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@inproceedings{DBLP:conf/irps/0005KCSSPRL21, author = {Hai Jiang and Jinju Kim and Kihyun Choi and Hyewon Shim and Hyunchul Sagong and Junekyun Park and Hwasung Rhee and Euncheol Lee}, title = {Time Dependent Variability in Advanced FinFET Technology for End-of-Lifetime Reliability Prediction}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405129}, doi = {10.1109/IRPS46558.2021.9405129}, timestamp = {Wed, 05 May 2021 11:53:21 +0200}, biburl = {https://dblp.org/rec/conf/irps/0005KCSSPRL21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/AcurioTJBD21, author = {Eliana Acurio and Lionel Trojman and Brice De Jaeger and Benoit Bakeroot and Stefaan Decoutere}, title = {ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 {GET} dielectric}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405163}, doi = {10.1109/IRPS46558.2021.9405163}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/AcurioTJBD21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/AhnNCYC21, author = {Jae{-}Gyung Ahn and Rhesa Nathanael and I{-}Ru Chen and Ping{-}Chin Yeh and Jonathan Chang}, title = {Product Lifetime Estimation in 7nm with Large data of Failure Rate and Si-Based Thermal Coupling Model}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405193}, doi = {10.1109/IRPS46558.2021.9405193}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/AhnNCYC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ArunachalamBRRK21, author = {Balraj Arunachalam and Jean{-}Emmanuel Broquin and Quentin Rafhay and David Roy and Anne Kaminski}, title = {Simulation Study of the Origin of Ge High Speed Photodetector Degradation}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405211}, doi = {10.1109/IRPS46558.2021.9405211}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ArunachalamBRRK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/BeekRKKOCYCCSJC21, author = {Simon Van Beek and Siddharth Rao and Shreya Kundu and Woojin Kim and Barry J. O'Sullivan and Stefan Cosemans and Farrukh Yasin and Robert Carpenter and Sebastien Couet and Shamin H. Sharifi and Nico Jossart and Davide Crotti and Gouri Sankar Kar}, title = {Edge-induced reliability {\&} performance degradation in {STT-MRAM:} an etch engineering solution}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405209}, doi = {10.1109/IRPS46558.2021.9405209}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/BeekRKKOCYCCSJC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/BerensA21, author = {Judith Berens and Thomas Aichinger}, title = {A straightforward electrical method to determine screening capability of {GOX} extrinsics in arbitrary, commercially available SiC MOSFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405152}, doi = {10.1109/IRPS46558.2021.9405152}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/BerensA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/BruceSBCKNMPLBG21, author = {Robert L. Bruce and Syed Ghazi Sarwat and Irem Boybat and Cheng{-}Wei Cheng and Wanki Kim and S. R. Nandakumar and Charles Mackin and Timothy Philip and Zuoguang Liu and Kevin Brew and Nanbo Gong and Injo Ok and Praneet Adusumilli and Katie Spoon and Stefano Ambrogio and Benedikt Kersting and Thomas Bohnstingl and Manuel Le Gallo and Andrew Simon and Ning Li and Iqbal Saraf and Jin{-}Ping Han and Lynne M. Gignac and John M. Papalia and Tenko Yamashita and Nicole Saulnier and Geoffrey W. Burr and Hsinyu Tsai and Abu Sebastian and Vijay Narayanan and Matthew BrightSky}, title = {Mushroom-Type phase change memory with projection liner: An array-level demonstration of conductance drift and noise mitigation}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405191}, doi = {10.1109/IRPS46558.2021.9405191}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/BruceSBCKNMPLBG21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/BuddhanoySR21, author = {Matchima Buddhanoy and Sadman Sakib and Biswajit Ray}, title = {Runtime Variability Monitor for Data Retention Characteristics of Commercial {NAND} Flash Memory}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405143}, doi = {10.1109/IRPS46558.2021.9405143}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/BuddhanoySR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/CachoAF21, author = {Florian Cacho and Lorena Anghel and Xavier Federspiel}, title = {Monitoring Setup and Hold Timing Limits}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405175}, doi = {10.1109/IRPS46558.2021.9405175}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/CachoAF21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ChangKHJMSZHPCA21, author = {Yao{-}Feng Chang and Ilya Karpov and Reed Hopkins and David Janosky and Jacob Medeiros and Benjamin Sherrill and Jiahan Zhang and Yifu Huang and Tanmoy Pramanik and Albert B. Chen and Tony Acosta and Abdullah Guler and James A. O'Donnell and Pedro A. Quintero and Nathan Strutt and Oleg Golonzka and Chris Connor and Jack C. Lee and Jeffrey Hicks}, title = {Embedded emerging memory technologies for neuromorphic computing: temperature instability and reliability}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405120}, doi = {10.1109/IRPS46558.2021.9405120}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ChangKHJMSZHPCA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ChangZYJLSYW21, author = {Hao Chang and Longda Zhou and Hong Yang and Zhigang Ji and Qianqian Liu and Eddy Simoen and Huaxiang Yin and Wenwu Wang}, title = {Comparative Study on the Energy Distribution of Defects under {HCD} and {NBTI} in Short Channel p-FinFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405162}, doi = {10.1109/IRPS46558.2021.9405162}, timestamp = {Thu, 05 Jan 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/ChangZYJLSYW21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ChatterjeeOMXT21, author = {Neel Chatterjee and John Ortega and Inanc Meric and Peng Xiao and Ilan Tsameret}, title = {Machine Learning On Transistor Aging Data: Test Time Reduction and Modeling for Novel Devices}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--9}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405188}, doi = {10.1109/IRPS46558.2021.9405188}, timestamp = {Fri, 01 Dec 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/ChatterjeeOMXT21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ChenKFSOKO21, author = {Zhwen Chen and Young{-}Suk Kim and Tadashi Fukuda and Koji Sakui and Takayuki Ohba and Tatsuji Kobayashi and Takashi Obara}, title = {Reliability of Wafer-Level Ultra-Thinning down to 3 {\(\mathrm{\mu}\)}m using 20 nm-Node DRAMs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405125}, doi = {10.1109/IRPS46558.2021.9405125}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ChenKFSOKO21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ChenLNBLK21, author = {Chao{-}Yang Chen and Jian{-}Hsing Lee and Karuna Nidhi and Tzer{-}Yaa Bin and Geeng{-}Lih Lin and Ming{-}Dou Ker}, title = {Study on the Guard Rings for Latchup Prevention between {HV-PMOS} and {LV-PMOS} in a 0.15-{\(\mathrm{\mu}\)}m {BCD} Process}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405113}, doi = {10.1109/IRPS46558.2021.9405113}, timestamp = {Thu, 23 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ChenLNBLK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ChiocchettaCSSR21, author = {Francesca Chiocchetta and Claudia Calascione and Carlo De Santi and Chandan Sharma and Fabiana Rampazzo and Xun Zheng and Brian Romanczyk and Matthew Guidry and Haoran Li and Stacia Keller and Umesh K. Mishra and Gaudenzio Meneghesso and Matteo Meneghini and Enrico Zanoni}, title = {Role of the AlGaN Cap Layer on the Trapping Behaviour of N-Polar GaN MISHEMTs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--2}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405111}, doi = {10.1109/IRPS46558.2021.9405111}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ChiocchettaCSSR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ChoudhurySTZSWM21, author = {Nilotpal Choudhury and Tarun Samadder and Ravi Tiwari and Huimei Zhou and Richard G. Southwick and Miaomiao Wang and Souvik Mahapatra}, title = {Analysis of Sheet Dimension (W, {L)} Dependence of {NBTI} in {GAA-SNS} FETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405137}, doi = {10.1109/IRPS46558.2021.9405137}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ChoudhurySTZSWM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/CiappaP21, author = {Mauro Ciappa and Marco Pocaterra}, title = {Assessing the pre-breakdown