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@article{DBLP:journals/mr/AbbateBFI06, author = {Carmine Abbate and Giovanni Busatto and Luigi Fratelli and Francesco Iannuzzo}, title = {The high frequency behaviour of high voltage and current {IGBT} modules}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1848--1853}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.068}, doi = {10.1016/J.MICROREL.2006.07.068}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AbbateBFI06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AgostinelliLPMMJ06, author = {Marty Agostinelli and Shing Lau and Sangwoo Pae and Phil Marzolf and Harish Muthali and Steve Jacobs}, title = {{PMOS} NBTI-induced circuit mismatch in advanced technologies}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {63--68}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.004}, doi = {10.1016/J.MICROREL.2005.05.004}, timestamp = {Thu, 23 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/AgostinelliLPMMJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AlbadriSGW06, author = {A. M. Albadri and Ronald D. Schrimpf and Kenneth F. Galloway and D. Greg Walker}, title = {Single event burnout in power diodes: Mechanisms and models}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {317--325}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.015}, doi = {10.1016/J.MICROREL.2005.06.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AlbadriSGW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AltesTW06, author = {Andreas Altes and Rainer Tilgner and W. Walter}, title = {Numerical evaluation of miniaturized resistive probe for quantitative thermal near-field microscopy of thermal conductivity}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1525--1529}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.030}, doi = {10.1016/J.MICROREL.2006.07.030}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AltesTW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AlvarezARCGKLSH06, author = {David Alvarez and Michel J. Abou{-}Khalil and Christian Russ and Kiran V. Chatty and Robert Gauthier and D. Kontos and Junjun Li and Christopher Seguin and Ralph Halbach}, title = {Analysis of {ESD} failure mechanism in 65nm bulk {CMOS} {ESD} NMOSFETs with {ESD} implant}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1597--1602}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.041}, doi = {10.1016/J.MICROREL.2006.07.041}, timestamp = {Thu, 02 Feb 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AlvarezARCGKLSH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ArshadAJO06, author = {Mohd Khairuddin Md Arshad and Ibrahim Ahmad and Azman Jalar and Ghazali Omar}, title = {The surface characteristics of under bump metallurgy {(UBM)} in electroless nickel immersion gold {(ENIG)} deposition}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {367--379}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.018}, doi = {10.1016/J.MICROREL.2005.01.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ArshadAJO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ArulvananZS06, author = {Periannan Arulvanan and Zhaowei Zhong and Xunqing Shi}, title = {Effects of process conditions on reliability, microstructure evolution and failure modes of SnAgCu solder joints}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {432--439}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.005}, doi = {10.1016/J.MICROREL.2005.05.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ArulvananZS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AubelBKHH06, author = {Oliver Aubel and Eberhard Bugiel and Dietmar Kr{\"{u}}ger and Wolfgang Hasse and Martina Hommel}, title = {Investigation of the influence of thermal treatment on interconnect-barrier interfaces in copper metallization systems}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {768--773}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.010}, doi = {10.1016/J.MICROREL.2005.10.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AubelBKHH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/AugereauOLB06, author = {Jean Augereau and Yves Ousten and Bruno Levrier and Laurent B{\'{e}}chou}, title = {Use of signal processing imaging for the study of a 3D package in harsh environment}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1922--1925}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.081}, doi = {10.1016/J.MICROREL.2006.07.081}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/AugereauOLB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BalkGW06, author = {L. J. Balk and W. H. Gerling and E. Wolfgang}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1401--1402}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.004}, doi = {10.1016/J.MICROREL.2006.07.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BalkGW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BarliniCCMF06, author = {Davide Barlini and Mauro Ciappa and Alberto Castellazzi and Michel Mermet{-}Guyennet and Wolfgang Fichtner}, title = {New technique for the measurement of the static and of the transient junction temperature in {IGBT} devices under operating conditions}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1772--1777}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.058}, doi = {10.1016/J.MICROREL.2006.07.058}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BarliniCCMF06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BelaidKMGMM06, author = {Mohamed Ali Bela{\"{\i}}d and K. Ketata and Mohamed Masmoudi and M. Gares and Hichame Maanane and J{\'{e}}r{\^{o}}me Marcon}, title = {Electrical parameters degradation of power {RF} {LDMOS} device after accelerated ageing tests}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1800--1805}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.073}, doi = {10.1016/J.MICROREL.2006.07.073}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BelaidKMGMM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BenmansourAMW06, author = {Adel Benmansour and Stephane Azzopardi and Jean{-}Christophe Martin and Eric Woirgard}, title = {Failure mechanism of trench {IGBT} under short-circuit after turn-off}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1778--1783}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.059}, doi = {10.1016/J.MICROREL.2006.07.059}, timestamp = {Wed, 03 Aug 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BenmansourAMW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BergbauerLFB06, author = {Werner Bergbauer and Thomas Lutz and Werner Frammelsberger and Guenther Benstetter}, title = {Kelvin probe force microscopy - An appropriate tool for the electrical characterisation of {LED} heterostructures}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1736--1740}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.064}, doi = {10.1016/J.MICROREL.2006.07.064}, timestamp = {Wed, 27 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BergbauerLFB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BernsteinGLWST06, author = {Joseph B. Bernstein and Moshe Gurfinkel and Xiaojun Li and J{\"{o}}rg Walters and Yoram Shapira and Michael Talmor}, title = {Electronic circuit reliability modeling}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {1957--1979}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.004}, doi = {10.1016/J.MICROREL.2005.12.004}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BernsteinGLWST06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BlankeT06, author = {Mogens Blanke and Jesper Sandberg Thomsen}, title = {Electrical steering of vehicles - fault-tolerant analysis and design}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1421--1432}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.005}, doi = {10.1016/J.MICROREL.2006.07.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BlankeT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BonfertGWFKS06, author = {Detlef Bonfert and Horst A. Gieser and Heinrich Wolf and M. Frank and A. Konrad and J. Schulz}, title = {Transient-induced latch-up test setup for wafer-level and package-level}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1629--1633}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.002}, doi = {10.1016/J.MICROREL.2006.08.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BonfertGWFKS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BoutillierGBLVKG06, author = {Mathieu Boutillier and Olivier Gauthier{-}Lafaye and S. Bonnefont and F. Lozes{-}Dupuy and F.{-}J. Vermersch and M. Krakowski and Olivier Gilard}, title = {Strong electron irradiation hardness of 852 nm Al-free laser diodes}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1715--1719}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.049}, doi = {10.1016/J.MICROREL.2006.07.049}, timestamp = {Thu, 06 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BoutillierGBLVKG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BraunBKBAR06, author = {Tanja Braun and Karl{-}Friedrich Becker and Mathias Koch and Volker Bader and Rolf Aschenbrenner and Herbert Reichl}, title = {High-temperature reliability of Flip Chip assemblies}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {144--154}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.004}, doi = {10.1016/J.MICROREL.2005.06.004}, timestamp = {Thu, 02 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BraunBKBAR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BreachW06, author = {C. D. Breach and F. Wulff}, title = {Oxidation of Au\({}_{\mbox{4}}\)Al in un-moulded gold ballbonds after high temperature storage {(HTS)} in air at 175degreeC}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2112--2121}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.009}, doi = {10.1016/J.MICROREL.2005.12.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BreachW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BreachWT06, author = {C. D. Breach and F. Wulff and C. W. Tok}, title = {An unusual mechanical failure mode in gold ballbonds at 50mum pitch due to degradation at the Au-Au\({}_{\mbox{4}}\)Al interface during ageing in air at 175degreeC}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {543--557}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.019}, doi = {10.1016/J.MICROREL.2005.05.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BreachWT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BreitensteinARKG06, author = {O. Breitenstein and Frank Altmann and Thorsten Riediger and D. Karg and V. Gottschalk}, title = {Lock-in thermal {IR} imaging using a solid immersion lens}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1508--1513}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.027}, doi = {10.1016/J.MICROREL.2006.07.027}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/BreitensteinARKG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BriatLVW06, author = {Olivier Briat and Walid Lajnef and Jean{-}Michel Vinassa and Eric Woirgard}, title = {Power cycling tests for accelerated ageing of ultracapacitors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1445--1450}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.008}, doi = {10.1016/J.MICROREL.2006.07.008}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BriatLVW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BurmerG06, author = {Christian Burmer and Siegfried G{\"{o}}rlich}, title = {Failure analyses for debug and ramp-up of modern IC's}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1486--1497}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.024}, doi = {10.1016/J.MICROREL.2006.07.024}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BurmerG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BusattoIPSVC06, author = {Giovanni Busatto and Francesco Iannuzzo and Alberto Porzio and Annunziata Sanseverino and Francesco Velardi and Giuseppe Curr{\`{o}}}, title = {Experimental study of power MOSFET's gate damage in radiation environment}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1854--1857}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.069}, doi = {10.1016/J.MICROREL.2006.07.069}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BusattoIPSVC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/BuzzoCF06, author = {Marco Buzzo and Mauro Ciappa and Wolfgang Fichtner}, title = {Characterization of photonic devices by secondary electron potential contrast}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1536--1541}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.016}, doi = {10.1016/J.MICROREL.2006.07.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/BuzzoCF06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CaddemiCD06, author = {Alina Caddemi and Giovanni Crupi and Nicola Donato}, title = {Temperature effects on {DC} and small signal {RF} performance of AlGaAs/GaAs HEMTs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {169--173}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.003}, doi = {10.1016/J.MICROREL.2005.05.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CaddemiCD06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CassanelliMFVP06, author = {G. Cassanelli and Giovanna Mura and Fausto Fantini and Massimo Vanzi and Bernard Plano}, title = {Failure Analysis-assisted {FMEA}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1795--1799}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.072}, doi = {10.1016/J.MICROREL.2006.07.072}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CassanelliMFVP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CastellazziCFLM06, author = {Alberto Castellazzi and Mauro Ciappa and Wolfgang Fichtner and G. Lourdel and Michel Mermet{-}Guyennet}, title = {Compact modelling and analysis of power-sharing unbalances in IGBT-modules used in traction applications}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1754--1759}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.055}, doi = {10.1016/J.MICROREL.2006.07.055}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CastellazziCFLM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChangH06, author = {Yang{-}Hua Chang and Hui{-}Fen Hsu}, title = {Determination of thermal resistance using Gummel measurement for InGaP/GaAs HBTs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2074--2078}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.008}, doi = {10.1016/J.MICROREL.2005.12.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChangH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CharruauGDB06, author = {St{\'{e}}phane Charruau and Fabrice Gu{\'{e}}rin and Jesus Hern{\'{a}}ndez Dominguez and Julie Berthon}, title = {Reliability estimation of aeronautic component by accelerated tests}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1451--1457}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.009}, doi = {10.1016/J.MICROREL.2006.07.009}, timestamp = {Mon, 06 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/CharruauGDB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChatterjeeKLTM06, author = {S. Chatterjee and Yue Kuo and J. Lu and J.{-}Y. Tewg and P. Majhi}, title = {Electrical reliability aspects of HfO\({}_{\mbox{2}}\) high-k gate dielectrics with TaN metal gate electrodes under constant voltage stress}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {69--76}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.004}, doi = {10.1016/J.MICROREL.2005.02.