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@inproceedings{DBLP:conf/irps/0005KCSSPRL21,
author = {Hai Jiang and
Jinju Kim and
Kihyun Choi and
Hyewon Shim and
Hyunchul Sagong and
Junekyun Park and
Hwasung Rhee and
Euncheol Lee},
title = {Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime
Reliability Prediction},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405129},
doi = {10.1109/IRPS46558.2021.9405129},
timestamp = {Wed, 05 May 2021 11:53:21 +0200},
biburl = {https://dblp.org/rec/conf/irps/0005KCSSPRL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/AcurioTJBD21,
author = {Eliana Acurio and
Lionel Trojman and
Brice De Jaeger and
Benoit Bakeroot and
Stefaan Decoutere},
title = {ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs.
Al2O3/SiO2 {GET} dielectric},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405163},
doi = {10.1109/IRPS46558.2021.9405163},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/AcurioTJBD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/AhnNCYC21,
author = {Jae{-}Gyung Ahn and
Rhesa Nathanael and
I{-}Ru Chen and
Ping{-}Chin Yeh and
Jonathan Chang},
title = {Product Lifetime Estimation in 7nm with Large data of Failure Rate
and Si-Based Thermal Coupling Model},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405193},
doi = {10.1109/IRPS46558.2021.9405193},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/AhnNCYC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ArunachalamBRRK21,
author = {Balraj Arunachalam and
Jean{-}Emmanuel Broquin and
Quentin Rafhay and
David Roy and
Anne Kaminski},
title = {Simulation Study of the Origin of Ge High Speed Photodetector Degradation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405211},
doi = {10.1109/IRPS46558.2021.9405211},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ArunachalamBRRK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BeekRKKOCYCCSJC21,
author = {Simon Van Beek and
Siddharth Rao and
Shreya Kundu and
Woojin Kim and
Barry J. O'Sullivan and
Stefan Cosemans and
Farrukh Yasin and
Robert Carpenter and
Sebastien Couet and
Shamin H. Sharifi and
Nico Jossart and
Davide Crotti and
Gouri Sankar Kar},
title = {Edge-induced reliability {\&} performance degradation in {STT-MRAM:}
an etch engineering solution},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405209},
doi = {10.1109/IRPS46558.2021.9405209},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BeekRKKOCYCCSJC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BerensA21,
author = {Judith Berens and
Thomas Aichinger},
title = {A straightforward electrical method to determine screening capability
of {GOX} extrinsics in arbitrary, commercially available SiC MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405152},
doi = {10.1109/IRPS46558.2021.9405152},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BerensA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BruceSBCKNMPLBG21,
author = {Robert L. Bruce and
Syed Ghazi Sarwat and
Irem Boybat and
Cheng{-}Wei Cheng and
Wanki Kim and
S. R. Nandakumar and
Charles Mackin and
Timothy Philip and
Zuoguang Liu and
Kevin Brew and
Nanbo Gong and
Injo Ok and
Praneet Adusumilli and
Katie Spoon and
Stefano Ambrogio and
Benedikt Kersting and
Thomas Bohnstingl and
Manuel Le Gallo and
Andrew Simon and
Ning Li and
Iqbal Saraf and
Jin{-}Ping Han and
Lynne M. Gignac and
John M. Papalia and
Tenko Yamashita and
Nicole Saulnier and
Geoffrey W. Burr and
Hsinyu Tsai and
Abu Sebastian and
Vijay Narayanan and
Matthew BrightSky},
title = {Mushroom-Type phase change memory with projection liner: An array-level
demonstration of conductance drift and noise mitigation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405191},
doi = {10.1109/IRPS46558.2021.9405191},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BruceSBCKNMPLBG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/BuddhanoySR21,
author = {Matchima Buddhanoy and
Sadman Sakib and
Biswajit Ray},
title = {Runtime Variability Monitor for Data Retention Characteristics of
Commercial {NAND} Flash Memory},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405143},
doi = {10.1109/IRPS46558.2021.9405143},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/BuddhanoySR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CachoAF21,
author = {Florian Cacho and
Lorena Anghel and
Xavier Federspiel},
title = {Monitoring Setup and Hold Timing Limits},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405175},
doi = {10.1109/IRPS46558.2021.9405175},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/CachoAF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChangKHJMSZHPCA21,
author = {Yao{-}Feng Chang and
Ilya Karpov and
Reed Hopkins and
David Janosky and
Jacob Medeiros and
Benjamin Sherrill and
Jiahan Zhang and
Yifu Huang and
Tanmoy Pramanik and
Albert B. Chen and
Tony Acosta and
Abdullah Guler and
James A. O'Donnell and
Pedro A. Quintero and
Nathan Strutt and
Oleg Golonzka and
Chris Connor and
Jack C. Lee and
Jeffrey Hicks},
title = {Embedded emerging memory technologies for neuromorphic computing:
temperature instability and reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405120},
doi = {10.1109/IRPS46558.2021.9405120},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChangKHJMSZHPCA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChangZYJLSYW21,
author = {Hao Chang and
Longda Zhou and
Hong Yang and
Zhigang Ji and
Qianqian Liu and
Eddy Simoen and
Huaxiang Yin and
Wenwu Wang},
title = {Comparative Study on the Energy Distribution of Defects under {HCD}
and {NBTI} in Short Channel p-FinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405162},
doi = {10.1109/IRPS46558.2021.9405162},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ChangZYJLSYW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChatterjeeOMXT21,
author = {Neel Chatterjee and
John Ortega and
Inanc Meric and
Peng Xiao and
Ilan Tsameret},
title = {Machine Learning On Transistor Aging Data: Test Time Reduction and
Modeling for Novel Devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--9},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405188},
doi = {10.1109/IRPS46558.2021.9405188},
timestamp = {Fri, 01 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ChatterjeeOMXT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChenKFSOKO21,
author = {Zhwen Chen and
Young{-}Suk Kim and
Tadashi Fukuda and
Koji Sakui and
Takayuki Ohba and
Tatsuji Kobayashi and
Takashi Obara},
title = {Reliability of Wafer-Level Ultra-Thinning down to 3 {\(\mathrm{\mu}\)}m
using 20 nm-Node DRAMs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405125},
doi = {10.1109/IRPS46558.2021.9405125},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChenKFSOKO21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChenLNBLK21,
author = {Chao{-}Yang Chen and
Jian{-}Hsing Lee and
Karuna Nidhi and
Tzer{-}Yaa Bin and
Geeng{-}Lih Lin and
Ming{-}Dou Ker},
title = {Study on the Guard Rings for Latchup Prevention between {HV-PMOS}
and {LV-PMOS} in a 0.15-{\(\mathrm{\mu}\)}m {BCD} Process},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405113},
doi = {10.1109/IRPS46558.2021.9405113},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChenLNBLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChiocchettaCSSR21,
author = {Francesca Chiocchetta and
Claudia Calascione and
Carlo De Santi and
Chandan Sharma and
Fabiana Rampazzo and
Xun Zheng and
Brian Romanczyk and
Matthew Guidry and
Haoran Li and
Stacia Keller and
Umesh K. Mishra and
Gaudenzio Meneghesso and
Matteo Meneghini and
Enrico Zanoni},
title = {Role of the AlGaN Cap Layer on the Trapping Behaviour of N-Polar GaN
MISHEMTs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--2},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405111},
doi = {10.1109/IRPS46558.2021.9405111},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChiocchettaCSSR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ChoudhurySTZSWM21,
author = {Nilotpal Choudhury and
Tarun Samadder and
Ravi Tiwari and
Huimei Zhou and
Richard G. Southwick and
Miaomiao Wang and
Souvik Mahapatra},
title = {Analysis of Sheet Dimension (W, {L)} Dependence of {NBTI} in {GAA-SNS}
FETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405137},
doi = {10.1109/IRPS46558.2021.9405137},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ChoudhurySTZSWM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CiappaP21,
author = {Mauro Ciappa and
Marco Pocaterra},
