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@inproceedings{DBLP:conf/ets/AliZAH06,
  author       = {Noohul Basheer Zain Ali and
                  Mark Zwolinski and
                  Bashir M. Al{-}Hashimi and
                  Peter Harrod},
  title        = {Dynamic Voltage Scaling Aware Delay Fault Testing},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {15--20},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.13},
  doi          = {10.1109/ETS.2006.13},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/AliZAH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/AmoryGMLM06,
  author       = {Alexandre M. Amory and
                  Kees Goossens and
                  Erik Jan Marinissen and
                  Marcelo Lubaszewski and
                  Fernando Moraes},
  title        = {Wrapper Design for the Reuse of Networks-on-Chip as Test Access Mechanism},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {213--218},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.48},
  doi          = {10.1109/ETS.2006.48},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/AmoryGMLM06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/AshoueiBC06,
  author       = {Maryam Ashouei and
                  Soumendu Bhattacharya and
                  Abhijit Chatterjee},
  title        = {Improving {SNR} for {DSM} Linear Systems Using Probabilistic Error
                  Correction and State Restoration: {A} Comparative Study},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {35--42},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.26},
  doi          = {10.1109/ETS.2006.26},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/AshoueiBC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/BensoBCNP06,
  author       = {Alfredo Benso and
                  Alberto Bosio and
                  Stefano Di Carlo and
                  Giorgio Di Natale and
                  Paolo Prinetto},
  title        = {A 22n March Test for Realistic Static Linked Faults in SRAMs},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {49--54},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.2},
  doi          = {10.1109/ETS.2006.2},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/BensoBCNP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/BoutobzaNLC06,
  author       = {Slimane Boutobza and
                  Michael Nicolaidis and
                  Kheiredine M. Lamara and
                  Andrea Costa},
  title        = {A Transparent based Programmable Memory {BIST}},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {89--96},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.7},
  doi          = {10.1109/ETS.2006.7},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/BoutobzaNLC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/CiminoLMTDB06,
  author       = {Mika{\"{e}}l Cimino and
                  Herv{\'{e}} Lapuyade and
                  M. De Matos and
                  Thierry Taris and
                  Yann Deval and
                  Jean{-}Baptiste B{\'{e}}gueret},
  title        = {A Robust 130nm-CMOS Built-In Current Sensor Dedicated to {RF} Applications},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {151--158},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.6},
  doi          = {10.1109/ETS.2006.6},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/CiminoLMTDB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/CollinsA06,
  author       = {Matthew Collins and
                  Bashir M. Al{-}Hashimi},
  title        = {On-Chip Time Measurement Architecture with Femtosecond Timing Resolution},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {103--110},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.36},
  doi          = {10.1109/ETS.2006.36},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/CollinsA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/DasMH06,
  author       = {Ramashis Das and
                  Igor L. Markov and
                  John P. Hayes},
  title        = {On-Chip Test Generation Using Linear Subspaces},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {111--116},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.35},
  doi          = {10.1109/ETS.2006.35},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/DasMH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/DevtaprasannaGKRP06,
  author       = {Narendra Devta{-}Prasanna and
                  Arun Gunda and
                  P. Krishnamurthy and
                  Sudhakar M. Reddy and
                  Irith Pomeranz},
  title        = {A Unified Method to Detect Transistor Stuck-Open Faults and Transition
                  Delay Faults},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {185--192},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.8},
  doi          = {10.1109/ETS.2006.8},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/DevtaprasannaGKRP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/EklowB06,
  author       = {Bill Eklow and
                  Ben Bennetts},
  title        = {New Techniques for Accessing Embedded Instrumentation: {IEEE} {P1687}
                  {(IJTAG)}},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {253--254},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.33},
  doi          = {10.1109/ETS.2006.33},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/EklowB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/FresnaudBDBJACG06,
  author       = {Vincent Fresnaud and
                  Lilian Bossuet and
                  Dominique Dallet and
                  Serge Bernard and
                  Jean{-}Marie Janik and
                  B. Agnus and
                  Philippe Cauvet and
                  Ph. Gandy},
  title        = {A Low Cost Alternative Method for Harmonics Estimation in a {BIST}
                  Context},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {193--198},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.5},
  doi          = {10.1109/ETS.2006.5},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/FresnaudBDBJACG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Furber06,
  author       = {Steve B. Furber},
  title        = {Living with Failure: Lessons from Nature?},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {4--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.28},
  doi          = {10.1109/ETS.2006.28},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/Furber06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GhermanWSG06,
  author       = {Valentin Gherman and
                  Hans{-}Joachim Wunderlich and
                  J{\"{u}}rgen Schl{\"{o}}ffel and
                  Michael Garbers},
  title        = {Deterministic Logic {BIST} for Transition Fault Testing},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {123--130},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.12},
  doi          = {10.1109/ETS.2006.12},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/GhermanWSG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GoelMG06,
  author       = {Sandeep Kumar Goel and