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChatterjeeKLTM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenCLZ06, author = {Ching{-}Yang Chen and Yung{-}Ching Chao and De{-}Shin Liu and Zhen{-}Wei Zhuang}, title = {Design of a novel chip on glass package solution for {CMOS} image sensor device}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1326--1334}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.003}, doi = {10.1016/J.MICROREL.2005.12.003}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenCLZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenE06, author = {Li Chen and M. M. El{-}Gomati}, title = {Stabilized emission from micro-field emitter for electron microscopy}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1209--1213}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.005}, doi = {10.1016/J.MICROREL.2005.10.005}, timestamp = {Thu, 09 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenE06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenGDBWMBT06, author = {Li Chen and O. J. Guy and D. Doneddu and S. G. J. Batcup and S. P. Wilks and P. A. Mawby and T. Bouchet and F. Torregrosa}, title = {Report on 4H-SiC {JTE} Schottky diodes}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {637--640}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.006}, doi = {10.1016/J.MICROREL.2005.07.006}, timestamp = {Thu, 09 Jul 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenGDBWMBT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenGHSSLRE06, author = {Fen Chen and J. Gill and Dave Harmon and T. Sullivan and A. Strong and B. Li and H. Rathore and Daniel C. Edelstein}, title = {Determination of the thermal conductivity of composite low-k dielectrics for advanced interconnect structures}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {232--243}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.016}, doi = {10.1016/J.MICROREL.2005.05.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenGHSSLRE06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenHC06, author = {Kuo{-}Ming Chen and Kuo{-}Hsiung Houng and Kuo{-}Ning Chiang}, title = {Thermal resistance analysis and validation of flip chip {PBGA} packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {440--448}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.001}, doi = {10.1016/J.MICROREL.2005.06.001}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenHC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenILD06, author = {Tze Wee Chen and Choshu Ito and William Loh and Robert W. Dutton}, title = {Post-breakdown leakage resistance and its dependence on device area}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1612--1616}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.044}, doi = {10.1016/J.MICROREL.2006.07.044}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenILD06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenJKL06, author = {K. M. Chen and D. S. Jiang and N. H. Kao and J. Y. Lai}, title = {Effects of underfill materials on the reliability of low-K flip-chip packaging}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {155--163}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.001}, doi = {10.1016/J.MICROREL.2005.05.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenJKL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenK06, author = {Shih{-}Hung Chen and Ming{-}Dou Ker}, title = {Failure analysis and solutions to overcome latchup failure event of a power controller {IC} in bulk {CMOS} technology}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1042--1049}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.009}, doi = {10.1016/J.MICROREL.2005.09.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenMO06, author = {W.{-}M. Chen and Paul McCloskey and S. Cian O'Mathuna}, title = {Isothermal aging effects on the microstructure and solder bump shear strength of eutectic Sn37Pb and Sn3.5Ag solders}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {896--904}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.006}, doi = {10.1016/J.MICROREL.2005.06.006}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenMO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenWC06, author = {Kuen{-}Suan Chen and Chin{-}Hsin Wang and H. T. Chen}, title = {A {MAIC} approach to {TFT-LCD} panel quality improvement}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1189--1198}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.003}, doi = {10.1016/J.MICROREL.2005.10.003}, timestamp = {Thu, 23 Dec 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenWC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenWC06a, author = {Kuo{-}Ming Chen and J. D. Wu and Kuo{-}Ning Chiang}, title = {Effects of pre-bump probing and bumping processes on eutectic solder bump electromigration}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2104--2111}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.005}, doi = {10.1016/J.MICROREL.2006.01.005}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenWC06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenWL06, author = {Hongtao Chen and C. Q. Wang and M. Y. Li}, title = {Numerical and experimental analysis of the Sn3.5Ag0.75Cu solder joint reliability under thermal cycling}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1348--1356}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.001}, doi = {10.1016/J.MICROREL.2005.12.001}, timestamp = {Wed, 21 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenWL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenWTCKL06, author = {K. M. Chen and B. C. Wu and K. H. Tang and F. Y. Cheng and N. H. Kao and J. Y. Lai}, title = {An investigation into the effects of probing and wire bonding stress on the reliability of {BOAC}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {335--342}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.016}, doi = {10.1016/J.MICROREL.2005.02.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChenWTCKL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChenZJL06, author = {Xu Chen and Jun Zhang and Chunlei Jiao and Yanmin Liu}, title = {Effects of different bonding parameters on the electrical performance and peeling strengths of {ACF} interconnection}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {774--785}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.115}, doi = {10.1016/J.MICROREL.2005.07.115}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChenZJL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChienCCCHW06, author = {Chi{-}Hui Chien and Thaiping Chen and Yung{-}Chang Chen and Yii{-}Tay Chiou and Chi{-}Chang Hsieh and Yii{-}Der Wu}, title = {Stability of the warpage in a {PBGA} package subjected to hygro-thermal loading}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1139--1147}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.03.012}, doi = {10.1016/J.MICROREL.2005.03.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChienCCCHW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChimentonIO06, author = {Andrea Chimenton and Fernanda Irrera and Piero Olivo}, title = {Improving performance and reliability of NOR-Flash arrays by using pulsed operation}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1478--1481}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.014}, doi = {10.1016/J.MICROREL.2006.07.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ChimentonIO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChongCPNTL06, author = {Desmond Y. R. Chong and F. X. Che and John H. L. Pang and Kellin Ng and Jane Y. N. Tan and Patrick T. H. Low}, title = {Drop impact reliability testing for lead-free and lead-based soldered {IC} packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1160--1171}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.011}, doi = {10.1016/J.MICROREL.2005.10.011}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChongCPNTL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChouLGLKLEBO06, author = {Yeong{-}Chang Chou and Denise Leung and Ronald Grundbacher and Richard Lai and Quin Kan and P. H. Liu and David Eng and Thomas R. Block and Aaron K. Oki}, title = {Gate metal interdiffusion induced degradation in space-qualified GaAs PHEMTs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {24--40}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.012}, doi = {10.1016/J.MICROREL.2005.02.012}, timestamp = {Wed, 20 Jul 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChouLGLKLEBO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ChuangAD06, author = {Cheng{-}Li Chuang and Jong{-}Ning Aoh and Rong{-}Fong Din}, title = {Oxidation of copper pads and its influence on the quality of Au/Cu bonds during thermosonic wire bonding process}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {449--458}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.010}, doi = {10.1016/J.MICROREL.2005.01.010}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ChuangAD06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CourtasGFBW06, author = {S. Courtas and M. Gr{\'{e}}goire and X. Federspiel and N. Bica{\"{\i}}s{-}L{\'{e}}pinay and C. Wyon}, title = {Electron BackScattered Diffraction {(EBSD)} use and applications in newest technologies development}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1530--1535}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.031}, doi = {10.1016/J.MICROREL.2006.07.031}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CourtasGFBW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CovaDM06, author = {Paolo Cova and Nicola Delmonte and Roberto Menozzi}, title = {Thermal characterization and modeling of power hybrid converters for distributed power systems}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1760--1765}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.056}, doi = {10.1016/J.MICROREL.2006.07.056}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CovaDM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/CrunteanuPBDCCTVDC06, author = {Aurelian Crunteanu and Arnaud Pothier and Pierre Blondy and Frederic Dumas{-}Bouchiat and C. Champeaux and A. Catherinot and P. Tristant and Olivier Vendier and Claude Drevon and Jean Louis Cazaux}, title = {Gamma radiation effects on {RF} {MEMS} capacitive switches}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1741--1746}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.065}, doi = {10.1016/J.MICROREL.2006.07.065}, timestamp = {Sun, 12 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/CrunteanuPBDCCTVDC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DabrowskiDP06, author = {Adam Dabrowski and Rafal Dlugosz and Pawel Pawlowski}, title = {Integrated {CMOS} {GSM} baseband channel selecting filters realized using switched capacitor finite impulse response technique}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {949--958}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.002}, doi = {10.1016/J.MICROREL.2005.04.002}, timestamp = {Fri, 09 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DabrowskiDP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Dakhel06, author = {A. A. Dakhel}, title = {Study of dc conduction mechanisms in dysprosium-manganese oxide insulator thin films grown on Si substrates}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1303--1308}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.001}, doi = {10.1016/J.MICROREL.2005.11.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Dakhel06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DanesinZGRMZP06, author = {Francesca Danesin and Franco Zanon and Simone Gerardin and Fabiana Rampazzo and Gaudenzio Meneghesso and Enrico Zanoni and Alessandro Paccagnella}, title = {Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1750--1753}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.066}, doi = {10.1016/J.MICROREL.2006.07.066}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DanesinZGRMZP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DankovicMDDGS06, author = {Danijel Dankovic and Ivica Manic and Snezana Djoric{-}Veljkovic and Vojkan Davidovic and Snezana Golubovic and Ninoslav Stojadinovic}, title = {{NBT} stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1828--1833}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.077}, doi = {10.1016/J.MICROREL.2006.07.077}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DankovicMDDGS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DauksherMC06, author = {W. Dauksher and P. Marcoux and G. Castleman}, title = {A methodology for the calculation of stress migration in die-level interconnects}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {616--625}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.021}, doi = {10.1016/J.MICROREL.2005.05.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DauksherMC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DeNardiDPGG06, author = {Christophe De Nardi and Romain Desplats and Philippe Perdu and Jean{-}Luc Gauffier and Christophe Gu{\'{e}}rin}, title = {Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1569--1574}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.022}, doi = {10.1016/J.MICROREL.2006.07.022}, timestamp = {Tue, 14 Sep 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DeNardiDPGG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DengK06, author = {Chih{-}Kang Deng and Ming{-}Dou Ker}, title = {{ESD} robustness of thin-film devices with different layout structures in {LTPS} technology}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2067--2073}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.008}, doi = {10.1016/J.MICROREL.2006.01.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DengK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DingKT06, author = {Yong Ding and Jang{-}Kyo Kim and Pin Tong}, title = {Effects of bonding force on contact pressure and frictional energy in wire bonding}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1101--1112}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.010}, doi = {10.1016/J.MICROREL.2005.09.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DingKT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DomanskiPBSB06, author = {Krzysztof Domanski and B. P{\'{o}}ltorak and S. Bargst{\"{a}}dt{-}Franke and Wolfgang Stadler and Waclaw Bala}, title = {Physical fundamentals of external transient latch-up and corrective actions}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {689--701}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.007}, doi = {10.1016/J.MICROREL.2005.10.007}, timestamp = {Fri, 16 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DomanskiPBSB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DonahoePLG06, author = {Daniel N. Donahoe and Michael G. Pecht and Isabel K. Lloyd and Sanka Ganesan}, title = {Moisture induced degradation of multilayer ceramic capacitors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {400--408}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.008}, doi = {10.1016/J.MICROREL.2005.05.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DonahoePLG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DouinPMLPF06, author = {Alexandre Douin and Vincent Pouget and M. De Matos and Dean Lewis and Philippe Perdu and Pascal Fouillat}, title = {Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1514--1519}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.028}, doi = {10.1016/J.MICROREL.2006.07.028}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DouinPMLPF06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DreyerDEJ06, author = {W. Dreyer and F. Duderstadt and S. Eichler and M. Jurisch}, title = {Stress analysis and bending tests for GaAs wafers}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {822--835}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.005}, doi = {10.1016/J.MICROREL.2005.09.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DreyerDEJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DrielSYUZAZ06, author = {W. D. van Driel and Olaf van der Sluis and Dao{-}Guo Yang and R. L. J. M. Ubachs and C. Zenz and G. Aflenzer and G. Q. Zhang}, title = {Reliability modelling for packages in flexible end-products}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1880--1885}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.085}, doi = {10.1016/J.MICROREL.2006.07.085}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DrielSYUZAZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DupontKLB06, author = {Laurent Dupont and Zoubir Khatir and St{\'{e}}phane Lefebvre and S. Bontemps}, title = {Effects of metallization thickness of ceramic substrates on the reliability of power assemblies under high temperature cycling}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1766--1771}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.057}, doi = {10.1016/J.MICROREL.2006.07.057}, timestamp = {Thu, 25 Jan 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DupontKLB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DuvvurySBRKMC06, author = {Charvaka Duvvury and Robert Steinhoff and Gianluca Boselli and Vijay Reddy and Hans Kunz and Steve Marum and Roger Cline}, title = {Gate oxide failures due to anomalous stress from {HBM} {ESD} testers}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {656--665}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.120}, doi = {10.1016/J.MICROREL.2005.07.120}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/DuvvurySBRKMC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/DziedzicKET06, author = {Andrzej Dziedzic and Andrzej Kolek and Waleed Ehrhardt and Heiko Thust}, title = {Advanced electrical and stability characterization of untrimmed and variously trimmed thick-film and {LTCC} resistors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {352--359}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2004.12.014}, doi = {10.1016/J.MICROREL.2004.12.