Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Low Energy Signal Processing Techniques for Reliability Improvement of ..."

Dong-hwan Lee, Jonghong Kim, Wonyong Sung (2015)

> Home

Details and statistics

DOI: 10.1007/S11265-014-0943-7

access: closed

type: Journal Article

metadata version: 2020-03-12

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/vlsisp/LeeKS15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsisp/LeeKS15
Dong-hwan Lee, Jonghong Kim, Wonyong Sung:
Low Energy Signal Processing Techniques for Reliability Improvement of High-Density NAND Flash Memory. J. Signal Process. Syst. 78(1): 63-71 (2015)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.