Search dblp for Publications

export results for "toc:db/conf/ats/ats2022.bht:"

 download as .bib file

@inproceedings{DBLP:conf/ats/AddepalliPANSV22,
  author       = {Hari Addepalli and
                  Irith Pomeranz and
                  M. Enamul Amyeen and
                  Suriyaprakash Natarajan and
                  Arani Sinha and
                  Srikanth Venkataraman},
  title        = {Using Fault Detection Tests to Produce Diagnostic Tests Targeting
                  Large Sets of Candidate Faults},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {120--125},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00033},
  doi          = {10.1109/ATS56056.2022.00033},
  timestamp    = {Wed, 11 Jan 2023 14:55:55 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/AddepalliPANSV22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/AditiH22,
  author       = {Aditi and
                  Michael S. Hsiao},
  title        = {Hybrid Rule-based and Machine Learning System for Assertion Generation
                  from Natural Language Specifications},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {126--131},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00034},
  doi          = {10.1109/ATS56056.2022.00034},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/AditiH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/ChouWSC22,
  author       = {Yu{-}You Chou and
                  Cheng{-}Wen Wu and
                  Ming{-}Der Shieh and
                  Chao{-}Hsun Chen},
  title        = {Battery Pack Reliability and Endurance Enhancement for Electric Vehicles
                  by Dynamic Reconfiguration},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {66--71},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00024},
  doi          = {10.1109/ATS56056.2022.00024},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/ChouWSC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/DeligiannisFCC022,
  author       = {Nikolaos Ioannis Deligiannis and
                  Tobias Faller and
                  Josie E. Rodriguez Condia and
                  Riccardo Cantoro and
                  Bernd Becker and
                  Matteo Sonza Reorda},
  title        = {Using Formal Methods to Support the Development of STLs for GPUs},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {84--89},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00027},
  doi          = {10.1109/ATS56056.2022.00027},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/DeligiannisFCC022.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/DuhWSCF22,
  author       = {Kuan{-}Hsun Duh and
                  Cheng{-}Wen Wu and
                  Ming{-}Der Shieh and
                  Chao{-}Hsun Chen and
                  Ming{-}Yan Fan},
  title        = {Aging Impact of Power MOSFETs in Charger with Different Operation
                  Frequency},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {54--59},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00022},
  doi          = {10.1109/ATS56056.2022.00022},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/DuhWSCF22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/HsiehTW22,
  author       = {Tong{-}Yu Hsieh and
                  Pao{-}Wei Tsui and
                  Jun{-}Tsung Wu},
  title        = {On No-Reference Error Detection of an Image Stitching System Based
                  on Error-Tolerance},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {150--155},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00038},
  doi          = {10.1109/ATS56056.2022.00038},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HsiehTW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/HuangCZLC22,
  author       = {Huixian Huang and
                  Xiaole Cui and
                  Shuming Zhang and
                  Ge Li and
                  Xiaoxin Cui},
  title        = {An obfuscation scheme of scan chain to protect the cryptographic chips},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {19--24},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00016},
  doi          = {10.1109/ATS56056.2022.00016},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HuangCZLC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/HuangFH22,
  author       = {Wan Ju Huang and
                  Hsiao{-}Wen Fu and
                  Tsung{-}Chu Huang},
  title        = {{AN-HRNS:} AN-Coded Hierarchical Residue Number System for Reliable
                  Neural Network Accelerators},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {132--137},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00035},
  doi          = {10.1109/ATS56056.2022.00035},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HuangFH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/HuangSLL22,
  author       = {Hao Huang and
                  Haihua Shen and
                  Shan Li and
                  Huawei Li},
  title        = {A Hardware Trojan Trigger Localization Method in {RTL} based on Control
                  Flow Features},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {138--143},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00036},
  doi          = {10.1109/ATS56056.2022.00036},
  timestamp    = {Mon, 15 May 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/HuangSLL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/HuangYLC22,
  author       = {Zih{-}Ming Huang and
                  Dun{-}An Yang and
                  Jing{-}Jia Liou and
                  Harry H. Chen},
  title        = {FPGA-Based Emulation for Accelerating Transient Fault Reduction Analysis},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {144--149},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00037},
  doi          = {10.1109/ATS56056.2022.00037},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/HuangYLC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/JanaB0BUF22,
  author       = {Utsav Jana and
                  Sourav Banerjee and
                  Binod Kumar and
                  Madhu B and
                  Shankar Umapathi and
                  Masahiro Fujita},
  title        = {Deep Learning-assisted Scan Chain Diagnosis with Different Fault Models
                  during Manufacturing Test},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {72--77},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00025},
  doi          = {10.1109/ATS56056.2022.00025},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/JanaB0BUF22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/KatoMK22,
  author       = {Takaaki Kato and
                  Yousuke Miyake and
                  Seiji Kajihara},
  title        = {On Correction of {A} Delay Value Using Ring-Oscillators for Aging
                  Detection and Prediction},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {60--65},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00023},
  doi          = {10.1109/ATS56056.2022.00023},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KatoMK22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/KoyluFHT22,
  author       = {Troya {\c{C}}agil K{\"{o}}yl{\"{u}} and
                  Moritz Fieback and
                  Said Hamdioui and
                  Mottaqiallah Taouil},
  title        = {Using Hopfield Networks to Correct Instruction Faults},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {102--107},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00030},
  doi          = {10.1109/ATS56056.2022.00030},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KoyluFHT22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/KumarRPA22,
  author       = {Gaurav Kumar and
                  Anjum Riaz and
                  Yamuna Prasad and
                  Satyadev Ahlawat},
  title        = {A New Access Protocol for Elevating the Security of {IJTAG} Network},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {31--36},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00018},
  doi          = {10.1109/ATS56056.2022.00018},