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/DziedzicKET06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EntringerFGAN06, author = {Christophe Entringer and Philippe Flatresse and Philippe Galy and Florence Aza{\"{\i}}s and Pascal Nouet}, title = {Electro-thermal short pulsed simulation for {SOI} technology}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1482--1485}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.015}, doi = {10.1016/J.MICROREL.2006.07.015}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/EntringerFGAN06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ErslandM06, author = {Peter Ersland and Roberto Menozzi}, title = {Editorial}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1217}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.003}, doi = {10.1016/J.MICROREL.2006.02.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ErslandM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EsselyDPRBGBPTL06, author = {Fabien Essely and Fr{\'{e}}d{\'{e}}ric Darracq and Vincent Pouget and Mustapha Remmach and Felix Beaudoin and Nicolas Guitard and Marise Bafleur and Philippe Perdu and Andr{\'{e}} Touboul and Dean Lewis}, title = {Application of various optical techniques for {ESD} defect localization}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1563--1568}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.021}, doi = {10.1016/J.MICROREL.2006.07.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EsselyDPRBGBPTL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/EthertonQWWMDSZAG06, author = {M. Etherton and Ning Qu and J. Willemen and Wolfgang Wilkening and S. Mettler and Mariano Dissegna and R. Stella and L. Zullino and A. Andreini and Horst A. Gieser}, title = {Study of {CDM} specific effects for a smart power input protection structure}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {666--676}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.008}, doi = {10.1016/J.MICROREL.2005.10.008}, timestamp = {Fri, 27 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/EthertonQWWMDSZAG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ExarchosPPLPP06, author = {M. A. Exarchos and E. Papandreou and Patrick Pons and Mohamed Lamhamdi and George J. Papaioannou and Robert Plana}, title = {Charging of radiation induced defects in {RF} {MEMS} dielectric films}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1695--1699}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.045}, doi = {10.1016/J.MICROREL.2006.07.045}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ExarchosPPLPP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FangOP06, author = {Tong Fang and Michael D. Osterman and Michael G. Pecht}, title = {Statistical analysis of tin whisker growth}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {846--849}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.002}, doi = {10.1016/J.MICROREL.2005.06.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FangOP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FernandezRNAKG06, author = {Raul Fern{\'{a}}ndez and Rosana Rodr{\'{\i}}guez and Montserrat Nafr{\'{\i}}a and Xavier Aymerich and Ben Kaczer and Guido Groeseneken}, title = {FinFET and {MOSFET} preliminary comparison of gate oxide reliability}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1608--1611}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.043}, doi = {10.1016/J.MICROREL.2006.07.043}, timestamp = {Wed, 14 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/FernandezRNAKG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FilhoBFD06, author = {W. C. Maia Filho and M. Brizoux and H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and Yves Danto}, title = {Improved physical understanding of intermittent failure in continuous monitoring method}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1886--1891}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.086}, doi = {10.1016/J.MICROREL.2006.07.086}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FilhoBFD06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FilipWN06, author = {Valeriu Filip and Hei Wong and D. Nicolaescu}, title = {Definition of curve fitting parameter to study tunneling and trapping of electrons in Si/ultra-thin SiO\({}_{\mbox{2}}\)/metal structures}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1027--1034}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.014}, doi = {10.1016/J.MICROREL.2005.10.014}, timestamp = {Sat, 11 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FilipWN06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FleischerCJ06, author = {Amy S. Fleischer and Li{-}Hsin Chang and Barry C. Johnson}, title = {The effect of die attach voiding on the thermal resistance of chip level packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {794--804}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.019}, doi = {10.1016/J.MICROREL.2005.01.019}, timestamp = {Thu, 09 Feb 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/FleischerCJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FleischerTHJ06, author = {Amy S. Fleischer and Ute Troppenz and Michael Hamacher and Werner John}, title = {Thermal analysis of bond layer influence on performance of an all-active vertically coupled, microring resonating laser}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {421--431}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.010}, doi = {10.1016/J.MICROREL.2005.04.010}, timestamp = {Wed, 31 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/FleischerTHJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/FoucherTMJ06, author = {Bruno Foucher and J. Tomas and F. Mounsi and M. Jeremias}, title = {Life margin assessment with Physics of Failure Tools application to {BGA} packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {1013--1018}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.005}, doi = {10.1016/J.MICROREL.2005.08.005}, timestamp = {Tue, 06 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/FoucherTMJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Fukuda06, author = {Mitsuo Fukuda}, title = {Optical source reliability in recent optical fiber transmission systems and consumer electronics}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {263--269}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.003}, doi = {10.1016/J.MICROREL.2005.04.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Fukuda06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GanesanPL06, author = {Sanka Ganesan and Michael G. Pecht and Sharon Ling}, title = {Use of high temperature operating life data to mitigate risks in long-duration space applications that deploy commercial-grade plastic encapsulated semiconductor devices}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {360--366}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2004.12.019}, doi = {10.1016/J.MICROREL.2004.12.019}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GanesanPL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GaoBS06, author = {Liming Gao and Christian Burmer and Frank Siegelin}, title = {{ATPG} scan logic failure analysis: a case study of logic ICs - fault isolation, defect mechanism identification and yield improvement}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1458--1463}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.010}, doi = {10.1016/J.MICROREL.2006.07.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GaoBS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GaresMMBMBMTE06, author = {M. Gares and Hichame Maanane and Mohamed Masmoudi and Pierre Bertram and J{\'{e}}r{\^{o}}me Marcon and Mohamed Ali Bela{\"{\i}}d and Karine Mourgues and C. Tolant and Philippe Eudeline}, title = {Hot carrier reliability of {RF} {N-} {LDMOS} for {S} Band radar application}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1806--1811}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.074}, doi = {10.1016/J.MICROREL.2006.07.074}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GaresMMBMBMTE06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GawAMZZ06, author = {Craig A. Gaw and Thomas Arnold and Robert Martin and Lisa Zhang and Dragan Zupac}, title = {Evaluation of SiGe: {C} {HBT} intrinsic reliability using conventional and step stress methodologies}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1272--1278}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.012}, doi = {10.1016/J.MICROREL.2006.02.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GawAMZZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GerardinGCPG06, author = {Simone Gerardin and Alessio Griffoni and Andrea Cester and Alessandro Paccagnella and G. Ghidini}, title = {Degradation of static and dynamic behavior of {CMOS} inverters during constant and pulsed voltage stress}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1669--1672}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.052}, doi = {10.1016/J.MICROREL.2006.07.052}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/GerardinGCPG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Ghaffarian06, author = {Reza Ghaffarian}, title = {{CCGA} packages for space applications}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2006--2024}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.094}, doi = {10.1016/J.MICROREL.2006.07.094}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Ghaffarian06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GhorbaniS06, author = {Hamid R. Ghorbani and Jan K. Spelt}, title = {Interfacial thermal stresses in solder joints of leadless chip resistors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {873--884}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.022}, doi = {10.1016/J.MICROREL.2005.05.022}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GhorbaniS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GorollKP06, author = {Michael Goroll and Werner Kanert and Reinhard Pufall}, title = {{ESD} protection structure qualification - a new approach for release for automotive applications}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1648--1651}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.035}, doi = {10.1016/J.MICROREL.2006.07.035}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GorollKP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GotoH06, author = {Yasunori Goto and Tomokatsu Higuchi}, title = {A 3D analysis technique for detecting trace metal contamination}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1542--1547}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.017}, doi = {10.1016/J.MICROREL.2006.07.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GotoH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/GuhelBDGB06, author = {Yannick Guhel and Bertrand Boudart and E. Delos and Marianne Germain and Z. Bougrioua}, title = {Comparative studies of Pt and Ir schottky contacts on undoped Al\({}_{\mbox{0.36}}\)Ga\({}_{\mbox{0.64}}\)N}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {786--793}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.008}, doi = {10.1016/J.MICROREL.2005.08.008}, timestamp = {Mon, 21 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/GuhelBDGB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HanWXZ06, author = {Lei Han and Fuliang Wang and Wenhu Xu and Jue Zhong}, title = {Bondability window and power input for wire bonding}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {610--615}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.018}, doi = {10.1016/J.MICROREL.2005.05.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HanWXZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HatzopoulosTADK06, author = {Argyrios T. Hatzopoulos and Dimitrios H. Tassis and N. Arpatzanis and C. A. Dimitriadis and G. Kamarinos}, title = {Effects of hot carriers in offset gated polysilicon thin-film transistors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {311--316}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.004}, doi = {10.1016/J.MICROREL.2005.07.004}, timestamp = {Tue, 13 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HatzopoulosTADK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HayamaTSORMSC06, author = {Kiyoteru Hayama and Kenichiro Takakura and K. Shigaki and Hidenori Ohyama and Joan Marc Raf{\'{\i}} and Abdelkarim Mercha and Eddy Simoen and Cor Claeys}, title = {Impact on the back gate degradation in partially depleted {SOI} n-MOSFETs by 2-MeV electron irradiation}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1731--1735}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.063}, doi = {10.1016/J.MICROREL.2006.07.063}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HayamaTSORMSC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeLXW06, author = {Z. W. He and X. Q. Liu and D. Y. Xu and Y. Y. Wang}, title = {Effect of annealing on the properties of low-k nanoporous SiO\({}_{\mbox{2}}\) films prepared by sol-gel method with catalyst {HF}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2062--2066}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.05.002}, doi = {10.1016/J.MICROREL.2006.05.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeLXW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HeerDBPGFKS06, author = {Michael Heer and Viktor Dubec and Sergey Bychikhin and Dionyz Pogany and Erich Gornik and M. Frank and A. Konrad and J. Schulz}, title = {Analysis of triggering behaviour of high voltage {CMOS} {LDMOS} clamps and SCRs during {ESD} induced latch-up}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1591--1596}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.040}, doi = {10.1016/J.MICROREL.2006.07.040}, timestamp = {Wed, 16 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HeerDBPGFKS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuGR06, author = {Chao{-}Kun Hu and Lynne M. Gignac and R. Rosenberg}, title = {Electromigration of Cu/low dielectric constant interconnects}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {213--231}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.015}, doi = {10.1016/J.MICROREL.2005.05.015}, timestamp = {Mon, 11 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/HuGR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuangCHW06, author = {Hou{-}Kuei Huang and Cieh{-}Pin Chang and Mau{-}Phon Houng and Yeong{-}Her Wang}, title = {Current-dependent hot-electron stresses on InGaP-gated and AlGaAs-gated low noise PHEMTs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2038--2043}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.014}, doi = {10.1016/J.MICROREL.2006.02.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HuangCHW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuangT06, author = {Guangyu Huang and Cher Ming Tan}, title = {Device level electrical-thermal-stress coupled-field modeling}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1823--1827}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.076}, doi = {10.1016/J.MICROREL.2006.07.076}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HuangT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuangWHW06, author = {Hou{-}Kuei Huang and Chou{-}Sern Wang and Mau{-}Phon Houng and Yeong{-}Her Wang}, title = {Hot-electron effects on AlGaAs/InGaAs/GaAs PHEMTs under accelerated {DC} stresses}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2025--2031}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.013}, doi = {10.1016/J.MICROREL.2006.02.