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@inproceedings{DBLP:conf/iolts/AbellaCVCG08, author = {Jaume Abella and Pedro Chaparro and Xavier Vera and Javier Carretero and Antonio Gonz{\'{a}}lez}, title = {On-Line Failure Detection and Confinement in Caches}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {3--9}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.15}, doi = {10.1109/IOLTS.2008.15}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/AbellaCVCG08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Aitken08, author = {Rob Aitken}, title = {Special Session 4: Reliability and Circuit Simulation}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {195--196}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.69}, doi = {10.1109/IOLTS.2008.69}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Aitken08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/AlmukhaizimMYV08, author = {Sobeeh Almukhaizim and Yiorgos Makris and Yu{-}Shen Yang and Andreas G. Veneris}, title = {On the Minimization of Potential Transient Errors and {SER} in Logic Circuits Using {SPFD}}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {123--128}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.16}, doi = {10.1109/IOLTS.2008.16}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/AlmukhaizimMYV08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ArgyridesVMP08, author = {Costas Argyrides and Fabian Vargas and Marlon Moraes and Dhiraj K. Pradhan}, title = {Embedding Current Monitoring in H-Tree {RAM} Architecture for Multiple {SEU} Tolerance and Reliability Improvement}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {155--160}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.36}, doi = {10.1109/IOLTS.2008.36}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ArgyridesVMP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/AzaisLBR08, author = {Florence Aza{\"{\i}}s and Laurent Larguier and Yves Bertrand and Michel Renovell}, title = {On the Detection of SSN-Induced Logic Errors through On-Chip Monitoring}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {233--238}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.19}, doi = {10.1109/IOLTS.2008.19}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/AzaisLBR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/BartzoudisTM08, author = {Nikolaos G. Bartzoudis and Vasileios Tantsios and Klaus D. McDonald{-}Maier}, title = {Dynamic Scheduling of Test Routines for Efficient Online Self-Testing of Embedded Microprocessors}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {185--187}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.55}, doi = {10.1109/IOLTS.2008.55}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/BartzoudisTM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/BattezzatiGMPRSV08, author = {Niccol{\`{o}} Battezzati and Simone Gerardin and Andrea Manuzzato and Alessandro Paccagnella and Sana Rezgui and Luca Sterpone and Massimo Violante}, title = {On the Evaluation of Radiation-Induced Transient Faults in Flash-Based FPGAs}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {135--140}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.47}, doi = {10.1109/IOLTS.2008.47}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/BattezzatiGMPRSV08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/BougerolMB08, author = {Antonin Bougerol and Florent Miller and Nadine Buard}, title = {{SDRAM} Architecture {\&} Single Event Effects Revealed with Laser}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {283--288}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.40}, doi = {10.1109/IOLTS.2008.40}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/BougerolMB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/CanivetCFVRL08, author = {Gaetan Canivet and Jessy Cl{\'{e}}di{\`{e}}re and Jean Baptiste Ferron and Fr{\'{e}}d{\'{e}}ric Valette and Marc Renaudin and R{\'{e}}gis Leveugle}, title = {Detailed Analyses of Single Laser Shot Effects in the Configuration of a Virtex-II {FPGA}}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {289--294}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.41}, doi = {10.1109/IOLTS.2008.41}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/CanivetCFVRL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/DarbariAHB08, author = {Ashish Darbari and Bashir M. Al{-}Hashimi and Peter Harrod and Daryl Bradley}, title = {A New Approach for Transient Fault Injection Using Symbolic Simulation}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {93--98}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.59}, doi = {10.1109/IOLTS.2008.59}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/DarbariAHB08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/DasRR08, author = {Nachiketa Das and Pranab Roy and Hafizur Rahaman}, title = {On Line Testing of Single Feedback Bridging Fault in Cluster Based {FPGA} by Using Asynchronous Element}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {190--191}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.11}, doi = {10.1109/IOLTS.2008.11}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/DasRR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/DuarteMKP08, author = {Ricardo de Oliveira Duarte and Luiz de Siqueira Martins{-}Filho