Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "toc:db/journals/et/et30.bht:"
download as .bib file
@article{DBLP:journals/et/Agrawal14,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {155--156},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5446-8},
doi = {10.1007/S10836-014-5446-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal14a,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {251--252},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5460-x},
doi = {10.1007/S10836-014-5460-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal14a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal14b,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {383--384},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5470-8},
doi = {10.1007/S10836-014-5470-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal14b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal14c,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {491--492},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5483-3},
doi = {10.1007/S10836-014-5483-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal14c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal14d,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {637--638},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5499-8},
doi = {10.1007/S10836-014-5499-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal14d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ArastehMR14,
author = {Bahman Arasteh and
Seyed Ghassem Miremadi and
Amir Masoud Rahmani},
title = {Developing Inherently Resilient Software Against Soft-Errors Based
on Algorithm Level Inherent Features},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {193--212},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5438-8},
doi = {10.1007/S10836-014-5438-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ArastehMR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ArvanitiT14,
author = {Efi Arvaniti and
Yiorgos Tsiatouhas},
title = {Low-Power Scan Testing: {A} Scan Chain Partitioning and Scan Hold
Based Technique},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {329--341},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5453-9},
doi = {10.1007/S10836-014-5453-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ArvanitiT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BaranowskiKW14,
author = {Rafal Baranowski and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {Access Port Protection for Reconfigurable Scan Networks},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {711--723},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5484-2},
doi = {10.1007/S10836-014-5484-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BaranowskiKW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BhatnagarG14,
author = {Pulkit Bhatnagar and
Sachin Garg},
title = {Dynamic Threshold Delay Characterization Model for Improved Static
Timing Analysis},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {495--504},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5469-1},
doi = {10.1007/S10836-014-5469-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BhatnagarG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BhattaBDTC14,
author = {Debesh Bhatta and
Aritra Banerjee and
Sabyasachi Deyati and
Nicholas Tzou and
Abhijit Chatterjee},
title = {Low Cost Signal Reconstruction Based Testing of {RF} Components using
Incoherent Undersampling},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {213--228},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5442-z},
doi = {10.1007/S10836-014-5442-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BhattaBDTC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CarloGSR14,
author = {Stefano Di Carlo and
Marco Gaudesi and
Edgar E. S{\'{a}}nchez and
Matteo Sonza Reorda},
title = {A Functional Approach for Testing the Reorder Buffer Memory},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {469--481},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5461-9},
doi = {10.1007/S10836-014-5461-9},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/CarloGSR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CarvalhoBSRB14,
author = {Mauricio de Carvalho and
Paolo Bernardi and
Ernesto S{\'{a}}nchez and
Matteo Sonza Reorda and
Oscar Ballan},
title = {Increasing the Fault Coverage of Processor Devices during the Operational
Phase Functional Test},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {317--328},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5457-5},
doi = {10.1007/S10836-014-5457-5},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/CarvalhoBSRB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CerattiCPVF14,
author = {Arthur Ceratti and
Thiago Copetti and
Let{\'{\i}}cia Maria Bolzani Poehls and
Fabian Vargas and
Rubem Dutra Ribeiro Fagundes},
title = {An On-Chip Sensor to Monitor {NBTI} Effects in SRAMs},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {159--169},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5444-x},
doi = {10.1007/S10836-014-5444-X},
timestamp = {Fri, 03 Sep 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/CerattiCPVF14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChenQM14,
author = {Mingsong Chen and
Xiaoke Qin and
Prabhat Mishra},
title = {Learning-oriented Property Decomposition for Automated Generation
of Directed Tests},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {287--306},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5452-x},
doi = {10.1007/S10836-014-5452-X},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChenQM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/CortezRHN14,
author = {Mafalda Cortez and
Gijs Roelofs and
Said Hamdioui and
Giorgio Di Natale},
title = {Testing Methods for PUF-Based Secure Key Storage Circuits},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {581--594},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5471-7},