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HuangWHW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HuardDP06, author = {Vincent Huard and M. Denais and C. R. Parthasarathy}, title = {{NBTI} degradation: From physical mechanisms to modelling}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {1--23}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.001}, doi = {10.1016/J.MICROREL.2005.02.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HuardDP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HungHC06, author = {Y. H. Hung and M. L. Huang and C. H. Chang}, title = {Optimizing the controller {IC} for micro {HDD} process based on Taguchi methods}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1183--1188}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.008}, doi = {10.1016/J.MICROREL.2005.09.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HungHC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/HunterB06, author = {Bradford L. Hunter and Brian K. Butka}, title = {Damped transient power clamps for improved {ESD} protection of {CMOS}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {77--85}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.006}, doi = {10.1016/J.MICROREL.2005.05.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/HunterB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IannuzzoBA06, author = {Francesco Iannuzzo and Giovanni Busatto and Carmine Abbate}, title = {Investigation of {MOSFET} failure in soft-switching conditions}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1790--1794}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.061}, doi = {10.1016/J.MICROREL.2006.07.061}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IannuzzoBA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ImKKJKLKS06, author = {Kyoung{-}Sik Im and Jae{-}Hyok Ko and Suk{-}Jin Kim and Chan{-}Hee Jeon and Chang{-}Su Kim and Ki{-}Tae Lee and Han{-}Gu Kim and Il{-}Hun Son}, title = {Novel {ESD} strategy for high voltage non-volatile programming pin application}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1664--1668}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.051}, doi = {10.1016/J.MICROREL.2006.07.051}, timestamp = {Fri, 14 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ImKKJKLKS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IraceBSBRM06, author = {Andrea Irace and Giovanni Breglio and Paolo Spirito and A. Bricconi and Diego Raffo and Luigi Merlin}, title = {Effect of a buffer layer in the epi-substrate region to boost the avalanche capability of a 100V Schottky diode}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1784--1789}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.060}, doi = {10.1016/J.MICROREL.2006.07.060}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/IraceBSBRM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/IspasoiuCJSKGRO06, author = {Radu Ispasoiu and Tom Crawford and Brian Johnston and Chris Shaw and Steven Kasapi and Jason Goertz and Olivier Rinaudo and Peter Ouimet}, title = {Reduction of the acquisition time for {CMOS} time-resolved photon emission by optimized {IR} detection}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1504--1507}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.026}, doi = {10.1016/J.MICROREL.2006.07.026}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/IspasoiuCJSKGRO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Iyer06, author = {Natarajan Mahadeva Iyer}, title = {Introduction to special section on selected papers from {EOS/ESD} Symposium 2004}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {655}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.012}, doi = {10.1016/J.MICROREL.2005.10.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Iyer06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JacobKN06, author = {Peter Jacob and Albert Kunz and Giovanni Nicoletti}, title = {Reliability and wearout characterisation of LEDs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1711--1714}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.048}, doi = {10.1016/J.MICROREL.2006.07.048}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JacobKN06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JangHKK06, author = {Changsoo Jang and Seongyoung Han and Hangyu Kim and Sayoon Kang}, title = {A numerical failure analysis on lead breakage issues of ultra fine pitch flip chip-on-flex and tape carrier packages during chip/film assembly process}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {487--495}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.013}, doi = {10.1016/J.MICROREL.2005.06.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JangHKK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JangKBKKJKS06, author = {J. T. Jang and Y. C. Kim and W. H. Bong and E. K. Kwon and B. J. Kwon and J. S. Jeon and H. G. Kim and I. H. Son}, title = {A new high-voltage tolerant {I/O} for improving {ESD} robustness}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1634--1637}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.033}, doi = {10.1016/J.MICROREL.2006.07.033}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JangKBKKJKS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JenWF06, author = {Yi{-}Ming Jen and Ying{-}Lung Wu and Chih{-}Kai Fang}, title = {Impact of the number of chips on the reliability of the solder balls for wire-bonded stacked-chip ball grid array packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {386--399}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.011}, doi = {10.1016/J.MICROREL.2005.06.011}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/JenWF06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JilesenLA06, author = {Jonathan Jilesen and F. S. Lien and H. Ahn}, title = {Investigation of increased performance of close series stacked tube axial fans due to inclusion of diffuser element}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {984--993}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.013}, doi = {10.1016/J.MICROREL.2005.05.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JilesenLA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/JiunAJO06, author = {Hoh Huey Jiun and Ibrahim Ahmad and Azman Jalar and Ghazali Omar}, title = {Effect of wafer thinning methods towards fracture strength and topography of silicon die}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {836--845}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.110}, doi = {10.1016/J.MICROREL.2005.07.110}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/JiunAJO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KangL06, author = {H.{-}Y. Kang and Amy H. I. Lee}, title = {Critical dimension control in photolithography based on the yield by a simulation program}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {1006--1012}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.003}, doi = {10.1016/J.MICROREL.2005.08.003}, timestamp = {Thu, 19 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KangL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KangasvieriNPRV06, author = {T. Kangasvieri and Olli Nousiainen and Jussi Putaala and Risto Rautioaho and J. V{\"{a}}h{\"{a}}kangas}, title = {Reliability and {RF} performance of {BGA} solder joints with plastic-core solder balls in {LTCC/PWB} assemblies}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1335--1347}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.003}, doi = {10.1016/J.MICROREL.2005.11.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KangasvieriNPRV06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KarjalainenR06, author = {P{\"{a}}ivi H. Karjalainen and Eero Ristolainen}, title = {Balancing temperature dependence of on-wafer {SOS} inductors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1071--1079}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.003}, doi = {10.1016/J.MICROREL.2005.09.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KarjalainenR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KatahiraKSTS06, author = {Takayoshi Katahira and Ilkka Kartio and Hiroshi Segawa and Michimasa Takahashi and Katsumi Sagisaka}, title = {Vertically high-density interconnection for mobile application}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {756--762}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.001}, doi = {10.1016/J.MICROREL.2005.07.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KatahiraKSTS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KeimasiGP06, author = {Mohammadreza Keimasi and Sanka Ganesan and Michael G. Pecht}, title = {Low temperature electrical measurements of silicon bipolar monolithic microwave integrated circuit {(MMIC)} amplifiers}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {326--334}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.002}, doi = {10.1016/J.MICROREL.2005.07.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KeimasiGP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KeppensMTRCV06, author = {Bart Keppens and Markus P. J. Mergens and Cong Son Trinh and Christian C. Russ and Benjamin Van Camp and Koen G. Verhaege}, title = {{ESD} protection solutions for high voltage technologies}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {677--688}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.009}, doi = {10.1016/J.MICROREL.2005.10.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KeppensMTRCV06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimK06, author = {Dae Whan Kim and Byung{-}Seon Kong}, title = {The effect of hygro-mechanical and thermo-mechanical stress on delamination of gold bump}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1087--1094}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.119}, doi = {10.1016/J.MICROREL.2005.07.119}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimKJ06, author = {Jong{-}Woong Kim and Dae{-}Gon Kim and Seung{-}Boo Jung}, title = {Evaluation of displacement rate effect in shear test of Sn-3Ag-0.5Cu solder bump for flip chip application}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {535--542}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.008}, doi = {10.1016/J.MICROREL.2005.06.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimKJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimNA06, author = {YoungBae Kim and Hiroshi Noguchi and Masazumi Amagai}, title = {Vibration fatigue reliability of {BGA-IC} package with Pb-free solder and Pb-Sn solder}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {459--466}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.003}, doi = {10.1016/J.MICROREL.2005.02.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimNA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimSY06, author = {Hyong Tae Kim and Chang Seop Song and Hae Jeong Yang}, title = {Algorithm for automatic alignment in 2D space by object transformation}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {100--108}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.005}, doi = {10.1016/J.MICROREL.2005.06.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimSY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KimYY06, author = {Kyung{-}Seob Kim and C. H. Yu and J. M. Yang}, title = {Tin whisker formation of lead-free plated leadframes}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1080--1086}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.007}, doi = {10.1016/J.MICROREL.2005.08.007}, timestamp = {Thu, 31 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KimYY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KohK06, author = {Jung{-}Hyuk Koh and Tae{-}geun Kim}, title = {Reliability of Pb(Mg, Nb)O\({}_{\mbox{3}}\)-Pb(Zr, Ti)O\({}_{\mbox{3}}\) multilayer ceramic piezoelectric actuators by Weibull method}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {183--188}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.011}, doi = {10.1016/J.MICROREL.2005.04.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KohK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KomodaYYINWY06, author = {Hirotaka Komoda and Masaaki Yoshida and Yoh Yamamoto and Kouji Iwasaki and Ikuko Nakatani and Heiji Watanabe and Kiyoshi Yasutake}, title = {Novel charge neutralization techniques applicable to wide current range of {FIB} processing in {FIB-SEM} combined system}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2085--2095}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.014}, doi = {10.1016/J.MICROREL.2006.01.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KomodaYYINWY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KozlowskaM06, author = {Anna Kozlowska and Andrzej Malag}, title = {Investigations of transient thermal properties of conductively cooled diode laser arrays operating under quasicontinuous-wave conditions}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2079--2084}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.03.011}, doi = {10.1016/J.MICROREL.2006.03.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KozlowskaM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KriegerWDBOL06, author = {V. Krieger and Wolfgang Wondrak and A. Dehbi and W. Bartel and Yves Ousten and Bruno Levrier}, title = {Defect detection in multilayer ceramic capacitors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1926--1931}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.082}, doi = {10.1016/J.MICROREL.2006.07.082}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KriegerWDBOL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KrivosheevaSLBdL06, author = {A. V. Krivosheeva and V. L. Shaposhnikov and V. V. Lyskouski and V. E. Borisenko and F. Arnaud d'Avitaya and J.{-}L. Lazzari}, title = {Prospects on Mn-doped ZnGeP\({}_{\mbox{2}}\) for spintronics}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1747--1749}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.006}, doi = {10.1016/J.MICROREL.2006.08.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KrivosheevaSLBdL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KumtaRTA06, author = {Amit Kumta and Rusli and Chin{-}Che Tin and J. Ahn}, title = {Design of field-plate terminated 4H-SiC Schottky diodes using high-k dielectrics}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1295--1302}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.009}, doi = {10.1016/J.MICROREL.2005.11.009}, timestamp = {Tue, 27 Apr 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/KumtaRTA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/KwonHP06, author = {Woon{-}Seong Kwon and Suk{-}Jin Ham and Kyung{-}Wook Paik}, title = {Deformation mechanism and its effect on electrical conductivity of {ACF} flip chip package under thermal cycling condition: An experimental study}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {589--599}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.014}, doi = {10.1016/J.MICROREL.2005.06.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/KwonHP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Lai06, author = {Yi{-}Shao Lai}, title = {On solution schemes for time-independent thermomechanical analysis for structures containing polymeric materials}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {859--863}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.010}, doi = {10.1016/J.MICROREL.2005.02.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Lai06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiK06, author = {Yi{-}Shao Lai and Chin{-}Li Kao}, title = {Characteristics of current crowding in flip-chip solder bumps}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {915--922}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.007}, doi = {10.1016/J.MICROREL.2005.02.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiK06a, author = {Yi{-}Shao Lai and Chin{-}Li Kao}, title = {Electrothermal coupling analysis of current crowding and Joule heating in flip-chip packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1357--1368}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.009}, doi = {10.1016/J.MICROREL.2005.08.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiK06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LaiYY06, author = {Yi{-}Shao Lai and Ping{-}Feng Yang and Chang{-}Lin Yeh}, title = {Experimental studies of board-level reliability of chip-scale packages subjected to {JEDEC} drop test condition}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {645--650}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.005}, doi = {10.1016/J.MICROREL.2005.07.