and Guilherme F. T. Knop and Ricardo S. Prado}, title = {A Fault-Tolerant Attitude Determination System Based on {COTS} Devices}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {85--90}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.20}, doi = {10.1109/IOLTS.2008.20}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/DuarteMKP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/GangadharST08, author = {Sreenivas Gangadhar and Michael N. Skoufis and Spyros Tragoudas}, title = {Propagation of Transients Along Sensitizable Paths}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {129--134}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.46}, doi = {10.1109/IOLTS.2008.46}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/GangadharST08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/GawkowskiS08, author = {Piotr Gawkowski and Janusz Sosnowski}, title = {Developing Fault Injection Environment for Complex Experiments}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {179--181}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.13}, doi = {10.1109/IOLTS.2008.13}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/GawkowskiS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Heijmen08, author = {Tino Heijmen}, title = {Special Session 3 - Panel: {SER} in Automotive: what is the impact of the {AEC} {Q100-G} spec?}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {161--162}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.68}, doi = {10.1109/IOLTS.2008.68}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Heijmen08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Heijmen08a, author = {Tino Heijmen}, title = {Soft-Error Vulnerability of Sub-100-nm Flip-Flops}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {247--252}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.12}, doi = {10.1109/IOLTS.2008.12}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Heijmen08a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/HuangL08, author = {Zhengfeng Huang and Huaguo Liang}, title = {A New Radiation Hardened by Design Latch for Ultra-Deep-Sub-Micron Technologies}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {175--176}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.9}, doi = {10.1109/IOLTS.2008.9}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/HuangL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/HungerH08, author = {Marc Hunger and Sybille Hellebrand}, title = {Verification and Analysis of Self-Checking Properties through {ATPG}}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {25--30}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.32}, doi = {10.1109/IOLTS.2008.32}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/HungerH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ImhofWZ08, author = {Michael E. Imhof and Hans{-}Joachim Wunderlich and Christian G. Zoellin}, title = {Integrating Scan Design and Soft Error Correction in Low-Power Applications}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {59--64}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.31}, doi = {10.1109/IOLTS.2008.31}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ImhofWZ08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Kao08, author = {Yu (Kevin) Kao}, title = {Modeling and Simulation of Circuit Aging in Scaled {CMOS} Design}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {197}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.65}, doi = {10.1109/IOLTS.2008.65}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Kao08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/KarimiASN08, author = {Naghmeh Karimi and Soheil Aminzadeh and Saeed Safari and Zainalabedin Navabi}, title = {A Novel GA-Based High-Level Synthesis Technique to Enhance RT-Level Concurrent Testing}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {173--174}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.43}, doi = {10.1109/IOLTS.2008.43}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/KarimiASN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/KoalV08, author = {Tobias Koal and Heinrich Theodor Vierhaus}, title = {Basic Architecture for Logic Self Repair}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {177--178}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.17}, doi = {10.1109/IOLTS.2008.17}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/KoalV08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/LeroyGSBWW08, author = {Damien Leroy and R{\'{e}}mi Gaillard and Erwin Sch{\"{a}}fer and Cyrille Beltrando and Shi{-}Jie Wen and Richard Wong}, title = {Variation of {SRAM} Alpha-Induced Soft Error Rate with Technology Node}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {253--257}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.38}, doi = {10.1109/IOLTS.2008.38}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/LeroyGSBWW08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Lopez-OngilJPGME08, author = {Celia L{\'{o}}pez{-}Ongil and Alejandro Jim{\'{e}}nez{-}Horas and Marta Portela{-}Garc{\'{\i}}a and Mario Garc{\'{\i}}a{-}Valderas and Enrique San Mill{\'{a}}n and Luis Entrena}, title = {Smart Hardening for Round-based Encryption Algorithms: Application to Advanced Encryption