"Low Energy Signal Processing Techniques for Reliability Improvement of ..."

Dong-hwan Lee, Jonghong Kim, Wonyong Sung (2015)

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DOI: 10.1007/S11265-014-0943-7

access: closed

type: Journal Article

metadata version: 2020-03-12

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Dong-hwan Lee, Jonghong Kim, Wonyong Sung:
Low Energy Signal Processing Techniques for Reliability Improvement of High-Density NAND Flash Memory. J. Signal Process. Syst. 78(1): 63-71 (2015)

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