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LaiYY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LamhamdiGBSPBP06, author = {Mohamed Lamhamdi and Jean Guastavino and Laurent Boudou and Y. Segui and Patrick Pons and Laurent Bouscayrol and Robert Plana}, title = {Charging-Effects in {RF} capacitive switches influence of insulating layers composition}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1700--1704}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.046}, doi = {10.1016/J.MICROREL.2006.07.046}, timestamp = {Thu, 07 Dec 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LamhamdiGBSPBP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LarsonVL06, author = {Michael C. Larson and Melody A. Verges and Xia Liu}, title = {Residual compression in area array packages induced by underfill shrinkage}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {496--502}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.001}, doi = {10.1016/J.MICROREL.2005.04.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LarsonVL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Lee06, author = {Jing Lee}, title = {A reliability-driven placement procedure based on thermal-force model}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {973--983}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.015}, doi = {10.1016/J.MICROREL.2005.04.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Lee06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LeeL06, author = {Dong{-}Jun Lee and Hyo S. Lee}, title = {Major factors to the solder joint strength of {ENIG} layer in {FC} {BGA} package}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1119--1127}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.006}, doi = {10.1016/J.MICROREL.2005.08.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LeeL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LeeYKYP06, author = {In Kyung Lee and Se Re Na Yun and Kyosun Kim and Chong{-}Gun Yu and Jong Tae Park}, title = {New experimental findings on hot-carrier-induced degradation in lateral {DMOS} transistors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1864--1867}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.071}, doi = {10.1016/J.MICROREL.2006.07.071}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LeeYKYP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LegierskiWM06, author = {Jaroslaw Legierski and Boguslaw Wiecek and Gilbert De Mey}, title = {Measurements and simulations of transient characteristics of heat pipes}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {109--115}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.003}, doi = {10.1016/J.MICROREL.2005.06.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LegierskiWM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiYCGFS06, author = {Baozhen Li and Emmanuel Yashchin and Cathryn Christiansen and Jason Gill and Ronald Filippi and Timothy D. Sullivan}, title = {Application of three-parameter lognormal distribution in {EM} data analysis}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2049--2055}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.001}, doi = {10.1016/J.MICROREL.2006.01.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiYCGFS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LinK06, author = {Kun{-}Hsien Lin and Ming{-}Dou Ker}, title = {Electrostatic discharge protection scheme without leakage current path for {CMOS} {IC} operating in power-down-mode condition on a system board}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {301--310}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2004.12.020}, doi = {10.1016/J.MICROREL.2004.12.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LinK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LitovskiAZ06, author = {Vanco B. Litovski and Miona Andrejevic and Mark Zwolinski}, title = {Analogue electronic circuit diagnosis based on ANNs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1382--1391}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.008}, doi = {10.1016/J.MICROREL.2005.11.008}, timestamp = {Mon, 01 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/LitovskiAZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LiuSVL06, author = {Xia Liu and Valmiki K. Sooklal and Melody A. Verges and Michael C. Larson}, title = {Experimental study and life prediction on high cycle vibration fatigue in {BGA} packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1128--1138}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.011}, doi = {10.1016/J.MICROREL.2005.09.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LiuSVL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LloydMPCL06, author = {J. R. Lloyd and C. E. Murray and S. Ponoth and S. Cohen and E. Liniger}, title = {The effect of Cu diffusion on the {TDDB} behavior in a low-k interlevel dielectrics}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1643--1647}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.003}, doi = {10.1016/J.MICROREL.2006.08.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LloydMPCL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LuBN06, author = {Henry Y. Lu and Haluk Balkan and K. Y. Simon Ng}, title = {Microstructure evolution of the Sn-Ag-y{\%}Cu interconnect}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1058--1070}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.004}, doi = {10.1016/J.MICROREL.2005.08.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LuBN06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LuSZ06, author = {Hua Lu and Helen Shi and Ming Zhou}, title = {Thermally induced deformation of solder joints in real packages: Measurement and analysis}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1148--1159}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.002}, doi = {10.1016/J.MICROREL.2005.10.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LuSZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LucovskySFULLB06, author = {Gerald Lucovsky and H. Seo and L. B. Fleming and M. D. Ulrich and J. L{\"{u}}ning and Patrick Lysaght and Gennadi Bersuker}, title = {Intrinsic bonding defects in transition metal elemental oxides}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1623--1628}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.032}, doi = {10.1016/J.MICROREL.2006.07.032}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LucovskySFULLB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/LuoJZZWLNHGS06, author = {J. F. Luo and Yuan Ji and T. X. Zhong and Y. Q. Zhang and J. Z. Wang and J. P. Liu and N. H. Niu and J. Han and X. Guo and G. D. Shen}, title = {{EBSD} measurements of elastic strain fields in a GaN/sapphire structure}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {178--182}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.012}, doi = {10.1016/J.MICROREL.2005.05.012}, timestamp = {Tue, 22 Dec 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/LuoJZZWLNHGS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MaananeMMBMTKE06, author = {Hichame Maanane and Mohamed Masmoudi and J{\'{e}}r{\^{o}}me Marcon and Mohamed Ali Bela{\"{\i}}d and Karine Mourgues and C. Tolant and K. Ketata and Philippe Eudeline}, title = {Study of {RF} N\({}^{\mbox{-}}\) {LDMOS} critical electrical parameter drifts after a thermal and electrical ageing in pulsed {RF}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {994--1000}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.107}, doi = {10.1016/J.MICROREL.2005.07.107}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MaananeMMBMTKE06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Matters-KammererMRPHSMGM06, author = {Marion K. Matters{-}Kammerer and U. Mackens and Klaus Reimann and Rainer Pietig and D. Hennings and B. Schreinemacher and R. Mauczok and S. Gruhlke and C. Martiny}, title = {Material properties and {RF} applications of high k and ferrite {LTCC} ceramics}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {134--143}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2004.10.022}, doi = {10.1016/J.MICROREL.2004.10.022}, timestamp = {Fri, 23 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/Matters-KammererMRPHSMGM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/McCluskeyDWH06, author = {F. Patrick McCluskey and M. Dash and Z. Wang and D. Huff}, title = {Reliability of high temperature solder alternatives}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1910--1914}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.090}, doi = {10.1016/J.MICROREL.2006.07.090}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/McCluskeyDWH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MeneghiniPMPTMVZ06, author = {Matteo Meneghini and Simona Podda and A. Morelli and Ruggero Pintus and L. Trevisanello and Gaudenzio Meneghesso and Massimo Vanzi and Enrico Zanoni}, title = {High brightness GaN LEDs degradation during dc and pulsed stress}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1720--1724}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.050}, doi = {10.1016/J.MICROREL.2006.07.050}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/MeneghiniPMPTMVZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MisraTMA06, author = {E. Misra and N. D. Theodore and J. W. Mayer and T. L. Alford}, title = {Failure mechanisms of pure silver, pure aluminum and silver-aluminum alloy under high current stress}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2096--2103}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.011}, doi = {10.1016/J.MICROREL.2006.01.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MisraTMA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MiyazakiO06, author = {Toru Miyazaki and Tomoya Omata}, title = {Electromigration degradation mechanism for Pb-free flip-chip micro solder bumps}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1898--1903}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.088}, doi = {10.1016/J.MICROREL.2006.07.088}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MiyazakiO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MoreauHR06, author = {C. Moreau and P. Le Helleye and D. Ruelloux}, title = {A complete {RF} power technology assessment for military applications}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1817--1822}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.007}, doi = {10.1016/J.MICROREL.2006.08.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MoreauHR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MoritaATK06, author = {Yasuyuki Morita and Kazuo Arakawa and Mitsugu Todo and Masayuki Kaneto}, title = {Experimental study on the thermo-mechanical effects of underfill and low-CTE substrate in a flip-chip device}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {923--929}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.013}, doi = {10.1016/J.MICROREL.2005.02.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MoritaATK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/MuraliSV06, author = {Sarangapani Murali and Narasimalu Srikanth and Charles J. Vath III}, title = {Effect of wire diameter on the thermosonic bond reliability}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {467--475}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.011}, doi = {10.1016/J.MICROREL.2005.05.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/MuraliSV06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NasehDC06, author = {Sasan Naseh and M. Jamal Deen and Chih{-}Hung Chen}, title = {Hot-carrier reliability of submicron NMOSFETs and integrated {NMOS} low noise amplifiers}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {201--212}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.009}, doi = {10.1016/J.MICROREL.2005.04.009}, timestamp = {Fri, 27 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NasehDC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NguyenGCCPMJ06, author = {Hung Son Nguyen and Z. H. Gan and Zhe Chen and V. Chandrasekar and K. Prasad and S. G. Mhaisalkar and Ning Jiang}, title = {Reliability studies of barrier layers for Cu/PAE low-k interconnects}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1309--1314}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.005}, doi = {10.1016/J.MICROREL.2005.11.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NguyenGCCPMJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/NicholsonS06, author = {R. A. Nicholson and H. Suri}, title = {Physical-to-Logical Mapping of Emission Data using Place-and-Route}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1548--1553}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.018}, doi = {10.1016/J.MICROREL.2006.07.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/NicholsonS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/OatesL06, author = {A. S. Oates and Shou{-}Chung Lee}, title = {Electromigration failure distributions of dual damascene Cu /low - k interconnects}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1581--1586}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.038}, doi = {10.1016/J.MICROREL.2006.07.038}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/OatesL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/OssaimeeKFGO06, author = {M. Ossaimee and Khaled Kirah and W. Fikry and A. Girgis and O. A. Omar}, title = {Simplified quantitative stress-induced leakage current {(SILC)} model for {MOS} devices}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {287--292}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.007}, doi = {10.1016/J.MICROREL.2005.07.007}, timestamp = {Thu, 05 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/OssaimeeKFGO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PalegoPCB06, author = {Cristiano Palego and Arnaud Pothier and Aurelian Crunteanu and Pierre Blondy}, title = {High power reliability aspects on {RF} {MEMS} varactor design}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1705--1710}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.047}, doi = {10.1016/J.MICROREL.2006.07.047}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PalegoPCB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PanCYH06, author = {C. T. Pan and P. J. Cheng and C. K. Yen and C. C. Hsieh}, title = {Application of polyimide to bending-mode microactuators with Ni/Fe and Fe/Pt magnet}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1369--1381}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.015}, doi = {10.1016/J.MICROREL.2005.10.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PanCYH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PanGTV06, author = {M. Y. Pan and Manoj Gupta and Andrew A. O. Tay and Kripesh Vaidyanathan}, title = {Development of bulk nanostructured copper with superior hardness for use as an interconnect material in electronic packaging}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {763--767}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.009}, doi = {10.1016/J.MICROREL.2005.06.009}, timestamp = {Tue, 15 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/PanGTV06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ParkO06, author = {Jongwoo Park and John Osenbach}, title = {Processability and reliability of epoxy adhesive used in microelectronic devices linked to effects of degree of cure and damp heat aging}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {503--511}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.010}, doi = {10.1016/J.MICROREL.2005.05.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ParkO06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ParthasarathyDHRRGPVB06, author = {C. R. Parthasarathy and M. Denais and Vincent Huard and G. Ribes and David Roy and Chloe Gu{\'{e}}rin and F. Perrier and E. Vincent and Alain Bravaix}, title = {Designing in reliability in advanced {CMOS} technologies}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1464--1471}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.012}, doi = {10.1016/J.MICROREL.2006.07.012}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ParthasarathyDHRRGPVB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PechtD06, author = {Michael G. Pecht and Yuliang Deng}, title = {Electronic device encapsulation using red phosphorus flame retardants}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {53--62}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.001}, doi = {10.1016/J.MICROREL.2005.09.