  timestamp    = {Tue, 21 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/KumarRPA22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/LiL22,
  author       = {Jin{-}Fu Li and
                  Jing{-}Jia Liou},
  title        = {Foreword: {ATS} 2022},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {x},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00005},
  doi          = {10.1109/ATS56056.2022.00005},
  timestamp    = {Tue, 17 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/LiL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/LuLH22,
  author       = {Shyue{-}Kung Lu and
                  Zhi{-}Jia Liu and
                  Masaki Hashizume},
  title        = {Fault Securing Techniques for Yield and Reliability Enhancement of
                  {RRAM}},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {13--18},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00015},
  doi          = {10.1109/ATS56056.2022.00015},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LuLH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/LylinaWW22,
  author       = {Natalia Lylina and
                  Chih{-}Hao Wang and
                  Hans{-}Joachim Wunderlich},
  title        = {Online Periodic Test of Reconfigurable Scan Networks},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {78--83},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00026},
  doi          = {10.1109/ATS56056.2022.00026},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/LylinaWW22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/MamgainMTB22,
  author       = {Ankush Mamgain and
                  Salvador Mir and
                  Jai Narayan Tripathi and
                  Manuel J. Barrag{\'{a}}n},
  title        = {On-chip calibration for high-speed harmonic cancellation-based sinusoidal
                  signal generators},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {43--48},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00020},
  doi          = {10.1109/ATS56056.2022.00020},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/MamgainMTB22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/NieCS22,
  author       = {Xiaofan Nie and
                  Liwei Chen and
                  Gang Shi},
  title        = {PointerChecker: Tag-Based and Hardware-Assisted Memory Safety against
                  Memory Corruption},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {96--101},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00029},
  doi          = {10.1109/ATS56056.2022.00029},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/NieCS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/OhmatsuOIYLH22,
  author       = {Masao Ohmatsu and
                  Yuto Ohtera and
                  Yuki Ikiri and
                  Hiroyuki Yotsuyanagi and
                  Shyue{-}Kung Lu and
                  Masaki Hashizume},
  title        = {Enhanced Interconnect Test Method for Resistive Open Defects in Final
                  Tests with Relaxation Oscillators},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {49--53},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00021},
  doi          = {10.1109/ATS56056.2022.00021},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/OhmatsuOIYLH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/Pomeranz22,
  author       = {Irith Pomeranz},
  title        = {Two-Dimensional Test Generation Objective},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {108--113},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00031},
  doi          = {10.1109/ATS56056.2022.00031},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Pomeranz22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/Pomeranz22a,
  author       = {Irith Pomeranz},
  title        = {Selecting Path Delay Faults Through the Largest Subcircuits of Uncovered
                  Lines},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {114--119},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00032},
  doi          = {10.1109/ATS56056.2022.00032},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Pomeranz22a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/Pomeranz22b,
  author       = {Irith Pomeranz},
  title        = {Usable Circuits with Imperfect Scan Logic},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {156--161},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00039},
  doi          = {10.1109/ATS56056.2022.00039},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/Pomeranz22b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/SatoNKIO0OIZKKH22,
  author       = {Keno Sato and
                  Takayuki Nakatani and
                  Shogo Katayama and
                  Daisuke Iimori and
                  Gaku Ogihara and
                  Takashi Ishida and
                  Toshiyuki Okamoto and
                  Tamotsu Ichikawa and
                  Yujie Zhao and
                  Kentaroh Katoh and
                  Anna Kuwana and
                  Kazumi Hatayama and
                  Haruo Kobayashi},
  title        = {High Precision Voltage Measurement System Utilizing Low-End {ATE}
                  Resource and {BOST}},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {37--42},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00019},
  doi          = {10.1109/ATS56056.2022.00019},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/SatoNKIO0OIZKKH22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/WangLLC22,
  author       = {Sying{-}Jyan Wang and
                  Katherine Shu{-}Min Li and
                  Chen{-}Yeh Lin and
                  Song{-}Kong Chong},
  title        = {Intrusion Detection and Obfuscation Mechanism for PUF-Based Authentication},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {90--95},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00028},
  doi          = {10.1109/ATS56056.2022.00028},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/ats/WangLLC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/YanDZH00W22,
  author       = {Aibin Yan and
                  Liang Ding and
                  Zhen Zhou and
                  Zhengfeng Huang and
                  Jie Cui and
                  Patrick Girard and
                  Xiaoqing Wen},
  title        = {A Radiation-Hardened Non-Volatile Magnetic Latch with High Reliability
                  and Persistent Storage},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00013},
  doi          = {10.1109/ATS56056.2022.00013},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/YanDZH00W22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/YehLC22,
  author       = {Shih{-}Chun Yeh and
                  Kuen{-}Jong Lee and
                  Dong{-}Yi Chen},
  title        = {An Authentication-Based Secure {IJTAG} Network},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {25--30},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00017},
  doi          = {10.1109/ATS56056.2022.00017},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/YehLC22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/ats/ZhuJS22,
  author       = {Weidong Zhu and
                  Jianhui Jiang and
                  Zhanhui Shi},
  title        = {Locating Critical-Reliability Gates for Sequential Circuits based
                  on the Time Window Graph Model},
  booktitle    = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  pages        = {7--12},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022.00014},
  doi          = {10.1109/ATS56056.2022.00014},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/ZhuJS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/ats/2022,
  title        = {{IEEE} 31st Asian Test Symposium, {ATS} 2022, Taichung City, Taiwan,
                  November 21-24, 2022},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/ATS56056.2022},
  doi          = {10.1109/ATS56056.2022},
  isbn         = {978-1-6654-7227-2},
  timestamp    = {Wed, 11 Jan 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/ats/2022.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.