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@inproceedings{DBLP:conf/dft/AhmadilivaniRDK23,
author = {Mohammad Hasan Ahmadilivani and
Jaan Raik and
Masoud Daneshtalab and
Alar Kuusik},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Analysis and Improvement of Resilience for Long Short-Term Memory
Neural Networks},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313559},
doi = {10.1109/DFT59622.2023.10313559},
timestamp = {Tue, 21 Nov 2023 12:38:06 +0100},
biburl = {https://dblp.org/rec/conf/dft/AhmadilivaniRDK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BohmerFCRFAO23,
author = {Kevin B{\"{o}}hmer and
Bruno Forlin and
Carlo Cazzaniga and
Paolo Rech and
Gianluca Furano and
Nikolaos Alachiotis and
Marco Ottavi},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Neutron Radiation Tests of the {NEORV32} {RISC-V} SoC on Flash-Based
FPGAs},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313556},
doi = {10.1109/DFT59622.2023.10313556},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BohmerFCRFAO23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BolchiniCMNP23,
author = {Cristiana Bolchini and
Luca Cassano and
Antonio Miele and
Alessandro Nazzari and
Dario Passarello},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Analyzing the Reliability of Alternative Convolution Implementations
for Deep Learning Applications},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313558},
doi = {10.1109/DFT59622.2023.10313558},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BolchiniCMNP23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BoncaloA23,
author = {Oana Boncalo and
Alexandru Amaricai},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Gradient Descent Iterative Correction Unit for Fixed Point Parity
Based Codes},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313571},
doi = {10.1109/DFT59622.2023.10313571},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BoncaloA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BouatAMCST23,
author = {S. Bouat and
St{\'{e}}phanie Anceau and
Laurent Maingault and
Jessy Cl{\'{e}}di{\`{e}}re and
Luc Salvo and
R{\'{e}}mi Tucoulou},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated
circuits},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313553},
doi = {10.1109/DFT59622.2023.10313553},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BouatAMCST23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CantoroSRAP23,
author = {Riccardo Cantoro and
Sandro Sartoni and
Matteo Sonza Reorda and
Lorena Anghel and
Michele Portolan},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Evaluating the Impact of Aging on Path-Delay Self-Test Libraries},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--7},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313531},
doi = {10.1109/DFT59622.2023.10313531},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/CantoroSRAP23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChapmanMWKK23,
author = {Glenn H. Chapman and
Klinsmann J. Coelho Silva Meneses and
Linda Wu and
Israel Koren and
Zahava Koren},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Image Degradation in Time Due to Interacting Hot Pixels},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313555},
doi = {10.1109/DFT59622.2023.10313555},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChapmanMWKK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChaurasiaAS23,
author = {Rahul Chaurasia and
Abhinav Reddy Asireddy and
Anirban Sengupta},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Fault Secured JPEG-Codec Hardware Accelerator with Piracy Detective
Control using Secure Fingerprint Template},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313536},
doi = {10.1109/DFT59622.2023.10313536},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChaurasiaAS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChenAKV23,
author = {Junchao Chen and
Marko S. Andjelkovic and
Milos Krstic and
Fabian Luis Vargas},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {A Machine Learning-driven {EDAC} Method for Space-Application Memory},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313560},
doi = {10.1109/DFT59622.2023.10313560},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChenAKV23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChenT23,
author = {Yu{-}Guang Chen and
Ying{-}Jing Tsai},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Reliability of Computing-In-Memories: Threats, Detection Methods,
and Mitigation Approaches},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313545},
doi = {10.1109/DFT59622.2023.10313545},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChenT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DuttaCDT23,
author = {Shruti Dutta and
Sai Charan Rachamadugu Chinni and
Abhishek Das and
Nur A. Touba},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Highly Efficient Layered Syndrome-based Double Error Correction Utilizing
Current Summing in {RRAM} Cells to Simplify Decoder},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313572},
doi = {10.1109/DFT59622.2023.10313572},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DuttaCDT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/FanjasAPC23,
author = {Cl{\'{e}}ment Fanjas and
Driss Aboulkassimi and
Simon Ponti{\'{e}} and
Jessy Cl{\'{e}}di{\`{e}}re},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Exploration of System-on-Chip Secure-Boot Vulnerability to Fault-Injection
by Side-Channel Analysis},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313346},
doi = {10.1109/DFT59622.2023.10313346},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/FanjasAPC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/FuentesACA23,