doi = {10.1007/S10836-014-5471-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/CortezRHN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Eggersgluss14,
author = {Stephan Eggersgl{\"{u}}{\ss}},
title = {Dynamic X-filling for Peak Capture Power Reduction for Compact Test
Sets},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {557--567},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5472-6},
doi = {10.1007/S10836-014-5472-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Eggersgluss14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/El-GamalHI14,
author = {Mohamed A. El{-}Gamal and
Abdel{-}Karim S. O. Hassan and
Ahmad A. I. Ibrahim},
title = {Analog Fault Diagnosis Using Conic Optimization and Ellipsoidal Classifiers},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {443--455},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5466-4},
doi = {10.1007/S10836-014-5466-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/El-GamalHI14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/EvainSG14,
author = {Samuel Evain and
Valentin Savin and
Valentin Gherman},
title = {Error Correction Schemes with Erasure Information for Fast Memories},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {183--192},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5440-1},
doi = {10.1007/S10836-014-5440-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/EvainSG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FavalliD14,
author = {Michele Favalli and
Marcello Dalpasso},
title = {Applications of Boolean Satisfiability to Verification and Testing
of Switch-Level Circuits},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {41--55},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5433-0},
doi = {10.1007/S10836-014-5433-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FavalliD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FengO14,
author = {Junpeng Feng and
Marvin Onabajo},
title = {Wide Dynamic Range {CMOS} Amplifier Design for {RF} Signal Power Detection
via Electro-Thermal Coupling},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {101--109},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5427-3},
doi = {10.1007/S10836-013-5427-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FengO14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GomezCIHW14,
author = {Laura Rodr{\'{\i}}guez G{\'{o}}mez and
Alejandro Cook and
Thomas Indlekofer and
Sybille Hellebrand and
Hans{-}Joachim Wunderlich},
title = {Adaptive Bayesian Diagnosis of Intermittent Faults},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {527--540},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5477-1},
doi = {10.1007/S10836-014-5477-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GomezCIHW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GosheblaghM14,
author = {Reza Omidi Gosheblagh and
Karim Mohammadi},
title = {Three-Level Management Algorithm to Increase the {SEU} Emulation Rate
in {DPR} Based Emulators},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {739--749},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5489-x},
doi = {10.1007/S10836-014-5489-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GosheblaghM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuinDT14,
author = {Ujjwal Guin and
Daniel DiMase and
Mohammad Tehranipoor},
title = {Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges
Ahead},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {9--23},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5430-8},
doi = {10.1007/S10836-013-5430-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GuinDT14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuinDT14a,
author = {Ujjwal Guin and
Daniel DiMase and
Mohammad Tehranipoor},
title = {A Comprehensive Framework for Counterfeit Defect Coverage Analysis
and Detection Assessment},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {25--40},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5428-2},
doi = {10.1007/S10836-013-5428-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GuinDT14a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuoK14,
author = {Xiaofei Guo and
Ramesh Karri},
title = {Low-Cost Concurrent Error Detection for {GCM} and {CCM}},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {725--737},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5494-0},
doi = {10.1007/S10836-014-5494-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GuoK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HouL14,
author = {Chih{-}Sheng Hou and
Jin{-}Fu Li},
title = {Testing Disturbance Faults in Various {NAND} Flash Memories},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {643--652},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5487-z},
doi = {10.1007/S10836-014-5487-Z},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HouL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HsiaoWC14,
author = {Sen{-}Wen Hsiao and
Xian Wang and
Abhijit Chatterjee},
title = {Low Cost Built-in Sensor Testing of Phase-Locked Loop Dynamic Parameters},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {515--526},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5474-4},
doi = {10.1007/S10836-014-5474-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HsiaoWC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HsiehPL14,
author = {Tong{-}Yu Hsieh and
Yi{-}Han Peng and
Kuan{-}Hsien Li},
title = {Efficient Error-Tolerability Testing on Image Processing Circuits
Based on Equivalent Error Rate Transformation},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {687--699},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5488-y},
doi = {10.1007/S10836-014-5488-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HsiehPL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KatohKCWLLK14,
author = {Kentaroh Katoh and
Yutaro Kobayashi and
Takeshi Chujo and
Junshan Wang and
Ensi Li and
Congbing Li and
Haruo Kobayashi},