title = {Assessing the pre-breakdown carriers' multiplication in SiC power
MOSFETs by soft gamma radiation and its correlation to the Terrestrial
Cosmic Rays failure rate data as measured by neutron irradiation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405205},
doi = {10.1109/IRPS46558.2021.9405205},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/CiappaP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/CioniBMVPC21,
author = {Marcello Cioni and
Alessandro Bertacchini and
Alessandro Mucci and
Giovanni Verzellesi and
Paolo Pavan and
Alessandro Chini},
title = {Investigation on {VTH} and {RON} Slow/Fast Drifts in SiC MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405231},
doi = {10.1109/IRPS46558.2021.9405231},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/CioniBMVPC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Cressler21,
author = {John D. Cressler},
title = {New Developments in SiGe {HBT} Reliability for {RF} Through mmW Circuits},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405171},
doi = {10.1109/IRPS46558.2021.9405171},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Cressler21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/DammannBKKBKGS21,
author = {Maximilian Dammann and
Martina Baeumler and
Tobias Kemmer and
Helmer Konstanzer and
Peter Br{\"{u}}ckner and
Sebastian Krause and
Andreas Graff and
Mich{\'{e}}l Simon{-}Najasek},
title = {Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under {DC}
and {RF} Stress},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405227},
doi = {10.1109/IRPS46558.2021.9405227},
timestamp = {Fri, 27 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/DammannBKKBKGS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/DegraeveRKFCGK21,
author = {Robin Degraeve and
Taras Ravsher and
Shoichi Kabuyanagi and
Andrea Fantini and
Sergiu Clima and
Daniele Garbin and
Gouri Sankar Kar},
title = {Modeling and spectroscopy of ovonic threshold switching defects},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405114},
doi = {10.1109/IRPS46558.2021.9405114},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/DegraeveRKFCGK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/DharPHS21,
author = {Tonmoy Dhar and
Jitesh Poojary and
Ramesh Harjani and
Sachin S. Sapatnekar},
title = {Aging of Current DACs and its Impact in Equalizer Circuits},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405160},
doi = {10.1109/IRPS46558.2021.9405160},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/DharPHS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/DuanSOESB21,
author = {Ning Duan and
Vignesh Subramanian and
Edgar Olthof and
Paul Eggenkamp and
Michiel van Soestbergen and
Richard Braspenning},
title = {Moisture diffusion rate in an ultra-low-k dielectric and its effect
on the dielectric reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405157},
doi = {10.1109/IRPS46558.2021.9405157},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/DuanSOESB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FabrisBPZJYDMMZ21,
author = {Elena Fabris and
Matteo Borga and
Niels Posthuma and
Ming Zhao and
Brice De Jaeger and
Shuzhen You and
Stefaan Decoutere and
Matteo Meneghini and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Vertical stack reliability of GaN-on-Si buffers for low-voltage applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405097},
doi = {10.1109/IRPS46558.2021.9405097},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FabrisBPZJYDMMZ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FarmerWHVBGEDSR21,
author = {James Farmer and
William Whitehead and
Andrew Hall and
Dmitry Veksler and
Gennadi Bersuker and
David Z. Gao and
Al{-}Moatasem El{-}Sayed and
Thomas Durrant and
Alexander L. Shluger and
Thomas Rueckes and
Lee Cleveland and
Harry Luan and
Rahul Sen},
title = {Mitigating switching variability in carbon nanotube memristors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405123},
doi = {10.1109/IRPS46558.2021.9405123},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FarmerWHVBGEDSR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FederspielCMDC21,
author = {Xavier Federspiel and
Abdourahmane Camara and
Audrey Michard and
Cheikh Diouf and
Florian Cacho},
title = {{HCI} Temperature sense effect from 180nm to 28nm nodes},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405146},
doi = {10.1109/IRPS46558.2021.9405146},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FederspielCMDC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FeeleyXBNWF21,
author = {Alexandra Feeley and
Yoni Xiong and
Bharat L. Bhuva and
Balaji Narasimham and
Shi{-}Ji Wen and
Rita Fung},
title = {Effects of Temperature and Supply Voltage on Soft Errors for 7-nm
Bulk FinFET Technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405124},
doi = {10.1109/IRPS46558.2021.9405124},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FeeleyXBNWF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FiorenzaAABCMRS21,
author = {Patrick Fiorenza and
Salvatore Adamo and
Mario Santo Alessandrino and
Cettina Bottari and
Beatrice Carbone and
Clarice Di Martino and
Alfio Russo and
Mario Saggio and
Carlo Venuto and
Elisa Vitanza and
Edoardo Zanetti and
Filippo Giannazzo and
Fabrizio Roccaforte},
title = {Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405148},
doi = {10.1109/IRPS46558.2021.9405148},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FiorenzaAABCMRS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FrutuosoLGBLGCC21,
author = {Tadeu Mota Frutuoso and
Jose Lugo{-}Alvarez and
Xavier Garros and
Laurent Brunet and
Joris Lacord and
Louis Gerrer and
Mika{\"{e}}l Cass{\'{e}} and
Edoardo Catapano and
Claire Fenouillet{-}B{\'{e}}ranger and
Fran{\c{c}}ois Andrieu and
Fred Gaillard and
Philippe Ferrari},
title = {Impact of spacer interface charges on performance and reliability
of low temperature transistors for 3D sequential integration},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405107},
doi = {10.1109/IRPS46558.2021.9405107},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FrutuosoLGBLGCC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/FujiiHYMKSOMM21,
author = {Shuntaro Fujii and
Shohei Hamada and
Tatsushi Yagi and
Isao Maru and
Shogo Katsuki and
Toshiro Sakamoto and
Atsushi Okamoto and
Soichi Morita and
Tsutomu Miyazaki},
title = {Impacts of Depth and Lateral Profiles of Fluorine Atoms in Gate Oxide
Films on Reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405217},
doi = {10.1109/IRPS46558.2021.9405217},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/FujiiHYMKSOMM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Garba-SeybouFBC21,
author = {Tidjani Garba{-}Seybou and
Xavier Federspiel and
Alain Bravaix and
Florian Cacho},
title = {Analysis of the interactions of {HCD} under "On" and "Off" state modes
for 28nm {FDSOI} {AC} {RF} modelling},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405214},
doi = {10.1109/IRPS46558.2021.9405214},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Garba-SeybouFBC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GerrerCGGFCRV21,
author = {Louis Gerrer and
Jacques Cluzel and
Fred Gaillard and
Xavier Garros and
Xavier Federspiel and
Florian Cacho and
David Roy and
E. Vincent},
title = {{BTI} Arbitrary Stress Patterns Characterization {\&} Machine-Learning
optimized {CET} Maps Simulations},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405145},
doi = {10.1109/IRPS46558.2021.9405145},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GerrerCGGFCRV21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GrasserOKFSW21,
author = {Tibor Grasser and
Barry J. O'Sullivan and
Ben Kaczer and
Jacopo Franco and
Bernhard Stampfer and
Michael Waltl},
title = {{CV} Stretch-Out Correction after Bias Temperature Stress: Work-Function
Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast
States},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405184},
doi = {10.1109/IRPS46558.2021.9405184},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/GrasserOKFSW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/GuptaBSBPBAC21,
author = {Aniket Gupta and
Govind Bajpai and
Priyanshi Singhal and
Navjeet Bagga and
Om Prakash and
Shashank Banchhor and
Hussam Amrouch and
Nitanshu Chauhan},
title = {Traps Based Reliability Barrier on Performance and Revealing Early
Ageing in Negative Capacitance {FET}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405185},