Standard}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {167--168}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.42}, doi = {10.1109/IOLTS.2008.42}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Lopez-OngilJPGME08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/MagosVT08, author = {Dimitris Magos and Ioannis Voyiatzis and Steffen Tarnick}, title = {A Low-Cost Accumulator-Based Test Pattern Generation Architecture}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {267--272}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.54}, doi = {10.1109/IOLTS.2008.54}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/MagosVT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/MaistriEL08, author = {Paolo Maistri and Cyril Excoffon and R{\'{e}}gis Leveugle}, title = {Software Self-Testing of a Symmetric Cipher with Error Detection Capability}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {79--84}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.33}, doi = {10.1109/IOLTS.2008.33}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/MaistriEL08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/MathewJP08, author = {Jimson Mathew and Abusaleh M. Jabir and Dhiraj K. Pradhan}, title = {Design Techniques for Bit-Parallel Galois Field Multipliers with On-Line Single Error Correction and Double Error Detection}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {16--21}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.34}, doi = {10.1109/IOLTS.2008.34}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/MathewJP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/MathewSTP08, author = {Jimson Mathew and Jawar Singh and Anas Abu Taleb and Dhiraj K. Pradhan}, title = {Fault Tolerant Reversible Finite Field Arithmetic Circuits}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {188--189}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.35}, doi = {10.1109/IOLTS.2008.35}, timestamp = {Sun, 06 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iolts/MathewSTP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/MerentitisTGK08, author = {Andreas Merentitis and George Theodorou and Mihalis Giorgaras and Nektarios Kranitis}, title = {Directed Random {SBST} Generation for On-Line Testing of Pipelined Processors}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {273--279}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.18}, doi = {10.1109/IOLTS.2008.18}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/MerentitisTGK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Mitra08, author = {Subhasish Mitra}, title = {Soft Error Protection Techniques}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {45}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.64}, doi = {10.1109/IOLTS.2008.64}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Mitra08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Nicolaidis08, author = {Michael Nicolaidis}, title = {Special Session 2: Benchmarking and Standardization in Software-Based {SER} Characterization: Towards an {IEEE} Task Force?}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {105--106}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.67}, doi = {10.1109/IOLTS.2008.67}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Nicolaidis08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/NisarC08, author = {Muhammad Mudassar Nisar and Abhijit Chatterjee}, title = {Guided Probabilistic Checksums for Error Control in Low Power Digital-Filters}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {239--244}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.50}, doi = {10.1109/IOLTS.2008.50}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/NisarC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/OhlerBNH08, author = {Philipp {\"{O}}hler and Alberto Bosio and Giorgio Di Natale and Sybille Hellebrand}, title = {A Modular Memory {BIST} for Optimized Memory Repair}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {171--172}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.30}, doi = {10.1109/IOLTS.2008.30}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/OhlerBNH08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/PekmestziASM08, author = {Kiamal Z. Pekmestzi and Nicholas Axelos and Isidoros Sideris and Nikos K. Moshopoulos}, title = {A {BISR} Architecture for Embedded Memories}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {149--154}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.21}, doi = {10.1109/IOLTS.2008.21}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/PekmestziASM08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/PerezVRSR08, author = {Wilson J. P{\'{e}}rez H. and Jaime Velasco{-}Medina and Danilo Ravotto and Edgar E. S{\'{a}}nchez and Matteo Sonza Reorda}, title = {A Hybrid Approach to the Test of Cache Memory Controllers Embedded in SoCs}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {143--148}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.22}, doi = {10.1109/IOLTS.2008.22}, timestamp = {Thu, 27 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iolts/PerezVRSR08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/PignolPCBE08, author = {Michel Pignol and Thierry Parrain and Vincent Claverie and Christian Bol{\'{e}}at and Guy Estaves}, title = {Development of a Testbench for Validation of {DMT} and {DT2} Fault-Tolerant Architectures on {SOI} PowerPC7448}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {182--184}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.24}, doi = {10.1109/IOLTS.2008.24}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/PignolPCBE08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/PontarelliCRS08, author = {Salvatore Pontarelli and Gian Carlo Cardarilli and Marco Re and Adelio Salsano}, title = {Totally Fault Tolerant {RNS} Based {FIR} Filters}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {192--194}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.14}, doi = {10.1109/IOLTS.2008.14}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/PontarelliCRS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/PougetDFPLFV08, author = {Vincent Pouget and Alexandre Douin and Gilles Foucard and Paul Peronnard and Dean Lewis and Pascal Fouillat and Raoul Velazco}, title = {Dynamic Testing of an SRAM-Based {FPGA} by Time-Resolved Laser Fault Injection}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {295--301}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.39}, doi = {10.1109/IOLTS.2008.39}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/PougetDFPLFV08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ReddyAP08, author = {M. Kiran Kumar Reddy and Bharadwaj S. Amrutur and Rubin A. Parekhji}, title = {False Error Study of On-line Soft Error Detection Mechanisms}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {53--58}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.29}, doi = {10.1109/IOLTS.2008.29}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ReddyAP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/RefanASPN08, author = {Fatemeh Refan and Homa Alemzadeh and Saeed Safari and Paolo Prinetto and Zainalabedin Navabi}, title = {Reliability in Application Specific Mesh-Based NoC Architectures}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {207--212}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.53}, doi = {10.1109/IOLTS.2008.53}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/RefanASPN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/RichterOG08, author = {Michael Richter and Klaus Oberl{\"{a}}nder and Michael G{\"{o}}ssel}, title = {New Linear {SEC-DED} Codes with Reduced Triple Bit Error Miscorrection Probability}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {37--42}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.27}, doi = {10.1109/IOLTS.2008.27}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/RichterOG08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/RocheLGDZD08, author = {Philippe Roche and Mark Lysinger and Gilles Gasiot and Jean{-}Marc Daveau and Mehdi Zamanian and Pierre Dautriche}, title = {Growing Interest of Advanced Commercial {CMOS} Technologies for Space and Medical Applications. Illustration with a New Nano-Power and Radiation-Hardened {SRAM} in 130nm {CMOS}}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {46--48}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.60}, doi = {10.1109/IOLTS.2008.60}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/RocheLGDZD08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/RusuGA08, author = {Claudia Rusu and Cristian Grecu and Lorena Anghel}, title = {Communication Aware Recovery Configurations for Networks-on-Chip}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {201--206}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.44}, doi = {10.1109/IOLTS.2008.44}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iolts/RusuGA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/RuzickaSP08, author = {Richard Ruzicka and Luk{\'{a}}s Sekanina and Roman Prokop}, title = {Physical Demonstration of Polymorphic Self-Checking Circuits}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {31--36}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.23}, doi = {10.1109/IOLTS.2008.23}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/RuzickaSP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/SanyalAK08, author = {Alodeep Sanyal and Syed M. Alam and Sandip Kundu}, title = {A Built-In Self-Test Scheme for Soft Error Rate Characterization}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {65--70}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.26}, doi = {10.1109/IOLTS.2008.26}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/SanyalAK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Seifert08, author = {Norbert Seifert}, title = {Special Session 1: Radiation Hardening Techniques}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {43--44}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.66}, doi = {10.1109/IOLTS.2008.66}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Seifert08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/Seifert08a, author = {Norbert Seifert}, title = {Soft Error Rates of Hardened Sequentials utilizing Local Redundancy}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {49--50}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.61}, doi = {10.1109/IOLTS.2008.61}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/Seifert08a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/SemiaoFRVSTT08, author = {Jorge Semi{\~{a}}o and Judit Freijedo and Juan J. Rodr{\'{\i}}guez{-}Andina and