author = {Francisco Fuentes and
Sergi Alcaide and
Raimon Casanova and
Jaume Abella},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Black-Box {IP} Validation with the SafeTI Traffic Injector: {A} Success
Story},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313565},
doi = {10.1109/DFT59622.2023.10313565},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/FuentesACA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GavariniRS23,
author = {Gabriele Gavarini and
Annachiara Ruospo and
Ernesto S{\'{a}}nchez},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {On the resilience of representative and novel data formats in CNNs},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313551},
doi = {10.1109/DFT59622.2023.10313551},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GavariniRS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GeorgakidisVSLCGASK23,
author = {Christos Georgakidis and
Dimitris Valiantzas and
Stavros Simoglou and
Iordanis Lilitsis and
Nikolaos Chatzivangelis and
Ilias Golfos and
Marko S. Andjelkovic and
Christos P. Sotiriou and
Milos Krstic},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Towards a Comprehensive {SET} Analysis Flow for {VLSI} Circuits using
Static Timing Analysis},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313533},
doi = {10.1109/DFT59622.2023.10313533},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GeorgakidisVSLCGASK23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GrignaniSDVM23,
author = {Wesley Grignani and
Douglas A. dos Santos and
Luigi Dilillo and
Felipe Viel and
Douglas R. Melo},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {A Low-Cost Hardware Accelerator for {CCSDS} 123 Lossless Hyperspectral
Image Compression},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313567},
doi = {10.1109/DFT59622.2023.10313567},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GrignaniSDVM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GuhaB23,
author = {Krishnendu Guha and
Gouriprasad Bhattacharyya},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {A Self Aware Security Approach for Real Time Neural Network Applications
from Row Hammer Attacks in Multi {FPGA} Multi User Environment},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313547},
doi = {10.1109/DFT59622.2023.10313547},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GuhaB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HabibyHD23,
author = {Payam Habiby and
Sebastian Huhn and
Rolf Drechsler},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {{RC-IJTAG:} {A} Methodology for Designing Remotely-Controlled {IEEE}
1687 Scan Networks},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313568},
doi = {10.1109/DFT59622.2023.10313568},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HabibyHD23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HosokawaIY23,
author = {Toshinori Hosokawa and
Kyohei Iizuka and
Masayoshi Yoshimura},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {An Evaluation of a Testability Measure for State Assignment to Estimate
Transition Fault Coverage for Controllers},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313575},
doi = {10.1109/DFT59622.2023.10313575},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HosokawaIY23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HuangCL23,
author = {Shih{-}Hsu Huang and
Wei{-}Che Cheng and
Jin{-}Fu Li},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Hardware Trojans of Computing-In-Memories: Issues and Methods},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313529},
doi = {10.1109/DFT59622.2023.10313529},
timestamp = {Wed, 22 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HuangCL23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/IbnatKF23,
author = {Zahin Ibnat and
Hadi Mardani Kamali and
Farimah Farahmandi},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Iterative Mitigation of Insecure Resource Sharing Produced by High-level
Synthesis},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313550},
doi = {10.1109/DFT59622.2023.10313550},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/IbnatKF23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ImianoskySMVD23,
author = {Carolina Imianosky and
Douglas A. dos Santos and
Douglas R. Melo and
Felipe Viel and
Luigi Dilillo},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Implementation and Reliability Evaluation of a {RISC-V} Vector Extension
Unit},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313569},
doi = {10.1109/DFT59622.2023.10313569},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ImianoskySMVD23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/JadhavSS23,
author = {Govind Rajhans Jadhav and
Sonali Shukla and
Virendra Singh},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {On Attacking Scan-based Logic Locking Schemes},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313561},
doi = {10.1109/DFT59622.2023.10313561},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/JadhavSS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KRRS23,
author = {Raghunandana K. K and
Yogesh Prasad K. R and
Matteo Sonza Reorda and
Virendra Singh},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {{DDSR:} An Online {GPGPU} Instruction Decoder Error Detecting and
Correcting Architecture},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313543},
doi = {10.1109/DFT59622.2023.10313543},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KRRS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KilianSTHS23,
author = {Tobias Kilian and
Abhishek Sengupta and
Daniel Tille and
Martin Huch and