doi = {10.1109/IRPS46558.2021.9405185},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/GuptaBSBPBAC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HanLSNJOHJLLSHJ21,
author = {Shinhee Han and
Junghyuk Lee and
Kiseok Suh and
Kyungtae Nam and
Daeeun Jeong and
Sechung Oh and
Sohee Hwang and
Yongsung Ji and
Kilho Lee and
Kangho Lee and
Yoonjong Song and
Yeongki Hong and
Gitae Jeong},
title = {Reliability of {STT-MRAM} for various embedded applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405094},
doi = {10.1109/IRPS46558.2021.9405094},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HanLSNJOHJLLSHJ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HanMK21,
author = {Jin{-}Woo Han and
M. Meyyappan and
Jungsik Kim},
title = {Single Event Hard Error due to Terrestrial Radiation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405177},
doi = {10.1109/IRPS46558.2021.9405177},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HanMK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HanXHYHLK21,
author = {Lixia Han and
Yachen Xiang and
Peng Huang and
Guihai Yu and
Runze Han and
Xiaoyan Liu and
Jinfeng Kang},
title = {Novel Weight Mapping Method for Reliable {NVM} based Neural Network},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405200},
doi = {10.1109/IRPS46558.2021.9405200},
timestamp = {Fri, 21 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/HanXHYHLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HaoSG21,
author = {Jifa Hao and
Yuhang Sun and
Amartya Ghosh},
title = {Charge pumping source-drain current for gate oxide interface trap
density in MOSFETs and {LDMOS}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405229},
doi = {10.1109/IRPS46558.2021.9405229},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HaoSG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HeSYSFYS21,
author = {Wangxin He and
Wonbo Shim and
Shihui Yin and
Xiaoyu Sun and
Deliang Fan and
Shimeng Yu and
Jae{-}sun Seo},
title = {Characterization and Mitigation of Relaxation Effects on Multi-level
{RRAM} based In-Memory Computing},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405228},
doi = {10.1109/IRPS46558.2021.9405228},
timestamp = {Wed, 26 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HeSYSFYS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HiblotRTDCSBDK21,
author = {Gaspard Hiblot and
Nouredine Rassoul and
Lieve Teugels and
Katia Devriendt and
Adrian Vaisman Chasin and
Michiel van Setten and
Attilio Belmonte and
Romain Delhougne and
Gouri Sankar Kar},
title = {Process-induced charging damage in {IGZO} nTFTs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405201},
doi = {10.1109/IRPS46558.2021.9405201},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HiblotRTDCSBDK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HoldenHCKPGDGA21,
author = {Konner E. K. Holden and
Gavin D. R. Hall and
Michael Cook and
Chris Kendrick and
Kaitlyn Pabst and
Bruce Greenwood and
Robin Daugherty and
Jeff P. Gambino and
Derryl D. J. Allman},
title = {Dielectric Relaxation, Aging and Recovery in High-K {MIM} Capacitors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--10},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405212},
doi = {10.1109/IRPS46558.2021.9405212},
timestamp = {Thu, 20 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HoldenHCKPGDGA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HuangR21,
author = {Shudong Huang and
Elyse Rosenbaum},
title = {Compact Model of {ESD} Diode Suitable for Subnanosecond Switching
Transients},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405149},
doi = {10.1109/IRPS46558.2021.9405149},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HuangR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/HungCCCLH21,
author = {Shih{-}che Hung and
Shih{-}Chang Chen and
Pei{-}Shan Chien and
Yu{-}Sheng Cho and
Yung{-}Huei Lee and
Wei{-}Shuo Hung},
title = {Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon
Using Tunable Ramp Voltage Stress {(TRVS)} Method for Automotive Applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405144},
doi = {10.1109/IRPS46558.2021.9405144},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/HungCCCLH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Ishimaru21,
author = {Kazunari Ishimaru},
title = {Challenges of Flash Memory for Next Decade},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405182},
doi = {10.1109/IRPS46558.2021.9405182},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Ishimaru21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/JoseYCHSZZ21,
author = {Sumy Jose and
Chunshan Yin and
Yu Chen and
Cheong Min Hong and
Mehul D. Shroff and
Xiaoling Zhao and
Fan Zhang},
title = {An efficient methodology to evaluate {BEOL} and {MOL} {TDDB} in advanced
nodes},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405138},
doi = {10.1109/IRPS46558.2021.9405138},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/JoseYCHSZZ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KaralkarGPHG21,
author = {Sagar Premnath Karalkar and
Vishal Ganesan and
Milova Paul and
Kyong Jin Hwang and
Robert Gauthier},
title = {Design Optimization of {MV-NMOS} to Improve Holding Voltage of a 28nm
{CMOS} Technology {ESD} Power Clamp},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405206},
doi = {10.1109/IRPS46558.2021.9405206},
timestamp = {Thu, 02 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KaralkarGPHG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KariyaYUIKM21,
author = {Kento Kariya and
Atsushi Yumiba and
Masaya Ukita and
Toru Ikeda and
Masaaki Koganemaru and
Noriyuki Masago},
title = {Study of the microstructure and the mechanical properties of Pb-2.5Ag-2Sn
solder joint},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405219},
doi = {10.1109/IRPS46558.2021.9405219},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KariyaYUIKM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Kashyap21,
author = {Rajesh Kashyap},
title = {Silicon lifecycle management {(SLM)} with in-chip monitoring},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405187},
doi = {10.1109/IRPS46558.2021.9405187},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Kashyap21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KimNOLKLKSHL21,
author = {Seung{-}Mo Kim and
Thi Mi Hanh Nyugen and
Jungwon Oh and
Yongsu Lee and
Soo Cheol Kang and
Ho{-}In Lee and
Cihyun Kim and
Surajit Some and
Hyeon Jun Hwang and
Byoung Hun Lee},
title = {Drastic reliability improvement using {H2O2/UV} treatment of HfO2
for heterogeneous integration},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405126},
doi = {10.1109/IRPS46558.2021.9405126},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KimNOLKLKSHL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KimYKEKYLKP21,
author = {Gang{-}Jun Kim and
Moonjee Yoon and
SungHwan Kim and
Myeongkyu Eo and
Shinhyung Kim and
Taehun You and
Namhyun Lee and
Kijin Kim and
Sangwoo Pae},
title = {The Characterization of Degradation on various SiON pMOSFET transistors
under {AC/DC} {NBTI} stress},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405108},
doi = {10.1109/IRPS46558.2021.9405108},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KimYKEKYLKP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KimYS21,
author = {Dongyoung Kim and
Nick Yun and
Woongje Sung},
title = {Advancing Static Performance and Ruggedness of 600 {V} SiC MOSFETs:
Experimental Analysis and Simulation Study},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405109},
doi = {10.1109/IRPS46558.2021.9405109},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KimYS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KishidaSK21,
author = {Ryo Kishida and
Ikuo Suda and
Kazutoshi Kobayashi},
title = {Bias Temperature Instability Depending on Body Bias through Buried
Oxide {(BOX)} Layer in a 65 nm Fully-Depleted Silicon-On-Insulator
Process},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405121},
doi = {10.1109/IRPS46558.2021.9405121},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KishidaSK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KobrinskyK21,
author = {Mauro J. Kobrinsky and
Rahim Kasim},
title = {Back End Of Line opportunities and reliability challenges for future
technology nodes},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--2},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405099},
doi = {10.1109/IRPS46558.2021.9405099},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KobrinskyK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KocharSMM21,
