"Reliability-Guaranteed Admission Control for Mobile Computation Offloading ..."

Guixian Qu et al. (2021)

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DOI: 10.1109/LWC.2021.3096381

access: closed

type: Journal Article

metadata version: 2021-11-03

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Guixian Qu, Jianshan Zhou, Zhengguo Sheng, Haiyang Yu, Yilong Ren:
Reliability-Guaranteed Admission Control for Mobile Computation Offloading Under Nakagami Fading Channel. IEEE Wirel. Commun. Lett. 10(10): 2195-2199 (2021)

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