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@inproceedings{DBLP:conf/dft/AhlawatTGFS19,
author = {Satyadev Ahlawat and
Jaynarayan T. Tudu and
Manoj Singh Gaur and
Masahiro Fujita and
Virendra Singh},
title = {Preventing Scan Attack through Test Response Encryption},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875355},
doi = {10.1109/DFT.2019.8875355},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/AhlawatTGFS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BosioORKVNANFH19,
author = {Alberto Bosio and
Ian O'Connor and
Gennaro Severino Rodrigues and
Fernanda Lima Kastensmidt and
Elena I. Vatajelu and
Giorgio Di Natale and
Lorena Anghel and
Surya Nagarajan and
Moritz Fieback and
Said Hamdioui},
title = {Rebooting Computing: The Challenges for Test and Reliability},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {8138--8143},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875270},
doi = {10.1109/DFT.2019.8875270},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/BosioORKVNANFH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChapmanTMHYKK19,
author = {Glenn H. Chapman and
Rohan Thomas and
Klinsmann J. Coelho Silva Meneses and
Bifei Huang and
Hao Yang and
Israel Koren and
Zahava Koren},
title = {Detecting SEUs in Noisy Digital Imagers with small pixels},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875486},
doi = {10.1109/DFT.2019.8875486},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/ChapmanTMHYKK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChoudhuryS19,
author = {Avishek Choudhury and
Biplab K. Sikdar},
title = {{CORE-VR:} {A} Coherence and Reusability Aware Low Voltage Fault Tolerant
Cache in Multicore},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875457},
doi = {10.1109/DFT.2019.8875457},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/ChoudhuryS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DuASBS19,
author = {Boyang Du and
Sarah Azimi and
Corrado De Sio and
Ludovica Bozzoli and
Luca Sterpone},
title = {On the Reliability of Convolutional Neural Network Implementation
on SRAM-based {FPGA}},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875362},
doi = {10.1109/DFT.2019.8875362},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/DuASBS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/FoutrisKL19,
author = {Nikos Foutris and
Christos Kotselidis and
Mikel Luj{\'{a}}n},
title = {Simulating Wear-out Effects of Asymmetric Multicores at the Architecture
Level},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875468},
doi = {10.1109/DFT.2019.8875468},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/FoutrisKL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/FuchsCWMFHTLPM19,
author = {Christian M. Fuchs and
Pai H. Chou and
Xiaoqing Wen and
Nadia M. Murillo and
Gianluca Furano and
Stefan Holst and
Antonis Tavoularis and
Shyue{-}Kung Lu and
Aske Plaat and
Kostas Marinis},
title = {A Fault-Tolerant MPSoC For CubeSats},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875417},
doi = {10.1109/DFT.2019.8875417},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/FuchsCWMFHTLPM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GambardellaKBDK19,
author = {Giulio Gambardella and
Johannes Kappauf and
Michaela Blott and
Christoph Doehring and
Martin Kumm and
Peter Zipf and
Kees A. Vissers},
title = {Efficient Error-Tolerant Quantized Neural Network Accelerators},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875314},
doi = {10.1109/DFT.2019.8875314},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/GambardellaKBDK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GaoZYYR19,
author = {Zhen Gao and
Jinhua Zhu and
Lina Yan and
Tong Yan and
Pedro Reviriego},
title = {Reliability Evaluation of Polyphase-filter based Decimators Implemented
on SRAM-FPGAs},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875316},
doi = {10.1109/DFT.2019.8875316},
timestamp = {Mon, 21 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GaoZYYR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GnoliCPUKMIVGMO19,
author = {Luca Gnoli and
Giuseppe Carnicelli and
Alessio Parisi and
Luca Urbinati and
Burim Kabashi and
Fabio Michieletti and
Sebastian Ignacio Peradotto Ibarra and
Marco Vacca and
Mariagrazia Graziano and
Jimson Mathew and
Marco Ottavi},
title = {Fault Tolerant Photovoltaic Array: {A} Repair Circuit Based on Memristor
Sensing},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875467},
doi = {10.1109/DFT.2019.8875467},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/GnoliCPUKMIVGMO19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HosokawaYMYHA19,
author = {Toshinori Hosokawa and
Hiroshi Yamazaki and
Kenichiro Misawa and
Masayoshi Yoshimura and
Yuki Hirama and
Masavuki Arai},
title = {A Low Capture Power Oriented X-filling Method Using Partial MaxSAT
Iteratively},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875434},