author = {Dimple Kochar and
Tarun Samadder and
Subhadeep Mukhopadhyay and
Souvik Mahapatra},
title = {Modeling of {HKMG} Stack Process Impact on Gate Leakage, {SILC} and
{PBTI}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405154},
doi = {10.1109/IRPS46558.2021.9405154},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KocharSMM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KozakS0LZ21,
author = {Joseph P. Kozak and
Qihao Song and
Ruizhe Zhang and
Jingcun Liu and
Yuhao Zhang},
title = {Robustness of GaN Gate Injection Transistors under Repetitive Surge
Energy and Overvoltage},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405173},
doi = {10.1109/IRPS46558.2021.9405173},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KozakS0LZ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KrishnanSHDL0BJ21,
author = {Gokul Krishnan and
Jingbo Sun and
Jubin Hazra and
Xiaocong Du and
Maximilian Liehr and
Zheng Li and
Karsten Beckmann and
Rajiv V. Joshi and
Nathaniel C. Cady and
Yu Cao},
title = {Robust RRAM-based In-Memory Computing in Light of Model Stability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405092},
doi = {10.1109/IRPS46558.2021.9405092},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KrishnanSHDL0BJ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KruvMCORBGWH21,
author = {Anastasiia Kruv and
Sean R. C. McMitchell and
Sergiu Clima and
Oguzhan O. Okudur and
Nicolo Ronchi and
Geert Van den Bosch and
Mario Gonzalez and
Ingrid De Wolf and
Jan Van Houdt},
title = {Impact of mechanical strain on wakeup of HfO2 ferroelectric memory},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405159},
doi = {10.1109/IRPS46558.2021.9405159},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KruvMCORBGWH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KumarSTSM21,
author = {Satyam Kumar and
Tarun Samadder and
Karansingh Thakor and
Uma Sharma and
Souvik Mahapatra},
title = {Stochastic and Deterministic Modeling Frameworks for Time Kinetics
of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405155},
doi = {10.1109/IRPS46558.2021.9405155},
timestamp = {Mon, 21 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/KumarSTSM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/KuyamaUE21,
author = {Tomohiro Kuyama and
Keiichiro Urabe and
Koji Eriguchi},
title = {Evaluation methodology for assessment of dielectric degradation and
breakdown dynamics using time-dependent impedance spectroscopy {(TDIS)}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405190},
doi = {10.1109/IRPS46558.2021.9405190},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/KuyamaUE21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LamaBBBNCGCNN21,
author = {Giusy Lama and
Mathieu Bernard and
Nicolas Bernier and
Guillaume Bourgeois and
Emmanuel Nolot and
Niccolo Castellani and
Julien Garrione and
Marie Claire Cyrille and
Gabriele Navarro and
Etienne Nowak},
title = {Multilevel Programming Reliability in Si-doped GeSbTe for Storage
Class Memory},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405116},
doi = {10.1109/IRPS46558.2021.9405116},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LamaBBBNCGCNN21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LauensteinCLKPT21,
author = {Jean{-}Marie Lauenstein and
Megan C. Casey and
Ray L. Ladbury and
Hak S. Kim and
Anthony M. Phan and
Alyson D. Topper},
title = {Space Radiation Effects on SiC Power Device Reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405180},
doi = {10.1109/IRPS46558.2021.9405180},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LauensteinCLKPT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LeeBKKYRL21,
author = {Moon Soo Lee and
Inhak Baick and
Min Kim and
Seo Hyun Kwon and
Myeong Soo Yeo and
Hwasung Rhee and
Euncheol Lee},
title = {Chip to Package Interaction Risk Assessment of {FCBGA} Devices using
{FEA} Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm
Optimization Technique},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405133},
doi = {10.1109/IRPS46558.2021.9405133},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LeeBKKYRL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LeeLHHNKCYCWBD21,
author = {Yung{-}Huei Lee and
P. J. Liao and
Vincent Hou and
Dawei Heh and
Chih{-}Hung Nien and
Wen{-}Hsien Kuo and
Gary T. Chen and
Shao{-}Ming Yu and
Yu{-}Sheng Chen and
Jau{-}Yi Wu and
Xinyu Bao and
Carlos H. Diaz},
title = {Composition Segregation of Ge-Rich {GST} and Its Effect on Reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405168},
doi = {10.1109/IRPS46558.2021.9405168},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LeeLHHNKCYCWBD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LeeTTT21,
author = {Tsung{-}En Lee and
Kasidit Toprasertpong and
Mitsuru Takenaka and
Shinichi Takagi},
title = {Characterization of Slow Traps in SiGe {MOS} Interfaces by TiN/Y2O3
Gate Stacks},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405189},
doi = {10.1109/IRPS46558.2021.9405189},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LeeTTT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LesniewskaPLMVD21,
author = {Alicja Lesniewska and
Olalla Varela Pedreira and
Melina Lofrano and
Gayle Murdoch and
Marleen H. van der Veen and
Anish Dangol and
Naoto Horiguchi and
Zsolt T{\"{o}}kei and
Kris Croes},
title = {Reliability of a {DME} Ru Semidamascene scheme with 16 nm wide Airgaps},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405192},
doi = {10.1109/IRPS46558.2021.9405192},
timestamp = {Mon, 01 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LesniewskaPLMVD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LinHSLXCYCWHSWP21,
author = {Shy{-}Jay Lin and
Yen{-}Lin Huang and
MingYaun Song and
Chien{-}Ming Lee and
Fen Xue and
Guan{-}Long Chen and
Shan{-}Yi Yang and
Yao{-}Jen Chang and
I{-}Jung Wang and
Yu{-}Chen Hsin and
Yi{-}Hui Su and
Jeng{-}Hua Wei and
Chi{-}Feng Pai and
Shan X. Wang and
Carlos H. Diaz},
title = {Challenges toward Low-Power {SOT-MRAM}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405127},
doi = {10.1109/IRPS46558.2021.9405127},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LinHSLXCYCWHSWP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LiuDZZ21,
author = {Wei Liu and
Yaru Ding and
Liang Zhao and
Yi Zhao},
title = {Nanosecond-scale and self-heating free characterization of advanced
{CMOS} transistors utilizing wave reflection},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405218},
doi = {10.1109/IRPS46558.2021.9405218},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LiuDZZ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LopezHGRSNBCDCB21,
author = {Joel Minguet Lopez and
Lucas Hudeley and
Laurent Grenouillet and
Diego Alfaro Robayo and
Jury Sandrini and
Gabriele Navarro and
Mathieu Bernard and
Catherine Carabasse and
Damien Deleruyelle and
Niccolo Castellani and
Marc Bocquet and
Jean{-}Michel Portal and
Etienne Nowak and
Gabriel Molas},
title = {Elucidating 1S1R operation to reduce the read voltage margin variability
by stack and programming conditions optimization},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405195},
doi = {10.1109/IRPS46558.2021.9405195},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/LopezHGRSNBCDCB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MahajanCVRKA21,
author = {Bikram Kishore Mahajan and
Yen{-}Pu Chen and
Dhanoop Varghese and
Vijay Reddy and
Srikanth Krishnan and
Muhammad Ashraful Alam},
title = {Quantifying Region-Specific Hot Carrier Degradation in {LDMOS} Transistors
Using a Novel Charge Pumping Technique},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405224},
doi = {10.1109/IRPS46558.2021.9405224},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MahajanCVRKA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MazzaPCGRSZBF21,
author = {Bruna Mazza and
Salvatore Patan{\'{e}} and
Francesco Cordiano and
Massimiliano Giliberto and
Giovanni Renna and
Andrea Severino and
Edoardo Zanetti and
Massimo Boscaglia and
Giovanni Franco},
title = {Effect of interface and bulk charges on the breakdown of nitrided
gate oxide on 4H-SiC},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405176},
doi = {10.1109/IRPS46558.2021.9405176},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MazzaPCGRSZBF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/McDonaldB21,
author = {Tim McDonald and
Stephanie Watts Butler},