Ulf Schlichtmann},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {An efficient High-Volume Production Performance Screening using On-Chip
Ring Oscillators},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313542},
doi = {10.1109/DFT59622.2023.10313542},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KilianSTHS23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KoufopoulouPPPH23,
author = {Amalia{-}Artemis Koufopoulou and
Athanasios Papadimitriou and
Aggelos Pikrakis and
Mihalis Psarakis and
David H{\'{e}}ly},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {On the Prediction of Hardware Security Properties of {HLS} Designs
Using Graph Neural Networks},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313544},
doi = {10.1109/DFT59622.2023.10313544},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KoufopoulouPPPH23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Li23,
author = {Jin{-}Fu Li},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Testing of Computing-In Memories: Faults, Test Algorithms, and Design-for-Testability},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313537},
doi = {10.1109/DFT59622.2023.10313537},
timestamp = {Wed, 06 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Li23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MezgerSDM23,
author = {Benjamin W. Mezger and
Douglas A. dos Santos and
Luigi Dilillo and
Douglas R. Melo},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Hardening a Real-Time Operating System for a Dependable {RISC-V} System-on-Chip},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313566},
doi = {10.1109/DFT59622.2023.10313566},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/MezgerSDM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MizotaHYA23,
author = {Momona Mizota and
Toshinori Hosokawa and
Masayoshi Yoshimura and
Masayuki Arai},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {A Block Partitioning Method for Region Exhaustive Test to Reduce the
Number of Test Patterns and Improve Gate Exhaustive Fault Coverage},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313552},
doi = {10.1109/DFT59622.2023.10313552},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MizotaHYA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/OtaHYYA23,
author = {Natsuki Ota and
Toshinori Hosokawa and
Koji Yamazaki and
Yukari Yamauchi and
Masayuki Arai},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {An Estimation Method of Defect Types Using Artificial Neural Networks
and Fault Detection Information},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313540},
doi = {10.1109/DFT59622.2023.10313540},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/OtaHYYA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PaliaroutisTGVES23,
author = {Georgios Ioannis Paliaroutis and
Pelopidas Tsoumanis and
Dimitrios Garyfallou and
Anastasis Vagenas and
Nestoras E. Evmorfopoulos and
Georgios I. Stamoulis},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Accurate Soft Error Rate Evaluation Using Event-Driven Dynamic Timing
Analysis},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313573},
doi = {10.1109/DFT59622.2023.10313573},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/PaliaroutisTGVES23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PalumboCRO23,
author = {Alessandro Palumbo and
Luca Cassano and
Pedro Reviriego and
Marco Ottavi},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Improving the Detection of Hardware Trojan Horses in Microprocessors
via Hamming Codes},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313563},
doi = {10.1109/DFT59622.2023.10313563},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/PalumboCRO23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PalumboOC23,
author = {Alessandro Palumbo and
Marco Ottavi and
Luca Cassano},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Built-in Software Obfuscation for Protecting Microprocessors against
Hardware Trojan Horses},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313534},
doi = {10.1109/DFT59622.2023.10313534},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/PalumboOC23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PappalardoPRODSB23,
author = {Salvatore Pappalardo and
Ali Piri and
Annachiara Ruospo and
Ian O'Connor and
Bastien Deveautour and
Ernesto S{\'{a}}nchez and
Alberto Bosio},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Investigating the effect of approximate multipliers on the resilience
of a systolic array {DNN} accelerator},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313535},
doi = {10.1109/DFT59622.2023.10313535},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/PappalardoPRODSB23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RahmanTAF23,
author = {Mridha Md Mashahedur Rahman and
Shams Tarek and
Kimia Zamiri Azar and
Farimah Farahmandi},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {EnSAFe: Enabling Sustainable SoC Security Auditing using eFPGA-based
Accelerators},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313548},
doi = {10.1109/DFT59622.2023.10313548},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/RahmanTAF23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SantenKGA23,
author = {Victor M. van Santen and
Florian Klemme and
Paul R. Genssler and
Hussam Amrouch},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Challenges in Machine Learning Techniques to Estimate Reliability
from Transistors to Circuits},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313528},
doi = {10.1109/DFT59622.2023.10313528},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SantenKGA23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SantosMMD23,