title = {A Small Chip Area Stochastic Calibration for {TDC} Using Ring Oscillator},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {653--663},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5486-0},
doi = {10.1007/S10836-014-5486-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KatohKCWLLK14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KhanIKA14,
author = {Shakeb Ahmad Khan and
Tariqul Islam and
Neeraj Khera and
A. K. Agarwala},
title = {On-line Condition Monitoring and Maintenance of Power Electronic Converters},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {701--709},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5491-3},
doi = {10.1007/S10836-014-5491-3},
timestamp = {Thu, 29 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/KhanIKA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KrishnaS14,
author = {K. Murali Krishna and
M. Sailaja},
title = {Low Power Memory Built in Self Test Address Generator Using Clock
Controlled Linear Feedback Shift Registers},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {77--85},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5432-1},
doi = {10.1007/S10836-014-5432-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KrishnaS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LiHW14,
author = {Deliang Li and
Kaoli Huang and
Changlong Wang},
title = {Fault Detection of Linear Analog Integrated Circuit in Network},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {483--489},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5468-2},
doi = {10.1007/S10836-014-5468-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LiHW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LienLHC14,
author = {Wei{-}Cheng Lien and
Kuen{-}Jong Lee and
Tong{-}Yu Hsieh and
Krishnendu Chakrabarty},
title = {Efficient {LFSR} Reseeding Based on Internal-Response Feedback},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {673--685},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5482-4},
doi = {10.1007/S10836-014-5482-4},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/LienLHC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaheswariS14,
author = {M. Maheswari and
G. Seetharaman},
title = {Enhanced Low Complex Double Error Correction Coding with Crosstalk
Avoidance for Reliable On-Chip Interconnection Link},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {387--400},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5465-5},
doi = {10.1007/S10836-014-5465-5},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaheswariS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MiettinenHRV14,
author = {Pekka Miettinen and
Mikko Honkala and
Janne Roos and
Martti Valtonen},
title = {Benefits of Partitioning in a Projection-based and Realizable Model-order
Reduction Flow},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {271--285},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5451-y},
doi = {10.1007/S10836-014-5451-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MiettinenHRV14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MillicanS14,
author = {Spencer K. Millican and
Kewal K. Saluja},
title = {Optimal Test Scheduling Formulation under Power Constraints with Dynamic
Voltage and Frequency Scaling},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {569--580},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5473-5},
doi = {10.1007/S10836-014-5473-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MillicanS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MiryalaOPCMP14,
author = {Sandeep Miryala and
Matheus Oleiro and
Let{\'{\i}}cia Maria Bolzani P{\"{o}}hls and
Andrea Calimera and
Enrico Macii and
Massimo Poncino},
title = {Modeling of Physical Defects in {PN} Junction Based Graphene Devices},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {357--370},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5458-4},
doi = {10.1007/S10836-014-5458-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MiryalaOPCMP14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PahlevanzadehY14,
author = {Hoda Pahlevanzadeh and
Qiaoyan Yu},
title = {A New Analytical Model of {SET} Latching Probability for Circuits
Experiencing Single- or Multiple-Cycle Single-Event Transients},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {595--609},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5476-2},
doi = {10.1007/S10836-014-5476-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PahlevanzadehY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PengRWWLW14,
author = {Yujia Peng and
B. M. Farid Rahman and
TengXing Wang and
Guoan Wang and
Xinchuan Liu and
Xuejun Wen},
title = {Characterization of a Passive Telemetric System for {ISM} Band Pressure
Sensors},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {665--671},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5485-1},
doi = {10.1007/S10836-014-5485-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PengRWWLW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RaoRP14,
author = {Sushmita Kadiyala Rao and
Ryan W. Robucci and
Chintan Patel},
title = {Simulation Based Framework for Accurately Estimating Dynamic Power-Supply
Noise and Path Delay},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {125--147},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5425-5},
doi = {10.1007/S10836-013-5425-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RaoRP14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RechFC14,
author = {Paolo Rech and
Christopher Frost and
Luigi Carro},
title = {GPUs Neutron Sensitivity Dependence on Data Type},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {307--316},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5456-6},
doi = {10.1007/S10836-014-5456-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RechFC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RekikAMN14,
author = {Ahmed Amine Rekik and
Florence Aza{\"{\i}}s and
Fr{\'{e}}d{\'{e}}rick Mailly and
Pascal Nouet},