title = {Progress and Current Topics of {JEDEC} {JC-70.1} Power GaN Device
Quality and Reliability Standards Activity: Or: What is the Avalanche
capability of your GaN Transistor?},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405225},
doi = {10.1109/IRPS46558.2021.9405225},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/McDonaldB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MichaelLK21,
author = {Ooi Michael and
Loo Tung Lun and
Koay Eng Keong},
title = {Methodology to improve Safety Critical SoC based platform: a case
study},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405223},
doi = {10.1109/IRPS46558.2021.9405223},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MichaelLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MiloAZPMOOWI21,
author = {Valerio Milo and
Francesco Anzalone and
Cristian Zambelli and
Eduardo P{\'{e}}rez and
Mamathamba Kalishettyhalli Mahadevaiah and
Oscar Gonzalez Ossorio and
Piero Olivo and
Christian Wenger and
Daniele Ielmini},
title = {Optimized programming algorithms for multilevel {RRAM} in hardware
neural networks},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405119},
doi = {10.1109/IRPS46558.2021.9405119},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MiloAZPMOOWI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MishraWZLSC21,
author = {Subrat Mishra and
Pieter Weckx and
Odysseas Zografos and
Ji{-}Yung Lin and
Alessio Spessot and
Francky Catthoor},
title = {Overhead Reduction with Optimal Margining Using {A} Reliability Aware
Design Paradigm},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405198},
doi = {10.1109/IRPS46558.2021.9405198},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MishraWZLSC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ModoloMSSSPMZM21,
author = {Nicola Modolo and
Andrea Minetto and
Carlo De Santi and
Luca Sayadi and
Sebastien Sicre and
Gerhard Prechtl and
Gaudenzio Meneghesso and
Enrico Zanoni and
Matteo Meneghini},
title = {A Generalized Approach to Determine the Switching Reliability of GaN
HEMTs on-Wafer Level},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405142},
doi = {10.1109/IRPS46558.2021.9405142},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ModoloMSSSPMZM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MonishmuraliS21,
author = {M. Monishmurali and
Mayank Shrivastava},
title = {Peculiar Current Instabilities {\&} Failure Mechanism in Vertically
Stacked Nanosheet ggN-FET},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405147},
doi = {10.1109/IRPS46558.2021.9405147},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MonishmuraliS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MonishmuraliS21a,
author = {M. Monishmurali and
Mayank Shrivastava},
title = {A Novel High Voltage Drain Extended FinFET {SCR} for SoC Applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405194},
doi = {10.1109/IRPS46558.2021.9405194},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MonishmuraliS21a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MorishitaM21,
author = {Yasuyuki Morishita and
Satoshi Maeda},
title = {Characterization of NMOS-based {ESD} Protection for Wide-range Pulse
Immunity},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405117},
doi = {10.1109/IRPS46558.2021.9405117},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MorishitaM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/MulaosmanovicLS21,
author = {Halid Mulaosmanovic and
Patrick D. Lomenzo and
Uwe Schroeder and
Stefan Slesazeck and
Thomas Mikolajick and
Benjamin Max},
title = {Reliability aspects of ferroelectric hafnium oxide for application
in non-volatile memories},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405215},
doi = {10.1109/IRPS46558.2021.9405215},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/MulaosmanovicLS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NarasimhamCSTBB21,
author = {Balaji Narasimham and
Vikas Chaudhary and
Mike Smith and
Liming Tsau and
Dennis R. Ball and
Bharat L. Bhuva},
title = {Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm
FinFET},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405216},
doi = {10.1109/IRPS46558.2021.9405216},
timestamp = {Mon, 09 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/NarasimhamCSTBB21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NevarezOWP21,
author = {Jairo Nevarez and
Anthony Olmedo and
Rachel Williams and
Polina Pechnikova},
title = {Gate Driver Protection Methods for SiC {MOSFET} Short Circuit Testing},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405170},
doi = {10.1109/IRPS46558.2021.9405170},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/NevarezOWP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/NeyerDDS21,
author = {Thomas Neyer and
Martin Domeij and
Hrishikesh Das and
Swapna Sunkari},
title = {Is there a perfect SiC MosFETs Device on an imperfect crystal?},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405098},
doi = {10.1109/IRPS46558.2021.9405098},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/NeyerDDS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Osenbach21,
author = {John Osenbach},
title = {Reliability of optoelectronic module An Introduction},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--9},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405213},
doi = {10.1109/IRPS46558.2021.9405213},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Osenbach21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/OsmansonKMKGK21,
author = {Allison T. Osmanson and
Mohsen Tajedini and
Yi Ram Kim and
Hossein Madanipour and
Choong{-}Un Kim and
Bradley Glasscock and
Muhammad Khan},
title = {Mechanisms of Contact Formation and Electromigration Reliability in
Wirebond Packages},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405131},
doi = {10.1109/IRPS46558.2021.9405131},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/OsmansonKMKGK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/OuyangYYHWYHX21,
author = {Yan Ouyang and
Suhui Yang and
Dandan Yin and
Xiang Huang and
Zhiqiang Wang and
Shengwei Yang and
Kun Han and
Zhongyi Xia},
title = {Excellent Reliability of Xtacking{\texttrademark} Bonding Interface},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405115},
doi = {10.1109/IRPS46558.2021.9405115},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/OuyangYYHWYHX21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PalanisamyBLKWE21,
author = {Shanmuganathan Palanisamy and
Thomas Basler and
Josef Lutz and
Cesare K{\"{u}}nzel and
Larissa Wehrhahn{-}Kilian and
Rudolf Elpelt},
title = {Investigation of the bipolar degradation of SiC {MOSFET} body diodes
and the influence of current density},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405183},
doi = {10.1109/IRPS46558.2021.9405183},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PalanisamyBLKWE21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PalmerZWLPK21,
author = {James Palmer and
Galor Zhang and
Justin R. Weber and
Cheyun Lin and
Christopher Perini and
Rahim Kasim},
title = {Intrinsic Reliability of {BEOL} interlayer dielectric},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--2},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405089},
doi = {10.1109/IRPS46558.2021.9405089},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PalmerZWLPK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ParkYKK21,
author = {Gyusung Park and
Hanzhao Yu and
Minsu Kim and
Chris H. Kim},
title = {An All {BTI} (N-PBTI, N-NBTI, P-PBTI, {P-NBTI)} Odometer based on
a Dual Power Rail Ring Oscillator Array},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405181},
doi = {10.1109/IRPS46558.2021.9405181},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ParkYKK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PedrettiAI21,
author = {Giacomo Pedretti and
Elia Ambrosi and
Daniele Ielmini},
title = {Conductance variations and their impact on the precision of in-memory
computing with resistive switching memory {(RRAM)}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405130},
doi = {10.1109/IRPS46558.2021.9405130},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PedrettiAI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PesicBPGKHVPBCL21,
author = {Milan Pesic and
Bastien Beltrando and
Andrea Padovani and
Shruba Gangopadhyay and
Muthukumar Kaliappan and
Michael Haverty and
Marco A. Villena and
Enrico Piccinini and
Matteo Bertocchi and
Tony Chiang and