                  Maurice Meijer and
                  Jos{\'{e}} Pineda de Gyvez},
  title        = {Testing and Diagnosis of Power Switches in SOCs},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {145--150},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.47},
  doi          = {10.1109/ETS.2006.47},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/GoelMG06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GoyalCA06,
  author       = {Shalabh Goyal and
                  Abhijit Chatterjee and
                  Mike Atia},
  title        = {Reducing Sampling Clock Jitter to Improve {SNR} Measurement of {A/D}
                  Converters in Production Test},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {165--172},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.39},
  doi          = {10.1109/ETS.2006.39},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/GoyalCA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/GuglielmoFMP06,
  author       = {Giuseppe Di Guglielmo and
                  Franco Fummi and
                  Cristina Marconcini and
                  Graziano Pravadelli},
  title        = {{FATE:} a Functional {ATPG} to Traverse Unstabilized EFSMs},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {179--184},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.21},
  doi          = {10.1109/ETS.2006.21},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/GuglielmoFMP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HanGBC06,
  author       = {Donghoon Han and
                  Shalabh Goyal and
                  Soumendu Bhattacharya and
                  Abhijit Chatterjee},
  title        = {Low Cost Parametric Failure Diagnosis of {RF} Transceivers},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {205--212},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.30},
  doi          = {10.1109/ETS.2006.30},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/HanGBC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HarutunyanVZ06,
  author       = {Gurgen Harutunyan and
                  Valery A. Vardanian and
                  Yervant Zorian},
  title        = {Minimal March Tests for Dynamic Faults in Random Access Memories},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {43--48},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.32},
  doi          = {10.1109/ETS.2006.32},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/HarutunyanVZ06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HeijmenN06,
  author       = {Tino Heijmen and
                  Andr{\'{e}} Nieuwland},
  title        = {Soft-Error Rate Testing of Deep-Submicron Integrated Circuits},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {247--252},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.42},
  doi          = {10.1109/ETS.2006.42},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/HeijmenN06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HosseinabadyLNCBP06,
  author       = {Mohammad Hosseinabady and
                  Pejman Lotfi{-}Kamran and
                  Giorgio Di Natale and
                  Stefano Di Carlo and
                  Alfredo Benso and
                  Paolo Prinetto},
  title        = {Single-Event Upset Analysis and Protection in High Speed Circuits},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {29--34},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.41},
  doi          = {10.1109/ETS.2006.41},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/HosseinabadyLNCBP06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/HuangL06,
  author       = {Yu{-}Jen Huang and
                  Jin{-}Fu Li},
  title        = {Testing Active Neighborhood Pattern-Sensitive Faults of Ternary Content
                  Addressable Memories},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {55--62},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.46},
  doi          = {10.1109/ETS.2006.46},
  timestamp    = {Tue, 17 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/HuangL06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KatohI06,
  author       = {Kentaroh Katoh and
                  Hideo Ito},
  title        = {Built-In Self-Test for PEs of Coarse Grained Dynamically Reconfigurable
                  Devices},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {69--74},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.10},
  doi          = {10.1109/ETS.2006.10},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/KatohI06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KerzerhoCBACR06,
  author       = {Vincent Kerzerho and
                  Philippe Cauvet and
                  Serge Bernard and
                  Florence Aza{\"{\i}}s and
                  Mariane Comte and
                  Michel Renovell},
  title        = {"Analogue Network of Converters": {A} {DFT} Technique to Test a Complete
                  Set of ADCs and DACs Embedded in a Complex SiP or {SOC}},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {159--164},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.1},
  doi          = {10.1109/ETS.2006.1},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/KerzerhoCBACR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KimSCA06,
  author       = {Byoungho Kim and
                  Hongjoong Shin and
                  Ji Hwan (Paul) Chun and
                  Jacob A. Abraham},
  title        = {Optimized Signature-Based Statistical Alternate Test for Mixed-Signal
                  Performance Parameters},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {199--204},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.37},
  doi          = {10.1109/ETS.2006.37},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/KimSCA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/KopecGGH06,
  author       = {Michal Kopec and
                  Tomasz Garbolino and
                  Krzysztof Gucwa and
                  Andrzej Hlawiczka},
  title        = {Test-per-Clock Detection, Localization and Identification of Interconnect
                  Faults},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {233--238},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.45},
  doi          = {10.1109/ETS.2006.45},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/KopecGGH06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/LaquaiHSB06,
  author       = {Bernd Laquai and
                  Martin Hua and
                  Guido Schulze and
                  Michael Braun},
  title        = {A Flexible and Scaleable Methodology for Testing High Speed Source
                  Synchronous Interfaces on {ATE} with Multiple Fixed Phase Capture
                  and Compare},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {97--102},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.4},
  doi          = {10.1109/ETS.2006.4},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/LaquaiHSB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/LegerR06,
  author       = {Gildas L{\'{e}}ger and
                  Adoraci{\'{o}}n Rueda},
