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"A New Theory for Testability-Preserving Optimization of Combinational ..."

Jiabi Zhu, Mostafa I. H. Abd-El-Barr, Carl McCrosky (1996)

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DOI: 10.1155/1996/19043

access: open

type: Journal Article

metadata version: 2022-11-05

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  - journals/vlsi/ZhuAM96
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  - https://dblp.org/rec/journals/vlsi/ZhuAM96
Jiabi Zhu, Mostafa I. H. Abd-El-Barr, Carl McCrosky:
A New Theory for Testability-Preserving Optimization of Combinational Circuits. VLSI Design 5(1): 59-75 (1996)

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