Luca Larcher and
Jack Strand and
Alexander L. Shluger},
title = {Variability sources and reliability of 3D - FeFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405118},
doi = {10.1109/IRPS46558.2021.9405118},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PesicBPGKHVPBCL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PirroJZLIMPZOHR21,
author = {Luca Pirro and
Aarthi Jayakumar and
Olaf Zimmerhackl and
Dieter Lipp and
Ralf Illgen and
Armin Muehlhoff and
Ronny Pfuetzner and
Alban Zaka and
Michael Otto and
Jan Hoentschel and
Yannick Raffel and
Konrad Seidel and
Ricardo Olivo},
title = {Comparison of Analog and Noise Performance between Buried Channel
versus Surface Devices in {HKMG} {I/O} Devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405122},
doi = {10.1109/IRPS46558.2021.9405122},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PirroJZLIMPZOHR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/PutchaCAZLPWLC21,
author = {Vamsi Putcha and
Liang Cheng and
AliReza Alian and
Ming Zhao and
Hai Lu and
Bertrand Parvais and
Niamh Waldron and
Dimitri Linten and
Nadine Collaert},
title = {On the impact of buffer and GaN-channel thickness on current dispersion
for GaN-on-Si RF/mmWave devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405139},
doi = {10.1109/IRPS46558.2021.9405139},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/PutchaCAZLPWLC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RaceZTKG21,
author = {Salvatore Race and
Thomas Ziemann and
Shweta Tiwari and
Ivana Kovacevic{-}Badstuebner and
Ulrike Grossner},
title = {Accuracy of Thermal Analysis for SiC Power Devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405203},
doi = {10.1109/IRPS46558.2021.9405203},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RaceZTKG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RanjanLMRPLKNKJ21,
author = {Rakesh Ranjan and
Ki{-}Don Lee and
Md Iqbal Mahmud and
Mohammad Shahriar Rahman and
Pavitra Ramadevi Perepa and
Charles Briscoe LaRow and
Caleb Dongkyun Kwon and
Maihan Nguyen and
Minhyo Kang and
Ashish Kumar Jha and
Ahmed Shariq and
Shamas Musthafa Ummer and
Susannah Laure Prater and
Hyunchul Sagong and
HwaSung Rhee},
title = {Systematic Study of Process Impact on FinFET Reliability},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405134},
doi = {10.1109/IRPS46558.2021.9405134},
timestamp = {Fri, 07 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RanjanLMRPLKNKJ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RathiSGD21,
author = {Aarti Rathi and
P. Srinivasan and
Fernando Guarin and
Abhisek Dixit},
title = {Large Signal {RF} Reliability of 45-nm {RFSOI} Power Amplifier Cell
for Wi-Fi6 Applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405158},
doi = {10.1109/IRPS46558.2021.9405158},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RathiSGD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RoldanMARHSJAL21,
author = {Juan Bautista Rold{\'{a}}n and
David Maldonado and
Francisco J. Alonso and
Andr{\'{e}}s M. Rold{\'{a}}n and
Fei Hui and
Yuanyuan Shi and
Francisco Jim{\'{e}}nez{-}Molinos and
Ana M. Aguilera and
Mario Lanza},
title = {Time series modeling of the cycle-to-cycle variability in h-BN based
memristors},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405100},
doi = {10.1109/IRPS46558.2021.9405100},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/RoldanMARHSJAL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/RzepaKBSSMKKWHC21,
author = {Gerhard Rzepa and
Markus Karner and
Oskar Baumgartner and
Georg Strof and
Franz Schanovsky and
Ferdinand Mitterbauer and
Christian Kernstock and
Hui{-}Wen Karner and
Pieter Weckx and
Geert Hellings and
Dieter Claes and
Zhicheng Wu and
Yang Xiang and
Thomas Chiarella and
Bertrand Parvais and
J{\'{e}}r{\^{o}}me Mitard and
Jacopo Franco and
Ben Kaczer and
Dimitri Linten and
Zlatan Stanojevic},
title = {Reliability and Variability-Aware {DTCO} Flow: Demonstration of Projections
to {N3} FinFET and Nanosheet Technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405172},
doi = {10.1109/IRPS46558.2021.9405172},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/RzepaKBSSMKKWHC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Salahuddin21,
author = {Sayeef S. Salahuddin},
title = {Ultrathin Ferroelectricity and Its Application in Advanced Logic and
Memory Devices},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405186},
doi = {10.1109/IRPS46558.2021.9405186},
timestamp = {Wed, 08 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Salahuddin21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SalmenFWRRA21,
author = {Paul Salmen and
Maximilian W. Feil and
Katja Waschneck and
Hans Reisinger and
Gerald Rescher and
Thomas Aichinger},
title = {A new test procedure to realistically estimate end-of-life electrical
parameter stability of SiC MOSFETs in switching operation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405207},
doi = {10.1109/IRPS46558.2021.9405207},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SalmenFWRRA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SamadderKTM21,
author = {Tarun Samadder and
Satyam Kumar and
Karansingh Thakor and
Souvik Mahapatra},
title = {A Theoretical Framework for Trap Generation and Passivation in {NAND}
Flash Tunnel Oxide During Distributed Cycling and Retention Bake},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405104},
doi = {10.1109/IRPS46558.2021.9405104},
timestamp = {Mon, 21 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/SamadderKTM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SasseSR21,
author = {Guido T. Sasse and
Vignesh Subramanian and
Ljubo Radic},
title = {Aging models for n- and p-type {LDMOS} covering low, medium and high
{VGS} operation},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405135},
doi = {10.1109/IRPS46558.2021.9405135},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SasseSR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Scarpulla21,
author = {John Scarpulla},
title = {Guidelines for Space Qualification of GaN HEMTs and MMICs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--11},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405226},
doi = {10.1109/IRPS46558.2021.9405226},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Scarpulla21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SchmidgallGTPYS21,
author = {Emma R. Schmidgall and
Flavio Griggio and
George H. Thiel and
Sherman E. Peek and
Bhargav Yelamanchili and
Archit Shah and
Vaibhav Gupta and
John A. Sellers and
Michael C. Hamilton and
David B. Tuckerman and
Samuel d'Hollosy},
title = {Reliability Characterization of a Flexible Interconnect for Cryogenic
and Quantum Applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405090},
doi = {10.1109/IRPS46558.2021.9405090},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SchmidgallGTPYS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShahZLR21,
author = {Milan Shah and
Yujie Zhou and
David LaFonteese and
Elyse Rosenbaum},
title = {Considerations in High Voltage Lateral {ESD} {PNP} Design},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--10},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405093},
doi = {10.1109/IRPS46558.2021.9405093},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShahZLR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShengH21,
author = {Lieyi Sheng and
Ihsiu Ho},
title = {Universal Impacts of Local Electric Fields on the Projected Dielectric
Lifetime},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405112},
doi = {10.1109/IRPS46558.2021.9405112},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ShengH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ShimMPSY21,
author = {Wonbo Shim and
Jian Meng and
Xiaochen Peng and
Jae{-}sun Seo and
Shimeng Yu},
title = {Impact of Multilevel Retention Characteristics on {RRAM} based {DNN}
Inference Engine},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405210},
doi = {10.1109/IRPS46558.2021.9405210},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ShimMPSY21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SolomonBTDFCLCR21,
author = {Paul M. Solomon and
Douglas M. Bishop and
Teodor K. Todorov and
Simon Dawes and
Damon B. Farmer and
Matthew Copel and
Ko{-}Tao Lee and
John Collins and
John Rozen},
title = {Transient Investigation of Metal-oxide based, CMOS-compatible {ECRAM}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405156},