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PechtD06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PengKCKC06, author = {Chih{-}Tang Peng and Chia{-}Tai Kuo and Kuo{-}Ning Chiang and Terry Ku and Kenny Chang}, title = {Experimental characterization and mechanical behavior analysis of intermetallic compounds of Sn-3.5Ag lead-free solder bump with Ti/Cu/Ni {UBM} on copper chip}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {523--534}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.010}, doi = {10.1016/J.MICROREL.2005.06.010}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/PengKCKC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PerpinaSSBMM06, author = {X. Perpi{\~{n}}{\`{a}} and Jean{-}Fran{\c{c}}ois Serviere and J. Saiz and Davide Barlini and Michel Mermet{-}Guyennet and Jos{\'{e}} Mill{\'{a}}n}, title = {Temperature measurement on series resistance and devices in power packs based on on-state voltage drop monitoring at high current}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1834--1839}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.078}, doi = {10.1016/J.MICROREL.2006.07.078}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PerpinaSSBMM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PershenkovTBRM06, author = {V. S. Pershenkov and A. D. Tremasov and V. V. Belyakov and A. U. Razvalyaev and V. S. Mochkin}, title = {X-ray ion mobility spectrometer}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {641--644}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.003}, doi = {10.1016/J.MICROREL.2005.07.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PershenkovTBRM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PlieningerDP06, author = {R. Plieninger and M. Dittes and Klaus Pressel}, title = {Modern {IC} packaging trends and their reliability implications}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1868--1873}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.008}, doi = {10.1016/J.MICROREL.2006.08.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PlieningerDP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PomplKRK06, author = {T. Pompl and A. Kerber and M. R{\"{o}}hner and Martin Kerber}, title = {Gate voltage and oxide thickness dependence of progressive wear-out of ultra-thin gate oxides}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1603--1607}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.042}, doi = {10.1016/J.MICROREL.2006.07.042}, timestamp = {Fri, 09 Oct 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/PomplKRK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/PramanikIS06, author = {C. Pramanik and Tarikul Islam and Hiranmay Saha}, title = {Temperature compensation of piezoresistive micro-machined porous silicon pressure sensor by {ANN}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {343--351}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.008}, doi = {10.1016/J.MICROREL.2005.04.008}, timestamp = {Thu, 29 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/PramanikIS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/QiLGSS06, author = {Yan Qi and Rex Lam and Hamid R. Ghorbani and Polina Snugovsky and Jan K. Spelt}, title = {Temperature profile effects in accelerated thermal cycling of SnPb and Pb-free solder joints}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {574--588}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.008}, doi = {10.1016/J.MICROREL.2005.01.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/QiLGSS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/QianSTM06, author = {Zhongling Qian and Frank Siegelin and Birgit Tippelt and Stefan M{\"{u}}ller}, title = {Localization and physical analysis of a complex {SRAM} failure in 90nm technology}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1558--1562}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.020}, doi = {10.1016/J.MICROREL.2006.07.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/QianSTM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RadivojevicKOSSV06, author = {Zoran Radivojevic and Ivan Kassamakov and Markku Oinonen and H. Saarikko and Henri Sepp{\"{a}}nen and Pasi Vihinen}, title = {Transient {IR} imaging of light and flexible microelectronic devices}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {116--123}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.013}, doi = {10.1016/J.MICROREL.2005.01.013}, timestamp = {Mon, 05 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RadivojevicKOSSV06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RafiSHMCOC06, author = {Joan Marc Raf{\'{\i}} and Eddy Simoen and Kiyoteru Hayama and Abdelkarim Mercha and Francesca Campabadal and Hidenori Ohyama and Cor Claeys}, title = {Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted {SOI} nMOSFETs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1657--1663}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.037}, doi = {10.1016/J.MICROREL.2006.07.037}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RafiSHMCOC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RajabzadehM06, author = {Amir Rajabzadeh and Seyed Ghassem Miremadi}, title = {Transient detection in {COTS} processors using software approach}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {124--133}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2004.10.013}, doi = {10.1016/J.MICROREL.2004.10.013}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RajabzadehM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RajabzadehM06a, author = {Amir Rajabzadeh and Seyed Ghassem Miremadi}, title = {{CFCET:} {A} hardware-based control flow checking technique in {COTS} processors using execution tracing}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {959--972}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.108}, doi = {10.1016/J.MICROREL.2005.07.108}, timestamp = {Mon, 26 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RajabzadehM06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RamkumarGV06, author = {S. Manian Ramkumar and Reza Ghaffarian and Arun Varanasi}, title = {Lead-free 0201 manufacturing, assembly and reliability test results}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {244--262}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.007}, doi = {10.1016/J.MICROREL.2005.09.007}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RamkumarGV06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RampnouxMSGCD06, author = {Jean{-}Michel Rampnoux and H. Michel and M. Amine Salhi and St{\'{e}}phane Grauby and Wilfrid Claeys and Stefan Dilhaire}, title = {Time gating imaging through thick silicon substrate: a new step towards backside characterisation}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1520--1524}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.029}, doi = {10.1016/J.MICROREL.2006.07.029}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RampnouxMSGCD06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RanuarezDC06, author = {Juan C. Ranu{\'{a}}rez and M. Jamal Deen and Chih{-}Hung Chen}, title = {A review of gate tunneling current in {MOS} devices}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {1939--1956}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.006}, doi = {10.1016/J.MICROREL.2005.12.006}, timestamp = {Fri, 27 Mar 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RanuarezDC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RatchevSS06, author = {Petar Ratchev and Serguei Stoukatch and Bart Swinnen}, title = {Mechanical reliability of Au and Cu wire bonds to Al, Ni/Au and Ni/Pd/Au capped Cu bond pads}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1315--1325}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.002}, doi = {10.1016/J.MICROREL.2005.11.002}, timestamp = {Sat, 09 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RatchevSS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RidoutDBH06, author = {Stephen Ridout and Milos Dusek and Chris Bailey and Chris Hunt}, title = {Assessing the performance of crack detection tests for solder joints}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2122--2130}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.05.001}, doi = {10.1016/J.MICROREL.2006.05.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RidoutDBH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RodriguezAGHGP06, author = {Nicolas Rodriguez and J{\'{e}}r{\^{o}}me Adrian and Catherine Grosjean and G{\'{e}}rald Haller and Christophe Girardeaux and Alain Portavoce}, title = {Evaluation of scanning capacitance microscopy sample preparation by focused ion beam}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1554--1557}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.019}, doi = {10.1016/J.MICROREL.2006.07.019}, timestamp = {Thu, 03 Aug 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RodriguezAGHGP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Roesch06, author = {William J. Roesch}, title = {Historical review of compound semiconductor reliability}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1218--1227}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.008}, doi = {10.1016/J.MICROREL.2006.02.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Roesch06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Roesch06a, author = {William J. Roesch}, title = {Compound semiconductor activation energy in humidity}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1238--1246}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.006}, doi = {10.1016/J.MICROREL.2006.02.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Roesch06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoosmalenZ06, author = {A. J. van Roosmalen and G. Q. Zhang}, title = {Reliability challenges in the nanoelectronics era}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1403--1414}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.011}, doi = {10.1016/J.MICROREL.2006.07.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/RoosmalenZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/RoyT06, author = {Arijit Roy and Cher Ming Tan}, title = {Experimental investigation on the impact of stress free temperature on the electromigration performance of copper dual damascene submicron interconnect}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1652--1656}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.036}, doi = {10.1016/J.MICROREL.2006.07.036}, timestamp = {Tue, 27 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/RoyT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SalcedoLAH06, author = {Javier A. Salcedo and Juin J. Liou and Muhammad Yaqub Afridi and Allen R. Hefner}, title = {On-chip electrostatic discharge protection for {CMOS} gas sensor systems-on-a-chip (SoC)}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1285--1294}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.002}, doi = {10.1016/J.MICROREL.2005.12.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SalcedoLAH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SalmHKS06, author = {Cora Salm and Andr{\'{e}} J. Hof and Fred G. Kuper and Jurriaan Schmitz}, title = {Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1617--1622}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.004}, doi = {10.1016/J.MICROREL.2006.08.004}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SalmHKS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SanadaY06, author = {Masaru Sanada and Yutaka Yoshizawa}, title = {Fault diagnosis technology based on transistor behavior analysis for physical analysis}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1575--1580}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.023}, doi = {10.1016/J.MICROREL.2006.07.023}, timestamp = {Mon, 07 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SanadaY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SanchezOM06, author = {Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and Adelmo Ortiz{-}Conde and Juan Muci}, title = {Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {731--742}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.116}, doi = {10.1016/J.MICROREL.2005.07.116}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SanchezOM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SchlangenSKB06, author = {Rudolf Schlangen and Peter Sadewater and Uwe Kerst and Christian Boit}, title = {Contact to contacts or silicide by use of backside {FIB} circuit edit allowing to approach every active circuit node}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1498--1503}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.025}, doi = {10.1016/J.MICROREL.2006.07.025}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SchlangenSKB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SedaghatKAJ06, author = {Reza Sedaghat and Mayuri Kunchwar and Raha Abedi and M. Reza Javaheri}, title = {Transistor-level to gate-level comprehensive fault synthesis for n-input primitive gates}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2149--2158}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.005}, doi = {10.1016/J.MICROREL.2005.12.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SedaghatKAJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ShuCC06, author = {Ming{-}Hung Shu and Ching{-}Hsue Cheng and Jing{-}Rong Chang}, title = {Using intuitionistic fuzzy sets for fault-tree analysis on printed circuit board assembly}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2139--2148}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.007}, doi = {10.1016/J.MICROREL.2006.01.007}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/ShuCC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SiekierskaFKKLOPPSS06, author = {Krystyna Siekierska and Pawel Fras and Artur Kokoszka and Tomasz Kostienko and Norbert Lugowski and Dariusz Obrebski and Adam Pawlak and Piotr Penkala and Dariusz Stachanczyk and Marek Szlezak}, title = {Distributed collaborative design of {IP} components in the {TRMS} environment}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {1019--1024}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.118}, doi = {10.1016/J.MICROREL.2005.07.118}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SiekierskaFKKLOPPSS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SikoraPUP06, author = {Axel Sikora and Frank{-}Peter Pesl and Walter Unger and Uwe Paschen}, title = {Technologies and reliability of modern embedded flash cells}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {1980--2005}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.003}, doi = {10.1016/J.MICROREL.2006.01.003}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SikoraPUP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Singh06, author = {Ranbir Singh}, title = {Reliability and performance limitations in SiC power devices}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {713--730}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.013}, doi = {10.1016/J.MICROREL.2005.10.013}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Singh06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SinghalLCHTJNMRR06, author = {Sameer Singhal and T. Li and Apurva Chaudhari and Allen W. Hanson and Robert J. Therrien and Wayne Johnson and Walter Nagy and J. Marquart and Pradeep Rajagopal and John C. Roberts}, title = {Reliability of large periphery GaN-on-Si HFETs}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1247--1253}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.009}, doi = {10.1016/J.MICROREL.2006.02.009}, timestamp = {Mon, 04 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SinghalLCHTJNMRR06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SomisettyEYB06, author = {Shivarajiv Somisetty and Peter Ersland and Xinxing Yang and Jason Barrett}, title = {Reliability investigation and characterization of failure modes in Schottky diodes}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1254--1260}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.005}, doi = {10.1016/J.MICROREL.2006.02.