title = {Study of Low-Cost Electrical Test Strategies for Post-Silicon Yield
Improvement of {MEMS} Convective Accelerometers},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {87--100},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5423-7},
doi = {10.1007/S10836-013-5423-7},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/RekikAMN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenC14,
author = {Yi Ren and
Li Chen},
title = {The Effect of Temperature-Induced Quiescent Operating Point Shift
on Single-Event Transient Sensitivity in Analog/Mixed-Signal Circuits},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {377--382},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5448-6},
doi = {10.1007/S10836-014-5448-6},
timestamp = {Wed, 26 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RenC14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RenHSGCWWVB14,
author = {Yi Ren and
Anlin He and
Shuting Shi and
Gang Guo and
Li Chen and
Shi{-}Jie Wen and
Richard Wong and
N. W. van Vonno and
Bharat L. Bhuva},
title = {Single-Event Transient Measurements on a {DC/DC} Pulse Width Modulator
Using Heavy Ion, Proton, and Pulsed Laser},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {149--154},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5431-7},
doi = {10.1007/S10836-013-5431-7},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RenHSGCWWVB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RossiOCMM14,
author = {Daniele Rossi and
Martin Oma{\~{n}}a and
Jos{\'{e}} Manuel Cazeaux and
Cecilia Metra and
T. M. Mak},
title = {Clock Faults Induced Min and Max Delay Violations},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {111--123},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5426-4},
doi = {10.1007/S10836-013-5426-4},
timestamp = {Sun, 20 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/RossiOCMM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SomhaY14,
author = {Worawit Somha and
Hiroyuki Yamauchi},
title = {An {RTN} Variation Tolerant {SRAM} Screening Test Design with Gaussian
Mixtures Approximations of Long-Tail Distributions},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {171--181},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5439-7},
doi = {10.1007/S10836-014-5439-7},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/SomhaY14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SunBDGPVA14,
author = {Zhenzhou Sun and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Etienne Auvray},
title = {Intra-Cell Defects Diagnosis},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {541--555},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5481-5},
doi = {10.1007/S10836-014-5481-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SunBDGPVA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TahanoutTDBGN14,
author = {Cherifa Tahanout and
Hakim Tahi and
Boualem Djezzar and
Abdelmadjid Benabdelmoumene and
Mohamed Goudjil and
B{\'{e}}charia Nadji},
title = {An Accurate Combination of on-the-fly Interface Trap and Threshold
Voltage Methods for {NBTI} Degradation Extraction},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {415--423},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5464-6},
doi = {10.1007/S10836-014-5464-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TahanoutTDBGN14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TanR14,
author = {Tze Sin Tan and
Bakhtiar Affendi Rosdi},
title = {Verilog {HDL} Simulator Technology: {A} Survey},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {255--269},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5449-5},
doi = {10.1007/S10836-014-5449-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TanR14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TranVBDGPW14,
author = {D. A. Tran and
Arnaud Virazel and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Hans{-}Joachim Wunderlich},
title = {A New Hybrid Fault-Tolerant Architecture for Digital {CMOS} Circuits
and Systems},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {401--413},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5459-3},
doi = {10.1007/S10836-014-5459-3},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/TranVBDGPW14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/UllahS14,
author = {Anees Ullah and
Luca Sterpone},
title = {Recovery Time and Fault Tolerance Improvement for Circuits mapped
on SRAM-based FPGAs},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {425--442},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5463-7},
doi = {10.1007/S10836-014-5463-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/UllahS14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VenkataramaniSA14,
author = {Praveen Venkataramani and
Suraj Sindia and
Vishwani D. Agrawal},
title = {A Test Time Theorem and its Applications},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {229--236},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5447-7},
doi = {10.1007/S10836-014-5447-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/VenkataramaniSA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/VockETO14,
author = {Stefan R. Vock and
Omar Escalona and
Colin Turner and
Frank J. Owens},
title = {The Use of Software Engineering Methods for Efficacious Test Program
Creation: {A} Supportive Evidence Based Case Study},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {457--467},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5462-8},
doi = {10.1007/S10836-014-5462-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/VockETO14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangGTL14,
author = {Zhigang Wang and
Lianping Guo and
Shulin Tian and
Tao Liu},
title = {Estiamtion and Correction of Mismatch Errors in Time-Interleaved ADCs},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {629--635},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5475-3},