doi = {10.1109/IRPS46558.2021.9405156},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SolomonBTDFCLCR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SonKKLKP21,
author = {Donghee Son and
Gang{-}Jun Kim and
Jongkyun Kim and
Nam{-}Hyun Lee and
Kijin Kim and
Sangwoo Pae},
title = {Effect of High Temperature on Recovery of Hot Carrier Degradation
of scaled nMOSFETs in {DRAM}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405153},
doi = {10.1109/IRPS46558.2021.9405153},
timestamp = {Fri, 21 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SonKKLKP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Song0KLLZ21,
author = {Qihao Song and
Ruizhe Zhang and
Joseph P. Kozak and
Jingcun Liu and
Qiang Li and
Yuhao Zhang},
title = {Failure Mechanisms of Cascode GaN HEMTs Under Overvoltage and Surge
Energy Events},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405208},
doi = {10.1109/IRPS46558.2021.9405208},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Song0KLLZ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SrinivasanG21,
author = {P. Srinivasan and
Fernando Guarin},
title = {{CMOS} {RF} reliability for 5G mmWave applications - Challenges and
Opportunities},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405202},
doi = {10.1109/IRPS46558.2021.9405202},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SrinivasanG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SrinivasanGSJLJ21,
author = {P. Srinivasan and
Fernando Guarin and
Shafi Syed and
Joris Angelo Sundaram Jerome and
Wen Liu and
Sameer H. Jain and
Dimitri Lederer and
Stephen Moss and
Paul Colestock and
Anirban Bandyopadhyay and
Ned Cahoon and
Byoung Min and
Martin Gall},
title = {{RF} Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405220},
doi = {10.1109/IRPS46558.2021.9405220},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SrinivasanGSJLJ21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/SrinivasanSRLD21,
author = {P. Srinivasan and
Da Song and
David Rose and
Maurice LaCroix and
Arunima Dasgupta},
title = {Back gate bias effect and layout dependence on Random Telegraph Noise
in {FDSOI} technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405199},
doi = {10.1109/IRPS46558.2021.9405199},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/SrinivasanSRLD21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/StewartKRNHJHGP21,
author = {Kevin A. Stewart and
Keiichi Kimura and
Matt Ring and
Koen Noldus and
Pat Hulse and
Rick C. Jerome and
Akihiro Hasegawa and
Jeff P. Gambino and
David T. Price},
title = {Assessing SiCr resistor drift for automotive analog ICs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405169},
doi = {10.1109/IRPS46558.2021.9405169},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/StewartKRNHJHGP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TataridouGT21,
author = {Angeliki Tataridou and
G{\'{e}}rard Ghibaudo and
Christoforos G. Theodorou},
title = {"Pinch to Detect": {A} Method to Increase the Number of Detectable
{RTN} Traps in Nano-scale MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405102},
doi = {10.1109/IRPS46558.2021.9405102},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/TataridouGT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TatenoNOMKOHIYN21,
author = {Yasunori Tateno and
Ken Nakata and
Akio Oya and
Keita Matsuda and
Yoshihide Komatsu and
Shinichi Osada and
Masafumi Hirata and
Shigeyuki Ishiyama and
Toshiki Yoda and
Atsushi Nitta and
Tomio Sato},
title = {Investigation of the Failure Mechanism of InGaAs-pHEMT under High
Temperature Operating Life Tests},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405166},
doi = {10.1109/IRPS46558.2021.9405166},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TatenoNOMKOHIYN21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TiernoCARBR21,
author = {Davide Tierno and
Kristof Croes and
Arjun Ajaykumar and
Siva Ramesh and
Geert Van den Bosch and
Maarten Rosmeulen},
title = {Reliability of Mo as Word Line Metal in 3D {NAND}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405132},
doi = {10.1109/IRPS46558.2021.9405132},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TiernoCARBR21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/Toledano-LuqueP21,
author = {Maria Toledano{-}Luque and
Peter C. Paliwoda and
Mohamed Nour and
Thomas Kauerauf and
Byoung Min and
Germain Bossu and
Mahesh Siddabathula and
Tanya Nigam},
title = {Off-state {TDDB} in FinFET Technology and its Implication for Safe
Operating Area},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405151},
doi = {10.1109/IRPS46558.2021.9405151},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/Toledano-LuqueP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/TroussierBJSA21,
author = {Chloe Troussier and
Johan Bourgeat and
Blaise Jacquier and
Emmanuel Simeu and
Jean{-}Daniel Arnould},
title = {Estimation of Oxide Breakdown Voltage During a {CDM} Event Using Very
Fast Transmission Line Pulse and Transmission Line Pulse Measurements},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405110},
doi = {10.1109/IRPS46558.2021.9405110},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/TroussierBJSA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/UemuraCJKLKLSRL21,
author = {Taiki Uemura and
Byungjin Chung and
Jeongmin Jo and
Mijoung Kim and
Dalhee Lee and
Gunrae Kim and
Seungbae Lee and
Taesjoong Song and
Hwasung Rhee and
Brandon Lee and
Jaehee Choi},
title = {Soft-Error Susceptibility in Flip-Flop in {EUV} 7 nm Bulk-FinFET Technology},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405101},
doi = {10.1109/IRPS46558.2021.9405101},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/UemuraCJKLKLSRL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VaisHSYAMKKWSC21,
author = {Abhitosh Vais and
Brent Hsu and
Olga Syshchyk and
Hao Yu and
AliReza Alian and
Yves Mols and
Komal Vondkar Kodandarama and
Bernardette Kunert and
Niamh Waldron and
Eddy Simoen and
Nadine Collaert},
title = {A defect characterization technique for the sidewall surface of Nano-ridge
and Nanowire based Logic and {RF} technologies},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405095},
doi = {10.1109/IRPS46558.2021.9405095},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VaisHSYAMKKWSC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VandemaeleKTFDC21,
author = {Michiel Vandemaele and
Ben Kaczer and
Stanislav Tyaginov and
Jacopo Franco and
Robin Degraeve and
Adrian Vaisman Chasin and
Zhicheng Wu and
Erik Bury and
Yang Xiang and
Hans Mertens and
Guido Groeseneken},
title = {The properties, effect and extraction of localized defect profiles
from degraded {FET} characteristics},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405164},
doi = {10.1109/IRPS46558.2021.9405164},
timestamp = {Wed, 24 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTFDC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VieyVJCCKMBGSGM21,
author = {Aby{-}Ga{\"{e}}l Viey and
William Vandendaele and
Marie{-}Anne Jaud and
Jean Coignus and
Jacques Cluzel and
Alexis Krakovinsky and
Simon Martin and
J{\'{e}}rome Biscarrat and
Romain Gwoziecki and
Veronique Sousa and
Fred Gaillard and
Roberto Modica and
Ferdinando Iucolano and
Matteo Meneghini and
Gaudenzio Meneghesso and
G{\'{e}}rard Ghibaudo},
title = {Study on the difference between {ID(VG)} and {C(VG)} pBTI shifts in
GaN-on-Si E-mode MOSc-HEMT},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405221},
doi = {10.1109/IRPS46558.2021.9405221},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/VieyVJCCKMBGSGM21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/VyasPTABSLGI21,
author = {Pratik B. Vyas and
Ninad Pimparkar and
Robert Tu and
Wafa Arfaoui and
Germain Bossu and
Mahesh Siddabathula and
Steffen Lehmann and
Jung{-}Suk Goo and
Ali B. Icel},
title = {Reliability-Conscious {MOSFET} Compact Modeling with Focus on the
Defect-Screening Effect of Hot-Carrier Injection},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405197},
doi = {10.1109/IRPS46558.2021.9405197},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/VyasPTABSLGI21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WangZZHSQH21,
author = {Runsheng Wang and
Zuodong Zhang and
Yawen Zhang and
Yixuan Hu and
Yanan Sun and
Weikang Qian and
Ru Huang},
title = {Can Emerging Computing Paradigms Help Enhancing Reliability Towards
the End of Technology Roadmap?},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405167},
doi = {10.1109/IRPS46558.2021.9405167},