author = {Douglas A. dos Santos and
Andr{\'{e}} Martins Pio de Mattos and
Douglas R. Melo and
Luigi Dilillo},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Characterization of a Fault-Tolerant {RISC-V} System-on-Chip for Space
Environments},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313549},
doi = {10.1109/DFT59622.2023.10313549},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SantosMMD23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ShaikhMAFTR23,
author = {Hasan Al Shaikh and
Mohammad Bin Monjil and
Kimia Zamiri Azar and
Farimah Farahmandi and
Mark M. Tehranipoor and
Fahim Rahman},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {QuardTropy: Detecting and Quantifying Unauthorized Information Leakage
in Hardware Designs using g-entropy},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313574},
doi = {10.1109/DFT59622.2023.10313574},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ShaikhMAFTR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ShibinJJDT23,
author = {Konstantin Shibin and
Maksim Jenihhin and
Artur Jutman and
Sergei Devadze and
Anton Tsertov},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {On-Chip Sensors Data Collection and Analysis for SoC Health Management},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313562},
doi = {10.1109/DFT59622.2023.10313562},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ShibinJJDT23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/StratigopoulosSR23,
author = {Haralampos{-}G. Stratigopoulos and
Theofilos Spyrou and
Spyridon Raptis},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Testing and Reliability of Spiking Neural Networks: {A} Review of
the State-of-the-Art},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--8},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313541},
doi = {10.1109/DFT59622.2023.10313541},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/StratigopoulosSR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TakouSMFES23,
author = {Alexandra Takou and
Pavlos Stoikos and
Moysis Moysis and
George Floros and
Nestoras E. Evmorfopoulos and
Georgios I. Stamoulis},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {An Efficient Security Closure Methodology for EM-based Attacks on
Power Grid Structures},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313546},
doi = {10.1109/DFT59622.2023.10313546},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TakouSMFES23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TebinaZHM23,
author = {Nasr{-}Eddine Ouldei Tebina and
Nacer{-}Eddine Zergainoh and
Guillaume Hubert and
Paolo Maistri},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Simulation Methodology for Assessing X-Ray Effects on Digital Circuits},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313564},
doi = {10.1109/DFT59622.2023.10313564},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/TebinaZHM23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ToyookaWHY23,
author = {Yudai Toyooka and
Haruki Watanabe and
Toshinori Hosokawa and
Masayoshi Yoshimura},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {An Evaluation of Estimated Field Random Testability for Data Paths
at Register Transfer Level Using Status Signal Sequences Based on
k-Consecutive State Transitions for Field Testing},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313570},
doi = {10.1109/DFT59622.2023.10313570},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ToyookaWHY23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TurcoRGSR23,
author = {V. Turco and
Annachiara Ruospo and
Gabriele Gavarini and
Ernesto S{\'{a}}nchez and
Matteo Sonza Reorda},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Uncovering hidden vulnerabilities in CNNs through evolutionary-based
Image Test Libraries},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313530},
doi = {10.1109/DFT59622.2023.10313530},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TurcoRGSR23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/WangWMKHTSWN23,
author = {Senling Wang and
Shaoqi Wei and
Jun Ma and
Hiroshi Kai and
Yoshinobu Higami and
Hiroshi Takahashi and
Akihiro Shimizu and
Xiaoqing Wen and
Tianming Ni},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {{SASL-JTAG:} {A} Light-Weight Dependable {JTAG}},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--3},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313532},
doi = {10.1109/DFT59622.2023.10313532},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/WangWMKHTSWN23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/XieYZCX23,
author = {Yu Xie and
Wen{-}Yue Yu and
Ning Zhang and
He Chen and
Yizhuang Xie},
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {Partial Triple Modular Redundancy Method for Fault-Tolerant Circuit
based on {HITS} Algorithm},
booktitle = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
pages = {1--4},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023.10313538},
doi = {10.1109/DFT59622.2023.10313538},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/XieYZCX23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2023,
editor = {Luca Cassano and
Mihalis Psarakis and
Marcello Traiola and
Alberto Bosio},
title = {{IEEE} International Symposium on Defect and Fault Tolerance in {VLSI}
and Nanotechnology Systems, {DFT} 2023, Juan-Les-Pins, France, October
3-5, 2023},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/DFT59622.2023},
doi = {10.1109/DFT59622.2023},
isbn = {979-8-3503-1500-4},
timestamp = {Tue, 21 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/2023.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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