
R. Dean Adams and
Thomas J. Eckenrode and
Steven P. Gregor},
title = {Self test architecture for testing complex memory structures},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {547--556},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894248},
doi = {10.1109/TEST.2000.894248},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZarrinehAEG00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhangH00,
author = {Qiushuang Zhang and
Ian G. Harris},
title = {A domain coverage metric for the validation of behavioral {VHDL} descriptions},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {302--308},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894218},
doi = {10.1109/TEST.2000.894218},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhangH00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZhaoD00,
author = {Yi Zhao and
Sujit Dey},
title = {Analysis of interconnect crosstalk defect coverage of test sets},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {492--501},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894242},
doi = {10.1109/TEST.2000.894242},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZhaoD00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianMK00,
author = {Yervant Zorian and
Erik Jan Marinissen and
Rohit Kapur},
title = {On using {IEEE} {P1500} {SECT} for test plug-n-play},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {770--777},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894273},
doi = {10.1109/TEST.2000.894273},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianMK00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ZorianMLG00,
author = {Yervant Zorian and
Erik Jan Marinissen and
Maurice Lousberg and
Sandeep Kumar Goel},
title = {Wrapper design for embedded core test},
booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
pages = {911--920},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://doi.org/10.1109/TEST.2000.894302},
doi = {10.1109/TEST.2000.894302},
timestamp = {Thu, 23 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ZorianMLG00.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2000,
title = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
NJ, USA, October 2000},
publisher = {{IEEE} Computer Society},
year = {2000},
url = {https://ieeexplore.ieee.org/xpl/conhome/7183/proceeding},
isbn = {0-7803-6546-1},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/2000.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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