timestamp = {Wed, 22 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WangZZHSQH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WeiASLYWL21,
author = {Ming{-}Liang Wei and
Hussam Amrouch and
Cheng{-}Lin Sung and
Hang{-}Ting Lue and
Chia{-}Lin Yang and
Keh{-}Chung Wang and
Chih{-}Yuan Lu},
title = {Robust Brain-Inspired Computing: On the Reliability of Spiking Neural
Network Using Emerging Non-Volatile Synapses},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--8},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405141},
doi = {10.1109/IRPS46558.2021.9405141},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WeiASLYWL21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/WuFTRTVBGLK21,
author = {Zhicheng Wu and
Jacopo Franco and
Brecht Truijen and
Philippe Roussel and
Stanislav Tyaginov and
Michiel Vandemaele and
Erik Bury and
Guido Groeseneken and
Dimitri Linten and
Ben Kaczer},
title = {Physics-based device aging modelling framework for accurate circuit
reliability assessment},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405106},
doi = {10.1109/IRPS46558.2021.9405106},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiangTVWFBTPLK21,
author = {Yang Xiang and
Stanislav Tyaginov and
Michiel Vandemaele and
Zhicheng Wu and
Jacopo Franco and
Erik Bury and
Brecht Truijen and
Bertrand Parvais and
Dimitri Linten and
Ben Kaczer},
title = {A BSIM-Based Predictive Hot-Carrier Aging Compact Model},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--9},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405222},
doi = {10.1109/IRPS46558.2021.9405222},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/XiangTVWFBTPLK21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiaoHKJOSPT21,
author = {Peng Xiao and
Haris Hadziosmanovic and
Michael Klessens and
Rong Jiang and
John Ortega and
Daniel Schroeder and
James Palmer and
Ilan Tsameret},
title = {Customized Parallel Reliability Testing Platform with Multifold Throughput
Enhancement for Intel Stressing Tests},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405140},
doi = {10.1109/IRPS46558.2021.9405140},
timestamp = {Fri, 01 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/XiaoHKJOSPT21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/XiongFMBWF21,
author = {Yoni Xiong and
Alexandra Feeley and
Lloyd W. Massengill and
Bharat L. Bhuva and
Shi{-}Jie Wen and
Rita Fung},
title = {Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors
at the 7-nm Node},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405128},
doi = {10.1109/IRPS46558.2021.9405128},
timestamp = {Thu, 20 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/XiongFMBWF21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YangHCCLC21,
author = {W. Y. Yang and
E. R. Hsieh and
C. H. Cheng and
B. Y. Chen and
K. S. Li and
Steve S. Chung},
title = {A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring
Forming-Free and High Immunity to Sneak Path},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405179},
doi = {10.1109/IRPS46558.2021.9405179},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/YangHCCLC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YangKPKLPKH21,
author = {NamHyuk Yang and
JinHwan Kim and
GeonGu Park and
ChulHyuk Kwon and
SeungTaek Lee and
SangWoo Pae and
HooSung Kim and
SangWon Hwang},
title = {A Study on System Level {UFS} {M-PHY} Reliability Measurement Method
Using {RDVS}},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405096},
doi = {10.1109/IRPS46558.2021.9405096},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/YangKPKLPKH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/YangWLYHH21,
author = {Liu Yang and
Qi Wang and
Qianhui Li and
Xiaolei Yu and
Jing He and
Zongliang Huo},
title = {Efficient Data Recovery Technique for 3D {TLC} {NAND} Flash Memory
based on {WL} Interference},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405150},
doi = {10.1109/IRPS46558.2021.9405150},
timestamp = {Tue, 07 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/YangWLYHH21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZahedmaneshPTC21,
author = {Houman Zahedmanesh and
Olalla Varela Pedreira and
Zsolt Tokei and
Kristof Croes},
title = {Electromigration limits of copper nano-interconnects},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405091},
doi = {10.1109/IRPS46558.2021.9405091},
timestamp = {Mon, 01 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZahedmaneshPTC21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZanottiPP21,
author = {Tommaso Zanotti and
Francesco Maria Puglisi and
Paolo Pavan},
title = {Low-Bit Precision Neural Network Architecture with High Immunity to
Variability and Random Telegraph Noise based on Resistive Memories},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405103},
doi = {10.1109/IRPS46558.2021.9405103},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZanottiPP21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZengCGKA21,
author = {Ke Zeng and
Srabanti Chowdhury and
Brendan Gunning and
Robert Kaplar and
Travis Anderson},
title = {Study on Avalanche Uniformity in 1.2KV GaN Vertical {PIN} Diode with
Bevel Edge-Termination},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--4},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405165},
doi = {10.1109/IRPS46558.2021.9405165},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZengCGKA21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhangKHCCZG21,
author = {Zhenjun Zhang and
Matthias Kraatz and
Meike Hauschildt and
Seungman Choi and
Andr{\'{e}} Clausner and
Ehrenfried Zschech and
Martin Gall},
title = {Strategy to Characterize Electromigration Short Length Effects in
Cu/low-k Interconnects},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405161},
doi = {10.1109/IRPS46558.2021.9405161},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZhangKHCCZG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhengPW21,
author = {Yongju Zheng and
Rahul R. Potera and
Tony Witt},
title = {Characterization of Early Breakdown of SiC {MOSFET} Gate Oxide by
Voltage Ramp Tests},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--5},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405196},
doi = {10.1109/IRPS46558.2021.9405196},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZhengPW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhouWBSWSZBG21,
author = {Huimei Zhou and
Miaomiao Wang and
Ruqiang Bao and
Tian Shen and
Ernest Y. Wu and
Richard G. Southwick and
Jingyun Zhang and
Veeraraghavan S. Basker and
Dechao Guo},
title = {{TDDB} Reliability in Gate-All-Around Nanosheet},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--6},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405204},
doi = {10.1109/IRPS46558.2021.9405204},
timestamp = {Wed, 28 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZhouWBSWSZBG21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhouZYJLZSYLDZW21,
author = {Longda Zhou and
Zhaohao Zhang and
Hong Yang and
Zhigang Ji and
Qianqian Liu and
Qingzhu Zhang and
Eddy Simoen and
Huaxiang Yin and
Jun Luo and
Anyan Du and
Chao Zhao and
Wenwu Wang},
title = {A Fast {DCIV} Technique for Characterizing the Generation and Repassivation
of Interface Traps Under {DC/} {AC} {NBTI} Stress/Recovery Condition
in Si p-FinFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405105},
doi = {10.1109/IRPS46558.2021.9405105},
timestamp = {Thu, 05 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/irps/ZhouZYJLZSYLDZW21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/ZhuLWASS21,
author = {Shengnan Zhu and
Tianshi Liu and
Marvin H. White and
Anant K. Agarwal and
Arash Salemi and
David Sheridan},
title = {Investigation of Gate Leakage Current Behavior for Commercial 1.2
kV 4H-SiC Power MOSFETs},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
pages = {1--7},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021.9405230},
doi = {10.1109/IRPS46558.2021.9405230},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/ZhuLWASS21.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/irps/2021,
title = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey,
CA, USA, March 21-25, 2021},
publisher = {{IEEE}},
year = {2021},
url = {https://doi.org/10.1109/IRPS46558.2021},
doi = {10.1109/IRPS46558.2021},
isbn = {978-1-7281-6893-7},
timestamp = {Wed, 05 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/irps/2021.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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