carriers' multiplication in SiC power MOSFETs by soft gamma radiation and its correlation to the Terrestrial Cosmic Rays failure rate data as measured by neutron irradiation}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405205}, doi = {10.1109/IRPS46558.2021.9405205}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/CiappaP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/CioniBMVPC21, author = {Marcello Cioni and Alessandro Bertacchini and Alessandro Mucci and Giovanni Verzellesi and Paolo Pavan and Alessandro Chini}, title = {Investigation on {VTH} and {RON} Slow/Fast Drifts in SiC MOSFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405231}, doi = {10.1109/IRPS46558.2021.9405231}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/CioniBMVPC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Cressler21, author = {John D. Cressler}, title = {New Developments in SiGe {HBT} Reliability for {RF} Through mmW Circuits}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405171}, doi = {10.1109/IRPS46558.2021.9405171}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Cressler21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/DammannBKKBKGS21, author = {Maximilian Dammann and Martina Baeumler and Tobias Kemmer and Helmer Konstanzer and Peter Br{\"{u}}ckner and Sebastian Krause and Andreas Graff and Mich{\'{e}}l Simon{-}Najasek}, title = {Reliability and Failure Analysis of 100 nm AlGaN/GaN HEMTs under {DC} and {RF} Stress}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405227}, doi = {10.1109/IRPS46558.2021.9405227}, timestamp = {Fri, 27 Oct 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/DammannBKKBKGS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/DegraeveRKFCGK21, author = {Robin Degraeve and Taras Ravsher and Shoichi Kabuyanagi and Andrea Fantini and Sergiu Clima and Daniele Garbin and Gouri Sankar Kar}, title = {Modeling and spectroscopy of ovonic threshold switching defects}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405114}, doi = {10.1109/IRPS46558.2021.9405114}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/DegraeveRKFCGK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/DharPHS21, author = {Tonmoy Dhar and Jitesh Poojary and Ramesh Harjani and Sachin S. Sapatnekar}, title = {Aging of Current DACs and its Impact in Equalizer Circuits}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405160}, doi = {10.1109/IRPS46558.2021.9405160}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/DharPHS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/DuanSOESB21, author = {Ning Duan and Vignesh Subramanian and Edgar Olthof and Paul Eggenkamp and Michiel van Soestbergen and Richard Braspenning}, title = {Moisture diffusion rate in an ultra-low-k dielectric and its effect on the dielectric reliability}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405157}, doi = {10.1109/IRPS46558.2021.9405157}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/DuanSOESB21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/FabrisBPZJYDMMZ21, author = {Elena Fabris and Matteo Borga and Niels Posthuma and Ming Zhao and Brice De Jaeger and Shuzhen You and Stefaan Decoutere and Matteo Meneghini and Gaudenzio Meneghesso and Enrico Zanoni}, title = {Vertical stack reliability of GaN-on-Si buffers for low-voltage applications}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405097}, doi = {10.1109/IRPS46558.2021.9405097}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/FabrisBPZJYDMMZ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/FarmerWHVBGEDSR21, author = {James Farmer and William Whitehead and Andrew Hall and Dmitry Veksler and Gennadi Bersuker and David Z. Gao and Al{-}Moatasem El{-}Sayed and Thomas Durrant and Alexander L. Shluger and Thomas Rueckes and Lee Cleveland and Harry Luan and Rahul Sen}, title = {Mitigating switching variability in carbon nanotube memristors}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405123}, doi = {10.1109/IRPS46558.2021.9405123}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/FarmerWHVBGEDSR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/FederspielCMDC21, author = {Xavier Federspiel and Abdourahmane Camara and Audrey Michard and Cheikh Diouf and Florian Cacho}, title = {{HCI} Temperature sense effect from 180nm to 28nm nodes}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405146}, doi = {10.1109/IRPS46558.2021.9405146}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/FederspielCMDC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/FeeleyXBNWF21, author = {Alexandra Feeley and Yoni Xiong and Bharat L. Bhuva and Balaji Narasimham and Shi{-}Ji Wen and Rita Fung}, title = {Effects of Temperature and Supply Voltage on Soft Errors for 7-nm Bulk FinFET Technology}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405124}, doi = {10.1109/IRPS46558.2021.9405124}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/FeeleyXBNWF21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/FiorenzaAABCMRS21, author = {Patrick Fiorenza and Salvatore Adamo and Mario Santo Alessandrino and Cettina Bottari and Beatrice Carbone and Clarice Di Martino and Alfio Russo and Mario Saggio and Carlo Venuto and Elisa Vitanza and Edoardo Zanetti and Filippo Giannazzo and Fabrizio Roccaforte}, title = {Correlation between MOSFETs breakdown and 4H-SiC epitaxial defects}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405148}, doi = {10.1109/IRPS46558.2021.9405148}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/FiorenzaAABCMRS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/FrutuosoLGBLGCC21, author = {Tadeu Mota Frutuoso and Jose Lugo{-}Alvarez and Xavier Garros and Laurent Brunet and Joris Lacord and Louis Gerrer and Mika{\"{e}}l Cass{\'{e}} and Edoardo Catapano and Claire Fenouillet{-}B{\'{e}}ranger and Fran{\c{c}}ois Andrieu and Fred Gaillard and Philippe Ferrari}, title = {Impact of spacer interface charges on performance and reliability of low temperature transistors for 3D sequential integration}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405107}, doi = {10.1109/IRPS46558.2021.9405107}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/FrutuosoLGBLGCC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/FujiiHYMKSOMM21, author = {Shuntaro Fujii and Shohei Hamada and Tatsushi Yagi and Isao Maru and Shogo Katsuki and Toshiro Sakamoto and Atsushi Okamoto and Soichi Morita and Tsutomu Miyazaki}, title = {Impacts of Depth and Lateral Profiles of Fluorine Atoms in Gate Oxide Films on Reliability}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405217}, doi = {10.1109/IRPS46558.2021.9405217}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/FujiiHYMKSOMM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Garba-SeybouFBC21, author = {Tidjani Garba{-}Seybou and Xavier Federspiel and Alain Bravaix and Florian Cacho}, title = {Analysis of the interactions of {HCD} under "On" and "Off" state modes for 28nm {FDSOI} {AC} {RF} modelling}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405214}, doi = {10.1109/IRPS46558.2021.9405214}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Garba-SeybouFBC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/GerrerCGGFCRV21, author = {Louis Gerrer and Jacques Cluzel and Fred Gaillard and Xavier Garros and Xavier Federspiel and Florian Cacho and David Roy and E. Vincent}, title = {{BTI} Arbitrary Stress Patterns Characterization {\&} Machine-Learning optimized {CET} Maps Simulations}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405145}, doi = {10.1109/IRPS46558.2021.9405145}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/GerrerCGGFCRV21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/GrasserOKFSW21, author = {Tibor Grasser and Barry J. O'Sullivan and Ben Kaczer and Jacopo Franco and Bernhard Stampfer and Michael Waltl}, title = {{CV} Stretch-Out Correction after Bias Temperature Stress: Work-Function Dependence of Donor-/Acceptor-Like Traps, Fixed Charges, and Fast States}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405184}, doi = {10.1109/IRPS46558.2021.9405184}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/GrasserOKFSW21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/GuptaBSBPBAC21, author = {Aniket Gupta and Govind Bajpai and Priyanshi Singhal and Navjeet Bagga and Om Prakash and Shashank Banchhor and Hussam Amrouch and Nitanshu Chauhan}, title = {Traps Based Reliability Barrier on Performance and Revealing Early Ageing in Negative Capacitance {FET}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405185}, doi = {10.1109/IRPS46558.2021.9405185}, timestamp = {Wed, 07 Dec 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/GuptaBSBPBAC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HanLSNJOHJLLSHJ21, author = {Shinhee Han and Junghyuk Lee and Kiseok Suh and Kyungtae Nam and Daeeun Jeong and Sechung Oh and Sohee Hwang and Yongsung Ji and Kilho Lee and Kangho Lee and Yoonjong Song and Yeongki Hong and Gitae Jeong}, title = {Reliability of {STT-MRAM} for various embedded applications}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405094}, doi = {10.1109/IRPS46558.2021.9405094}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HanLSNJOHJLLSHJ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HanMK21, author = {Jin{-}Woo Han and M. Meyyappan and Jungsik Kim}, title = {Single Event Hard Error due to Terrestrial Radiation}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405177}, doi = {10.1109/IRPS46558.2021.9405177}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HanMK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HanXHYHLK21, author = {Lixia Han and Yachen Xiang and Peng Huang and Guihai Yu and Runze Han and Xiaoyan Liu and Jinfeng Kang}, title = {Novel Weight Mapping Method for Reliable {NVM} based Neural Network}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405200}, doi = {10.1109/IRPS46558.2021.9405200}, timestamp = {Fri, 21 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/HanXHYHLK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HaoSG21, author = {Jifa Hao and Yuhang Sun and Amartya Ghosh}, title = {Charge pumping source-drain current for gate oxide interface trap density in MOSFETs and {LDMOS}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405229}, doi = {10.1109/IRPS46558.2021.9405229}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HaoSG21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HeSYSFYS21, author = {Wangxin He and Wonbo Shim and Shihui Yin and Xiaoyu Sun and Deliang Fan and Shimeng Yu and Jae{-}sun Seo}, title = {Characterization and Mitigation of Relaxation Effects on Multi-level {RRAM} based In-Memory Computing}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405228}, doi = {10.1109/IRPS46558.2021.9405228}, timestamp = {Wed, 26 Jul 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HeSYSFYS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HiblotRTDCSBDK21, author = {Gaspard Hiblot and Nouredine Rassoul and Lieve Teugels and Katia Devriendt and Adrian Vaisman Chasin and Michiel J. van Setten and Attilio Belmonte and Romain Delhougne and Gouri Sankar Kar}, title = {Process-induced charging damage in {IGZO} nTFTs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405201}, doi = {10.1109/IRPS46558.2021.9405201}, timestamp = {Wed, 29 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HiblotRTDCSBDK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HoldenHCKPGDGA21, author = {Konner E. K. Holden and Gavin D. R. Hall and Michael Cook and Chris Kendrick and Kaitlyn Pabst and Bruce Greenwood and Robin Daugherty and Jeff P. Gambino and Derryl D. J. Allman}, title = {Dielectric Relaxation, Aging and Recovery in High-K {MIM} Capacitors}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--10}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405212}, doi = {10.1109/IRPS46558.2021.9405212}, timestamp = {Thu, 20 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HoldenHCKPGDGA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HuangR21, author = {Shudong Huang and Elyse Rosenbaum}, title = {Compact Model of {ESD} Diode Suitable for Subnanosecond Switching Transients}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405149}, doi = {10.1109/IRPS46558.2021.9405149}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HuangR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/HungCCCLH21, author = {Shih{-}che Hung and Shih{-}Chang Chen and Pei{-}Shan Chien and Yu{-}Sheng Cho and Yung{-}Huei Lee and Wei{-}Shuo Hung}, title = {Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress {(TRVS)} Method for Automotive Applications}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405144}, doi = {10.1109/IRPS46558.2021.9405144}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/HungCCCLH21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Ishimaru21, author = {Kazunari Ishimaru}, title = {Challenges of Flash Memory for Next Decade}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405182}, doi = {10.1109/IRPS46558.2021.9405182}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Ishimaru21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/JoseYCHSZZ21, author = {Sumy Jose and Chunshan Yin and Yu Chen and Cheong Min Hong and Mehul D. Shroff and Xiaoling Zhao and Fan Zhang}, title = {An efficient methodology to evaluate {BEOL} and {MOL} {TDDB} in advanced nodes}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405138}, doi = {10.1109/IRPS46558.2021.9405138}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/JoseYCHSZZ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KaralkarGPHG21, author = {Sagar Premnath Karalkar and Vishal Ganesan and Milova Paul and Kyong Jin Hwang and Robert Gauthier}, title = {Design Optimization of {MV-NMOS} to Improve Holding Voltage of a 28nm {CMOS} Technology {ESD} Power Clamp}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405206}, doi = {10.1109/IRPS46558.2021.9405206}, timestamp = {Thu, 02 Feb 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/KaralkarGPHG21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KariyaYUIKM21, author = {Kento Kariya and Atsushi Yumiba and Masaya Ukita and Toru Ikeda and Masaaki Koganemaru and Noriyuki Masago}, title = {Study of the microstructure and the mechanical properties of Pb-2.5Ag-2Sn solder joint}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405219}, doi = {10.1109/IRPS46558.2021.9405219}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KariyaYUIKM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Kashyap21, author = {Rajesh Kashyap}, title = {Silicon lifecycle management {(SLM)} with in-chip monitoring}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405187}, doi = {10.1109/IRPS46558.2021.9405187}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Kashyap21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KimNOLKLKSHL21, author = {Seung{-}Mo Kim and Thi Mi Hanh Nyugen and Jungwon Oh and Yongsu Lee and Soo Cheol Kang and Ho{-}In Lee and Cihyun Kim and Surajit Some and Hyeon Jun Hwang and Byoung Hun Lee}, title = {Drastic reliability improvement using {H2O2/UV} treatment of HfO2 for heterogeneous integration}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405126}, doi = {10.1109/IRPS46558.2021.9405126}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KimNOLKLKSHL21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KimYKEKYLKP21, author = {Gang{-}Jun Kim and Moonjee Yoon and SungHwan Kim and Myeongkyu Eo and Shinhyung Kim and Taehun You and Namhyun Lee and Kijin Kim and Sangwoo Pae}, title = {The Characterization of Degradation on various SiON pMOSFET transistors under {AC/DC} {NBTI} stress}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405108}, doi = {10.1109/IRPS46558.2021.9405108}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KimYKEKYLKP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KimYS21, author = {Dongyoung Kim and Nick Yun and Woongje Sung}, title = {Advancing Static Performance and Ruggedness of 600 {V} SiC MOSFETs: Experimental Analysis and Simulation Study}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405109}, doi = {10.1109/IRPS46558.2021.9405109}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KimYS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KishidaSK21, author = {Ryo Kishida and Ikuo Suda and Kazutoshi Kobayashi}, title = {Bias Temperature Instability Depending on Body Bias through Buried Oxide {(BOX)} Layer in a 65 nm Fully-Depleted Silicon-On-Insulator Process}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405121}, doi = {10.1109/IRPS46558.2021.9405121}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KishidaSK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KobrinskyK21, author = {Mauro J. Kobrinsky and Rahim Kasim}, title = {Back End Of Line opportunities and reliability challenges for future technology nodes}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--2}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405099}, doi = {10.1109/IRPS46558.2021.9405099}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KobrinskyK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KocharSMM21, author = {Dimple Kochar and Tarun Samadder and Subhadeep Mukhopadhyay and Souvik Mahapatra}, title = {Modeling of {HKMG} Stack Process Impact on Gate Leakage, {SILC} and {PBTI}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405154}, doi = {10.1109/IRPS46558.2021.9405154}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KocharSMM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KozakS0LZ21, author = {Joseph P. Kozak and Qihao Song and Ruizhe Zhang and Jingcun Liu and Yuhao Zhang}, title = {Robustness of GaN Gate Injection Transistors under Repetitive Surge Energy and Overvoltage}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405173}, doi = {10.1109/IRPS46558.2021.9405173}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KozakS0LZ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KrishnanSHDL0BJ21, author = {Gokul Krishnan and Jingbo Sun and Jubin Hazra and Xiaocong Du and Maximilian Liehr and Zheng Li and Karsten Beckmann and Rajiv V. Joshi and Nathaniel C. Cady and Yu Cao}, title = {Robust RRAM-based In-Memory Computing in Light of Model Stability}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405092}, doi = {10.1109/IRPS46558.2021.9405092}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KrishnanSHDL0BJ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KruvMCORBGWH21, author = {Anastasiia Kruv and Sean R. C. McMitchell and Sergiu Clima and Oguzhan O. Okudur and Nicolo Ronchi and Geert Van den Bosch and Mario Gonzalez and Ingrid De Wolf and Jan Van Houdt}, title = {Impact of mechanical strain on wakeup of HfO2 ferroelectric memory}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405159}, doi = {10.1109/IRPS46558.2021.9405159}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KruvMCORBGWH21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KumarSTSM21, author = {Satyam Kumar and Tarun Samadder and Karansingh Thakor and Uma Sharma and Souvik Mahapatra}, title = {Stochastic and Deterministic Modeling Frameworks for Time Kinetics of Gate Insulator Traps During and After Hot Carrier Stress in MOSFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405155}, doi = {10.1109/IRPS46558.2021.9405155}, timestamp = {Mon, 21 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/KumarSTSM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/KuyamaUE21, author = {Tomohiro Kuyama and Keiichiro Urabe and Koji Eriguchi}, title = {Evaluation methodology for assessment of dielectric degradation and breakdown dynamics using time-dependent impedance spectroscopy {(TDIS)}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405190}, doi = {10.1109/IRPS46558.2021.9405190}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/KuyamaUE21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LamaBBBNCGCNN21, author = {Giusy Lama and Mathieu Bernard and Nicolas Bernier and Guillaume Bourgeois and Emmanuel Nolot and Niccolo Castellani and Julien Garrione and Marie Claire Cyrille and Gabriele Navarro and Etienne Nowak}, title = {Multilevel Programming Reliability in Si-doped GeSbTe for Storage Class Memory}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405116}, doi = {10.1109/IRPS46558.2021.9405116}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LamaBBBNCGCNN21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LauensteinCLKPT21, author = {Jean{-}Marie Lauenstein and Megan C. Casey and Ray L. Ladbury and Hak S. Kim and Anthony M. Phan and Alyson D. Topper}, title = {Space Radiation Effects on SiC Power Device Reliability}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405180}, doi = {10.1109/IRPS46558.2021.9405180}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LauensteinCLKPT21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LeeBKKYRL21, author = {Moon Soo Lee and Inhak Baick and Min Kim and Seo Hyun Kwon and Myeong Soo Yeo and Hwasung Rhee and Euncheol Lee}, title = {Chip to Package Interaction Risk Assessment of {FCBGA} Devices using {FEA} Simulation, Meta-Modeling and Multi-Objective Genetic Algorithm Optimization Technique}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405133}, doi = {10.1109/IRPS46558.2021.9405133}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LeeBKKYRL21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LeeLHHNKCYCWBD21, author = {Yung{-}Huei Lee and P. J. Liao and Vincent Hou and Dawei Heh and Chih{-}Hung Nien and Wen{-}Hsien Kuo and Gary T. Chen and Shao{-}Ming Yu and Yu{-}Sheng Chen and Jau{-}Yi Wu and Xinyu Bao and Carlos H. Diaz}, title = {Composition Segregation of Ge-Rich {GST} and Its Effect on Reliability}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405168}, doi = {10.1109/IRPS46558.2021.9405168}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LeeLHHNKCYCWBD21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LeeTTT21, author = {Tsung{-}En Lee and Kasidit Toprasertpong and Mitsuru Takenaka and Shinichi Takagi}, title = {Characterization of Slow Traps in SiGe {MOS} Interfaces by TiN/Y2O3 Gate Stacks}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405189}, doi = {10.1109/IRPS46558.2021.9405189}, timestamp = {Sun, 25 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LeeTTT21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LesniewskaPLMVD21, author = {Alicja Lesniewska and Olalla Varela Pedreira and Melina Lofrano and Gayle Murdoch and Marleen H. van der Veen and Anish Dangol and Naoto Horiguchi and Zsolt T{\"{o}}kei and Kris Croes}, title = {Reliability of a {DME} Ru Semidamascene scheme with 16 nm wide Airgaps}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405192}, doi = {10.1109/IRPS46558.2021.9405192}, timestamp = {Mon, 01 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LesniewskaPLMVD21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LinHSLXCYCWHSWP21, author = {Shy{-}Jay Lin and Yen{-}Lin Huang and MingYaun Song and Chien{-}Ming Lee and Fen Xue and Guan{-}Long Chen and Shan{-}Yi Yang and Yao{-}Jen Chang and I{-}Jung Wang and Yu{-}Chen Hsin and Yi{-}Hui Su and Jeng{-}Hua Wei and Chi{-}Feng Pai and Shan X. Wang and Carlos H. Diaz}, title = {Challenges toward Low-Power {SOT-MRAM}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405127}, doi = {10.1109/IRPS46558.2021.9405127}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LinHSLXCYCWHSWP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LiuDZZ21, author = {Wei Liu and Yaru Ding and Liang Zhao and Yi Zhao}, title = {Nanosecond-scale and self-heating free characterization of advanced {CMOS} transistors utilizing wave reflection}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405218}, doi = {10.1109/IRPS46558.2021.9405218}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LiuDZZ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/LopezHGRSNBCDCB21, author = {Joel Minguet Lopez and Lucas Hudeley and Laurent Grenouillet and Diego Alfaro Robayo and Jury Sandrini and Gabriele Navarro and Mathieu Bernard and Catherine Carabasse and Damien Deleruyelle and Niccolo Castellani and Marc Bocquet and Jean{-}Michel Portal and Etienne Nowak and Gabriel Molas}, title = {Elucidating 1S1R operation to reduce the read voltage margin variability by stack and programming conditions optimization}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405195}, doi = {10.1109/IRPS46558.2021.9405195}, timestamp = {Thu, 23 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/LopezHGRSNBCDCB21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MahajanCVRKA21, author = {Bikram Kishore Mahajan and Yen{-}Pu Chen and Dhanoop Varghese and Vijay Reddy and Srikanth Krishnan and Muhammad Ashraful Alam}, title = {Quantifying Region-Specific Hot Carrier Degradation in {LDMOS} Transistors Using a Novel Charge Pumping Technique}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405224}, doi = {10.1109/IRPS46558.2021.9405224}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MahajanCVRKA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MazzaPCGRSZBF21, author = {Bruna Mazza and Salvatore Patan{\'{e}} and Francesco Cordiano and Massimiliano Giliberto and Giovanni Renna and Andrea Severino and Edoardo Zanetti and Massimo Boscaglia and Giovanni Franco}, title = {Effect of interface and bulk charges on the breakdown of nitrided gate oxide on 4H-SiC}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405176}, doi = {10.1109/IRPS46558.2021.9405176}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MazzaPCGRSZBF21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/McDonaldB21, author = {Tim McDonald and Stephanie Watts Butler}, title = {Progress and Current Topics of {JEDEC} {JC-70.1} Power GaN Device Quality and Reliability Standards Activity: Or: What is the Avalanche capability of your GaN Transistor?