doi = {10.1109/DFT.2019.8875434},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/HosokawaYMYHA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/IchiharaMII19,
author = {Hideyuki Ichihara and
Yuki Maeda and
Tsuyoshi Iwagaki and
Tomoo Inoue},
title = {State Encoding with Stochastic Numbers for Transient Fault Tolerant
Linear Finite State Machines},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875383},
doi = {10.1109/DFT.2019.8875383},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/IchiharaMII19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/JenihhinRBA19,
author = {Maksim Jenihhin and
Matteo Sonza Reorda and
Aneesh Balakrishnan and
Dan Alexandrescu},
title = {Challenges of Reliability Assessment and Enhancement in Autonomous
Systems},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875379},
doi = {10.1109/DFT.2019.8875379},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/JenihhinRBA19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KlineLMJ19,
author = {Donald Kline Jr. and
Stephen Longofono and
Rami G. Melhem and
Alex K. Jones},
title = {Predicting Single Event Effects in {DRAM}},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875328},
doi = {10.1109/DFT.2019.8875328},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KlineLMJ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LasherasCRC19,
author = {Ana Lasheras and
Ramon Canal and
Eva Rodr{\'{\i}}guez and
Luca Cassano},
title = {Protecting {RSA} Hardware Accelerators against Differential Fault
Analysis through Residue Checking},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875320},
doi = {10.1109/DFT.2019.8875320},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/LasherasCRC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LiRXK19,
author = {Jiaqiang Li and
Pedro Reviriego and
Liyi Xiao and
Alexander Klockmann},
title = {Protecting Large Word Size Memories against MCUs with 3-bit Burst
Error Correction},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875396},
doi = {10.1109/DFT.2019.8875396},
timestamp = {Tue, 29 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LiRXK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LiuRNPXL19,
author = {Shanshan Liu and
Pedro Reviriego and
Kazuteru Namba and
Salvatore Pontarelli and
Liyi Xiao and
Fabrizio Lombardi},
title = {Low Redundancy Double Error Correction Spotty Codes Combined with
Gray Coding for 64 Data Bits Memories of 4-bit Multilevel Cells},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875283},
doi = {10.1109/DFT.2019.8875283},
timestamp = {Wed, 10 May 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/LiuRNPXL19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LuzaBGJMD19,
author = {Lucas Matana Luza and
Alexandre Besser and
Viyas Gupta and
Arto Javanainen and
Ali Mohammadzadeh and
Luigi Dilillo},
title = {Effects of Heavy Ion and Proton Irradiation on a {SLC} {NAND} Flash
Memory},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875475},
doi = {10.1109/DFT.2019.8875475},
timestamp = {Tue, 16 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/LuzaBGJMD19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MascioMGFM19,
author = {Stefano Di Mascio and
Alessandra Menicucci and
Eberhard K. A. Gill and
Gianluca Furano and
Claudio Monteleone},
title = {On the Criticality of Caches in Fault-Tolerant Processors for Space},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875424},
doi = {10.1109/DFT.2019.8875424},
timestamp = {Fri, 01 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/MascioMGFM19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MerchantDBAYJ19,
author = {Feroze Merchant and
Anandraj Devarajan and
Anik Basu and
David Ashen and
Brandon Yelton and
Prashant D. Joshi},
title = {High Performance Memory Repair},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875490},
doi = {10.1109/DFT.2019.8875490},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/MerchantDBAYJ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MousaviPC019,
author = {Mahsa Mousavi and
Hamid Reza Pourshaghaghi and
Henk Corporaal and
Akash Kumar},
title = {Scatter Scrubbing: {A} Method to Reduce {SEU} Repair Time in {FPGA}
Configuration Memory},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875431},
doi = {10.1109/DFT.2019.8875431},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/MousaviPC019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/OliveiraNR19,
author = {Daniel Oliveira and
Philippe O. A. Navaux and
Paolo Rech},
title = {Increasing the Efficiency and Efficacy of Selective-Hardening for
Parallel Applications},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875300},
doi = {10.1109/DFT.2019.8875300},
timestamp = {Wed, 01 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/OliveiraNR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PathroseLK19,
author = {Jerrin Pathrose and
Leon van de Logt and
Hans G. Kerkhoff},
title = {Analog Test Interface for {IEEE} 1687 Employing Split {SAR} Architecture
