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"Reliability Analysis of Large Intelligent Surfaces (LISs): Rate ..."

Minchae Jung et al. (2019)

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DOI: 10.1109/LWC.2019.2935190

access: closed

type: Journal Article

metadata version: 2020-04-01

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  - https://dblp.org/rec/journals/wcl/JungSJKC19
Minchae Jung, Walid Saad, Young Rok Jang, Gyuyeol Kong, Sooyong Choi:
Reliability Analysis of Large Intelligent Surfaces (LISs): Rate Distribution and Outage Probability. IEEE Wirel. Commun. Lett. 8(6): 1662-1666 (2019)

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