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ORCID"Généralisation des méthodes de scan pour le test des ..."
Joseph Bulone (1994)
- Joseph Bulone:
Généralisation des méthodes de scan pour le test des circuits intégrés complexes et application à des circuits critiques en vitesse. (Generalization of the scan methods for the test of complex integrated circuits and application to high speed circuits). Grenoble Institute of Technology, France, 1994
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