Fabian Vargas and Marcelino B. Santos and Isabel C. Teixeira and Jo{\~{a}}o Paulo Teixeira}, title = {Exploiting Parametric Power Supply and/or Temperature Variations to Improve Fault Tolerance in Digital Circuits}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {227--232}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.51}, doi = {10.1109/IOLTS.2008.51}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/SemiaoFRVSTT08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ShafikRA08, author = {Rishad A. Shafik and Paul M. Rosinger and Bashir M. Al{-}Hashimi}, title = {SystemC-Based Minimum Intrusive Fault Injection Technique with Improved Fault Representation}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {99--104}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.25}, doi = {10.1109/IOLTS.2008.25}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ShafikRA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ShiyanovskiiWP08, author = {Yuriy Shiyanovskii and Francis G. Wolff and Christos A. Papachristou}, title = {{SRAM} Cell Design Protected from {SEU} Upsets}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {169--170}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.49}, doi = {10.1109/IOLTS.2008.49}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ShiyanovskiiWP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/SudireddyKK08, author = {Samara Sudireddy and Jayawant Kakade and Dimitri Kagaris}, title = {Deterministic Built-in {TPG} with Segmented FSMs}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {261--266}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.37}, doi = {10.1109/IOLTS.2008.37}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/SudireddyKK08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/UemuraTTS08, author = {Taiki Uemura and Ryo Tanabe and Yoshiharu Tosaka and Shigeo Satoh}, title = {Using Low Pass Filters in Mitigation Techniques against Single-Event Transients in 45nm Technology LSIs}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {117--122}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.28}, doi = {10.1109/IOLTS.2008.28}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/UemuraTTS08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/VemuA08, author = {Ramtilak Vemu and Jacob A. Abraham}, title = {Budget-Dependent Control-Flow Error Detection}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {73--78}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.52}, doi = {10.1109/IOLTS.2008.52}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/VemuA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/VialBGLPV08, author = {Julien Vial and Alberto Bosio and Patrick Girard and Christian Landrault and Serge Pravossoudovitch and Arnaud Virazel}, title = {Yield Improvement, Fault-Tolerance to the Rescue?}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {165--166}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.10}, doi = {10.1109/IOLTS.2008.10}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/VialBGLPV08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/WenAP08, author = {Shi{-}Jie Wen and Dan Alexandrescu and Renaud Perez}, title = {A Systematical Method of Quantifying {SEU} {FIT}}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {109--114}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.62}, doi = {10.1109/IOLTS.2008.62}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/WenAP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/YangCDRP08, author = {Fan Yang and Sreejit Chakravarty and Narendra Devta{-}Prasanna and Sudhakar M. Reddy and Irith Pomeranz}, title = {An Enhanced Logic {BIST} Architecture for Online Testing}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {10--15}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.48}, doi = {10.1109/IOLTS.2008.48}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/YangCDRP08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ZajacCN08, author = {Piotr Zajac and Jacques Henri Collet and Andrzej Napieralski}, title = {Self-Configuration and Reachability Metrics in Massively Defective Multiport Chips}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {219--224}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.58}, doi = {10.1109/IOLTS.2008.58}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ZajacCN08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/iolts/ZhaoC08, author = {Yang Zhao and Krishnendu Chakrabarty}, title = {On-Line Testing of Lab-on-Chip Using Digital Microfluidic Compactors}, booktitle = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, pages = {213--218}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/IOLTS.2008.45}, doi = {10.1109/IOLTS.2008.45}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/iolts/ZhaoC08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/iolts/2008, title = {14th {IEEE} International On-Line Testing Symposium {(IOLTS} 2008), 7-9 July 2008, Rhodes, Greece}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://ieeexplore.ieee.org/xpl/conhome/4567040/proceeding}, isbn = {978-0-7695-3264-6}, timestamp = {Wed, 16 Oct 2019 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/iolts/2008.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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