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SomisettyEYB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SozzaCDMLT06, author = {A. Sozza and Arnaud Curutchet and Christian Dua and Nathalie Malbert and Nathalie Labat and Andr{\'{e}} Touboul}, title = {AlGaN/GaN {HEMT} Reliability Assessment by means of Low Frequency Noise Measurements}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1725--1730}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.062}, doi = {10.1016/J.MICROREL.2006.07.062}, timestamp = {Thu, 16 Apr 2020 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/SozzaCDMLT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/StathisZ06, author = {James H. Stathis and Sufi Zafar}, title = {The negative bias temperature instability in {MOS} devices: {A} review}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {270--286}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.001}, doi = {10.1016/J.MICROREL.2005.08.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/StathisZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06, author = {Mile K. Stojcev}, title = {Stephen Brown Zvonko Vranesic, Fundamental of Digital Logic with Verilog Design, McGraw Hill, Boston, 2004, Hardcover, pp 844, plus XX, {ISBN} 0-07-121359-7}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {194--195}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.001}, doi = {10.1016/J.MICROREL.2005.01.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06a, author = {Mile K. Stojcev}, title = {John P. Hayes, Computer Architecture and Organization, Third ed., McGraw-Hill Book Company, Inc., Boston, 1988, Softcover, pp 604, plus XIV, {ISBN} 0-07-115997-5}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {196--197}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.004}, doi = {10.1016/J.MICROREL.2005.01.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06b, author = {Mile K. Stojcev}, title = {S. Sutherland, S. Davidman and P. Flake, System Verilog for Design: {A} Guide to Using System Verilog for Hardware Design and Modeling Hardcover, Kluwer Academic Publishers, Norwell, {MA} {(2004)} {ISBN} 1-4020-7530-8 pp 374, plus XXVIII, euro 119}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {198--199}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.012}, doi = {10.1016/J.MICROREL.2005.06.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06b.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06c, author = {Mile K. Stojcev}, title = {Sachin Sapatnekar, Timing, Kluwer Academic Publishers, Hardcover, {ISBN} 1-4020-7671-1, pp 294, plus {IX}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {651--652}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.005}, doi = {10.1016/J.MICROREL.2005.02.005}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06c.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06d, author = {Mile K. Stojcev}, title = {Low Power Electronics Design, Christian Pignet, Editor, {CRC} Press, Boca Raton, 2005, Hardcover, pp 854, plus 18, {ISBN} 0-8493-1941-2}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {653--654}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.006}, doi = {10.1016/J.MICROREL.2005.04.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06d.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06e, author = {Mile K. Stojcev}, title = {F. Mayer-Linderberg, Dedicated Digital Processors: Methods in Hardware/Software System Design, John Wiley {\&} Sons, Ltd., Chichester {(2004)} {ISBN} 0-470-84444-2 Hardcover, pp 302, plus {XI}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {1025--1026}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.017}, doi = {10.1016/J.MICROREL.2005.05.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06e.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06f, author = {Mile K. Stojcev}, title = {R. Jacob Baker, {CMOS} Circuit Design, Layout, and Simulation (second ed.), Wiley Interscience {\&} {IEEE} Press {(2005)} {ISBN} 0-471-70055-X Hardcover, pp 1039, plus {XXXIII}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1214--1215}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.006}, doi = {10.1016/J.MICROREL.2005.09.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06f.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06g, author = {Mile K. Stojcev}, title = {Alfredo Benso, Paolo Prinetto, editors, Fault injection techniques and tools for embedded systems reliability and evaluation, Kluwer Academic Publishers, Boston, 2003. Hardcover, pp 241, plus XIV, {ISBN} 1-4020-7589-8}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1396--1397}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.006}, doi = {10.1016/J.MICROREL.2005.11.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06g.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Stojcev06h, author = {Mile K. Stojcev}, title = {Sachin Sapatnekar, Timing, Kluwer Academic Publishers, Hardcover, pp 294, plus IX, {ISBN} 1-4020-7671-1}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1398--1399}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.007}, doi = {10.1016/J.MICROREL.2005.11.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Stojcev06h.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SuCY06, author = {Fei Su and Kerm Sin Chian and Sung Yi}, title = {An optical characterization technique for hygroscopic expansion of polymers and plastic packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {600--609}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.017}, doi = {10.1016/J.MICROREL.2005.06.017}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SuCY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SunSYS06, author = {Zhilin Sun and Weifeng Sun and Yangbo Yi and Longxing Shi}, title = {Study of the power capability of {LDMOS} and the improved methods}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {1001--1005}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.111}, doi = {10.1016/J.MICROREL.2005.07.111}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SunSYS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/SzymanskiK06, author = {Andrzej Szymanski and Ewa Kurjata{-}Pfitzner}, title = {Effects of package and process variation on 2.4GHz analog integrated circuits}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {189--193}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.006}, doi = {10.1016/J.MICROREL.2005.02.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/SzymanskiK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanGC06, author = {Cher Ming Tan and Zhenghao Gan and Tai Chong Chai}, title = {Feasibility study of the application of voltage contrast to printed circuit board}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {939--948}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.014}, doi = {10.1016/J.MICROREL.2005.04.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanGC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanLTL06, author = {Cher Ming Tan and Wei Li and Kok Tong Tan and Frankie Low}, title = {Development of highly accelerated electromigration test}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1638--1642}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.034}, doi = {10.1016/J.MICROREL.2006.07.034}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TanLTL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TanduoCTMM06, author = {P. Tanduo and Luca Cola and S. Testa and M. Menchise and A. Mervic}, title = {Read disturb in flash memories: reliability case}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1439--1444}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.007}, doi = {10.1016/J.MICROREL.2006.07.007}, timestamp = {Thu, 21 Apr 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TanduoCTMM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TaoWDX06, author = {Bo Tao and Yiping Wu and Han Ding and You{-}Lun Xiong}, title = {A quantitative method of reliability estimation for surface mount solder joints based on heating factor Q\({}_{\mbox{eta}}\)}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {864--872}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.013}, doi = {10.1016/J.MICROREL.2005.04.013}, timestamp = {Fri, 21 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TaoWDX06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TassisHADK06, author = {Dimitrios H. Tassis and Argyrios T. Hatzopoulos and N. Arpatzanis and C. A. Dimitriadis and G. Kamarinos}, title = {Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2032--2037}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.03.010}, doi = {10.1016/J.MICROREL.2006.03.010}, timestamp = {Tue, 13 Sep 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TassisHADK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TeeNZ06, author = {Tong Yan Tee and Hun Shen Ng and Zhaowei Zhong}, title = {Board level solder joint reliability analysis of stacked die mixed flip-chip and wirebond {BGA}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2131--2138}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.010}, doi = {10.1016/J.MICROREL.2006.01.010}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TeeNZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ThijsILJDDSDG06, author = {Steven Thijs and M. Natarajan Iyer and Dimitri Linten and Wutthinan Jeamsaksiri and T. Daenen and Robin Degraeve and Andries J. Scholten and Stefaan Decoutere and Guido Groeseneken}, title = {Implementation of plug-and-play {ESD} protection in 5.5GHz 90nm {RF} {CMOS} LNAs - Concepts, constraints and solutions}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {702--712}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.018}, doi = {10.1016/J.MICROREL.2005.06.018}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ThijsILJDDSDG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TsaiCLH06, author = {Ming{-}Yi Tsai and W. C. Chiang and T. M. Liu and G. H. Hsu}, title = {Thermal deformation measurements and predictions of {MAP-BGA} electronic packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {476--486}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.014}, doi = {10.1016/J.MICROREL.2005.02.014}, timestamp = {Thu, 02 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TsaiCLH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TsuchiyaY06, author = {Hideaki Tsuchiya and Shinji Yokogawa}, title = {Electromigration lifetimes and void growth at low cumulative failure probability}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1415--1420}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.001}, doi = {10.1016/J.MICROREL.2006.08.001}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/TsuchiyaY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/TyaginovVSG06, author = {S. E. Tyaginov and M. I. Vexler and A. F. Shulekin and I. V. Grekhov}, title = {The post-damage behavior of a {MOS} tunnel emitter transistor}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1035--1041}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.006}, doi = {10.1016/J.MICROREL.2005.10.006}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/TyaginovVSG06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/UbachsSDZ06, author = {R. L. J. M. Ubachs and Olaf van der Sluis and W. D. van Driel and G. Q. Zhang}, title = {Multiscale modelling of multilayer substrates}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1472--1477}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.013}, doi = {10.1016/J.MICROREL.2006.07.013}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/UbachsSDZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/UllanLCBCGMMPP06, author = {Miguel Ull{\'{a}}n and Manuel Lozano and Mokhtar Chmeissani and G. Blanchot and Enric Cabruja and J. Garc{\'{\i}}a and M. Maiorino and Ricardo Mart{\'{\i}}nez and Giulio Pellegrini and Carles Puigdengoles}, title = {Test structure assembly for bump bond yield measurement on high density flip chip technologies}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1095--1100}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.001}, doi = {10.1016/J.MICROREL.2005.10.001}, timestamp = {Thu, 05 Nov 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/UllanLCBCGMMPP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/VermeerschM06, author = {Bjorn Vermeersch and Gilbert De Mey}, title = {Thermal impedance plots of micro-scaled devices}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {174--177}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.014}, doi = {10.1016/J.MICROREL.2005.05.014}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/VermeerschM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WagnerUW06, author = {M. Wagner and W. Unger and Wolfgang Wondrak}, title = {Part average analysis - {A} tool for reducing failure rates in automotive electronics}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1433--1438}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.006}, doi = {10.1016/J.MICROREL.2006.07.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WagnerUW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Wakil06, author = {Jamil A. Wakil}, title = {Thermal performance impacts of heat spreading lids on flip chip packages: With and without heat sinks}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {380--385}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.007}, doi = {10.1016/J.MICROREL.2005.01.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Wakil06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WangLCWC06, author = {Robin C. J. Wang and C. C. Lee and L. D. Chen and Kenneth Wu and K. S. Chang{-}Liao}, title = {A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure effect}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1673--1678}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.053}, doi = {10.1016/J.MICROREL.2006.07.053}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WangLCWC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WangLPHCY06, author = {Yuqi Wang and K. H. Low and John H. L. Pang and Kay Hiang Hoon and F. X. Che and Y. S. Yong}, title = {Modeling and simulation for a drop-impact analysis of multi-layered printed circuit boards}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {558--573}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.007}, doi = {10.1016/J.MICROREL.2005.05.007}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/WangLPHCY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WangOM06, author = {Jingchao Wang and Edgar Olthof and Wim Metselaar}, title = {Hot-carrier degradation analysis based on ring oscillators}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1858--1863}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.070}, doi = {10.1016/J.MICROREL.2006.07.070}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WangOM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WelTBLHGRBP06, author = {P. J. van der Wel and S. J. C. H. Theeuwen and J. A. Bielen and Y. Li and R. A. van den Heuvel and J. G. Gommans and F. van Rijs and P. Bron and H. J. F. Peuscher}, title = {Wear out failure mechanisms in aluminium and gold based {LDMOS} {RF} power applications}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1279--1284}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.011}, doi = {10.1016/J.MICROREL.2006.02.011}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WelTBLHGRBP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Whitman06, author = {Charles S. Whitman}, title = {Reliability results of HBTs with an InGaP emitter}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1261--1271}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.004}, doi = {10.1016/J.MICROREL.2006.02.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Whitman06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/Whitman06a, author = {Charles S. Whitman}, title = {Erratum to "Reliability results of HBTs with an InGaP emitter" [Microelectron. Reliability 46 {(2006)} 1261-1271]}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2159}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.015}, doi = {10.1016/J.MICROREL.2006.08.015}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/Whitman06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WhitmanGRA06, author = {Charles S. Whitman and Terri M. Gilbert and Ann M. Rahn and Jennifer A. Antonell}, title = {Determining factors affecting {ESD} failure voltage using {DOE}}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1228--1237}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.02.007}, doi = {10.1016/J.MICROREL.2006.02.