to Support Embedded Instrument Dependability Applications},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875372},
doi = {10.1109/DFT.2019.8875372},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/PathroseLK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PrevilonKKR19,
author = {Fritz G. Previlon and
Charu Kalra and
David R. Kaeli and
Paolo Rech},
title = {A Comprehensive Evaluation of the Effects of Input Data on the Resilience
of {GPU} Applications},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875269},
doi = {10.1109/DFT.2019.8875269},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/PrevilonKKR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RuospoC0SGB19,
author = {Annachiara Ruospo and
Riccardo Cantoro and
Ernesto S{\'{a}}nchez and
Pasquale Davide Schiavone and
Angelo Garofalo and
Luca Benini},
title = {On-line Testing for Autonomous Systems driven by {RISC-V} Processor
Design Verification},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875345},
doi = {10.1109/DFT.2019.8875345},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/RuospoC0SGB19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SanchezBSS19,
author = {Antonio J. S{\'{a}}nchez and
Yubal Barrios and
Lucana Santos and
Roberto Sarmiento},
title = {Evaluation of {TMR} effectiveness for soft error mitigation in SHyLoC
compression {IP} core implemented on Zynq SoC under heavy ion radiation},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875281},
doi = {10.1109/DFT.2019.8875281},
timestamp = {Mon, 09 Jan 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SanchezBSS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SantosoJ19,
author = {Danny Santoso and
Hyeran Jeon},
title = {Understanding of {GPU} Architectural Vulnerability for Deep Learning
Workloads},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875404},
doi = {10.1109/DFT.2019.8875404},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/SantosoJ19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SimevskiSCK19,
author = {Aleksandar Simevski and
Patryk Skoncej and
Cristiano Calligaro and
Milos Krstic},
title = {Scalable and Configurable Multi-Chip {SRAM} in a Package for Space
Applications},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--6},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875489},
doi = {10.1109/DFT.2019.8875489},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SimevskiSCK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TsaiLHS19,
author = {Tsai{-}Ling Tsai and
Jin{-}Fu Li and
Chun{-}Lung Hsu and
Chi{-}Tien Sun},
title = {Testing of In-Memory-Computing 8T SRAMs},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875487},
doi = {10.1109/DFT.2019.8875487},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/TsaiLHS19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/UlbrichtSK19,
author = {Markus Ulbricht and
Rizwan Tariq Syed and
Milos Krstic},
title = {Developing a Configurable Fault Tolerant Multicore System for Optimized
Sensor Processing},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875433},
doi = {10.1109/DFT.2019.8875433},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/UlbrichtSK19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ValleroC19,
author = {Alessandro Vallero and
Stefano Di Carlo},
title = {Combining Cluster Sampling and {ACE} analysis to improve fault-injection
based reliability evaluation of GPU-based systems},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {8138--8143},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875392},
doi = {10.1109/DFT.2019.8875392},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ValleroC19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/YoshimuraTYH19,
author = {Masayoshi Yoshimura and
Yuki Takeuchi and
Hiroshi Yamazaki and
Toshinori Hosokawa},
title = {A State Assignment Method to Improve Transition Fault Coverage for
Controllers},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875322},
doi = {10.1109/DFT.2019.8875322},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/YoshimuraTYH19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ZehMR19,
author = {Alexander Zeh and
Manuela Meier and
Viola Rieger},
title = {Parity-Based Concurrent Error Detection Schemes for the ChaCha Stream
Cipher},
booktitle = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
pages = {1--4},
publisher = {{IEEE}},
year = {2019},
url = {https://doi.org/10.1109/DFT.2019.8875478},
doi = {10.1109/DFT.2019.8875478},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/ZehMR19.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2019,
title = {2019 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFT} 2019, Noordwijk, Netherlands,
October 2-4, 2019},
publisher = {{IEEE}},
year = {2019},
url = {https://ieeexplore.ieee.org/xpl/conhome/8863044/proceeding},
isbn = {978-1-7281-2260-1},
timestamp = {Tue, 22 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/2019.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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