  title        = {Experimental Validation of a Fully Digital BISTfor Cascaded Sigma
                  Delta Modulators},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {131--136},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.20},
  doi          = {10.1109/ETS.2006.20},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/LegerR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/PoehlRBGAO06,
  author       = {Frank Poehl and
                  Jan Rzeha and
                  Matthias Beck and
                  Michael G{\"{o}}ssel and
                  Ralf Arnold and
                  Peter Ossimitz},
  title        = {On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data
                  - {A} Test Time Efficient Scan Diagnosis Architecture},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {239--246},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.34},
  doi          = {10.1109/ETS.2006.34},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/PoehlRBGAO06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/PogielRT06,
  author       = {Artur Pogiel and
                  Janusz Rajski and
                  Jerzy Tyszer},
  title        = {Convolutional Compactors with Variable Polynomials},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {117--122},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.11},
  doi          = {10.1109/ETS.2006.11},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/PogielRT06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/PomeranzR06,
  author       = {Irith Pomeranz and
                  Sudhakar M. Reddy},
  title        = {Fault Collapsing for Transition Faults Using Extended Transition Faults},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {173--178},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.22},
  doi          = {10.1109/ETS.2006.22},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/PomeranzR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/RaoOK06,
  author       = {Wenjing Rao and
                  Alex Orailoglu and
                  Ramesh Karri},
  title        = {Fault Identification in Reconfigurable Carry Lookahead Adders Targeting
                  Nanoelectronic Fabrics},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {63--68},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.23},
  doi          = {10.1109/ETS.2006.23},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/RaoOK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ReordaSVPLE06,
  author       = {Matteo Sonza Reorda and
                  Luca Sterpone and
                  Massimo Violante and
                  Marta Portela{-}Garc{\'{\i}}a and
                  Celia L{\'{o}}pez{-}Ongil and
                  Luis Entrena},
  title        = {Fault Injection-based Reliability Evaluation of SoPCs},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {75--82},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.24},
  doi          = {10.1109/ETS.2006.24},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/ReordaSVPLE06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/Saxby06,
  author       = {Robin Saxby},
  title        = {Innovation and Wealth Creation from Technology},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {3},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.27},
  doi          = {10.1109/ETS.2006.27},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/Saxby06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/SchulerFC06,
  author       = {Erik Sch{\"{u}}ler and
                  Daniel Scain Farenzena and
                  Luigi Carro},
  title        = {Evaluating Sigma-Delta Modulated Signals to Develop Fault-Tolerant
                  Circuits},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {137--144},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.19},
  doi          = {10.1109/ETS.2006.19},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/SchulerFC06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ShangYBXB06,
  author       = {Delong Shang and
                  Alexandre Yakovlev and
                  Frank P. Burns and
                  Fei Xia and
                  Alexandre V. Bystrov},
  title        = {Low-Cost Online Testing of Asynchronous Handshakes},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {225--232},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.31},
  doi          = {10.1109/ETS.2006.31},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/ShangYBXB06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/TranDBBR06,
  author       = {Xuan{-}Tu Tran and
                  Jean Durupt and
                  Fran{\c{c}}ois Bertrand and
                  Vincent Beroulle and
                  Chantal Robach},
  title        = {A {DFT} Architecture for Asynchronous Networks-on-Chip},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {219--224},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.3},
  doi          = {10.1109/ETS.2006.3},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/TranDBBR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/XuS06,
  author       = {Gefu Xu and
                  Adit D. Singh},
  title        = {Low Cost Launch-on-Shift Delay Test with Slow Scan Enable},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {9--14},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.29},
  doi          = {10.1109/ETS.2006.29},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/XuS06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/XuWY06,
  author       = {Qiang Xu and
                  Baosheng Wang and
                  F. Y. Young},
  title        = {Retention-Aware Test Scheduling for BISTed Embedded SRAMs},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {83--88},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.40},
  doi          = {10.1109/ETS.2006.40},
  timestamp    = {Thu, 30 Mar 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/XuWY06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ets/ZhangRPRA06,
  author       = {Zhuo Zhang and
                  Sudhakar M. Reddy and
                  Irith Pomeranz and
                  Janusz Rajski and
                  Bashir M. Al{-}Hashimi},
  title        = {Enhancing Delay Fault Coverage through Low Power Segmented Scan},
  booktitle    = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  pages        = {21--28},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/ETS.2006.18},
  doi          = {10.1109/ETS.2006.18},
  timestamp    = {Thu, 23 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ets/ZhangRPRA06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/ets/2006,
  title        = {11th European Test Symposium, {ETS} 2006, Southhampton, UK, May 21-24,
                  2006},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/10839/proceeding},
  isbn         = {0-7695-2566-0},
  timestamp    = {Tue, 28 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ets/2006.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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