}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405225}, doi = {10.1109/IRPS46558.2021.9405225}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/McDonaldB21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MichaelLK21, author = {Ooi Michael and Loo Tung Lun and Koay Eng Keong}, title = {Methodology to improve Safety Critical SoC based platform: a case study}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405223}, doi = {10.1109/IRPS46558.2021.9405223}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MichaelLK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MiloAZPMOOWI21, author = {Valerio Milo and Francesco Anzalone and Cristian Zambelli and Eduardo P{\'{e}}rez and Mamathamba Kalishettyhalli Mahadevaiah and Oscar Gonzalez Ossorio and Piero Olivo and Christian Wenger and Daniele Ielmini}, title = {Optimized programming algorithms for multilevel {RRAM} in hardware neural networks}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405119}, doi = {10.1109/IRPS46558.2021.9405119}, timestamp = {Sun, 25 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MiloAZPMOOWI21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MishraWZLSC21, author = {Subrat Mishra and Pieter Weckx and Odysseas Zografos and Ji{-}Yung Lin and Alessio Spessot and Francky Catthoor}, title = {Overhead Reduction with Optimal Margining Using {A} Reliability Aware Design Paradigm}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405198}, doi = {10.1109/IRPS46558.2021.9405198}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MishraWZLSC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ModoloMSSSPMZM21, author = {Nicola Modolo and Andrea Minetto and Carlo De Santi and Luca Sayadi and Sebastien Sicre and Gerhard Prechtl and Gaudenzio Meneghesso and Enrico Zanoni and Matteo Meneghini}, title = {A Generalized Approach to Determine the Switching Reliability of GaN HEMTs on-Wafer Level}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405142}, doi = {10.1109/IRPS46558.2021.9405142}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ModoloMSSSPMZM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MonishmuraliS21, author = {M. Monishmurali and Mayank Shrivastava}, title = {Peculiar Current Instabilities {\&} Failure Mechanism in Vertically Stacked Nanosheet ggN-FET}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405147}, doi = {10.1109/IRPS46558.2021.9405147}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MonishmuraliS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MonishmuraliS21a, author = {M. Monishmurali and Mayank Shrivastava}, title = {A Novel High Voltage Drain Extended FinFET {SCR} for SoC Applications}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405194}, doi = {10.1109/IRPS46558.2021.9405194}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MonishmuraliS21a.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MorishitaM21, author = {Yasuyuki Morishita and Satoshi Maeda}, title = {Characterization of NMOS-based {ESD} Protection for Wide-range Pulse Immunity}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405117}, doi = {10.1109/IRPS46558.2021.9405117}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MorishitaM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/MulaosmanovicLS21, author = {Halid Mulaosmanovic and Patrick D. Lomenzo and Uwe Schroeder and Stefan Slesazeck and Thomas Mikolajick and Benjamin Max}, title = {Reliability aspects of ferroelectric hafnium oxide for application in non-volatile memories}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405215}, doi = {10.1109/IRPS46558.2021.9405215}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/MulaosmanovicLS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/NarasimhamCSTBB21, author = {Balaji Narasimham and Vikas Chaudhary and Mike Smith and Liming Tsau and Dennis R. Ball and Bharat L. Bhuva}, title = {Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405216}, doi = {10.1109/IRPS46558.2021.9405216}, timestamp = {Mon, 09 May 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/NarasimhamCSTBB21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/NevarezOWP21, author = {Jairo Nevarez and Anthony Olmedo and Rachel Williams and Polina Pechnikova}, title = {Gate Driver Protection Methods for SiC {MOSFET} Short Circuit Testing}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405170}, doi = {10.1109/IRPS46558.2021.9405170}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/NevarezOWP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/NeyerDDS21, author = {Thomas Neyer and Martin Domeij and Hrishikesh Das and Swapna Sunkari}, title = {Is there a perfect SiC MosFETs Device on an imperfect crystal?}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405098}, doi = {10.1109/IRPS46558.2021.9405098}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/NeyerDDS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Osenbach21, author = {John Osenbach}, title = {Reliability of optoelectronic module An Introduction}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--9}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405213}, doi = {10.1109/IRPS46558.2021.9405213}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Osenbach21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/OsmansonKMKGK21, author = {Allison T. Osmanson and Mohsen Tajedini and Yi Ram Kim and Hossein Madanipour and Choong{-}Un Kim and Bradley Glasscock and Muhammad Khan}, title = {Mechanisms of Contact Formation and Electromigration Reliability in Wirebond Packages}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405131}, doi = {10.1109/IRPS46558.2021.9405131}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/OsmansonKMKGK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/OuyangYYHWYHX21, author = {Yan Ouyang and Suhui Yang and Dandan Yin and Xiang Huang and Zhiqiang Wang and Shengwei Yang and Kun Han and Zhongyi Xia}, title = {Excellent Reliability of Xtacking{\texttrademark} Bonding Interface}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405115}, doi = {10.1109/IRPS46558.2021.9405115}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/OuyangYYHWYHX21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/PalanisamyBLKWE21, author = {Shanmuganathan Palanisamy and Thomas Basler and Josef Lutz and Cesare K{\"{u}}nzel and Larissa Wehrhahn{-}Kilian and Rudolf Elpelt}, title = {Investigation of the bipolar degradation of SiC {MOSFET} body diodes and the influence of current density}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405183}, doi = {10.1109/IRPS46558.2021.9405183}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/PalanisamyBLKWE21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/PalmerZWLPK21, author = {James Palmer and Galor Zhang and Justin R. Weber and Cheyun Lin and Christopher Perini and Rahim Kasim}, title = {Intrinsic Reliability of {BEOL} interlayer dielectric}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--2}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405089}, doi = {10.1109/IRPS46558.2021.9405089}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/PalmerZWLPK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ParkYKK21, author = {Gyusung Park and Hanzhao Yu and Minsu Kim and Chris H. Kim}, title = {An All {BTI} (N-PBTI, N-NBTI, P-PBTI, {P-NBTI)} Odometer based on a Dual Power Rail Ring Oscillator Array}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405181}, doi = {10.1109/IRPS46558.2021.9405181}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ParkYKK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/PedrettiAI21, author = {Giacomo Pedretti and Elia Ambrosi and Daniele Ielmini}, title = {Conductance variations and their impact on the precision of in-memory computing with resistive switching memory {(RRAM)}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405130}, doi = {10.1109/IRPS46558.2021.9405130}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/PedrettiAI21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/PesicBPGKHVPBCL21, author = {Milan Pesic and Bastien Beltrando and Andrea Padovani and Shruba Gangopadhyay and Muthukumar Kaliappan and Michael Haverty and Marco A. Villena and Enrico Piccinini and Matteo Bertocchi and Tony Chiang and Luca Larcher and Jack Strand and Alexander L. Shluger}, title = {Variability sources and reliability of 3D - FeFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405118}, doi = {10.1109/IRPS46558.2021.9405118}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/PesicBPGKHVPBCL21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/PirroJZLIMPZOHR21, author = {Luca Pirro and Aarthi Jayakumar and Olaf Zimmerhackl and Dieter Lipp and Ralf Illgen and Armin Muehlhoff and Ronny Pfuetzner and Alban Zaka and Michael Otto and Jan Hoentschel and Yannick Raffel and Konrad Seidel and Ricardo Olivo}, title = {Comparison of Analog and Noise Performance between Buried Channel versus Surface Devices in {HKMG} {I/O} Devices}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405122}, doi = {10.1109/IRPS46558.2021.9405122}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/PirroJZLIMPZOHR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/PutchaCAZLPWLC21, author = {Vamsi Putcha and Liang Cheng and AliReza Alian and Ming Zhao and Hai Lu and Bertrand Parvais and Niamh Waldron and Dimitri Linten and Nadine Collaert}, title = {On the impact of buffer and GaN-channel thickness on current dispersion for GaN-on-Si RF/mmWave devices}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405139}, doi = {10.1109/IRPS46558.2021.9405139}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/PutchaCAZLPWLC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/RaceZTKG21, author = {Salvatore Race and Thomas Ziemann and Shweta Tiwari and Ivana Kovacevic{-}Badstuebner and Ulrike Grossner}, title = {Accuracy of Thermal Analysis for SiC Power Devices}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405203}, doi = {10.1109/IRPS46558.2021.9405203}, timestamp = {Mon, 26 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/RaceZTKG21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/RanjanLMRPLKNKJ21, author = {Rakesh Ranjan and Ki{-}Don Lee and Md Iqbal Mahmud and Mohammad Shahriar Rahman and Pavitra Ramadevi Perepa and Charles Briscoe LaRow and Caleb Dongkyun Kwon and Maihan Nguyen and Minhyo Kang and Ashish Kumar Jha and Ahmed Shariq and Shamas Musthafa Ummer and Susannah Laure Prater and Hyunchul Sagong and HwaSung Rhee}, title = {Systematic Study of Process Impact on FinFET Reliability}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405134}, doi = {10.1109/IRPS46558.2021.9405134}, timestamp = {Fri, 07 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/RanjanLMRPLKNKJ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/RathiSGD21, author = {Aarti Rathi and P. Srinivasan and Fernando Guarin and Abhisek Dixit}, title = {Large Signal {RF} Reliability of 45-nm {RFSOI} Power Amplifier Cell for Wi-Fi6 Applications}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405158}, doi = {10.1109/IRPS46558.2021.9405158}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/RathiSGD21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/RoldanMARHSJAL21, author = {Juan Bautista Rold{\'{a}}n and David Maldonado and Francisco J. Alonso and Andr{\'{e}}s M. Rold{\'{a}}n and Fei Hui and Yuanyuan Shi and Francisco Jim{\'{e}}nez{-}Molinos and Ana M. Aguilera and Mario Lanza}, title = {Time series modeling of the cycle-to-cycle variability in h-BN based memristors}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405100}, doi = {10.1109/IRPS46558.2021.9405100}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/RoldanMARHSJAL21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/RzepaKBSSMKKWHC21, author = {Gerhard Rzepa and Markus Karner and Oskar Baumgartner and Georg Strof and Franz Schanovsky and Ferdinand Mitterbauer and Christian Kernstock and Hui{-}Wen Karner and Pieter Weckx and Geert Hellings and Dieter Claes and Zhicheng Wu and Yang Xiang and Thomas Chiarella and Bertrand Parvais and J{\'{e}}r{\^{o}}me Mitard and Jacopo Franco and Ben Kaczer and Dimitri Linten and Zlatan Stanojevic}, title = {Reliability and Variability-Aware {DTCO} Flow: Demonstration of Projections to {N3} FinFET and Nanosheet Technologies}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405172}, doi = {10.1109/IRPS46558.2021.9405172}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/RzepaKBSSMKKWHC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Salahuddin21, author = {Sayeef S. Salahuddin}, title = {Ultrathin Ferroelectricity and Its Application in Advanced Logic and Memory Devices}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405186}, doi = {10.1109/IRPS46558.2021.9405186}, timestamp = {Wed, 08 Jun 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Salahuddin21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SalmenFWRRA21, author = {Paul Salmen and Maximilian W. Feil and Katja Waschneck and Hans Reisinger and Gerald Rescher and Thomas Aichinger}, title = {A new test procedure to realistically estimate end-of-life electrical parameter stability of SiC MOSFETs in switching operation}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405207}, doi = {10.1109/IRPS46558.2021.9405207}, timestamp = {Mon, 05 Feb 2024 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/SalmenFWRRA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SamadderKTM21, author = {Tarun Samadder and Satyam Kumar and Karansingh Thakor and Souvik Mahapatra}, title = {A Theoretical Framework for Trap Generation and Passivation in {NAND} Flash Tunnel Oxide During Distributed Cycling and Retention Bake}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405104}, doi = {10.1109/IRPS46558.2021.9405104}, timestamp = {Mon, 21 Mar 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/SamadderKTM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SasseSR21, author = {Guido T. Sasse and Vignesh Subramanian and Ljubo Radic}, title = {Aging models for n- and p-type {LDMOS} covering low, medium and high {VGS} operation}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405135}, doi = {10.1109/IRPS46558.2021.9405135}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/SasseSR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Scarpulla21, author = {John Scarpulla}, title = {Guidelines for Space Qualification of GaN HEMTs and MMICs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--11}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405226}, doi = {10.1109/IRPS46558.2021.9405226}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Scarpulla21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SchmidgallGTPYS21, author = {Emma R. Schmidgall and Flavio Griggio and George H. Thiel and Sherman E. Peek and Bhargav Yelamanchili and Archit Shah and Vaibhav Gupta and John A. Sellers and Michael C. Hamilton and David B. Tuckerman and Samuel d'Hollosy}, title = {Reliability Characterization of a Flexible Interconnect for Cryogenic and Quantum Applications}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405090}, doi = {10.1109/IRPS46558.2021.9405090}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/SchmidgallGTPYS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ShahZLR21, author = {Milan Shah and Yujie Zhou and David LaFonteese and Elyse Rosenbaum}, title = {Considerations in High Voltage Lateral {ESD} {PNP} Design}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--10}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405093}, doi = {10.1109/IRPS46558.2021.9405093}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ShahZLR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ShengH21, author = {Lieyi Sheng and Ihsiu Ho}, title = {Universal Impacts of Local Electric Fields on the Projected Dielectric Lifetime}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405112}, doi = {10.1109/IRPS46558.2021.9405112}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ShengH21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ShimMPSY21, author = {Wonbo Shim and Jian Meng and Xiaochen Peng and Jae{-}sun Seo and Shimeng Yu}, title = {Impact of Multilevel Retention Characteristics on {RRAM} based {DNN} Inference Engine}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405210}, doi = {10.1109/IRPS46558.2021.9405210}, timestamp = {Tue, 21 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/ShimMPSY21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SolomonBTDFCLCR21, author = {Paul M. Solomon and Douglas M. Bishop and Teodor K. Todorov and Simon Dawes and Damon B. Farmer and Matthew Copel and Ko{-}Tao Lee and John Collins and John Rozen}, title = {Transient Investigation of Metal-oxide based, CMOS-compatible {ECRAM}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405156}, doi = {10.1109/IRPS46558.2021.9405156}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/SolomonBTDFCLCR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SonKKLKP21, author = {Donghee Son and Gang{-}Jun Kim and Jongkyun Kim and Nam{-}Hyun Lee and Kijin Kim and Sangwoo Pae}, title = {Effect of High Temperature on Recovery of Hot Carrier Degradation of scaled nMOSFETs in {DRAM}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405153}, doi = {10.1109/IRPS46558.2021.9405153}, timestamp = {Fri, 21 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/SonKKLKP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Song0KLLZ21, author = {Qihao Song and Ruizhe Zhang and Joseph P. Kozak and Jingcun Liu and Qiang Li and Yuhao Zhang}, title = {Failure Mechanisms of Cascode GaN HEMTs Under Overvoltage and Surge Energy Events}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405208}, doi = {10.1109/IRPS46558.2021.9405208}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Song0KLLZ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SrinivasanG21, author = {P. Srinivasan and Fernando Guarin}, title = {{CMOS} {RF} reliability for 5G mmWave applications - Challenges and Opportunities}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405202}, doi = {10.1109/IRPS46558.2021.9405202}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/SrinivasanG21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SrinivasanGSJLJ21, author = {P. Srinivasan and Fernando Guarin and Shafi Syed and Joris Angelo Sundaram Jerome and Wen Liu and Sameer H. Jain and Dimitri Lederer and Stephen Moss and Paul Colestock and Anirban Bandyopadhyay and Ned Cahoon and Byoung Min and Martin Gall}, title = {{RF} Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405220}, doi = {10.1109/IRPS46558.2021.9405220}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/SrinivasanGSJLJ21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/SrinivasanSRLD21, author = {P. Srinivasan and Da Song and David Rose and Maurice LaCroix and Arunima Dasgupta}, title = {Back gate bias effect and layout dependence on Random Telegraph Noise in {FDSOI} technologies}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405199}, doi = {10.1109/IRPS46558.2021.9405199}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/SrinivasanSRLD21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/StewartKRNHJHGP21, author = {Kevin A. Stewart and Keiichi Kimura and Matt Ring and Koen Noldus and Pat Hulse and Rick C. Jerome and Akihiro Hasegawa and Jeff P. Gambino and David T. Price}, title = {Assessing SiCr resistor drift for automotive analog ICs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405169}, doi = {10.1109/IRPS46558.2021.9405169}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/StewartKRNHJHGP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/TataridouGT21, author = {Angeliki Tataridou and G{\'{e}}rard Ghibaudo and Christoforos G. Theodorou}, title = {"Pinch to Detect": {A} Method to Increase the Number of Detectable {RTN} Traps in Nano-scale MOSFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405102}, doi = {10.1109/IRPS46558.2021.9405102}, timestamp = {Mon, 03 Jan 2022 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/TataridouGT21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/TatenoNOMKOHIYN21, author = {Yasunori Tateno and Ken Nakata and Akio Oya and Keita Matsuda and Yoshihide Komatsu and Shinichi Osada and Masafumi Hirata and Shigeyuki Ishiyama and Toshiki Yoda and Atsushi Nitta and Tomio Sato}, title = {Investigation of the Failure Mechanism of InGaAs-pHEMT under High Temperature Operating Life Tests}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405166}, doi = {10.1109/IRPS46558.2021.9405166}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/TatenoNOMKOHIYN21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/TiernoCARBR21, author = {Davide Tierno and Kristof Croes and Arjun Ajaykumar and Siva Ramesh and Geert Van den Bosch and Maarten Rosmeulen}, title = {Reliability of Mo as Word Line Metal in 3D {NAND}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405132}, doi = {10.1109/IRPS46558.2021.9405132}, timestamp = {Thu, 14 Oct 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/TiernoCARBR21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/Toledano-LuqueP21, author = {Maria Toledano{-}Luque and Peter C. Paliwoda and Mohamed Nour and Thomas Kauerauf and Byoung Min and Germain Bossu and Mahesh Siddabathula and Tanya Nigam}, title = {Off-state {TDDB} in FinFET Technology and its Implication for Safe Operating Area}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405151}, doi = {10.1109/IRPS46558.2021.9405151}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/Toledano-LuqueP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/TroussierBJSA21, author = {Chloe Troussier and Johan Bourgeat and Blaise Jacquier and Emmanuel Simeu and Jean{-}Daniel Arnould}, title = {Estimation of Oxide Breakdown Voltage During a {CDM} Event Using Very Fast Transmission Line Pulse and Transmission Line Pulse Measurements}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405110}, doi = {10.1109/IRPS46558.2021.9405110}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/TroussierBJSA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/UemuraCJKLKLSRL21, author = {Taiki Uemura and Byungjin Chung and Jeongmin Jo and Mijoung Kim and Dalhee Lee and Gunrae Kim and Seungbae Lee and Taesjoong Song and Hwasung Rhee and Brandon Lee and Jaehee Choi}, title = {Soft-Error Susceptibility in Flip-Flop in {EUV} 7 nm Bulk-FinFET Technology}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405101}, doi = {10.1109/IRPS46558.2021.9405101}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/UemuraCJKLKLSRL21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/VaisHSYAMKKWSC21, author = {Abhitosh Vais and Brent Hsu and Olga Syshchyk and Hao Yu and AliReza Alian and Yves Mols and Komal Vondkar Kodandarama and Bernardette Kunert and Niamh Waldron and Eddy Simoen and Nadine Collaert}, title = {A defect characterization technique for the sidewall surface of Nano-ridge and Nanowire based Logic and {RF} technologies}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405095}, doi = {10.1109/IRPS46558.2021.9405095}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/VaisHSYAMKKWSC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/VandemaeleKTFDC21, author = {Michiel Vandemaele and Ben Kaczer and Stanislav Tyaginov and Jacopo Franco and Robin Degraeve and Adrian Vaisman Chasin and Zhicheng Wu and Erik Bury and Yang Xiang and Hans Mertens and Guido Groeseneken}, title = {The properties, effect and extraction of localized defect profiles from degraded {FET} characteristics}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405164}, doi = {10.1109/IRPS46558.2021.9405164}, timestamp = {Wed, 24 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/VandemaeleKTFDC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/VieyVJCCKMBGSGM21, author = {Aby{-}Ga{\"{e}}l Viey and William Vandendaele and Marie{-}Anne Jaud and Jean Coignus and Jacques Cluzel and Alexis Krakovinsky and Simon Martin and J{\'{e}}rome Biscarrat and Romain Gwoziecki and Veronique Sousa and Fred Gaillard and Roberto Modica and Ferdinando Iucolano and Matteo Meneghini and Gaudenzio Meneghesso and G{\'{e}}rard Ghibaudo}, title = {Study on the difference between {ID(VG)} and {C(VG)} pBTI shifts in GaN-on-Si E-mode MOSc-HEMT}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405221}, doi = {10.1109/IRPS46558.2021.9405221}, timestamp = {Fri, 24 Dec 2021 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/VieyVJCCKMBGSGM21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/VyasPTABSLGI21, author = {Pratik B. Vyas and Ninad Pimparkar and Robert Tu and Wafa Arfaoui and Germain Bossu and Mahesh Siddabathula and Steffen Lehmann and Jung{-}Suk Goo and Ali B. Icel}, title = {Reliability-Conscious {MOSFET} Compact Modeling with Focus on the Defect-Screening Effect of Hot-Carrier Injection}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405197}, doi = {10.1109/IRPS46558.2021.9405197}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/VyasPTABSLGI21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/WangZZHSQH21, author = {Runsheng Wang and Zuodong Zhang and Yawen Zhang and Yixuan Hu and Yanan Sun and Weikang Qian and Ru Huang}, title = {Can Emerging Computing Paradigms Help Enhancing Reliability Towards the End of Technology Roadmap?