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WhitmanGRA06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WhitmanGRA06a, author = {Charles S. Whitman and Terri M. Gilbert and Ann M. Rahn and Jennifer A. Antonell}, title = {Erratum to "Determining factors affecting {ESD} failure voltage using DOE" [Microelectron. Reliability 46 {(2006)} 1228-1237]}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2160}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.016}, doi = {10.1016/J.MICROREL.2006.08.016}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WhitmanGRA06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WolborskiBOPSRLH06, author = {Maciej Wolborski and Mietek Bakowski and Armando Ortiz and Viljami Pore and Adolf Sch{\"{o}}ner and Mikko Ritala and Markku Leskel{\"{a}} and Anders Hall{\'{e}}n}, title = {Characterisation of the Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) films deposited by ultrasonic spray pyrolysis and atomic layer deposition methods for passivation of 4H-SiC devices}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {743--755}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.08.002}, doi = {10.1016/J.MICROREL.2005.08.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WolborskiBOPSRLH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WolfGBH06, author = {Heinrich Wolf and Horst A. Gieser and Detlef Bonfert and Markus Hauser}, title = {{ESD} Susceptibility of Submicron Air Gaps}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1587--1590}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.039}, doi = {10.1016/J.MICROREL.2006.07.039}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WolfGBH06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongM06, author = {Ee{-}Hua Wong and Yiu{-}Wing Mai}, title = {New insights into board level drop impact}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {930--938}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.114}, doi = {10.1016/J.MICROREL.2005.07.114}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WongWCKC06, author = {C. K. Wong and Hei Wong and Mansun Chan and Chi{-}Wah Kok and H. P. Chan}, title = {Minimizing hydrogen content in silicon oxynitride by thermal oxidation of silicon-rich silicon nitride}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2056--2061}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.01.006}, doi = {10.1016/J.MICROREL.2006.01.006}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WongWCKC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WuZLHL06, author = {J. D. Wu and P. J. Zheng and C. W. Lee and S. C. Hung and J. J. Lee}, title = {A study in flip-chip UBM/bump reliability with effects of SnPb solder composition}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {41--52}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.01.012}, doi = {10.1016/J.MICROREL.2005.01.012}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/WuZLHL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/WunderleM06, author = {Bernhard Wunderle and Bernd Michel}, title = {Progress in reliability research in the micro and nano region}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1685--1694}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.08.005}, doi = {10.1016/J.MICROREL.2006.08.005}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/WunderleM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/XingWY06, author = {Jianhui Xing and Hong Wang and Shiyuan Yang}, title = {Constructing {IP} cores' transparency paths for SoC test access using greedy search}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1199--1208}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.10.004}, doi = {10.1016/J.MICROREL.2005.10.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/XingWY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YamadaTYNOSKI06, author = {Yasushi Yamada and Yoshikazu Takaku and Yuji Yagi and Y. Nishibe and Ikuo Ohnuma and Yuji Sutou and R. Kainuma and Kiyohito Ishida}, title = {Pb-free high temperature solders for power device packaging}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1932--1937}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.083}, doi = {10.1016/J.MICROREL.2006.07.083}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YamadaTYNOSKI06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YamashitaS06, author = {M. Yamashita and K. Suganuma}, title = {Improvement in high-temperature degradation by isotropic conductive adhesives including Ag-Sn alloy fillers}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {850--858}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.020}, doi = {10.1016/J.MICROREL.2005.05.020}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YamashitaS06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YamashitaS06a, author = {M. Yamashita and K. Suganuma}, title = {Degradation by Sn diffusion applied to surface mounting with Ag-epoxy conductive adhesive with joining pressure}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1113--1118}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.112}, doi = {10.1016/J.MICROREL.2005.07.112}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YamashitaS06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YanTVMK06, author = {M. Y. Yan and King{-}Ning Tu and A. V. Vairagar and S. G. Mhaisalkar and Ahila Krishnamoorthy}, title = {A direct measurement of electromigration induced drift velocity in Cu dual damascene interconnects}, journal = {Microelectron. Reliab.}, volume = {46}, number = {8}, pages = {1392--1395}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.11.004}, doi = {10.1016/J.MICROREL.2005.11.004}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YanTVMK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangJLP06, author = {Se Young Yang and Young{-}Doo Jeon and Soon{-}Bok Lee and Kyung{-}Wook Paik}, title = {Solder reflow process induced residual warpage measurement and its influence on reliability of flip-chip electronic packages}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {512--522}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.06.007}, doi = {10.1016/J.MICROREL.2005.06.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangJLP06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangKL06, author = {Bing{-}Liang Yang and Paul C. K. Kwok and P. T. Lai}, title = {Influence of {TCE} concentration in thermal oxidation on reliability of SiC {MOS} capacitors under Fowler-Nordheim electron injection}, journal = {Microelectron. Reliab.}, volume = {46}, number = {12}, pages = {2044--2048}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.12.007}, doi = {10.1016/J.MICROREL.2005.12.007}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangKL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangLJL06, author = {Se Young Yang and Wang{-}Joo Lee and S. H. Jeong and S. J. Lee}, title = {Structural reliability assessment of multi-stack package {(MSP)} under high temperature storage {(HTS)} testing condition}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1904--1909}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.089}, doi = {10.1016/J.MICROREL.2006.07.089}, timestamp = {Fri, 19 Jan 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YangLJL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangWC06, author = {Shuang Yang and Ji Wu and Aristos Christou}, title = {Initial stage of silver electrochemical migration degradation}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1915--1921}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.080}, doi = {10.1016/J.MICROREL.2006.07.080}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YangWC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YangYLB06, author = {Zunxian Yang and Ying Yu and Xinxin Li and Haifei Bao}, title = {Nano-mechanical electro-thermal probe array used for high-density storage based on {NEMS} technology}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {805--810}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.117}, doi = {10.1016/J.MICROREL.2005.07.117}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YangYLB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YarimbiyikSAZB06, author = {A. Emre Yarimbiyik and Harry A. Schafft and Richard A. Allen and Mona E. Zaghloul and David L. Blackburn}, title = {Modeling and simulation of resistivity of nanometer scale copper}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1050--1057}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.004}, doi = {10.1016/J.MICROREL.2005.09.004}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YarimbiyikSAZB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YehL06, author = {Chang{-}Lin Yeh and Yi{-}Shao Lai}, title = {Support excitation scheme for transient analysis of {JEDEC} board-level drop test}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {626--636}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2004.12.021}, doi = {10.1016/J.MICROREL.2004.12.021}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YehL06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YehL06a, author = {Chang{-}Lin Yeh and Yi{-}Shao Lai}, title = {Transient fracturing of solder joints subjected to displacement-controlled impact loads}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {885--895}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.113}, doi = {10.1016/J.MICROREL.2005.07.113}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YehL06a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YehLK06, author = {Chang{-}Lin Yeh and Yi{-}Shao Lai and Chin{-}Li Kao}, title = {Evaluation of board-level reliability of electronic packages under consecutive drops}, journal = {Microelectron. Reliab.}, volume = {46}, number = {7}, pages = {1172--1182}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.09.002}, doi = {10.1016/J.MICROREL.2005.09.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YehLK06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YeoGDHJ06, author = {H. C. Yeo and Ningqun Guo and Hejun Du and Weimin Huang and X. M. Jian}, title = {Characterisation of {IC} packaging interfaces and loading effects}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1892--1897}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.087}, doi = {10.1016/J.MICROREL.2006.07.087}, timestamp = {Wed, 05 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YeoGDHJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YewCHYC06, author = {Ming{-}Chih Yew and C. Y. Chou and C. S. Huang and W. K. Yang and Kuo{-}Ning Chiang}, title = {The solder on rubber {(SOR)} interconnection design and its reliability assessment based on shear strength test and finite element analysis}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1874--1879}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.084}, doi = {10.1016/J.MICROREL.2006.07.084}, timestamp = {Wed, 23 Nov 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YewCHYC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YoonJ06, author = {Jeong{-}Won Yoon and Seung{-}Boo Jung}, title = {High temperature reliability and interfacial reaction of eutectic Sn-0.7Cu/Ni solder joints during isothermal aging}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {905--914}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.009}, doi = {10.1016/J.MICROREL.2005.05.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YoonJ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YuJY06, author = {Chuanzhao Yu and L. Jiang and Jiann{-}Shiun Yuan}, title = {Study of performance degradations in {DC-DC} converter due to hot carrier stress by simulation}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1840--1843}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.079}, doi = {10.1016/J.MICROREL.2006.07.079}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YuJY06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YuYX06, author = {Chuanzhao Yu and J. S. Yuan and Enjun Xiao}, title = {Dynamic voltage stress effects on nMOS varactor}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1812--1816}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.075}, doi = {10.1016/J.MICROREL.2006.07.075}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/YuYX06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/YuanDSSEEKZ06, author = {Cadmus A. Yuan and Willem D. van Driel and Richard B. R. van Silfhout and Olaf van der Sluis and Roy A. B. Engelen and Leo J. Ernst and Fred van Keulen and G. Q. Zhang}, title = {Delamination analysis of Cu/low-k technology subjected to chemical-mechanical polishing process conditions}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1679--1684}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.054}, doi = {10.1016/J.MICROREL.2006.07.054}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/mr/YuanDSSEEKZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZarandiM06, author = {Hamid R. Zarandi and Seyed Ghassem Miremadi}, title = {A fault-tolerant cache architecture based on binary set partitioning}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {86--99}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.009}, doi = {10.1016/J.MICROREL.2005.02.009}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZarandiM06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZemliakC06, author = {Alexander Zemliak and Roque De La Cruz}, title = {Numerical analysis of a double avalanche region {IMPATT} diode on the basis of nonlinear model}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {293--300}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.02.002}, doi = {10.1016/J.MICROREL.2005.02.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZemliakC06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhangHB06, author = {Guang{-}Ming Zhang and David M. Harvey and Derek R. Braden}, title = {Resolution improvement of acoustic microimaging by continuous wavelet transform for semiconductor inspection}, journal = {Microelectron. Reliab.}, volume = {46}, number = {5-6}, pages = {811--821}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.07.008}, doi = {10.1016/J.MICROREL.2005.07.008}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhangHB06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhangSZ06, author = {Y. L. Zhang and D. X. Q. Shi and Wei Zhou}, title = {Reliability study of underfill/chip interface under accelerated temperature cycling {(ATC)} loading}, journal = {Microelectron. Reliab.}, volume = {46}, number = {2-4}, pages = {409--420}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.04.012}, doi = {10.1016/J.MICROREL.2005.04.012}, timestamp = {Tue, 27 Oct 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhangSZ06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZhaoXT06, author = {Yao Zhao and Mingzhen Xu and Changhua Tan}, title = {Effect of reverse substrate bias on ultra-thin gate oxide n-MOSFET degradation under different stress modes}, journal = {Microelectron. Reliab.}, volume = {46}, number = {1}, pages = {164--168}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2005.05.002}, doi = {10.1016/J.MICROREL.2005.05.002}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZhaoXT06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@article{DBLP:journals/mr/ZimprichLW06, author = {P. Zimprich and T. Licht and B. Weiss}, title = {A new method to characterize the thermomechanical response of multilayered structures in power electronics}, journal = {Microelectron. Reliab.}, volume = {46}, number = {9-11}, pages = {1844--1847}, year = {2006}, url = {https://doi.org/10.1016/j.microrel.2006.07.067}, doi = {10.1016/J.MICROREL.2006.07.067}, timestamp = {Sat, 22 Feb 2020 00:00:00 +0100}, biburl = {https://dblp.org/rec/journals/mr/ZimprichLW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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