doi = {10.1007/S10836-014-5475-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WangGTL14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangLCLBWWFB14,
author = {Haibin Wang and
Mulong Li and
Li Chen and
Rui Liu and
Sanghyeon Baeg and
Shi{-}Jie Wen and
Richard Wong and
Rita Fung and
Jinshun Bi},
title = {Single Event Resilient Dynamic Logic Designs},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {751--761},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5492-2},
doi = {10.1007/S10836-014-5492-2},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WangLCLBWWFB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WangLCM14,
author = {Guohua Wang and
Qiang Li and
Xiaomei Chen and
Xiaofeng Meng},
title = {Research on the Efficiency Improvement of Design for Testability Using
Test Point Allocation},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {371--376},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5450-z},
doi = {10.1007/S10836-014-5450-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WangLCM14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X14,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {157--158},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5443-y},
doi = {10.1007/S10836-014-5443-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X14a,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {253--254},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5455-7},
doi = {10.1007/S10836-014-5455-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X14a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X14b,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {30},
number = {4},
pages = {385--386},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5467-3},
doi = {10.1007/S10836-014-5467-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X14b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X14c,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {493--494},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5480-6},
doi = {10.1007/S10836-014-5480-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X14c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X14d,
title = {2013 {JETTA-TTTC} Best Paper Award},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {639--640},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5498-9},
doi = {10.1007/S10836-014-5498-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X14d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X14e,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {641--642},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5493-1},
doi = {10.1007/S10836-014-5493-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X14e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/XieH14,
author = {Tao Xie and
Yigang He},
title = {Fault Diagnosis of Analog Circuit Based on High-Order Cumulants and
Information Fusion},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {505--514},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5478-0},
doi = {10.1007/S10836-014-5478-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/XieH14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/XieLXXZ14,
author = {Yongle Xie and
Xifeng Li and
Sanshan Xie and
Xuan Xie and
Qizhong Zhou},
title = {Soft Fault Diagnosis of Analog Circuits via Frequency Response Function
Measurements},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {243--249},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5445-9},
doi = {10.1007/S10836-014-5445-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/XieLXXZ14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YuanMSG14,
author = {Haiying Yuan and
Jiaping Mei and
Hongying Song and
Kun Guo},
title = {Test Data Compression for System-on-a-Chip using Count Compatible
Pattern Run-Length Coding},
journal = {J. Electron. Test.},
volume = {30},
number = {2},
pages = {237--242},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5441-0},
doi = {10.1007/S10836-014-5441-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YuanMSG14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangA14,
author = {Bei Zhang and
Vishwani D. Agrawal},
title = {A Novel Wafer Manipulation Method for Yield Improvement and Cost Reduction
of 3D Wafer-on-Wafer Stacked ICs},
journal = {J. Electron. Test.},
volume = {30},
number = {1},
pages = {57--75},
year = {2014},
url = {https://doi.org/10.1007/s10836-013-5429-1},
doi = {10.1007/S10836-013-5429-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangHYD14,
author = {Chaolong Zhang and
Yigang He and
Lifen Yuan and
Fangming Deng},
title = {A Novel Approach for Analog Circuit Fault Prognostics Based on Improved
{RVM}},
journal = {J. Electron. Test.},
volume = {30},
number = {3},
pages = {343--356},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5454-8},
doi = {10.1007/S10836-014-5454-8},
timestamp = {Mon, 10 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangHYD14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangZA14,
author = {Yu Zhang and
Bei Zhang and
Vishwani D. Agrawal},
title = {Diagnostic Test Generation for Transition Delay Faults Using Stuck-At
Fault Detection Tools},
journal = {J. Electron. Test.},
volume = {30},
number = {6},
pages = {763--780},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5490-4},
doi = {10.1007/S10836-014-5490-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangZA14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZordanBDGVB14,
author = {Leonardo Bonet Zordan and
Alberto Bosio and
Luigi Dilillo and
Patrick Girard and
Arnaud Virazel and
Nabil Badereddine},
title = {On the Test and Mitigation of Malfunctions in Low-Power SRAMs},
journal = {J. Electron. Test.},
volume = {30},
number = {5},
pages = {611--627},
year = {2014},
url = {https://doi.org/10.1007/s10836-014-5479-z},
doi = {10.1007/S10836-014-5479-Z},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ZordanBDGVB14.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-05-25 03:21 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