}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405167}, doi = {10.1109/IRPS46558.2021.9405167}, timestamp = {Mon, 03 Jun 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/WangZZHSQH21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/WeiASLYWL21, author = {Ming{-}Liang Wei and Hussam Amrouch and Cheng{-}Lin Sung and Hang{-}Ting Lue and Chia{-}Lin Yang and Keh{-}Chung Wang and Chih{-}Yuan Lu}, title = {Robust Brain-Inspired Computing: On the Reliability of Spiking Neural Network Using Emerging Non-Volatile Synapses}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--8}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405141}, doi = {10.1109/IRPS46558.2021.9405141}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/WeiASLYWL21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/WuFTRTVBGLK21, author = {Zhicheng Wu and Jacopo Franco and Brecht Truijen and Philippe Roussel and Stanislav Tyaginov and Michiel Vandemaele and Erik Bury and Guido Groeseneken and Dimitri Linten and Ben Kaczer}, title = {Physics-based device aging modelling framework for accurate circuit reliability assessment}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405106}, doi = {10.1109/IRPS46558.2021.9405106}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/WuFTRTVBGLK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/XiangTVWFBTPLK21, author = {Yang Xiang and Stanislav Tyaginov and Michiel Vandemaele and Zhicheng Wu and Jacopo Franco and Erik Bury and Brecht Truijen and Bertrand Parvais and Dimitri Linten and Ben Kaczer}, title = {A BSIM-Based Predictive Hot-Carrier Aging Compact Model}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--9}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405222}, doi = {10.1109/IRPS46558.2021.9405222}, timestamp = {Sat, 30 Sep 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/XiangTVWFBTPLK21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/XiaoHKJOSPT21, author = {Peng Xiao and Haris Hadziosmanovic and Michael Klessens and Rong Jiang and John Ortega and Daniel Schroeder and James Palmer and Ilan Tsameret}, title = {Customized Parallel Reliability Testing Platform with Multifold Throughput Enhancement for Intel Stressing Tests}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405140}, doi = {10.1109/IRPS46558.2021.9405140}, timestamp = {Fri, 01 Dec 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/XiaoHKJOSPT21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/XiongFMBWF21, author = {Yoni Xiong and Alexandra Feeley and Lloyd W. Massengill and Bharat L. Bhuva and Shi{-}Jie Wen and Rita Fung}, title = {Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405128}, doi = {10.1109/IRPS46558.2021.9405128}, timestamp = {Thu, 20 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/XiongFMBWF21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/YangHCCLC21, author = {W. Y. Yang and E. R. Hsieh and C. H. Cheng and B. Y. Chen and K. S. Li and Steve S. Chung}, title = {A Reliable Triple-Level Operation of Resistive-Gate Flash Featuring Forming-Free and High Immunity to Sneak Path}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405179}, doi = {10.1109/IRPS46558.2021.9405179}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/YangHCCLC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/YangKPKLPKH21, author = {NamHyuk Yang and JinHwan Kim and GeonGu Park and ChulHyuk Kwon and SeungTaek Lee and SangWoo Pae and HooSung Kim and SangWon Hwang}, title = {A Study on System Level {UFS} {M-PHY} Reliability Measurement Method Using {RDVS}}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405096}, doi = {10.1109/IRPS46558.2021.9405096}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/YangKPKLPKH21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/YangWLYHH21, author = {Liu Yang and Qi Wang and Qianhui Li and Xiaolei Yu and Jing He and Zongliang Huo}, title = {Efficient Data Recovery Technique for 3D {TLC} {NAND} Flash Memory based on {WL} Interference}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405150}, doi = {10.1109/IRPS46558.2021.9405150}, timestamp = {Tue, 07 Nov 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/YangWLYHH21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZahedmaneshPTC21, author = {Houman Zahedmanesh and Olalla Varela Pedreira and Zsolt Tokei and Kristof Croes}, title = {Electromigration limits of copper nano-interconnects}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405091}, doi = {10.1109/IRPS46558.2021.9405091}, timestamp = {Mon, 01 May 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZahedmaneshPTC21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZanottiPP21, author = {Tommaso Zanotti and Francesco Maria Puglisi and Paolo Pavan}, title = {Low-Bit Precision Neural Network Architecture with High Immunity to Variability and Random Telegraph Noise based on Resistive Memories}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405103}, doi = {10.1109/IRPS46558.2021.9405103}, timestamp = {Tue, 07 May 2024 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZanottiPP21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZengCGKA21, author = {Ke Zeng and Srabanti Chowdhury and Brendan Gunning and Robert Kaplar and Travis Anderson}, title = {Study on Avalanche Uniformity in 1.2KV GaN Vertical {PIN} Diode with Bevel Edge-Termination}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--4}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405165}, doi = {10.1109/IRPS46558.2021.9405165}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZengCGKA21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZhangKHCCZG21, author = {Zhenjun Zhang and Matthias Kraatz and Meike Hauschildt and Seungman Choi and Andr{\'{e}} Clausner and Ehrenfried Zschech and Martin Gall}, title = {Strategy to Characterize Electromigration Short Length Effects in Cu/low-k Interconnects}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405161}, doi = {10.1109/IRPS46558.2021.9405161}, timestamp = {Sun, 02 Oct 2022 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZhangKHCCZG21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZhengPW21, author = {Yongju Zheng and Rahul R. Potera and Tony Witt}, title = {Characterization of Early Breakdown of SiC {MOSFET} Gate Oxide by Voltage Ramp Tests}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--5}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405196}, doi = {10.1109/IRPS46558.2021.9405196}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZhengPW21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZhouWBSWSZBG21, author = {Huimei Zhou and Miaomiao Wang and Ruqiang Bao and Tian Shen and Ernest Y. Wu and Richard G. Southwick and Jingyun Zhang and Veeraraghavan S. Basker and Dechao Guo}, title = {{TDDB} Reliability in Gate-All-Around Nanosheet}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--6}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405204}, doi = {10.1109/IRPS46558.2021.9405204}, timestamp = {Wed, 28 Jun 2023 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZhouWBSWSZBG21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZhouZYJLZSYLDZW21, author = {Longda Zhou and Zhaohao Zhang and Hong Yang and Zhigang Ji and Qianqian Liu and Qingzhu Zhang and Eddy Simoen and Huaxiang Yin and Jun Luo and Anyan Du and Chao Zhao and Wenwu Wang}, title = {A Fast {DCIV} Technique for Characterizing the Generation and Repassivation of Interface Traps Under {DC/} {AC} {NBTI} Stress/Recovery Condition in Si p-FinFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405105}, doi = {10.1109/IRPS46558.2021.9405105}, timestamp = {Thu, 05 Jan 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/irps/ZhouZYJLZSYLDZW21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@inproceedings{DBLP:conf/irps/ZhuLWASS21, author = {Shengnan Zhu and Tianshi Liu and Marvin H. White and Anant K. Agarwal and Arash Salemi and David Sheridan}, title = {Investigation of Gate Leakage Current Behavior for Commercial 1.2 kV 4H-SiC Power MOSFETs}, booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, pages = {1--7}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021.9405230}, doi = {10.1109/IRPS46558.2021.9405230}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/ZhuLWASS21.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
@proceedings{DBLP:conf/irps/2021, title = {{IEEE} International Reliability Physics Symposium, {IRPS} 2021, Monterey, CA, USA, March 21-25, 2021}, publisher = {{IEEE}}, year = {2021}, url = {https://doi.org/10.1109/IRPS46558.2021}, doi = {10.1109/IRPS46558.2021}, isbn = {978-1-7281-6893-7}, timestamp = {Wed, 05 May 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/conf/irps/2021.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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